AFM for Measuring Surface Topography and Forces
|
|
- Silas Rafe Murphy
- 5 years ago
- Views:
Transcription
1 ENB AFM for Measuring Surface Topography and Forces Andreas Fery Scanning Probe : What is it and why do we need it? AFM as a versatile tool for local analysis and manipulation
2 Dates Course today 2* 1h with 15 min break do it yourself AFM : Tomorrow, starting 9:00 in AFM Lab in PCII
3 Scanning Probe : What is it an why do we need it versus IBM
4 How sensitive is an AFM? AFM-sensitivity translated to the macro-scale Matterhorn = AFM tip Ping Pong ball = molecular dimensions Why should one try something so difficult?
5 optical microscopy: the fraunhofer limit a point source imaged by a lens of finite size transforms into an airy disc pattern due to diffraction this sets a natural limit to the resolution of far field wave optics devices x min λ 2
6 solving the problem 1. usage of shorter wavelength Problems: adsorption of the beam by glass for UV, the beam itself for x-ray 2. usage of high speed electrons Problems: electron source, samples can only be observed in UHV, oxidation of the sample 3. Scanning techniques Problems: long measurement time, UHV (for SEM), sample can be damaged due to probe sample interactions
7 Resolution of SPMs the resolution of SPMs is determined by: the spatial dimension of the probe the probe has to be small the distance probe-surface the probe has to be a point probe scanning probe microscopes are surface microscopes
8 The different types of SPM interaction the nature of the interaction determines the property of the sample that is investigated the strength of the interaction used in SPM determines whether one observes or modifies the sample: SPM as a microscope or a tool
9 The different types of SPM STM: scanning tunnelling microscopy SFM: scanning force microscopy SNOM: scanning near-field optical microscopy SEM: scanning electron microscopy SCM: scanning capacitance microscopy SThM: scanning thermal microscopy SICM: scanning ion conductance microscopy SAM: scanning acoustic microscopy
10 the right tool for the right problem the surface of a magnetooptic medium seen in AFM the same part of the sample imaged in MFM (Magnetic force microscopy)
11 AFM schematically Photodiode AFM-Probe mounted on spring Spring deflection detection Laserdiode Mirror Sample - Probe displacement Sample Feedback Mechanism Feedback XYZ Piezo-Scanner
12 AFM-Tip Approaching and Retracting Jump to Contact Deflection-Displacement Characteristics Hysteresis P Piezo Piezo Jump off contact Jump to Contact Jump off Contact Substrate
13 force-distance characteristics Deflection as a function of the distance Contact Region Stable Contact Non-Contact Region Unstable Very stable very damaging shear forces Too unstable but would be less damaging
14 AFM Imaging Idea : Stay at the same separation by keeping tip-sample Interactions constant while scanning the sample z-position controlled by feedback xy-position is scanned Possible feedback parameters : Spring deflection : Contact Mode For vibrating tips : Amplitude of vibration
15 principle Contact mode
16 Example DNA on a mica surface molecular resolution for a nonconducting sample in air
17 Convolution Effects One thing to keep in mind : convolution effect The smaller thing images the bigger thing The signal is always a convolution of sample topography And tip topography a bigger issue for AFM than for STM Tips should be as sharp as possible (10nm standard)
18 Artifacts DNA and debris PS spheres How can you check if this is an artifact??
19 Example : Surface Damage Molecules are swept out off the scanned Area
20 example : surface modification using the possibility to exert forces with the afm: nano- sculptures
21 recording friction friction properties can be recorded by monitoring the torsion of the cantilever
22 example LFM hydrophobic and hydrophilic regions can be clearly destinguished in LFM
23 Methods Using Vibrating Tips Feedback parameter : Amplitude Advantages : No permanent tip-sample contact No shear forces Non-contact imaging possible Tapping Mode, Intermittent Contact Mode And Non-Contact Mode are the most successful methods for pure imaging
24 Dynamic AFM Tip+cantilever can be described as harmonic oscillator 2 x m + kx = 2 t F ext x Here : F ext = A ext ( t) = A( ω ) sin( ωt + φ( ω )) sin ( ωt) A(w) : Amplitude F(w) : Phase Shift w R : resonance-frequency ω R = k m w R w
25 Vibrating Tip and Surface Forces 2 x m + kx = 2 t Simple picture : F ext 2 x m + kx + Fsurf = 2 t ( x) Fext Long-range attractive force Spring force Simplify force (linear approx.) A spring again, but k has decreased An attractive force gradient results in an effective decrease of the spring constant
26 Effect on Vibration Amplitude Phase-shift Excitation frequ. equals res. frequ. k effectively decreases ω R = k m w Ext = w R Free vibration (no surface force) w w R w Ext Surface influenced vibration Excitation frequency stays at w R, therefore : Phase changes A changes Amplitude can serve as Feedback parameter
27 example soft ultrathin pattern on silicon wafer (single molecular resolution under water)
28 Vibrating Tip Revisited: Phase Contrast Chemically heterogeneous surface Region 1 Region 2 Different surface forces F Long-range repulsive F Long-range attractive D D Different Phase Shift at same amplitude Phase 2 Phase 1 w R w R
29 Example Phase Contrast Phase Image (right) shows Material Contrast Here : film of Diblockcopolymer mixture (images courtesy M. Schneider / H. Schlaad)
30 ENB AFM for Measuring Surface Topography and Forces II Andreas Fery Force Spectroscopy : AFM for measuring forces Modern trends in AFM
31 AFM-Tip Approaching and Retracting Jump to Contact Deflection-Displacement Characteristics Hysteresis P Piezo Piezo Jump off contact Jump to Contact Jump off Contact Substrate
32 Simulating a measured curve F Instability! Det. Deflection Piezo ext. Deflection unstable D Piezo ext. stable Rest position F Deflection Piezo ext. D
33 Impact of the spring constant on stability B. Cappella and G. Dietler, "Force-distance curves by atomic force microscopy", Surface Science Reports, 34, 1-+, (1999)
34 Impact of the spring constant on stability 2 B. Cappella and G. Dietler, "Force-distance curves by atomic force microscopy", Surface Science Reports, 34, 1-+, (1999)
35 From raw data to force-distance 1) Photodetector signal [V] Interaction force [N] 2) Piezo displacement [m] Distance probe-surface [m] 1) : a) get sensitivity from force-deflection characteristic of hard sample ( photodiode signal [V] -> deflection [nm] ) b) determine spring constant ( deflection [nm] -> force [N] ) 2) : a) use calibrated Piezo / measure displacement b) subtract/add cantilever deflection from piezo position
36 added mass effect J. P. Cleveland, S. Manne, D. Bocek and P. K. Hansma, Review of Scientific Instruments, 64, , (1993)
37 added mass effect 2 J. P. Cleveland, S. Manne, D. Bocek and P. K. Hansma, "A Nondestructive Method for Determining the Spring Constant of Cantilevers for Scanning Force Microscopy", Review of Scientific Instruments, 64, , (1993)
38 thermal noise spectrum J. L. Hutter and J. Bechhoefer, "Calibration of Atomic-force microscopy tips", Rev. Sci. Instrum., 64, 1868, (1993)
39 Two worlds I have measured that my AFM tip is attracted with 15 nn force at 10 nm distance I have calculated that 2 infinite half spaces of this material should have an interaction energy/area of 1J/m 2 at this distance Experimentalist Theoretician How can we build a bridge from one to the other??
40 A bridge 2R 1 2R 2 D Derjaguin relation : R R2 F( D) = 2π 1 W ( D ) R + R 1 valid for all forces, as long as R >> range of force 2 infinite half space D infinite half space F(D) : interaction Force W(D) : interaction energy per area
41 Typical AFM cantilevers Here : radius of tip R not much bigger than typical interaction ranges
42 Colloidal Probe AFM
43 A typical protein for single molecule experiments : Titin His-Tag to allow for easy purification Multiple repeats of TI I27 free SH allows for attachment to gold surfaces
44 The AFM Experiment
45 Pulling chains off the surface k sp v Force = k sp Deflection Stage Position = v Time
46 Pulling chains off the surface
47 Pulling chains off the surface
48 Pulling chains off the surface
49 Pulling chains off the surface
50 Pulling chains off the surface
51 Pulling chains off the surface
52 Pulling chains off the surface
53 statistical variation: to few unfolding events : not the full protein is stretched to many unfolding events, more than 1 protein
54 statistics over many pulls to compensate for that, statistics over many pulls is necessary from this the typical curve is obtained
55 what does the peak force mean? influence of additional coupling to spring :
56 the force is rate dependent Unfolding proteins by AFM is a kinetic measurement: average unfolding force depends on pulling speed. Average unfolding rates can be estimated by Monte-Carlo simulation or by extrapolation. Force (N) Force (N)
57 physically meaningful single molecule experiments * average over many experiments to extract the typical set of unfolding lengths and forces do this for different pulling speeds compare to molecular dynamics calculations
58 Real-life Cantilevers Real-life cantilevers are damped harmonic oscillators 2 x m + kx = 2 t F ext Ideal, no damping 2 x x m β + kx = 2 t t F ext Real, damping force proportional to speed Damping broadens the resonance peak, limiting sensitivity A ω Res ω ω 50% of max. ampl. Damping is characterized by the Q-Factor (Quality Factor) ω Q = R ω Typical Q-factors are between 100 and 1000
59 Q-switching : tuning the resonance 2 x x m β + kx = 2 t t F ext Usually with F ext = A ext sin ( ωt) Now, use additional external force coupled to speed, compensating damping F ext x = Aext sin( ωt) β Damping force compensated!! t A A Q>10000 possible ω ω In theory much better for imaging, in practise sometimes
60 Supertips carbon nanotubes as a try to get the perfect tip (no convolution problem)
61 Combination AFM - microscopy general problem in deformation measurements : only force (indentation) accessible for (mechanically) complex objects not suffcient methods that combine force-deformation with shape information!
62 Combination of force and deformation measurements combination RICM - AFM interferometry example : buckling process
63 Setup
64 Acknowledgement Marc Nolte H. Heinzelmann because they made so nice presentations concerning SPM where I could pinch graphics, animation,
Atomic Force Microscopy imaging and beyond
Atomic Force Microscopy imaging and beyond Arif Mumtaz Magnetism and Magnetic Materials Group Department of Physics, QAU Coworkers: Prof. Dr. S.K.Hasanain M. Tariq Khan Alam Imaging and beyond Scanning
More informationAtomic and molecular interactions. Scanning probe microscopy.
Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic
More informationScanning Force Microscopy
Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data
More informationContents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages
Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy
More informationBasic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)
Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...
More informationSTM: Scanning Tunneling Microscope
STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationModule 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM
Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used
More informationOutline Scanning Probe Microscope (SPM)
AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)
More informationInstrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
More informationSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationCharacterization of MEMS Devices
MEMS: Characterization Characterization of MEMS Devices Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, Recap Characterization of MEMS
More informationScanning Probe Microscopy. EMSE-515 F. Ernst
Scanning Probe Microscopy EMSE-515 F. Ernst 1 Literature 2 3 Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer,Ans Josef Hug,Roland Bennewitz 4 Scanning Probe Microscopy and Spectroscopy : Theory,
More informationScanning Force Microscopy II
Scanning Force Microscopy II Measurement modes Magnetic force microscopy Artifacts Lars Johansson 1 SFM - Forces Chemical forces (short range) Van der Waals forces Electrostatic forces (long range) Capillary
More informationIntermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM)
WORKSHOP Nanoscience on the Tip Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM) Table of Contents: 1. Motivation... 1. Simple Harmonic Motion... 1 3. AC-Mode Imaging...
More informationPoint mass approximation. Rigid beam mechanics. spring constant k N effective mass m e. Simple Harmonic Motion.. m e z = - k N z
Free end Rigid beam mechanics Fixed end think of cantilever as a mass on a spring Point mass approximation z F Hooke s law k N = F / z This is beam mechanics, standard in engineering textbooks. For a rectangular
More informationLecture 12: Biomaterials Characterization in Aqueous Environments
3.051J/20.340J 1 Lecture 12: Biomaterials Characterization in Aqueous Environments High vacuum techniques are important tools for characterizing surface composition, but do not yield information on surface
More informationTechniken der Oberflächenphysik (Techniques of Surface Physics)
Techniken der Oberflächenphysik (Techniques of Surface Physics) Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: yong.lei@tu-ilmenau.de yang.xu@tu-ilmenau.de
More informationScanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010
Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis
More informationAnd Manipulation by Scanning Probe Microscope
Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic
More informationThe Powerful Diversity of the AFM Probe
The Powerful Diversity of the AFM Probe Stefan B. Kaemmer, Bruker Nano Surfaces Division, Santa Barbara, CA 93117 stefan.kaemmer@bruker-nano.com March 21, 2011 Introduction The tip allows us to measure
More informationNIS: what can it be used for?
AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached
More informationAtomic Force Microscopy (AFM) Part I
Atomic Force Microscopy (AFM) Part I CHEM-L2000 Eero Kontturi 6 th March 2018 Lectures on AFM Part I Principles and practice Imaging of native materials, including nanocellulose Part II Surface force measurements
More informationProgram Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION
Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany
More informationAFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division
AFM Imaging In Liquids W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division Imaging Techniques: Scales Proteins 10 nm Bacteria 1μm Red Blood Cell 5μm Human Hair 75μm Si Atom Spacing 0.4nm
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/22/07 Prof. C. Ortiz, MIT-DMSE
I LECTURE 5: AFM IMAGING Outline : LAST TIME : HRFS AND FORCE-DISTANCE CURVES... 2 ATOMIC FORCE MICROSCOPY : GENERAL COMPONENTS AND FUNCTIONS... 3 Deflection vs. Height Images... 4 3D Plots and 2D Section
More informationbio-molecular studies Physical methods in Semmelweis University Osváth Szabolcs
Physical methods in bio-molecular studies Osváth Szabolcs Semmelweis University szabolcs.osvath@eok.sote.hu Light emission and absorption spectra Stokes shift is the difference (in wavelength or frequency
More informationGeneral concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman
General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/22/07 Prof. C. Ortiz, MIT-DMSE
I LECTURE 5: AFM IMAGING Outline : LAST TIME : HRFS AND FORCE-DISTANCE CURVES... 2 ATOMIC FORCE MICROSCOPY : GENERAL COMPONENTS AND FUNCTIONS... 3 Deflection vs. Height Images... 4 3D Plots and 2D Section
More informationIntroduction to Scanning Probe Microscopy
WORKSHOP Nanoscience on the Tip Introduction to Scanning Probe Microscopy Table of Contents: 1 Historic Perspectives... 1 2 Scanning Force Microscopy (SFM)... 2 2.1. Contact Mode... 2 2.2. AC Mode Imaging...
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/15/07 Prof. C. Ortiz, MIT-DMSE I LECTURE 4: FORCE-DISTANCE CURVES
I LECTURE 4: FORCE-DISTANCE CURVES Outline : LAST TIME : ADDITIONAL NANOMECHANICS INSTRUMENTATION COMPONENTS... 2 PIEZOS TUBES : X/Y SCANNING... 3 GENERAL COMPONENTS OF A NANOMECHANICAL DEVICE... 4 HIGH
More informationINTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/08/06 Prof. C. Ortiz, MIT-DMSE I LECTURE 2 : THE FORCE TRANSDUCER
I LECTURE 2 : THE FORCE TRANSDUCER Outline : LAST TIME : WHAT IS NANOMECHANICS... 2 HOW CAN WE MEASURE SUCH TINY FORCES?... 3 EXAMPLE OF A FORCE TRANSDUCER... 4 Microfabricated cantilever beams with nanosized
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 11: Scanning Probe Microscopy. Byungha Shin Dept. of MSE, KAIST
2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 11: Scanning Probe Microscopy Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization
More informationIntroduction to Scanning Probe Microscopy Zhe Fei
Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na
More informationChapter 2 Correlation Force Spectroscopy
Chapter 2 Correlation Force Spectroscopy Correlation Force Spectroscopy: Rationale In principle, the main advantage of correlation force spectroscopy (CFS) over onecantilever atomic force microscopy (AFM)
More informationChapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
More informationScanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM) --- G. Binnig, H. Rohrer et al, (1982) Near-Field Scanning Optical Microscopy (NSOM) --- D. W. Pohl (1982) Atomic Force Microscopy (AFM)
More informationToday s SPM in Nanotechnology
Today s SPM in Nanotechnology An introduction for Advanced Applications Qun (Allen) Gu, Ph.D., AFM Scientist, Pacific Nanotechnology IEEE Bay Area Nanotechnology Council, August, 2007 8/17/2015 1 Content
More informationEcole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools
1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron
More informationSingle-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy
Single-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy Byung Kim Department of Physics Boise State University Langmuir (in press, 2006) swollen collapsed Hydrophilic non-sticky
More informationNitride HFETs applications: Conductance DLTS
Nitride HFETs applications: Conductance DLTS The capacitance DLTS cannot be used for device trap profiling as the capacitance for the gate will be very small Conductance DLTS is similar to capacitance
More informationScanning Probe Microscopy. L. J. Heyderman
1 Scanning Probe Microscopy 2 Scanning Probe Microscopy If an atom was as large as a ping-pong ball......the tip would have the size of the Matterhorn! 3 Magnetic Force Microscopy Stray field interaction
More informationScanning Probe Microscopy
1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced
More informationMeasurements of interaction forces in (biological) model systems
Measurements of interaction forces in (biological) model systems Marina Ruths Department of Chemistry, UMass Lowell What can force measurements tell us about a system? Depending on the technique, we might
More informationScanning Probe Microscopy (SPM)
CHEM53200: Lecture 9 Scanning Probe Microscopy (SPM) Major reference: 1. Scanning Probe Microscopy and Spectroscopy Edited by D. Bonnell (2001). 2. A practical guide to scanning probe microscopy by Park
More informationSOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani
SOLID STATE PHYSICS PHY F341 Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani 333031 manjula@bits-pilani.ac.in Characterization techniques SEM AFM STM BAM Outline What can we use
More informationReview. Surfaces of Biomaterials. Characterization. Surface sensitivity
Surfaces of Biomaterials Three lectures: 1.23.05 Surface Properties of Biomaterials 1.25.05 Surface Characterization 1.27.05 Surface and Protein Interactions Review Bulk Materials are described by: Chemical
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,
More informationChapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
More informationIntroduction to Scanning Tunneling Microscopy
Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York New York Oxford OXFORD UNIVERSITY PRESS 1993 CONTENTS List
More informationHow do we see the Nano-World? Microscopic Techniques
Lecture 2 How do we see the Nano-World? Microscopic Techniques Comparison of Microscopies 10 6 Vertical scale (A) 10 4 10 2 1 TEM SPM SEM OM 1 10 2 10 4 10 6 Lateral scale (A) Comparison of Microscopies
More informationCNPEM Laboratório de Ciência de Superfícies
Investigating electrical charged samples by scanning probe microscopy: the influence to magnetic force microscopy and atomic force microscopy phase images. Carlos A. R. Costa, 1 Evandro M. Lanzoni, 1 Maria
More informationSUPPLEMENTARY INFORMATION
1. Supplementary Methods Characterization of AFM resolution We employed amplitude-modulation AFM in non-contact mode to characterize the topography of the graphene samples. The measurements were performed
More informationLecture Note October 1, 2009 Nanostructure characterization techniques
Lecture Note October 1, 29 Nanostructure characterization techniques UT-Austin PHYS 392 T, unique # 5977 ME 397 unique # 1979 CHE 384, unique # 151 Instructor: Professor C.K. Shih Subjects: Applications
More informationScanning Probe Microscopy: Atomic Force Microscopy And Scanning Tunneling Microscopy (NanoScience And Technology) [Kindle Edition] By Bert Voigtl
Scanning Probe Microscopy: Atomic Force Microscopy And Scanning Tunneling Microscopy (NanoScience And Technology) [Kindle Edition] By Bert Voigtl READ ONLINE If searched for a book Scanning Probe Microscopy:
More informationMolecular and carbon based electronic systems
Molecular and carbon based electronic systems Single molecule deposition and properties on surfaces Bottom Up Top Down Fundamental Knowledge & Functional Devices Thilo Glatzel, thilo.glatzel@unibas.ch
More informationThe most versatile AFM platform for your nanoscale microscopy needs
The most versatile AFM platform for your nanoscale microscopy needs Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement
More informationInstability & Pattering of Thin Polymer Films Prof. R. Mukherjee Department of Chemical Engineering Indian Institute of Technology Kharagpur
Instability & Pattering of Thin Polymer Films Prof. R. Mukherjee Department of Chemical Engineering Indian Institute of Technology Kharagpur Lecture No#26 Atomic Force Microscope V (Refer Slide Time: 00:34)
More informationIntroduction to the Scanning Tunneling Microscope
Introduction to the Scanning Tunneling Microscope A.C. Perrella M.J. Plisch Center for Nanoscale Systems Cornell University, Ithaca NY Measurement I. Theory of Operation The scanning tunneling microscope
More informationEnrico Gnecco Department of Physics. University of Basel, Switzerland
AOSCIECES AD AOTECHOOGIES anotribology - Enrico Gnecco AOTRIBOOGY Enrico Gnecco Department of Physics. University of Basel, Switzerland Keywords: Atomic stick-slip, Friction force microscopy, oad dependence
More informationNoninvasive determination of optical lever sensitivity in atomic force microscopy
REVIEW OF SCIENTIFIC INSTRUMENTS 77, 013701 2006 Noninvasive determination of optical lever sensitivity in atomic force microscopy M. J. Higgins a R. Proksch Asylum Research, 6310 Hollister Ave, Santa
More information3.052 Nanomechanics of Materials and Biomaterials Tuesday 04/03/07 Prof. C. Ortiz, MIT-DMSE I LECTURE 13: MIDTERM #1 SOLUTIONS REVIEW
I LECTURE 13: MIDTERM #1 SOLUTIONS REVIEW Outline : HIGH RESOLUTION FORCE SPECTROSCOPY...2-10 General Experiment Description... 2 Verification of Surface Functionalization:Imaging of Planar Substrates...
More informationScanning Force Microscopy And Related Techniques. With the help of.
With the help of. 1. Yosi Shacham TAU 2. Yossi Rosenwacks TAU 3. Julio Gomez-Herrero UAM 4. Adriana Gil - UAM 5. Serge Lemay - Delft 6. Hezy Cohen - HUJI 7. Scanning Force Microscopy And Related Techniques
More informationBeetle UHV VT AFM / STM
UHV VT AFM / STM RHK Technology Imaging the Future of Nanoscience UHV VT AFM / STM Engineered Excellence Everyday, in university and government labs around the globe, RHK research platforms lead to new
More informationBringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach
Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Beyond the diffraction limit The resolution of optical microscopy is generally limited by the diffraction
More informationBridge between research in modern physics and entrepreneurship in nanotechnology. Quantum Physics
Bridge between research in modern physics and entrepreneurship in nanotechnology Quantum Physics The physics of the very small with great applications Part 2 QUANTUM PROPERTIES & TECHNOLOGY TRANSLATION
More informationDETERMINATION OF THE ADHESION PROPERTIES OF MICA VIA ATOMIC FORCE SPECTROSCOPY
2nd International Conference on Ultrafine Grained & Nanostructured Materials (UFGNSM) International Journal of Modern Physics: Conference Series Vol. 5 (2012) 33 40 World Scientific Publishing Company
More information(Scanning Probe Microscopy)
(Scanning Probe Microscopy) Ing-Shouh Hwang (ishwang@phys.sinica.edu.tw) Institute of Physics, Academia Sinica, Taipei, Taiwan References 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett.
More informationINDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE. Biomedical Nanotechnology. Lec-05 Characterisation of Nanoparticles
INDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE Biomedical Nanotechnology Lec-05 Characterisation of Nanoparticles Dr. P. Gopinath Department of Biotechnology Indian Institute
More informationReducing dimension. Crystalline structures
Reducing dimension 2D surfaces, interfaces and quantum wells 1D carbon nanotubes, quantum wires and conducting polymers 0D nanocrystals, nanoparticles, lithographically patterned quantum dots Crystalline
More informationRHK Technology Brief
The Atomic Force Microscope as a Critical Tool for Research in Nanotribology Rachel Cannara and Robert W. Carpick Nanomechanics Laboratory, University of Wisconsin Madison Department of Engineering Physics,
More informationMicroscopie a stilo: principi ed esempi di applicazione
Microscopie a stilo: principi ed esempi di applicazione Adele Sassella Dipartimento di Scienza dei Materiali Università degli Studi di Milano Bicocca adele.sassella@unimib.it Pavia, 22 aprile 2009 SCANNING
More informationScanning Force Microscopy And Related Techniques
Scanning Force Microscopy And Related Techniques Danny Porath 2003 With the help of. 1. Yosi Shacham TAU 2. Yossi Rosenwacks TAU 3. Julio Gomez-Herrero UAM 4. Adriana Gil - UAM 5. Serge Lemay - Delft 6.
More informationUnderstanding the properties and behavior of groups of interacting atoms more than simple molecules
Condensed Matter Physics Scratching the Surface Understanding the properties and behavior of groups of interacting atoms more than simple molecules Solids and fluids in ordinary and exotic states low energy
More informationLorentz Contact Resonance for viscoelastic measurements of polymer blends
The nanoscale spectroscopy company The world leader in nanoscale IR spectroscopy Lorentz Contact Resonance for viscoelastic measurements of polymer blends Lorentz Contact Resonance (LCR) reliably compares
More informationSantosh Devasia Mechanical Eng. Dept., UW
Nano-positioning Santosh Devasia Mechanical Eng. Dept., UW http://faculty.washington.edu/devasia/ Outline of Talk 1. Why Nano-positioning 2. Sensors for Nano-positioning 3. Actuators for Nano-positioning
More informationMeasuring Properties of Elastomers using AFM Force Curves
Measuring Properties of Elastomers using AFM Force Curves Key Words Atomic Force Microscopy, Elastomers, Intermolecular interactions, Force curves, Contact mode, Non-contact mode, Cantilever Object It
More information672 Advanced Solid State Physics. Scanning Tunneling Microscopy
672 Advanced Solid State Physics Scanning Tunneling Microscopy Biao Hu Outline: 1. Introduction to STM 2. STM principle & working modes 3. STM application & extension 4. STM in our group 1. Introduction
More informationTowards nano-mri in mesoscopic transport systems
Towards nano-mri in mesoscopic transport systems P. Peddibhotla, M. Montinaro, D. Weber, F. Xue, and M. Poggio Swiss Nanoscience Institute Department of Physics University of Basel Switzerland 3 rd Nano-MRI
More informationKavli Workshop for Journalists. June 13th, CNF Cleanroom Activities
Kavli Workshop for Journalists June 13th, 2007 CNF Cleanroom Activities Seeing nm-sized Objects with an SEM Lab experience: Scanning Electron Microscopy Equipment: Zeiss Supra 55VP Scanning electron microscopes
More informationCharacterization Tools
Lectures in Nanoscience & Technology Characterization Tools K. Sakkaravarthi Department of Physics National Institute of Technology Tiruchirappalli 620 015 Tamil Nadu India sakkaravarthi@nitt.edu ksakkaravarthi.weebly.com
More informationScanning Probe Microscopy (SPM)
http://ww2.sljus.lu.se/staff/rainer/spm.htm Scanning Probe Microscopy (FYST42 / FAFN30) Scanning Probe Microscopy (SPM) overview & general principles March 23 th, 2018 Jan Knudsen, room K522, jan.knudsen@sljus.lu.se
More informationVisualization of Nanoscale Components Using Low Cost AFMs Part 2. Dr. Salahuddin Qazi
Visualization of Nanoscale Components Using Low Cost AFMs Part 2 Dr. Salahuddin Qazi State University of New York Institute of Technology Utica, New York. Outline Introduction Visualization by Phase Imaging
More informationMeasuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods
INSTITUTE OF PHYSICS PUBLISHING Nanotechnology 3 (2002) 33 37 NANOTECHNOLOGY PII: S0957-4484(02)27598-4 Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other
More informationLecture 26 MNS 102: Techniques for Materials and Nano Sciences
Lecture 26 MNS 102: Techniques for Materials and Nano Sciences Reference: #1 C. R. Brundle, C. A. Evans, S. Wilson, "Encyclopedia of Materials Characterization", Butterworth-Heinemann, Toronto (1992),
More informationHigh-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy
High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy Jing-jiang Yu Nanotechnology Measurements Division Agilent Technologies, Inc. Atomic Force Microscopy High-Resolution
More informationFEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS
FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS Kai GENG, Ute RABE, Sigrun HIRSEKORN Fraunhofer Institute for Nondestructive Testing (IZFP); Saarbrücken, Germany Phone: +49 681 9302
More informationIntegrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System Design
Tamkang Journal of Science and Engineering, Vol. 12, No. 4, pp. 399 407 (2009) 399 Integrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System
More informationOptimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy
11 th World Congress on Structural and Multidisciplinary Optimisation 07 th -12 th, June 2015, Sydney Australia Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy
More informationMagnetic Force Microscopy (MFM) F = µ o (m )H
Magnetic Force Microscopy (MFM) F = µ o (m )H 1. MFM is based on the use of a ferromagnetic tip as a local field sensor. Magnetic interaction between the tip and the surface results in a force acting on
More informationSpring 2009 EE 710: Nanoscience and Engineering
Spring 2009 EE 710: Nanoscience and Engineering Part 1: Introduction Course Texts: Bhushan, Springer Handbook of Nanotechnology 2 nd ed., Springer 2007 Hornyak, et.al, Introduction ti to Nanoscience, CRC
More informationTECHNIQUE TO EVALUATE NANOMECHANICS OF CANTILEVER AT NANOSCALE BY USING AFM
TECHNIQUE TO EVALUATE NANOMECHANICS OF CANTILEVER AT NANOSCALE BY USING AFM Upendra Sharan Gupta 1, Rahul Singh 2, Savan Parmar 3, Prasanna Gupta 4, Vipul Pandey 5 1 Reader Dept. of Mech. Engineering,
More informationLorentz Contact Resonance for viscoelastic measurements of polymer blends
The world leader in nanoscale IR spectroscopy for viscoelastic measurements of polymer blends (LCR) reliably compares viscoleastic properties with nanoscale spatial resolution With no moving parts in the
More informationCHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
More informationNanoscale Chemical Imaging with Photo-induced Force Microscopy
OG2 BCP39nm_0062 PiFM (LIA1R)Fwd 500 279.1 µv 375 250 nm 500 375 250 125 0 nm 125 219.0 µv Nanoscale Chemical Imaging with Photo-induced Force Microscopy 0 Thomas R. Albrecht, Derek Nowak, Will Morrison,
More informationEffect of AFM Cantilever Geometry on the DPL Nanomachining process
Int J Advanced Design and Manufacturing Technology, Vol. 9/ No. 4/ December 2016 75 Effect of AFM Cantilever Geometry on the DPL Nanomachining process A. R. Norouzi Department of New Sciences and Technologies,
More informationThe interpretation of STM images in light of Tersoff and Hamann tunneling model
The interpretation of STM images in light of Tersoff and Hamann tunneling model The STM image represents contour maps of constant surface LDOS at E F, evaluated at the center of the curvature of the tip.
More information