3267 Progress Drive Suite 137 Orlando, FL

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2 Cmpany Descriptin NanSpective specializes in materials science with special emphasis n nanscale materials characterizatin. The cmpany prvides analytical services and cnsultatin t a wrldwide market ffering cmplete slutins fr intellectual prperty issues, failure analysis, quality cntrl, and materials research. NanSpective is passinate abut prviding an excellent wrk prduct cmbined with superir custmer supprt. The cmpany is distinctive in the market place by prviding custm-tailred cmmercial analytical services with academic level attentin t detail. Headquartered at the University f Central Flrida s Research Park in Orland, FL, NanSpective is in its 9th year f peratin. In additin t NanSpective s internal facilities, the scientists als wrk with advanced characterizatin equipment hused in varius satellite facilities including but nt limited t the Materials Characterizatin Facility at the University f Central Flrida, the Majr Analytical Instrumentatin Facility at the University f Flrida, the Nantechnlgy research and Educatin Center at the University f Suth Flrida, the Analytical Instrumentatin Facility at Nrth Carlina State University, and the Stanfrd Synchrtrn Radiatin Lightsurce. Wrking clsely with faculty at universities arund the cuntry prvides NanSpective a natinwide netwrk f scientific expertise. Materials Science Slutins Cmpanies wh make prducts need answers t questins abut the quality f the material used in their gds. NanSpective ffers in depth cnsultatin t prvide the right slutin fr a materials science prblem. Innvatin, design, manufacture and supprt are critical t a prduct-based cmpany in industry. Each phase requires careful and cntinuus mnitring in rder t sustain a cmpetitive edge in a glbal marketplace. An additinal layer f cmplexity is added t this challenge when the size f the prduct is reduced t scales typically seen in MEMS, micrelectrnic and phtnic devices. Althugh the functinality f such devices is ften readily measureable, the dimensins present a significant barrier t investigating their cnstructin and layut. Perfrmance and reliability are intimately cnnected t the materials and their integratin int devices; therefre, nanscale materials characterizatin is an indispensible tl. Nanscale characterizatin is essential t prtecting the fruits f innvatin Intellectual Prperty, ensuring that the empirical cnverges with the theretical during the Design prcess, supprting the line during Manufacturing and pinpinting the rigin f a defect in the unfrtunate circumstance f a Failure during manufacture, prcessing r in service.

3 Areas f Expertise NanSpective prvides materials science slutins fr cmpanies wh need t knw mre abut the materials f which their prducts are made even dwn t the atmic level. NanSpective ffers a suite f advanced materials characterizatin ptins. We use cutting edge technlgy and state f the art equipment t perfrm nanscale and macrscpic material prperty evaluatin. Our scientists have industry and research experience in a brad spectrum f materials systems. At NanSpective, ur experience and technical expertise cupled with ur equipment deliver unique capabilities in the areas f integrated circuit, slid-state phtnics, liner and thin film analyses. NanSpective is expert in ptical, X-ray, in and electrn beam characterizatin techniques. Using the FEI 200TEM and FEI DB235, any site-specific regin f interest can be pinpinted with sub-micrmeter accuracy. The FIBs are equipped s that bth insitu and ex-situ specimen preparatin techniques are available. With the Physical Electrnics Adept 1010, Cameca IMS-3f SIMS, Cameca IMS-6f SIMS and the ION TOF SIMS5 the cmpsitin f a material may be determined in the part per billin t part per trillin range. The fully laded state f the art FEI TF30 field emissin TEM allws the determinatin f the crystallgraphy, micrstructure, cmpsitin and chemistry f a material frm regins nly nanmeters in size. The TF30 is equipped with energy dispersive X-ray analysis (X-EDS), electrn energy lss spectrscpy (EELS) and a Gatan Imaging Filter system (GIF) used fr energy filtered TEM (EFTEM). Detailed analyses may als be perfrmed by using the high reslutin imaging techniques in bright field (BF), dark field (DF) and scanning transmissin mdes (STEM). We als ffer services in field emissin scanning electrn micrscpy (SEM), X-ray diffractin (XRD), scanning prbe micrscpy (SPM), electrn prbe micranalysis (EPMA), AUGER electrn spectrscpy (AES), ESCA/XPS, and surface metrlgy.

4 Advanced Materials Characterizatin Techniques Fcused In Beam (FIB) Scanning Transmissin Electrn Micrscpy (STEM) Field Emissin Transmissin Electrn Micrscpy (FE TEM) Electrn Energy Lss Spectrscpy (EELS) Energy Filtered TEM (EFTEM) Energy Dispersive X-Ray Spectrscpy (X-EDS) Secndary In Mass Spectrmetry (SIMS) Field Emissin Scanning Electrn Micrscpy (FE SEM) Light Optical Micrscpy (LOM) Backscattering Spectrmetry (RBS) X-Ray Phtelectrn Spectrscpy (XPS) Auger Electrn Spectrscpy (AES) X-Ray Diffractin (XRD) Optical testing Surface Metrlgy Raman Spectrscpy Furier Transfrm Infrared Spectrscpy (FTIR)

5 NanSpective Team The management team and staff f NanSpective have experience in bth industry and academic materials science applicatins. Each f the three principals is a graduate f the University f Central Flrida. Cllectively, the scientists at NanSpective have areas f expertise in Materials Science, Mechanical and Electrical Engineering and Chemistry. Brenda Prenitzer President and Chief Executive Officer Dr. Prenitzer prvides visin and leadership t the cmpany as well as technical expertise in the areas f materials and materials characterizatin. Her areas f specializatin include scanning electrn and in micrscpies i.e., transmissin electrn micrscpy (TEM) and related micranalytical techniques including energy dispersive X-ray spectrscpy (X-EDS) and electrn energy lss spectrscpy (EELS), fcused in beam micrscpy (FIB) and scanning electrn micrscpy (SEM). Other areas f technical expertise include ptical and electrnic materials. Dr. Prenitzer hlds a B.S. in Chemistry and a Ph.D. in Mechanical Engineering with the Materials Science ptin frm the University f Central Flrida. She has bth academic research as well as industry experience. Dr. Prenitzer has c-authred ver 45 refereed jurnal articles and cnference prceedings as well as numerus platfrm presentatins at numerus lcal, natinal and internatinal cnferences. Brian Kempshall Vice President and Chief Technical Officer Dr. Kempshall prvides technical directin t the cmpany as well as technical expertise in the areas f materials and materials characterizatin. His areas f specializatin include transmissin electrn micrscpy (TEM) and related micranalytical techniques including energy dispersive X-ray spectrscpy (X-EDS) and electrn energy lss spectrscpy (EELS), scanning electrn micrscpy (SEM) and secndary in mass spectrscpy (SIMS). Additinally, Dr. Kempshall has renwned expertise in the field f fcused in beam (FIB) technlgy. Dr. Kempshall hlds a B.S. in Mechanical Engineering and a Ph.D. in Materials Science and Engineering frm the University f Central Flrida. Dr. Kempshall has c-authred ver 20 refereed jurnal articles and cnference prceedings as well as numerus platfrm presentatins at lcal, natinal and internatinal cnferences. Stephen M. Schwarz Vice President and Chief Operatins Officer Dr. Schwarz prvides peratinal directin t the cmpany as well as technical expertise in the areas f materials and materials characterizatin. His areas f specializatin include fcused in beam micrscpy (FIB), scanning electrn micrscpy (SEM) and transmissin electrn micrscpy (TEM). Dr. Schwarz hlds a B.S. degree in Electrical frm the Milwaukee Schl f Engineering, a B.S. degree in Mechanical Engineering and a Ph.D. in Materials Science and Engineering frm the University f Central Flrida. He has bth academic research as well as industry experience. Dr. Schwarz has cauthred ver 15 refereed jurnal articles and cnference prceedings as well as numerus platfrm presentatins at lcal, natinal and internatinal cnferences.