Test Report: PLM
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1 Test Report: PLM W Single Output LED Power Supply DESIGN VERIFY TEST Output Function Test Input Function Test Protection Function Test Component Stress Test SFETY & E.M.C. TEST Safety Test E.M.C. Test RELIBILITY TEST ENVIRONMENT TEST
2 DESIGN VERIFY TEST OUTPUT FUNCTION TEST 1 RIPPLE & NOISE V1:3600 mvp-p (Max ) I/P: 230VC V1: 1220 mvp-p (Max ) 2 LED OPERTING VOLTGE RNGE 3 SET UP TIME 230VC: 4 OVER/UNDERSHOOT TEST V1= 21 V ~ 36 V I/P: 230VC I/P: 115VC O/P:CV MODE 115VC: ms (Max) ms (Max) I/P: 230 VC I/P: 115 VC < 42 V I/P: 230 VC 21V: 35V: 21V: 35V: V 230V 115V 115V 230VC/ 190 ms 115VC/ 221 ms TEST: < 39.4 V 5 CURRENT CCURCY ±5% I/P: 230 VC TEST: ±2.43 % INPUT FUNCTION TEST 1 INPUT VOLTGE RNGE 110VC~295 VC I/P:TESTING 2 INPUT FREQUENCY RNGE 47HZ ~63 HZ NO DMGE OSC I/P: LOW-LINE-3V=107 V HIGH-LINE=295 V O/P:FULL/MIN LOD ON: 30 Sec. OFF: 30 Sec 10MIN ( C POWER ON/OFF NO DMGE ) I/P: 110 VC ~ 295 VC O/P:FULL~MIN LOD 103V~295V TEST: OK TEST: OK 3 POWER FCTOR / 115 VC(TYP) / 230 VC(TYP) / 277 VC(TYP) I/P: 115 VC I/P: 230 VC I/P: 277 VC 4 EFFICIENCY 86 %(TYP) I/P: 230 VC PF= PF= PF= % / 100% / 100% / 100% 5 INPUT CURRENT 115V/ 230V/ 277V/ (TYP) (TYP) (TYP) I/P: 115 VC I/P: 230 VC I/P: 277 VC I = / 115 VC I = / 230 VC I = / 277 VC Model: PLM Test Report 2 / 6
3 6 INRUSH CURRENT 230V/ 15 (TYP) I/P: 230 VC (twidth=50us measured at 50% Ipeak) COLD STRT 7 LEKGE CURRENT < 0.5 m / 240 VC I/P: 240 VC O/P:Min LOD I = 2.46 / 230 VC T= 41.2 us L-CSE: m N-CSE: m 8 TOTL HRMONIC DISTORTION Total harmonic distortion will be lower than 20% when output loading is 60% or higher at 115VC / 230VC I/P: 115VC I/P: 230VC O/P:60% LOD Total harmonic distortion will be lower I/P: 277VC than 20% when output loading is 75% O/P:75% LOD or higher at 277VC 9 NO LOD CONSUMPTION < 0.5 W I/P:115VC I/P:230VC I/P:277VC O/P:NO LOD THD: % THD: 7.62 % THD: % < 0.18 W < 0.32 W < 0.39 W PROTECTION FUNCTION TEST 1 SHORT PROTECTION SHORT EVERY OUTPUT 1 HOUR NO DMGE I/P: 295 VC NO DMGE Hiccup mode, recovers automatically after fault condition is removed. COMPONENT STRESS TEST 1 Power Transistor ( D to S) or (C to E) Peak Voltage Q 1 Rated: 800V / 7 2 Diode Peak Voltage D100 Rated: 400 V/ 5 3 Clamp Diode Peak Voltage D 2 Rated: 1000V / 1 4 Control IC Voltage Test U 1 Rated: 25 V O/P: (1)Full Load Turn on (2) Output Short (3)Full load continue O/P: (1)Full Load Turn on (2)Output Short (3)Full load continue O/P: (1)Full Load Turn on (2)Output Short (3)Full load continue O/P: (1)Full Load Turn on /Off (2) Min load Turn on /Off (3)Full Load /Min load Change (1) 636 V (2) (3) V V (1) 165 V (2) 269 V (3) 166 V (1) 622 V (2) 608 V (3) 622 V (1) 17.8 V (2) 17.6 V (3) 17.8 V Model: PLM Test Report 3 / 6
4 SFETY & E.M.C. TEST SFETY TEST 1 WITHSTND VOLTGE I/P-O/P: 3.75 KVC/min I/P-O/P: 4 KVC/min 2 ISOLTION RESISTNCE I/P-O/P:500VDC>100MΩ I/P-O/P: 500 VDC Ta:25 /70%RH I/P-O/P: m NO DMGE I/P-O/P: >9999 MΩ NO DMGE E.M.C TEST 1 HRMONIC EN CLSS C I/P: 230/240/277VC /50HZ/60HZ O/P:100% LOD 2 CONDUCTION EN55015 I/P:230 VC (50HZ) 3 RDITION EN55015 I/P: 230 VC (50HZ) 4 E.S.D EN LIGHT INDUSTRY IR:8KV / Contact:4KV I/P: 230 VC/50HZ Test by certified Lab Test by certified Lab CRITERI 5 E.F.T EN LIGHT INDUSTRY INPUT: 1KV I/P: 230 VC/50HZ CRITERI 6 SURGE EN INDUSTRY L-N :2KV I/P: 230 VC/50HZ CRITERI 7 Test by certified Lab & Test Report Prepare Model: PLM Test Report 4 / 6
5 RELIBILITY TEST ENVIRONMENT TEST 1 TEMPERTURE RISE TEST MODEL: PLM ROOM MBIENT BURN-IN:1.0 HRS I/P: 230VC O/P: CVmode=35V Ta= HIGH MBIENT BURN-IN: 2.0 HRS I/P: 230VC O/P: CVmode=35V Ta=49.6 NO Position ROOM MBIENT Ta= 26.7 HIGH MBIENT Ta= L LF BD L Q C U T D D C LOW TEMPERTURE TURN ON TEST TURN ON FTER 2 HOUR I/P: 295VC/110VC O/P: LED LOD=35V Ta= TEMPERTURE %(0~50 ) I/P: 230 VC COEFFICIENT O/P:CVmode=35V 4 STORGE TEMPERTURE TEST 1. Thermal shock Temperature: -45 ~ Temperature change rate :25 / MIN 3. Dwell time low and high temperature : 30 MIN/ECH 4. Total test cycle:5 CYCLE 5. Input/Output condition: STTIC TEST:OK %(0~50 ) OK 5 THERML SHOCK TEST 1. Thermal shock Temperature: -35 ~ Temperature change rate :25 / MIN 3. Dwell time low and high temperature : 30 MIN/ECH 4. Total test cycle:10 CYCLE 5. Input/Output condition: 230VC/ CVmode=35V C ON/OFF TEST turn on 58sec;turn off 2sec 6 VIBRTION TEST 1 Carton & 1 Set (1) Waveform: Sine Wave (2) Frequency:10~500Hz (3) Sweep Time:10min/sweep cycle (4) cceleration:3g (5) Test Time:90min in each axis (X.Y.Z) (6) OK TEST:OK 7 CPCITOR LIFE CYCLE PLM :SUPPOSE C105 IS THE MOST CRITICL COMPONENT (1) I/P: 230VC Ta=25 LIFE TIME (2) I/P: 230VC Ta=45 LIFE TIME (3) I/P: 230VC O/P:75% LOD Ta=45 LIFE TIME 8 MTBF MIL-HDBK-217F NOTICES2 PRTS COUNT TOTL FILURE RTE: KHRS (1) HRS (2) HRS (3) HRS 9 DMTBF/ccelerated Life Test Demonstration Mean Time Between Failure(Expected Life) : 20,000 Tcase 65 ; 50,000 Tcase 50 Model: PLM Test Report 5 / 6
6 SMPLE TEST RESULT TESTER PPROVL PRODUCT SMPLE ZHUOKB/ZOULF LIUWY 2009/08/04 50-G058 Model: PLM Test Report 6 / 6
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