AOS Semiconductor Product Reliability Report

Transcription

1 AOS Semiconductor Product Reliability Report AO4466/AO4466L, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 49 Mercury Drive Sunnyvale, CA 948 U.S. Tel: (48) Jun 4, 28 1

2 This AOS product reliability report summarizes the qualification result for AO4466. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AO4466 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. Product Description II. Package and Die information III. Environmental Stress Test Summary and Result IV. Reliability Evaluation V. Quality Assurance Information I. Product Description: The AO4466/L uses advanced trench technology to provide excellent R DS(ON) and low gate charge. This device is suitable for use as a load switch or in PWM applications. The source leads are separated to allow a Kelvin connection to the source, which may be used to bypass the source inductance. AO4466 and AO4466L are electrically identical. -RoHS Compliant -AO4466L is Halogen Free Absolute Maximum Ratings T A =2 C unless otherwise noted Parameter Symbol Maximum Units Drain-Source Voltage V DS 3 V Gate-Source Voltage V GS ±2 V Continuous Drain T A =2 C 9.4 Current T A =7 C I D 7.7 Pulsed Drain Current I DM T A =2 C P D 3.1 W Power Dissipation T A =7 C 2.1 Junction and Storage Temperature Range T J, T STG - to 1 C Thermal Characteristics Parameter Symbol Typ Max Units Maximum Junction-to- T 1s Ambient Maximum Junction-to- Ambient Maximum Junction-to-Lead 34 4 C/W R Steady- θja State 62 7 C/W Steady- State R θjl C/W A 2

3 II. Die / Package Information: AO4466 AO4466L (Green Compound) Process Standard sub-micron Standard sub-micron Low voltage N channel process Low voltage N channel process Package Type 8 leads SOIC 8 leads SOIC Lead Frame Copper with Ag pad Copper with Ag pad Die Attach Ag epoxy Ag epoxy Bond wire G: Au 1.3 mils; S: Cu 2mils G: Au 1.3 mils; S: Cu 2mils Mold Material Epoxy resin with silica filler Epoxy resin with silica filler Filler % (Spherical/Flake) 9/1 1/ Flammability Rating UL-94 V- UL-94 V- Backside Metallization Ti / Ni / Ag Ti / Ni / Ag Moisture Level Up to Level 1 * Up to Level 1* Note * based on info provided by assembler and mold compound supplier III. Result of Reliability Stress for AO4466 (Standard) & AO4466L (Green) Test Item Test Condition Time Point Solder Reflow Precondition Standard: 1hr PCT+3 cycle reflow@26 c Green: 168hr 8 c /8%RH +3 cycle reflow@26 c HTGB Temp = 1 c, Vgs=1% of Vgsmax HTRB Temp = 1 c, Vds=8% of Vdsmax HAST Pressure Pot Temperature Cycle 13 +/- 2 c, 8%RH, 33.3 psi, Vgs = 8% of Vgs max 121 c, 29.7psi, RH=1% -6 c to 1 c, air to air hr 168 / hrs 1 hrs 168 / hrs 1 hrs Lot Attribution Standard: 83 s Green: 29 s 3 s (Note A*) 3 s (Note A*) 1 hrs Standard: 81 s Green: 16 s 96 hrs Standard: 83 s Green: 2 s 2 / cycles Standard: 87 s Green: 29 s Total Sample size Number of Failures 1738 pcs 246 pcs 77+ pcs / 246 pcs 77+ pcs / 33 pcs + pcs / 66 pcs + pcs / 638 pcs + pcs / 3

4 III. Result of Reliability Stress for AO4466 (Standard) & AO4466L (Green) Continues DPA Internal Vision Cross-section X-ray NA CSAM NA Bond Integrity Room Temp 1 C bake 1 C bake hr 2hr hr wires 4 wires 4 wires Solderability 24 C sec 1 1 leads Note A: The HTGB and HTRB reliability data presents total of available AO4466 and AO4466L burn-in data up to the published date. Note B: The pressure pot, temperature cycle and HAST reliability data for AO4466 and AO4466L comes from the AOS generic package qualification data. IV. Reliability Evaluation FIT rate (per billion): 13 MTTF = 8781years In general, hrs of HTGB, 1 deg C accelerated stress testing is equivalent to 1 years of lifetime at deg C operating conditions (by applying the Arrhenius equation with an activation energy of.7ev and 6% of upper confidence level on the failure rate calculation). AOS reliability group also routinely monitors the product reliability up to 1 hr at and performs the necessary failure analysis on the units failed for reliability test(s). The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AO4466). Failure Rate Determination is based on JEDEC Standard JESD 8. FIT means one failure per billion hours. Failure Rate = Chi 2 x 1 9 / [2 (N) (H) (Af)] = 1.83 x 1 9 / [2 (164) (168) (28) + 2 (164) () (28) + 2 (164) (1) (28)] = 13 MTTF = 1 9 / FIT =7.69 x 1 7 hrs = 8781years Chi² = Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea =.7eV and Tuse = C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u 1/Tj s)] Acceleration Factor ratio list: deg C 7 deg C 8 deg C 1 deg C 11 deg C 13 deg C 1 deg C Af Tj s = Stressed junction temperature in degree (Kelvin), K = C Tj u =The use junction temperature in degree (Kelvin), K = C k = Boltzmann s constant, X 1 - ev / K 4

5 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection:.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 2 ppm Quality Sample Plan: conform to Mil-Std-1D