QTC Pisa up-date. STM & HPK Sensors received from : December 03-February. 04 Qualification Summary and preliminary acceptance Company data comparison

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1 QTC Pisa up-date STM & HPK Sensrs received frm : December 03-February 04 Qualificatin Summary and preliminary acceptance Cmpany data cmparisn L.Brrell, D.Kartashv, A.Messine, G.Segneri, D.Sentenac March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

2 STM : Sample f sensrs Sensr received at CERN between and STM-prcess frm Week38 t Week45 Ttal f 155 Split as Frm STM side : R int gate applied and fixed I strip measurement perfrmed Sme cmpany data missing Qualified by CMS (QTC & PQC) Batch Nr. Set Sensr Number f Delivery Type Sensrs Date T Pisa120 OB Pisa118 OB T Pisa117 OB Pisa118 OB Pisa124 OB Pisa124 OB Pisa124 OB Pisa124 OB Pisa131 OB Pisa131 OB Pisa132 OB E Pisa132 OB Pisa132 OB E Pisa133 OB E Pisa132 OB Pisa133 OB Pisa133 OB Pisa133 OB Pisa133 OB March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

3 PQC results : Firenze All batches with V fb inside specs Fr all batches R int > 20 V back All 17 batches accepted frm PQC March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

4 Summary frm STM data Distributin f faulty strips frm STM measurement March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

5 Qualificatin tests : ptical Inspectin Tests perfrmed n 155 sensrs Optical inspectin: 100 % f sensrs accepted! Sme surface damage seen; mre evident n 8 sensrs Optical defects can affect Assembly Electrical prperties March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

6 Optical inspectin : Shadw n Crner 4 sensrs with similar ptical defect. Can they be assembled? QTC pattern recgnitin OK! Als fr assembly shuld wrk. March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

7 Optical inspectin * * * * = N electrical effects March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

8 Qualificatin tests : electrical tests perfrmed n 155 sensrs Glbal electrical tests : nt standard pre-classificatin frm IV test Nrmal batches ( IV with visible kink) class A/B = 47/8 (n a ttal f 55) Special batches ( n kink n IV but average I tt µa ) Class B like 98/100 2 in classa March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

9 Peculiarities: Average Istrip Average Istrip current increased in average Same effect detected by STM 9 batches driven by average Istrip current increase 98 scan perfrmed in ttal Results are as class A sensrs Batch: i.e I strip /14 scans March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

10 Peculiarities : Rply On a few sensrs a spreadnrply average value Strips have unifrm values, inside specs but a few strips just acrss upper cut Acceptance windw [0.8 2] MΩ i.e. batch scans in ttal March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

11 QTC Ttal failures Summary f strip failures Only 1 sensr reject fr strip % Distributin similar t cmpany data March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

12 Summary f acceptance Batch Nr. Set Sensr Number f Delivery Nr. accepted Nr. rejected reject reasn PQC Type Sensrs Date Pisa Pisa IV strip T Pisa120 OB PQC k Pisa118 OB PQC k T Pisa117 OB PQC k Pisa118 OB pqc k Pisa124 OB PQC k Pisa124 OB PQC k Pisa124 OB PQC k Pisa124 OB PQC k Pisa131 OB bd 9 Cac PQC k Pisa131 OB PQC k Pisa132 OB PQC k E Pisa132 OB PQC k Pisa132 OB I(450) PQC k E Pisa133 OB PQC k E Pisa132 OB PQC k Pisa133 OB PQC k Pisa133 OB PQC k Pisa133 OB PQC k Pisa133 OB PQC k efficiency 98.1% March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

13 Optical inspectin result : 9 C ac Open detected after electrical tests March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

14 Summary Cmments: Overall quality has imprved: reject reasn are IV 1.3% faulty strips 0.7% Acceptance at the level f 98% Mst f STM data files are available missing data have been re-laded by STM last Mnday Lw R int prblem nt bserved at batch level frm PQC tests March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

15 QTC-STM cmparisn Test Cmparisn n rejected strips : 91 scans r strips R ply crrelated with C ac / I strip I strip crrelated with different mechanical stress (sme discrepancy between STM surce file and DB stred : units????) Test agreement n faulty Pisa + STM + Rply Idiel Cac Istrip failing capacitr (Cac OR Idiel) March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

16 QTC-STM cmparisn Test At sensrs level discrepancies are negligible Gd agreement March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

17 HPK update Sensr received at CERN between and Ttal f 202 Split as Batch Nr. Set Sensr Number f Delivery Type Sensrs Date Pisa125 OB Pisa126 OB Pisa127 OB Pisa134 OB Pisa135 OB Pisa136 OB Pisa137 OB Preliminary Qualified by CMS (QTC) March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

18 Results Optical inspectin : gd junctin side scratches and circular marks (chuck) n the back side Electrical measurement gd perfrmance: IV smaller than HPK measurement Sensr V depl (HPK) between V (OK!) but sme discrepancy seen March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

19 IV reject : t be cnfirmed March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

20 Strip discrepancy One Cac nt reprted by HPK But nt relevant t flag bad strips March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

21 Strip discrepancy 2 Rply nt reprted by HPK (this can be relevant) can be a saturatin effect (still 10 V f bias n measurement) March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

22 Summary f acceptance Batch Nr. Set Sensr Number f Delivery CMS QA prvisinal Type Sensrs Date t be measured accepted rejected accepted Pisa125 OB Pisa126 OB Pisa127 OB Pisa124 OB Pisa124 OB Pisa124 OB Pisa124 OB March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup

23 plans Check IV reject : full batch n IV test Re-qualify suspicius sensrs Submit fr irradiatin & lng term test sample f sensrs with back side damage March 16 th, 2004 CERN CMS-week A.Messine Pisa Sensr grup