The Story of Xe 21+ at FLASH
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1 X ray Science in the 21th Century Santa Barbara, August 2 to 6, 2010 The Story of Xe 21+ at FLASH M. Richter Physikalisch Technische Bundesanstalt (PTB) I PB
2 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
3 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) The generation of Xe 21+ requires more than 5 kev, i.e. more than 57 EUV photons of 93 ev photon energy, to be absorbed by a single atom within the FLASH pulse duration of 10 to 20 fs. A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
4 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) The generation of Xe 21+ requires more than 5 kev, i.e. more than 57 EUV photons of 93 ev photon energy, to be absorbed by a single atom within the FEL pulse duration of 10 to 20 fs. A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
5 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) MRS Bulletin 33 (2008): The generation of Xe 21+ requires more than 5 kev, i.e. more than 57 EUV photons of 93 ev photon energy, to be absorbed by a single atom within the FEL pulse duration of 10 to 20 fs. A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
6 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) MRS Bulletin 33 (2008): The generation of Xe 21+ requires more than 5 kev, i.e. more than 57 EUV photons of 93 ev photon energy, to be absorbed by a single atom within the FEL pulse duration of 10 to 20 fs. A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
7 X ray Science in the 21th Century Santa Barbara, August 2 to 6, 2010 The Story of Xe 21+ at FLASH M. Richter, A. A. Sorokin, S. V. Bobashev, K. Tiedtke I PB
8 The Story of Xe 21+ at FLASH: Outline Background: FEL photon diagnostics Experimental details Multiphoton ionization of Ne and He Experiments in the focus of EUV multilayer mirrors
9 Experimental Area at FLASH 36 m FEL beam
10 Experimental Area at FLASH APL 83, 2970 (2003) JAP 103, (2008) 36 m Gas-Monitor Detectors (GMDs) FEL beam
11 Experimental Area at FLASH APL 83, 2970 (2003) JAP 103, (2008) 36 m Gas-Monitor Detectors (GMDs) FEL beam (Mean) pulse energy / µw Time / hh:mm:ss Time / µs
12 PTB in Berlin Adlershof Metrology Light Source (MLS) BESSY II
13 PTB Laboratory at BESSY II Synchrotron radiation beamlines operating in the spectral range from the vacuum ultraviolet (VUV) to the hard X ray regime
14 PTB s Metrology Light Source (MLS) Starting operation in 2008 Synchrotron radiation beamlines operating in the spectral range from the THz to the extreme ultraviolet (EUV) regime
15 Staff of PTB in Berlin Adlershof (52) Daniel Ambos Burkhard Beckhoff Guido Brandt Christian Buchholz Levent Cibik Jens Eden Karl Heinz Eitner Andreas Fischer Rolf Fliegauf Gudrun Gleber Roland Goernemann Alexander Gottwald Stephan Hain Philipp Hönicke Christine Hertzsch Detlef Herzog Arne Hoehl Annett Kampe Akiko Kato Peter Kersten Erk Kienitz Roman Klein Ulf Knoll Michael Kolbe Udo Kroth Simone Kroth Michael Krumrey Christian Laubis Stefanie Marggraf Peter Müller Ralph Müller Matthias Müller Wolfgang Paustian Beatrix Pollakowski Jana Puls Stephan Rehfeld Thomas Reichel Falk Reinhardt Mathias Richter Bernd Rieschel Hartmut Scherr Hendrik Schöppe Frank Scholze Anton Serdyukov Christian Stadelhoff Sylvia Struck Bernd Taut Reiner Thornagel Gerhard Ulm Rainer Unterumsberger Jan Wernecke Jan Weser
16 Metrology using Synchrotron Radiation by PTB in Berlin Adlershof Fundamental methods Source based radiometry Detector based radiometry Reflectometry
17 Metrology using Synchrotron Radiation by PTB in Berlin Adlershof Fundamental methods Source based radiometry Detector based radiometry Reflectometry Applications Characterization of space instrumentation X ray dosimetry and medical applications Optics development for (E)UV lithography Nanometrology via X ray reflectometry and small angle scattering X ray spectrometry for reference free materials analysis Photon diagnostics and research at X ray lasers
18 Calibration of X ray Lasers: EUV FEL/Spring8 (2009) Combined expanded (k=2) measurement uncertainty: 5.5 %
19 Experimental Area at FLASH Photoionization Experiments APL 83, 2970 (2003) JAP 103, (2008) 36 m Gas-Monitor Detectors (GMDs) FEL beam (Mean) pulse energy / µw Time / hh:mm:ss Time / µs
20 Ion Mass/Charge Time Of Flight (TOF) Spectroscopy on Rare Gases and Molecules at FLASH BL2 focus
21 Ion Mass/Charge Time Of Flight (TOF) Spectroscopy on Rare Gases and Molecules at FLASH: Ion Extraction Target pressure: 10 5 mbar (u = 1 %)
22 Saturation of Ion Signals due to Target Depletion: Determination of FEL Focus Size and Waist Ion number (N + ) / 10 4 Neon hν = 38 ev Photon number (N ph ) / A. A. Sorokin et al., Appl. Phys. Lett. 89, (2006)
23 Saturation of Ion Signals due to Target Depletion: Determination of FEL Focus Size and Waist Ion number (N + ) / 10 4 Neon hν = 38 ev Photon number (N ph ) / N + ( N ph ) 1 e σ = N N ph A fit cross section σ is known photon number N ph is measured beam cross section A is derived A. A. Sorokin et al., Appl. Phys. Lett. 89, (2006)
24 Saturation of Ion Signals due to Target Depletion: Determination of FEL Focus Size and Waist Ion number (N + ) / 10 4 Neon hν = 38 ev Beamline FLASH Photon number (N ph ) / Exp. chamber position / mm N + ( N ph ) 1 e σ = N N ph A fit cross section σ is known photon number N ph is measured beam cross section A is derived A. A. Sorokin et al., Appl. Phys. Lett. 89, (2006)
25 Multiphoton Ionization of Neon Atoms by Soft X rays at FLASH: Ion TOF Spectra at 42.8 ev (29.0 nm) ion signal / arb. units!!! in the focus of BL2 out of focus time-of-flight / µs A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, M. Richter, Phys. Rev. A 75, (R) (2007)
26 Multiphoton Ionization of Neon Atoms by Soft X rays at FLASH: Ion TOF Spectra at 42.8 ev (29.0 nm) ion signal / arb. units!!! time-of-flight / µs A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, M. Richter, Phys. Rev. A 75, (R) (2007)
27 Multiphoton Ionization of Neon Atoms by Soft X rays at FLASH: Photon Intensity Dependence Perturbation theory: N& (n) = N σ (n) E hω n Irradiance (E) / W cm -2 Ion yield ratio 0.1 x Ne 2+ /Ne + (42.8 ev) ~ E (= E 2 / E) Ne 3+ /Ne 2+ (42.8 ev) ~ E 2 (= E 4 / E 2 ) Photon exposure (N ph /A) / cm -2 A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, M. Richter, Phys. Rev. A 75, (R) (2007)
28 Multiphoton Ionization of Neon Atoms by Soft X rays at FLASH: Photon Intensity Dependence Perturbation theory: N& (n) = N σ (n) Irradiance (E) / W cm -2 E hω n Ion yield ratio 0.1 x Ne 2+ /Ne + (42.8 ev) ~ E (= E 2 / E) Ne 3+ /Ne 2+ (42.8 ev) ~ E 2 (= E 4 / E 2 ) ~ E (= E 2 / E) He 2+ /He 1+ (42.8 ev) Photon exposure (N ph /A) / cm -2 A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, M. Richter, Phys. Rev. A 75, (R) (2007)
29 Evaluation of FEL Pulse Duration by Autocorrelation and Non linear Photoionization of Helium Atoms Two photon process: N& (2) = N σ (2) E hω 2
30 Evaluation of FEL Pulse Duration by Autocorrelation and Non linear Photoionization of Helium Atoms Two photon process: 2 & (2) (2) E N = N σ E ( t) = E1 f ( t) + E 2 f ( t t ) N N (2) (2)( t ) ( t ) hω = 1 + a Irradiance: + f () t f ( t t ) dt
31 Evaluation of FEL Pulse Duration by Autocorrelation and Non linear Photoionization of Helium Atoms Two photon process: 2 & (2) (2) E N = N σ E ( t) = E1 f ( t) + E 2 f ( t t ) N N (2) (2)( t ) ( t ) hω = 1 + a Irradiance: + f () t f ( t t ) dt R Mitzner, A. A. Sorokin, B. Siemer, S. Roling, M. Rutkowski, H. Zacharias, M. Neeb, T. Noll, F. Siewert, W. Eberhardt, M. Richter, P. Juranic, K. Tiedtke, and J. Feldhaus, Phys. Rev A 80, (2009) Δt = (28 ± 5) fs at FLASH (51.8 ev / 23.9 nm)
32 Irradiance ( Intensity ) Pulse Energy Irradiance E = ΔW Δt ΔA Pulse Duration Beam Cross Section
33 Direct Two photon Double Ionization Cross Section of Helium: Experiment and Theory (2008) A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, and M. Richter, Phys. Rev. A 75, (R) (2007)
34 Direct Two photon Double Ionization Cross Section of Helium: Experiment and Theory (2008) A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, and M. Richter, Phys. Rev. A 75, (R) (2007) H. Hasegawa et al., Phys. Rev. A 71, (2005)
35 Direct Two photon Double Ionization Cross Section of Helium: Experiment and Theory (2008) A. A. Sorokin, S. V. Bobashev, K. Tiedtke, M. Wellhöfer, and M. Richter, Phys. Rev. A 75, (R) (2007) H. Hasegawa et al., Phys. Rev. A 71, (2005) I. A. Ivanov and A. S. Kheifets, J. Phys. B 41, (2008), and references therein
36 Ion Time Of Flight (TOF) Experiments in the Focus of EUV Lithography Multilayer Mirrors (IOF Jena) EUV wavelength: 13 to 14 nm Photon energy: 90 to 93 ev Focus diameter: 3 to 5 µm Irradiance: up to Wcm 2
37 Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) A. A. Sorokin, S. V. Bobashev, T. Feigl, K. Tiedtke, H. Wabnitz, and M. Richter, Photoelectric effect at ultra high intensities, Phys. Rev. Lett. 99, (2007)
38 Multiphoton Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) Xe: [Kr] 4d 10 5s 2 5p 6 A. A. Sorokin et al., Phys. Rev. Lett. 99, (2007)
39 Multiple Ionization of Xenon in the EUV (13.3 nm): Photon Intensity Dependence Xe M. G. Makris, P. Lambropoulos, and A. Mihelic, Phys. Rev. Lett. 102, (2009)
40 Multiple Ionization of Xenon in the EUV (13.3 nm): Photon Intensity Dependence Perturbation theory and n photon processes: & ln N q + ( E) ~ n lne Xe M. G. Makris, P. Lambropoulos, and A. Mihelic, Phys. Rev. Lett. 102, (2009)
41 Multiphoton Multiple Ionization of Xenon in the EUV (13.3 nm / 93 ev) Xe: [Kr] 4d 10 5s 2 5p 6 A. A. Sorokin et al., Phys. Rev. Lett. 99, (2007)
42 Multiple Ionization of Rare Gases in the EUV: 13.7 nm / 90.5 ev; (1.7 ± 0.7) x W cm 2 M. Richter, M. Ya. Amusia, S. V. Bobashev, T. Feigl, P. Juranić, M. Martins, A. A. Sorokin, and K. Tiedtke, Phys. Rev. Lett. 102, (2009)
43 Multiple Ionization of Rare Gases in the EUV: 13.7 nm / 90.5 ev; (1.7 ± 0.7) x W cm 2 M. Richter, M. Ya. Amusia, S. V. Bobashev, T. Feigl, P. Juranić, M. Martins, A. A. Sorokin, and K. Tiedtke, Phys. Rev. Lett. 102, (2009)
44 Multiple Ionization of Rare Gases in the EUV: 13.7 nm / 90.5 ev; (1.7 ± 0.7) x W cm 2 M. Richter, M. Ya. Amusia, S. V. Bobashev, T. Feigl, P. Juranić, M. Martins, A. A. Sorokin, and K. Tiedtke, Phys. Rev. Lett. 102, (2009)
45 Multiple Ionization of Rare Gases in the EUV: 13.7 nm / 90.5 ev; (1.7 ± 0.7) x W cm 2 M. Richter, M. Ya. Amusia, S. V. Bobashev, T. Feigl, P. Juranić, M. Martins, A. A. Sorokin, and K. Tiedtke, Phys. Rev. Lett. 102, (2009)
46 Multiple Ionization of Rare Gases in the EUV: 13.7 nm / 90.5 ev; (1.7 ± 0.7) x W cm 2 Gas Highest charge q + observed I q +/ev Number of EUV photons absorbed per FEL pulse and atom Ne Ar Kr Xe M. Richter, M. Ya. Amusia, S. V. Bobashev, T. Feigl, P. Juranić, M. Martins, A.A. Sorokin, and K. Tiedtke, Phys. Rev. Lett. 102, (2009)
47 One photon Absorption / Ionization Cross Sections of Rare Gases Photon energy 90.5 ev: cm cm cm cm 2
48 One photon Absorption / Ionization Cross Sections of Rare Gases 4d Giant Resonance
49 4d Giant Resonance of Xenon: Total Photoionization Cross Section : Experimental Data : RTDLDA Calculation : RRPA Calculation F. A. Parpia, W. R. Johnson, and V. Radojewic, Phys. Rev. A 29, (1984)
50 4d Giant Resonance of Xenon: Total Photoionization Cross Section : Experimental Data : RTDLDA Calculation : RRPA Calculation : Harm. Osc. Model F. A. Parpia, W. R. Johnson, and V. Radojewic, Phys. Rev. A 29, (1984)
51 Strong field Multiple Ionization in the Inner 4d Shell of Xe by EUV Radiation
52 Electron Time Of Flight (TOF) Spectroscopy on Rare Gases and Molecules at FLASH V. Richardson, J. T. Costello, D. Cubaynes, S. Düsterer, J. Feldhaus, H.W. van der Hart, P. Juranić, W. B. Li, M. Meyer, M. Richter, A. A. Sorokin, K. Tiedke, Phys. Rev. Lett 105, (2010)
53 Two photon 4d Ionization of Xenon at hν = 93 ev: Electron Spectrum Intensity (Arb. Units) (d) (a) (b) (c) I (Arb. Units) KE (ev) V. Richardson, J. T. Costello, D. Cubaynes, S. Düsterer, J. Feldhaus, H.W. van der Hart, P. Juranić, W. B. Li, M. Meyer, M. Richter, A. A. Sorokin, K. Tiedke, Phys. Rev. Lett 105, (2010) Irradiance > W cm Kinetic Energy (ev)
54 Two photon 4d Ionization of Xenon at hν = 93 ev: Electron Spectrum Intensity (Arb. Units) (d) (a) (b) (c) I (Arb. Units) KE (ev) Kinetic Energy (ev) log 10 (Electron Signal / Arb. Units) V. Richardson, J. T. Costello, D. Cubaynes, S. Düsterer, J. Feldhaus, H.W. van der Hart, P. Juranić, W. B. Li, M. Meyer, M. Richter, A. A. Sorokin, K. Tiedke, Phys. Rev. Lett 105, (2010) n 2 (1.95 ± 0.12) log 10 (FEL Pulse Energy / µj)
55 Two photon 4d Ionization of Xenon at hν = 93 ev: Electron Spectrum Intensity (Arb. Units) (d) (a) (b) (c) I (Arb. Units) KE (ev) Kinetic Energy (ev) 2 93 ev 118 ev = 68 ev (2 hν ε e - = I ) 4d log 10 (Electron Signal / Arb. Units) V. Richardson, J. T. Costello, D. Cubaynes, S. Düsterer, J. Feldhaus, H.W. van der Hart, P. Juranić, W. B. Li, M. Meyer, M. Richter, A. A. Sorokin, K. Tiedke, Phys. Rev. Lett 105, (2010) n 2 (1.95 ± 0.12) log 10 (FEL Pulse Energy / µj)
56 Two photon 4d Ionization of Xenon at hν = 93 ev: Electron Spectrum Intensity (Arb. Units) (d) (a) (b) (c) I (Arb. Units) KE (ev) Kinetic Energy (ev) 2 93 ev 118 ev = 68 ev (2 hν ε e - = I ) 4d log 10 (Electron Signal / Arb. Units) V. Richardson, J. T. Costello, D. Cubaynes, S. Düsterer, J. Feldhaus, H.W. van der Hart, P. Juranić, W. B. Li, M. Meyer, M. Richter, A. A. Sorokin, K. Tiedke, Phys. Rev. Lett 105, (2010) n 2 (1.95 ± 0.12) log 10 (FEL Pulse Energy / µj) First detection of an Above Threshold Ionization (ATI) two photon process in an inner electron shell
57 Partners I U. Kroth M. Richter H. Schöppe G. Ulm PB M. Ya. Amusia S. V. Bobashev A. A. Sorokin M. Martins, B. Sonnag, M. Wellhöfer S. Düsterer J. Feldhaus U. Jastrow P. Juranic W. B. Li K. Tiedtke H. Wabnitz R. Mitzner T. Feigl H. Zacharias, B. Siemer, D. Cubaynes M. Meyer J. Costello V. Richardson
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