CAPACITIVE ADIABATIC LOGIC: A NEW PARADIGM FOR LOW-POWER COMMUTATION. Microenergy, Gubbio, Italy Gaël Pillonnet July 2017
|
|
- Cassandra Diane Hunt
- 5 years ago
- Views:
Transcription
1 CAPACITIVE ADIABATIC LOGIC: A NEW PARADIGM FOR LOW-POWER COMMUTATION Microenergy, Gubbio, Italy Gaël Pillonnet July 2017
2 ENERGY DISSIPATION IN DIGITAL ELECTRONICS CIRCUITS Power density issue CMOS-based digital circuit in nano-scaled technology consume <1kW/cm 2 * 10x higher than air cooling dissipation capability recent technologies offer billions of transistors but cannot be used at the same time! Energy issue Comparing to Landauer limits (3zJ@300k), one logic operation in deep CMOS technology node costs x10 5 more Why do we need to dissipate high amount of energy to code one logic state in current digital circuit using CMOS technology? * considering buffer gate on 10-2 µm 2 with 0.1fF gate capacitance operating at 1GHz ** considering 1 zetta flops and 50W 2
3 CMOS BASED LOGIC ROOT LIMITATION #1 Go back to the energy transfer basic in a elementary inverter logic gate V DC V DC V DC R OFF i R R ON Hyp: R ON C G R OFF ->+oo V CC 0 C G NOT gate U C U pulse ;U C V CC Energy provided by energy source to code one logic bit: E VDC = T OPUDC 2 xi DC = C G V CC t=0 NB: R ON value has not effect 0 I R T OP V CC /R ON 0.5xC G xv DC 2 0.5xC G xv DC 2 large current peak = too fast transition = irreversible transform = inescapable loss Classical digital circuits suffer from inherent dynamic loss (not device dependent) due to sharp transition between two logic states 3
4 CMOS BASED LOGIC ROOT LIMITATION #1 Is it really a serious problem? Quantify this inherent loss in the last node CMOS technology: {V CC ;C G* }={1V;0.1fF} E OP =0.1fJ >> 3zJ given by Landauer limit: k B.T.ln(2) Yes! we are x10 5 far from the minimal energy to code one bit! Does the CMOS scaling help? Move to the next lower node: C G /2 & V CC ~cst E OP /2 per node Does the subthreshold operation help? V CC ~0.3V E OP /10 and higher leakage (see later) Scaling or subthreshold cannot fill the huge gap * best case: interconnections cap is assumed equal to zero 4
5 WHAT S NEXT? The huge energy gap to fill needs a hardware revolution! Fortunately, the adiabatic technique has been introduced to avoid a hardware revolution V DC V PC Basic idea: only replace a DC-power supply V DC by a trapezoidal power-clock V PC 5
6 ADIABATIC ENERGY GAIN AND LIMITATION WITH FET Go back to the energy transfer basic, but with soft charging V PC U PC ~U C V CC Hyp: R OFF ->+oo V DC 0 R ON C G U C 0 I R T RAMP T OP V CC /R ~V CC /R x RC/T Energy go back to the voltage source E VPC = T OPUPC xi PC R ONC G C T G V CC RAMP t= V TH + C G V TH 2 C T RAMP R ON C G V TH G Controlled inherent dynamic loss in adiabatic Uncontrolled inherent dynamic loss due to the FET behavior 6
7 ADIABATIC ENERGY ROOT LIMITATION #1 It it really a serious problem? Quantify this uncontrolled loss in the last node CMOS technology: {V CC ;C G }={1V;0.1fF} {R ON ;T RAMP }={1kΩ,10ps} V TH =0.3V E OP =0.01fJ >> 3zJ Yes! we are 10 4 higher than the Landauer limit Why not reduced V TH? Because we are face to a hardware limitation E VPC R ONC G C T G V 2 2 CC V TH + C G V 2 TH + I OFF V CC T RAMP RAMP dynamic loss f V TH static loss f 1 V TH An inherent trade-off for any semiconductor device between its cut-off and on-state strength exits 7
8 WHAT S NEXT? Adiabatic technique is efficient but not using FET devices. We need a hardware revolution! Fortunately, the mechanical device has been (re)introduced* V PC V PC Basic idea: Use metal contact (or no contact) to have not I ON over I OFF compromise * in combination with adiabatic technique 8
9 HOW TO FABRICATE RELAYS? G V PC D S chassis ground slide link g l G k electrical isolation spring S e y D e x vertical motion g DS dy OFF position Simplified mechanical scheme G D C GS R OFF /R ON S Equivalent electrical model µ-relay fabricated * M. Spencer, Demonstration of Integrated Micro-ElectroMechanical Relay Circuits for VLSI Applications, JSSCC,
10 ENERGY DISSIPATION USING MEMS RELAYS E VPC = T OPUPC xi PC R ONC G C T G V CC RAMP t= V PO + C G V PO 2 C G V T RAMP R ON C PO G Controlled inherent dynamic loss in adiabatic Still uncontrolled inherent dynamic loss in adiabatic based on relay Quantify for nano-scale relay: {U PI ;U PO }={10mV;1mV} {V CC ;C G }={1V;100pF} {R ON ;T RAMP }={10kΩ,100µs} E OP =0.1fJ No, we are still 10 4 higher than the Landauer limit with x10 10 operating period and x10 6 size compared to MOS + technological limitation: mechanical reliability due to the bad electrical contact and chocks 10
11 WHAT S NEXT? Go back to our old MOS transistors or try another revolution to save energy? OR Fortunately, the capacitive adiabatic logic is introduced! [1] V PC V PC ON OFF Basic idea: use relay but in (electrical) contactless operation and adiabatic operation always OFF operation [1] G. Pillonnet, S. Houri and H. Fanet, Adiabatic Capacitive Logic: a paradigm for low-power logic, IEEE ISCAS,
12 HOW TO USE CONTACTLESS RELAYS? Relays become variable capacitors in CAL paradigm Buffer example V PC V PC OFF low 0 logic input 1 logic input V o = V PC ON R ON R OFF + R ON V PC ~0 ON OFF V o = high C L C H + C L V PC ~0 V PC high low Trade resistive divider for capacitive one V o = R OFF R OFF + R ON V PC ~V PC V o = C H C L + C H V PC ~V PC 12
13 WHO IS THE ELEMENTARY DEVICES IN CAL? Positive- and negative- variable capacitors (VC) are the elementary hardware device in CAL C DS MOS relay VC P-CV C(V) curve C H G B D U DS C L S U GB P-MOS P-CV N-MOS N-CV Analogy to transistor-, relay-based logic N-CV C(V) curve C H C DS C L U GB 13
14 HOW TO IMPLEMENT VC DEVICES How to change a capacitor value? C DS = ε 0 ε r w l g By changing surface (wxl), gap between plates (g) or permittivity (ε r ) l S D w g C DS changes by an isolated voltage U GB it is a four terminals device G B U DS D S Actuation could be : Thermal not very reversible Piezoelectric trade off between leakage and dynamic losses Electrodynamic current actuation Electrostatic small gap needed to have reasonable supply voltage 14
15 spring isolation PROPOSED HARDWARE SOLUTION* Well known MEMS topology ( excepted isolation) Electrostatic actuation using comb drive in both sides Purely contact-less (electrical & mechanical) Input electrodes Output electrodes G B D S * This is not the only hardware solution to implement a 4-terminal variable cap 15
16 DISPLACEMENT AGAINST INPUT VOLTAGE low position high position (V GB >0) G B S D G B S D isolation Simulation from Coventor, MEMS+ 16
17 15µm displacement ELECTROMECHANICAL CHARACTERISTICS The MEMS sizing is given by cascability logic constraints (see later) Displacement against input voltage Capacitance vs input voltage C DS C DS x3 C G D G B S C G C DS 2 caps mechanically coupled Simulation from Coventor, MEMS+ for 1mm 2 device (2µm gap) dv ( t) dc( x) dx i( t) C( x) V dt dx dt electrical part mechanical part 17
18 BUFFER BEHAVIOR: STEP BY STEP V PC1 V PC2 V PC3 V PC4 Buffer pipeline V out1 V out2 =V in3 V out3 PCs have a π/2 phase shift Waiting Evaluation Holding Recovery V in3 V PC3 PC3 wait the input C out3,high x 3 αc out3 C out3,low E mechanic V out3 C out3,h /(C out3,h +C in4 )xv PC3 i PC3 PC3 also recovers energy to VC 18
19 BUFFER BEHAVIOR: ENERGY TRANSFER [in green] loss controlled by the ramping time T E loss elec. energy from/to PC i loss from power supply resistive loss α I i 2 spring energy 1/2kx 2 loss inside material elec. energy from/to PC i-1 energy in the variable capacitor VC i elec. cap energy 1/2C in V in2 +1/2C out V out 2 loss from power supply* resistive loss α I i-1 2 viscosity loss α dx i /dt kinetic energy: 1/2mdx/dt 2 chock loss contactless * Power supply must be reversible and AC (literature has already proved high efficiency power supplies) 19
20 (OUR) "ADIABATIC LOSS DEFINITION E EL Energy, fj E C E D E M E LOSS Definition: loss scaling linearly with the ramping time Need low dissipation? Reduce the speed! 1 E KIN 0, Tf Here, our MEMS moving is always controlled by the power clock ramping time Gap closing MEMS is not suitable as motion is not controlled after the pull-in CONFIDENTIEL CEA Journée Annuelle Carnot 12janv
21 ENERGY ANALYSIS OF ELEMENTARY MOVING 1/T=100Hz Power clocks currents currents displacement E OP,min =1,2pJ pour 1mm 2 (vs 1fJ for nano-scale transistor) thanks to the controlled moving and energy back Electrical simulation using simplified model (VHDL-AMS) 21
22 LOGIC PROPAGATION THROUGH PIPELINE The biggest issue: find the right MEMS configuration (cap variation, C in vs C out ) to propagate the logic state gate by gate V in V PC1 V out1 V PC2 V out2 V PC3 V out3 V PC4 V out4 30V 12V 8V V PC V out gnd gnd gnd gnd 1 0 Cascability condition V PC1 V PC2 V PC3 V PC4 = have different voltage levels Occurred when 30V < V PC < 37V V out1 V out2 =V in3 V out3 22
23 LOGIC OPERATION: OR EXAMPLE V PC V in,1 V in,2 to the next gate All combination logic operation is possible with CVP and/or CVN devices 23
24 ROADMAP FOR DEEPER INTEGRATION Based on the current (first draft) MEMS Gap 1/k Linear sizes 1/k Mass 1/k 3 Spring constant Frequency Capacitance 1/k Actuation voltage 1/k E LOSS 1/k 3 k k E OP [J] S si [µm 2 ] F op [MHz] 1p 2µm 1f Landauer limit 2µm 200nm 200nm CMOS limit 1a 1z 20nm 20nm 2nm CMOS limit 10-2 CMOS limit (1000) 0,1 2µm 1 200nm 10 20nm 2nm 100 2nm Energy gain x10 5 techno. node Surface penality x10 4 techno. node Speed penality x10 techno. node Targeted application: low processing rate with high energy constraint (e.g. autonomous environmental sensors) 24
25 THANKS TO THE TEAM Hervé Fanet Gaël Pillonnet Louis Hutin Bruno Reig Full time researchers in Léti (Grenoble, France) Gregory Snider Prof. Univ. of Notre Dame Samer Houri Delft Tech.Univ. Ayrat Galisultanov post doc. Yann Perrin post doc. External partners Post PhD 25
26 CONCLUSION Actual CMOS logic is an energy heresy for logic operation The root of the problem is the elementary gate behavior New device / design style at the gate level has to be invented! Adiabatic design style is promising but we need a dedicated device, not FET variable capacitor (VR) seems to be adiabatic compatible This is preliminary results waiting the silicon device measurements Contact-less variable capacitors could be based on: well-known MEMS structures with already proved scalability and reliability abilities Other (reversible) actuation: to be defined! Beware: every solution has to be cascadable (propagate logic state to the next stage) It is not a crazy alternative to reduce the energy dissipation Open question: where is the energy limit using the proposed MEMS? Your feedbacks are more than welcome! 26
27 CAPACITIVE ADIABATIC LOGIC: A NEW PARADIGM FOR LOW-POWER COMMUTATION Microenergy, Gubbio, Italy Gaël Pillonnet July 2017
CMOS Transistors, Gates, and Wires
CMOS Transistors, Gates, and Wires Should the hardware abstraction layers make today s lecture irrelevant? pplication R P C W / R W C W / 6.375 Complex Digital Systems Christopher atten February 5, 006
More informationLecture 6 Power Zhuo Feng. Z. Feng MTU EE4800 CMOS Digital IC Design & Analysis 2010
EE4800 CMOS Digital IC Design & Analysis Lecture 6 Power Zhuo Feng 6.1 Outline Power and Energy Dynamic Power Static Power 6.2 Power and Energy Power is drawn from a voltage source attached to the V DD
More informationParallel Processing and Circuit Design with Nano-Electro-Mechanical Relays
Parallel Processing and Circuit Design with Nano-Electro-Mechanical Relays Elad Alon 1, Tsu-Jae King Liu 1, Vladimir Stojanovic 2, Dejan Markovic 3 1 University of California, Berkeley 2 Massachusetts
More informationAnnouncements. EE141- Fall 2002 Lecture 7. MOS Capacitances Inverter Delay Power
- Fall 2002 Lecture 7 MOS Capacitances Inverter Delay Power Announcements Wednesday 12-3pm lab cancelled Lab 4 this week Homework 2 due today at 5pm Homework 3 posted tonight Today s lecture MOS capacitances
More informationSpiral 2 7. Capacitance, Delay and Sizing. Mark Redekopp
2-7.1 Spiral 2 7 Capacitance, Delay and Sizing Mark Redekopp 2-7.2 Learning Outcomes I understand the sources of capacitance in CMOS circuits I understand how delay scales with resistance, capacitance
More informationRecent Progress and Challenges for Relay Logic Switch Technology
Recent Progress and Challenges for Relay Logic Switch Technology Tsu-Jae King Liu Louis Hutin, I-Ru Chen, Rhesa Nathanael, Yenhao Chen, Matthew Spencer and Elad Alon Electrical Engineering and Computer
More informationWhere Does Power Go in CMOS?
Power Dissipation Where Does Power Go in CMOS? Dynamic Power Consumption Charging and Discharging Capacitors Short Circuit Currents Short Circuit Path between Supply Rails during Switching Leakage Leaking
More informationE40M Capacitors. M. Horowitz, J. Plummer, R. Howe
E40M Capacitors 1 Reading Reader: Chapter 6 Capacitance A & L: 9.1.1, 9.2.1 2 Why Are Capacitors Useful/Important? How do we design circuits that respond to certain frequencies? What determines how fast
More informationLecture 16: Circuit Pitfalls
Introduction to CMOS VLSI Design Lecture 16: Circuit Pitfalls David Harris Harvey Mudd College Spring 2004 Outline Pitfalls Detective puzzle Given circuit and symptom, diagnose cause and recommend solution
More informationEE115C Digital Electronic Circuits Homework #4
EE115 Digital Electronic ircuits Homework #4 Problem 1 Power Dissipation Solution Vdd =1.0V onsider the source follower circuit used to drive a load L =20fF shown above. M1 and M2 are both NMOS transistors
More informationEE241 - Spring 2003 Advanced Digital Integrated Circuits
EE241 - Spring 2003 Advanced Digital Integrated Circuits Lecture 16 Energy-Recovery Circuits SOI Technology and Circuits Optimal EDP Contours 1 Leakage and Switching ELk 2 = ESw Opt L ln d K tech α avg
More informationSub-Boltzmann Transistors with Piezoelectric Gate Barriers
Sub-Boltzmann Transistors with Piezoelectric Gate Barriers Raj Jana, Gregory Snider, Debdeep Jena Electrical Engineering University of Notre Dame 29 Oct, 2013 rjana1@nd.edu Raj Jana, E3S 2013, Berkeley
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 18: March 27, 2018 Dynamic Logic, Charge Injection Lecture Outline! Sequential MOS Logic " D-Latch " Timing Constraints! Dynamic Logic " Domino
More informationLast Lecture. Power Dissipation CMOS Scaling. EECS 141 S02 Lecture 8
EECS 141 S02 Lecture 8 Power Dissipation CMOS Scaling Last Lecture CMOS Inverter loading Switching Performance Evaluation Design optimization Inverter Sizing 1 Today CMOS Inverter power dissipation» Dynamic»
More informationLecture 23. CMOS Logic Gates and Digital VLSI I
ecture 3 CMOS ogic Gates and Digital SI I In this lecture you will learn: Digital ogic The CMOS Inverter Charge and Discharge Dynamics Power Dissipation Digital evels and Noise NFET Inverter Cut-off Saturation
More informationESE570 Spring University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals
University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals ESE570, Spring 017 Final Wednesday, May 3 4 Problems with point weightings shown.
More informationVLSI GATE LEVEL DESIGN UNIT - III P.VIDYA SAGAR ( ASSOCIATE PROFESSOR) Department of Electronics and Communication Engineering, VBIT
VLSI UNIT - III GATE LEVEL DESIGN P.VIDYA SAGAR ( ASSOCIATE PROFESSOR) contents GATE LEVEL DESIGN : Logic Gates and Other complex gates, Switch logic, Alternate gate circuits, Time Delays, Driving large
More informationCARNEGIE MELLON UNIVERSITY DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING DIGITAL INTEGRATED CIRCUITS FALL 2002
CARNEGIE MELLON UNIVERSITY DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING 18-322 DIGITAL INTEGRATED CIRCUITS FALL 2002 Final Examination, Monday Dec. 16, 2002 NAME: SECTION: Time: 180 minutes Closed
More informationFig. 1 CMOS Transistor Circuits (a) Inverter Out = NOT In, (b) NOR-gate C = NOT (A or B)
1 Introduction to Transistor-Level Logic Circuits 1 By Prawat Nagvajara At the transistor level of logic circuits, transistors operate as switches with the logic variables controlling the open or closed
More informationESE570 Spring University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals
University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals ESE570, Spring 2018 Final Monday, Apr 0 5 Problems with point weightings shown.
More informationEE 466/586 VLSI Design. Partha Pande School of EECS Washington State University
EE 466/586 VLSI Design Partha Pande School of EECS Washington State University pande@eecs.wsu.edu Lecture 8 Power Dissipation in CMOS Gates Power in CMOS gates Dynamic Power Capacitance switching Crowbar
More informationTHE INVERTER. Inverter
THE INVERTER DIGITAL GATES Fundamental Parameters Functionality Reliability, Robustness Area Performance» Speed (delay)» Power Consumption» Energy Noise in Digital Integrated Circuits v(t) V DD i(t) (a)
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 15: March 15, 2018 Euler Paths, Energy Basics and Optimization Midterm! Midterm " Mean: 89.7 " Standard Dev: 8.12 2 Lecture Outline! Euler
More informationECE 407 Computer Aided Design for Electronic Systems. Simulation. Instructor: Maria K. Michael. Overview
407 Computer Aided Design for Electronic Systems Simulation Instructor: Maria K. Michael Overview What is simulation? Design verification Modeling Levels Modeling circuits for simulation True-value simulation
More informationEECS 141: FALL 05 MIDTERM 1
University of California College of Engineering Department of Electrical Engineering and Computer Sciences D. Markovic TuTh 11-1:3 Thursday, October 6, 6:3-8:pm EECS 141: FALL 5 MIDTERM 1 NAME Last SOLUTION
More informationNTE74HC173 Integrated Circuit TTL High Speed CMOS, 4 Bit D Type Flip Flop with 3 State Outputs
NTE74HC173 Integrated Circuit TTL High Speed CMOS, 4 Bit D Type Flip Flop with 3 State Outputs Description: The NTE74HC173 is an high speed 3 State Quad D Type Flip Flop in a 16 Lead DIP type package that
More informationINF5490 RF MEMS. LN03: Modeling, design and analysis. Spring 2008, Oddvar Søråsen Department of Informatics, UoO
INF5490 RF MEMS LN03: Modeling, design and analysis Spring 2008, Oddvar Søråsen Department of Informatics, UoO 1 Today s lecture MEMS functional operation Transducer principles Sensor principles Methods
More informationIntroduction to CMOS VLSI Design (E158) Lecture 20: Low Power Design
Harris Introduction to CMOS VLSI Design (E158) Lecture 20: Low Power Design David Harris Harvey Mudd College David_Harris@hmc.edu Based on EE271 developed by Mark Horowitz, Stanford University MAH E158
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 23, 2018 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2018 Khanna Lecture Outline! CMOS Process Enhancements! Semiconductor
More informationMOSFET: Introduction
E&CE 437 Integrated VLSI Systems MOS Transistor 1 of 30 MOSFET: Introduction Metal oxide semiconductor field effect transistor (MOSFET) or MOS is widely used for implementing digital designs Its major
More informationDigital Integrated Circuits A Design Perspective
Semiconductor Memories Adapted from Chapter 12 of Digital Integrated Circuits A Design Perspective Jan M. Rabaey et al. Copyright 2003 Prentice Hall/Pearson Outline Memory Classification Memory Architectures
More informationPower Dissipation. Where Does Power Go in CMOS?
Power Dissipation [Adapted from Chapter 5 of Digital Integrated Circuits, 2003, J. Rabaey et al.] Where Does Power Go in CMOS? Dynamic Power Consumption Charging and Discharging Capacitors Short Circuit
More informationObjective and Outline. Acknowledgement. Objective: Power Components. Outline: 1) Acknowledgements. Section 4: Power Components
Objective: Power Components Outline: 1) Acknowledgements 2) Objective and Outline 1 Acknowledgement This lecture note has been obtained from similar courses all over the world. I wish to thank all the
More informationand V DS V GS V T (the saturation region) I DS = k 2 (V GS V T )2 (1+ V DS )
ECE 4420 Spring 2005 Page 1 FINAL EXAMINATION NAME SCORE /100 Problem 1O 2 3 4 5 6 7 Sum Points INSTRUCTIONS: This exam is closed book. You are permitted four sheets of notes (three of which are your sheets
More informationMASSACHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Sciences
MSSCHUSETTS INSTITUTE OF TECHNOLOGY Department of Electrical Engineering and Computer Sciences nalysis and Design of Digital Integrated Circuits (6.374) - Fall 2003 Quiz #1 Prof. nantha Chandrakasan Student
More informationCMPEN 411 VLSI Digital Circuits Spring 2011 Lecture 07: Pass Transistor Logic
CMPEN 411 VLSI Digital Circuits Spring 2011 Lecture 07: Pass Transistor Logic [dapted from Rabaey s Digital Integrated Circuits, Second Edition, 2003 J. Rabaey,. Chandrakasan,. Nikolic] Sp11 CMPEN 411
More informationMidterm. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Lecture Outline. Pass Transistor Logic. Restore Output.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 16: March 21, 2017 Transmission Gates, Euler Paths, Energy Basics Review Midterm! Midterm " Mean: 79.5 " Standard Dev: 14.5 2 Lecture Outline!
More informationCIRCUIT ELEMENT: CAPACITOR
CIRCUIT ELEMENT: CAPACITOR PROF. SIRIPONG POTISUK ELEC 308 Types of Circuit Elements Two broad types of circuit elements Ati Active elements -capable of generating electric energy from nonelectric energy
More informationDynamic operation 20
Dynamic operation 20 A simple model for the propagation delay Symmetric inverter (rise and fall delays are identical) otal capacitance is linear t p Minimum length devices R W C L t = 0.69R C = p W L 0.69
More informationTransduction Based on Changes in the Energy Stored in an Electrical Field
Lecture 6-1 Transduction Based on Changes in the Energy Stored in an Electrical Field Electric Field and Forces Suppose a charged fixed q 1 in a space, an exploring charge q is moving toward the fixed
More informationECE321 Electronics I
ECE321 Electronics I Lecture 1: Introduction to Digital Electronics Payman Zarkesh-Ha Office: ECE Bldg. 230B Office hours: Tuesday 2:00-3:00PM or by appointment E-mail: payman@ece.unm.edu Slide: 1 Textbook
More informationIntegrated Circuits & Systems
Federal University of Santa Catarina Center for Technology Computer Science & Electronics Engineering Integrated Circuits & Systems INE 5442 Lecture 14 The CMOS Inverter: dynamic behavior (sizing, inverter
More information6.012 Electronic Devices and Circuits
Page 1 of 10 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.012 Electronic Devices and Circuits Exam No. 2 Thursday, November 5, 2009 7:30 to
More informationLecture 5: DC & Transient Response
Lecture 5: DC & Transient Response Outline q Pass Transistors q DC Response q Logic Levels and Noise Margins q Transient Response q RC Delay Models q Delay Estimation 2 Activity 1) If the width of a transistor
More informationEE 330 Lecture 6. Improved Switch-Level Model Propagation Delay Stick Diagrams Technology Files
EE 330 Lecture 6 Improved witch-level Model Propagation elay tick iagrams Technology Files Review from Last Time MO Transistor Qualitative iscussion of n-channel Operation Bulk ource Gate rain rain G Gate
More informationM74HCT138TTR 3 TO 8 LINE DECODER (INVERTING)
3 TO 8 LINE DECODER (INVERTING) HIGH SPEED: t PD = 16ns (TYP.) at V CC = 4.5V LOW POWER DISSIPATION: I CC = 4µA(MAX.) at T A =25 C COMPATIBLE WITH TTL OUTPUTS : V IH = 2V (MIN.) V IL = 0.8V (MAX) SYMMETRICAL
More informationThe challenges of Power estimation and Power-silicon correlation. Yoad Yagil Intel, Haifa
The challenges of estimation and -silicon correlation Yoad Yagil Intel, Haifa Nanoscale Integrated Systems on Chip, Technion, Dec. 006 Acknowledgements Yoni Aizik Ali Muhtaroglu Agenda Introduction Can
More informationCHAPTER 5 FIXED GUIDED BEAM ANALYSIS
77 CHAPTER 5 FIXED GUIDED BEAM ANALYSIS 5.1 INTRODUCTION Fixed guided clamped and cantilever beams have been designed and analyzed using ANSYS and their performance were calculated. Maximum deflection
More informationMOSIS REPORT. Spring MOSIS Report 1. MOSIS Report 2. MOSIS Report 3
MOSIS REPORT Spring 2010 MOSIS Report 1 MOSIS Report 2 MOSIS Report 3 MOSIS Report 1 Design of 4-bit counter using J-K flip flop I. Objective The purpose of this project is to design one 4-bit counter
More informationDynamic Combinational Circuits. Dynamic Logic
Dynamic Combinational Circuits Dynamic circuits Charge sharing, charge redistribution Domino logic np-cmos (zipper CMOS) Krish Chakrabarty 1 Dynamic Logic Dynamic gates use a clocked pmos pullup Two modes:
More informationEE C245 ME C218 Introduction to MEMS Design Fall 2011
EE C245 ME C218 Introduction to MEMS Design Fall 2011 Prof. Clark T.-C. Nguyen Dept. of Electrical Engineering & Computer Sciences University of California at Berkeley Berkeley, CA 94720 Lecture EE C245:
More informationLow Power VLSI Circuits and Systems Prof. Ajit Pal Department of Computer Science and Engineering Indian Institute of Technology, Kharagpur
Low Power VLSI Circuits and Systems Prof. Ajit Pal Department of Computer Science and Engineering Indian Institute of Technology, Kharagpur Lecture No. # 08 MOS Inverters - III Hello, and welcome to today
More informationLecture 7 Circuit Delay, Area and Power
Lecture 7 Circuit Delay, Area and Power lecture notes from S. Mitra Intro VLSI System course (EE271) Introduction to VLSI Systems 1 Circuits and Delay Introduction to VLSI Systems 2 Power, Delay and Area:
More informationNEM Relay Design for Compact, Ultra-Low-Power Digital Logic Circuits
NEM Relay Design for Compact, Ultra-Low-Power Digital Logic Circuits T.-J. K. Liu 1, N. Xu 1, I.-R. Chen 1, C. Qian 1, J. Fujiki 2 1 Dept. of Electrical Engineering and Computer Sciences University of
More informationSemiconductor Memories
Semiconductor References: Adapted from: Digital Integrated Circuits: A Design Perspective, J. Rabaey UCB Principles of CMOS VLSI Design: A Systems Perspective, 2nd Ed., N. H. E. Weste and K. Eshraghian
More informationECE520 VLSI Design. Lecture 23: SRAM & DRAM Memories. Payman Zarkesh-Ha
ECE520 VLSI Design Lecture 23: SRAM & DRAM Memories Payman Zarkesh-Ha Office: ECE Bldg. 230B Office hours: Wednesday 2:00-3:00PM or by appointment E-mail: pzarkesh@unm.edu Slide: 1 Review of Last Lecture
More informationINTEGRATED CIRCUITS. For a complete data sheet, please also download:
INTEGRATED CIRCUITS DATA SHEET For a complete data sheet, please also download: The IC06 74HC/HCT/HCU/HCMOS Logic Family Specificatio The IC06 74HC/HCT/HCU/HCMOS Logic Package Information The IC06 74HC/HCT/HCU/HCMOS
More informationMOS Transistors. Prof. Krishna Saraswat. Department of Electrical Engineering Stanford University Stanford, CA
MOS Transistors Prof. Krishna Saraswat Department of Electrical Engineering S Stanford, CA 94305 saraswat@stanford.edu 1 1930: Patent on the Field-Effect Transistor! Julius Lilienfeld filed a patent describing
More informationTopics to be Covered. capacitance inductance transmission lines
Topics to be Covered Circuit Elements Switching Characteristics Power Dissipation Conductor Sizes Charge Sharing Design Margins Yield resistance capacitance inductance transmission lines Resistance of
More informationEE141Microelettronica. CMOS Logic
Microelettronica CMOS Logic CMOS logic Power consumption in CMOS logic gates Where Does Power Go in CMOS? Dynamic Power Consumption Charging and Discharging Capacitors Short Circuit Currents Short Circuit
More informationDigital Integrated Circuits 2nd Inverter
Digital Integrated Circuits The Inverter The CMOS Inverter V DD Analysis Inverter complex gate Cost V in V out complexity & Area Integrity and robustness C L Static behavior Performance Dynamic response
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 24: April 19, 2018 Crosstalk and Wiring, Transmission Lines Lecture Outline! Crosstalk! Repeaters in Wiring! Transmission Lines " Where transmission
More informationTransduction Based on Changes in the Energy Stored in an Electrical Field. Lecture 6-5. Department of Mechanical Engineering
Transduction Based on Changes in the Energy Stored in an Electrical Field Lecture 6-5 Transducers with cylindrical Geometry For a cylinder of radius r centered inside a shell with with an inner radius
More informationLecture 4: CMOS Transistor Theory
Introduction to CMOS VLSI Design Lecture 4: CMOS Transistor Theory David Harris, Harvey Mudd College Kartik Mohanram and Steven Levitan University of Pittsburgh Outline q Introduction q MOS Capacitor q
More informationMixed Analog-Digital VLSI Circuits & Systems Laboratory
CORNELL U N I V E R S I T Y School of Electrical and Computer Engineering Mixed Analog-Digital VLSI Circuits & Systems Laboratory Our research presently revolves around two major themes: Devising new circuit
More informationENERGY HARVESTING TRANSDUCERS - ELECTROSTATIC (ICT-ENERGY SUMMER SCHOOL 2016)
ENERGY HARVESTING TRANSDUCERS - ELECTROSTATIC (ICT-ENERGY SUMMER SCHOOL 2016) Shad Roundy, PhD Department of Mechanical Engineering University of Utah shad.roundy@utah.edu Three Types of Electromechanical
More informationMOS Transistor Theory
CHAPTER 3 MOS Transistor Theory Outline 2 1. Introduction 2. Ideal I-V Characteristics 3. Nonideal I-V Effects 4. C-V Characteristics 5. DC Transfer Characteristics 6. Switch-level RC Delay Models MOS
More informationINTEGRATED CIRCUITS. For a complete data sheet, please also download:
INTEGRATED CIRCUITS DATA SHEET For a complete data sheet, please also download: The IC06 74HC/HCT/HCU/HCMOS Logic Family Specifications The IC06 74HC/HCT/HCU/HCMOS Logic Package Information The IC06 74HC/HCT/HCU/HCMOS
More informationDesign for Manufacturability and Power Estimation. Physical issues verification (DSM)
Design for Manufacturability and Power Estimation Lecture 25 Alessandra Nardi Thanks to Prof. Jan Rabaey and Prof. K. Keutzer Physical issues verification (DSM) Interconnects Signal Integrity P/G integrity
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 19: March 29, 2018 Memory Overview, Memory Core Cells Today! Charge Leakage/Charge Sharing " Domino Logic Design Considerations! Logic Comparisons!
More informationLecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor
Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE15 Spring 28 Lecture
More information! Crosstalk. ! Repeaters in Wiring. ! Transmission Lines. " Where transmission lines arise? " Lossless Transmission Line.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 24: April 19, 2018 Crosstalk and Wiring, Transmission Lines Lecture Outline! Crosstalk! Repeaters in Wiring! Transmission Lines " Where transmission
More informationDynamic Combinational Circuits. Dynamic Logic
Dynamic Combinational Circuits Dynamic circuits Charge sharing, charge redistribution Domino logic np-cmos (zipper CMOS) Krish Chakrabarty 1 Dynamic Logic Dynamic gates use a clocked pmos pullup Two modes:
More informationECE 546 Lecture 10 MOS Transistors
ECE 546 Lecture 10 MOS Transistors Spring 2018 Jose E. Schutt-Aine Electrical & Computer Engineering University of Illinois jesa@illinois.edu NMOS Transistor NMOS Transistor N-Channel MOSFET Built on p-type
More informationHigh-to-Low Propagation Delay t PHL
High-to-Low Propagation Delay t PHL V IN switches instantly from low to high. Driver transistor (n-channel) immediately switches from cutoff to saturation; the p-channel pull-up switches from triode to
More informationLecture 12 CMOS Delay & Transient Response
EE 471: Transport Phenomena in Solid State Devices Spring 2018 Lecture 12 CMOS Delay & Transient Response Bryan Ackland Department of Electrical and Computer Engineering Stevens Institute of Technology
More informationECE 342 Electronic Circuits. Lecture 35 CMOS Delay Model
ECE 34 Electronic Circuits Lecture 35 CMOS Delay Model Jose E. Schutt-Aine Electrical & Computer Engineering University of Illinois jesa@illinois.edu ECE 34 Jose Schutt Aine 1 Digital Circuits V IH : Input
More informationESE570 Spring University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals
University of Pennsylvania Department of Electrical and System Engineering Digital Integrated Cicruits AND VLSI Fundamentals ESE570, Spring 2016 Final Friday, May 6 5 Problems with point weightings shown.
More informationDigital Electronics Part II - Circuits
Digital Electronics Part - Circuits Dr.. J. Wassell Gates from Transistors ntroduction Logic circuits are non-linear, consequently we will introduce a graphical technique for analysing such circuits The
More informationEEC 118 Lecture #5: CMOS Inverter AC Characteristics. Rajeevan Amirtharajah University of California, Davis Jeff Parkhurst Intel Corporation
EEC 8 Lecture #5: CMOS Inverter AC Characteristics Rajeevan Amirtharajah University of California, Davis Jeff Parkhurst Intel Corporation Acknowledgments Slides due to Rajit Manohar from ECE 547 Advanced
More informationL16: Power Dissipation in Digital Systems. L16: Spring 2007 Introductory Digital Systems Laboratory
L16: Power Dissipation in Digital Systems 1 Problem #1: Power Dissipation/Heat Power (Watts) 100000 10000 1000 100 10 1 0.1 4004 80088080 8085 808686 386 486 Pentium proc 18KW 5KW 1.5KW 500W 1971 1974
More informationAn Autonomous Nonvolatile Memory Latch
Radiant Technologies, Inc. 2835D Pan American Freeway NE Albuquerque, NM 87107 Tel: 505-842-8007 Fax: 505-842-0366 e-mail: radiant@ferrodevices.com www.ferrodevices.com An Autonomous Nonvolatile Memory
More informationChapter 4 Field-Effect Transistors
Chapter 4 Field-Effect Transistors Microelectronic Circuit Design Richard C. Jaeger Travis N. Blalock 5/5/11 Chap 4-1 Chapter Goals Describe operation of MOSFETs. Define FET characteristics in operation
More informationName: Answers. Mean: 83, Standard Deviation: 12 Q1 Q2 Q3 Q4 Q5 Q6 Total. ESE370 Fall 2015
University of Pennsylvania Department of Electrical and System Engineering Circuit-Level Modeling, Design, and Optimization for Digital Systems ESE370, Fall 2015 Final Tuesday, December 15 Problem weightings
More informationSimulation of a Polyimide Based Micromirror
Simulation of a Polyimide Based Micromirror A. Arevalo* *1, S. Ilyas **1, D. Conchouso and I. G. Foulds *1, 2 * Computer, Electrical and Mathematical Sciences and Engineering Division (CEMSE), ** Physical
More informationLecture 23. Dealing with Interconnect. Impact of Interconnect Parasitics
Lecture 23 Dealing with Interconnect Impact of Interconnect Parasitics Reduce Reliability Affect Performance Classes of Parasitics Capacitive Resistive Inductive 1 INTERCONNECT Dealing with Capacitance
More informationDigital Integrated Circuits Designing Combinational Logic Circuits. Fuyuzhuo
Digital Integrated Circuits Designing Combinational Logic Circuits Fuyuzhuo Introduction Digital IC Dynamic Logic Introduction Digital IC EE141 2 Dynamic logic outline Dynamic logic principle Dynamic logic
More informationReducing power in using different technologies using FSM architecture
Reducing power in using different technologies using FSM architecture Himani Mitta l, Dinesh Chandra 2, Sampath Kumar 3,2,3 J.S.S.Academy of Technical Education,NOIDA,U.P,INDIA himanimit@yahoo.co.in, dinesshc@gmail.com,
More informationDigital Integrated Circuits A Design Perspective
Digital Integrated Circuits Design Perspective Designing Combinational Logic Circuits Fuyuzhuo School of Microelectronics,SJTU Introduction Digital IC Dynamic Logic Introduction Digital IC 2 EE141 Dynamic
More information! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 3, 018 MOS Transistor Theory, MOS Model Lecture Outline! CMOS Process Enhancements! Semiconductor Physics " Band gaps " Field Effects!
More information(Refer Slide Time: 00:01:30 min)
Control Engineering Prof. M. Gopal Department of Electrical Engineering Indian Institute of Technology, Delhi Lecture - 3 Introduction to Control Problem (Contd.) Well friends, I have been giving you various
More informationChapter 5. The Inverter. V1. April 10, 03 V1.1 April 25, 03 V2.1 Nov Inverter
Chapter 5 The Inverter V1. April 10, 03 V1.1 April 25, 03 V2.1 Nov.12 03 Objective of This Chapter Use Inverter to know basic CMOS Circuits Operations Watch for performance Index such as Speed (Delay calculation)
More informationUltralow-Power Reconfigurable Computing with Complementary Nano-Electromechanical Carbon Nanotube Switches
Ultralow-Power Reconfigurable Computing with Complementary Nano-Electromechanical Carbon Nanotube Switches Presenter: Tulika Mitra Swarup Bhunia, Massood Tabib-Azar, and Daniel Saab Electrical Eng. And
More informationEEE 421 VLSI Circuits
EEE 421 CMOS Properties Full rail-to-rail swing high noise margins» Logic levels not dependent upon the relative device sizes transistors can be minimum size ratioless Always a path to V dd or GND in steady
More informationNTE74HC165 Integrated Circuit TTL High Speed CMOS, 8 Bit Parallel In/Serial Out Shift Register
NTE74HC165 Integrated Circuit TTL High Speed CMOS, 8 Bit Parallel In/Serial Out Shift Register Description: The NTE74HC165 is an 8 bit parallel in/serial out shift register in a 16 Lead DIP type package
More informationEE241 - Spring 2001 Advanced Digital Integrated Circuits
EE241 - Spring 21 Advanced Digital Integrated Circuits Lecture 12 Low Power Design Self-Resetting Logic Signals are pulses, not levels 1 Self-Resetting Logic Sense-Amplifying Logic Matsui, JSSC 12/94 2
More informationRecall the essence of data transmission: How Computers Work Lecture 11
Recall the essence of data transmission: How Computers Work Lecture 11 Q: What form does information take during transmission? Introduction to the Physics of Computation A: Energy Energy How Computers
More informationLast Name _Di Tredici_ Given Name _Venere_ ID Number
Last Name _Di Tredici_ Given Name _Venere_ ID Number 0180713 Question n. 1 Discuss noise in MEMS accelerometers, indicating the different physical sources and which design parameters you can act on (with
More informationEE C245 - ME C218 Introduction to MEMS Design Fall Today s Lecture
EE C45 - ME C18 Introduction to MEMS Design Fall 003 Roger Howe and Thara Srinivasan Lecture 11 Electrostatic Actuators II Today s Lecture Linear (vs. displacement) electrostatic actuation: vary overlap
More informationDual D Flip-Flop with Set and Reset High-Speed Silicon-Gate CMOS
TECHNICAL DATA IN74ACT74 Dual D Flip-Flop with Set and Reset High-Speed Silicon-Gate CMOS The IN74ACT74 is identical in pinout to the LS/ALS74, HC/HCT74. The IN74ACT74 may be used as a level converter
More information