NDF08N50Z, NDP08N50Z. N-Channel Power MOSFET. Low ON Resistance Low Gate Charge 100% Avalanche Tested These Devices are Pb Free and are RoHS Compliant
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1 N-Channel Power MOSFET 500 V, 0.69 Features Low ON Resistance Low Gate Charge 0% Avalanche Tested These Devices are Pb Free and are RoHS Compliant ABSOLUTE MAXIMUM RATINGS (T C = 25 C unless otherwise noted) Rating Symbol NDF08N50Z NDP08N50Z Unit Drain to Source Voltage V DSS 500 V Continuous Drain Current I D 7.5 (Note 1) 7.5 A R JC Continuous Drain Current R JC T A = 0 C Pulsed Drain Current, V V I D 4.7 (Note 1) 4.7 A I DM 30 (Note 1) 30 A V DSS R DS(ON) 3.6 A 500 V 0.69 N Channel D (2) G (1) Power Dissipation P D W Gate to Source Voltage V GS 30 V Single Pulse Avalanche Energy, I D = 7.5 A ESD (HBM) (JESD 22 A114) RMS Isolation Voltage (t = 0.3 sec., R.H. 30%, T A = 25 C) (Figure 14) E AS 190 mj V esd 3500 V V ISO 4500 V Peak Diode Recovery dv/dt 4.5 V/ns Continuous Source Current (Body Diode) Maximum Temperature for Soldering Leads Operating Junction and Storage Temperature Range I S 7.5 A T L 260 C T J, T stg 55 to 150 C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Limited by maximum junction temperature 2. I SD = 7.5 A, di/dt 0 A/ s, V DD BV DSS, T J = +150 C TO 220FP CASE 221D STYLE 1 TO 220AB CASE 221A STYLE 5 A Y WW G Gate MARKING DIAGRAM NDF08N50ZG or NDP08N50ZG AYWW Drain = Location Code = Year = Work Week = Pb Free Package S (3) Source ORDERING INFORMATION Device Package Shipping NDF08N50ZG TO 220FP 50 Units/Rail NDP08N50ZG TO 220AB In Development Semiconductor Components Industries, LLC, 20 April, 20 Rev. 1 1 Publication Order Number: NDF08N50Z/D
2 THERMAL RESISTANCE Parameter Symbol NDF08N50Z NDP08N50Z Unit Junction to Case (Drain) R JC 4.0 C/W Junction to Ambient Steady State (Note 3) R JA Insertion mounted ELECTRICAL CHARACTERISTICS ( unless otherwise noted) Characteristic Test Conditions Symbol Min Typ Max Unit OFF CHARACTERISTICS Drain to Source Breakdown Voltage V GS = 0 V, I D = 1 ma BV DSS 500 V Breakdown Voltage Temperature Coefficient Drain to Source Leakage Current Reference to 25 C, I D = 1 ma V DS = 500 V, V GS = 0 V BV DSS / 0.6 V/ C T J 25 C I DSS 1 A 150 C 50 Gate to Source Forward Leakage V GS = ±20 V I GSS ± A ON CHARACTERISTICS (Note 4) Static Drain to Source On Resistance V GS = V, I D = 3.6 A R DS(on) Gate Threshold Voltage V DS = V GS, I D = 0 A V GS(th) V Forward Transconductance V DS = 15 V, I D = 3.75 A g FS 6.0 S DYNAMIC CHARACTERISTICS Input Capacitance C iss 912 pf Output Capacitance V DS = 25 V, V GS = 0 V, f = MHz C oss 120 Reverse Transfer Capacitance C rss 27 Total Gate Charge Q g 31 nc Gate to Source Charge V DD = 250 V, I D = 7.5 A, Q gs 6.2 Gate to Drain ( Miller ) Charge V GS = V Q gd 17 Plateau Voltage V GP 6.3 V Gate Resistance R g 3.0 RESISTIVE SWITCHING CHARACTERISTICS Turn On Delay Time t d(on) 13 ns Rise Time V DD = 250 V, I D = 7.5 A, t r 23 Turn Off Delay Time V GS = V, R G = 5 t d(off) 31 Fall Time t f 29 SOURCE DRAIN DIODE CHARACTERISTICS (T C = 25 C unless otherwise noted) Diode Forward Voltage I S = 7.5 A, V GS = 0 V V SD 1.6 V Reverse Recovery Time V GS = 0 V, V DD = 30 V t rr 295 ns Reverse Recovery Charge I S = 7.5 A, di/dt = 0 A/ s Q rr 1.85 C 4. Pulse Width 380 s, Duty Cycle 2%. 2
3 TYPICAL CHARACTERISTICS V V 7.0 V 12.0 GS = V 6.5 V V V V Figure 1. On Region Characteristics 20.0 V 18.0 DS = 25 V T 4.0 J = 150 C 2.0 T J = 55 C V GS, GATE TO SOURCE VOLTAGE (V) Figure 2. Transfer Characteristics R DS(on), DRAIN TO SOURCE RESISTANCE ( ) R DS(on), DRAIN TO SOURCE RESISTANCE (NORMALIZED) I D = 3.6 A V GS, GATE TO SOURCE VOLTAGE (V) Figure 3. On Region versus Gate to Source Voltage I D = 3.6 A V GS = V T J, JUNCTION TEMPERATURE ( C) Figure 5. On Resistance Variation with Temperature R DS(on), DRAIN TO SOURCE RESISTANCE ( ) BV DSS, NORMALIZED BREAKDOWN VOLTAGE (V) V GS = V Figure 4. On Resistance versus Drain Current and Gate Voltage I D = 1 ma T J, JUNCTION TEMPERATURE ( C) Figure 6. BV DSS Variation with Temperature 3
4 TYPICAL CHARACTERISTICS I DSS, LEAKAGE ( A) 0. T J = 150 C T J = 125 C Figure 7. Drain to Source Leakage Current versus Voltage C, CAPACITANCE (pf) C iss V GS = 0 V f = 1 MHz 200 C rss C oss Figure 8. Capacitance Variation V GS, GATE TO SOURCE VOLTAGE (V) Q GS V DS Q T Q GD V GS V DS = 250 V I D = 7.5 A Q g, TOTAL GATE CHARGE (nc) Figure 9. Gate to Source Voltage and Drain to Source Voltage versus Total Charge t, TIME (ns) 0 V DD = 250 V I D = 7.5 A V GS = V t d(off) t r t f t d(on) I S, SOURCE CURRENT (A) T J = 150 C 125 C 25 C 55 C 1 0 R G, GATE RESISTANCE ( ) Figure. Resistive Switching Time Variation versus Gate Resistance V SD, SOURCE TO DRAIN VOLTAGE (V) Figure 11. Diode Forward Voltage versus Current 4
5 TYPICAL CHARACTERISTICS 0 1 V GS 30 V SINGLE PULSE T C = 25 C dc 1 ms ms 0 s s 0.1 R DS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT Figure 12. Maximum Rated Forward Biased Safe Operating Area NDF08N50Z R(t) (C/W) % (DUTY CYCLE) 20% % 5.0% 2.0% % SINGLE PULSE PULSE TIME (s) Figure 13. Thermal Impedance (Junction to Case) for NDF08N50Z R JC = 4.0 C/W Steady State 00 LEADS HEATSINK 0.1 MIN Figure 14. Isolation Test Diagram Measurement made between leads and heatsink with all leads shorted together. *For additional mounting information, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. 5
6 PACKAGE DIMENSIONS H F Q A H K Q Z L V G 4 B B N G N L D 3 PL Y U 0.25 (0.0) M B M Y D A K F T U C S R J TO 220 FULLPAK CASE 221D 03 ISSUE K T S J R SEATING PLANE TO 220 CASE 221A 09 ISSUE AF C T SEATING PLANE NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, CONTROLLING DIMENSION: INCH D-01 THRU 221D-02 OBSOLETE, NEW STANDARD 221D-03. INCHES MILLIMETERS DIM MIN MAX MIN MAX A B C D F G 0.0 BSC 2.54 BSC H J K L N BSC 5.08 BSC Q R S U STYLE 1: PIN 1. GATE 2. DRAIN 3. SOURCE NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, CONTROLLING DIMENSION: INCH. 3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED. INCHES MILLIMETERS DIM MIN MAX MIN MAX A B C D F G H J K L N Q R S T U V Z STYLE 5: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Typical parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including Typicals must be validated for each customer application by customer s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado USA Phone: or Toll Free USA/Canada Fax: or Toll Free USA/Canada orderlit@onsemi.com N. American Technical Support: Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: Japan Customer Focus Center Phone: ON Semiconductor Website: Order Literature: For additional information, please contact your local Sales Representative NDF08N50Z/D
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