Scanning Electron Microscopy

Size: px
Start display at page:

Download "Scanning Electron Microscopy"

Transcription

1 Scanning Electron Microscopy Amanpreet Kaur 1

2 Scanning Electron Microscopy What is scanning electron microscopy? Basic features of conventional SEM Limitations of conventional SEM Looking at wet samples in the high vacuum SEM Cryo-SEM and Environmental SEM 2

3 SEM & TEM Electron gun Electron gun Condenser lens Objective lens Specimen Projector lens Fluorescent screen Specimen Digital camera Scanning electron microscope Transmission electron microscope Workshop: 31 st October 3

4 SEM Scanning electron microscope 4

5 Electron sources for SEM Schottky Field Emission Source High brightness Tungsten thermionic source Energy spread < 0.5 ev Low brightness Energy spread ~ 1-2eV 5

6 SEM Scanning electron microscope 6

7 Interaction of high-energy electrons with specimen 7

8 Interaction of electrons with specimen S = secondary B = backscattered (A are auger) 8

9 Secondary and backscattered electrons What are secondary electrons? They are electrons dislodged from the specimen itself. What are backscattered electrons? They are primary electrons that have entered the sample and then escaped back out. 9

10 Detectors for SEM Secondary electrons Backscattered electrons Everhart Thornley or solid state detector (silicon diode). Usually positioned around the final lens or inside. Everhart Thornley detector (ETD): Scintillator photomultiplier system. 10

11 Information given by different signals Secondary electrons Topographic information Backscattered electrons Compositional information X-rays - Spectra - Maps Session on X-ray analysis and Elemental Mapping: 21 st November 11

12 Origin of topographic contrast Everhart Thornley detector 12

13 Detector efficiency contrast pseudo-octahedral crystal of the compound [NC 6 H 8 ][GaGe 3 S 8 ] a mixed Germanium and Gallium Sulphide framework material 50% collected somewhat bright 10% collected - Dark 100% collected - Bright 13

14 Early history of SEM 1935, M. Knoll, Germany proposed concept of a scanning electron microscope. 1942, Zworykin et al., RCA Laboratories, USA - first working SEM. 1950s, C.W. Oatley et al., Engineering Department, Cambridge - major improvements in electron optics and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument Company, Stereoscan Mark 1. 14

15 EM Lab s high vacuum SEM 15

16 Conventional SEM images Compact disc Polypropylene spherulites Integrated circuit 16

17 Problems with conventional SEM Can only operate at low pressure (10-5 Torr) No wet samples Surface must be electrically conducting Non-conducting samples have to be coated 17

18 Looking at wet samples in the high vacuum SEM Animal and plant tissues up to 98% water. Options for examining these materials in the high vacuum SEM: Freeze drying Chemical fixation, critical point drying 18

19 Critical point drying Evaporative drying of specimens can cause collapse of structures, mainly due to effects of surface tension. Effect can be reduced by substitution of water with a liquid with a lower surface tension Specimen prepared by CPD: Hyphae and spores in Stilton cheese 19

20 Sample prepared by fixation & critical point drying Euphorbia seed. Amal Al Hasan, SBS. 20

21 Cryo - SEM Workshop: 7 th November 21

22 Cryo SEM of food Potato showing starch grains Scale bar 100 μm Probiotic yoghurt with bacteria. Scale bar 5μm 22

23 Environmental SEM Special pumping system allows water vapour to be introduced into chamber. Cooled specimen to retain moisture. New (backscattered) electron detector. Cooled specimen Workshop: 7 th November 23

24 Introducing water vapour into the chamber enables uncoated samples to be examined Secondary electrons from sample strike water molecules. Positively charged water molecules are attracted to negatively charged sample. Negative charge at sample surface is neutralized.. 24

25 EM Lab s FEI Quanta 600 ESEM Gaseous secondary electron detector fits on objective lens. Pressures up to 20 Torr - samples typically cooled to 5 o C. 25

26 Environmental SEM Raspberry buds : Hiroyuki Imanishi, Plant Sciences 26

27 Becoming an EMLab user Sherrie Foo 27

28 Booking system 28

29 Remaining workshops Date Topic 31 October November November November November 2017 Transmission Electron Microscopy Environmental & Cryo SEM Biological specimen preparation for SEM X-ray Analysis and Elemental Mapping Biological specimen preparation for TEM 29

30 Electron Microscopy Laboratory Questions? Demo 30

Scanning Electron Microscopy

Scanning Electron Microscopy Scanning Electron Microscopy Field emitting tip Grid 2kV 100kV Anode ZEISS SUPRA Variable Pressure FESEM Dr Heath Bagshaw CMA bagshawh@tcd.ie Why use an SEM? Fig 1. Examples of features resolvable using

More information

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE 21.05.2010 Hacettepe University SCANNING ELECTRON MICROSCOPE Berrak BOYBEK Tuğba ÖZTÜRK Vicdan PINARBAŞI Cahit YAYAN OUTLINE Definition of scanning electron microscope History Applications of SEM Components

More information

Everhart-Thornley detector

Everhart-Thornley detector SEI Detector Everhart-Thornley detector Microscope chamber wall Faraday cage Scintillator Electrons in Light pipe Photomultiplier Electrical signal out Screen Quartz window +200 V +10 kv Always contains

More information

Why microscopy?

Why microscopy? Electron Microscopy Why microscopy? http://www.cellsalive.com/howbig.htm 2 Microscopes are used as magnifying tools (although not exclusively as will see later on). The resolution of the human eye is limited

More information

Part II: Thin Film Characterization

Part II: Thin Film Characterization Part II: Thin Film Characterization General details of thin film characterization instruments 1. Introduction to Thin Film Characterization Techniques 2. Structural characterization: SEM, TEM, AFM, STM

More information

Gaetano L Episcopo. Scanning Electron Microscopy Focus Ion Beam and. Pulsed Plasma Deposition

Gaetano L Episcopo. Scanning Electron Microscopy Focus Ion Beam and. Pulsed Plasma Deposition Gaetano L Episcopo Scanning Electron Microscopy Focus Ion Beam and Pulsed Plasma Deposition Hystorical background Scientific discoveries 1897: J. Thomson discovers the electron. 1924: L. de Broglie propose

More information

= 6 (1/ nm) So what is probability of finding electron tunneled into a barrier 3 ev high?

= 6 (1/ nm) So what is probability of finding electron tunneled into a barrier 3 ev high? STM STM With a scanning tunneling microscope, images of surfaces with atomic resolution can be readily obtained. An STM uses quantum tunneling of electrons to map the density of electrons on the surface

More information

HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai

HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS SCSAM Short Course Amir Avishai RESEARCH QUESTIONS Sea Shell Cast Iron EDS+SE Fe Cr C Objective Ability to ask the

More information

Scanning Electron Microscopy & Ancillary Techniques

Scanning Electron Microscopy & Ancillary Techniques Scanning Electron Microscopy & Ancillary Techniques By Pablo G. Caceres-Valencia The prototype of the first Stereoscan supplied by the Cambridge Instrument Company to the dupont Company, U.S.A. (1965)

More information

Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist

Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist 12.141 Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist Massachusetts Institute of Technology Electron Microprobe Facility Department of Earth, Atmospheric and Planetary

More information

Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist

Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist 12.141 Electron Microprobe Analysis 1 Nilanjan Chatterjee, Ph.D. Principal Research Scientist Massachusetts Institute of Technology Electron Microprobe Facility Department of Earth, Atmospheric and Planetary

More information

Chapter 9. Electron mean free path Microscopy principles of SEM, TEM, LEEM

Chapter 9. Electron mean free path Microscopy principles of SEM, TEM, LEEM Chapter 9 Electron mean free path Microscopy principles of SEM, TEM, LEEM 9.1 Electron Mean Free Path 9. Scanning Electron Microscopy (SEM) -SEM design; Secondary electron imaging; Backscattered electron

More information

I live in this atom, with my other electron brothers

I live in this atom, with my other electron brothers Hello, my name is Electron, John Electron. I am going to tell you how my work is in an electron microscope. I live in this atom, with my other electron brothers The filament crowns the column of the electron

More information

Modern Optical Spectroscopy

Modern Optical Spectroscopy Modern Optical Spectroscopy X-Ray Microanalysis Shu-Ping Lin, Ph.D. Institute of Biomedical Engineering E-mail: splin@dragon.nchu.edu.tw Website: http://web.nchu.edu.tw/pweb/users/splin/ Backscattered

More information

3 Scanning Electron Microscopy

3 Scanning Electron Microscopy 3 Scanning Electron Microscopy David C. Joy University of Tennessee, Knoxville, TN, U.S.A. List of Symbols and Abbreviations 222 3.1 Introduction and Historical Summary 223 3.2 Principles of the Scanning

More information

Electron beam scanning

Electron beam scanning Electron beam scanning The Electron beam scanning operates through an electro-optical system which has the task of deflecting the beam Synchronously with cathode ray tube which create the image, beam moves

More information

Model : JEOL JSM 7610f

Model : JEOL JSM 7610f Name Field Emission Electron Scanning Microscopy (FESEM) Make: JEOL India Pvt Ltd. Model : JEOL JSM 7610f Specification Electron gun : Schottky type field emission (T-FE) gun Electron Beam resolution (secondary

More information

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500

More information

SOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani

SOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani SOLID STATE PHYSICS PHY F341 Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani 333031 manjula@bits-pilani.ac.in Characterization techniques SEM AFM STM BAM Outline What can we use

More information

AP5301/ Name the major parts of an optical microscope and state their functions.

AP5301/ Name the major parts of an optical microscope and state their functions. Review Problems on Optical Microscopy AP5301/8301-2015 1. Name the major parts of an optical microscope and state their functions. 2. Compare the focal lengths of two glass converging lenses, one with

More information

MSE 321 Structural Characterization

MSE 321 Structural Characterization Optical Microscope Plan Lenses In an "ideal" single-element lens system all planar wave fronts are focused to a point at distance f from the lens; therefore: Image near the optical axis will be in perfect

More information

SEM Doctoral Course MS-636. April 11-13, 2016

SEM Doctoral Course MS-636. April 11-13, 2016 Thomas LaGrange, Ph.D. Faculty Lecturer and Senior Staff Scientist Electron Sources, Optics and Detectors SEM Doctoral Course MS-636 April 11-13, 2016 Summary Electron propagation is only possible through

More information

Weak-Beam Dark-Field Technique

Weak-Beam Dark-Field Technique Basic Idea recall bright-field contrast of dislocations: specimen close to Bragg condition, s î 0 Weak-Beam Dark-Field Technique near the dislocation core, some planes curved to s = 0 ) strong Bragg reflection

More information

Massachusetts Institute of Technology. Dr. Nilanjan Chatterjee

Massachusetts Institute of Technology. Dr. Nilanjan Chatterjee Massachusetts Institute of Technology Dr. Nilanjan Chatterjee Electron Probe Micro-Analysis (EPMA) Imaging and micrometer-scale chemical compositional analysis of solids Signals produced in The Electron

More information

Transmission Electron Microscopy

Transmission Electron Microscopy L. Reimer H. Kohl Transmission Electron Microscopy Physics of Image Formation Fifth Edition el Springer Contents 1 Introduction... 1 1.1 Transmission Electron Microscopy... 1 1.1.1 Conventional Transmission

More information

Basic Principles Brief history of EM

Basic Principles Brief history of EM SIR WILLIAM DUNN SCHOOL OF PATHOLOGY Basic Principles of Electron Microscopy (EM) Dr Errin Johnson Head of the Dunn School EM Facility Basic Principles Brief history of EM 1873 Hermann von Helmholtz &

More information

Microscopy, Staining, and Classification

Microscopy, Staining, and Classification PowerPoint Lecture Presentations prepared by Mindy Miller-Kittrell, North Carolina State University C H A P T E R 4 Microscopy, Staining, and Classification Microscopy Light Microscopy 1) Bright-field

More information

Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors

Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors Platinum Metals Rev., 2014, 58, (2), 106 110 FINAL ANALYSIS Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors Heterogeneous catalysis often involves the use of

More information

History of 3D Electron Microscopy and Helical Reconstruction

History of 3D Electron Microscopy and Helical Reconstruction T H E U N I V E R S I T Y of T E X A S S C H O O L O F H E A L T H I N F O R M A T I O N S C I E N C E S A T H O U S T O N History of 3D Electron Microscopy and Helical Reconstruction For students of HI

More information

Ch 2 Part 2. The Microscope

Ch 2 Part 2. The Microscope Ch 2 Part 2 The Microscope SLOs for Microscopic Analysis of Microorganisms Convert among the different units of the metric system. List and describe three elements of good microscopy. Differentiate between

More information

Analytical Methods for Materials

Analytical Methods for Materials Analytical Methods for Materials Lesson 21 Electron Microscopy and X-ray Spectroscopy Suggested Reading Leng, Chapter 3, pp. 83-126; Chapter 4, pp. 127-160; Chapter 6, pp. 191-219 P.J. Goodhew, J. Humphreys

More information

QUANTUM PHYSICS. Limitation: This law holds well only for the short wavelength and not for the longer wavelength. Raleigh Jean s Law:

QUANTUM PHYSICS. Limitation: This law holds well only for the short wavelength and not for the longer wavelength. Raleigh Jean s Law: Black body: A perfect black body is one which absorbs all the radiation of heat falling on it and emits all the radiation when heated in an isothermal enclosure. The heat radiation emitted by the black

More information

Introduction to Electron Microscopy Andres Kaech. Instrumentation

Introduction to Electron Microscopy Andres Kaech. Instrumentation Center for Microscopy and Image Analysis Introduction to Electron Microscopy Andres Kaech Instrumentation The types of electron microscopes Transmission electron microscope (TEM) Scanning electron microscope

More information

Scanning electron microscopy

Scanning electron microscopy Scanning electron microscopy Fei Quanta Tabletop Hitachi Example: Tin soldier Pb M Sn L Secondary electrons Backscatter electrons EDS analysis Average composition Learning goals: Understanding the principle

More information

h p λ = mν Back to de Broglie and the electron as a wave you will learn more about this Equation in CHEM* 2060

h p λ = mν Back to de Broglie and the electron as a wave you will learn more about this Equation in CHEM* 2060 Back to de Broglie and the electron as a wave λ = mν h = h p you will learn more about this Equation in CHEM* 2060 We will soon see that the energies (speed for now if you like) of the electrons in the

More information

TEST BANK FOR PRESCOTTS MICROBIOLOGY 9TH EDITION BY WILLEY SHERWOOD WOOLVERTON

TEST BANK FOR PRESCOTTS MICROBIOLOGY 9TH EDITION BY WILLEY SHERWOOD WOOLVERTON TEST BANK FOR PRESCOTTS MICROBIOLOGY 9TH EDITION BY WILLEY SHERWOOD WOOLVERTON Link download full: https://testbankservice.com/download/test-bank-for-prescottsmicrobiology-9th-edition-by-willey-sherwood-woolverton/

More information

SEM stands for Scanning Electron Microscopy. The earliest known work describing

SEM stands for Scanning Electron Microscopy. The earliest known work describing 1. HISTORY ABOUT SEM SEM stands for Scanning Electron Microscopy. The earliest known work describing the concept of a Scanning Electron Microscope was by M. Knoll (1935) who, along with other pioneers

More information

Chapter 10. Nanometrology. Oxford University Press All rights reserved.

Chapter 10. Nanometrology. Oxford University Press All rights reserved. Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands

More information

á1181ñ SCANNING ELECTRON MICROSCOPY

á1181ñ SCANNING ELECTRON MICROSCOPY USP 40 General Information / á1181ñ Scanning Electron Microscopy 1 á1181ñ SCANNING ELECTRON MICROSCOPY INTRODUCTION Over the last few decades, electron microscopy has become a reliable investigative tool

More information

object objective lens eyepiece lens

object objective lens eyepiece lens Advancing Physics G495 June 2015 SET #1 ANSWERS Field and Particle Pictures Seeing with electrons The compound optical microscope Q1. Before attempting this question it may be helpful to review ray diagram

More information

Introduction to Electron Beam Lithography

Introduction to Electron Beam Lithography Introduction to Electron Beam Lithography Boštjan Berčič (bostjan.bercic@ijs.si), Jožef Štefan Institute, Jamova 39, 1000 Ljubljana, Slovenia 1. Introduction Electron Beam Lithography is a specialized

More information

Surface Analysis. Dr. Lynn Fuller Dr. Fuller s Webpage:

Surface Analysis. Dr. Lynn Fuller Dr. Fuller s Webpage: ROCHESTER INSTITUTE OF TECHNOLOGY MICROELECTRONIC ENGINEERING Surface Analysis Dr. Lynn Fuller Dr. Fuller s Webpage: http://people.rit.edu/lffeee 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585)

More information

CBE Science of Engineering Materials. Scanning Electron Microscopy (SEM)

CBE Science of Engineering Materials. Scanning Electron Microscopy (SEM) CBE 30361 Science of Engineering Materials Scanning Electron Microscopy (SEM) Scale of Structure Organization Units: micrometer = 10-6 m = 1µm nanometer= 10-9 m = 1nm Angstrom = 10-10 m = 1Å A hair is

More information

Praktikum zur. Materialanalytik

Praktikum zur. Materialanalytik Praktikum zur Materialanalytik Energy Dispersive X-ray Spectroscopy B513 Stand: 19.10.2016 Contents 1 Introduction... 2 2. Fundamental Physics and Notation... 3 2.1. Alignments of the microscope... 3 2.2.

More information

sin" =1.22 # D "l =1.22 f# D I: In introduction to molecular electron microscopy - Imaging macromolecular assemblies

sin =1.22 # D l =1.22 f# D I: In introduction to molecular electron microscopy - Imaging macromolecular assemblies I: In introduction to molecular electron microscopy - Imaging macromolecular assemblies Yifan Cheng Department of Biochemistry & Biophysics office: GH-S472D; email: ycheng@ucsf.edu 2/20/2015 - Introduction

More information

Scanning Tunneling Microscopy Transmission Electron Microscopy

Scanning Tunneling Microscopy Transmission Electron Microscopy Scanning Tunneling Microscopy Transmission Electron Microscopy Speakers Burcu Başar Semih Gezgin Yavuz Selim Telis Place Hacettepe University Department of Chemical Engineering It s a small world after

More information

Transmission-mode Imaging in the Environmental Scanning Electron Microscope (ESEM)

Transmission-mode Imaging in the Environmental Scanning Electron Microscope (ESEM) Transmission-mode Imaging in the Environmental Scanning Electron Microscope (ESEM) Lech Staniewicz Churchill College University of Cambridge This dissertation is submitted for the degree of Doctor of Philosophy.

More information

Basic structure of SEM

Basic structure of SEM Table of contents Basis structure of SEM SEM imaging modes Comparison of ordinary SEM and FESEM Electron behavior Electron matter interaction o Elastic interaction o Inelastic interaction o Interaction

More information

Low Vacuum Scanning Electron Microscopy and Microanalysis

Low Vacuum Scanning Electron Microscopy and Microanalysis Low Vacuum Scanning Electron Microscopy and Microanalysis Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM), Debbie J Stokes, John Wiley&Sons 2008 Several

More information

Electron Microscopy. SEM = Scanning Electron Microscopy TEM = Transmission Electron Microscopy. E. coli, William E. Bentley, Maryland, USA

Electron Microscopy. SEM = Scanning Electron Microscopy TEM = Transmission Electron Microscopy. E. coli, William E. Bentley, Maryland, USA Electron Microscopy Transmission Electron Microscopy SEM = Scanning Electron Microscopy TEM = Transmission Electron Microscopy Sara Henriksson, UCEM 2017-02-16 E. coli, William E. Bentley, Maryland, USA

More information

EEE4106Z Radiation Interactions & Detection

EEE4106Z Radiation Interactions & Detection EEE4106Z Radiation Interactions & Detection 2. Radiation Detection Dr. Steve Peterson 5.14 RW James Department of Physics University of Cape Town steve.peterson@uct.ac.za May 06, 2015 EEE4106Z :: Radiation

More information

tip conducting surface

tip conducting surface PhysicsAndMathsTutor.com 1 1. The diagram shows the tip of a scanning tunnelling microscope (STM) above a conducting surface. The tip is at a potential of 1.0 V relative to the surface. If the tip is sufficiently

More information

Chapter 4 Scintillation Detectors

Chapter 4 Scintillation Detectors Med Phys 4RA3, 4RB3/6R03 Radioisotopes and Radiation Methodology 4-1 4.1. Basic principle of the scintillator Chapter 4 Scintillation Detectors Scintillator Light sensor Ionizing radiation Light (visible,

More information

Ecole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools

Ecole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools 1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron

More information

Biology Slide 1 of 31

Biology Slide 1 of 31 Biology 1 of 31 2 of 31 The Discovery of the Cell The Discovery of the Cell Because there were no instruments to make cells visible, the existence of cells was unknown for most of human history. This changed

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

Molecular electron microscopy

Molecular electron microscopy Molecular electron microscopy - Imaging macromolecular assemblies Yifan Cheng Department of Biochemistry & Biophysics office: GH-S427B; email: ycheng@ucsf.edu 2/22/2013 - Introduction of Molecular Microscopy:

More information

STUDY AND ANALYSIS OF THE FAILED USB DEVICES USED IN COPPER MINE USING ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY

STUDY AND ANALYSIS OF THE FAILED USB DEVICES USED IN COPPER MINE USING ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY STUDY AND ANALYSIS OF THE FAILED USB DEVICES USED IN COPPER MINE USING ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY Ayush Garg Department of Chemical and Materials Engineering,

More information

Use of light microscope and stereomicroscope: measuring microscopic

Use of light microscope and stereomicroscope: measuring microscopic Experiment 1 Use of light microscope and stereomicroscope: measuring microscopic objects 1.1 Introduction The microscope is a major tool used by biologists, which was invented about 350 years ago. It is

More information

Microscopy, Staining, and Classification

Microscopy, Staining, and Classification PowerPoint Lecture Presentations prepared by Mindy Miller-Kittrell, North Carolina State University C H A P T E R 4 Microscopy, Staining, and Classification 4. Discuss how microscopy has revealed the structure

More information

Solution set for EXAM IN TFY4265/FY8906 Biophysical microtechniques

Solution set for EXAM IN TFY4265/FY8906 Biophysical microtechniques ENGLISH NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY DEPARTMENT OF PHYSICS Contact during exam: Magnus Borstad Lilledahl Telefon: 73591873 (office) 92851014 (mobile) Solution set for EXAM IN TFY4265/FY8906

More information

CHARACTERIZATION of NANOMATERIALS KHP

CHARACTERIZATION of NANOMATERIALS KHP CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope

More information

Invited Lecture. "Different Aspects of Electron Microscopy. Sardar Vallabhbhai National Institute of Technology, Surat. Deepak Rajput & S.K.

Invited Lecture. Different Aspects of Electron Microscopy. Sardar Vallabhbhai National Institute of Technology, Surat. Deepak Rajput & S.K. Invited Lecture on "Different Aspects of Electron Microscopy at Sardar Vallabhbhai National Institute of Technology, Surat Deepak Rajput & S.K. Tiwary R&D and Product Development Essar Steel Limited Abstract

More information

Auger Electron Spectroscopy (AES)

Auger Electron Spectroscopy (AES) 1. Introduction Auger Electron Spectroscopy (AES) Silvia Natividad, Gabriel Gonzalez and Arena Holguin Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving

More information

Questions/Answers. Chapter 1

Questions/Answers. Chapter 1 Questions/Answers Chapter 1 1.1 What are the advantages of the SEM over optical microscopy? Advantages: Higher resolution and greater depth of field and microchemical analysis Disadvantages: Expensive,

More information

Practical course in scanning electron microscopy

Practical course in scanning electron microscopy Practical course in scanning electron microscopy Fortgeschrittenen Praktikum an der Technischen Universität München Wintersemester 2017/2018 Table of contents 1. Introduction 3 2. Formation of an electron

More information

PHASE CHANGE. Freezing Sublimation

PHASE CHANGE. Freezing Sublimation Melting Graphic Organizer Deposition PHASE CHANGE Freezing Sublimation Boiling Evaporation Condensation PHASE CHANGE Phase change happens as the temperature changes. All matter can move from one state

More information

Laboratory lecture in Introduction to Nanooptics (2012 SS)

Laboratory lecture in Introduction to Nanooptics (2012 SS) INO12_lab_lecture_2012-07-13.docx 1 Laboratory lecture in Introduction to Nanooptics (2012 SS) by Prof. Thomas PERTSCH at Friedrich-Schiller-Universität Jena in summer term 2012 13 July, 2012, 12:45 15:15

More information

An Anomalous Contrast in Scanning Electron Microscopy of Insulators: The Pseudo Mirror Effect.

An Anomalous Contrast in Scanning Electron Microscopy of Insulators: The Pseudo Mirror Effect. SCANNING VOL., 35-356 (000) Received: March 7, 000 FAMS, Inc. Accepted with revision: August, 000 An Anomalous Contrast in Scanning Electron Microscopy of Insulators: The Pseudo Mirror Effect. M. BELHAJ

More information

Information from Every Angle

Information from Every Angle pplication Note Information from Every ngle Directional SE Detector for Next-Level Imaging Zinc oxide nanorods with surficial palladium particles imaged at 500 V in high vacuum. dding palladium increases

More information

Electron Microscopy (TEM and SEM)

Electron Microscopy (TEM and SEM) 7 Electron Microscopy (TEM and SEM) Paul Verkade Wolfson Bioimaging Facility, Physiology & Pharmacology and Biochemistry, University of Bristol, UK 7.1 Basic how-to-do and why-do section 7.1.1 Electron

More information

EM-30AX is very good space utilization

EM-30AX is very good space utilization EM helps to grasp material characteristics through providing precise images. EM makes it possible to analyze deep submicron or nanometer structure. Alteration of material caused by pressure, heat can be

More information

UNIT-III QUANTUM PHYSICS

UNIT-III QUANTUM PHYSICS UNIT-III QUANTUM PHYSICS SYLLABUS Black body radiation Planck s theory (derivation) Deduction of Wien s displacement law and Rayleigh Jeans Law from Planck s theory Compton Effect-Theory and experimental

More information

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 13:00 Monday, 12/February/2018 (P/T 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases

More information

The Discovery of the Cell

The Discovery of the Cell The Discovery of the Cell The Discovery of the Cell Because there were no instruments to make cells visible, the existence of cells was unknown for most of human history. This changed with the invention

More information

Dual Beam Helios Nanolab 600 and 650

Dual Beam Helios Nanolab 600 and 650 Dual Beam Helios Nanolab 600 and 650 In the Clean Room facilities of the INA LMA, several lithography facilities permit to pattern structures at the micro and nano meter scale and to create devices. In

More information

MODULE 2 : FOUNDATIONS IN BIOLOGY

MODULE 2 : FOUNDATIONS IN BIOLOGY OCR A LEVEL BIOLOGY MODULE 2 : FOUNDATIONS IN BIOLOGY REVISION NOTES For 2015 onwards specification Miss T Banda All living things are primarily made from 4 key elements: Carbon (C) Hydrogen (H) Oxygen

More information

Mass Spectrometry in MCAL

Mass Spectrometry in MCAL Mass Spectrometry in MCAL Two systems: GC-MS, LC-MS GC seperates small, volatile, non-polar material MS is detection devise (Agilent 320-MS TQ Mass Spectrometer) Full scan monitoring SIM single ion monitoring

More information

Auger Electron Spectroscopy

Auger Electron Spectroscopy Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection

More information

E-Guide. Sample Preparation. A guide to ideal sample preparation

E-Guide. Sample Preparation. A guide to ideal sample preparation E-Guide Sample Preparation A guide to ideal sample preparation Contents Introduction 3 1. Basic sample preparation 4 2. Non-conductive samples 5 2.1 Use of conductive coating 2.2 Low vacuum 2.3 Sputter

More information

An Introduction to Auger Electron Spectroscopy

An Introduction to Auger Electron Spectroscopy An Introduction to Auger Electron Spectroscopy Spyros Diplas MENA3100 SINTEF Materials & Chemistry, Department of Materials Physics & Centre of Materials Science and Nanotechnology, Department of Chemistry,

More information

Introduction to the Q Trap LC/MS/MS System

Introduction to the Q Trap LC/MS/MS System www.ietltd.com Proudly serving laboratories worldwide since 1979 CALL +1.847.913.0777 for Refurbished & Certified Lab Equipment ABI Q Trap LC/MS/MS Introduction to the Q Trap LC/MS/MS System The Q Trap

More information

THIN FILMS FOR PHOTOVOLTAICS AND OTHER APPLICATIONS. BY Dr.A.K.SAXENA PHOTONICS DIVISION INDIAN INSTITUTE OF ASTROPHYSICS

THIN FILMS FOR PHOTOVOLTAICS AND OTHER APPLICATIONS. BY Dr.A.K.SAXENA PHOTONICS DIVISION INDIAN INSTITUTE OF ASTROPHYSICS THIN FILMS FOR PHOTOVOLTAICS AND OTHER APPLICATIONS BY Dr.A.K.SAXENA PHOTONICS DIVISION INDIAN INSTITUTE OF ASTROPHYSICS BACKGROUND 2.8 meter coating plant at VBO, Kavalur 1.5 meter coating plant at VBO,

More information

Preparation Of Biological Specimens For Scanning Electron Microscopy By Judith A. Murphy

Preparation Of Biological Specimens For Scanning Electron Microscopy By Judith A. Murphy Preparation Of Biological Specimens For Scanning Electron Microscopy By Judith A. Murphy If you are looking for a ebook by Judith A. Murphy Preparation of Biological Specimens for Scanning Electron Microscopy

More information

Lecture 15: Introduction to mass spectrometry-i

Lecture 15: Introduction to mass spectrometry-i Lecture 15: Introduction to mass spectrometry-i Mass spectrometry (MS) is an analytical technique that measures the mass/charge ratio of charged particles in vacuum. Mass spectrometry can determine masse/charge

More information

Chemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5

Chemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5 Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4

More information

The Effect of Magnetic Field Direction on the Imaging Quality of Scanning Electron Microscope

The Effect of Magnetic Field Direction on the Imaging Quality of Scanning Electron Microscope Journal of Magnetics (), 49-54 (07) ISSN (Print) 6-750 ISSN (Online) 33-6656 https://doi.org/0.483/jmag.07...049 The Effect of Magnetic Field Direction on the Imaging Quality of Scanning Electron Microscope

More information

Electron Microprobe Analysis and Scanning Electron Microscopy

Electron Microprobe Analysis and Scanning Electron Microscopy Electron Microprobe Analysis and Scanning Electron Microscopy Electron microprobe analysis (EMPA) Analytical technique in which a beam of electrons is focused on a sample surface, producing X-rays from

More information

Nano-Microscopy. Lecture 2. Scanning and Transmission Electron Microscopies: Principles. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA

Nano-Microscopy. Lecture 2. Scanning and Transmission Electron Microscopies: Principles. Pavel Zinin HIGP, University of Hawaii, Honolulu, USA GG 711: Advanced Techniques in Geophysics and Materials Science Nano-Microscopy. Lecture 2 Scanning and Transmission Electron Microscopies: Principles Pavel Zinin HIGP, University of Hawaii, Honolulu,

More information

Chapter 12. Nanometrology. Oxford University Press All rights reserved.

Chapter 12. Nanometrology. Oxford University Press All rights reserved. Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology

More information

Questions on Electric Fields

Questions on Electric Fields Questions on Electric Fields 1. The diagram shows a positively charged oil drop held at rest between two parallel conducting plates A and B. Oil drop A B 2.50 cm The oil drop has a mass 9.79 x 10 15 kg.

More information

Introduction to electron microscopes: electron optics, interactions and signals

Introduction to electron microscopes: electron optics, interactions and signals Introduction to electron microscopes: electron optics, interactions and signals J.L. Lábár 1 Research Institute for Technical Physics and Materials Science, H-1121, Budapest, Konkoly- Thege u. 29-33, Hungary

More information

X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu

X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-ray Photoelectron Spectroscopy Introduction Qualitative analysis Quantitative analysis Charging compensation Small area analysis and XPS imaging

More information

6.5 Optical-Coating-Deposition Technologies

6.5 Optical-Coating-Deposition Technologies 92 Chapter 6 6.5 Optical-Coating-Deposition Technologies The coating process takes place in an evaporation chamber with a fully controlled system for the specified requirements. Typical systems are depicted

More information

Part I Basics and Methods

Part I Basics and Methods j1 Part I Basics and Methods In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science, First Edition. Edited by Gerhard Dehm, James M. Howe, and Josef Zweck. Ó 2012 Wiley-VCH

More information

DEPOSITION OF THIN TiO 2 FILMS BY DC MAGNETRON SPUTTERING METHOD

DEPOSITION OF THIN TiO 2 FILMS BY DC MAGNETRON SPUTTERING METHOD Chapter 4 DEPOSITION OF THIN TiO 2 FILMS BY DC MAGNETRON SPUTTERING METHOD 4.1 INTRODUCTION Sputter deposition process is another old technique being used in modern semiconductor industries. Sputtering

More information

Conventional Transmission Electron Microscopy. Introduction. Text Books. Text Books. EMSE-509 CWRU Frank Ernst

Conventional Transmission Electron Microscopy. Introduction. Text Books. Text Books. EMSE-509 CWRU Frank Ernst Text Books Conventional Transmission Electron Microscopy EMSE-509 CWRU Frank Ernst D. B. Williams and C. B. Carter: Transmission Electron Microscopy, New York: Plenum Press (1996). L. Reimer: Transmission

More information

POSITRON AND POSITRONIUM INTERACTIONS WITH CONDENSED MATTER. Paul Coleman University of Bath

POSITRON AND POSITRONIUM INTERACTIONS WITH CONDENSED MATTER. Paul Coleman University of Bath POSITRON AND POSITRONIUM INTERACTIONS WITH CONDENSED MATTER Paul Coleman University of Bath THE FATE OF POSITRONS IN CONDENSED MATTER POSITRON-SURFACE INTERACTIONS positron backscattering BACKSCATTERED

More information

Techniques EDX, EELS et HAADF en TEM: possibilités d analyse et applications

Techniques EDX, EELS et HAADF en TEM: possibilités d analyse et applications Techniques EDX, EELS et HAADF en TEM: possibilités d analyse et applications Thomas Neisius Université Paul Cézanne Plan Imaging modes HAADF Example: supported Pt nanoparticles Electron sample interaction

More information

Chemistry Instrumental Analysis Lecture 19 Chapter 12. Chem 4631

Chemistry Instrumental Analysis Lecture 19 Chapter 12. Chem 4631 Chemistry 4631 Instrumental Analysis Lecture 19 Chapter 12 There are three major techniques used for elemental analysis: Optical spectrometry Mass spectrometry X-ray spectrometry X-ray Techniques include:

More information