ELECTRON MICROSCOPE UNIT

Transcription

1 ELECTRON MICROSCOPE Director: Prof Richard Tilley Associate Director: Dr Nicholas Ariotti Lab Manager: Ms Katie Levick Administrative Assistant: Mr Michael Zhi UNIT Basement Level: F10 Chemical Sciences & E10 Hilmer Building Dr Charlie Kong, Dr Karen Privat, Dr Soshan Cheong, Dr Richard Webster, Dr Simon Hager, Mr Sean Lim, Dr Isabel Morrow, Dr Yin Yao, Dr Qiang Zhu, Dr Juanfang Ruan, Mrs Natasha Kapoor-Kaushik, Dr Joanna Biazik, Dr Rhiannon Kuchel (mat. leave)

2 TECHNIQUES & FACILITIES: SEM Scanning Electron Microscopy (SEM): 7 Instruments Secondary Electron (SE) & Backscattered Electron (BSE) Imaging Conventional & high-resolution FE-SEM Energy-Dispersive Spectroscopy (SEM-EDS) Electron Probe Microanalysis (EPMA / SEM-WDS) Electron Backscattered Diffraction (EBSD)

3 TECHNIQUES & FACILITIES: TEM Transmission Electron Microscopy (TEM): 5 instruments High-resolution TEM Cryo-TEM TEM-Diffraction Energy-Dispersive Spectroscopy (TEM-EDS) 3D Tomography

4 TECHNIQUES & FACILITIES: FIB Focused Ion Beam Microscopy (FIB): 3 Instruments 2 Dual electron & gallium source imaging + milling 1 Plasma FIB: ultra-fast milling + in-situ lift-out EDS & EBSD capabilities TEM sample preparation 3D imaging (incl. Avizo software for post-processing)

5 TECHNIQUES & FACILITIES: PFIB Helios G4 PFIB UXe Large volume 3D characterization Ga+ free sample preparation Precise micromachining New PFIB 2.0 column with 2.5 μa Xenon Plasma for fast milling Compared to 1.0 μa for Tescan PFIB Compared to 65 na for Ga-FIB Best-in-class Monochromated Elstar SEM column enabling sub-nanometer performance at low energies EasyLift nanomanipulator Multiple GIS for Pt, W, C deposition High stability and accuracy large 150 mm Piezo stage Charge Neutralizer Plasma cleaner FEI Auto Slice & View 4 (AS&V4) Software 3D data collection

6 TECHNIQUES & FACILITIES: AFM Atomic Force Microscopy (SEM): 2 Instruments Contact mode, Intermittent contact mode, Non-contact mode, Conductive mode Magnetic Force Microscopy (MFM) Kelvin Probe Force Microscopy (KPFM) Piezo Response Microscopy (PFM) Lateral Force Microscopy (LFM)

7 TECHNIQUES & FACILITIES: PREP Specimen Preparation Low-kV ion beam milling (for flat, cross-section & TEM specimens) Ultramicrotomy (incl. Cryo) FIB liftout Critical point drying (CPD) Microwave Processing Plunge Freezing Metal sputter coating Evaporative carbon coating

8 SAMPLE TYPES Metals, oxides Nanoparticles, nanotubes, nanowires Biological material Geological samples Thin films Micelles Powders For samples not inherently vacuum stable, special preparation strategies are required Only small sample size required (~1cm 2, 1g) Good specimen preparation = Good microscopy

9 USERS ~750 active users Internal & external university researchers from Honours level onward Supervisors are requested to contact the EMU Director (Richard Tilley) to discuss training of undergraduates, Taste of Research students, short-term visitors, etc. Other research institutions (e.g., CSIRO, ANSTO, Australian Museum) Industry users/clients Training Collaboration Consultancy

10 REFERENCING & ACKNOWLEDGEMENT REFERENCING%20AND%20ACKNOWLEDGEMENT It is a condition of use that the EMU be acknowledged in all publications and communications which result from access to our facilities and expertise. This information is required for reporting to funding bodies and provides a means of measuring our impact, and is essential for the EMU s continued support and expansion of its capabilities. Let us know when you publish! Please us at: EMUAdmin@unsw.edu.au See the above link for acknowledgement templates for: Use of EMU facilities and/or expertise Use of AMMRF-sponsored facilities at the EMU Co-authorship with EMU staff

11 OPTIMISE YOUR EMU EXPERIENCE Advance preparation: Literature review (including relevant microscopy papers/techniques) Consult with other members of your research group Know your samples & your research question/hypothesis Budget your time to allow for unforseen results or delays Consult with EMU staff as early in the process as possible to discuss the best instrument(s)/techniques for your work, time/cost estimates, training/access waiting times, collaboration Coordinate with your colleagues: Can you divide up the microscopy techniques so that you minimise training time/costs and maximise your ability to develop your skills (& therefore quality of output)? Prioritise & target your research question(s): How many samples / how much data do you need to answer your question? Ensure you are using the most effective and efficient techniques to answer your question(s) check the MWAC & AMMRF facilities Questions? Concerns? Problems? Exciting results? Talk to us! You are the experts in your samples/field; we are microscopy experts We are here to support your research from start to finish

12 NEED MORE INFORMATION? Information for prospective new users & supervisors Staff list Available facilities Breakdown of training pathway, including time estimates, for each major technique Link to AMMRF MyScope online microscopy training tool Charges for microscopy & preparation training, usage & services Image of the Month winning entries