2012/01/20. Thierry EPICIER. MATEIS-CLYM, umr CNRS5510, Director METSA (FR 3507 CNRS) M. AOUINE, JP MILLET et al.
|
|
|
- Ursula Patrick
- 6 years ago
- Views:
Transcription
1 2012/01/20 Thierry EPICIER MATEIS-CLYM, umr CNRS5510, Director METSA (FR 3507 CNRS) M. AOUINE, JP MILLET et al.
2 MATERIALS SCIENCES & NANOTECHNOLOGIES HIGH RESOLUTION MICROSCOPY (including ATOM PROBE) techniques allow ACCURATE CHARACTERIZATION of the (ATOMIC) STRUCTURE, CHEMISTRY and CRYSTALLOGRAPHY
3 The network started in platforms 15 microscopes 3 atom probes 90 researchers and engineers / technicians PFNC 280 experiments treated in 3 years
4 The network?? 2. PROPOSAL (twice a year) facilitates the access of the French community to state-of-art TEM and AP (MET & Sonde Atomique in French) organizing the TEM and AP community (equipment strategy, joined developments) TEACHING (specialized schools and workshops) and TRAINING 1. CONTACT plateform(s) 4. Access through the permanent staff of the platform or direct access (trained users) 7. REPORT / scientific communication(s) 3. EXPERTISE (programme committee) 5. FUNDING of accepted experiments Dialog between platforms and steering committees
5 ELECTRON MICROSCOPES - High Resolution (atomic) imaging Illustration 1 nm FEI Tecnai SACTEM (C s -corrector) FEI TITAN (C s -corrector), PACA FEI TITAN (C s -corrector), PFNC JEOL 2100F (C s -corrector) METSA 2009 A23: T1 phase and local strain around nano-precipitates in Al alloys (HRTEM) P. DONNADIEU, J. DOUIN, F. HOUDELLIER, 200 kv - FEG image C s -corrector (resolution : 0.12 nm) rotatif biprism Gatan Imaging Filter (GIF) Tridiem (0.7 ev) 2K x 2K camera 300kV FEG image C s -corrector (résolution : 0.1 nm) Caméra 2K 2K, HAADF /BF detectors EDAX EDX GIFTridiem (0.7 ev) 300kV FEG image C s -corrector (résolution : 0.1 nm) biprism Caméra 2K 2K HAADF / BF detectors EDAX EDX GIFTridiem (0.7 ev) Probe C s correctior (resolution 0.11 nm) HAADF / BF detectors Biprism GIF Tridiem (0.7 ev) EDX 2K x 2K camera Heating stage (973K) high tilt cryo stage Tomographic holder +/- 80
6 ELECTRON MICROSCOPES - High Resolution (atomic) imaging Illustration Quantitative STEM simulations various models for the hexagonal b phase a 0.7 nm, c = nm (Mg0.48Si0.49Cu0.03) 2 nm METSA 2009 A8, 2010 A40 Cs-corrected HAADF study of (Al-Mg-Si-Cu) precipitates in Al 6XXX industrial alloys; T. EPICIER, C. CAYRON, to appear
7 ELECTRON MICROSCOPES - Chemical Analysis / Spectroscopic imaging Illustration VG STEM 501 NION ultra-stem 200 kv CFEG, LPS UHV column Spatial resolution 70 pm Energy resolution < 0.4 ev 100 kv cold FEG Spatial resolution > 0.7 nm Energy resolution: 0.6 ev EELS Spectrum imaging EFTEM devices (GIF/Tridiem/Quantum GATAN), EDX-SDD detectors (Oxford Instruments, JEOL, EDAX), all platforms METSA 2010 A2: LiMn 1 /2Ni 1 /2O 2 electrode/electrolyte interphase, M. CUISINIER et al., Solid State Nucl. Magn. Reson., (2011), in press, doi: /j.ssnmr
8 ELECTRON MICROSCOPES - Chemical Analysis / Spectroscopic imaging Illustration: chemical composition electronic structure at the atomic scale Nano-optics: mapping surface plasmon modes Mn La Ti M. WALLS et coll. Mn La Ti J. NELAYAH et al., Nature Phys (2007)
9 100 kv - FEG froid résolution spatiale > 0.7 nm résolution en énergie : 0.6 ev ELECTRON MICROSCOPES - Nano-machining / Sample prep. 10 µm Illustration SEM-FEG Zeiss (resolution : 1.1 nm) Ion column Orsay Physics Ga/AuSi ions (resolution : 5-7 nm) Dual Beam SEM-FEG high resolution FIB Ga+ (low voltage 500 V) Omniprobe micromanipulator SEM-FEG Zeiss (resolution : 1.1 nm) Ion Column Orsay Physics Ga/AuSi ions (resolution : 5-7 nm) flood gun 5 gas injectors Klocke micro-manipulator EBSD and EDX 3D Oxford Instruments METSA 2010 A3 nano-machining of Atom probe TIPS of the interface Cu-nanowires / sapphire substrate, S. CURIOTTO, D. CHATAIN, E. CADEL
10 ELECTRON MICROSCOPES - Nano-machining / Sample prep. Illustration: cutting matter for nano-tomography in a FIB. X-Y resolution 1 nm, Z resolution (slicing) 3 nm slicing (Ga + ions) SEM viewing direction FIB tomography: 3D structure of a metallic alloy (Cu-based with intra- and intergranular precipitation) 5 µm 5 µm
11 ELECTRON MICROSCOPES - In situ & Environmental microscopy Illustration JEOL 2010F (cooling He 10 K) IRMA, CRISMAT Resolution 0.24 nm Heating stage (1273K) cooling stage N 2 (92K) cooling stage He (10K) 1Kx1K camera EP: Electron Precession EDX JEOL 3010 (environmental cell), PACA-CINAM 300 kv LaB 6 environmental cell resolution 0.21 nm under gas pressure camera JEOL 2100F (C s -corrector), IPCMS Probe C s corrector (resolution 0.11 nm) HAADF/ BF detectors Biprism GIF Tridiem (0.7 ev) EDX 2K x 2K camera Heating stage (973K) high tilt cryo stage Tomographic holder +/- 80 METSA 2010 A37: high temperature ( o C) growth mechanisms of transient phases (d, q-nisi 2, ) in the Ni / Si reactive system K. HOUMMADA, M. DESCOINS, F. BANHART FEI XL30, ESEM-FEG (environmental & heating 1773 K), CLYM FEG controlled pressure (hydrated objects) Traction stage Heating stages 1273 / 1773K STEM / WET-STEM detectors EDX Home-made Tomography holder 180
12 ELECTRON MICROSCOPES - In situ & Environmental microscopy Illustration: In-situ growth of carbon nanomaterials in the TEM Growth of graphene from catalytically active metals In situ straining experiment: emission of pyramidal dislocations at a fracture tip in Ti 3 Al strained at 400 o C M. LEGROS et coll. F. BANHART et coll. ACS Nano 5, 1529 (2011) graphene
13 Illustration ATOM PROBES 240 nm 3 µm ECOTAP (electric mode), IRMA, GPM Mass resolution M/DM(FWHM) = 500 detection limit 50 ppm, ionic microscopy (He, Ar, Ne) Pulse 100 khz, cryostat: K average analyzed volume nm 3 CAMECA LAWATAP (laser-assisted) electric & pulsed modes, IRMA, GPM Laser femto-second laser (400 fs, IR / Visible / UV), wide angle analysis (diameter 100 nm) adld detector, cryostat: K, voltage 1-15 kv IMAGO LEAP3000XHR, (laser-assisted) PACA-IM2NP METSA 2009 A23: Nanostructure of a Si/Ni/Sn/C composite F. CUEVAS, D. MANGELINCK Mass resolution M/DM(FWHM) > 1000 laser for bad conductors analysis, pulse 250 khz average analyzed volume: nm 3 detection limit 50 ppm, cryostat : K, voltage 1-15 kv
14 1 mm NiSi ATOM PROBES Illustration: Thin film reaction: formation of Ni silicide NiSi 2 from a Ni thin film alloyed with Pt Ni 2 Si D. MANGELINCK et al., Scripta Mater (2010) Atomic resolution at a grain-boundary Iron tip with atomic NbN platelets Field Ion Microscopy D. BLAVETTE et coll F. DANOIX et al., J. Mater. Sci., (2012)
15 QUANTITATIVE in situ DIFFRACTION & CRYSTALLOGRAPHY ATOM PROBE (Tomography) SPECIFIC EXPERTISE tilted TOMOGRAPHY / EFTEM C s -corrected in situ HRTEM Atomic STEM / EELS SpectroMicroscopy Environmental SEM multi-tem 3D-FIB PFNC HR STEM / TEM Chemical Information EELS / EFTEM quantitative TEM C s -corrected HRTEM In situ TEM ATOM PROBE corrected HRTEM Environmental TEM
16 The network SCHOOLS / WORKSHOPS in preparation Soc. Fr. Microscopies TOMOGRAPHY ovidiu.ersen@ipcms.u-strasbg.fr Strasbourg, Nov. 2012, 1 week, participants HRTEM michael.texier@univ-cezanne.fr Marseille (not defined), 3-4 days, participants ATOM PROBE xavier.sauvage@univ-rouen.fr Rouen, Oct. 2012, 1 week, 20 participants QEM 2013 / snoeck@cemes.fr European School on Quantitative Electron Microscopy
Y. LIU 1, H. YUAN 1,2, A. BOGNER-VAN DE MOORTELE 1, B. VAN DE MOORTELE 2, T. EPICIER 1
Y. LIU 1, H. YUAN 1,2, A. BOGNER-VAN DE MOORTELE 1, B. VAN DE MOORTELE 2, T. EPICIER 1 1 mm 1 Université de Lyon, INSA-Lyon, MATEIS (CLYM), umr CNRS 5510, F-69621 Villeurbanne Cedex 2 Université de Lyon,
WorkShop Audace. INSA ROUEN 8 juin 2012
WorkShop Audace INSA ROUEN 8 juin 2012 Groupe de Physique des Matériaux Failure analysis of the HEMT GaN Cécile Genevois 8 juin 2012 AGENDA Context GPM presentation GPM: High Technology instruments Power
(Advanced) FIB sample preparation for (high performance) TEM analysis
(Advanced) FIB sample preparation for (high performance) TEM analysis Bertrand Van de Moortèle Laboratoire de Géologie de Lyon Terre, Planètes, Environnement ENS de Lyon CROSSBEAM MICROSCOPY Metz, June
HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai
HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS SCSAM Short Course Amir Avishai RESEARCH QUESTIONS Sea Shell Cast Iron EDS+SE Fe Cr C Objective Ability to ask the
Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur
Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500
Auger Electron Spectroscopy Overview
Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E
The New TEM facility at LCI, KSU. Min Gao Liquid Crystal Institute Kent State University
The New TEM facility at LCI, KSU Min Gao Liquid Crystal Institute Kent State University 1 Questions to be answered How does TEM work? Why thin specimen? How to prepare one? What is the TEM at LCI like?
Techniques EDX, EELS et HAADF en TEM: possibilités d analyse et applications
Techniques EDX, EELS et HAADF en TEM: possibilités d analyse et applications Thomas Neisius Université Paul Cézanne Plan Imaging modes HAADF Example: supported Pt nanoparticles Electron sample interaction
EPIC: Keck-II: SPID:
The Northwestern University Atomic and Nanoscale Characterization Experimental Center (NUANCE) was established during 2001-02 to integrate complementary analytical instruments and characterization capabilities
In-Situ Combination of TOF-SIMS and EDS Analysis During FIB Sectioning
In-Situ Combination of TOF-SIMS and EDS Analysis During FIB Sectioning V. Ray 1, E. Principe 2, T. Piper 2 vray@umd.edu 1. AIM Lab University of Maryland Nanocenter, College Park, MD 2. Tescan USA, Warrendale
Transmission Electron Microscopy. Part #2 High Resolution Imaging XEDS EELS spectroscopies Aberration corrected TEM
Transmission Electron Microscopy Part #2 High Resolution Imaging XEDS EELS spectroscopies Aberration corrected TEM Nicolas Menguy Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie Part
Dual Beam Helios Nanolab 600 and 650
Dual Beam Helios Nanolab 600 and 650 In the Clean Room facilities of the INA LMA, several lithography facilities permit to pattern structures at the micro and nano meter scale and to create devices. In
Nanoscale voxel spectroscopy by simultaneous EELS and EDS tomography
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supplementary Information Nanoscale voxel spectroscopy by simultaneous EELS and EDS tomography
Supporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
Transmission Electron Microscopy for metrology and characterization of semiconductor devices
Transmission Electron Microscopy for metrology and characterization of semiconductor devices Bert Freitag, Laurens Kwakman, Ivan Lazic and Frank de Jong FEI / ThermoFisher Scientific, Achtseweg Noord 5,
Dislocation networks in graphite
Dislocation networks in graphite High Resolution Microscop With Reference to Lattice Fringe Imaging in a TEM f f r Real space Specimen Reciprocal space hr Point spread function Diffraction pattern Back
), nano-objects (nano-particles, nano-wires, nano-bubbles) and the simulation of neutron irradiation effects in nuclear materials (UO 2.
SEMIRAMIS Since the sixties, SEMIRAMIS has developed skills in ion source and ion beam handling ranging from a few hundred ev to around 10 MeV, with the goal of materials implantation, irradiation and
An environment designed for success
An environment designed for success The nanofab is a centralized, open-access, training, service, and collaboration facility, focused on academic research and industrial applications in micro- and nanoscale
IMAGING DIFFRACTION SPECTROSCOPY
TEM Techniques TEM/STEM IMAGING DIFFRACTION SPECTROSCOPY Amplitude contrast (diffracion contrast) Phase contrast (highresolution imaging) Selected area diffraction Energy dispersive X-ray spectroscopy
PHYS-E0541:Special Course in Physics Gas phase synthesis of carbon nanotubes for thin film application. Electron Microscopy. for
PHYS-E0541:Special Course in Physics Gas phase synthesis of carbon nanotubes for thin film application Electron Microscopy for Introduction to Electron Microscopy Carbon Nanomaterials (nanotubes) Dr. Hua
Sub-10-nm Au-Pt-Pd Alloy Trimetallic Nanoparticles with. High Oxidation-Resistant Property as Efficient and Durable
Electronic Supplementary Material (ESI) for ChemComm. This journal is The Royal Society of Chemistry 2014 Electronic Supplementary Information Sub-10-nm Au-Pt-Pd Alloy Trimetallic Nanoparticles with High
Industry needs: Characterisation & Analysis. Prof. Valeria Nicolosi
Industry needs: Characterisation & Analysis Prof. Valeria Nicolosi Cleanroom Facility Cleanroom Facility Class 100 and 10,000 cleanroom facility. Cleanroom Sample Preparation Substrates are diced Into
Chapter 9. Electron mean free path Microscopy principles of SEM, TEM, LEEM
Chapter 9 Electron mean free path Microscopy principles of SEM, TEM, LEEM 9.1 Electron Mean Free Path 9. Scanning Electron Microscopy (SEM) -SEM design; Secondary electron imaging; Backscattered electron
imust Project NSTEM Nanomanipulationwith Simultaneous TEM Observation PNNL, NanoLyon, ILM INL
imust Project NSTEM Nanomanipulationwith Simultaneous TEM Observation PNNL, NanoLyon, ILM INL History and context of the project TEM acquisition Latest results Impact & conclusion TOPCON 002B TEM acquired
CBE Science of Engineering Materials. Scanning Electron Microscopy (SEM)
CBE 30361 Science of Engineering Materials Scanning Electron Microscopy (SEM) Scale of Structure Organization Units: micrometer = 10-6 m = 1µm nanometer= 10-9 m = 1nm Angstrom = 10-10 m = 1Å A hair is
Chapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
EELS Electron Energy Loss Spectroscopy
EELS Electron Energy Loss Spectroscopy (Thanks to Steve Pennycook, Quan Li, Charlie Lyman, Ondre Krivenak, David Muller, David Bell, Natasha Erdman, Nestor Zaluzec and many others) Nestor Zaluzec,
Supplementary information
Supplementary information Supplementary Figures Supplementary Figure 1. CO 2 light off curve obtained from the 5 wt% Pt/Al 2 O 3 catalyst obtained through heating the catalyst under a 50 ml.min -1 flow
MSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
Scanning Electron Microscopy
Scanning Electron Microscopy Field emitting tip Grid 2kV 100kV Anode ZEISS SUPRA Variable Pressure FESEM Dr Heath Bagshaw CMA bagshawh@tcd.ie Why use an SEM? Fig 1. Examples of features resolvable using
Supporting information:
Epitaxially Integrating Ferromagnetic Fe 1.3 Ge Nanowire Arrays on Few-Layer Graphene Hana Yoon, Taejoon Kang, Jung Min Lee, Si-in Kim, Kwanyong Seo, Jaemyung Kim, Won Il Park, and Bongsoo Kim,* Department
Praktikum zur. Materialanalytik
Praktikum zur Materialanalytik Energy Dispersive X-ray Spectroscopy B513 Stand: 19.10.2016 Contents 1 Introduction... 2 2. Fundamental Physics and Notation... 3 2.1. Alignments of the microscope... 3 2.2.
Variation of critical current and n-value of 2G HTS tapes in external magnetic fields of different orientation
Journal of Physics: Conference Series PAPER OPEN ACCESS Variation of critical current and n-value of 2G HTS tapes in external magnetic fields of different orientation To cite this article: V V Sychugov
Opportunities for Advanced Plasma and Materials Research in National Security
Opportunities for Advanced Plasma and Materials Research in National Security Prof. J.P. Allain allain@purdue.edu School of Nuclear Engineering Purdue University Outline: Plasma and Materials Research
Energy-Filtering. Transmission. Electron Microscopy
Part 3 Energy-Filtering Transmission Electron Microscopy 92 Energy-Filtering TEM Principle of EFTEM expose specimen to mono-energetic electron radiation inelastic scattering in the specimen poly-energetic
ORION NanoFab: An Overview of Applications. White Paper
ORION NanoFab: An Overview of Applications White Paper ORION NanoFab: An Overview of Applications Author: Dr. Bipin Singh Carl Zeiss NTS, LLC, USA Date: September 2012 Introduction With the advancement
A DIVISION OF ULVAC-PHI
A DIVISION OF ULVAC-PHI X-ray photoelectron spectroscopy (XPS/ESCA) is the most widely used surface analysis technique and has many well established industrial and research applications. XPS provides
«SCANNING TUNNELLING MICROSCOPY AND ATOM PROBE»
Département Nanosciences & Nanotechnologies «SCANNING TUNNELLING MICROSCOPY AND ATOM PROBE» Thematic day, Friday 30th june 2017, Salle des férences, GPM Rouen* PROGRAM 9h45-10h30 10h30-10h45 10h45-11h10
Carbon Quantum Dots/NiFe Layered Double Hydroxide. Composite as High Efficient Electrocatalyst for Water
Supplementary Information Carbon Quantum Dots/NiFe Layered Double Hydroxide Composite as High Efficient Electrocatalyst for Water Oxidation Di Tang, Juan Liu, Xuanyu Wu, Ruihua Liu, Xiao Han, Yuzhi Han,
The University of Alabama 1 st APT Workshop for Earth Sciences
The University of Alabama 1 st APT Workshop for Earth Sciences January 2016 David Reinhard LEAP 5000 www.cameca.com Microstructure characterization technique (UHV) that uses field evaporation (high electric
Facilities, Services and Rates
Facilities, Services and Rates Our unique facilities are available for public and private research centers as well as for the industry, who will find in the LMA equipment, a unique research capacity and
Electronic Supplementary Information
Electronic Supplementary Material (ESI) for ChemComm. This journal is The Royal Society of Chemistry 2015 Electronic Supplementary Information Exfoliated semiconducting pure 2H-MoS 2 and 2H-WS 2 assisted
TESCAN S New generation of FIB-SEM microscope
TESCAN S New generation of FIB-SEM microscope rising standards in sample preparation Key Features SEM COLUMN Versatile system for unlimited applications: resolution imaging (0.9 nm at 15 kev, 1.4 nm at
Continuous Production of Nanoparticles using Laser Radiation
Continuous Production of Nanoparticles using Laser Radiation Niko Bärsch Stephan Barcikowski Boris Chichkov NanoDay, October 6th, 2005 Laser Zentrum Hannover e.v. Founded in 1986 Staff: approx. 215 people
Instantaneous reduction of graphene oxide at room temperature
Instantaneous reduction of graphene oxide at room temperature Barun Kuma Burman, Pitamber Mahanandia and Karuna Kar Nanda Materials Research Centre, Indian Institute of Science, Bangalore-560012, India
MSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors
Platinum Metals Rev., 2014, 58, (2), 106 110 FINAL ANALYSIS Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors Heterogeneous catalysis often involves the use of
Physical Science Research Activities of Korea Basic Science Institute
institutes in asia PaCiFiC BULLETIN Physical Science Research Activities of Korea Basic Science Institute JouhAhn Lee head ADVAnCeD nano-surface ReSeARCh group, KBSI Fig. 1: Overview of Korea Basic Science
Introduction to Atom Probe Tomography: characterization of nanostructures
Introduction to Atom Probe Tomography: characterization of nanostructures Alain Portavoce CNRS, Aix-Marseille University, IM2NP, case 142, 13397 Marseille, France PULSE School: Epitaxy updates and promises,
User Fees for the 4D LABS Characterization Facility
User Fees for the 4D LABS Characterization Facility 1. Imaging Fees Service SEM 1 - Helios: SEM/EDS mode SEM/EDS mode with FIB functions Cryo mode setup SEM 2 Nova NanoSEM SEM/EDS mode SEM/EDS mode with
Chemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5
Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4
ELECTRON MICROSCOPE UNIT
ELECTRON MICROSCOPE Director: Prof Richard Tilley Associate Director: Dr Nicholas Ariotti Lab Manager: Ms Katie Levick Administrative Assistant: Mr Michael Zhi UNIT Basement Level: F10 Chemical Sciences
An automated Scanning Electron Microscopy procedure for nanoparticle characterisation in workplaces
An automated Scanning Electron Microscopy procedure for nanoparticle characterisation in workplaces Kirsten I Kling 1, Anders B Bluhme 2,1, Ismo K Koponen 1, Antti J Koivisto 1, Keld A Jensen 1 (1) National
Transmission Electron Microscopy
Transmission Electron Microscopy Fu-Rong Chen Transmission Electron Microscopy David B. Williams C. Barry Carter Background:Solid State Physics Materials Science 1.1 Why Electron Microscope? 1.1 Why Electron
Nanoholes for leak metrology
Vacuum Metrology for Industry Nanoholes for leak metrology Università Degli Studi di Genova, Italy OUTLINE INTRODUCTION FABRICATION OF NANOHOLES GEOMETRICAL CHARACTERIZATION LEAK DEVICES RESULTS: PTB INRIM
Inside this Issue. Articles. Atmospheric pressure plasma system for Textiles
Facilitation Centre for Industrial Plasma Technologies Institute for Plasma Research Plasma Processing Update I s s u e Editor 8 3 A p r 2 0 1 8 Inside this Issue Articles Atmospheric pressure plasma system
Chapter 2 Instrumentation for Analytical Electron Microscopy Lecture 5. Chapter 2 CHEM 793, 2011 Fall 1
Chater Instrumentation for Analytical Electron Microscoy Lecture 5 Chater CHEM 793, 011 Fall 1 Outline Electron Sources (Electron Guns) Thermionic: LaB 6 or W Field emission gun: cold or Schottky Lenses
Nanoscale Chemical Characterization: Moving to 3 Dimensions
Nanoscale Chemical Characterization: Moving to 3 Dimensions Eric B. Steel Chemical Science & Technology Laboratory National Institute of Standards & Technology Outline What is and why do we need chemical
Imaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
Everhart-Thornley detector
SEI Detector Everhart-Thornley detector Microscope chamber wall Faraday cage Scintillator Electrons in Light pipe Photomultiplier Electrical signal out Screen Quartz window +200 V +10 kv Always contains
Continuous Growth of Hexagonal Graphene and Boron Nitride In-Plane Heterostructures by Atmospheric Pressure Chemical Vapor Deposition
SUPPORTING INFORMATION FOR Continuous Growth of Hexagonal Graphene and Boron Nitride In-Plane Heterostructures by Atmospheric Pressure Chemical Vapor Deposition Gang Hee Han 1, 3, Julio A. Rodríguez-Manzo
Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS
Supporting Information Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Kamran Khajehpour,* a Tim Williams, b,c Laure Bourgeois b,d and Sam Adeloju a
CHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
MT Electron microscopy Scanning electron microscopy and electron probe microanalysis
MT-0.6026 Electron microscopy Scanning electron microscopy and electron probe microanalysis Eero Haimi Research Manager Outline 1. Introduction Basics of scanning electron microscopy (SEM) and electron
Electronic Supplementary Information
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C. This journal is The Royal Society of Chemistry 2017 Electronic Supplementary Information Polymorphism and microcrystal shape
The Illinois MRSEC: Mechanics and Dynamics in Nanodevices
The Illinois MRSEC: Mechanics and Dynamics in Nanodevices NSF Materials Research Science and Engineering Centers 50-year history 20 Centers, each 2-3 research groups 6 years funding, $2.4 $3.6 million
Aberration-corrected TEM studies on interface of multilayered-perovskite systems
Aberration-corrected TEM studies on interface of multilayered-perovskite systems By Lina Gunawan (0326114) Supervisor: Dr. Gianluigi Botton November 1, 2006 MSE 702(1) Presentation Outline Literature Review
Large Single Crystals of Graphene on Melted. Copper using Chemical Vapour Deposition.
Supporting information for Large Single Crystals of Graphene on Melted Copper using Chemical Vapour Deposition. Yimin A. Wu 1, Ye Fan 1, Susannah Speller 1, Graham L. Creeth 2, Jerzy T. Sadowski 3, Kuang
3D and Atomic-resolution Imaging with Coherent Electron Nanobeams - Opportunities and Challenges for X-rays
3D and Atomic-resolution Imaging with Coherent Electron Nanobeams - Opportunities and Challenges for X-rays David A. Muller Lena Fitting Kourkoutis, Megan Holtz, Robert Hovden, Qingyun Mao, Julia Mundy,
Microscopy: Principles
Low Voltage Electron Microscopy: Principles and Applications Edited by David C. Bell Harvard University, USA and Natasha Erdman JEOL USA Inc., USA Published in association with the Royal Microscopical
*Specifications subject to change without notice.
The Power of STEM *Specifications subject to change without notice. No. 1301G040C 1101E010C Printed in Japan, Kp Atomic Resolution Analytical Microscope Serving Advanced Technology Atomic Resolution Analytical
Model : JEOL JSM 7610f
Name Field Emission Electron Scanning Microscopy (FESEM) Make: JEOL India Pvt Ltd. Model : JEOL JSM 7610f Specification Electron gun : Schottky type field emission (T-FE) gun Electron Beam resolution (secondary
NTECH - Nanotechnology
Coordinating unit: Teaching unit: Academic year: Degree: ECTS credits: 2017 230 - ETSETB - Barcelona School of Telecommunications Engineering 710 - EEL - Department of Electronic Engineering 713 - EQ -
Synthesis of Colloidal Au-Cu 2 S Heterodimers via Chemically Triggered Phase Segregation of AuCu Nanoparticles
SUPPORTING INFORMATION Synthesis of Colloidal Au-Cu 2 S Heterodimers via Chemically Triggered Phase Segregation of AuCu Nanoparticles Nathan E. Motl, James F. Bondi, and Raymond E. Schaak* Department of
ABSTRACT 1. INTRODUCTION 2. EXPERIMENT
Fabrication of Nanostructured Heterojunction LEDs Using Self-Forming Moth-Eye Type Arrays of n-zno Nanocones Grown on p-si (111) Substrates by Pulsed Laser Deposition D. J. Rogers 1, V. E. Sandana 1,2,3,
Ultrafast single photon emitting quantum photonic structures. based on a nano-obelisk
Ultrafast single photon emitting quantum photonic structures based on a nano-obelisk Je-Hyung Kim, Young-Ho Ko, Su-Hyun Gong, Suk-Min Ko, Yong-Hoon Cho Department of Physics, Graduate School of Nanoscience
Ecole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools
1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron
Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory
Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory The laboratory of Low Temperature, Ultra High Vacuum (UHV LT) is specifically designed for surface science microscopy
Department of Chemistry of The College of Staten Island and The Graduate Center, The City University of
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry A. This journal is The Royal Society of Chemistry 2014 Fe 3 O 4 /Carbon quantum dots hybrid nanoflowers for highly active and
Characterisation of Nanoparticle Structure by High Resolution Electron Microscopy
Journal of Physics: Conference Series OPEN ACCESS Characterisation of Nanoparticle Structure by High Resolution Electron Microscopy To cite this article: Robert D Boyd et al 2014 J. Phys.: Conf. Ser. 522
Ultrafast nanophotonics - optical control of coherent electron -
ICTP 18.2.8 Ultrafast nanophotonics - optical control of coherent electron - Hirofumi Yanagisawa LMU, MPQ Hirofumi Yanagisawa Japan (Tokyo) Switzerland (Zurich) Germany (Munich) http://roundtripticket.me/world-map-labled.html/best-image-of-diagram-world-map-and-labeled-for-labled
Supporting Information:
Supporting Information: In Situ Synthesis of Magnetically Recyclable Graphene Supported Pd@Co Core-Shell Nanoparticles as Efficient Catalysts for Hydrolytic Dehydrogenation of Ammonia Borane Jun Wang,
Electronic Supplementary Information (ESI) From metal-organic framework to hierarchical high surface-area hollow octahedral carbon cages
Electronic Supplementary Material (ESI) for ChemComm. This journal is The Royal Society of Chemistry 2015 Electronic Supplementary Information (ESI) From metal-organic framework to hierarchical high surface-area
GSA Data Repository Item Wacey et al.
GSA Data Repository Item 2015025 Wacey et al. Figure DR1. Occurrence of putative framboidal pyrite from the late Ediacaran of the Catalina Dome, Bonavista Peninsula, Newfoundland (sample WM1, c. 560 Ma
April 10th-12th, 2017
Thomas LaGrange, Ph.D. Faculty Lecturer and Senior Staff Scientist Introduction: Basics of Transmission Electron Microscopy (TEM) TEM Doctoral Course MS-637 April 10th-12th, 2017 Outline 1. What is microcopy?
Final exam: take-home part
Final exam: take-home part! List five things that can be done to improve this class. Be specific; give much detail.! (You will be penalized only for insulting comments made for no benefit; you will not
Technical description of photoelectron spectrometer Escalab 250Xi
Technical description of photoelectron spectrometer Escalab 250Xi Resource center Physical Methods of Surface Investigations 2014 Table of contents Common description 3 Analytical chamber 8 Preparation
Graphene Annealing: How Clean Can It Be?
Supporting Information for Graphene Annealing: How Clean Can It Be? Yung-Chang Lin, 1 Chun-Chieh Lu, 1 Chao-Huei Yeh, 1 Chuanhong Jin, 2 Kazu Suenaga, 2 Po-Wen Chiu 1 * 1 Department of Electrical Engineering,
The design and construction of 3D rose petal-shape MoS 2. hierarchical nanostructures with structure-sensitive. properties
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry A. This journal is The Royal Society of Chemistry 2014 The design and construction of 3D rose petal-shape MoS 2 hierarchical nanostructures
Supporting Information
Supporting Information Wiley-VCH 2013 69451 Weinheim, Germany Hierarchical Nanosheet-Based MoS 2 Nanotubes Fabricated by an Anion-Exchange Reaction of MoO 3 Amine Hybrid Nanowires** Sifei Zhuo, You Xu,
MSE 321 Structural Characterization
Optical Microscope Plan Lenses In an "ideal" single-element lens system all planar wave fronts are focused to a point at distance f from the lens; therefore: Image near the optical axis will be in perfect
Preamble: Emphasis: Material = Device? MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS
MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS MTSE 719 - PHYSCL PRIN CHARACTIZTN SOLIDS Section # Call # Days / Times 001 96175 -View Book Info - F:100PM - 355PM - TIER114 Preamble: Core course
Supporting Information. For. Preparation and Characterization of Highly Planar Flexible Silver
Supporting Information For Preparation and Characterization of Highly Planar Flexible Silver Crystal Belts Dharmesh Varade and Kazutoshi Haraguchi* [*] Dr. K. Haraguchi (Corresponding-Author), Dr. D. Varade
ToF-SIMS or XPS? Xinqi Chen Keck-II
ToF-SIMS or XPS? Xinqi Chen Keck-II 1 Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Not ToF MS (laser, solution) X-ray Photoelectron Spectroscopy (XPS) 2 3 Modes of SIMS 4 Secondary Ion Sputtering
Physical resolution limits of single particle 3D imaging with X-rays and electrons
Physical resolution limits of single particle 3D imaging with X-rays and electrons Coherence 2005 Dirk Van Dyck and Sandra Van Aert June 15, 2005 Ultimate goal: imaging of atoms! Understanding properties
Conventional Transmission Electron Microscopy. Introduction. Text Books. Text Books. EMSE-509 CWRU Frank Ernst
Text Books Conventional Transmission Electron Microscopy EMSE-509 CWRU Frank Ernst D. B. Williams and C. B. Carter: Transmission Electron Microscopy, New York: Plenum Press (1996). L. Reimer: Transmission
Characterization of partially reduced graphene oxide as room
Supporting Information Characterization of partially reduced graphene oxide as room temperature sensor for H 2 Le-Sheng Zhang a, Wei D. Wang b, Xian-Qing Liang c, Wang-Sheng Chu d, Wei-Guo Song a *, Wei
Nanoscale Chemical Imaging with Photo-induced Force Microscopy
OG2 BCP39nm_0062 PiFM (LIA1R)Fwd 500 279.1 µv 375 250 nm 500 375 250 125 0 nm 125 219.0 µv Nanoscale Chemical Imaging with Photo-induced Force Microscopy 0 Thomas R. Albrecht, Derek Nowak, Will Morrison,
MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES
THE PUBLISHING HOUSE PROCEEDINGS OF THE ROMANIAN ACADEMY, Series A, OF THE ROMANIAN ACADEMY Volume 18, Number 1/2017, pp. 42 49 MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES Ion GRUIA University
EDS on the Nanoscale in TEM/STEM and SEM
EDS on the Nanoscale in TEM/STEM and SEM Bruker Nano Analytics, Berlin, Germany Webinar, June 14, 2017 Innovation with Integrity Presenters Dr. Meiken Falke Global Product Manager TEM Bruker Nano Analytics,