Low Temperature Physics Measurement Systems

Size: px
Start display at page:

Download "Low Temperature Physics Measurement Systems"

Transcription

1 PAGE 6 & PRODUCT CATALOG Accelerate your Semiconductor Research & Developments towards Nanoscale Products. Experience your new working horse in the emerging field of semiconductor research for the nanoscale age. attocube systems presents its product line of low temperature physics measurement systems. Perform your experiments time efficiently resulting in your company s future nanoscale products. Confocal Microscopy Atomic Force Microscopy Magnetic Force Microscopy With this novel ultra-modular system a variety of scanning probe microscopy (SPM) techniques as well as a probing station at low temperatures down to the mk regime can be covered within one single device. This is realized by a modular basic system in combination with flexible, high end control electronics supporting your individual research task. For this system, a variety of microscopy inserts are available which are tailored for your individual measurement tasks and can simply be expanded for future projects. For details on the different microscopy and probe station inserts, please refer to the nanoscopy and nanotoo- LING sections in this catalog. Spectral lines of one single quantum dot. Scanning Near-Field Optical Microscopy Lattice of lateral InAs quantum dot molecules. Scanning Tunneling Microscopy 5 mm MFM image of a hard disk. Cryogenic Probe Station 5 mm SNOM images of Vanadium rhomb structures in reflection (4 K, 8 T). Atomic resolution image of an HOPG surface recorded at 300 mk. CCD image of an HF probe touching the contact pads. attocube systems explore your nanoworld

2 PAGE 7 & PRODUCT CATALOG INTRODUCTION LTSYS the new line of low temperature physics measurement systems LIQUID HELIUM SYSTEMS LTSYS-He ultra-stable low temperature physics measurement systems CRYOGEN-FREE SYSTEMS LTSYS-Cc cryogen-free low temperature physics measurement systems nanopositioning Ultra Compact Positioners for Extreme Environments

3 PAGE 8 & PRODUCT CATALOG LTSYS attocube systems offers various versions of the two basic systems: LTSYS-He ultra-stable low temperature physics measurement systems The basic LTSYS-He4 systems are based on a liquid Helium bath cryostat and optimized for highest stability of your measurements. Options as a variable temperature insert (VTI), a He3 insert, or a dilution refrigerator unit, enable to cover a large temperature range down to the mk regime. Superconducting magnets up to 15 T are compatible with the system. The compatible microscopy inserts range from Confocal Microscopy (CFM) and Scanning Nearfield Optical Microscopy (SNOM) to Atomic Force Microscopy (AFM) and related techniques (Magnetic Force Microscopy (MFM) and Electric Force Microscopy (EFM), as well as Scanning Tunneling Microscopy (STM) for measurements with atomic resolution. Furthermore, probe station modules for cryogenic probing of your NEMS/MEMS samples are available. LTSYS-Cc cryogen-free low temperature physics measurement systems This cooling system includes a cryogen-free closed-cycle cryostat for applications where liquid Helium is not available or desired. Expensive running costs and security issues can be avoided. An optional Adiabatic Demagnetization Refrigerator (ADR), or dilution refrigerator unit enables ultra-low temperature setups. The automation level allows for set and forget operation for non-expert users. For these systems, a variety of Confocal Microscopy (CFM) inserts, the Atomic Force Microscopy (AFM) insert with MFM and EFM functionality, as well as the probe station inserts are available. attocube systems explore your nanoworld

4 PAGE 9 & PRODUCT CATALOG Configure your Low Temperature Physics Measurement System vibration isolation system cryostat superconducting magnet electronic controller microscope insert Cryostat liquid He bath cryostat with optional VTI, He3, or dilution refrigerator insert. pulse tube cooler with optional ADR or dilution refrigerator insert. Magnets with variable field strengths (e.g. 5, 7, 8, 9, 10, 12 or 15 Tesla). Microscope Inserts Confocal Microscopy (CFM) Atomic Force Microscopy (AFM) Scanning Near-Field Optical Microscopy (SNOM) Scanning Tunneling Microscopy (STM) Cryogenic Probe Station (CPS) 4 5 Isolation System each LTSYS is equipped with an accoustic and mechanic damping and vibration isolation system to minimize noise levels enabling atomic resolution imaging. Electronics Scanning Probe Microscopy Controller (ASC500) Scanning Confocal Microscopy Controller (ASC400) Piezo Motion Controller (ANC350) Piezo Step Controller (ANC150) Piezo Scan Controller (ANC200) Position Readout Controller (ARC200) Laser Detection Module (LDM 600,...) LTSYS

5 PAGE 10 & PRODUCT CATALOG LTSYS-He ultra-stable low temperature physics measurement systems :... This system is based on a liquid Helium bath cryostat and has been optimized for highest stability. This system enables e.g. ultra high resolution imaging using Scanning Tunneling Microscopy (STM) or long-term investigations of single quantum dots over several weeks. A large variety of microscopy and probing heads cover a broad spectrum of measurement tasks. Superconducting magnets up to 15 T are available with this system. Three LTSYS-He systems are available: LTSYS-He4: Dependent on the pumping system, temperatures down to 1.5 K can be achieved. With an additional heating stage the temperature of the sample can be swept up to 70 K. A Variable Temperature Insert (VTI, optional) enables sweeping the temperature between 1.8 and 300 K. LTSYS-He3: Operating down to 300 mk, this state of the art system features integrated designs for the He3 insert with the high efficiency He bath cryostat. Reduction of the vapor pressure is achieved by an internal sorption pump (charcoal cooling) optimized for lowest vibrations. LTSYS-DIL: Operating down to 20 mk, this state of the art system features lowest base temperatures for combination with e.g. the confocal microscopy insert attocfm II. The basic system includes the following components: > liquid Helium bath cryostat with a 2 insert fitting all attocube microscope and probing inserts > vibration and acoustic noise damping system attodamp enabling high resolution imaging > high-end SPM controller ASC500 or confocal microscopy controller ASC400 for intuitive controlling of the microcope modules > Piezo Scan Controller for fine scanning of the sample > Piezo Step Controller for sample coarse positioning > workstation PC with TFT-monitor Options: > sample heating stage for temperature control from 1.5 to 70 K > Variable Temperature Insert (VTI) for temperature control from 1.8 to 300 K > He3 insert for base temperatures down to 300 mk > superconducting magnets up to 12 T by default (15 T on request) PRODUCT KEY FEATURES > ultra high stability > highest flexibility > base temperature: down to 300 mk with He3 insert, down to 20 mk with dilution refrigerator insert > compatible with superconducting magnets up to 15 T EXAMPLE APPLICATIONS > ultra high resolution imaging in STM or AFM on semiconductor structures > solid state physics and quantum dot optics (CFM) > materials science research on ceramics, polymers, additives, alloys,.. > quantitative surface characterization in the sub-micron range attocube systems explore your nanoworld

6 PAGE 11 & PRODUCT CATALOG LTSYS

7 PAGE 12 & PRODUCT CATALOG Specifications LTSYS-He attocube systems explore your nanoworld

8 PAGE 13 & PRODUCT CATALOG LTSYS

9 PAGE 14 & PRODUCT CATALOG Specifications LTSYS-He attocube systems explore your nanoworld

10 PAGE 15 & PRODUCT CATALOG LTSYS

11 PAGE 16 & PRODUCT CATALOG Specifications LTSYS-HeDIL attocube systems explore your nanoworld

12 PAGE 17 & PRODUCT CATALOG LTSYS

13 PAGE 18 & PRODUCT CATALOG LTSYS-Cc cryogen-free low temperature physics measurement system :... This measurement system relies on a pulse tube based closed cycle cryostat allowing measurements at low temperatures down to 4 K and high magnetic fields up to 9 T (optional) without the need of liquid coolants. Expensive running costs for the purchase, transport, and storage of liquid Helium as well as security training for users can be avoided. With the optional Adiabatic Demagnetization Refrigerator (ADR) temperatures of < 100 mk can be achieved. The lowest base temperature of 20 mk is now available in combination with the dilution refrigerator unit. For this system, a variety of SPM inserts as well as the probe station inserts are available covering a large variety of semiconductor applications. Three LTSYS-Cc systems are available: LTSYS-Cc: Temperatures down to 4 K can be reached with the standard closed-cycle system. Optional, superconducting magnets up to 9 T are available. The inserts are cooled by a controlled exchange gas atmosphere. The basic system includes the following components: > closed-cycle cryostat with a 2 insert fitting attocube microscope and probing inserts > patented vibration and acoustic noise damping system attodamp > high-end SPM controller ASC500 or confocal microscopy controller ASC400 for intuitive controlling of the microcope modules > Piezo Scan Controller for fine scanning of the sample > Piezo Step Controller for sample coarse positioning > laser / detector module for sensing and adjusting > workstation PC with TFT-monitor Options: > ADR insert for base temperatures down to 100 mk > dilution refrigerator insert for base temperatures down to 20 mk > superconducting magnets up 9 T PRODUCT KEY FEATURES > cryogen-free > very easy to use, set and forget operation > base temperature: 4 K, with ADR 100 mk, with dilution refrigerator 20 mk LTSYS-CcADR: This system allows plug-andplay cryogenic measurements at temperatures as low as 100 mk. The automation level facilitates an operation for non-expert users. LTSYS-CcDIL: The lowest base temperature of 20 mk can be achieved with this system. EXAMPLE APPLICATIONS > Confocal microscopy (CFM) > Atomic Force Microscopy (AFM) > solid state physics and quantum dot optics > materials science research on ceramics, polymers, additives, alloys,.. > semiconductor device characterization attocube systems explore your nanoworld

14 PAGE 19 & PRODUCT CATALOG LTSYS

15 PAGE 20 & PRODUCT CATALOG Specifications LTSYS-Cc attocube systems explore your nanoworld

16 PAGE 21 & PRODUCT CATALOG 4 Kelvin Closed-Cycle Cooler Cross-Section LTSYS

17 PAGE 22 & PRODUCT CATALOG Specifications LTSYS-CcADR attocube systems explore your nanoworld

18 PAGE 23 & PRODUCT CATALOG LTSYS

19 PAGE 24 & PRODUCT CATALOG Specifications LTSYS-CcDIL attocube systems explore your nanoworld

20 PAGE 25 & PRODUCT CATALOG LTSYS

21 PAGE 26 & PRODUCT CATALOG Overview on available microscope and probing inserts Confocal Microscopes Scanning Near-Field attocfm I attocfm II attocfm III attosnom I attosnom II LTSYS-He4 yes yes yes yes yes LTSYS-He3 no yes yes no on request LTSYS-HeDIL no yes on request no no LTSYS-Cc on request yes yes on request on request LTSYS-CcADR no yes yes no no LTSYS-CcDIL no yes yes no no Description low temperature scanning confocal microscope, highly modular and flexible low temperature scanning confocal microscope, highly stable and compact low temperature scanning confocal microscope, optimized for transmission measurements cantilever based, low temperature scanning near-field optical microscope, interferometric sensor fiber based low temperature, scanning near-field optical microscope, interferometric sensor attocube systems explore your nanoworld

22 PAGE 27 & PRODUCT CATALOG Optical Microscopes Atomic Force Microscopes Scanning Tunneling Microscope Probe Station attosnom III attoafm I attoafm II attoafm III attostm attcps yes yes yes yes yes yes yes yes no yes yes no on request on request no on request no no on request yes on request on request no yes on request yes no on request no no on request yes no on request no no fiber based, low temperature scanning near-field optical microscope, tuning fork sensor low temperature atomic force microscope, interferometric sensor low temperature atomic force microscope, modular and flexible, interferometric sensor low temperature atomic force microscope, tuning fork sensor low temperature scanning tunneling microscope, highly compact and stable cryogenic probe station with four ultra stable nano-manipulation stages LTSYS

Low Vibration Cryogenic Equipment

Low Vibration Cryogenic Equipment PAGE 12 PAGE 13 ATTOCUBE S CRYOSTATS ATTODRY attodry1000....................... 14 cryogen-free cryostats with/without s attodry700.........................18 cryogen-free table-top cryostats with optical

More information

attocfm I for Surface Quality Inspection NANOSCOPY APPLICATION NOTE M01 RELATED PRODUCTS G

attocfm I for Surface Quality Inspection NANOSCOPY APPLICATION NOTE M01 RELATED PRODUCTS G APPLICATION NOTE M01 attocfm I for Surface Quality Inspection Confocal microscopes work by scanning a tiny light spot on a sample and by measuring the scattered light in the illuminated volume. First,

More information

Clark Atlanta University Center for Surface Chemistry and Catalysis Instrument Capabilities

Clark Atlanta University Center for Surface Chemistry and Catalysis Instrument Capabilities Center for Surface Chemistry and Catalysis Instrument Capabilities For information contact: Dr. Eric Mintz Research Center for Science and Technology Clark Atlanta University Atlanta, Georgia 30314 Phone:

More information

Microscopy Cryostat System

Microscopy Cryostat System OF AMERICA, INC. Microscopy Cryostat System RC102-CFM Microscopy Cryostat offers fast cooldown, high efficiency, lowest thermal drift, excellent temperature stability and ultra low vibration Optical cryostat

More information

Santosh Devasia Mechanical Eng. Dept., UW

Santosh Devasia Mechanical Eng. Dept., UW Nano-positioning Santosh Devasia Mechanical Eng. Dept., UW http://faculty.washington.edu/devasia/ Outline of Talk 1. Why Nano-positioning 2. Sensors for Nano-positioning 3. Actuators for Nano-positioning

More information

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions

More information

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis

More information

The most versatile AFM platform for your nanoscale microscopy needs

The most versatile AFM platform for your nanoscale microscopy needs The most versatile AFM platform for your nanoscale microscopy needs Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement

More information

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used

More information

Other SPM Techniques. Scanning Probe Microscopy HT10

Other SPM Techniques. Scanning Probe Microscopy HT10 Other SPM Techniques Scanning Near-Field Optical Microscopy (SNOM) Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Multiprobe techniques Electrostatic Force Microscopy,

More information

Chapter 10. Nanometrology. Oxford University Press All rights reserved.

Chapter 10. Nanometrology. Oxford University Press All rights reserved. Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands

More information

And Manipulation by Scanning Probe Microscope

And Manipulation by Scanning Probe Microscope Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic

More information

Optics and Spectroscopy

Optics and Spectroscopy Introduction to Optics and Spectroscopy beyond the diffraction limit Chi Chen 陳祺 Research Center for Applied Science, Academia Sinica 2015Apr09 1 Light and Optics 2 Light as Wave Application 3 Electromagnetic

More information

attocfm Multichannel Low Temperature Confocal Microscopes

attocfm Multichannel Low Temperature Confocal Microscopes attocfm Multichannel Low Temperature Confocal Microscopes Top-Innovator 201 201, attocube systems AG - Germany. attocube systems and the logo are trademarks of attocube systems AG. Registered and/or otherwise

More information

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2

Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2 Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor

More information

Instrumentation and Operation

Instrumentation and Operation Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data

More information

Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory

Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory The laboratory of Low Temperature, Ultra High Vacuum (UHV LT) is specifically designed for surface science microscopy

More information

Measurements of ultralow temperatures

Measurements of ultralow temperatures Measurements of ultralow temperatures Anssi Salmela 1 Outline Motivation Thermometry below 1K Methods below 1K (Adiabatic melting experiment) 2 Motivation Why tedious refrigeration is worthwhile? Reduced

More information

Atomic Force/Magnetic Force Microscope

Atomic Force/Magnetic Force Microscope Atomic Force/Magnetic Force Microscope Veeco Instruments Dimension 3000 SPM with Nanoscope IIIa controller Atomic Force Microscopy Mode Magnetic Force Microscopy Mode Vibration isolation and sound proof

More information

Nanoscale IR spectroscopy of organic contaminants

Nanoscale IR spectroscopy of organic contaminants The nanoscale spectroscopy company The world leader in nanoscale IR spectroscopy Nanoscale IR spectroscopy of organic contaminants Application note nanoir uniquely and unambiguously identifies organic

More information

Scanning Probe Microscopy (SPM)

Scanning Probe Microscopy (SPM) http://ww2.sljus.lu.se/staff/rainer/spm.htm Scanning Probe Microscopy (FYST42 / FAFN30) Scanning Probe Microscopy (SPM) overview & general principles March 23 th, 2018 Jan Knudsen, room K522, jan.knudsen@sljus.lu.se

More information

Physics Nov Cooling by Expansion

Physics Nov Cooling by Expansion Physics 301 19-Nov-2004 25-1 Cooling by Expansion Now we re going to change the subject and consider the techniques used to get really cold temperatures. Of course, the best way to learn about these techniques

More information

Reducing dimension. Crystalline structures

Reducing dimension. Crystalline structures Reducing dimension 2D surfaces, interfaces and quantum wells 1D carbon nanotubes, quantum wires and conducting polymers 0D nanocrystals, nanoparticles, lithographically patterned quantum dots Crystalline

More information

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy

More information

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples

More information

Please allow us to demonstrate our capabilities and test us testing your samples!

Please allow us to demonstrate our capabilities and test us testing your samples! We determine properties of surfaces, thin films, and layer structures Hardness Young s modulus Scratch, friction, and wear tests Topography Mapping of thermal, magnetic, and electronic properties Please

More information

LabRAM HR Evolution. Research Raman Made Easy!

LabRAM HR Evolution. Research Raman Made Easy! LabRAM HR Evolution Research Raman Made Easy! Cutting-Edge Applications with the La LabRAM HR Life sciences Deeply involved in Raman spectroscopy for decades, HORIBA Scientific has been providing an extensive

More information

Chapter 12. Nanometrology. Oxford University Press All rights reserved.

Chapter 12. Nanometrology. Oxford University Press All rights reserved. Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology

More information

Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach

Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Beyond the diffraction limit The resolution of optical microscopy is generally limited by the diffraction

More information

Scanning gate microscopy and individual control of edge-state transmission through a quantum point contact

Scanning gate microscopy and individual control of edge-state transmission through a quantum point contact Scanning gate microscopy and individual control of edge-state transmission through a quantum point contact Stefan Heun NEST, CNR-INFM and Scuola Normale Superiore, Pisa, Italy Coworkers NEST, Pisa, Italy:

More information

http://www.physics.ucdavis.edu/condensed_matter.html A brief introduction to Condensed Matter Physics at Davis and an overview of the Condensed Matter Experiment Group The Past-- 30 Years of Nobel Prizes

More information

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM) Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...

More information

Characterization of MEMS Devices

Characterization of MEMS Devices MEMS: Characterization Characterization of MEMS Devices Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, Recap Characterization of MEMS

More information

Magnetic Property Measurement System

Magnetic Property Measurement System Magnetic Property Measurement System Product Description Quantum Design's MPMS 3 represents the culmination of more than 3 years of development and design in the world of SQUID Magnetometry. Providing

More information

Compact Hydrogen Peroxide Sensor for Sterilization Cycle Monitoring

Compact Hydrogen Peroxide Sensor for Sterilization Cycle Monitoring Physical Sciences Inc. VG15-012 Compact Hydrogen Peroxide Sensor for Sterilization Cycle Monitoring January 26, 2015 Krishnan R. Parameswaran, Clinton J. Smith, Kristin L. Galbally-Kinney, William J. Kessler

More information

Consulting Service measurements Project collaboration Training & Education. Swiss Scanning Probe Microscopy User Laboratory

Consulting Service measurements Project collaboration Training & Education. Swiss Scanning Probe Microscopy User Laboratory Consulting Service measurements Project collaboration Training & Education Swiss Scanning Probe Microscopy User Laboratory Prof. Dr Hans Josef Hug Welcome to SUL, the Swiss Scanning Probe Microscopy User

More information

672 Advanced Solid State Physics. Scanning Tunneling Microscopy

672 Advanced Solid State Physics. Scanning Tunneling Microscopy 672 Advanced Solid State Physics Scanning Tunneling Microscopy Biao Hu Outline: 1. Introduction to STM 2. STM principle & working modes 3. STM application & extension 4. STM in our group 1. Introduction

More information

Scanning Probe Microscopy (SPM)

Scanning Probe Microscopy (SPM) Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM) --- G. Binnig, H. Rohrer et al, (1982) Near-Field Scanning Optical Microscopy (NSOM) --- D. W. Pohl (1982) Atomic Force Microscopy (AFM)

More information

Scanning Probe Microscopy

Scanning Probe Microscopy 1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced

More information

Scanning Tunneling Microscopy Transmission Electron Microscopy

Scanning Tunneling Microscopy Transmission Electron Microscopy Scanning Tunneling Microscopy Transmission Electron Microscopy Speakers Burcu Başar Semih Gezgin Yavuz Selim Telis Place Hacettepe University Department of Chemical Engineering It s a small world after

More information

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface

More information

DOE SBIR & STTR FY 2019 Phase 1, Release 1 Topics

DOE SBIR & STTR FY 2019 Phase 1, Release 1 Topics Source: InternetCoast BUSINESS OPPORTUNITIES web page>>> Letter of Intent Deadline: September 4, 2018 Application Deadline: October 15, 2018 Download Solicitation Topic Details>>> 1. TECHNOLOGIES FOR MANAGING

More information

Small Quantum Systems Scientific Instrument

Small Quantum Systems Scientific Instrument Small Quantum Systems Scientific Instrument WP-85 A. De Fanis, T. Mazza, H. Zhang, M. Meyer European XFEL GmbH TDR_2012: http://www.xfel.eu/documents/technical_documents XFEL Users Meeting 2014, January

More information

From nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor

From nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor From nanophysics research labs to cell phones Dr. András Halbritter Department of Physics associate professor Curriculum Vitae Birth: 1976. High-school graduation: 1994. Master degree: 1999. PhD: 2003.

More information

SOPHISTICATED DESIGN, INTUITIVE OPERATION, RESEARCH-GRADE RESULTS

SOPHISTICATED DESIGN, INTUITIVE OPERATION, RESEARCH-GRADE RESULTS SOPHISTICATED DESIGN, INTUITIVE OPERATION, RESEARCH-GRADE RESULTS ASAP 2020 Plus: Accelerated Surface Area and Porosimetry System The Micromeritics ASAP 2020 Plus integrates a variety of automated gas

More information

Critical Exponents. From P. Chaikin and T Lubensky Principles of Condensed Matter Physics

Critical Exponents. From P. Chaikin and T Lubensky Principles of Condensed Matter Physics Critical Exponents From P. Chaikin and T Lubensky Principles of Condensed Matter Physics Notice that convention allows for different exponents on either side of the transition, but often these are found

More information

Beetle UHV VT AFM / STM

Beetle UHV VT AFM / STM UHV VT AFM / STM RHK Technology Imaging the Future of Nanoscience UHV VT AFM / STM Engineered Excellence Everyday, in university and government labs around the globe, RHK research platforms lead to new

More information

Control of Dynamics of SPM Probes for Non-destructive Defectoscopy

Control of Dynamics of SPM Probes for Non-destructive Defectoscopy XXX. ASR '2005 Seminar, Instruments and Control, Ostrava, April 29, 2005 209 Control of Dynamics of SPM Probes for Non-destructive Defectoscopy KALA, Jaroslav Ing., Physics Department, FEEC, BUT, Technická

More information

Physical Science Research Activities of Korea Basic Science Institute

Physical Science Research Activities of Korea Basic Science Institute institutes in asia PaCiFiC BULLETIN Physical Science Research Activities of Korea Basic Science Institute JouhAhn Lee head ADVAnCeD nano-surface ReSeARCh group, KBSI Fig. 1: Overview of Korea Basic Science

More information

Design of a low-temperature scanning tunneling microscope head with a lowfriction, piezoelectric coarse approach mechanism

Design of a low-temperature scanning tunneling microscope head with a lowfriction, piezoelectric coarse approach mechanism Design of a low-temperature scanning tunneling microscope head with a lowfriction, piezoelectric coarse approach mechanism T. A. Smith 1 and A. Biswas 2 1 Department of Physics, Southern Illinois University

More information

Surface atoms/molecules of a material act as an interface to its surrounding environment;

Surface atoms/molecules of a material act as an interface to its surrounding environment; 1 Chapter 1 Thesis Overview Surface atoms/molecules of a material act as an interface to its surrounding environment; their properties are often complicated by external adsorbates/species on the surface

More information

Single-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy

Single-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy Single-Molecule Recognition and Manipulation Studied by Scanning Probe Microscopy Byung Kim Department of Physics Boise State University Langmuir (in press, 2006) swollen collapsed Hydrophilic non-sticky

More information

Nanotechnology. Gavin Lawes Department of Physics and Astronomy

Nanotechnology. Gavin Lawes Department of Physics and Astronomy Nanotechnology Gavin Lawes Department of Physics and Astronomy Earth-Moon distance 4x10 8 m (courtesy NASA) Length scales (Part I) Person 2m Magnetic nanoparticle 5x10-9 m 10 10 m 10 5 m 1 m 10-5 m 10-10

More information

MONTANA INSTRUMENTS MAGNET SOLUTIONS THIRD PARTY PRODUCT SOLUTIONS

MONTANA INSTRUMENTS MAGNET SOLUTIONS THIRD PARTY PRODUCT SOLUTIONS MONTANA INSTRUMENTS MAGNET SOLUTIONS THIRD PARTY PRODUCT SOLUTIONS GMW ASSOCIATES-5403 DIPOLE ELECTROMAGNET Adjustable pole gap 0-86mm Variety of pole tips 10mm, 38mm, & 76mm Air or water cooled Variety

More information

Introduction to Scanning Probe Microscopy Zhe Fei

Introduction to Scanning Probe Microscopy Zhe Fei Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force

More information

Image courtesy of Keith Schwab http://www.lbl.gov/science-articles/archive/afrd Articles/Archive/AFRD-quantum-logic.html http://www.wmi.badw.de/sfb631/tps/dqd2.gif http://qist.lanl.gov/qcomp_map.shtml

More information

Magnetic Resonance Force Microscopy. Christian Degen Department of Physics, ETH Zurich, Switzerland

Magnetic Resonance Force Microscopy. Christian Degen Department of Physics, ETH Zurich, Switzerland Magnetic Resonance Force Microscopy Christian Degen Department of Physics, ETH Zurich, Switzerland CIMST Summer School 2014 From Andreas Trabesinger / Wikipedia Scale of things 1m 1mm 1µm 1-100 nm 1nm

More information

MEMS Metrology. Prof. Tianhong Cui ME 8254

MEMS Metrology. Prof. Tianhong Cui ME 8254 MEMS Metrology Prof. Tianhong Cui ME 8254 What is metrology? Metrology It is the science of weights and measures Refers primarily to the measurements of length, weight, time, etc. Mensuration- A branch

More information

Combining High Resolution Optical and Scanning Probe Microscopy

Combining High Resolution Optical and Scanning Probe Microscopy Combining High Resolution Optical and Scanning Probe Microscopy Fernando Vargas WITec, Ulm, Germany www.witec.de Company Background Foundation 1997 by O. Hollricher, J. Koenen, K. Weishaupt WITec = Wissenschaftliche

More information

Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York New York Oxford OXFORD UNIVERSITY PRESS 1993 CONTENTS List

More information

Steven W. Van Sciver. Helium Cryogenics. Second Edition. 4) Springer

Steven W. Van Sciver. Helium Cryogenics. Second Edition. 4) Springer Steven W. Van Sciver Helium Cryogenics Second Edition 4) Springer Contents 1 Cryogenic Principles and Applications 1 1.1 Temperature Scale 2 1.2 Historical Background 4 1.3 Applications for Cryogenics

More information

REPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S.

REPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. REPORT ON SCANNING TUNNELING MICROSCOPE Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. Bobji Submitted by Ankush Kumar Jaiswal (09371) Abhay Nandan (09301) Sunil

More information

METROLOGY AND STANDARDIZATION FOR NANOTECHNOLOGIES

METROLOGY AND STANDARDIZATION FOR NANOTECHNOLOGIES MEROLOGY AND SANDARDIZAION FOR NANOECHNOLOGIES P.A.odua Center for Surface and Vacuum Research (CSVR), Moscow, Moscow Institute of Physics and echnology (MIP) E-mail: fgupnicpv@mail.ru Key words: nanotechnology,

More information

THE MEASUREMENT OF SOLAR ULTRAVIOLET SPECTRAL IRRADIANCE PROBLEMS & SOLUTIONS

THE MEASUREMENT OF SOLAR ULTRAVIOLET SPECTRAL IRRADIANCE PROBLEMS & SOLUTIONS THE MEASUREMENT OF SOLAR ULTRAVIOLET SPECTRAL IRRADIANCE PROBLEMS & SOLUTIONS INTRODUCTION In recent years, researchers involved in many unrelated scientific disciplines have acquired an interest in accurately

More information

Today s SPM in Nanotechnology

Today s SPM in Nanotechnology Today s SPM in Nanotechnology An introduction for Advanced Applications Qun (Allen) Gu, Ph.D., AFM Scientist, Pacific Nanotechnology IEEE Bay Area Nanotechnology Council, August, 2007 8/17/2015 1 Content

More information

The High Field Magnet Laboratory at Radboud University Nijmegen

The High Field Magnet Laboratory at Radboud University Nijmegen J Low Temp Phys (2010) 159: 389 393 DOI 10.1007/s10909-009-0076-8 The High Field Magnet Laboratory at Radboud University Nijmegen S.A.J. Wiegers P.C.M. Christianen H. Engelkamp A. den Ouden J.A.A.J. Perenboom

More information

X-Ray Spectro-Microscopy Joachim Stöhr Stanford Synchrotron Radiation Laboratory

X-Ray Spectro-Microscopy Joachim Stöhr Stanford Synchrotron Radiation Laboratory X-Ray Spectro-Microscopy Joachim Stöhr Stanford Synchrotron Radiation Laboratory X-Rays have come a long way Application to Magnetic Systems 1 µm 1895 1993 2003 http://www-ssrl.slac.stanford.edu/stohr/index.htm

More information

ORMS HARS. SpectrA LAB EQUIPMENTS Optical Rotation Resolution nm Wavelength Range 0.1nm Wavelength Resolution -70 C Cooling 10 Vacuum

ORMS HARS. SpectrA LAB EQUIPMENTS Optical Rotation Resolution nm Wavelength Range 0.1nm Wavelength Resolution -70 C Cooling 10 Vacuum All Products are manufactured and marketed by Opto-Mechatronics Pvt. Ltd HARS ADVANCED RESEARCH SYSTEMS & SOLUTIONS FARADAY & KERR OPTO-MECHATRONICS PVT.LTD OPTICAL ROTATION MEASUREMENT SYSTEM 0-3 0.005

More information

The GENERATION, MEASURING TECHNIQUE AND APPLICATION OF PULSED FIELDS. R.Grössinger

The GENERATION, MEASURING TECHNIQUE AND APPLICATION OF PULSED FIELDS. R.Grössinger High Magnetic Fields The GENERATION, MEASURING TECHNIQUE AND APPLICATION OF PULSED FIELDS R.Grössinger Coworker: M. Küpferling, H.Sassik, R.Sato, E.Wagner, O.Mayerhofer, M.Taraba ƒ1 Content CONTENT Generation

More information

Building Blocks for Quantum Computing Part IV. Design and Construction of the Trapped Ion Quantum Computer (TIQC)

Building Blocks for Quantum Computing Part IV. Design and Construction of the Trapped Ion Quantum Computer (TIQC) Building Blocks for Quantum Computing Part IV Design and Construction of the Trapped Ion Quantum Computer (TIQC) CSC801 Seminar on Quantum Computing Spring 2018 1 Goal Is To Understand The Principles And

More information

Federal University of São Carlos Physics Department. Time Resolved Measurement System MUE: 2014/

Federal University of São Carlos Physics Department. Time Resolved Measurement System MUE: 2014/ Federal University of São Carlos Physics Department Semiconductor Nanostructure Group Optical Properties, Vibrational, Spin and Transport Time Resolved Measurement System MUE: 2014/07375-2 Young Investigator:

More information

Atomic and molecular interactions. Scanning probe microscopy.

Atomic and molecular interactions. Scanning probe microscopy. Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic

More information

STM: Scanning Tunneling Microscope

STM: Scanning Tunneling Microscope STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =

More information

Magnetic measurements (Pt. IV) advanced probes

Magnetic measurements (Pt. IV) advanced probes Magnetic measurements (Pt. IV) advanced probes Ruslan Prozorov October 2018 Physics 590B types of local probes microscopic (site-specific) NMR neutrons Mossbauer stationary Bitter decoration magneto-optics

More information

A g e L e v e l s O b j e c t i v e s

A g e L e v e l s O b j e c t i v e s Be a Scanning Probe Microscope Provided by TryEngineering - L e s s o n F o c u s Lesson focuses on how engineers have developed and use special tools that can observe the landscape of materials when they

More information

CEA Saclay Seminar. Cryogenic Research for HTS Transmission Cables in Korea

CEA Saclay Seminar. Cryogenic Research for HTS Transmission Cables in Korea CEA Saclay Seminar Cryogenic Research for HTS Transmission Cables in Korea Overview 10 min 10 kw Brayton Refrigerator 10 min He-LN 2 Heat Exchanger 15 min Cryogenic Design for Future 15 min April 22, 2016

More information

Vacuum techniques (down to 1 K)

Vacuum techniques (down to 1 K) Vacuum techniques (down to 1 K) For isolation (deep Knudsen regime) liquid helium dewar / inner vacuum jacket Leak testing at level 10-11 Pa m3/s (10-10 mbar l/s) liquid helium dewar & transfer syphon

More information

Towards Automatic Nanomanipulation at the Atomic Scale

Towards Automatic Nanomanipulation at the Atomic Scale Towards Automatic Nanomanipulation at the Atomic Scale Bernd Schütz Department of Computer Science University of Hamburg, Germany Department of Computer Science Outline Introduction System Overview Workpackages

More information

Cover Page. The handle holds various files of this Leiden University dissertation

Cover Page. The handle   holds various files of this Leiden University dissertation Cover Page The handle http://hdl.handle.net/1887/38444 holds various files of this Leiden University dissertation Author: Haan, Arthur den Title: Nuclear magnetic resonance force microscopy at millikelvin

More information

PHYS-E0551. Low Temperature Physics Basics of Cryoengineering Course 2015:

PHYS-E0551. Low Temperature Physics Basics of Cryoengineering Course 2015: PHYS-E0551 Low Temperature Physics Basics of Cryoengineering Course 2015: 18.9. 4.12. Introduction Short history of cryogenics Some phase diagrams Cryogenic fluids Safety measures 1 Three courses under

More information

nano-ta: Nano Thermal Analysis

nano-ta: Nano Thermal Analysis nano-ta: Nano Thermal Analysis Application Note #1 Failure Analysis - Identification of Particles in a Polymer Film Author: David Grandy Ph.D. Introduction Nano-TA is a local thermal analysis technique

More information

Frozen Spin Targets. In a Nutshell. Version 2.0. Chris Keith

Frozen Spin Targets. In a Nutshell. Version 2.0. Chris Keith Frozen Spin Targets In a Nutshell Version 2.0 Chris Keith Dynamic Nuclear Polarization (the simple model) Use Low Temperature + High Field to polarize free electrons (aka paramagnetic centers) in the target

More information

Cantilever enhanced tunable diode laser photoacoustic spectroscopy in gas purity measurement case study: acetylene in ethylene

Cantilever enhanced tunable diode laser photoacoustic spectroscopy in gas purity measurement case study: acetylene in ethylene Cantilever enhanced tunable diode laser photoacoustic spectroscopy in gas purity measurement case study: acetylene in ethylene Juho Uotila, Jussi Raittila, Ismo Kauppinen ¹Gasera Ltd., Tykistökatu 4, 20520

More information

MIT Department of Nuclear Science & Engineering

MIT Department of Nuclear Science & Engineering 1 MIT Department of Nuclear Science & Engineering Thesis Prospectus for the Bachelor of Science Degree in Nuclear Science and Engineering Nicolas Lopez Development of a Nanoscale Magnetometer Through Utilization

More information

CHAPTER EIGHT: PHOTONIC CRYSTALS: MATERIALS, END USES, AND MARKETS, MATERIALS PROPERTIES... 78

CHAPTER EIGHT: PHOTONIC CRYSTALS: MATERIALS, END USES, AND MARKETS, MATERIALS PROPERTIES... 78 CHAPTER ONE: INTRODUCTION... 1 STUDY BACKGROUND... 1 STUDY GOALS AND OBJECTIVES... 1 INTENDED AUDIENCE... 2 SCOPE AND FORMAT... 2 INFORMATION SOURCES AND METHODOLOGY... 3 ANALYST CREDENTIALS... 4 RELATED

More information

Magnetic measurements (Pt. IV) advanced probes

Magnetic measurements (Pt. IV) advanced probes Magnetic measurements (Pt. IV) advanced probes Ruslan Prozorov 26 February 2014 Physics 590B types of local probes microscopic (site-specific) NMR neutrons Mossbauer stationary Bitter decoration magneto-optics

More information

Understanding the properties and behavior of groups of interacting atoms more than simple molecules

Understanding the properties and behavior of groups of interacting atoms more than simple molecules Condensed Matter Physics Scratching the Surface Understanding the properties and behavior of groups of interacting atoms more than simple molecules Solids and fluids in ordinary and exotic states low energy

More information

SHPM imaging of LiHoF 4 at ultra low temperatures.

SHPM imaging of LiHoF 4 at ultra low temperatures. SHPM imaging of LiHoF 4 at ultra low temperatures. Master Thesis Supervised by: Professor Henrik M. Ronnow and Dr. Julian O. Piatek Laboratory for quantum magnetism (LQM) Faculté des Sciences de base de

More information

Translational Biomarker Core

Translational Biomarker Core Translational Biomarker Core Instrumentation Thermo Scientific TSQ Quantum Triple Quadrupole Mass Spectrometers. There are two TSQ Quantum Ultra AM instruments available in the TBC. The TSQ Quantum Ultra

More information

Nanoscale characteristics by Scanning Tunneling Spectroscopy

Nanoscale characteristics by Scanning Tunneling Spectroscopy Related Topics Tunneling effect, Scanning Tunneling Microscopy (STM), (STS), Local Density of States (LDOS), Band structure, Band Gap, k-space, Brioullin Zone, Metal, Semi-Metal, Semiconductor Principle

More information

Scanning Force Microscopy

Scanning Force Microscopy Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data

More information

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany

More information

Kavli Workshop for Journalists. June 13th, CNF Cleanroom Activities

Kavli Workshop for Journalists. June 13th, CNF Cleanroom Activities Kavli Workshop for Journalists June 13th, 2007 CNF Cleanroom Activities Seeing nm-sized Objects with an SEM Lab experience: Scanning Electron Microscopy Equipment: Zeiss Supra 55VP Scanning electron microscopes

More information

nano-ftir: Material Characterization with Nanoscale Spatial Resolution

nano-ftir: Material Characterization with Nanoscale Spatial Resolution neaspec presents: neasnom microscope nano-ftir: Material Characterization with Nanoscale Spatial Resolution AMC Workshop 2017 6th of June Dr. 2017 Tobias Gokus Company neaspec GmbH leading experts of nanoscale

More information

arxiv: v2 [astro-ph.im] 23 Jul 2018

arxiv: v2 [astro-ph.im] 23 Jul 2018 Journal of Low Temperature Physics manuscript No. (will be inserted by the editor) A Continuous 100-mK Helium-Light Cooling System for MUSCAT on the LMT T. L. R. Brien E. Castillo-Dominguez S. Chase S.

More information

新技術説明会 ラマン分光 必見! AFM- ラマンによるナノイメージの世界 株式会社堀場製作所

新技術説明会 ラマン分光 必見! AFM- ラマンによるナノイメージの世界 株式会社堀場製作所 新技術説明会 ラマン分光 必見! AFM- ラマンによるナノイメージの世界 株式会社堀場製作所 2013 HORIBA Scientific. All rights reserved. Ultra fast simultaneous AFM and hyper-spectral imaging: chemical and physical investigation of nano-materials

More information

Physics Faculty Publications and Presentations

Physics Faculty Publications and Presentations Portland State University PDXScholar Physics Faculty Publications and Presentations Physics 9-2-2010 Systems for Assessing and Enhancing the Performance of Scanning Electron Microscopes by Quantifying

More information

Syllabus for Bachelor of Technology. Subject Code: 01GS0101. Subject Name: Physics. B.Tech. Year - I

Syllabus for Bachelor of Technology. Subject Code: 01GS0101. Subject Name: Physics. B.Tech. Year - I Subject Code: 01GS0101 Subject Name: Physics B.Tech. Year - I Objective: Students are expected to learn basics of physics which will help them to apply physical concepts in various engineering branches

More information