Université du Québec Institut national de la recherche scientifique INRS

Size: px
Start display at page:

Download "Université du Québec Institut national de la recherche scientifique INRS"

Transcription

1 McGill University, CSACS Course, March 5th 2010 Scanning Probe Microscopy Techniques Federico Rosei Canada Research Chair in Nanostructured Organic and Inorganic Materials Énergie, Matériaux et Télécommunications élécommunications, Université du Québec, Varennes (Québec)

2 Contents Intro on nano-tools Scanning Tunneling Microscopy (STM) STM imaging i of semiconductor surfaces STM imaging of metal surfaces Atomic Force Microscopy (AFM)

3 Nano tools By increasing by a factor of 10 the resolving power of the Human eye, Galileo was able to discover Jupiter s satellites The principles of physics, as far as I can see, do not speak against the possibility of maneuvering things atom by atom The problems of chemistry and biology can be greatly helped if our ability to see what we are doing, and to do things on an atomic level, is ultimately developed a development which I think cannot be avoided From: R. Feynman: There's Plenty Science in ACTION of for a World Room in EVOLUTION at the Bottom (1959)

4

5 Length scales Nano tools Université du Québec Human hair Cells 100 μm Optical Microscopy 10 μm Lithography Integrated circuits Biological Macromolecules 1 μm 100 nm 10 nm Electron Microscopy Atoms and molecules 1 nm Scanning Probe Microscopy

6 Scanning Probe Microscopy Principle of a scanning probe microscope. Surface is scanned line by line with a probe using a fine positioning system (scanner). Vibration isolation shields the microscope from external vibrations. With a coarse positioning device, the distance between the sample and the probe is reduced until the interaction regime is reached.

7 The STM principle G. Binnig and H. Rohrer, (Nobel Prize in Physics, 1986) A sharp metal tip (W, Pt Ir) is brought into close proximity of a conducting sample, and a bias is applied: electrons tunnel from tip to sample (or viceversa)

8 STM working model Animation on:

9 The STM principle Principle of a scanning tunnelling microscope. Once the gap between tip and sample is about as small as the diameter of an atom, a tunnelling current flows between a conductive cti tip and sample.

10 Operation of an STM 1,2 [1] C. Julian Chen, Introduction to Scanning Tunnelling Microscopy, Oxford (1993) [2] G.A.D. Briggs and A. J. Fisher, Surf. Sci. Rep. 33, 1 (1999)

11 Scanning Tunneling Microscopy Once the tip is in tunneling contact, it is scanned above the surface using three separate piezoelectric transducers for precise movements in x,y,z Pt(110) (1x2) with atomic resolution

12 Principle of a local probe gentle touch of a nanofinger: If the interaction between tip and sample decays sufficiently rapidly on the atomic scale, only the two atoms that are closest to each other are able to feel each other. G. Binnig, H. Röhrer, Rev. Mod. Phys. 71, S324 (1999)

13 Tunneling Current I t V t exp(-a Θ z) Θ. Workfunction, typically 3-5 ev z.. Tip-sample separation, typically 4-10 A Δ z = 1 Å --> Δ I one order of magnitude!

14 Imaging Si(111) 7x7 Si(111) clean surface (reconstructed 7x7) imaged with atomic resolution First STM work: Binnig et al., Phys. Rev. Lett. (1983) Si(111) 7x7 in real space

15 The Bottom Up approach Semiconductor quantum dot: the ultimate quantum confined structure Narrow band gap material nanostructure embedded in wide band material Unique electronic properties: δ-function like energy dependence of the density of states: energy and charge quantization quantum confinement of carriers in all 3 dimensions can be treated like an atom Needs: lateral dimensions < λ de Broglie (50 nm in GaAs) Uniformity in shape and dimensions Reliable ordered distribution direct synthesis of devices by epitaxial growth Self assembled epitaxial growth: Damage free (coherent) structures Coherent crystals Possibility of integration with microelectronic fabrication

16 Crystal Growth: Université du Québec a non equilibrium phenomenon Epitaxial thin film growth is a non equilibrium kinetic phenomenon. At thermodynamic equilibrium, all atomic processes proceed din opposite directions at equal rates (principle of detailed balance ) Adsorption/desorption from the gasphase and cluster nucleation/decay occur at equal rates => no net growth at equilibrium => average macroscopic quantities (e.g. surface coverage, roughness) stay constant For a net growth rate, one has to be away from equilibrium Competing effects: thermodynamics (surface and interface energies) versus kinetics (temperature, deposition rate)

17 Epitaxy Epitaxy comes from the greek words: επί (on top) ταξισ (to order) In this growth mode, the atoms attach to an existing crystalline surface by forming layers with the same order as the original matrix.

18 Growth Techniques Chemical Vapor Deposition Molecular Beam Epitaxy

19 Three types of Epitaxy The forces that act between the substrate and the deposited layer give rise to three different growth modes: layer-by-layer (Frank Van der Merwe), island formation on the bare substrate (Volmer Weber), layer by layer up to a critical thickness, followed by island formation (Stranski Krastanov), which is a mix of the first two.

20

21

22 Homoepitaxy Examples: Growth of Si on Si Growth of Pt on Pt (previous STM movies) There is no strain. The growth dynamics is governed by kinetic effects (e.g. substrate temperature, deposition rate)

23 Heteroepitaxy heteroepitaxy : epitaxial growth realized by depositing one or more atomic species on a substrate with different composition (e.g. Ge on Si, InAs on GaAs). Typically the two (or more) species have a different lattice parameter, and this often induces a strain in the grown film

24 Lattice parameter: x Ge = 5.65 Å x Si =543Å 5.43 Lattice mismatch Pseudomorphic Growth ε = (x Ge x Si )/x Ge = 4.2% Up to a critical thickness, it is possible to grow layer by layer (Wetting Layer: The grown material B wets the surface of A) Rule of thumb: If B wets A, then A does not wet B (the type of strain is inverted)

25 Heteroepitaxy: Ge/Si growth Université du Québec 1 ML = 0.34 nm: WL ~ 3 ML Si Wetting Layer 4.2% Ge/Si lattice mismatch: wetting layer -> 3D structures (SK growth mode) Up to 3 5 ML flat WL More than 3 5 ML strain driven roughening transition Ge/Si(111) is a model quantum dot system Islands are very large due to alloying 1 μm LEEM movie: T = 550 C, 3 to 10 ML

26 Ge/Si: Reconstruction change Si(111) reconstructs 7x7 The Ge/Si(111) Wetting Layer reconstructs 5x5 7x7 5x5

27 Ge/Si(111): island nucleation Nucleation of 3 D islands: 20 Å Ge / Si(111), T = 550 C Abrupt transition of the WL? Islands begin to form as truncated tetrahedra Gradient image 8.5 nm nm 40 Θ 0

28 Ge/Si(111): island evolution 25 Å Ge / Si(111), T = 450 C Gradient image Island height: 38 nm 43 <117> Insertion facets of Initial formation trenches new of 230 nm <111> 55 <100> 60 Θ 0

29 Ge/Si(111): different reconstructions 2000 nm 9MLGedeposition 0.1 nm/min T = 500 ºC 3 D Islands: 7x7-5x5 tall triangular (strained) (180 nm wide x 10 nm high) low rounded (ripened) (350 nm wide x 2.5 nm high) 8 nm

30 Ge/Si(111) island evolution After nucleation: the islands grow vertically up to a critical value the strain energy introduces dislocations morphological transition lateral growth material flow from the top - central hole formation nm 0.6 nm n 40 m

31 Ge/Si(111) island evolution 45 Å Ge/Si(111) T=450 C Gradient image Island height: 63 nm Insertion of dislocations nm 260 Dislocations

32 Ge/Si(111): island ripening 30 Å Ge / Si(111), T = 500 C 20 Å Ge / Si(111), T = 550 C Gradient image - Main features: Gradient image nm Ripening effect: island is rounded Substrate erosion: formation of a trench around the island. 500 nm - Full Ripening: Atoll like shape: formation of a central hole Substrate erosion

33 Growth Movies -1 STM Movies: B. Voigtlander observation of step-flow growth Homoepitaxy of Si on Si(001): Layer by Science inlayer ACTION for a World EVOLUTION growth

34 Growth Movies - 2 Homoepitaxy of Si on Si(111): Layer by Layer growth 2 D island nucleation and coalescence

35 Growth Movies - 3 heteroepitaxy of Ge on Si(001): Stranski Krastanow growth (layer by layer, then 3 D island nucleation)

36 Growth Movies - 4 heteroepitaxy of Ge on Si(111): Stranski Krastanow growth

37

38 The Herringbone Reconstruction on the Au(111) Surface 1211 x 1227 Å 2 87 x 90 Å 2

39 Au(110)-(1x2) (1x2) Missing row reconstruction

40 Cu(110) with atomic resolution Cu(110) 1x1 [1 1 0] [0 0 1] 100x100 Å 2

41 Oxygen nanopattern on Cu(110) Cu(110) O 2 chemisorption: Cu O rows (2x1) Cu O rows (2x1) 4 6 Langmuir O 2 at 625 K [001] [1-10] 10] partial 2x1 reconstruction ( patches ) [001] [1-10] 10] 65x65 Å 2 Bare Cu 65x65 Å 2 added row structure : Cu atoms : O atom

42 Coseupo Close on Cu O O 2 chemisorption on Cu(110): partial 2x1 reconstruction ti ( patches ) ) 35x35 Å 2 20x20 Å 2

43 Surface diffusion: in general, it is a 2 D random walk E D ν = ν 0 exp(-e D /kt) Hopping rate: counting the proportion of molecules that have not moved between two consecutive images: P 0 = M / N = F(ht)

44 Surface diffusion i E D hopping rate: h = h 0 exp(-e D /kt) random walk: ( x) 2 = λ 2 ht λ - RMS jump length P x T 1 T 2 tracer diffusion coefficient: D = ( x) 2 /2t x D = D 0 exp(-e D /kt) ln D D 0 E D with D 0 = h 0 λ 2 /2 1/kT

45 STM Université du Québec movies: Diffusion of Pt adatoms Diffusion of Pt adatoms on Pt(110) (1x2) (1x2) T.R. Linderoth et al., Phys. Rev. Lett. 78, 4978 (1997) More STM Movies: Science in ACTION for a World in EVOLUTION

46 STM movie: Dynamics of Pt dimers Slightly higher Pt coverage Diffusion of vacancies along the rows Formation and diffusion of Pt dimers T. Linderoth et al., Phys. Rev. B 61, R2448 (2000) Å 2 STM Movies:

47 Surface Université du Québec Diffusion of Large Molecules DC HtBDC 1 D Diffusion along the close packed direction [1-10] of Cu(110) [1,-1,0] 1,0] [001] 50 Jump length ht HtBDC/Cu(110): λ = 6.8 ± x500 Å 2 T = 235 K 500x500 Å 2 T = 194 K DC/Cu(110): λ = 3.9 ± 0.2 Pt/Pt(110): λ = 1.11 ± 0.01 Comparative diffusion of DC and HtBDC on Cu(110): M. Schunack, T. Linderoth, F. Rosei et al., Phys. Rev. Lett. 88, (2002)

48 Displacement Institut national de recherche scientifique distribution: HtBDC Temperature: 185 K Time per image: 13.5 sec Temperature: 194 K Time per image: 13.7 sec OBSER RVATION NS OBSER RVATION NS Δx [N.N. DISTANCES] Δx [N.N. DISTANCES]

49 Institut national de la Arrhenius recherche scientifique analysis: D DC K HtBDC K E D =0.71±0.05 ev E D =0.62±0.04eV D =10-1.0± cm s D =10 0.9± cm s => Arrhenius parameters are related to Science molecular in ACTION for a World in EVOLUTION structure

50 Institut national de la recherche Arrhenius scientifique analysis: h DC K HtBDC K E D=0.71±0.05 ev h 0 = ±0.7 s -1 E D=0.62±0.04eV h 0 = ±0.4 s -1 In general, E D is a fraction of the adsorption energy

51 Diffusion coupled to rotation Diffusion of DC on Cu(110), high resolution movie 200 x 200 Å 2 with high resolution we observed the rotation of single molecules, coupled to diffusion: the molecules behave like nano-disks

52 Diffusion of C 60 on Pd(110): rolling motion? J. Weckesser, J.V. Barth, K. Kern, Phys. Rev. B 64, (2001) E D = 1.4 ± 0.2 ev, h 0 = ±0.4 s -1 Sequence of STM images monitoring the thermal motions of C 60 molecules on Science Pd(110) in ACTION for a World in EVOLUTION at T = 437 K.

53 Diffusion i conclusions DC HtBDC E D (ev) 0.71 ± ± 0.04 λ (nn dist) ) 3.9 ± ± long jumps may be predominant in surface diffusion of large organic molecules 2. tailoring diffusion properties (using specially designed molecules)

54 Further Reading F. Besenbacher, STM studies of metal surfaces Rep. Prog. Phys. 59, 1737 (1996) G. Binnig et al., Atomic Force Microscope, Phys. Rev. Lett. 56, 930 (1986) G. Binnig et al., 7x7 reconstruction on Si(111) resolved in real space, Phys. Rev. Lett. 50, 120 (1983) G. Binnig, H. Rohrer, In touch with atoms, Rev. Mod. Phys. 71, S324 (1999) K. Bobrov, A.J. Mayne, G. Dujardin, Atomic - scale imaging of insulating diamond through resonant electron injection Nature 413, 616 (2001) C. Barth, M. Reichling, Imaging the atomic arrangements on the high-temperature reconstructed α-al 2 O 3 (0001) surface, Nature 414, 54 (2001)

55 Review Institut national Article de la recherche in: scientifique Progress in Surface Science 71,, (2003).

56 Atomic Force Microscope (AFM) It also works on insulators! Binnig, Quate, Gerber (1986)

57 Atomic Force Microscope

58 The first AFM G. Binning, Ch. Gerber, C.F. Quate, Phys. Rev. Lett. 56, 930 (1986)

59 Atomic Force Microscopy

60 Principle of an atomic force microscope. A sharp tip is brought close to the sample. AFM principle The forces acting between tip and sample lead to a deflection of the spring. The deflection is then measured e.g. optically

61 AFM on insulators Previous studies had indicated that AFM can attain atomic resolution on Si(111) 7x7 Structure of the α-al 2 O 3 (0001) surface in its 31x 31 R ±9 high-temperature reconstruction, as measured by dynamic scanning force Science microscopy in ACTION for a World in EVOLUTION

62 Measuring Forces

63 Forces between atoms Back of the envelope : Atomic energy scale: E bond ~ 1-4 ev ~ J bond Typical bonding length: a~0.2 nm Typical forces: F = E/a ~ 1-3 nn Bonding energies: Quantum mechanical (covalent, metallic bonds): 1 3 nn Coulomb (dipole, ionic): nn Polarization (induced dipoles): nN J. Israelachvili, Intermolecular and Surface Forces, Academic Press

64 Comparing forces Comparison of the distance dependence of a short range force with the tunneling current.

65 F vdw = AR/6z 2 vdw Van der Waals forces A: Hamaker s constant R: tip radius z: Tip sample separation A depends d on the type of material (polarizability). For most materials and vacuum, A~1 ev (Krupp, Advances Colloidal Interface Sci. 1, 113 (1967) R~100 nm is a typical effective radius => F vdw ~10 nn at z~0.5 nm

66

67 Deflection sensors

68 Laser beam deflection Interferometric cantilever detection systems as detection system, a often used in ambient popular choice for low- AFMs. temperature t AFMs.

69 Feedback modes

70 Piezoelectric scanners

71 Creating images from the feedback signal

72 Electrostatic forces

73 Imaging artifacts t

74 Thermal drift Touching the microscope (e.g. sample, cantilever) will change its temperature T. Shining light on it too! Cantilever has a mass of ~ 1 ng, and thus a VERY small heat capacity. So what!?! L/L = const T; const ~ 10-5

75 AFM on biological systems (a) The cytoplasmic surface of the hexagonally packed intermediate layer is an essential part of the cell envelope of Deinococcus radiodurans. It has a protective function and acts as a molecular sieve. The pores in protruding cores are the channels of this sieve, and exhibit two conformations that change dynamically. The unit cell size is 18 nm, and the brightness range corresponds to 3 nm. (b) Two-dimensional crystals of bacteriophage F 29 head-tail connectors recorded with AFM in buffer solution. The connectors are packed in up-and-down originations, exposing their narrow ends that connect to the tail and their wide ends that connect to the head. The unit cell size is 16.5 nm, whereas the brightness range corresponds to 4 nm.

76 Examples of writing by AFM

77 Dip-pen pen nanolithography Chad Mirkin (1999)

78 Université Dynamic du Québec (AFM) Nanostencil Lüthi et al., Appl. Phys. Lett. 75 (1999) 1314 Scheme of the experimental apparatus: - The material is deposited from source A through series of collimating apertures - Optical beam from source B reflects off a cantilever (D) - Position-sensitive sensiti e detector (C) used to regulate proximity of the cantilever tip with respect to substrate surface (E) - Series of small apertures: the cantilever defines pattern of deposited material at E

79 Université Dynamic du Québec (AFM) Nanostencil SEM images of a Si 3 N 4 cantilever featuring several holes in and near pyramidal tip - milled by focused ion beam (Ga ions, 70 pa, 30 kv). Lüthi et al., Appl. Phys. Lett. 75 (1999) 1314 AFM images of atomically clean Cu lines grown by dynamic stenciling: (a) line, (b) circle, (c) interdigitated line, and (d) lines connecting two pads (height of the lines: nm).

80 Applications: nanosensors Ways to functionalize cantilevers: - Evaporation of metal layers through shadow masks - Self assembly of monolayers - Spray coating with polymers - Coating using a microfluidic network IBM and the Nanomechanical ln Nose Ch. Gerber Science and in ACTION for a World in EVOLUTION co workers, Science 288, 216 (2000)

The basics of Scanning Probe Microscopy

The basics of Scanning Probe Microscopy McGill University, Montreal, Jan. 8 th 2009 The basics of Scanning Probe Microscopy Federico Rosei Canada Research Chair in Nanostructured Organic and Inorganic Materials Énergie, Matériaux et Télécommunications,

More information

Introduction to semiconductor nanostructures. Peter Kratzer Modern Concepts in Theoretical Physics: Part II Lecture Notes

Introduction to semiconductor nanostructures. Peter Kratzer Modern Concepts in Theoretical Physics: Part II Lecture Notes Introduction to semiconductor nanostructures Peter Kratzer Modern Concepts in Theoretical Physics: Part II Lecture Notes What is a semiconductor? The Fermi level (chemical potential of the electrons) falls

More information

Lecture 10 Thin Film Growth

Lecture 10 Thin Film Growth Lecture 10 Thin Film Growth 1/76 Announcements Homework: Homework Number 2 is returned today, please pick it up from me at the end of the class. Solutions are online. Homework 3 will be set Thursday (2

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,

More information

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM) Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

Initial Stages of Growth of Organic Semiconductors on Graphene

Initial Stages of Growth of Organic Semiconductors on Graphene Initial Stages of Growth of Organic Semiconductors on Graphene Presented by: Manisha Chhikara Supervisor: Prof. Dr. Gvido Bratina University of Nova Gorica Outline Introduction to Graphene Fabrication

More information

Nanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope

Nanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope Nanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope Kentaro Sasaki, Keiji Ueno and Atsushi Koma Department of Chemistry, The University of Tokyo,

More information

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Scanning Tunneling Microscopy. Wei-Bin Su, Institute of Physics, Academia Sinica

Scanning Tunneling Microscopy. Wei-Bin Su, Institute of Physics, Academia Sinica Scanning Tunneling Microscopy Wei-Bin Su, Institute of Physics, Academia Sinica Tunneling effect Classical physics Field emission 1000 ~ 10000 V E V metal-vacuum-metal tunneling metal metal Quantum physics

More information

SEMICONDUCTOR GROWTH TECHNIQUES. Introduction to growth techniques (bulk, epitaxy) Basic concepts in epitaxy (MBE, MOCVD)

SEMICONDUCTOR GROWTH TECHNIQUES. Introduction to growth techniques (bulk, epitaxy) Basic concepts in epitaxy (MBE, MOCVD) SEMICONDUCTOR GROWTH TECHNIQUES Introduction to growth techniques (bulk, epitaxy) Basic concepts in epitaxy (MBE, MOCVD) Growth Processes Bulk techniques (massive semiconductors, wafers): Si, compounds

More information

From nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor

From nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor From nanophysics research labs to cell phones Dr. András Halbritter Department of Physics associate professor Curriculum Vitae Birth: 1976. High-school graduation: 1994. Master degree: 1999. PhD: 2003.

More information

Microscopie a stilo: principi ed esempi di applicazione

Microscopie a stilo: principi ed esempi di applicazione Microscopie a stilo: principi ed esempi di applicazione Adele Sassella Dipartimento di Scienza dei Materiali Università degli Studi di Milano Bicocca adele.sassella@unimib.it Pavia, 22 aprile 2009 SCANNING

More information

Lecture 30: Kinetics of Epitaxial Growth: Surface Diffusion and

Lecture 30: Kinetics of Epitaxial Growth: Surface Diffusion and Lecture 30: Kinetics of Epitaxial Growth: Surface Diffusion and Nucleation Today s topics Understanding the basics of epitaxial techniques used for surface growth of crystalline structures (films, or layers).

More information

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy

More information

Plan for Lectures #4, 5, & 6. Theme Of Lectures: Nano-Fabrication

Plan for Lectures #4, 5, & 6. Theme Of Lectures: Nano-Fabrication Plan for Lectures #4, 5, & 6 Theme Of Lectures: Nano-Fabrication Quantum Wells, SLs, Epitaxial Quantum Dots Carbon Nanotubes, Semiconductor Nanowires Self-assembly and Self-organization Two Approaches

More information

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer

More information

GeSi Quantum Dot Superlattices

GeSi Quantum Dot Superlattices GeSi Quantum Dot Superlattices ECE440 Nanoelectronics Zheng Yang Department of Electrical & Computer Engineering University of Illinois at Chicago Nanostructures & Dimensionality Bulk Quantum Walls Quantum

More information

CH676 Physical Chemistry: Principles and Applications. CH676 Physical Chemistry: Principles and Applications

CH676 Physical Chemistry: Principles and Applications. CH676 Physical Chemistry: Principles and Applications CH676 Physical Chemistry: Principles and Applications History of Nanotechnology: Time Line Democritus in ancient Greece: concept of atom 1900 : Rutherford : discovery of atomic nucleus The first TEM was

More information

Scanning Tunneling Microscopy. how does STM work? the quantum mechanical picture example of images how can we understand what we see?

Scanning Tunneling Microscopy. how does STM work? the quantum mechanical picture example of images how can we understand what we see? Scanning Tunneling Microscopy how does STM work? the quantum mechanical picture example of images how can we understand what we see? Observation of adatom diffusion with a field ion microscope Scanning

More information

High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy

High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy High-resolution Characterization of Organic Ultrathin Films Using Atomic Force Microscopy Jing-jiang Yu Nanotechnology Measurements Division Agilent Technologies, Inc. Atomic Force Microscopy High-Resolution

More information

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples

More information

Atomic and molecular interactions. Scanning probe microscopy.

Atomic and molecular interactions. Scanning probe microscopy. Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic

More information

Techniken der Oberflächenphysik (Techniques of Surface Physics)

Techniken der Oberflächenphysik (Techniques of Surface Physics) Techniken der Oberflächenphysik (Techniques of Surface Physics) Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: yong.lei@tu-ilmenau.de yang.xu@tu-ilmenau.de

More information

Surface Composition Mapping Of Semiconductor Quantum Dots. Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy.

Surface Composition Mapping Of Semiconductor Quantum Dots. Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy. Surface Composition Mapping Of Semiconductor Quantum Dots Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy. Motivation Quantum Dot Applications based on their particular electronic properties (confinement)

More information

Surface Physics Surface Diffusion. Assistant: Dr. Enrico Gnecco NCCR Nanoscale Science

Surface Physics Surface Diffusion. Assistant: Dr. Enrico Gnecco NCCR Nanoscale Science Surface Physics 008 8. Surface Diffusion Assistant: Dr. Enrico Gnecco NCCR Nanoscale Science Random-Walk Motion Thermal motion of an adatom on an ideal crystal surface: - Thermal excitation the adatom

More information

Chapter 10. Nanometrology. Oxford University Press All rights reserved.

Chapter 10. Nanometrology. Oxford University Press All rights reserved. Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,

More information

Optical Spectroscopies of Thin Films and Interfaces. Dietrich R. T. Zahn Institut für Physik, Technische Universität Chemnitz, Germany

Optical Spectroscopies of Thin Films and Interfaces. Dietrich R. T. Zahn Institut für Physik, Technische Universität Chemnitz, Germany Optical Spectroscopies of Thin Films and Interfaces Dietrich R. T. Zahn Institut für Physik, Technische Universität Chemnitz, Germany 1. Introduction 2. Vibrational Spectroscopies (Raman and Infrared)

More information

STM: Scanning Tunneling Microscope

STM: Scanning Tunneling Microscope STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =

More information

Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2

Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2 Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor

More information

Scanning Probe Microscopy. EMSE-515 F. Ernst

Scanning Probe Microscopy. EMSE-515 F. Ernst Scanning Probe Microscopy EMSE-515 F. Ernst 1 Literature 2 3 Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer,Ans Josef Hug,Roland Bennewitz 4 Scanning Probe Microscopy and Spectroscopy : Theory,

More information

Self-Assembled InAs Quantum Dots

Self-Assembled InAs Quantum Dots Self-Assembled InAs Quantum Dots Steve Lyon Department of Electrical Engineering What are semiconductors What are semiconductor quantum dots How do we make (grow) InAs dots What are some of the properties

More information

tip of a current tip and the sample. Components: 3. Coarse sample-to-tip isolation system, and

tip of a current tip and the sample. Components: 3. Coarse sample-to-tip isolation system, and SCANNING TUNNELING MICROSCOPE Brief history: Heinrich Rohrer and Gerd K. Binnig, scientists at IBM's Zurich Research Laboratory in Switzerland, are awarded the 1986 Nobel Prize in physicss for their work

More information

Compositional mapping of semiconductor quantum dots by X-ray photoemission electron microscopy

Compositional mapping of semiconductor quantum dots by X-ray photoemission electron microscopy Compositional mapping of semiconductor quantum dots by X-ray photoemission electron microscopy Stefan Heun CNR-INFM, Italy, Laboratorio Nazionale TASC, Trieste and NEST-SNS, Pisa Outline A brief introduction

More information

Outline Scanning Probe Microscope (SPM)

Outline Scanning Probe Microscope (SPM) AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)

More information

Fabrication at the nanoscale for nanophotonics

Fabrication at the nanoscale for nanophotonics Fabrication at the nanoscale for nanophotonics Ilya Sychugov, KTH Materials Physics, Kista silicon nanocrystal by electron beam induced deposition lithography Outline of basic nanofabrication methods Devices

More information

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany

More information

Scanning Probe Microscopy (SPM)

Scanning Probe Microscopy (SPM) Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM) --- G. Binnig, H. Rohrer et al, (1982) Near-Field Scanning Optical Microscopy (NSOM) --- D. W. Pohl (1982) Atomic Force Microscopy (AFM)

More information

672 Advanced Solid State Physics. Scanning Tunneling Microscopy

672 Advanced Solid State Physics. Scanning Tunneling Microscopy 672 Advanced Solid State Physics Scanning Tunneling Microscopy Biao Hu Outline: 1. Introduction to STM 2. STM principle & working modes 3. STM application & extension 4. STM in our group 1. Introduction

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,

More information

Adsorption, desorption, and diffusion on surfaces. Joachim Schnadt Divsion of Synchrotron Radiation Research Department of Physics

Adsorption, desorption, and diffusion on surfaces. Joachim Schnadt Divsion of Synchrotron Radiation Research Department of Physics Adsorption, desorption, and diffusion on surfaces Joachim Schnadt Divsion of Synchrotron Radiation Research Department of Physics Adsorption and desorption Adsorption Desorption Chemisorption: formation

More information

STM spectroscopy (STS)

STM spectroscopy (STS) STM spectroscopy (STS) di dv 4 e ( E ev, r) ( E ) M S F T F Basic concepts of STS. With the feedback circuit open the variation of the tunneling current due to the application of a small oscillating voltage

More information

Scanning Probe Microscopy (SPM)

Scanning Probe Microscopy (SPM) http://ww2.sljus.lu.se/staff/rainer/spm.htm Scanning Probe Microscopy (FYST42 / FAFN30) Scanning Probe Microscopy (SPM) overview & general principles March 23 th, 2018 Jan Knudsen, room K522, jan.knudsen@sljus.lu.se

More information

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes Fabrication of the scanning thermal microscopy (SThM) probes is summarized in Supplementary Fig. 1 and proceeds

More information

Scanning Tunneling Microscopy and its Application

Scanning Tunneling Microscopy and its Application Chunli Bai Scanning Tunneling Microscopy and its Application With 181 Figures SHANGHAI SCIENTIFIC & TECHNICAL PUBLISHERS Jpl Springer Contents 1. Introduction 1 1.1 Advantages of STM Compared with Other

More information

REPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S.

REPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. REPORT ON SCANNING TUNNELING MICROSCOPE Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S. Bobji Submitted by Ankush Kumar Jaiswal (09371) Abhay Nandan (09301) Sunil

More information

Nanotechnology Fabrication Methods.

Nanotechnology Fabrication Methods. Nanotechnology Fabrication Methods. 10 / 05 / 2016 1 Summary: 1.Introduction to Nanotechnology:...3 2.Nanotechnology Fabrication Methods:...5 2.1.Top-down Methods:...7 2.2.Bottom-up Methods:...16 3.Conclusions:...19

More information

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface

More information

Lecture 12: Biomaterials Characterization in Aqueous Environments

Lecture 12: Biomaterials Characterization in Aqueous Environments 3.051J/20.340J 1 Lecture 12: Biomaterials Characterization in Aqueous Environments High vacuum techniques are important tools for characterizing surface composition, but do not yield information on surface

More information

Self-Assembled InAs Quantum Dots on Patterned InP Substrates

Self-Assembled InAs Quantum Dots on Patterned InP Substrates Self-Assembled InAs Quantum Dots on Patterned InP Substrates J. Lefebvre, P.J. Poole, J. Fraser, G.C. Aers, D. Chithrani, and R.L. Williams Institute for Microstructural Sciences, National Research Council

More information

Scanning Tunneling Microscopy Transmission Electron Microscopy

Scanning Tunneling Microscopy Transmission Electron Microscopy Scanning Tunneling Microscopy Transmission Electron Microscopy Speakers Burcu Başar Semih Gezgin Yavuz Selim Telis Place Hacettepe University Department of Chemical Engineering It s a small world after

More information

Scanning Force Microscopy

Scanning Force Microscopy Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data

More information

Scanning Probe Microscopy

Scanning Probe Microscopy 1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced

More information

Surface atoms/molecules of a material act as an interface to its surrounding environment;

Surface atoms/molecules of a material act as an interface to its surrounding environment; 1 Chapter 1 Thesis Overview Surface atoms/molecules of a material act as an interface to its surrounding environment; their properties are often complicated by external adsorbates/species on the surface

More information

Nanoelectronics. Topics

Nanoelectronics. Topics Nanoelectronics Topics Moore s Law Inorganic nanoelectronic devices Resonant tunneling Quantum dots Single electron transistors Motivation for molecular electronics The review article Overview of Nanoelectronic

More information

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used

More information

Morphological evolution of single-crystal ultrathin solid films

Morphological evolution of single-crystal ultrathin solid films Western Kentucky University From the SelectedWorks of Mikhail Khenner March 29, 2010 Morphological evolution of single-crystal ultrathin solid films Mikhail Khenner, Western Kentucky University Available

More information

Fabrication / Synthesis Techniques

Fabrication / Synthesis Techniques Quantum Dots Physical properties Fabrication / Synthesis Techniques Applications Handbook of Nanoscience, Engineering, and Technology Ch.13.3 L. Kouwenhoven and C. Marcus, Physics World, June 1998, p.35

More information

Ecole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools

Ecole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools 1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron

More information

Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York New York Oxford OXFORD UNIVERSITY PRESS 1993 CONTENTS List

More information

Università degli Studi di Bari "Aldo Moro"

Università degli Studi di Bari Aldo Moro Università degli Studi di Bari "Aldo Moro" Table of contents 1. Introduction to Atomic Force Microscopy; 2. Introduction to Raman Spectroscopy; 3. The need for a hybrid technique Raman AFM microscopy;

More information

Chapter 3. Step Structures and Epitaxy on Semiconductor Surfaces

Chapter 3. Step Structures and Epitaxy on Semiconductor Surfaces and Epitaxy on Semiconductor Surfaces Academic and Research Staff Professor Simon G.J. Mochrie, Dr. Ophelia Tsui Graduate Students Seugheon Song, Mirang Yoon 3.1 Introduction Sponsors Joint Services Electronics

More information

Supplementary Information:

Supplementary Information: Supplementary Figures Supplementary Information: a b 1 2 3 0 ΔZ (pm) 66 Supplementary Figure 1. Xe adsorbed on a Cu(111) surface. (a) Scanning tunnelling microscopy (STM) topography of Xe layer adsorbed

More information

Three-Dimensional Silicon-Germanium Nanostructures for Light Emitters and On-Chip Optical. Interconnects

Three-Dimensional Silicon-Germanium Nanostructures for Light Emitters and On-Chip Optical. Interconnects Three-Dimensional Silicon-Germanium Nanostructures for Light Emitters and On-Chip Optical eptember 2011 Interconnects Leonid Tsybeskov Department of Electrical and Computer Engineering New Jersey Institute

More information

Instrumentation and Operation

Instrumentation and Operation Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data

More information

Introduction to Nanotechnology Chapter 5 Carbon Nanostructures Lecture 1

Introduction to Nanotechnology Chapter 5 Carbon Nanostructures Lecture 1 Introduction to Nanotechnology Chapter 5 Carbon Nanostructures Lecture 1 ChiiDong Chen Institute of Physics, Academia Sinica chiidong@phys.sinica.edu.tw 02 27896766 Carbon contains 6 electrons: (1s) 2,

More information

Molecular Dynamics on the Angstrom Scale

Molecular Dynamics on the Angstrom Scale Probing Interface Reactions by STM: Molecular Dynamics on the Angstrom Scale Zhisheng Li Prof. Richard Osgood Laboratory for Light-Surface Interactions, Columbia University Outline Motivation: Why do we

More information

Properties of Individual Nanoparticles

Properties of Individual Nanoparticles TIGP Introduction technology (I) October 15, 2007 Properties of Individual Nanoparticles Clusters 1. Very small -- difficult to image individual nanoparticles. 2. New physical and/or chemical properties

More information

interband transitions in semiconductors M. Fox, Optical Properties of Solids, Oxford Master Series in Condensed Matter Physics

interband transitions in semiconductors M. Fox, Optical Properties of Solids, Oxford Master Series in Condensed Matter Physics interband transitions in semiconductors M. Fox, Optical Properties of Solids, Oxford Master Series in Condensed Matter Physics interband transitions in quantum wells Atomic wavefunction of carriers in

More information

And Manipulation by Scanning Probe Microscope

And Manipulation by Scanning Probe Microscope Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic

More information

Scanning Force Microscopy II

Scanning Force Microscopy II Scanning Force Microscopy II Measurement modes Magnetic force microscopy Artifacts Lars Johansson 1 SFM - Forces Chemical forces (short range) Van der Waals forces Electrostatic forces (long range) Capillary

More information

collisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature

collisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature 1.9. Temperature Dependence of Semiconductor Conductivity Such dependence is one most important in semiconductor. In metals, Conductivity decreases by increasing temperature due to greater frequency of

More information

Epitaxial Growth of Mn on Si(111)

Epitaxial Growth of Mn on Si(111) 105 Chapter 7 Epitaxial Growth of Mn on Si(111) 7.1 Introduction There are a few reports and experiments concerning the adsoption of Mn on Si(111), where film growth with and without a Bi surfactant layer

More information

Introduction to Scanning Probe Microscopy

Introduction to Scanning Probe Microscopy WORKSHOP Nanoscience on the Tip Introduction to Scanning Probe Microscopy Table of Contents: 1 Historic Perspectives... 1 2 Scanning Force Microscopy (SFM)... 2 2.1. Contact Mode... 2 2.2. AC Mode Imaging...

More information

Supplementary Figure 1 Experimental setup for crystal growth. Schematic drawing of the experimental setup for C 8 -BTBT crystal growth.

Supplementary Figure 1 Experimental setup for crystal growth. Schematic drawing of the experimental setup for C 8 -BTBT crystal growth. Supplementary Figure 1 Experimental setup for crystal growth. Schematic drawing of the experimental setup for C 8 -BTBT crystal growth. Supplementary Figure 2 AFM study of the C 8 -BTBT crystal growth

More information

(Scanning Probe Microscopy)

(Scanning Probe Microscopy) (Scanning Probe Microscopy) Ing-Shouh Hwang (ishwang@phys.sinica.edu.tw) Institute of Physics, Academia Sinica, Taipei, Taiwan References 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett.

More information

AFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division

AFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division AFM Imaging In Liquids W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division Imaging Techniques: Scales Proteins 10 nm Bacteria 1μm Red Blood Cell 5μm Human Hair 75μm Si Atom Spacing 0.4nm

More information

Introduction to Scanning Probe Microscopy Zhe Fei

Introduction to Scanning Probe Microscopy Zhe Fei Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force

More information

Experimental methods in physics. Local probe microscopies I

Experimental methods in physics. Local probe microscopies I Experimental methods in physics Local probe microscopies I Scanning tunnelling microscopy (STM) Jean-Marc Bonard Academic year 09-10 1. Scanning Tunneling Microscopy 1.1. Introduction Image of surface

More information

Seminars in Nanosystems - I

Seminars in Nanosystems - I Seminars in Nanosystems - I Winter Semester 2011/2012 Dr. Emanuela Margapoti Emanuela.Margapoti@wsi.tum.de Dr. Gregor Koblmüller Gregor.Koblmueller@wsi.tum.de Seminar Room at ZNN 1 floor Topics of the

More information

Scanning Tunneling Microscopy: theory and examples

Scanning Tunneling Microscopy: theory and examples Scanning Tunneling Microscopy: theory and examples Jan Knudsen The MAX IV laboratory & Division of synchrotron radiation research K5-53 (Sljus) jan.knudsen@sljus.lu.se April 17, 018 http://www.sljus.lu.se/staff/rainer/spm.htm

More information

Optimizing Graphene Morphology on SiC(0001)

Optimizing Graphene Morphology on SiC(0001) Optimizing Graphene Morphology on SiC(0001) James B. Hannon Rudolf M. Tromp Graphene sheets Graphene sheets can be formed into 0D,1D, 2D, and 3D structures Chemically inert Intrinsically high carrier mobility

More information

IMAGING TECHNIQUES IN CONDENSED MATTER PHYSICS SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPES

IMAGING TECHNIQUES IN CONDENSED MATTER PHYSICS SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPES 1 IMAGING TECHNIQUES IN CONDENSED MATTER PHYSICS SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPES 2 WHY THIS TOPIC? STM and AFM images are ubiquitous in condensed matter physics. It is important to understand

More information

Raman spectroscopy of self-assembled InAs quantum dots in wide-bandgap matrices of AlAs and aluminium oxide

Raman spectroscopy of self-assembled InAs quantum dots in wide-bandgap matrices of AlAs and aluminium oxide Mat. Res. Soc. Symp. Proc. Vol. 737 2003 Materials Research Society E13.8.1 Raman spectroscopy of self-assembled InAs quantum dots in wide-bandgap matrices of AlAs and aluminium oxide D. A. Tenne, A. G.

More information

Atomic Force Microscopy (AFM) Part I

Atomic Force Microscopy (AFM) Part I Atomic Force Microscopy (AFM) Part I CHEM-L2000 Eero Kontturi 6 th March 2018 Lectures on AFM Part I Principles and practice Imaging of native materials, including nanocellulose Part II Surface force measurements

More information

From manipulation of the charge state to imaging of individual molecular orbitals and bond formation

From manipulation of the charge state to imaging of individual molecular orbitals and bond formation Scanning Probe Microscopy of Adsorbates on Insulating Films: From manipulation of the charge state to imaging of individual molecular orbitals and bond formation Gerhard Meyer, Jascha Repp, Peter Liljeroth

More information

Probing the Hydrophobic Interaction between Air Bubbles and Partially. Hydrophobic Surfaces Using Atomic Force Microscopy

Probing the Hydrophobic Interaction between Air Bubbles and Partially. Hydrophobic Surfaces Using Atomic Force Microscopy Supporting Information for Probing the Hydrophobic Interaction between Air Bubbles and Partially Hydrophobic Surfaces Using Atomic Force Microscopy Chen Shi, 1 Derek Y.C. Chan, 2.3 Qingxia Liu, 1 Hongbo

More information

DIFFUSION AND GROWTH ON STRAINED SURFACES

DIFFUSION AND GROWTH ON STRAINED SURFACES DIFFUSION AND GROWTH ON STRAINED SURFACES A.C. SCHINDLER AND D.E. WOLF Theoretische Physik, FB 10, Gerhard Mercator Universität Duisburg, 47048 Duisburg, Germany E-mail: A.Schindler@Uni-Duisburg.de Using

More information

X-ray Absorption studies of atomic environments in semiconductor nanostructures

X-ray Absorption studies of atomic environments in semiconductor nanostructures X-ray Absorption studies of atomic environments in semiconductor nanostructures Federico Boscherini and Department of Physics, Italy Introduction Why XAS for nanostructures How XAS for nanostructures Interdiffusion

More information

SUPPLEMENTARY INFORMATION

SUPPLEMENTARY INFORMATION DOI: 10.1038/NCHEM.2491 Experimental Realization of Two-dimensional Boron Sheets Baojie Feng 1, Jin Zhang 1, Qing Zhong 1, Wenbin Li 1, Shuai Li 1, Hui Li 1, Peng Cheng 1, Sheng Meng 1,2, Lan Chen 1 and

More information

Chapter 12. Nanometrology. Oxford University Press All rights reserved.

Chapter 12. Nanometrology. Oxford University Press All rights reserved. Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology

More information

Surface Characte i r i zat on LEED Photoemission Phot Linear optics

Surface Characte i r i zat on LEED Photoemission Phot Linear optics Surface Characterization i LEED Photoemission Linear optics Surface characterization with electrons MPS M.P. Seah, WA W.A. Dench, Surf. Interf. Anal. 1 (1979) 2 LEED low energy electron diffraction De

More information

1.1.6 Island Shapes (see Michely / Krug book, Chapter 3)

1.1.6 Island Shapes (see Michely / Krug book, Chapter 3) 1 1.1.6 Island Shapes (see Michely / Krug book, Chapter 3) The last section was concerned with nucleation, which determines the number density of islands. This section is concerned with their shape. The

More information

Quantum Condensed Matter Physics Lecture 12

Quantum Condensed Matter Physics Lecture 12 Quantum Condensed Matter Physics Lecture 12 David Ritchie QCMP Lent/Easter 2016 http://www.sp.phy.cam.ac.uk/drp2/home 12.1 QCMP Course Contents 1. Classical models for electrons in solids 2. Sommerfeld

More information

3.46 PHOTONIC MATERIALS AND DEVICES Lecture 15: III-V Processing

3.46 PHOTONIC MATERIALS AND DEVICES Lecture 15: III-V Processing 3.46 PHOTONIC MATERIALS AND DEVICES 15: III-V Processing Double Hetero structure laser (band structure engineering) AlGaAs GaAs AlGaAs e - E n hν P h + X n x I d < 1 μm 1. Large refractive index active

More information

Spectromicroscopic investigations of semiconductor quantum dots. Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy.

Spectromicroscopic investigations of semiconductor quantum dots. Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy. Spectromicroscopic investigations of semiconductor quantum dots Stefan Heun, Laboratorio TASC INFM-CNR, Trieste, Italy. Motivation Quantum Dot Applications based on their particular electronic properties

More information

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500

More information