LC2 MOS 4-/8-Channel High Performance Analog Multiplexers ADG408/ADG409

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1 a FEATURES 44 upply Maximum Ratings to Analog Signal Range Low On Resistance ( max) Low Power (I SUPPLY < 75 A) Fast Switching Break-Before-Make Switching Action Plug-in Replacement for G408/G409 APPLICATIONS Audio and Video Routing Automatic Test Equipment ata Acquisition Systems Battery Powered Systems Sample and Hold Systems Communication Systems LC2 MOS 4-/8-Channel High Performance Analog Multiplexers AG408/AG409 FUNCTIONAL BLOCK IAGRAMS AG408 1 OF 8 ECOER A S4A B S4B AG409 1 OF 4 ECOER A B GERAL ESCRIPTION The AG408 and AG409 are monolithic CMOS analog multiplexers comprising eight single channels and four differential channels respectively. The AG408 switches one of eight inputs to a common output as determined by the 3-bit binary address lines, and. The AG409 switches one of four differential inputs to a common differential output as determined by the 2-bit binary address lines and. An input on both devices is used to enable or disable the device. When disabled, all channels are switched OFF. The AG408/AG409 are designed on an enhanced LC 2 MOS process which provides low power dissipation yet gives high switching speed and low on resistance. Each channel conducts equally well in both directions when ON and has an input signal range that extends to the supplies. In the OFF condition, signal levels up to the supplies are blocked. All channels exhibit breakbefore-make switching action, preventing momentary shorting when switching channels. Inherent in the design is low charge injection for minimum transients when switching the digital inputs. The AG408/AG409 are improved replacements for the G408/G409 Analog Multiplexers. PROUCT HIGHLIGHTS 1. Extended Signal Range The AG408/AG409 are fabricated on an enhanced LC 2 MOS process giving an increased signal range that extends to the supply rails. 2. Low Power issipation 3 Low R ON 4. Single Supply Operation For applications where the analog signal is unipolar, the AG408/AG409 can be operated from a single rail power supply. The parts are fully specified with a single +12 V power supply and will remain functional with single supplies as low as +5 V. Information furnished by Analog evices is believed to be accurate and reliable. However, no responsibility is assumed by Analog evices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog evices. One Technology Way, P.O. Box 9106, Norwood, MA , U.S.A. Tel: 781/ World Wide Web Site: Fax: 781/ Analog evices, Inc., 1998

2 AG408/AG409 SPECIFICATIONS UAL SUPPLY 1 ( = +15 V, = 15 V, GN = 0 V, unless otherwise noted) B Version T Version 40 C to 55 C to Parameter +25 C +85 C +25 C +125 C Units Test Conditions/Comments ANALOG SWITCH Analog Signal Range to to V R ON Ω typ V = ±10 V, I S = 10 ma Ω max R ON Ω max V = +10 V, 10 V LEAKAGE CURRTS Source OFF Leakage I S (OFF) ±0.5 ±50 ±0.5 ±50 na max V = ±10 V, = 10 V; Test Circuit 2 rain OFF Leakage I (OFF) V = ±10 V; = 10 V; AG408 ±1 ± ±1 ± na max Test Circuit 3 AG409 ±1 ±50 ±1 ±50 na max Channel ON Leakage I, I S (ON) = V = ±10 V; AG408 ±1 ± ±1 ± na max Test Circuit 4 AG409 ±1 ±50 ±1 ±50 na max IGITAL INPUTS Input High Voltage, V INH V min Input Low Voltage, V INL V max Input Current I INL or I INH ±10 ±10 µa max V IN = 0 or C IN, igital Input Capacitance 8 8 pf typ f = 1 MHz YNAMIC CHARACTERISTICS ns typ R L = 300 Ω, C L = 35 pf; ns max V = ±10 V, = 10 V; Test Circuit 5 t OP ns min R L = 300 Ω, C L = 35 pf; = +5 V; Test Circuit 6 t ON () ns typ R L = 300 Ω, C L = 35 pf; ns max = +5 V; Test Circuit 7 t OFF () ns typ R L = 300 Ω, C L = 35 pf; ns max = +5 V; Test Circuit 7 Charge Injection pc typ = 0 V, R S = 0 Ω, C L = 10 nf; Test Circuit 8 OFF Isolation db typ R L = 1 kω, f = khz; V = 0 V; Test Circuit 9 Channel-to-Channel Crosstalk db typ R L = 1 kω, f = khz; Test Circuit 10 C S (OFF) pf typ f = 1 MHz C (OFF) f = 1 MHz AG pf typ AG pf typ C, C S (ON) f = 1 MHz AG pf typ AG pf typ POWER REQUIREMTS I 1 1 µa typ V IN = 0 V, V = 0 V 5 5 µa max I SS 1 1 µa typ 5 5 µa max I µa typ V IN = 0 V, V = 2.4 V µa max NOTES 1 Temperature ranges are as follows: B Version: 40 C to +85 C; T Version: 55 C to +125 C. 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. 2

3 AG408/AG409 SINGLE SUPPLY 1 ( = +12 V, = 0 V, GN = 0 V, unless otherwise noted) B Version T Version 40 C to 55 C to Parameter +25 C +85 C +25 C +125 C Units Test Conditions/Comments ANALOG SWITCH Analog Signal Range 0 to 0 to V R ON Ω typ V = +3 V, +10 V, I S = 1 ma LEAKAGE CURRTS Source OFF Leakage I S (OFF) ±0.5 ±50 ±0.5 ±50 na max V =8 V/0 V, = 0 V/8 V; Test Circuit 2 rain OFF Leakage I (OFF) V =8 V/0 V, = 0 V/8 V; AG408 ±1 ± ±1 ± na max Test Circuit 3 AG409 ±1 ±50 ±1 ±50 na max Channel ON Leakage I, I S (ON) = V = 8 V/0 V; AG408 ±1 ± ±1 ± na max Test Circuit 4 AG409 ±1 ±50 ±1 ±50 na max IGITAL INPUTS Input High Voltage, V INH V min Input Low Voltage, V INL V max Input Current I INL or I INH ±10 ±10 µa max V IN = 0 or C IN, igital Input Capacitance 8 8 pf typ f = 1 MHz YNAMIC CHARACTERISTICS ns typ R L = 300 Ω, C L = 35 pf; V = 8 V/0 V, 8 = 0 V/8 V; Test Circuit 5 t OP ns typ R L = 300 Ω, C L = 35 pf; = +5 V; Test Circuit 6 t ON () ns typ R L = 300 Ω, C L = 35 pf; = +5 V; Test Circuit 7 t OFF () ns typ R L = 300 Ω, C L = 35 pf; = +5 V; Test Circuit 7 Charge Injection 5 5 pc typ = 0 V, R S = 0 Ω, C L = 10 nf; Test Circuit 8 OFF Isolation db typ R L = 1 kω, f = khz; V = 0 V; Test Circuit 9 Channel-to-Channel Crosstalk db typ R L = 1 kω, f = khz; Test Circuit 10 C S (OFF) pf typ f = 1 MHz C (OFF) f = 1 MHz AG pf typ AG pf typ C, C S (ON) f = 1 MHz AG pf typ AG pf typ POWER REQUIREMTS I 1 1 µa typ V IN = 0 V, V = 0 V 5 5 µa max I µa typ V IN = 0 V, V = 2.4 V µa max NOTES 1 Temperature ranges are as follows: B Version: 40 C to +85 C; T Version: 55 C to +125 C. 2 Guaranteed by design, not subject to production test. Specifications subject to change without notice. 3

4 AG408/AG409 ABSOLUTE MAXIMUM RATINGS 1 (T A = +25 C unless otherwise noted) to V to GN V to +25 V to GN V to 25 V Analog, igital Inputs V to +2 V or 20 ma, Whichever Occurs First Continuous Current, S or ma Peak Current, S or (Pulsed at 1 ms, 10% uty Cycle max) ma Operating Temperature Range Industrial (B Version) C to +85 C Extended (T Version) C to +125 C Storage Temperature Range C to +150 C Junction Temperature C Cerdip Package, Power issipation mw θ JA, Thermal Impedance C/W Lead Temperature, Soldering (10 sec) C Plastic Package, Power issipation mw θ JA, Thermal Impedance C/W Lead Temperature, Soldering (10 sec) C TSSOP Package, Power issipation mw θ JA, Thermal Impedance C/W θ JC, Thermal Impedance C/W SOIC Package, Power issipation mw θ JA, Thermal Impedance C/W Lead Temperature, Soldering Vapor Phase ( sec) C Infrared (15 sec) C NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time. 2 Overvoltages at A,, S or will be clamped by internal diodes. Current should be limited to the maximum ratings given. ORERING INFORMATION Model 1 Temperature Range Package Option 2 AG408BN 40 C to +85 C N-16 AG408BR 40 C to +85 C R-16A AG408BRU 40 C to +85 C RU-16 AG408TQ 55 C to +125 C Q-16 AG409BN 40 C to +85 C N-16 AG409BR 40 C to +85 C R-16A AG409TQ 55 C to +125 C Q-16 NOTES 1 To order MIL-ST-883, Class B processed parts, add /883B to T grade part numbers. 2 N = Plastic IP; Q = Cerdip; R = 0.15" Small Outline IC (SOIC); RU = Think Shrink Small Outline Package (TSSOP). CAUTION ES (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AG408/AG409 feature proprietary ES protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ES precautions are recommended to avoid performance degradation or loss of functionality. WARNING! ES SSITIVE EVICE 4

5 AG408/AG409 PIN CONFIGURATIONS (IP/SOIC/TSSOP) AG GN S2 S3 S TOP VIEW 12 (Not to Scale) S5 S6 S7 A S2A S3A S4A A AG408 Truth Table AG GN B TOP VIEW 12 (Not to Scale) S2B S3B S4B B ON SWITCH X X X 0 NONE AG409 Truth Table ON SWITCH Al PAIR X X 0 NONE TERMINOLOGY Most positive power supply potential. Most negative power supply potential in dual supplies. In single supply applications, it may be connected to ground. GN Ground (0 V) reference. R ON Ohmic resistance between and S. R ON ifference between the R ON of any two channels. I S (OFF) Source leakage current when the switch is off. I (OFF) rain leakage current when the switch is off. I, I S (ON) Channel leakage current when the switch is on. V ( ) Analog voltage on terminals, S. C S (OFF) Channel input capacitance for OFF condition. C (OFF) Channel output capacitance for OFF condition. C, C S (ON) ON switch capacitance. C IN igital input capacitance. t ON () elay time between the 50% and 90% points of the digital input and switch ON condition. t OFF () elay time between the 50% and 90% points of the digital input and switch OFF condition. elay time between the 50% and 90% points of the digital inputs and the switch ON condition when switching from one address state to another. t OP OFF time measured between the % point of both switches when switching from one address state to another. V INL Maximum input voltage for Logic 0. V INH Minimum input voltage for Logic 1. I INL (I INH ) Input current of the digital input. Crosstalk A measure of unwanted signal which is coupled through from one channel to another as a result of parasitic capacitance. Off Isolation A measure of unwanted signal coupling through an OFF channel. Charge Injection I I SS A measure of the glitch impulse transferred from the digital input to the analog output during switching. Positive supply current. Negative supply current. 5

6 AG408/AG409 Typical Performance Characteristics 120 T A = +25 C 1 T A = +25 C = +5V = 5V 1 = +5V = 0V 140 R ON = +10V = 10V = +12V = 12V R ON 120 = +10V = 0V = +12V = 0V 40 = +15V = 15V = +15V = 0V V ( ) Volts Figure 1. R ON as a Function of V ( ): ual Supply Voltage V ( ) Volts Figure 4. R ON as a Function of V ( ): Single Supply Voltage 90 = +15V = 15V = +12V = 0V 110 R ON C +125 C R ON C C C C V ( ) Volts Figure 2. R ON as a Function of V ( ) for ifferent Temperatures V ( ) Volts Figure 5. R ON as a Function of V ( ) for ifferent Temperatures LEAKAGE CURRT na T A = +25 C = +15V = 15V I (ON) I S (OFF) I (OFF) LEAKAGE CURRT na T A = +25 C = +12V = 0V I (ON) I (OFF) I S (OFF) V ( ) Volts Figure 3. Leakage Currents as a Function of V ( ) V ( ) Volts Figure 6. Leakage Currents as a Function of V ( ) 6

7 AG408/AG = +15V = 15V 140 = +12V = 0V 120 t ON () t ns t ON () t ns 40 t OFF () t OFF () V IN Volts Figure 7. Switching Time vs. V IN (Bipolar Supply) V IN Volts Figure 10. Switching Time vs. V IN (Single Supply) 400 V IN = +5V 300 V IN = +5V t ns 200 t ON () t ns t ON () t OFF () t OFF () UPPLY Volts Figure 8. Switching Time vs. Single Supply UPPLY Volts Figure 11. Switching Time vs. Bipolar Supply 10 4 = +15V = 15V 10 4 = +15V = 15V I A 10 3 I SS A 10 1 = 2.4V = 2.4V = 0V 10 0 = 0V k 10k k 1M 10M FREQUCY Hz Figure 9. Positive Supply Current vs. Switching Frequency k 10k k 1M 10M FREQUCY Hz Figure 12. Negative Supply Current vs. Switching Frequency 7

8 AG408/AG = +15V = 15V = +15V = 15V OFF ISOLATION db 90 CROSSTALK db k 10k k 1M FREQUCY Hz Figure 13. Off Isolation vs. Frequency 1k 10k k 1M FREQUCY Hz Figure 14. Crosstalk vs. Frequency Test Circuits I S V1 S S2 GN I (OFF) +0.8V A V R ON = V1/I S Test Circuit 1. On Resistance Test Circuit 3. I (OFF) I S (OFF) A V S2 GN +0.8V GN 2.4V V A I (ON) Test Circuit 2. I S (OFF) Test Circuit 4. I (ON) 8

9 AG408/AG409 3V ABLE RIVE (V IN ) 0V 50% 50% t r < 20ns t f < 20ns V IN 50 S2 THRU S7 V 90% 2.4V AG408* 8 90% GN pF *SIMILAR CONNECTION FOR AG409 Test Circuit 5. Switching Time of Multiplexer, t TRANSlTlON 3V ARESS RIVE (V IN ) 0V V IN 50 S2 THRU S7 % % 2.4V AG408* GN pF t OP *SIMILAR CONNECTION FOR AG409 Test Circuit 6. Break-Before-Make elay, t OP 3V ABLE RIVE (V IN ) 0V 50% 50% S2 THRU t ON () 0.9V O 0.9V O t OFF () V IN 50 AG408* GN pF Test Circuit 7. Enable elay, t ON (), t OFF () *SIMILAR CONNECTION FOR AG409 9

10 AG408/AG409 3V V IN AG408* V OUT Q INJ = C L V OUT V OUT R S S GN V OUT C L 10nF V IN *SIMILAR CONNECTION FOR AG409 Test Circuit 8. Charge Injection 0V AG408 GN 1k V OUT 1k S2 AG408 GN 2.4V 1k V OUT OFF ISOLATION = 20 LOG V OUT /V IN Test Circuit 9. OFF Isolation CROSSTALK = 20 LOG V OUT /V IN Test Circuit 10. Channel-to-Channel Crosstalk 10

11 AG408/AG409 OUTLINE IMSIONS imensions shown in inches and (mm). Plastic IP (N-16) SO (Narrow Body) (R-16A) (3.18) MIN (0.46) 0.87 (22.1) MAX 1 8 PIN 1 0. (2.54) BSC (0.84) (6.35) (7.87) (0.89) 0.18 (4.57) SEATING PLANE (0.28) 0.3 (7.62) 0.18 (4.57) MAX (4.00) (3.) (0.25) (0.10) SEATING PLANE PIN (1.27) BSC (10.00) (9.) (0.49) (0.35) (6.20) (5.) (1.75) (1.35) (0.25) (0.19) (0.50) (0.25) x (1.27) 0.01 (0.41) C1824a 0 4/98 Cerdip (Q-16) Thin Shrink Small Outline Package (TSSOP) (RU-16) (0.13) MIN 0.0 (2.03) MAX (5.08) MAX (5.08) (3.18) (0.558) (0.356) 1 8 PIN (21.34) MAX 0. (2.54) BSC (7.87) (5.59) 0.0 (1.52) (0.38) (3.81) MIN SEATING (1.78) PLANE (0.76) (8.13) (7.37) (0.38) (0.20) (4.50) (4.30) (0.15) (0.05) SEATING PLANE (5.10) (4.90) PIN (0.65) BSC (0.30) (0.19) (6.50) (6.25) (1.10) MAX (0.20) (0.090) (0.70) (0.50) PRINTE IN U.S.A. 11

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