Scanning Tunneling Microscopy and its Application
|
|
- Reginald Jordan
- 6 years ago
- Views:
Transcription
1 Chunli Bai Scanning Tunneling Microscopy and its Application With 181 Figures SHANGHAI SCIENTIFIC & TECHNICAL PUBLISHERS Jpl Springer
2 Contents 1. Introduction Advantages of STM Compared with Other Techniques From Optical Microscopy to Scanning Tunneling Microscopy Electron Microscopes Field Ion Microscope Scanning Tunneling Microscope Overview 7 2. The Tunneling Effect Historical Remarks Tunneling-Current Theory Tunneling Current Practical Tip and Surface Wave Functions Tip-Surface Interaction Model Tunneling Current Tunnel Conductance Tunneling Active Orbital at the Tip Double-Tip and Interference Effects Spectroscopy, and Spectroscopic Imaging Concepts of Tunneling Spectroscopies Solid-State-Barrier Tunneling Metal-Vacuum-Metal Tunneling Experimental Modes Current-Voltage Characteristics Current-Separation and Separation-Voltage Characteristics Constant-Current Topography Current-Imaging Tunneling Spectroscopy Energy Resolution Examples Surface States Adsorbate-Covered Surfaces Superconductivity Outlook 53 a) Influence of the Tip 54 b) Interpretation of Spectroscopy Results 54 VII
3 4. STM Instrumentation The Vibration Isolation System Mechanical Designs Piezoelectric Ceramics Three-Dimensional Scanners Coarse Sample Positioning STMs for Operation in Various Environments Tip Preparation Preparation of Tungsten Tips Preparation of Pt-Ir Tips Other Ways to Prepare STM Tips Tip Treatment Electronics Computer Automation Hardware Software Image Processing 91 a) Histogram Equalization 92 b) Convolution Filter 92 c) Statistical Differencing 93 d) Three-Dimensional Representation Other Related Scanning Probe Microscopes Atomic Force Microscope The Force Sensor Deflection Detection Illustrating AFM Applications Other Scanning-Force Microscopies HI Lateral Force Microscope Ill Force Microscope Operating in the Noncontact Mode Force Microscope Operating in the Tapping Mode Magnetic Force Microscope Electrostatic Force Microscope Ballistic-Electron-Emission Microscopy The Principle of ВЕЕМ The ВЕЕМ Experiment The Application of ВЕЕМ Ballistic-Hole Spectroscopy of Interfaces Scanning Ion-Conductance Microscope The Scanning Thermal Microscope Scanning Tunneling Potentiometry and Scanning Noise Microscopy Photon Scanning Tunneling Microscopy and Scanning Plasmon Near-Field Microscopy 136 VIII
4 5.8 Near-Field Scanning Optical Microscopy and Spectroscopy Principles of Near-Field Optics Optical Probes for Near-Field Optics NSOM Operation Near-Field Scanning Optical Spectroscopy Near-Field Optical Chemical Sensors Scanning Exciton Microscopy Single-Molecule Detection by Near-Field Optics STM Studies of Clean Surfaces Metal Surfaces Geometric Structures Electronic Structures Surface Diffusion Elemental Semiconductor Surfaces The Si(111) Surface 157 a) Si(lll)-7X7 157 b) Si(lll)-2xl The Si(001) Surface 161 a) Geometric Structure 161 b) Electronic Structure 163 c) The 2xn Structure Other Silicon-Surface Structures The Ge Surfaces 167 a) Ge(lll) 167 b) Ge(001) The GeSi(111) Surface Compound Semiconductors and Layered Compounds GaAs Surfaces 171 a) GaAs(llO). 171 b) GaAs(lOO) 172 c) GaAs(lll)andGaAs(Ill) 173 d) GaAs-AlGaAs Layered Compounds Charge-Density Waves in Compound Semiconductors. 177 a) CDW Phases of lt-tas b) Charge-Density Wave Defects High-T c Oxides Surf ace Adsorbates and Surf ace Chemistry Adsorption on Metal Surfaces Cu(110)-O Cu(100)-O Dynamics 189 IX
5 x Ag(110)-O Ni(110)-HandNi(lll)-H Sulfur Adsorption Cu(lll)-S Ni(lll)-S Cu(110)-S Ni(110)-S Mo(001)-SandRe(0001)-S Other Non-metal Adsorbates on Metals Metallic Adsorbates Adsorption on Semiconductor Surfaces Ag/Si(lll) Au/Si(lll) Cu/Si(lll) Group-Ill Metals on Si(111) B/Si(lll) Cl/Si(lll) Bi on Si(100) and Si(l 11) Surfaces Na/Si(lll) Na/GaAs(110)andCs/GaAs(110) Alkali Metals on Si(100)-2xl Molecules, and Molecular Adsorbates Molecular Crystals Chemisorbed Aromatic Molecules in Ultrahigh Vacuum Physisorbed Molecules in Ultrahigh Vacuum Physisorbed Long-Chain Molecules Fullerenes 227 a) C 60 on GaAs(llO) 227 b) C 60 on Si(100) 228 c) C 60 onsi(lll) 228 d) C 60 on MoS 2 (0001) 228 e) C 60 on Cu(lll) 229 f) C 60 onau(lll)andag(lll) Langmuir-Blodgett Films Observation of Clusters Metal Clusters Semiconductor Clusters Nucleation and Growth Epitaxial Growth of Metal Films Growth of SionSi(OOl) Chemical Reactions on Metals Reaction on Ni(l 10) Reaction on Cu(110) Chemical Identity with STM 242
6 7.7 Chemical Reaction on Semiconductors Reaction of NH 3 with Si(lll)-7x7 Surfaces Reaction of NH 3 with B/Si( 111)- л/3 xv3 Surf ace Reaction of NH 3 with Clean Si(OOl) Surface Si(lll)-7x7 Oxidation Si(100)-2xl Oxidation Reaction of H with Si(lll)-7x Reaction of Sb 4 with Si(100) Biological Applications Advantages and Problems Substrates Fixation of Samples onto Substrates Flexibility of Biological Samples Identification and Interpretation of STM Images Preparation Dispersion of Samples on Substrates Fixation of Samples 255 a) Sample Coatings 255 b) Covalently Binding Samples with Strongly Absorbent Groups 255 c) Binding Samples to the Substrate Covalently STM Imaging in Acqueous Solutions Hopping Technique STM Directed by an Optical Microscope Nucleic Acids DNA in Air and in Vacuum DNA Studies Under Water with an Electrolyte DNA-Protein Complex DNA Bases DNA Sequencing by Scanning-Probe Microscopes Proteins Animo Acids and Peptides Structural Proteins Functional Proteins Biological Membranes Imaging Cells and Other Applications Surface Modification Overview Direct Indentation with the Tunneling Tip Modification of Metal Surfaces Modification of Semiconductor Surfaces Nanolithography on Resist Films 287 XI
7 9.4 Nanofabrication in Solution and in Gaseous Environments Nanofabrication in Solution Nanofabrication in Gaseous Environments Atomic-Scale Manipulation Manipulation of Atoms 293 a) Xenon Atoms 293 b) Iron Atom 296 c) Silicon Atom 297 d) Sulfer Atoms Manipulation of Molecules and Clusters 300 a) Carbon Monoxide 300 b) Antimony Molecules 301 c) Decaborane and Other Organic Molecules 302 d) H 2 0 Molecules Fabrication with Other Scanning-Probe Microscopes Machining Thin Films Charge Storage Magnetic Structures and Writing into an Interface The Future 307 References 309 Subject Index 327 XII
Solid Surfaces, Interfaces and Thin Films
Hans Lüth Solid Surfaces, Interfaces and Thin Films Fifth Edition With 427 Figures.2e Springer Contents 1 Surface and Interface Physics: Its Definition and Importance... 1 Panel I: Ultrahigh Vacuum (UHV)
More informationINTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface
More informationScanning Probe Microscopy. EMSE-515 F. Ernst
Scanning Probe Microscopy EMSE-515 F. Ernst 1 Literature 2 3 Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer,Ans Josef Hug,Roland Bennewitz 4 Scanning Probe Microscopy and Spectroscopy : Theory,
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationOPTICAL PROPERTIES AND SPECTROSCOPY OF NANOAAATERIALS. Jin Zhong Zhang. World Scientific TECHNISCHE INFORMATIONSBIBLIOTHEK
OPTICAL PROPERTIES AND SPECTROSCOPY OF NANOAAATERIALS Jin Zhong Zhang University of California, Santa Cruz, USA TECHNISCHE INFORMATIONSBIBLIOTHEK Y World Scientific NEW JERSEY. t'on.don SINGAPORE «'BEIJING
More informationConcepts in Surface Physics
M.-C. Desjonqueres D. Spanjaard Concepts in Surface Physics Second Edition With 257 Figures Springer 1. Introduction................................. 1 2. Thermodynamical and Statistical Properties of
More informationSpectroscopy of Nanostructures. Angle-resolved Photoemission (ARPES, UPS)
Spectroscopy of Nanostructures Angle-resolved Photoemission (ARPES, UPS) Measures all quantum numbers of an electron in a solid. E, k x,y, z, point group, spin E kin, ϑ,ϕ, hν, polarization, spin Electron
More informationIntroduction to Scanning Tunneling Microscopy
Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York New York Oxford OXFORD UNIVERSITY PRESS 1993 CONTENTS List
More informationNear-Field Nano/Atom Optics and Technology
M. Ohtsu (Ed.) Near-Field Nano/Atom Optics and Technology With 189 Figures / Springer Preface List of Contributors V VII XIII 1. Introduction 1 1.1 Near-Field Optics and Related Technologies 1 1.2 History
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationSTM spectroscopy (STS)
STM spectroscopy (STS) di dv 4 e ( E ev, r) ( E ) M S F T F Basic concepts of STS. With the feedback circuit open the variation of the tunneling current due to the application of a small oscillating voltage
More informationBasic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)
Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...
More informationInstrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
More informationScanning Tunneling Microscopy. how does STM work? the quantum mechanical picture example of images how can we understand what we see?
Scanning Tunneling Microscopy how does STM work? the quantum mechanical picture example of images how can we understand what we see? Observation of adatom diffusion with a field ion microscope Scanning
More informationVibrational Spectroscopy of Molecules on Surfaces
Vibrational Spectroscopy of Molecules on Surfaces Edited by John T. Yates, Jr. University of Pittsburgh Pittsburgh, Pennsylvania and Theodore E. Madey National Bureau of Standards Gaithersburg, Maryland
More informationIntroduction to Scanning Probe Microscopy Zhe Fei
Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force
More informationModule 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM
Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used
More informationSurface Analysis - The Principal Techniques
Surface Analysis - The Principal Techniques Edited by John C. Vickerman Surface Analysis Research Centre, Department of Chemistry UMIST, Manchester, UK JOHN WILEY & SONS Chichester New York Weinheim Brisbane
More informationContents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages
Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy
More informationREPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S.
REPORT ON SCANNING TUNNELING MICROSCOPE Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. Bobji Submitted by Ankush Kumar Jaiswal (09371) Abhay Nandan (09301) Sunil
More informationCharacterization of MEMS Devices
MEMS: Characterization Characterization of MEMS Devices Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, Recap Characterization of MEMS
More informationProgram Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION
Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany
More informationChapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
More informationFrom nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor
From nanophysics research labs to cell phones Dr. András Halbritter Department of Physics associate professor Curriculum Vitae Birth: 1976. High-school graduation: 1994. Master degree: 1999. PhD: 2003.
More informationSpring 2009 EE 710: Nanoscience and Engineering
Spring 2009 EE 710: Nanoscience and Engineering Part 1: Introduction Course Texts: Bhushan, Springer Handbook of Nanotechnology 2 nd ed., Springer 2007 Hornyak, et.al, Introduction ti to Nanoscience, CRC
More informationKavli Workshop for Journalists. June 13th, CNF Cleanroom Activities
Kavli Workshop for Journalists June 13th, 2007 CNF Cleanroom Activities Seeing nm-sized Objects with an SEM Lab experience: Scanning Electron Microscopy Equipment: Zeiss Supra 55VP Scanning electron microscopes
More informationExperimental methods in physics. Local probe microscopies I
Experimental methods in physics Local probe microscopies I Scanning tunnelling microscopy (STM) Jean-Marc Bonard Academic year 09-10 1. Scanning Tunneling Microscopy 1.1. Introduction Image of surface
More informationChapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
More informationFinal Reading Assignment: Travels to the Nanoworld: pages pages pages
Final Reading Assignment: Travels to the Nanoworld: pages 152-164 pages 201-214 pages 219-227 Bottom-up nanofabrication Can we assemble nanomachines manually? What are the components (parts)? nanoparticles
More information2) Atom manipulation. Xe / Ni(110) Model: Experiment:
2) Atom manipulation D. Eigler & E. Schweizer, Nature 344, 524 (1990) Xe / Ni(110) Model: Experiment: G.Meyer, et al. Applied Physics A 68, 125 (1999) First the tip is approached close to the adsorbate
More informationLocal spectroscopy. N. Witkowski W. Sacks
Local spectroscopy N. Witkowski W. Sacks Outlook 1. STM/STS theory elements a. history of STM and basic idea b. tunnel effect c. STM/STS 2. Technology a. STM design : vibration and thermal drift b. STM
More informationPhysics and Chemistry of Interfaces
Hans Jürgen Butt, Karlheinz Graf, and Michael Kappl Physics and Chemistry of Interfaces Second, Revised and Enlarged Edition WILEY- VCH WILEY-VCH Verlag GmbH & Co. KGaA Contents Preface XI 1 Introduction
More informationScanning Tunneling Microscopy Transmission Electron Microscopy
Scanning Tunneling Microscopy Transmission Electron Microscopy Speakers Burcu Başar Semih Gezgin Yavuz Selim Telis Place Hacettepe University Department of Chemical Engineering It s a small world after
More informationNTEGRA for EC PRESENTATION
NTEGRA for EC PRESENTATION Application Purpose: In-situ control/modification of the surface morphology of single crystal and polycrystal electrodes (samples) during electrochemical process (in situ) in
More informationNanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2
Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor
More informationFabrication at the nanoscale for nanophotonics
Fabrication at the nanoscale for nanophotonics Ilya Sychugov, KTH Materials Physics, Kista silicon nanocrystal by electron beam induced deposition lithography Outline of basic nanofabrication methods Devices
More informationCore Level Spectroscopies
Core Level Spectroscopies Spectroscopies involving core levels are element-sensitive, and that makes them very useful for understanding chemical bonding, as well as for the study of complex materials.
More informationSingle-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy
Single-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy Byung Kim Department of Physics Boise State University Langmuir (in press, 2006) swollen collapsed Hydrophilic non-sticky
More informationScanning Probe Microscopy (SPM)
http://ww2.sljus.lu.se/staff/rainer/spm.htm Scanning Probe Microscopy (FYST42 / FAFN30) Scanning Probe Microscopy (SPM) overview & general principles March 23 th, 2018 Jan Knudsen, room K522, jan.knudsen@sljus.lu.se
More informationContents. Preface to the first edition
Contents List of authors Preface to the first edition Introduction x xi xiii 1 The nanotechnology revolution 1 1.1 From micro- to nanoelectronics 2 1.2 From the macroscopic to the nanoscopic world 4 1.3
More informationScanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010
Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis
More informationMicroscopy and Spectroscopy with Tunneling Electrons STM. Sfb Kolloquium 23rd October 2007
Microscopy and Spectroscopy with Tunneling Electrons STM Sfb Kolloquium 23rd October 2007 The Tunnel effect T ( E) exp( S Φ E ) Barrier width s Barrier heigth Development: The Inventors 1981 Development:
More informationSurface Analysis - The Principal Techniques
Surface Analysis - The Principal Techniques 2nd Edition Editors johnc.vickerman Manchester Interdisciplinary Biocentre, University of Manchester, UK IAN S. GILMORE National Physical Laboratory, Teddington,
More informationSurface atoms/molecules of a material act as an interface to its surrounding environment;
1 Chapter 1 Thesis Overview Surface atoms/molecules of a material act as an interface to its surrounding environment; their properties are often complicated by external adsorbates/species on the surface
More informationSemiconductor Physical Electronics
Semiconductor Physical Electronics Sheng S. Li Department of Electrical Engineering University of Florida Gainesville, Florida Plenum Press New York and London Contents CHAPTER 1. Classification of Solids
More informationNIS: what can it be used for?
AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached
More informationSurface physics, Bravais lattice
Surface physics, Bravais lattice 1. Structure of the solid surface characterized by the (Bravais) lattice + space + point group lattice describes also the symmetry of the solid material vector directions
More informationToday s SPM in Nanotechnology
Today s SPM in Nanotechnology An introduction for Advanced Applications Qun (Allen) Gu, Ph.D., AFM Scientist, Pacific Nanotechnology IEEE Bay Area Nanotechnology Council, August, 2007 8/17/2015 1 Content
More informationTechniken der Oberflächenphysik (Techniques of Surface Physics)
Techniken der Oberflächenphysik (Techniques of Surface Physics) Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: yong.lei@tu-ilmenau.de yang.xu@tu-ilmenau.de
More informationSUPPLEMENTARY INFORMATION
Simultaneous and coordinated rotational switching of all molecular rotors in a network Y. Zhang, H. Kersell, R. Stefak, J. Echeverria, V. Iancu, U. G. E. Perera, Y. Li, A. Deshpande, K.-F. Braun, C. Joachim,
More informationScanning Tunneling Microscopy. Wei-Bin Su, Institute of Physics, Academia Sinica
Scanning Tunneling Microscopy Wei-Bin Su, Institute of Physics, Academia Sinica Tunneling effect Classical physics Field emission 1000 ~ 10000 V E V metal-vacuum-metal tunneling metal metal Quantum physics
More information8 Summary and outlook
91 8 Summary and outlook The main task of present work was to investigate the growth, the atomic and the electronic structures of Co oxide as well as Mn oxide films on Ag(001) by means of STM/STS at LT
More informationMODERN TECHNIQUES OF SURFACE SCIENCE
MODERN TECHNIQUES OF SURFACE SCIENCE Second edition D. P. WOODRUFF & T. A. DELCHAR Department ofphysics, University of Warwick CAMBRIDGE UNIVERSITY PRESS Contents Preface to first edition Preface to second
More informationSupplementary Information:
Supplementary Figures Supplementary Information: a b 1 2 3 0 ΔZ (pm) 66 Supplementary Figure 1. Xe adsorbed on a Cu(111) surface. (a) Scanning tunnelling microscopy (STM) topography of Xe layer adsorbed
More informationGeneral concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman
General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples
More informationScanning Force Microscopy
Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data
More informationWafer-scale fabrication of graphene
Wafer-scale fabrication of graphene Sten Vollebregt, MSc Delft University of Technology, Delft Institute of Mircosystems and Nanotechnology Delft University of Technology Challenge the future Delft University
More informationULTRATHIN ORGANIC FILMS
An Introduction to ULTRATHIN ORGANIC FILMS From Langmuir-Blodgett to Self-Assembly Abraham Ulman Corporate Research Laboratories Eastman Kodak Company Rochester, New York Academic Press San Diego New York
More informationScanning Tunneling Microscopy
Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,
More informationSpectroscopy at nanometer scale
Spectroscopy at nanometer scale 1. Physics of the spectroscopies 2. Spectroscopies for the bulk materials 3. Experimental setups for the spectroscopies 4. Physics and Chemistry of nanomaterials Various
More informationMSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
More informationSheng S. Li. Semiconductor Physical Electronics. Second Edition. With 230 Figures. 4) Springer
Sheng S. Li Semiconductor Physical Electronics Second Edition With 230 Figures 4) Springer Contents Preface 1. Classification of Solids and Crystal Structure 1 1.1 Introduction 1 1.2 The Bravais Lattice
More informationScanning probe microscopy of graphene with a CO terminated tip
Scanning probe microscopy of graphene with a CO terminated tip Andrea Donarini T. Hofmann, A. J. Weymouth, F. Gießibl 7.5.2014 - Theory Group Seminar The sample Single monolayer of graphene Epitaxial growth
More informationSpectroscopies for Unoccupied States = Electrons
Spectroscopies for Unoccupied States = Electrons Photoemission 1 Hole Inverse Photoemission 1 Electron Tunneling Spectroscopy 1 Electron/Hole Emission 1 Hole Absorption Will be discussed with core levels
More informationLow Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory
Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory The laboratory of Low Temperature, Ultra High Vacuum (UHV LT) is specifically designed for surface science microscopy
More informationCatalysis by supported metal clusters and model systems
Catalysis by supported metal clusters and model systems Gianfranco Pacchioni Dipartimento di Scienza dei Materiali Università Milano-Bicocca Part I Catalysis by supported metal clusters and model systems
More informationSTM and graphene. W. W. Larry Pai ( 白偉武 ) Center for condensed matter sciences, National Taiwan University NTHU, 2013/05/23
STM and graphene W. W. Larry Pai ( 白偉武 ) Center for condensed matter sciences, National Taiwan University NTHU, 2013/05/23 Why graphene is important: It is a new form of material (two dimensional, single
More informationPHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy
PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray
More informationNanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope
Nanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope Kentaro Sasaki, Keiji Ueno and Atsushi Koma Department of Chemistry, The University of Tokyo,
More informationEXPLORING SCANNING PROBE MICROSCOPY WITH MATHEMATICA
EXPLORING SCANNING PROBE MICROSCOPY WITH MATHEMATICA Dror Sarid University of Arizona A WILEY-1NTERSCIENCE PUBLICATION JOHN WILEY & SONS, INC. New York Chichester Weinheim Brisbane Singapore Toronto CONTENTS
More informationNanomaterials and their Optical Applications
Nanomaterials and their Optical Applications Winter Semester 2013 Lecture 02 rachel.grange@uni-jena.de http://www.iap.uni-jena.de/multiphoton Lecture 2: outline 2 Introduction to Nanophotonics Theoretical
More informationSolutions for Assignment-8
Solutions for Assignment-8 Q1. The process of adding impurities to a pure semiconductor is called: [1] (a) Mixing (b) Doping (c) Diffusing (d) None of the above In semiconductor production, doping intentionally
More informationScanning Probe Microscopy
1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced
More informationContents. List of contributors Preface. Part I Nanostructure design and structural properties of epitaxially grown quantum dots and nanowires 1
Table of List of contributors Preface page xi xv Part I Nanostructure design and structural properties of epitaxially grown quantum dots and nanowires 1 1 Growth of III V semiconductor quantum dots C.
More informationCORE MOLIT ACTIVITIES at a glance
CORE MOLIT ACTIVITIES at a glance 1. Amplification of Biochemical Signals: The ELISA Test http://molit.concord.org/database/activities/248.html The shape of molecules affects the way they function. A test
More informationMicroscopical and Microanalytical Methods (NANO3)
Microscopical and Microanalytical Methods (NANO3) 06.11.15 10:15-12:00 Introduction - SPM methods 13.11.15 10:15-12:00 STM 20.11.15 10:15-12:00 STS Erik Zupanič erik.zupanic@ijs.si stm.ijs.si 27.11.15
More informationThe interpretation of STM images in light of Tersoff and Hamann tunneling model
The interpretation of STM images in light of Tersoff and Hamann tunneling model The STM image represents contour maps of constant surface LDOS at E F, evaluated at the center of the curvature of the tip.
More informationbio-molecular studies Physical methods in Semmelweis University Osváth Szabolcs
Physical methods in bio-molecular studies Osváth Szabolcs Semmelweis University szabolcs.osvath@eok.sote.hu Light emission and absorption spectra Stokes shift is the difference (in wavelength or frequency
More information(Scanning Probe Microscopy)
(Scanning Probe Microscopy) Ing-Shouh Hwang (ishwang@phys.sinica.edu.tw) Institute of Physics, Academia Sinica, Taipei, Taiwan References 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett.
More informationSELF-ASSEMBLY AND NANOTECHNOLOGY A Force Balance Approach
SELF-ASSEMBLY AND NANOTECHNOLOGY A Force Balance Approach Yoon S. Lee Scientific Information Analyst Chemical Abstracts Service A Division of the American Chemical Society Columbus, Ohio WILEY A JOHN WILEY
More informationAnd Manipulation by Scanning Probe Microscope
Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic
More informationPhotoelectron Spectroscopy
Stefan Hüfner Photoelectron Spectroscopy Principles and Applications Third Revised and Enlarged Edition With 461 Figures and 28 Tables JSJ Springer ... 1. Introduction and Basic Principles 1 1.1 Historical
More informationCHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
More informationHarald Ibach Hans Lüth SOLID-STATE PHYSICS. An Introduction to Theory and Experiment
Harald Ibach Hans Lüth SOLID-STATE PHYSICS An Introduction to Theory and Experiment With 230 Figures Springer-Verlag Berlin Heidelberg New York London Paris Tokyo Hong Kong Barcelona Budapest Contents
More informationGraphene Fundamentals and Emergent Applications
Graphene Fundamentals and Emergent Applications Jamie H. Warner Department of Materials University of Oxford Oxford, UK Franziska Schaffel Department of Materials University of Oxford Oxford, UK Alicja
More informationBandgap engineering through nanocrystalline magnetic alloy grafting on. graphene
Electronic Supplementary Material (ESI) for Physical Chemistry Chemical Physics. This journal is the Owner Societies 2014 Electronic Supplementary Information (ESI) for Bandgap engineering through nanocrystalline
More informationReducing dimension. Crystalline structures
Reducing dimension 2D surfaces, interfaces and quantum wells 1D carbon nanotubes, quantum wires and conducting polymers 0D nanocrystals, nanoparticles, lithographically patterned quantum dots Crystalline
More informationMSN551 LITHOGRAPHY II
MSN551 Introduction to Micro and Nano Fabrication LITHOGRAPHY II E-Beam, Focused Ion Beam and Soft Lithography Why need electron beam lithography? Smaller features are required By electronics industry:
More informationSurface Physics Surface Diffusion. Assistant: Dr. Enrico Gnecco NCCR Nanoscale Science
Surface Physics 008 8. Surface Diffusion Assistant: Dr. Enrico Gnecco NCCR Nanoscale Science Random-Walk Motion Thermal motion of an adatom on an ideal crystal surface: - Thermal excitation the adatom
More informationINDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE. Biomedical Nanotechnology. Lec-05 Characterisation of Nanoparticles
INDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE Biomedical Nanotechnology Lec-05 Characterisation of Nanoparticles Dr. P. Gopinath Department of Biotechnology Indian Institute
More informationCrystalline Surfaces for Laser Metrology
Crystalline Surfaces for Laser Metrology A.V. Latyshev, Institute of Semiconductor Physics SB RAS, Novosibirsk, Russia Abstract: The number of methodological recommendations has been pronounced to describe
More informationOptics and Spectroscopy
Introduction to Optics and Spectroscopy beyond the diffraction limit Chi Chen 陳祺 Research Center for Applied Science, Academia Sinica 2015Apr09 1 Light and Optics 2 Light as Wave Application 3 Electromagnetic
More informationQuantum Condensed Matter Physics Lecture 12
Quantum Condensed Matter Physics Lecture 12 David Ritchie QCMP Lent/Easter 2016 http://www.sp.phy.cam.ac.uk/drp2/home 12.1 QCMP Course Contents 1. Classical models for electrons in solids 2. Sommerfeld
More informationLecture 12: Biomaterials Characterization in Aqueous Environments
3.051J/20.340J 1 Lecture 12: Biomaterials Characterization in Aqueous Environments High vacuum techniques are important tools for characterizing surface composition, but do not yield information on surface
More informationUnderstanding the properties and behavior of groups of interacting atoms more than simple molecules
Condensed Matter Physics Scratching the Surface Understanding the properties and behavior of groups of interacting atoms more than simple molecules Solids and fluids in ordinary and exotic states low energy
More informationNanoscale Chemical Imaging with Photo-induced Force Microscopy
OG2 BCP39nm_0062 PiFM (LIA1R)Fwd 500 279.1 µv 375 250 nm 500 375 250 125 0 nm 125 219.0 µv Nanoscale Chemical Imaging with Photo-induced Force Microscopy 0 Thomas R. Albrecht, Derek Nowak, Will Morrison,
More informationScanning tunneling microscopy
IFM The Department of Physics, Chemistry and Biology Lab 72 in TFFM08 Scanning tunneling microscopy NAME PERS. - NUMBER DATE APPROVED Rev. Dec 2006 Ivy Razado Aug 2014 Tuomas Hänninen Contents 1 Introduction
More informationSOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani
SOLID STATE PHYSICS PHY F341 Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani 333031 manjula@bits-pilani.ac.in Characterization techniques SEM AFM STM BAM Outline What can we use
More informationtip of a current tip and the sample. Components: 3. Coarse sample-to-tip isolation system, and
SCANNING TUNNELING MICROSCOPE Brief history: Heinrich Rohrer and Gerd K. Binnig, scientists at IBM's Zurich Research Laboratory in Switzerland, are awarded the 1986 Nobel Prize in physicss for their work
More information