Visualization of Nanoscale Components Using Low Cost AFMs Part 2. Dr. Salahuddin Qazi
|
|
- Reynold Charles
- 6 years ago
- Views:
Transcription
1 Visualization of Nanoscale Components Using Low Cost AFMs Part 2 Dr. Salahuddin Qazi State University of New York Institute of Technology Utica, New York.
2 Outline Introduction Visualization by Phase Imaging Visualization by Magnetic force microscopy Visualization by Scanning tunnel microscopy Visualization in Liquid Single point spectroscopy AFM Sample of Students work Remote Access November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 2
3 November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 3
4 Forces Between Tip and Sample Surface Van der Waals force: always present, attractive, outer electrons, fundamentally quantum mechanical (few nm) Contact force: repulsion, chemical, core electrons Capillary force: attractive, water layer! Electrostatic and magnetic force (up to 100nm) Friction force Forces in liquids J. Israelachvili: Intermolecular and Surface Forces with Appl. To Colloidal and Biological Systems, Academic Press (1985) November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 4
5 3 Primary Imaging Modes in AFM 1. Contact mode: < 0.5 nm probe-surface separation 2. Intermittent contact (tapping mode AFM) nm probe-surface separation 3. Non-contact mode: nm probe-surface separation Plot of force as a function of probe-sample separation November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 5
6 Dynamic AFM Cantilever driven near resonance Non-contact AFM, Tapping mode AFM, Amplitude Modulated AFM, Frequency Modulated AFM are all dynamic AFM The cantilever's resonant frequency, phase and amplitude are affected by short-scale force gradients November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 6
7 AFM Cantilever AFM cantilever magnifies motions of the tip which can approach 2000x Compared to other technologies it is inexpensive and accurate technique Cantilever detector distance is 1000x the magnitude of the cantilever deflection Desirable for cantilever to have resonant frequency so that it can respond to topography fast Resonant frequency = I /2π Spring constant/mass November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 7
8 AFM Cantilever and Probe Probe (tip) is placed on the end of a cantilever which can act like a spring. The amount of force between the probe and sample is dependant on the spring constant (stiffness of the cantilever) and the distance between the probe and the sample surface. This force can be described using Hooke s Law: F= -k x k = spring constant (typically ~ N/m) is less than surface) x = cantilever deflection Spring depiction of cantilever SEM image of triangular cantilever with probe (tip). November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 8
9 Topography Derived from voltage applied to Z piezo needed to keep oscillation amplitude constant Amplitude Error signal from photo detector that shows the change in amplitude Phase Phase lag of cantilever response with respect to drive signal Topography Amplitude Phase AC Mode images of inner surface of blood vessel in buffer Topography Amplitude Phase (Image courtesy of Nanotechnology Center of Tsinghua University) November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 9
10 Phase Imaging Refers to the monitoring of the phase lag between the signal that drives the cantilever oscillation and the cantilever oscillation output signal. Extension of tapping mode. Changes in the phase lag reflect changes in the mechanical properties of the sample surface. System s feedback loop operates in the usual manner, using changes in the cantilever s deflection or vibration amplitude to measure sample topography. Phase lag is monitored while the topographic image is being taken so that images of topography and material properties can be collected simultaneously. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 10
11 Phase Imaging Variations in the phase lag provide information necessary to detect variations in composition, adhesion, friction, and viscoelasticity among others. First suggested by Garcia and Tamayo in 1996 that the phase signal in soft materials is sensitive to viscoelastic properties and adhesion forces, with little participation by elastic properties November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 11
12 Applications of Phase Imaging Study of phenomena and processes, such as abrasion, adhesion, cleaning, corrosion, etching, friction, lubrication, microlithography, moulding, plating and polishing Stability and reactivity studies for various thin layers Structural characterization of liquid crystalline materials Fault identification in microscopic structures Surface potential measurements on active polymer thin film transistors (TFTs) and in nanowires Detection of (biological) interactions at the nanometer scale Because phase imaging highlights variations in composition it is unaffected by large-scale topographical alterations; therefore it is an ideal extension of AFM providing information that would otherwise be obscured by rough topography. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 12
13 Comparison of Amplitude and Phase Imaging 500 nm x 500 nm height (left) and phase (right) AFM images of the amine-epoxy film surface that was in contact with a silicon substrate during cure. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 13
14 Example of Polymer Embedded in a Uniform Matrix Tapping Mode (left) and phase (right) images of a composite polymer embedded in a uniform matrix. The high resolution of the phase contrast image highlights the two component structure of the composite regions. Sample courtesy of Raj Michael. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 14
15 Height (A) and phase (B) image for a sensor material. In the height image, various particles and line structures are visible on the substrate. Only in the phase image, the presence of an organic selfassembled monolayer is visible as a result of its different mechanical properties. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 15
16 Magnetic Force Microscopy (MFM) MFM senses the stray magnetic field above the surface of a sample. A magnetic tip is brought into close proximity with the surface and a small cantilever is used to detect the force between the tip and the sample. Tip is scanned over the surface to reveal the magnetic domain structure of the sample at up to 50 nm resolution. Little sample preparation is required, but the images are difficult to quantify. The process operates in a two pass fashion. 1. First pass is a standard AFM trace that maps out the surface topography by gently tapping the tip along the surface. 2. Second pass then samples the magnetic stray field by scanning at constant height above the surface. The tip is coated with a magnetized material (e.g., CoCr or NiFe), so changes in the magnetic field affect the resonance characteristics of the cantilever, which are detected by the laser/photo-detector setup November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 16
17 November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 17
18 MFM simultaneously measures both topography and magnetic properties of sample. Using a cantilever coated with magnetized metal layer, spatial variation of magnetic domains can be observed, which gives more information than optical measurement such as magneto-optical Kerr effect. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 18
19 Obtaining Magnetic field above the surface of a sample 1. A special magnetized AFM tip is first used in tapping mode to profile the topography of the physical surface of the sample, 2. AFM is set to Lift Mode to enable the tip to re-trace the memorized profile of the surface from a set distance above the surface, and 3. Resulting interaction between the surface magnetic field and the magnetized AFM tip produces an image of the magnetic field gradient, independent of the surface topography. 4. Lifted cantilever - topography while responding to magnetic influences (second retrace). 5. Lifted cantilever profiles topography while responding to magnetic influences (second trace). 6. Cantilever ascends to Lift scan height. 7. Cantilever retraces surface topography on first retrace. 8. Cantilever traces surface topography on first trace. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 19
20 Example of an MFM for electro-deposited Ni film on Cu (100). left ( magnetic stray field), Right (surface topography). Nominal thickness of film is 400 nm, but there is a hole left by a gas bubble during the deposition process. Dark (light) stripes in the left hand image indicate domains with a relatively upward (downward) magnetization component. Notice that the width of the domains decreases at the hole edge. This is caused by the narrowing of the nickel film at the lip of the hole. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 20
21 Limitations and applications of Atomic Force Microscopes Suitable for wide variety of samples like biological samples, plastic, metals, glasses, semiconductor. Does not require a conducting sample unlike STM The commonly used probe in AFM is not ideally sharp. AFM image does not reflect the true sample topography for non sharp probes Requires sharper tips for better resolution Requires longer cantilever for vertical sensitivity High aspect ratio probes made of carbon nanotubes are expensive November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 21
22 Scanning Tunneling Microscope Based on tunneling current, which starts to flow when a sharp tip approaches a conducting surface at a distance of approximately one nanometer. Tunneling is a quantum mechanical effect. A tunneling current occurs when electrons move through a barrier that they classically shouldn't be able to move though. Tunneling current is distance dependence of the quantum mechanical tunneling effect. At a distance of only a few Å, the overlap of tip and sample electron wave functions is large enough for a tunneling current I t to occur which is given by I t ~ e -2kd, where d denotes the tip-sample distance and k is a constant depending on the height of the potential barrier. Hence, an increase of the tunneling distance of only 1 Å changes the tunneling currents by about an order of magnitude. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 22
23 Principle of Scanning Tunneling Microscopy (STM) In STM a tip is mounted on a piezoelectric tube, which allows tiny movements by applying a voltage at its electrodes. Electronics of the STM system control the tip position in such a way that the tunneling current and, hence, the tip-surface distance is kept constant, while at the same time scanning a small area of the sample surface. This movement is recorded and can be displayed as an image of the surface topography. Under ideal circumstances, the individual atoms of a surface can be resolved and displayed. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 23
24 Scanning Tunneling Microscope in the study of surfaces Widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. Provides a three-dimensional profile of the surface Useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules and aggregates on the surface. Study of surfaces in semiconductor physics and microelectronics. In chemistry, surface reactions in catalysis. Possible to fix organic molecules on a surface and study their structures for example, in the study of DNA molecule November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 24
25 Quantum Corrals This STM image shows the direct observation of standing-wave patterns in the local density of states of the Cu(111) surface. These spatial oscillations are quantum-mechanical interference patterns caused by scattering of the two-dimensional electron gas off the Fe adatoms and point defects. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 25
26 Limitations of Scanning Tunneling Microscope Can not be used for live (biological) samples, should only be conductor or semiconductor Requires complex instrumentation for ultra high vacuum and isolation for isolation from vibrations Probes have a short life time and are expensive Multiple tips at the end of dull probes can create serious artifacts Subject to electrical noise and vibrations November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 26
27 Imaging in Liquid/ Fluid Atomic Force AFM in the tapping mode is an attractive tool in the study of liquidsolid interfacial phenomena because of the elimination of lateral forces between the tip, and the sample and allows the following imaging : Particles at the liquid-solid interface to be imaged without changing their natural positions. of: Small particles and biological molecules that adsorb from an aqueous liquid onto a solid surface (can be from Van der waal forces) Provides enough magnifications to resolve single, deep submicrometer particles at the surface, while the presence of the liquid keeps the adsorbed particles in their native, hydrated states. Widely used in the study of adsorption of colloidal particles, including polymer latexes, mineral colloids, and protein molecules November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 27
28 Imaging of Adsorbed particles in Colloidal Materials using Tapping Mode Adsorbed particles are unaffected by the oscillating tip in tapping mode, it is possible to observe how the arrangement of particles at the surface is affected by system properties, such as the ionic strength of the surrounding liquid. Relevant information to the processing of colloidal materials and the purification of protein products. Possible to study how the layer of adsorbed particles grows with time, and to see how the structure of the adsorbed layer at the liquid-solid interface differs from the structure at air-solid interface. Colloidal material are dispersions of gas liquid or solids and colloidal particle measure between 1 nm to 1 micron. Adsorption is capability of a solid substance to attract to its surface molecules of a gas or solution with which it is in contact. Physical adsorption depends on van der Waals forces of attraction between molecules and resembles condensation of liquids. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 28
29 Example of Adsorbed Particles Images Figure 1: Tapping Mode in liquid image of positively charged polystyrene latex particles adsorbed to mica (in water). The average particle diameter is 120nm. 3μm scan Figure 2. Contact mode image in water of the same area in Figure 1. 3μm scan. Figure 3. Tapping mode image shows a broader area of the sample (7μm x 7μm) in water. The damage to the layer of adsorbed particles caused by the contact mode scan is clear. The adsorbed particles appear to have been pushed into clusters, mostly near the sides of the previously scanned region, and the bare mica substrate is exposed. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 29
30 Example of Adsorption and Behavior of Single Polymer Molecule Measured samples are often covered with about 1 nm adsorption layer of water. That distorts significantly the shape of the objects which have similar thickness or the objects themselves may be even changed interacting with water. Given below is an example of under-liquid-studies of the adsorption and behavior of single polymer molecules. Measurements were performed under the aqueous media of different ph values, corresponding to the addition of ~ g of pure hydrochloric acid per 1000 g of water (from ph 4.24 to ph 3.89). Roiter, Y.; Minko, S. J. Am. Chem. Soc. 2005, 127(45), November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 30
31 Liquid Imaging In biological Applications AFM imaging needs to be performed in the natural (aqueous) living environment of the cell in order to observe molecular level interactions and biochemical processes in-situ in the electrolyte solution and to avoid the. interference due to the capillary adhesion forces. Freshly cleaved muscovite mica, the surface of which is covered with siloxy groups, is often used for Immobilizing DNA onto Substrates for AFM Imaging in Liquid and must be firmly affixed to very smooth and flat surfaces DNA is composed of two strands of repeating units called nucleotides which are entwined in the shape of a double helix. Each DNA strand is 2.2 to 2.6 nm wide. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 31
32 Single point Spectroscopy or Force Distance spectroscopy Nanomechanical information about the sample can be obtained by measuring the changes while the separation from the surface is varied at a single point Base of the cantilever is moved in the vertical direction towards the surface using the piezo and then retracted again. During the motion, the deflection of the cantilever and other signals, such as the amplitude or phase in dynamic AFM modes, can be measured. This is usually called force spectroscopy. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 32
33 Measurement of Nanomechanical Forces using Force-distance spectroscopy. Force Distance Spectroscopy measures the mechanical interaction force between a tip and a sample. In the attractive force regime, it measures the pull-off force or bonding strength of sample surface, while in the repulsive force regime, the relative stiffness. Force-distance interaction between the tip and the sample is detected by monitoring the deflection of the cantilever as it approaches and retracts from the sample. Deflection of the cantilever is measured using a laser and a position sensitive diode. Hysteresis of the scanner can be controlled by use of closed-loop sensors Force on the sample is = Cantilever spring constant x cantilever deflection. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 33
34 AFM Force Versus Distance A simple AFM force-distance curve on a silicon wafer. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 34
35 Specification of Veeco (Bruker) Caliber System of AFM Performs tapping mode, phase imaging, Lift Mode, Contact, Lateral Force Microscopy (LFM) and Point Spectroscopy (force-distance measurements). Performs Magnetic Force Microscopy (MFM) with an optional MFM tool kit and Nanolithography with complimentary Nano Plot Nanolithography Software Standard Scanner: Large area 90 micrometer piezoelectric scanner Scan range: maximum lateral scan range : 90 micro meter, Vertical scan range less tan 10 micrometer XY Translator Range: 8 mmx8mm Sample size about 45 mm x -45 mmx20 mm (thick) Nanolithography modes November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 35
36 Safety The caliber system AFM contains Class III a, nm wavelength laser. Its maximum at CW is 0.2 mw. Appropriate laser safety procedures must be followed to avoid risk of eye damage. The students using it should understand the cautionary notes regarding laser safety and risk. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 36
37 VEECO Caliber Head and isolation table November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 37
38 Veeco caliber system with controller, brick, PC and head November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 38
39 Sample of Student Work November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 39
40 Semiconductor grid (AU coated) Amplitude 50 micrometer November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 40
41 Semi Conductor TM Phase Image 50 micrometer November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 41
42 Semiconductor grid amplitude 10 micrometer November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 42
43 Semiconductor grid Phase Image 10 micrometer November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 43
44 Human Cell Scraping November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 44
45 Pre Lithography attempt of CD Sample November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 45
46 Post Lithography Attempt of CD Sample November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 46
47 Mica November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 47
48 Veeco Step Height Sample November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 48
49 Poster Tape Sample November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 49
50 Remote Access ( NACK Center brings cutting-edge technology and instrumentation into your classroom, laboratory, and industry site by offering on-line remote access to nanotechnology processing instruments. Traditionally, an engineer from Penn State University orchestrates the instrument's use, while offering additional assistance via audio and visual internet software. Available Instrumentation: AFM: Atomic Force Microscopy FESEM: Field Emission Scanning Electron Microscopy Profilometry UV-Vis Spectrophotometry November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 50
51 References 1. Salahuddin Qazi, Robert Decker, Instructional Laboratory For Visualization and Manipulation of Nanoscale Components Using Low Cost Atomic Force Microscopes, Proceeding of 2010 American Society of Engineering Education Annual Conference, Louisville, Kentucky, June Material modifications for nanotechnology application and characterization, testing of nanotechnology structures and materials Nanotechnology Applications & career knowledge, October Robert A. Wilson and Heather A. Bullen, Intriduction to Scanning Probe Microscopy, Basic Theory, Atomic Force Microscopy, Robert A. Wilson and Heather A. Bullen, Introduction to Scanning Probe Microscopy, Basic Theory, Scanning Tunneling Microscopy, 2. W. Travis Johnson, Imaging DNA in Solution with the AFM, Agilent Technologies, Oct A. Hendrych, R. Kulbinek and A.V. Zhukov, The magnetic force Microscopy and its Capability for Nanomagnetic Studies, Modern Research and Educational Topics in Microscopy, Formatex Cheryl R. Blanchard, Atomic Force Microscopy, The Chemical Educator, Springer-Verlag, New York, Veeco di Caliber User Manual, 3. Parksystems Non contact AFM. November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 51
52 This material is based upon work supported, in part, by the National Science Foundation under Grant DUE# Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation November 19, 2010 NSF-CCLI WORKSHOP AT SUNYIT UTICA, NY 52
Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)
Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...
More informationModule 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM
Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used
More informationInstrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
More informationAFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division
AFM Imaging In Liquids W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division Imaging Techniques: Scales Proteins 10 nm Bacteria 1μm Red Blood Cell 5μm Human Hair 75μm Si Atom Spacing 0.4nm
More informationScanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010
Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis
More informationGeneral concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman
General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples
More informationLecture 12: Biomaterials Characterization in Aqueous Environments
3.051J/20.340J 1 Lecture 12: Biomaterials Characterization in Aqueous Environments High vacuum techniques are important tools for characterizing surface composition, but do not yield information on surface
More informationAtomic Force Microscopy imaging and beyond
Atomic Force Microscopy imaging and beyond Arif Mumtaz Magnetism and Magnetic Materials Group Department of Physics, QAU Coworkers: Prof. Dr. S.K.Hasanain M. Tariq Khan Alam Imaging and beyond Scanning
More informationNIS: what can it be used for?
AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached
More informationSTM: Scanning Tunneling Microscope
STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationScanning Force Microscopy
Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data
More informationIntermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM)
WORKSHOP Nanoscience on the Tip Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM) Table of Contents: 1. Motivation... 1. Simple Harmonic Motion... 1 3. AC-Mode Imaging...
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na
More informationAtomic and molecular interactions. Scanning probe microscopy.
Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic
More informationContents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages
Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy
More informationUnderstanding the properties and behavior of groups of interacting atoms more than simple molecules
Condensed Matter Physics Scratching the Surface Understanding the properties and behavior of groups of interacting atoms more than simple molecules Solids and fluids in ordinary and exotic states low energy
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationINTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface
More informationChapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
More informationChapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
More informationRemote Access to Hi-tech Equipment
Remote Access to Hi-tech Equipment From Your Classroom to Ours Sebastien Maeder Outline What is Remote Access? The Method vs. the Goal The role within NACK Why should we try? Confines of Classroom Characterization
More informationNanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2
Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor
More informationOutline Scanning Probe Microscope (SPM)
AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)
More informationTechniken der Oberflächenphysik (Techniques of Surface Physics)
Techniken der Oberflächenphysik (Techniques of Surface Physics) Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: yong.lei@tu-ilmenau.de yang.xu@tu-ilmenau.de
More informationScanning Probe Microscopy (SPM)
CHEM53200: Lecture 9 Scanning Probe Microscopy (SPM) Major reference: 1. Scanning Probe Microscopy and Spectroscopy Edited by D. Bonnell (2001). 2. A practical guide to scanning probe microscopy by Park
More informationScanning Force Microscopy II
Scanning Force Microscopy II Measurement modes Magnetic force microscopy Artifacts Lars Johansson 1 SFM - Forces Chemical forces (short range) Van der Waals forces Electrostatic forces (long range) Capillary
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,
More informationAtomic Force Microscopy (AFM) Part I
Atomic Force Microscopy (AFM) Part I CHEM-L2000 Eero Kontturi 6 th March 2018 Lectures on AFM Part I Principles and practice Imaging of native materials, including nanocellulose Part II Surface force measurements
More informationScanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM) --- G. Binnig, H. Rohrer et al, (1982) Near-Field Scanning Optical Microscopy (NSOM) --- D. W. Pohl (1982) Atomic Force Microscopy (AFM)
More informationAnd Manipulation by Scanning Probe Microscope
Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic
More informationCNPEM Laboratório de Ciência de Superfícies
Investigating electrical charged samples by scanning probe microscopy: the influence to magnetic force microscopy and atomic force microscopy phase images. Carlos A. R. Costa, 1 Evandro M. Lanzoni, 1 Maria
More informationINDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE. Biomedical Nanotechnology. Lec-05 Characterisation of Nanoparticles
INDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE Biomedical Nanotechnology Lec-05 Characterisation of Nanoparticles Dr. P. Gopinath Department of Biotechnology Indian Institute
More informationNanoscale work function measurements by Scanning Tunneling Spectroscopy
Related Topics Tunneling effect, Defects, Scanning Tunneling Microscopy (STM), (STS), Local Density of States (LDOS), Work function, Surface activation, Catalysis Principle Scanning tunneling microscopy
More informationAFM for Measuring Surface Topography and Forces
ENB 2007 07.03.2007 AFM for Measuring Surface Topography and Forces Andreas Fery Scanning Probe : What is it and why do we need it? AFM as a versatile tool for local analysis and manipulation Dates Course
More informationCharacterization of MEMS Devices
MEMS: Characterization Characterization of MEMS Devices Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, Recap Characterization of MEMS
More informationScanning Tunneling Microscopy and its Application
Chunli Bai Scanning Tunneling Microscopy and its Application With 181 Figures SHANGHAI SCIENTIFIC & TECHNICAL PUBLISHERS Jpl Springer Contents 1. Introduction 1 1.1 Advantages of STM Compared with Other
More informationIntroduction to Scanning Probe Microscopy
WORKSHOP Nanoscience on the Tip Introduction to Scanning Probe Microscopy Table of Contents: 1 Historic Perspectives... 1 2 Scanning Force Microscopy (SFM)... 2 2.1. Contact Mode... 2 2.2. AC Mode Imaging...
More informationLecture 26 MNS 102: Techniques for Materials and Nano Sciences
Lecture 26 MNS 102: Techniques for Materials and Nano Sciences Reference: #1 C. R. Brundle, C. A. Evans, S. Wilson, "Encyclopedia of Materials Characterization", Butterworth-Heinemann, Toronto (1992),
More informationProgram Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION
Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany
More informationIntroduction to Scanning Probe Microscopy Zhe Fei
Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force
More informationKavli Workshop for Journalists. June 13th, CNF Cleanroom Activities
Kavli Workshop for Journalists June 13th, 2007 CNF Cleanroom Activities Seeing nm-sized Objects with an SEM Lab experience: Scanning Electron Microscopy Equipment: Zeiss Supra 55VP Scanning electron microscopes
More informationSOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani
SOLID STATE PHYSICS PHY F341 Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani 333031 manjula@bits-pilani.ac.in Characterization techniques SEM AFM STM BAM Outline What can we use
More informationReview. Surfaces of Biomaterials. Characterization. Surface sensitivity
Surfaces of Biomaterials Three lectures: 1.23.05 Surface Properties of Biomaterials 1.25.05 Surface Characterization 1.27.05 Surface and Protein Interactions Review Bulk Materials are described by: Chemical
More informationREPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S.
REPORT ON SCANNING TUNNELING MICROSCOPE Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. Bobji Submitted by Ankush Kumar Jaiswal (09371) Abhay Nandan (09301) Sunil
More informationPoint mass approximation. Rigid beam mechanics. spring constant k N effective mass m e. Simple Harmonic Motion.. m e z = - k N z
Free end Rigid beam mechanics Fixed end think of cantilever as a mass on a spring Point mass approximation z F Hooke s law k N = F / z This is beam mechanics, standard in engineering textbooks. For a rectangular
More informationSupporting Information
Supporting Information Analysis Method for Quantifying the Morphology of Nanotube Networks Dusan Vobornik*, Shan Zou and Gregory P. Lopinski Measurement Science and Standards, National Research Council
More information672 Advanced Solid State Physics. Scanning Tunneling Microscopy
672 Advanced Solid State Physics Scanning Tunneling Microscopy Biao Hu Outline: 1. Introduction to STM 2. STM principle & working modes 3. STM application & extension 4. STM in our group 1. Introduction
More informationSUPPLEMENTARY INFORMATION
1. Supplementary Methods Characterization of AFM resolution We employed amplitude-modulation AFM in non-contact mode to characterize the topography of the graphene samples. The measurements were performed
More informationToday s SPM in Nanotechnology
Today s SPM in Nanotechnology An introduction for Advanced Applications Qun (Allen) Gu, Ph.D., AFM Scientist, Pacific Nanotechnology IEEE Bay Area Nanotechnology Council, August, 2007 8/17/2015 1 Content
More informationScanning Probe Microscopy. EMSE-515 F. Ernst
Scanning Probe Microscopy EMSE-515 F. Ernst 1 Literature 2 3 Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer,Ans Josef Hug,Roland Bennewitz 4 Scanning Probe Microscopy and Spectroscopy : Theory,
More informationHigh-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy
High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy Jing-jiang Yu Nanotechnology Measurements Division Agilent Technologies, Inc. Atomic Force Microscopy High-Resolution
More informationVEDA - Virtual Environment for Dynamic Atomic Force Microscopy
VEDA - Virtual Environment for Dynamic Atomic Force Microscopy John Melcher, Daniel Kiracofe, doctoral students Steven Johnson, undergraduate Shuiqing Hu, Veeco Arvind Raman, Associate Professor Mechanical
More informationIntroduction to Scanning Tunneling Microscopy
Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York New York Oxford OXFORD UNIVERSITY PRESS 1993 CONTENTS List
More informationUniversità degli Studi di Bari "Aldo Moro"
Università degli Studi di Bari "Aldo Moro" Table of contents 1. Introduction to Atomic Force Microscopy; 2. Introduction to Raman Spectroscopy; 3. The need for a hybrid technique Raman AFM microscopy;
More informationNanotechnology Fabrication Methods.
Nanotechnology Fabrication Methods. 10 / 05 / 2016 1 Summary: 1.Introduction to Nanotechnology:...3 2.Nanotechnology Fabrication Methods:...5 2.1.Top-down Methods:...7 2.2.Bottom-up Methods:...16 3.Conclusions:...19
More informationMAGNETIC FORCE MICROSCOPY
University of Ljubljana Faculty of Mathematics and Physics Department of Physics SEMINAR MAGNETIC FORCE MICROSCOPY Author: Blaž Zupančič Supervisor: dr. Igor Muševič February 2003 Contents 1 Abstract 3
More informationCharacterization Tools
Lectures in Nanoscience & Technology Characterization Tools K. Sakkaravarthi Department of Physics National Institute of Technology Tiruchirappalli 620 015 Tamil Nadu India sakkaravarthi@nitt.edu ksakkaravarthi.weebly.com
More informationSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions
More informationSupplementary Figure 1 a) Scheme of microfluidic device fabrication by photo and soft lithography,
a b 1 mm Supplementary Figure 1 a) Scheme of microfluidic device fabrication by photo and soft lithography, (a1, a2) 50nm Pd evaporated on Si wafer with 100 nm Si 2 insulating layer and 5nm Cr as an adhesion
More informationSupporting information
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supporting information Self-assembled nanopatch with peptide-organic multilayers and mechanical
More informationFrom nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor
From nanophysics research labs to cell phones Dr. András Halbritter Department of Physics associate professor Curriculum Vitae Birth: 1976. High-school graduation: 1994. Master degree: 1999. PhD: 2003.
More informationMSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
More informationCHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
More informationLesson 4: Tools of the Nanosciences. Student Materials
Lesson 4: Tools of the Nanosciences Student Materials Contents Black Box Lab Activity: Student Instructions and Worksheet Seeing and Building Small Things: Student Reading Seeing and Building Small Things:
More information29: Nanotechnology. What is Nanotechnology? Properties Control and Understanding. Nanomaterials
29: Nanotechnology What is Nanotechnology? Properties Control and Understanding Nanomaterials Making nanomaterials Seeing at the nanoscale Quantum Dots Carbon Nanotubes Biology at the Nanoscale Some Applications
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/08/06 Prof. C. Ortiz, MIT-DMSE I LECTURE 2 : THE FORCE TRANSDUCER
I LECTURE 2 : THE FORCE TRANSDUCER Outline : LAST TIME : WHAT IS NANOMECHANICS... 2 HOW CAN WE MEASURE SUCH TINY FORCES?... 3 EXAMPLE OF A FORCE TRANSDUCER... 4 Microfabricated cantilever beams with nanosized
More informationChapter 2 Correlation Force Spectroscopy
Chapter 2 Correlation Force Spectroscopy Correlation Force Spectroscopy: Rationale In principle, the main advantage of correlation force spectroscopy (CFS) over onecantilever atomic force microscopy (AFM)
More informationInstability & Pattering of Thin Polymer Films Prof. R. Mukherjee Department of Chemical Engineering Indian Institute of Technology Kharagpur
Instability & Pattering of Thin Polymer Films Prof. R. Mukherjee Department of Chemical Engineering Indian Institute of Technology Kharagpur Lecture No#26 Atomic Force Microscope V (Refer Slide Time: 00:34)
More informationScanning Probe Microscopy. L. J. Heyderman
1 Scanning Probe Microscopy 2 Scanning Probe Microscopy If an atom was as large as a ping-pong ball......the tip would have the size of the Matterhorn! 3 Magnetic Force Microscopy Stray field interaction
More informationBringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach
Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Beyond the diffraction limit The resolution of optical microscopy is generally limited by the diffraction
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/15/07 Prof. C. Ortiz, MIT-DMSE I LECTURE 4: FORCE-DISTANCE CURVES
I LECTURE 4: FORCE-DISTANCE CURVES Outline : LAST TIME : ADDITIONAL NANOMECHANICS INSTRUMENTATION COMPONENTS... 2 PIEZOS TUBES : X/Y SCANNING... 3 GENERAL COMPONENTS OF A NANOMECHANICAL DEVICE... 4 HIGH
More informationSpring 2009 EE 710: Nanoscience and Engineering
Spring 2009 EE 710: Nanoscience and Engineering Part 1: Introduction Course Texts: Bhushan, Springer Handbook of Nanotechnology 2 nd ed., Springer 2007 Hornyak, et.al, Introduction ti to Nanoscience, CRC
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 11: Scanning Probe Microscopy. Byungha Shin Dept. of MSE, KAIST
2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 11: Scanning Probe Microscopy Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization
More informationNANOTECHNOLOGY. Students will gain an understanding of nanoscale dimensions and nanotechnology.
NANOTECHNOLOGY By Anna M. Waldron and Carl A. Batt, Nanobiotechnology Center, Cornell University Subjects: Nanotechnology, Chemistry, Physics Time: Two class periods (approximately 90 minutes) Objective:
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/22/07 Prof. C. Ortiz, MIT-DMSE
I LECTURE 5: AFM IMAGING Outline : LAST TIME : HRFS AND FORCE-DISTANCE CURVES... 2 ATOMIC FORCE MICROSCOPY : GENERAL COMPONENTS AND FUNCTIONS... 3 Deflection vs. Height Images... 4 3D Plots and 2D Section
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/22/07 Prof. C. Ortiz, MIT-DMSE
I LECTURE 5: AFM IMAGING Outline : LAST TIME : HRFS AND FORCE-DISTANCE CURVES... 2 ATOMIC FORCE MICROSCOPY : GENERAL COMPONENTS AND FUNCTIONS... 3 Deflection vs. Height Images... 4 3D Plots and 2D Section
More informationContents. Preface XI Symbols and Abbreviations XIII. 1 Introduction 1
V Contents Preface XI Symbols and Abbreviations XIII 1 Introduction 1 2 Van der Waals Forces 5 2.1 Van der Waals Forces Between Molecules 5 2.1.1 Coulomb Interaction 5 2.1.2 Monopole Dipole Interaction
More informationEcole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools
1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron
More informationMercury(II) detection by SERS based on a single gold microshell
Mercury(II) detection by SERS based on a single gold microshell D. Han, S. Y. Lim, B. J. Kim, L. Piao and T. D. Chung* Department of Chemistry, Seoul National University, Seoul, Korea. 2010, 46, 5587-558
More information3.052 Nanomechanics of Materials and Biomaterials Tuesday 04/03/07 Prof. C. Ortiz, MIT-DMSE I LECTURE 13: MIDTERM #1 SOLUTIONS REVIEW
I LECTURE 13: MIDTERM #1 SOLUTIONS REVIEW Outline : HIGH RESOLUTION FORCE SPECTROSCOPY...2-10 General Experiment Description... 2 Verification of Surface Functionalization:Imaging of Planar Substrates...
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3 and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationScanning Tunneling Microscopy Transmission Electron Microscopy
Scanning Tunneling Microscopy Transmission Electron Microscopy Speakers Burcu Başar Semih Gezgin Yavuz Selim Telis Place Hacettepe University Department of Chemical Engineering It s a small world after
More informationClark Atlanta University Center for Surface Chemistry and Catalysis Instrument Capabilities
Center for Surface Chemistry and Catalysis Instrument Capabilities For information contact: Dr. Eric Mintz Research Center for Science and Technology Clark Atlanta University Atlanta, Georgia 30314 Phone:
More informationImaging Nucleic Acids with the AFM. W Travis Johnson PhD Agilent Technologies Nanomeasurements Division
Imaging Nucleic Acids with the AFM W Travis Johnson PhD Agilent Technologies Nanomeasurements Division Structure of DNA A T G C Standard Watson-Crick A-T & G-C base pairs in B-DNA DNA double helix composed
More informationNanotechnology. Gavin Lawes Department of Physics and Astronomy
Nanotechnology Gavin Lawes Department of Physics and Astronomy Earth-Moon distance 4x10 8 m (courtesy NASA) Length scales (Part I) Person 2m Magnetic nanoparticle 5x10-9 m 10 10 m 10 5 m 1 m 10-5 m 10-10
More informationFundamentals of Atomic Force Microscopy Part 2: Dynamic AFM Methods
Fundamentals of tomic Force Microscopy Part 2: Dynamic FM Methods Week 2, Lecture 5 ttractive and repulsive regimes and phase contrast in amplitude modulation FM rvind Raman Mechanical Engineering Birck
More informationPhysics and Chemistry of Interfaces
Hans Jürgen Butt, Karlheinz Graf, and Michael Kappl Physics and Chemistry of Interfaces Second, Revised and Enlarged Edition WILEY- VCH WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface XI 1 Introduction
More informationSimple Harmonic Motion and Damping
Simple Harmonic Motion and Damping Marie Johnson Cabrices Chamblee Charter High School Background: Atomic Force Microscopy, or AFM, is used to characterize materials. It is used to measure local properties,
More informationIntegrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System Design
Tamkang Journal of Science and Engineering, Vol. 12, No. 4, pp. 399 407 (2009) 399 Integrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System
More informationnano-ta: Nano Thermal Analysis
nano-ta: Nano Thermal Analysis Application Note #1 Failure Analysis - Identification of Particles in a Polymer Film Author: David Grandy Ph.D. Introduction Nano-TA is a local thermal analysis technique
More informationSUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes
SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes Fabrication of the scanning thermal microscopy (SThM) probes is summarized in Supplementary Fig. 1 and proceeds
More informationinstruments anasys Nanoscale Thermal Analysis Craig Prater, CTO Research Challenges for Nanomanufacturing Systems Februay th, 2008
Nanoscale Thermal Analysis Craig Prater, CTO Research Challenges for Nanomanufacturing Systems Februay 11-12 th, 2008 Motivations Nanomanufacturing needs characterization for research, product development
More informationRHK Technology Brief
The Atomic Force Microscope as a Critical Tool for Research in Nanotribology Rachel Cannara and Robert W. Carpick Nanomechanics Laboratory, University of Wisconsin Madison Department of Engineering Physics,
More informationMeasurements of interaction forces in (biological) model systems
Measurements of interaction forces in (biological) model systems Marina Ruths Department of Chemistry, UMass Lowell What can force measurements tell us about a system? Depending on the technique, we might
More informationMagnetic Force Microscopy (MFM) F = µ o (m )H
Magnetic Force Microscopy (MFM) F = µ o (m )H 1. MFM is based on the use of a ferromagnetic tip as a local field sensor. Magnetic interaction between the tip and the surface results in a force acting on
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3, and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationSUPPLEMENTARY INFORMATION
Magnetic Exchange Force Microscopy with Atomic Resolution Uwe Kaiser, Alexander Schwarz and Roland Wiesendanger S1 AFM set-up Figure S1 shows the block diagram of the AFM data acquisition set-up using
More informationScanning Probe Microscopy
1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced
More informationNanoscale characteristics by Scanning Tunneling Spectroscopy
Related Topics Tunneling effect, Scanning Tunneling Microscopy (STM), (STS), Local Density of States (LDOS), Band structure, Band Gap, k-space, Brioullin Zone, Metal, Semi-Metal, Semiconductor Principle
More information