The dielectric response of Molecular Wires

Size: px
Start display at page:

Download "The dielectric response of Molecular Wires"

Transcription

1 The dielectric response of Molecular Wires Julio Gómez Laboratorio de Nuevas Microscopías. Departamento de Física de la Materia Condensada C-III Universidad Autónoma de Madrid

2 Nanowires overview Breakjuncti ons Carbon nanotube Organic molecule Quantum wire V 2 O 5 nanofiber DNA SWNT R. Reifenberger et al. The handbook of Nanostructured AsGa/AlGaAs, Materials and Nanotechnology. C, H, O, N, State of the art in DNA DC-conductivity Superconductor (1K) Good conductor at RT Semi conductor Insulator Kasumov et al. Science 291, 280 (2001) Fink et al. Nature 398, 407 (1999) Kasumov et al. Science 291, 280 (2001) Porath et al. Nature 403, 635 (2000) Cai et al. Appl. Phys. Lett (2000) Rakitin et al. Phys. Rew. Lett. 291, 280 (2001) Everybody before Fink et al AND De Pablo et al. Phys. Rew. Lett. 85, 4992 (2000)

3 Should the DNA be a conductor? Ab initio theoretical calculation with SIESTA program Ordejón et al. Phys. Rev. B. 53 R10441 (1996). Isosurfaces of charge DNA poly(g)-poly(c): G-G-G-G-G-G... C-C-C-C-C-C... λ-dna The theoretical calculation agrees with our experiments

4 Making contacts to molecular wires Gold source 1.4µm Electrode Insulating substrate Tungsten wire Sample Electrode 4 µm 390nm

5 Contact experiment on a single DNA molecule 10 V 00.0 pa Current meter Gold Metallized SFM tip Δ Z = 27 nm DNA λ 100 nm 1.2µm Mica substrate The minimum length is about 50 nm. 12 V are applied with a resolution < 1 pa. R = 12 TΩ. R * =171 G Ω/nm ρ ~ 1x10 10 µ Ω cm. 100 nm P. J. de Pablo et al. Phys. Rev. Lett.. 12, 573 (2000) Suplemento de El País

6 { Electrostatic force in SFM: a non-intrusive method F k V R C Resistance and Capacitance V I A set Amplitude A elect A set A elect V df/dz >0 tip = 0 V tip 0 Δω ω 0 1 2k df dz e ω elect ω 0 Frequency Δz z piezo displacement

7 Experimental Frequency shift Metallic SFM tip V V=0V Z Amplitude ω frequency Conducting surface Z Aset df/dz >0 Vtip = 0 Vtip 0 V=8V Aelect ω electω 0 Δz Frequency z piezo displacement Δω 1 dfe ω 0 2k dz

8 Visualization of electrical networks of SWNT nm 2 400nm V tip = 0 V V tip = 2 V Electrically connected molecules shine due electrostatic force P. J. de Pablo et al. Appl. Phys. Lett. (2001).

9 Applying electrostatic to DNA. 100nm Nanotubes and DNA co-adsorbed on mica Co-adsorption of SWNT and DNA to compare both electrostatic signals Insulating substrates used: Mica SiO 2 Glass Electrodes metal used: Gold Silver Chromium

10 Comparing electrostatic signals of DNA and SWNT. single DNA molecule 100nm SWNT 100nm Tip-sample bias: 0 V Tip-sample bias: 3 V

11 Contacting DNA molecule with SWNT nm single DNAmolecule SWNT 100nm Tip-sample bias: 0 V 100nm Tip-sample bias: 1.3 V

12 Electrostatic experiments on V 2 O 5 fibers. J. Muster et al. Adv. Mat. 12, 420 (2000) Semiconductors 1,5 nm Resistances in the range of 100 MΩ (1000 times bigger than SWNT) 10nm Topography Current Simultaneously acquired using Jumping Mode V A 240nm 240nm

13 Electrostatic enhancement on V 2 O 5 fibers. 290nm 290nm V=0 V=2V The same effect is observed in spite of the higher resistance of the fibers. The electrostatic is general purpose method, which can be applied to any nanowire.

14 DNA electrical properties without any electrical contact. SFM tip SFM tip Conducting molecule on a dielectric substrate ε >> 1 Insulating molecule on a dielectric substrate ε 1 S. Gómez-Moñivas et al.. Appl.Phys Lett.. In press.

15 3D modes in SFM. Classical SFM images represent a magnitude as a function of the geometrical position x,y : f(x,y) Z Normal force, Adhesion force Y (SLOW SCAN) Y (SLOW SCAN) Y (SLOW SCAN) X (FAST SCAN) X (FAST SCAN) X (FAST SCAN). 3D MODES allows to measure images as a function of non-geometrical variables: x 3 (x 1,x 2 ) X 3 (Signal to be measured) Current Z Amplitude Δω X 2 (slow scan) Bias Z Bias Z X 1 (fast scan) 0 V Lateral displacement

16 Using Phase Lock Loop (PLL) to measure the dielectric response. Using a PLL the system is kept at is resonance frequency. The frequency shift introduced by the electrostatic force is now monitored Z V Metallic SFM tip y x z s Z s Insulating substrate.

17 Comparation of Δω for nanotubes and DNA 130nm x Δω is registered in the line X, with a SWNT and a DNA molecule. V tip = 6 V ΔωRes (KHz) -20.0nm nanotube 160nm x X(nm) DNA Z

18 Conclusions and Acknowledgements Electrostatic methods allow to visualize electrically connected nanowires networks: connected molecules appear to shine When applying this method to adsorbed DNA molecules no contrast is observed: DNA does not shine On the basis of our experimental evidences we conclude that adsorbed DNA is an insulator SFM C. Gómez-Mavarro P.J. de Pablo F. Moreno-Herrero J. Colchero A.M. Baró Software R. Fernández I. Horcas Theory S. Gómez-Moñivas J.J. Sáenz J.M. Soler E. Artacho V 2 O 5 Y.Fan M. Burghart SWNT W. Maser A.M. Benito M.T. Martínez

Supplementary Methods A. Sample fabrication

Supplementary Methods A. Sample fabrication Supplementary Methods A. Sample fabrication Supplementary Figure 1(a) shows the SEM photograph of a typical sample, with three suspended graphene resonators in an array. The cross-section schematic is

More information

Electrical properties of DNA characterized by conducting-afm

Electrical properties of DNA characterized by conducting-afm Electrical properties of DNA characterized by conducting-afm Claude Nogues, idney Cohen, hirley Daube, Ron Naaman Weizmann Institute of cience, Rehovot, Israel Outline Introduction History Current understanding

More information

High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy

High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy Jing-jiang Yu Nanotechnology Measurements Division Agilent Technologies, Inc. Atomic Force Microscopy High-Resolution

More information

realistic nanostructured systems

realistic nanostructured systems Electrostatic force microscopy and potentiometry of realistic nanostructured systems M. Lucchesi (,), G. Privitera (), M. Labardi () *, D. Prevosto (), S. Capaccioli (,), P. Pingue (3) Dipartimento di

More information

BDS2016 Tutorials: Local Dielectric Spectroscopy by Scanning Probes

BDS2016 Tutorials: Local Dielectric Spectroscopy by Scanning Probes BDS2016 Tutorials: Local Dielectric Spectroscopy by Scanning Probes Massimiliano Labardi CNR Institute for Physico-Chemical Processes (IPCF) Pisa (Italy) OUTLINE Broadband Dielectric Spectroscopy (BDS):

More information

Lecture 12: Biomaterials Characterization in Aqueous Environments

Lecture 12: Biomaterials Characterization in Aqueous Environments 3.051J/20.340J 1 Lecture 12: Biomaterials Characterization in Aqueous Environments High vacuum techniques are important tools for characterizing surface composition, but do not yield information on surface

More information

CNPEM Laboratório de Ciência de Superfícies

CNPEM Laboratório de Ciência de Superfícies Investigating electrical charged samples by scanning probe microscopy: the influence to magnetic force microscopy and atomic force microscopy phase images. Carlos A. R. Costa, 1 Evandro M. Lanzoni, 1 Maria

More information

Electronic Supplementary Material for Chemical Communications Measuring Si-C 60 chemical forces via single molecule spectroscopy

Electronic Supplementary Material for Chemical Communications Measuring Si-C 60 chemical forces via single molecule spectroscopy Electronic Supplementary Material for Chemical Communications Measuring Si-C 6 chemical forces via single molecule spectroscopy Cristina Chiutu, Andrew Stannard, Adam M Sweetman, and Philip Moriarty The

More information

The use of artificial neural networks in electrostatic force microscopy

The use of artificial neural networks in electrostatic force microscopy Castellano-Hernández et al. Nanoscale Research Letters 2012, 7:250 NANO EXPRESS The use of artificial neural networks in electrostatic force microscopy Open Access Elena Castellano-Hernández, Francisco

More information

Ultralong natural graphene nanoribbons and their electrical conductivity**

Ultralong natural graphene nanoribbons and their electrical conductivity** Ultralong natural graphene nanoribbons and their electrical conductivity** By M. Moreno-Moreno, A. Castellanos-Gomez, G. Rubio-Bollinger, J. Gomez-Herrero *, N. Agraït *. [*] Prof. J. Gómez-Herrero, Prof.

More information

Cryoconference Young researchers

Cryoconference Young researchers Scanning Tunneling Microscope in a Dilution Refrigerator with a Vector Magnetic Field Solenoid J. Galvis, I Guillamón, H Suderow, J. G. Rodrigo, S. Viera Laboratorio de Bajas Temperaturas, Departamento

More information

An ab initio approach to electrical transport in molecular devices

An ab initio approach to electrical transport in molecular devices INSTITUTE OF PHYSICSPUBLISHING Nanotechnology 13 (00) 1 4 An ab initio approach to electrical transport in molecular devices NANOTECHNOLOGY PII: S0957-4484(0)31500-9 JJPalacios 1,ELouis 1,AJPérez-Jiménez,ESanFabián

More information

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM) Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...

More information

Today s SPM in Nanotechnology

Today s SPM in Nanotechnology Today s SPM in Nanotechnology An introduction for Advanced Applications Qun (Allen) Gu, Ph.D., AFM Scientist, Pacific Nanotechnology IEEE Bay Area Nanotechnology Council, August, 2007 8/17/2015 1 Content

More information

THE CONDUCTIVITY OF A NANOWIRE: QUANTUM AND LOCALIZATION REGIMES

THE CONDUCTIVITY OF A NANOWIRE: QUANTUM AND LOCALIZATION REGIMES THE CONDUCTIVITY OF A NANOWIRE: QUANTUM AND LOCALIZATION REGIMES JJ. PASCUAL, J. GÓMEZ-HERRERO, J. MÉNDEZ AND A.M. BARÓ Departamento de Física de la Materia Condensada Universidad Autónoma de Madrid. E-28049

More information

Magnetic Force Microscopy (MFM) F = µ o (m )H

Magnetic Force Microscopy (MFM) F = µ o (m )H Magnetic Force Microscopy (MFM) F = µ o (m )H 1. MFM is based on the use of a ferromagnetic tip as a local field sensor. Magnetic interaction between the tip and the surface results in a force acting on

More information

Expanding Characterization of Materials with Kelvin Force Microscopy

Expanding Characterization of Materials with Kelvin Force Microscopy Expanding Characterization of Materials with Kelvin Force Microscopy Sergei Magonov Page 1 Outline Introduction to Kelvin Force Microscopy Different KFM Modes and Their Practical Evaluation Applications

More information

Nonstationary electrical charge distribution on the fused silica bifilar pendulum and its effect on the mechanical Q-factor

Nonstationary electrical charge distribution on the fused silica bifilar pendulum and its effect on the mechanical Q-factor Nonstationary electrical charge distribution on the fused silica bifilar pendulum and its effect on the mechanical Q-factor V.P. Mitrofanov, L.G. Prokhorov, K.V. Tokmakov Moscow State University G050097-00-Z

More information

STM: Scanning Tunneling Microscope

STM: Scanning Tunneling Microscope STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =

More information

By Mir Mohammed Abbas II PCMB 'A' CHAPTER FORMULAS & NOTES. 1. Current through a given area of a conductor is the net charge passing

By Mir Mohammed Abbas II PCMB 'A' CHAPTER FORMULAS & NOTES. 1. Current through a given area of a conductor is the net charge passing Formulae For u CURRENT ELECTRICITY 1 By Mir Mohammed Abbas II PCMB 'A' 1 Important Terms, Definitions & Formulae CHAPTER FORMULAS & NOTES 1. Current through a given area of a conductor is the net charge

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION SUPPLEMENTARY INFORMATION doi: 10.1038/nPHYS1804 Supplementary Information J. Zhu 1, J. Christensen 2, J. Jung 2,3, L. Martin-Moreno 4, X. Yin 1, L. Fok 1, X. Zhang 1 and F. J. Garcia-Vidal 2 1 NSF Nano-scale

More information

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na

More information

Supporting Information

Supporting Information Supporting Information What do Laser Induced Transient Techniques Reveal for Batteries? Na- and K-Intercalation from Aqueous Electrolytes as an Example Daniel Scieszka a,b,(1), Jeongsik Yun a,b,(1), Aliaksandr

More information

Noncontact-AFM (nc-afm)

Noncontact-AFM (nc-afm) Noncontact-AFM (nc-afm) Quantitative understanding of nc-afm A attractive interaction Δf Resonance frequency: f 0 Width of resonance curve (FWHM): Γ Γ+ΔΓ Γ Q-factor: Q π f Γ = 0 f 0 f Conservative forces

More information

Electrostatics of Nanowire Transistors

Electrostatics of Nanowire Transistors Electrostatics of Nanowire Transistors Jing Guo, Jing Wang, Eric Polizzi, Supriyo Datta and Mark Lundstrom School of Electrical and Computer Engineering Purdue University, West Lafayette, IN, 47907 ABSTRACTS

More information

AFM for Measuring Surface Topography and Forces

AFM for Measuring Surface Topography and Forces ENB 2007 07.03.2007 AFM for Measuring Surface Topography and Forces Andreas Fery Scanning Probe : What is it and why do we need it? AFM as a versatile tool for local analysis and manipulation Dates Course

More information

Stepwise Solution Important Instructions to examiners:

Stepwise Solution Important Instructions to examiners: (ISO/IEC - 700-005 Certified) WINTER 0 EXAMINATION Subject Code: 70 Model Answer (Applied Science- Physics) Page No: 0/5 No. Sub. Important Instructions to examiners: ) The answers should be examined by

More information

Comparative electrostatic force microscopy of tetra- and intra-molecular G4-DNA

Comparative electrostatic force microscopy of tetra- and intra-molecular G4-DNA Comparative electrostatic force microscopy of tetra- and intra-molecular G4-DNA Gideon I. Livshits 1, Jamal Ghabboun 1, Natalia Borovok 2, Alexander B. Kotlyar 2 *, Danny Porath 1 * 1 Institute of Chemistry

More information

ELECTRICITY & MAGNETISM NOTES

ELECTRICITY & MAGNETISM NOTES ELECTRICITY & MAGNETISM NOTES PHYSICS B4B BAKERSFIELD COLLEGE Rick Darke (Instructor) CHARGE Electric charge is a fundamental property associated with 2 of the 3 subatomic particles making up most matter.

More information

NIS: what can it be used for?

NIS: what can it be used for? AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached

More information

Instrumentation and Operation

Instrumentation and Operation Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data

More information

Other SPM Techniques. Scanning Probe Microscopy HT10

Other SPM Techniques. Scanning Probe Microscopy HT10 Other SPM Techniques Scanning Near-Field Optical Microscopy (SNOM) Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Multiprobe techniques Electrostatic Force Microscopy,

More information

Force-distance studies with piezoelectric tuning forks below 4.2K

Force-distance studies with piezoelectric tuning forks below 4.2K submitted to APPLIED SURFACE SCIENCE nc-afm 99, Pontresina Force-distance studies with piezoelectric tuning forks below 4.2K J. Rychen, T. Ihn, P. Studerus, A. Herrmann, K. Ensslin Solid State Physics

More information

Scanning Force Microscopy

Scanning Force Microscopy Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data

More information

Electrostatic Force Microscopy (EFM)

Electrostatic Force Microscopy (EFM) 6 Electrostatic Force Microscopy (EFM) Masakazu Nakamura and Hirofumi Yamada 1 Department of Electronics and Mechanical Engineering, Faculty of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku,

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION SUPPLEMENTARY INFORMATION Supplementary Information for Optical Rectification and Field Enhancement in a Plasmonic Nanogap Daniel R. Ward, 1 Falco Hüser, 2 Fabian Pauly, 2 Juan Carlos Cuevas, 3 1, 4, Douglas

More information

Principle of Electrostatic Force Microscopy and Applications. Thierry Mélin.

Principle of Electrostatic Force Microscopy and Applications. Thierry Mélin. Principle of Electrostatic Force Microscopy and Applications Thierry Mélin thierry.melin@univ-lille1.fr ANF-DFRT CEA Leti, Dec 1 st 2016 I Introduction II Electrostatic Force Microscopy (EFM) III Kelvin

More information

Flow Rate is the NET amount of water passing through a surface per unit time

Flow Rate is the NET amount of water passing through a surface per unit time Electric Current An Analogy Water Flow in a Pipe H 2 0 gallons/minute Flow Rate is the NET amount of water passing through a surface per unit time Individual molecules are bouncing around with speeds of

More information

Stepwise Solution Important Instructions to examiners:

Stepwise Solution Important Instructions to examiners: (ISO/IEC - 700-005 Certified) SUMMER 05 EXAMINATION Subject Code: 70 Model Answer (Applied Science- Physics) Page No: 0/6 Que. No. Sub. Que. Important Instructions to examiners: ) The answers should be

More information

Monday July 14. Capacitance demo slide 19 Capacitors in series and parallel slide 33 Elmo example

Monday July 14. Capacitance demo slide 19 Capacitors in series and parallel slide 33 Elmo example Monday July 14 Lecture 5 Capacitance demo slide 19 Capacitors in series and parallel slide 33 Elmo example Lecture 6 Currents and esistance Lecture 9 Circuits Wear Microphone 1 3 Lecture 6 Current and

More information

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes Fabrication of the scanning thermal microscopy (SThM) probes is summarized in Supplementary Fig. 1 and proceeds

More information

Chapter 21 Electric Current and Direct- Current Circuits

Chapter 21 Electric Current and Direct- Current Circuits Chapter 21 Electric Current and Direct- Current Circuits 1 Overview of Chapter 21 Electric Current and Resistance Energy and Power in Electric Circuits Resistors in Series and Parallel Kirchhoff s Rules

More information

Outline Scanning Probe Microscope (SPM)

Outline Scanning Probe Microscope (SPM) AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)

More information

Application of electrostatic force microscopy in nanosystem diagnostics

Application of electrostatic force microscopy in nanosystem diagnostics Materials Science, Vol., No. 3, 003 Application of electrostatic force microscopy in nanosystem diagnostics TEODOR P. GOTSZALK *, PIOTR GRABIEC, IVO W. RANGELOW 3 Fulty of Microsystem Electronics and Photonics,

More information

Atomic and molecular interactions. Scanning probe microscopy.

Atomic and molecular interactions. Scanning probe microscopy. Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic

More information

Tuning the conductance of single walled carbon nanotubes by ion irradiation in the Anderson localization regime

Tuning the conductance of single walled carbon nanotubes by ion irradiation in the Anderson localization regime Tuning the conductance of single walled carbon nanotubes by ion irradiation in the Anderson localization regime C. Gómez-Navarro 1, P.J. de Pablo 1, J.Gómez-Herrero 1, B.Biel 2, F.J.Garcia-Vidal 2, A.Rubio

More information

Charging of highly resistive granular metal films

Charging of highly resistive granular metal films Charging of highly resistive granular metal films M. Orihuela, M. Ortuño, A. M. Somoza, J. Colchero, E. Palacios-Lidón, T. Grenet, J. Delahaye To cite this version: M. Orihuela, M. Ortuño, A. M. Somoza,

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,

More information

Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy

Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy J. Servat, a) P. Gorostiza, and F. Sanz Department Química-Fisica, Universitat de Barcelona, 08028 Barcelona,

More information

Chapter 5 Nanomanipulation. Chapter 5 Nanomanipulation. 5.1: With a nanotube. Cutting a nanotube. Moving a nanotube

Chapter 5 Nanomanipulation. Chapter 5 Nanomanipulation. 5.1: With a nanotube. Cutting a nanotube. Moving a nanotube Objective: learn about nano-manipulation techniques with a STM or an AFM. 5.1: With a nanotube Moving a nanotube Cutting a nanotube Images at large distance At small distance : push the NT Voltage pulse

More information

DNA Electronics. Michael Zwolak. Thesis submitted to the Faculty of the. Virginia Polytechnic Institute and State University

DNA Electronics. Michael Zwolak. Thesis submitted to the Faculty of the. Virginia Polytechnic Institute and State University DNA Electronics Michael Zwolak Thesis submitted to the Faculty of the Virginia Polytechnic Institute and State University in partial fulfillment of the requirements for the degree of Master of Science

More information

Wire Based Flexible Piezoelectric Sensor for Structural Health Monitoring Applications

Wire Based Flexible Piezoelectric Sensor for Structural Health Monitoring Applications Wire Based Flexible Piezoelectric Sensor for Structural Health Monitoring Applications Amine El Kacimi 1, Emmanuelle Pauliac-Vaujour 1, Joël Eymery 2 1 University Grenoble Alpes, CEA, LETI, MINATEC Campus,

More information

Quantized Electrical Conductance of Carbon nanotubes(cnts)

Quantized Electrical Conductance of Carbon nanotubes(cnts) Quantized Electrical Conductance of Carbon nanotubes(cnts) By Boxiao Chen PH 464: Applied Optics Instructor: Andres L arosa Abstract One of the main factors that impacts the efficiency of solar cells is

More information

Agilent Technologies. Scanning Microwave Microscopy (SMM)

Agilent Technologies. Scanning Microwave Microscopy (SMM) Agilent Technologies Scanning Microwave Microscopy (SMM) Expanding Impedance Measurements to the Nanoscale: Coupling the Power of Scanning Probe Microscopy with the PNA Presented by: Craig Wall PhD Product

More information

Research Article Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model

Research Article Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric Films: A Theoretical Model Advances in Condensed Matter Physics Volume 215, Article ID 75498, 6 pages http://dx.doi.org/1.1155/215/75498 Research Article Finite Conductivity Effects in Electrostatic Force Microscopy on Thin Dielectric

More information

Carbon Nanotubes in Interconnect Applications

Carbon Nanotubes in Interconnect Applications Carbon Nanotubes in Interconnect Applications Page 1 What are Carbon Nanotubes? What are they good for? Why are we interested in them? - Interconnects of the future? Comparison of electrical properties

More information

Chapter 21 Electric Current and Direct- Current Circuits

Chapter 21 Electric Current and Direct- Current Circuits Chapter 21 Electric Current and Direct- Current Circuits Units of Chapter 21 Electric Current Resistance and Ohm s Law Energy and Power in Electric Circuits Resistors in Series and Parallel Kirchhoff s

More information

Conventional Paper-I-2011 PART-A

Conventional Paper-I-2011 PART-A Conventional Paper-I-0 PART-A.a Give five properties of static magnetic field intensity. What are the different methods by which it can be calculated? Write a Maxwell s equation relating this in integral

More information

And Manipulation by Scanning Probe Microscope

And Manipulation by Scanning Probe Microscope Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic

More information

Carbonized Electrospun Nanofiber Sheets for Thermophones

Carbonized Electrospun Nanofiber Sheets for Thermophones Supporting Information Carbonized Electrospun Nanofiber Sheets for Thermophones Ali E. Aliev 1 *, Sahila Perananthan 2, John P. Ferraris 1,2 1 A. G. MacDiarmid NanoTech Institute, University of Texas at

More information

Quantum Information Processing with Semiconductor Quantum Dots. slides courtesy of Lieven Vandersypen, TU Delft

Quantum Information Processing with Semiconductor Quantum Dots. slides courtesy of Lieven Vandersypen, TU Delft Quantum Information Processing with Semiconductor Quantum Dots slides courtesy of Lieven Vandersypen, TU Delft Can we access the quantum world at the level of single-particles? in a solid state environment?

More information

Transport of Electrons on Liquid Helium across a Tunable Potential Barrier in a Point Contact-like Geometry

Transport of Electrons on Liquid Helium across a Tunable Potential Barrier in a Point Contact-like Geometry Journal of Low Temperature Physics - QFS2009 manuscript No. (will be inserted by the editor) Transport of Electrons on Liquid Helium across a Tunable Potential Barrier in a Point Contact-like Geometry

More information

Scanning Tunneling Spectroscopy of Single DNA Molecules. KEYWORDS: DNA molecular nanoelectronics scanning probe microscopy theoretical modeling.

Scanning Tunneling Spectroscopy of Single DNA Molecules. KEYWORDS: DNA molecular nanoelectronics scanning probe microscopy theoretical modeling. Scanning Tunneling Spectroscopy of Single DNA Molecules Dmitry A. Ryndyk, Errez Shapir, Danny Porath,, * Arrigo Calzolari, Rosa Di Felice, and Gianaurelio Cuniberti, * Institute for Theoretical Physics,

More information

Measuring charge transport through molecules

Measuring charge transport through molecules Measuring charge transport through molecules utline Indirect methods 1. ptical techniques 2. Electrochemical techniques Direct methods 1. Scanning probe techniques 2. In-plane electrodes 3. Break junctions

More information

4. One-dimensional systems

4. One-dimensional systems 4. One-dimensional systems 1 Contents Introduction Clasification and fabrication techniques 1D metals, polymers Carbon nanotubes Semiconductor wires Metallic wires obtained by MCBJ technique and STM Metallic

More information

DIELECTRIC AND AC CONDUCTION STUDIES OF LEAD PHTHALOCYANINE THIN FILM

DIELECTRIC AND AC CONDUCTION STUDIES OF LEAD PHTHALOCYANINE THIN FILM Chalcogenide Letters Vol. 6, No. 9, September 2009, p. 469 476 DIELECTRIC AND AC CONDUCTION STUDIES OF LEAD PHTHALOCYANINE THIN FILM P. KALUGASALAM a*, DR.S. GANESAN b a Department of Physics, Tamil Nadu

More information

SURFACE PLASMONS AND THEIR APPLICATIONS IN ELECTRO-OPTICAL DEVICES

SURFACE PLASMONS AND THEIR APPLICATIONS IN ELECTRO-OPTICAL DEVICES SURFACE PLASMONS AND THEIR APPLICATIONS IN ELECTRO-OPTICAL DEVICES Igor Zozouleno Solid State Electronics Department of Science and Technology Linöping University Sweden igozo@itn.liu.se http://www.itn.liu.se/meso-phot

More information

Research article Evidence of phonon-assisted tunnelling in electrical conduction through DNA molecules Povilas Pipinys and Antanas Kiveris*

Research article Evidence of phonon-assisted tunnelling in electrical conduction through DNA molecules Povilas Pipinys and Antanas Kiveris* Research article Evidence of phonon-assisted tunnelling in electrical conduction through DNA molecules Povilas Pipinys and Antanas Kiveris* Open Access Address: Department of Physics, Vilnius Pedagogical

More information

Electrical Characterization with SPM Application Modules

Electrical Characterization with SPM Application Modules Electrical Characterization with SPM Application Modules Metrology, Characterization, Failure Analysis: Data Storage Magnetoresistive (MR) read-write heads Semiconductor Transistors Interconnect Ferroelectric

More information

Supporting information for: Coverage-driven. Electronic Decoupling of Fe-Phthalocyanine from a. Ag(111) Substrate

Supporting information for: Coverage-driven. Electronic Decoupling of Fe-Phthalocyanine from a. Ag(111) Substrate Supporting information for: Coverage-driven Electronic Decoupling of Fe-Phthalocyanine from a Ag() Substrate T. G. Gopakumar,, T. Brumme, J. Kröger, C. Toher, G. Cuniberti, and R. Berndt Institut für Experimentelle

More information

29: Nanotechnology. What is Nanotechnology? Properties Control and Understanding. Nanomaterials

29: Nanotechnology. What is Nanotechnology? Properties Control and Understanding. Nanomaterials 29: Nanotechnology What is Nanotechnology? Properties Control and Understanding Nanomaterials Making nanomaterials Seeing at the nanoscale Quantum Dots Carbon Nanotubes Biology at the Nanoscale Some Applications

More information

General Physics (PHY 2140)

General Physics (PHY 2140) General Physics (PHY 2140) Lecture 4 Electrostatics and electrodynamics Capacitance and capacitors capacitors with dielectrics Electric current current and drift speed resistance and Ohm s law resistivity

More information

1 IMEM-CNR, U.O.S. Genova, Via Dodecaneso 33, Genova, IT. 2 Dipartimento di Fisica, Università di Genova, Via Dodecaneso 33, Genova, IT

1 IMEM-CNR, U.O.S. Genova, Via Dodecaneso 33, Genova, IT. 2 Dipartimento di Fisica, Università di Genova, Via Dodecaneso 33, Genova, IT Spontaneous Oxidation of Ni Nanoclusters on MgO Monolayers Induced by Segregation of Interfacial Oxygen. M. Smerieri 1, J. Pal 1,2, L. Savio 1*, L. Vattuone 1,2, R. Ferrando 1,3, S. Tosoni 4, L. Giordano

More information

Application of Linear, Nonlinear and Nanoscale Conductivity Spectroscopy for Characterising Ion Transport in Solid Electrolytes

Application of Linear, Nonlinear and Nanoscale Conductivity Spectroscopy for Characterising Ion Transport in Solid Electrolytes Application of Linear, Nonlinear and Nanoscale Conductivity Spectroscopy for Characterising Ion Transport in Solid Electrolytes Bernhard Roling Institute of Physical Chemistry and Collaborative Research

More information

Tip-Enhanced Raman Spectroscopy: Developments and Application to the study of double-stranded DNA bundles and polymer-wrapped carbon nanotubes

Tip-Enhanced Raman Spectroscopy: Developments and Application to the study of double-stranded DNA bundles and polymer-wrapped carbon nanotubes Tip-Enhanced Raman Spectroscopy: Developments and Application to the study of double-stranded DNA bundles and polymer-wrapped carbon nanotubes Sébastien Bonhommeau Groupe Spectroscopie Moléculaire, ISM,

More information

Understanding the properties and behavior of groups of interacting atoms more than simple molecules

Understanding the properties and behavior of groups of interacting atoms more than simple molecules Condensed Matter Physics Scratching the Surface Understanding the properties and behavior of groups of interacting atoms more than simple molecules Solids and fluids in ordinary and exotic states low energy

More information

Nanotechnology Fabrication Methods.

Nanotechnology Fabrication Methods. Nanotechnology Fabrication Methods. 10 / 05 / 2016 1 Summary: 1.Introduction to Nanotechnology:...3 2.Nanotechnology Fabrication Methods:...5 2.1.Top-down Methods:...7 2.2.Bottom-up Methods:...16 3.Conclusions:...19

More information

MAGNETIC FIELDS & UNIFORM PLANE WAVES

MAGNETIC FIELDS & UNIFORM PLANE WAVES MAGNETIC FIELDS & UNIFORM PLANE WAVES Name Section Multiple Choice 1. (8 Pts) 2. (8 Pts) 3. (8 Pts) 4. (8 Pts) 5. (8 Pts) Notes: 1. In the multiple choice questions, each question may have more than one

More information

Direct Measurement of Electron Transfer through a Hydrogen Bond

Direct Measurement of Electron Transfer through a Hydrogen Bond Supporting Information Direct Measurement of Electron Transfer through a Hydrogen Bond between Single Molecules Tomoaki Nishino,*, Nobuhiko Hayashi, and Phuc T. Bui Nanoscience and Nanotechnology Research

More information

Supporting Information

Supporting Information Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supporting Information Predicting Supramolecular Self-assembly on Reconstructed Metal Surfaces

More information

Probing into the Electrical Double Layer Using a Potential Nano-Probe

Probing into the Electrical Double Layer Using a Potential Nano-Probe A3 Foresight Program, 2. 27-3. 1, 26 Probing into the Electrical Double Layer Using a Potential Nano-Probe Heon Kang ( 姜憲 ) Department of Chemistry, Seoul National University, Republic of Korea (E-mail:

More information

Surface plasmon waveguides

Surface plasmon waveguides Surface plasmon waveguides Introduction Size Mismatch between Scaled CMOS Electronics and Planar Photonics Photonic integrated system with subwavelength scale components CMOS transistor: Medium-sized molecule

More information

Construction of Two Dimensional Chiral Networks

Construction of Two Dimensional Chiral Networks Supporting Information Construction of Two Dimensional Chiral Networks through Atomic Bromine on Surfaces Jianchen Lu, De-Liang Bao, Huanli Dong, Kai Qian, Shuai Zhang, Jie Liu, Yanfang Zhang, Xiao Lin

More information

Practical aspects of Kelvin probe force microscopy

Practical aspects of Kelvin probe force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 70, NUMBER 3 MARCH 1999 Practical aspects of Kelvin probe force microscopy H. O. Jacobs, H. F. Knapp, and A. Stemmer a) Swiss Federal Institute of Technology, Nanotechnology

More information

STM spectroscopy (STS)

STM spectroscopy (STS) STM spectroscopy (STS) di dv 4 e ( E ev, r) ( E ) M S F T F Basic concepts of STS. With the feedback circuit open the variation of the tunneling current due to the application of a small oscillating voltage

More information

Question 3: How is the electric potential difference between the two points defined? State its S.I. unit.

Question 3: How is the electric potential difference between the two points defined? State its S.I. unit. EXERCISE (8 A) Question : Define the term current and state its S.I unit. Solution : Current is defined as the rate of flow of charge. I = Q/t Its S.I. unit is Ampere. Question 2: Define the term electric

More information

Supplementary Materials. Mechanics and Chemistry: Single Molecule Bond Rupture Forces Correlate with

Supplementary Materials. Mechanics and Chemistry: Single Molecule Bond Rupture Forces Correlate with Supplementary Materials Mechanics and Chemistry: Single Molecule Bond Rupture Forces Correlate with Molecular Backbone Structure M. Frei 1, S Aradhya 1, M. Koentopp 2, M. S. Hybertsen 3, L. Venkataraman

More information

Dopant Concentration Measurements by Scanning Force Microscopy

Dopant Concentration Measurements by Scanning Force Microscopy 73.40L Scanning Microsc. Microanal. Microstruct. 551 Classification Physics Abstracts - - 61.16P 73.00 Dopant Concentration Measurements by Scanning Force Microscopy via p-n Junctions Stray Fields Jacopo

More information

Scanning Force Microscopy II

Scanning Force Microscopy II Scanning Force Microscopy II Measurement modes Magnetic force microscopy Artifacts Lars Johansson 1 SFM - Forces Chemical forces (short range) Van der Waals forces Electrostatic forces (long range) Capillary

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION DOI: 10.1038/NCHEM.1332 Light triggered self-construction of supramolecular organic nanowires as metallic interconnects Vina Faramarzi 1,2, Frédéric Niess 1,3, Emilie Moulin 3, Mounir Maaloum 1,3, Jean-François

More information

Quantum Information Processing with Semiconductor Quantum Dots

Quantum Information Processing with Semiconductor Quantum Dots Quantum Information Processing with Semiconductor Quantum Dots slides courtesy of Lieven Vandersypen, TU Delft Can we access the quantum world at the level of single-particles? in a solid state environment?

More information

Deposition of Multilayer Fibers and Beads by Near-Field Electrospinning for Texturing and 3D Printing Applications

Deposition of Multilayer Fibers and Beads by Near-Field Electrospinning for Texturing and 3D Printing Applications Deposition of Multilayer Fibers and Beads by Near-Field Electrospinning for Texturing and 3D Printing Applications Nicolas Martinez-Prieto, Jian Cao, and Kornel Ehmann Northwestern University SmartManufacturingSeries.com

More information

Improving signal-to-noise performance for DNA translocation in solid-state nanopores at MHz bandwidths

Improving signal-to-noise performance for DNA translocation in solid-state nanopores at MHz bandwidths Supporting Information Improving signal-to-noise performance for DNA translocation in solid-state nanopores at MHz bandwidths Adrian Balan *1, Bartholomeus Machielse *1, David Niedzwiecki 1, Jianxun Lin

More information

Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 70, NUMBER 3 MARCH 1999 Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope J. W. Hong,

More information

Single Electron Tunneling Examples

Single Electron Tunneling Examples Single Electron Tunneling Examples Danny Porath 2002 (Schönenberger et. al.) It has long been an axiom of mine that the little things are infinitely the most important Sir Arthur Conan Doyle Books and

More information

Supplementary Information for. Effect of Ag nanoparticle concentration on the electrical and

Supplementary Information for. Effect of Ag nanoparticle concentration on the electrical and Supplementary Information for Effect of Ag nanoparticle concentration on the electrical and ferroelectric properties of Ag/P(VDF-TrFE) composite films Haemin Paik 1,2, Yoon-Young Choi 3, Seungbum Hong

More information

Local spectroscopy. N. Witkowski W. Sacks

Local spectroscopy. N. Witkowski W. Sacks Local spectroscopy N. Witkowski W. Sacks Outlook 1. STM/STS theory elements a. history of STM and basic idea b. tunnel effect c. STM/STS 2. Technology a. STM design : vibration and thermal drift b. STM

More information

Graphene The Search For Two Dimensions. Christopher Scott Friedline Arizona State University

Graphene The Search For Two Dimensions. Christopher Scott Friedline Arizona State University Graphene The Search For Two Dimensions Christopher Scott Friedline Arizona State University What Is Graphene? Single atomic layer of graphite arranged in a honeycomb crystal lattice Consists of sp 2 -bonded

More information

Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope

Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope Atif Imtiaz 1 and Steven M. Anlage Center for Superconductivity Research, Department of Physics, University of Maryland,

More information