Hartford CT August

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1 IUMAS-6 Program Guide Hartford CT August The 6 th Meeting of the International Union of Microbeam Analysis Societies SAPRC Technical Committee 38

2 IUMAS-6 Program Meeting Guide MAS, The Microanalysis Society ISBN Editors Heather Lowers United States Geological Survey Paul Carpenter Washington University of St. Louis Edward P Vicenzi Smithsonian Institution s Museum Conservation Institute

3 CONTENTS Getting Around... 4 Hotel & City Information... 5 Venues Connecticut Convention Center and Hartford Marriott... 6 Essential Meeting Information... 7 Meetings & Events Schedule... 8 Saturday Workshops Sunday Plenary Schedule Plenary Abstracts Laurie Leshin My Lab is on Mars: Geochemical Adventures with the Mars Curiosity Rover Colin MacRae Multi-spectral Electron Microprobe Now and Future Paul Kotula Advances in Acquisition of Hyperspectral Images Masashi Watanabe Atomic Resolution X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopes: Current Limits and Challenges Toward Quantification David B. Williams H.G.J. Moseley: The Scientist Who Put the Z in ZAF (and KAB) Chan-Gyung Park Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology Joseph I. Goldstein & Charles E. Lyman Robert E Ogilvie: Inventor, MAS Founder, and Educator Gianluigi Botton Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution Birgit Hagenhoff Mass Spectrometry of Surfaces Using Ion Beam: Molecular Mapping of (Bio)Polymers Peta Clode Elemental Analysis of Cells and Tissues Early Career Scholars Sponsors IUMAS-6 August 2-7, 2014 Hartford, CT

4 WELCOME IUMAS Every four years the world microanalysis community comes together through the International Union of Microbeam Analysis Societies (IUMAS) to exchange ideas, to celebrate our progress, to remember our history, and to network with our colleagues. IUMAS is a weakly knit confederation of 8 different microanalytical societies representing five continents. We have members who are in active in geology, materials science, forensic science, pharmaceuticals, semiconductors, failure analysis and a host of other disciplines. We practice a broad range of microanalytical techniques unified by our desire to make quantitative measurements on the micro- and nano-scale. This year, the Microanalysis Society (USA) is graciously hosting the 6th quadrennial IUMAS meeting in Hartford, Connecticut in conjunction with Microscopy and Microanalysis We expect that your participation will make it a roaring success. In our roles as the president and secretary of the IUMAS, we would like to thank the efforts of the IUMAS-6 Organizing Committee, the US Advisory Committee, the International Advisory Committee and the leadership of the member societies who have worked tirelessly to pull this meeting together. We would also like to thank the Microscopy Society of America, the Microanalysis Society, M&M 2014 Chair, David Bell and the executive program committee, in addition to meeting organizers and meeting management for all their assistance in making this meeting a success. We look forward to meeting you in the hallways, in the lecture halls and at the social events. Se Ahn Song President, IUMAS Nicholas Ritchie Secretary/Treasurer, IUMAS IUMAS-6 Organizing Committee Edward P. Vicenzi, Chair Paul Carpenter, Vice Chair Ian M. Anderson, M&M liaison Patrick Camus Dan Kremser Heather Lowers Nicholas W. M. Ritchie Rhonda Stroud Katherine Crispin Karen Privat Yoosuf Picard (ex officio) Smithsonian Institution Washington University EDAX Battelle Memorial Institute U.S. Geological Survey National Institute of Standards and Technology U.S. Naval Research Laboratory Carnegie Institution of Washington University of New South Wales Carnegie Mellon University 3

5 Getting Around The DASH is a FREE Downtown circulator service. Please ask the shuttle driver which stop is best for your desired destination. The circulator route connects the Connecticut Convention Center, XL Center, Front Street District, along with some restaurants, hotels, attractions, meeting venues, and parking areas. Hop on and off at any of the stops marked as a DASH Shuttle Stop. 4 IUMAS-6 August 2-7, 2014 Hartford, CT

6 Getting Around The Society Room 31 Pratt St. (MAS/IUMAS 6 Social) City Steam Brewery Cafe 942 Main St. (unofficial pub of IUMAS 6) Hartford Marriott Connecticut Convention Center Connecticut Conv Cnt 100 Columbus Blvd Marriott Hartford Downtown 200 Columbus Blvd The Society Room 31 Pratt St City Steam Brewery 942 Main St Hilton Hartford Downtown 315 Trumbull St Homewood Suites Downtown 338 Asylum St Holiday Inn Express Downtown 440 Asylum St Radisson Downtown 50 Morgan St Hampton Inn East Hartford 351 Pitkin St Holiday Inn Hartford East 100 E River Dr Residence Inn Downtown 942 Main St Hampton Inn Manchester 1432 Pleasant Valley Rd Hilton Garden Inn North Windsor 555 Corporate Dr

7 Venues Connecticut Convention Center (CCC) Connecticut Convention Center Riverside Rooms 11-16, Level 6 IUMAS-6 Saturday Workshops Sunday plenary session Hartford Marriott (HM) Hartford Marriott Ballroom C IUMAS-6 Saturday evening 5:30 PM Saturday & Sunday lunches Hartford Marriott Capital 1/2 MAS Business Meeting Wednesday 5:15 PM IUMAS-6 Closing Ceremony Thursday 12 PM 6 IUMAS-6 August 2-7, 2014 Hartford, CT

8 Essential Meeting Information The Registration Desk at IUMAS-6 is on the Level 3 outside the Exhibit Hall in the Connecticut Convention Center. Pick up your badge and materials at the Registration desk according to the schedule below. The Sunday Social starts at 6:30 pm at the Connecticut Science Center, next door to the Marriott Hotel. ATTENDEE REGISTRATION HOURS Friday, August 1 7 am 5 pm Saturday, August 2 7 am 6 pm Sunday, August 3 7 am 8 pm SPEAKER/AWARDEE REIMBURSEMENT HOURS: Sunday, August 3 7 am 6 pm Monday, August 4 8 am 6 pm Tuesday, August 5 8 am 5 pm Wednesday, August 6 8 am 5 pm Thursday, August 7 8 am 4 pm Follow us online for up-to-date meeting and tweet using #IUMAS6 International Union of Microbeam Analysis Societies 6 M&M2014 ACCESSIBILITY If you require special accommodation in order to participate fully in the meeting, please ask to speak with the meeting manager, or MeetingManager@ microscopy.org. Requests made after July 1 or onsite at the meeting will be accommodated as much as possible. AWARDS Major Society Awards for MSA, MAS and IUMAS, along with M&M Student Awards, will be presented at the Plenary Session on Monday morning. IMS Awards are presented at the IMS Awards Banquet on Wednesday evening (ticket purchase required). For detailed listings of all awards, criteria, and award winners, please visit MandM/2014/ awards. FOOD FOR PURCHASE Inexpensive, portable breakfast and snack items are available for purchase in the convention center (7:30 am 10:30 am). Lunch concessions are available for purchase inside the exhibit hall during lunch hours (11:00 am 2:00 pm). HARTFORD & REGIONAL VISITOR INFORMATION Stop by the Hartford City booth, to pick up local information, including maps, dining guides and tour info. Located on Level 1 of the Connecticut Convention Center, it s staffed during the meeting and stocked with visitor information on Hartford and surrounding areas. INTERNET & Free wireless internet is available inside the exhibit hall for M&M attendees in the Connecticut Convention Center. Check your and surf the web at the Internet Café inside the M&M exhibit hall during exhibit hours (located next to the MSA MegaBooth). For more information on the MegaBooth, go to page 23. MSA MEGABOOTH [BOOTH # 1228] See complete details on Page 23. Check out all that MSA has to offer its members and M&M attendees: Free Internet Café, book display from scientific publishers, updated information on the Certification Board, and a DVD Library. Register for the popular Vendor Tutorials, sign up for MSA Membership, check out recent editions of Microscopy Today, learn about Project MICRO, and join the Technologists Forum. PHONE NUMBERS & INFORMATION Connecticut Convention Center Main: Connecticut Convention Center Exhibitor Services: exhibitors/ order-services/ Urgent Care Concentra Urgent Care East Hartford (2 Miles from Conv Ctr): PROCEEDINGS Conference Proceedings are distributed at Registration. All Full Meeting registrations include a free copy of the proceedings on DVD. Hard-copy proceedings are available for purchase through Cambridge University Press (allow several weeks for delivery). Inquire at the Registration Desk or log onto: MandM/2014/program/index.cfm. SOCIETY BOOTHS MAS, IMS and MSC-SMC each have a membership and information booth located in the main registration foyer on the exhibit hall level. Sign up for membership, get information on Society events at or after the M&M Meeting, and find out all that the societies have to offer. SMOKING POLICY M&M 2014 is a smoke-free meeting. If you wish to smoke, you will need to go to designated outdoor areas. VOLUNTEER ROOM The volunteer & student bursary office is in Show Office B on the exhibit hall level (Hall B side). Check in here for volunteer assignments and sign-outs. Need to unwind? Look for fellow IUMAS-6 attendees at City Steam Brewery, the unofficial hangout of microanalysts in Hartford. 942 Main St, Hartford CT (T)

9 FRIDAY, AUGUST 1, 2014 Meetings & Events Schedule 9 AM MAS Council HM - Capital 1 SATURDAY, AUGUST 2, :30 AM - 10 AM IUMAS-6 Morning Workshops CCC - Rooms AM - 10:30 AM Break 10:30 AM - 12 PM IUMAS-6 Morning Workshops CCC - Rooms PM - 1:30 PM IUMAS-6 Luncheon & Vendor Presentation CCC - Ballroom C 1:30 PM - 3 PM IUMAS-6 Afternoon Workshops CCC - Rooms PM - 3:30 PM Break 3:30 PM - 5 PM IUMAS-6 Afternoon Workshops CCC - Rooms :30 PM - 7 PM IUMAS-6 Opening Reception CCC - Ballroom C SUNDAY, AUGUST 3, :30 AM - 5 PM IUMAS-6 Plenary CCC - Rooms Break 10 AM - 10:30 AM IUMAS-6 Luncheon & Vendor Presentation 12:30P 1:30 PM CCC - Ballroom C Break 3:30 PM - 4 PM 6:30 PM M&M 2014 Sunday Evening Social Event Connecticut Science Center MONDAY, AUGUST 4, :30 AM - 12 PM Opening Welcome CCC - Ballroom AB M&M Plenary, "How Cutting-Edge Atomic Resolution Microscopy Can Help to Solve Some of the World's Energy Problems" by Colin Humphreys MAS Awards IUMAS Awards M&M Meeting Awards M&M Plenary, "Living Images from the Birth of Microscopy" by Brian J. Ford 12 PM - 1:30 PM Lunch Break 12 PM - 5:30 PM Exhibit Hall Open CCC - Exhibit Hall 12:15 PM MAS Meal with a Mentor HM - Capital 1-2 1:30 PM - 3 PM Monday P.M. Symposia & Sessions A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope CCC Room 24 A04 - Electron Holography at the Atomic Scale and the Nanoscale HM Ballroom B A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A16 - Correlative Microscopy and Microanalysis from Macro to Pico CCC Room 21 A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC Room 12 A18 - Vendor Symposium: New Tools for Life and Materials Sciences CCC Room 25 B02 - Microbes and Microbial Communities CCC Room 17 B06 - Microanalysis of Biological Materials CCC Room 23 B08 - Optical, Confocal and Fluorescence Imaging CCC Room 27 P02 - Advances in In-situ Microscopy HM Ballroom C P03 - Mineral Analyses from Laboratory to Spacecraft CCC Room 11 P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges CCC Room 16 P08 - Imaging and Analysis of Cultural Heritage Materials CCC Room 26 X52 - Bio Science Tutorial: Super Resolution: What Technique Should I Use? CCC Room 13 8 IUMAS-6 August 2-7, 2014 Hartford, CT

10 Meetings & Events Schedule MONDAY, AUGUST 4, PM - 5 PM Monday Poster Presentations CCC - Exhibit Hall A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope A04 - Electron Holography at the Atomic Scale and the Nanoscale A07 - Microscopy and Spectroscopy for Power Generation and Storage A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry A18 - Vendor Symposium: New Tools for Life and Materials Sciences A19 - Facilities B01 - Dr. Simon T. Gerard Memorial Symposium on Anatomic Pathology B02 - Microbes and Microbial Communities B06 - Microanalysis of Biological Materials L01 - Post-Deadline Poster Session P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges P08 - Imaging and Analysis of Cultural Heritage Materials 5:30 PM Student Mixer HM - Capital 1-2 TUESDAY, AUGUST 5, :30 AM - 10 AM Tuesday A.M. Symposia & Sessions Locations: A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope CCC Room 24 A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A04 - Electron Holography at the Atomic Scale and the Nanoscale HM Ballroom B A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A15 - Cs-Correctors: Current State and Ongoing Developments CCC Room 22 A16 - Correlative Microscopy and Microanalysis from Macro to Pico CCC Room 21 A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC Room 12 A18 - Vendor Symposium: New Tools for Life and Materials Sciences CCC Room 25 B01 - Dr. Simon T. Gerard Memorial Symposium on Anatomic Pathology CCC Room 27 B02 - Microbes and Microbial Communities CCC Room 17 B06 - Microanalysis of Biological Materials P02 - Advances in In-situ Microscopy TBD HM Ballroom C P03 - Mineral Analyses from Laboratory to Spacecraft CCC Room 11 P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges CCC Room 16 P08 - Imaging and Analysis of Cultural Heritage Materials CCC Room 26 P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems X40 - Physical Sciences Tutorial: STEM_CELL: (S)TEM Software for Supercell Manipulation and Image Analysis X90 - Microscopy Outreach Microscopy in the Classroom HM Ballroom D CCC Room 13 HM Ballroom E 9

11 Meetings & Events Schedule 10:30 AM - 12 PM Tuesday A.M. Symposia & Sessions Locations: A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope CCC Room 24 A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A04 - Electron Holography at the Atomic Scale and the Nanoscale HM Ballroom B A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A12-3D Imaging and Microanalysis: Image Analysis and Applications CCC Room 17 A15 - Cs-Correctors: Current State and Ongoing Developments CCC Room 22 A16 - Correlative Microscopy and Microanalysis from Macro to Pico CCC Room 21 A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC Room 12 A18 - Vendor Symposium: New Tools for Life and Materials Sciences CCC Room 25 B01 - Dr. Simon T. Gerard Memorial Symposium on Anatomic Pathology CCC Room 27 B06 - Microanalysis of Biological Materials P02 - Advances in In-situ Microscopy TBD HM Ballroom C P03 - Mineral Analyses from Laboratory to Spacecraft CCC Room 11 P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges CCC Room 16 P08 - Imaging and Analysis of Cultural Heritage Materials CCC Room 26 P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems X41 - PHYSICAL SCIENCES TUTORIAL: Imaging of Magnetic Structures in Scanning and Conventional TEM X90 - Microscopy Outreach Microscopy in the Classroom HM Ballroom D CCC Room 13 HM Ballroom E 12 PM - 1:30 PM Lunch Break 1:30 PM - 3 PM Tuesday P.M. Symposia & Sessions Locations: A01 - Oliver Wells Memorial Symposium on the Scanning Electron Microscope CCC Room 24 A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A12-3D Imaging and Microanalysis: Image Analysis and Applications CCC Room 17 A15 - Cs-Correctors: Current State and Ongoing Developments CCC Room 22 A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC Room 12 A18 - Vendor Symposium: New Tools for Life and Materials Sciences CCC Room 25 B03 - Nuclear Architecture and Chromatin Structure: 40 Years after the Nucleosome CCC Room 27 B05 - Structural Biology and Ultrastructure CCC Room 21 B07 - Light Sheet and Multi-Photon Imaging CCC Room 23 P02 - Advances in In-situ Microscopy HM Ballroom C P03 - Mineral Analyses from Laboratory to Spacecraft CCC Room 11 P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges CCC Room 16 P07 - Microscopy and Characterization of Ceramics, Polymers and Composites HM Ballroom A P08 - Imaging and Analysis of Cultural Heritage Materials CCC Room 26 P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems X92 - Microscopy Outreach: Project MICRO 10 IUMAS-6 August 2-7, 2014 Hartford, CT HM Ballroom D HM Ballroom E

12 Meetings & Events Schedule 3 PM - 5 PM Tuesday Poster Presentations CCC Exhibit Hall A02 - Advances in Imaging and Spectroscopy in STEM A12-3D Imaging and Microanalysis: Image Analysis and Applications A15 - Cs-Correctors: Current State and Ongoing Developments A16 - Correlative Microscopy and Microanalysis from Macro to Pico A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry B03 - Nuclear Architecture and Chromatin Structure: 40 Years after the Nucleosome B07 - Light Sheet and Multi-Photon Imaging B08 - Optical Topics P02 - Advances in In-situ Microscopy P03 - Mineral Analyses from Laboratory to Spacecraft P06 - Failure Analysis of Structural Materials: Microscopy, Metallography & Fractography P07 - Microscopy and Characterization of Ceramics, Polymers and Composites X90 - Microscopy Outreach Microscopy in the Classroom 5:15 PM IUMAS council Meeting HM - Capital 2 6:30 PM Presidents' Reception (invitation only) Offsite WEDNESDAY, AUGUST 6, :30 AM - 10 AM Wednesday A.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A06 - Super Resolution Microscopic Methods CCC Room 11 A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A09 - Frontiers in Analytical TEM-STEM CCC Room 22 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A12-3D Imaging and Microanalysis: Image Analysis and Applications CCC Room 17 A13 - Revealing and Characterizing the Microstructures of Metals and Other Engineered Materials HM Ballroom B A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC Room 12 B05 - Structural Biology and Ultrastructure CCC Room 21 B10 - Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences CCC Room 23 P02 - Advances in In-situ Microscopy P04 - Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges P05 - Microanalysis of Irradiated Materials: Preparation, Instrumental Development and Analysis P06 - Failure Analysis of Structural Materials: Microscopy, Metallography & Fractography P07 - Microscopy and Characterization of Ceramics, Polymers and Composites HM Ballroom C CCC Room 16 CCC Room 25 CCC Room 26 HM Ballroom A P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems X30 - Technologists Forum Special Topics: Technical Approaches to Wide Field Fluorescence and Laser Scanning Confocal Microscopy HM Ballroom D CCC Room 27 X50 - Biological Sciences Tutorial: Filling the Missing Wedge CCC Room

13 Wednesday continued Meetings & Events Schedule 10 AM - 10:30 AM Coffee Break - Exhibit Hall Open CCC - Exhibit Hall 10:30 AM - 12 PM Wednesday A.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A06 - Super Resolution Microscopic Methods CCC Room 11 A07 - Microscopy and Spectroscopy for Power Generation and Storage CCC Room 15 A09 - Frontiers in Analytical TEM-STEM CCC Room 22 A10 - X-ray Imaging CCC Room 12 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A12-3D Imaging and Microanalysis: Image Analysis and Applications CCC Room 17 B05 - Structural Biology and Ultrastructure CCC Room 21 B09 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals CCC Room 16 B10 - Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences CCC Room 23 P02 - Advances in In-situ Microscopy P05 - Microanalysis of Irradiated Materials: Preparation, Instrumental Development and Analysis P06 - Failure Analysis of Structural Materials: Microscopy, Metallography & Fractography P07 - Microscopy and Characterization of Ceramics, Polymers and Composites HM Ballroom C CCC Room 25 CCC Room 26 HM Ballroom A P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems X30 - Technologists Forum Special Topics: Technical Approaches to Wide Field Fluorescence and Laser Scanning Confocal Microscopy X51 - Biological Sciences Tutorial: Getting the Most from your Direct Detection (DD) Camera for Low-Dose TEM X91 - Microscopy Outreach It s A Family Affair! HM Ballroom D CCC Room 27 CCC Room 13 HM Ballroom E 12 PM - 1:30 PM Lunch Break 12:15 PM MAS - ANSI Meeting HM - Capital 2 12:15 PM MAS Affiliated Regional Societies HM - Capital 1 1:30 PM - 3 PM Wednesday P.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A03 - TEM Phase Contrast Imaging in Biological and Materials Science CCC Room 23 A05-15 Years of Focused Ion Beams at M&M CCC Room 17 A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices CCC Room 15 A09 - Frontiers in Analytical TEM-STEM CCC Room 22 A10 - X-ray Imaging CCC Room 12 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A12-3D Imaging and Microanalysis: Image Analysis and Applications CCC Room 17 A13 - Revealing and Characterizing the Microstructures of Metals and Other Engineered Materials HM Ballroom B A17 - Extended Crystal Defects: Quantifications of Strain, Local Atomic Structure and Chemistry CCC - Room 12 B05 - Structural Biology and Ultrastructure CCC Room 21 B09 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals CCC Room 16 P01 - Analytical Techniques and Their Application for the Study of Deformed Microstructures CCC Room IUMAS-6 August 2-7, 2014 Hartford, CT

14 Meetings & Events Schedule WEDNESDAY, AUGUST 6, 2015 P02 - Advances in In-situ Microscopy P05 - Microanalysis of Irradiated Materials: Preparation, Instrumental Development and Analysis P06 - Failure Analysis of Structural Materials: Microscopy, Metallography & Fractography P07 - Microscopy and Characterization of Ceramics, Polymers and Composites P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems HM Ballroom C CCC Room 25 CCC Room 26 HM Ballroom A HM Ballroom D X31 - Technologists Forum Roundtable Discussion: Doing Great Science on a Tight Budget CCC Room 27 3 PM - 5 PM Wednesday Poster Presentations CCC - Exhibit Hall A02 - Advances in Imaging and Spectroscopy in STEM A06 - Super Resolution Microscopic Methods A07 - Microscopy and Spectroscopy for Power Generation and Storage A09 - Frontiers in Analytical TEM-STEM A11 - Frontiers of Electron-Probe Microanalysis A12 - Atom Probe Tomography In Correlative Investigations A13 - Microscopy and Microanalysis for Real World Problem Solving B05 - Structural Biology and Ultrastructure B09 - Diseases Topical Session B10 - Pharma Topical Session P02 - Advances in In-situ Microscopy P05 - Microanalysis of Irradiated Materials: Preparation, Instrumental Development and Analysis P07 - Microscopy and Characterization of Ceramics, Polymers and Composites 5:15 PM MAS Business Meeting HM - Capital PM MAS/IUMAS-6 Social See MAS Booth for Details THURSDAY, AUGUST 7, :30 AM - 10 AM Thursday A.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A03 - TEM Phase Contrast Imaging in Biological and Materials Science CCC Room 23 A05-15 Years of Focused Ion Beams at M&M CCC Room 17 A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices CCC Room 15 A09 - Frontiers in Analytical TEM-STEM CCC Room 22 A10 - X-ray Imaging CCC Room 12 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A13 - Revealing and Characterizing the Microstructures of Metals and Other Engineered Materials HM Ballroom B A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis CCC Room 16 B04 - Advances in Sample Preparation for Cryo-EM Studies CCC Room 25 P01 - Analytical Techniques and Their Application for the Study of Deformed Microstructures P02 - Advances in In-situ Microscopy CCC Room 11 HM Ballroom C 13

15 Thursday continued Meetings & Events Schedule P07 - Microscopy and Characterization of Ceramics, Polymers and Composites HM Ballroom A P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems 14 IUMAS-6 August 2-7, 2014 Hartford, CT HM Ballroom D 10 AM - 12 PM Coffee Break & Thursday Poster Presentations CCC - Exhibit Hall A02 - Advances in Imaging and Spectroscopy in STEM A03 - TEM Phase Contrast Imaging in Biological and Materials Science A05-15 Years of Focused Ion Beams at M&M A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices A10 - X-ray Imaging A11 - Frontiers of Electron-Probe Microanalysis A13 - Revealing and Characterizing the Microstructures of Metals and Other Engineered Materials A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis B04 - Advances in Sample Preparation for Cryo-EM Studies P01 - Analytical Techniques and Their Application for the Study of Deformed Microstructures P02 - Advances in In-situ Microscopy P09 - Surface and Subsurface Microscopy and Microanalysis in Materials and Biological Systems 12 PM - 12:30 PM IUMAS-6 Closing Ceremonies HM Capital PM - 1:30 PM Lunch Break 1:30 PM - 3 PM Thursday P.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A03 - TEM Phase Contrast Imaging in Biological and Materials Science CCC Room 23 A05-15 Years of Focused Ion Beams at M&M CCC Room 17 A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices CCC Room 15 A09 - Frontiers in Analytical TEM-STEM CCC Room 22 A10 - X-ray Imaging CCC Room 12 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A13 - Revealing and Characterizing the Microstructures of Metals and Other Engineered Materials HM Ballroom B A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis CCC Room 16 B04 - Advances in Sample Preparation for Cryo-EM Studies CCC Room 25 B09 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals P01 - Analytical Techniques and Their Application for the Study of Deformed Microstructures P02 - Advances in In-situ Microscopy CCC Room 16 CCC Room 11 HM Ballroom C 3 PM - 3:30 PM Coffee Break 3:30 PM - 5 PM Thursday P.M. Symposia & Sessions Locations: A02 - Advances in Imaging and Spectroscopy in STEM CCC Room 14 A03 - TEM Phase Contrast Imaging in Biological and Materials Science CCC Room 23 A05-15 Years of Focused Ion Beams at M&M CCC Room 17 A08 - Nano-Characterization of Emerging Photovoltaic Materials and Devices CCC Room 15 A11 - Frontiers of Electron-Probe Microanalysis CCC Room 24 A14 - Advances in Cathodoluminescence and Soft X-ray Microanalysis CCC Room 16 B04 - Advances in Sample Preparation for Cryo-EM Studies CCC Room 25 P02 - Advances in In-situ Microscopy HM Ballroom C

16 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 11 Advanced Electron Probe Microanalysis Paul K. Carpenter, Washington University in St. Louis, USA Silvia Richter, Aachen University, Germany The Advanced EPMA workshop will provide a summary of the technique of electron-probe microanalysis in a manner appropriate for both beginners and experts. The first half of the workshop will cover a refresher of the technique but will emphasize the advantages and critical roadblocks that exist. Topics will be presented in an expandable outline fashion with anticipation of returning to selected topics during the second half where group discussion and problem solving will enable attendees to ask questions or provide answers. The specific topics covered will include: Summary of EPMA technique Sample preparation Microanalysis standards Microprobe instrumentation (hardware, software) Roles of EDS and WDS WDS measurement (procedure, pulse processing, background issues and methods) Quantitative analysis (correction algorithms, mass absorption coefficients, accuracy) Challenging materials: light element, trace element, beam sensitive Non-traditional samples (thin film, particles, rough surfaces) Software tools for the microanalyst Example problems to be provided with workshop materials 15

17 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 12 Atom Probe Tomography Thomas F. Kelly, Cameca Instruments, USA François Vurpillot, Université de Rouen, France This workshop will provide a summary of the state of the art of Atom Probe Tomography appropriate to beginners and experts. It will be divided into two sessions: Fundamentals and Applications. Fundamentals of atom probe tomography Physical principles of Atom Probe Tomography Basics of field emission, field evaporation, field ionization and post ionization Image projection and image reconstruction Time of flight mass spectroscopy Atom Probe instrumentation Open discussion and problem solving encouraging participants to ask about specific materials challenges in specimen preparation, image reconstruction, or data analysis. Applications of Atom Probe Tomography Specimen preparation Composition measurement, data representation, data analysis, data mining, software Correlation of APT with other characterization techniques Future directions of APT Frontier materials applications Open discussion and problem solving encouraging participants to ask about specific materials and applications. Time permitting, there will be a short demo of data processing and visualization tools. 16 IUMAS-6 August 2-7, 2014 Hartford, CT

18 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 13 Electron Backscatter Diffraction Joseph R. Michael, Sandia National Laboratories, USA Mark Vaudin, NIST Electron backscatter diffraction and transmission Kikuchi diffraction are now established techniques that allow various aspects of crystallography to be determined. This workshop will attempt to provide some background on EBSD with discussions of advanced techniques and applications and will address the current areas of research in EBSD including transmission Kikuchi diffraction and strain measurement. These sessions are intended to be interactive and attendees are encouraged to bring interesting issues in EBSD to the Workshop to be discussed. Joe Michael - Sandia National Laboratories The technique of EBSD will be briefly introduced at an introductory level. Data interpretation and presentation 3D EBSD data collection and display Transmission Kikuchi diffraction (TKD) Mark Vaudin - National Institute of Standards and Technology The presentation will start by describing how elastic strain is measured using high-resolution electron backscattered diffraction (HR-EBSD). The theory, methodology and use of cross-correlation to analyze diffraction patterns from strained samples will be covered. The need for standards - artifacts with known and certified strains that are designed to be measured in an SEM/EBSD system - will be stressed; NIST is close to releasing a standard of this type that uses a strained epitaxial thin film of Si1-xGex on a Si substrate. Applications of the HR-EBSD strain measurement method will be presented including 1) strain behavior in domains in BaTiO3 and 2) strain in Si indented with a wedge indenter. 17

19 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 14 Electron and X-ray Spectroscopies in the TEM/STEM Nestor J. Zaluzec, Argonne National Laboratory, USA X-ray Energy Dispersive Spectroscopy Brief Review of X-ray Generation Instrumentation - X-ray Detectors SiLi/SDD/Microcalorimeters/WDS The Microscope/Detector System Interfacing and Geometries in the AEM Optimizing Conditions Data Analysis/Spectral Processing Quantification Thin Film Methods Standardless Standards Absorption Corrections Fluorescence Corrections Electron Energy Loss Spectroscopy Brief Review of Electron Loss Processes Electron Scattering Distributions Instrumentation - Electron spectrometers Basic Principles Electrostatic/Electromagnetic Serial/Parallel Detector Systems Spectral Artifacts The Microscope/Detector System Interfacing and Geometries in the AEM Optimizing Conditions Data Analysis/Spectral Processing Quantification Thin Film Methods Standardless Standards Multiple Scattering Corrections NES/NEXAFS Information Additional Topics & Open Discussion Session Specimen Damage Channeling Effects Mapping vs. Hyperspectral Imaging Open Discussion 18 IUMAS-6 August 2-7, 2014 Hartford, CT

20 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 15 He/Ne Ion Microscopy and Microanalysis David C. Joy, University of Tennessee and Oak Ridge National Laboratory, USA John Notte, Zeiss Microscopy Introduction Class roster and sign in, Introductions, format of this tutorial, break schedule, handouts Technology of the HIM - The GFIS Source History of the GFIS Source GFIS Performance Characteristics Technology of the HIM The rest of it The GFIS Column Vacuum System Cryogenic Cooling Detectors Sample Interaction and Image Formation Image formation principles Ion beam penetration, dislocation, implantation Charging and neutralization Applications in Imaging Imaging with high resolution Imaging with surface information Imaging insulating samples Applications in NanoFabrication Nanopores, Plasmonic Devices, and other applications Lithography Beam Induced Chemistry: deposition and etching Analysis with the Helium and Neon Ion Microscope Backscattered Helium SIMS EDS References and Resource Information including books, articles, and online resources 19

21 Morning Workshops Saturday, August 2, :30 AM - 12 PM Connecticut Convention Center, Room 16 Quantitative X-ray Microanalysis by XEDS Dale E. Newbury, National Institute of Standards and Technology, USA Replacing EPMA/WDS for quantifying major (C > 0.1), minor (0.01 C 0.1), and trace (500 ppm C <0.01) constituents, even when severe peak overlap occurs Silicon drift detector energy dispersive spectrometry (SDD-EDS): critical performance parameters Measurement science basis for quantitative EDS: what we must learn from EPMA/WDS Sample preparation: effect of surface roughness Electron dose measurement Implementing the Castaing k-ratio protocol for SDD-EDS analyses Designing measurement protocols for accuracy and precision NIST DTSA-II for EDS spectrum processing Multiple linear least squares peak fitting Matrix correction factors The components of a complete error budget: k-ratio measurement statistics and uncertainty in matrix correction factors (for the first time in the 63 year history of x-ray microanalysis) Measuring the spectrum intensity: SDD-EDS vs. WDS k-ratios of Ba-Ti minerals and glasses Examples of SDD-EDS quantitative analysis with strong interferences: PbS; BaTiO 3 ; WSi 2 ; SrWO 4 SDD-EDS quantitative analysis of minor and trace constituents with strong interferences from major constituents SDD-EDS quantitative analysis of carbides, nitrides, oxides, and fluorides NIST DTSA-II Monte Carlo modeling tools for spectrum simulation to support analytical strategy 20 IUMAS-6 August 2-7, 2014 Hartford, CT

22 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Room 11 Trace Element Microanalysis by Laser Ablation ICP-MS Alan Koenig, U.S. Geological Survey, USA Fundamentals of LA-ICP-MS About the ICP-MS and laser ablation system: How and why of the ICP-MS as it pertains to direct solid elemental or isotopic analyses Type of instruments and lasers The analysis of samples and how it works along the way to a number The ablation process The ionization and detection process of the ICP-MS How we try to calibrate and how that can influence our data The right tool for the right job? A look at what tool to use when and why? Open discussion about what we know and don t know about the fundamentals of LA-ICP-MS Applications of LA-ICP-MS A potpourri of applications and overview of things we can do Detailed discussion of a few application examples from start to finish An integrated look at incorporation of multiple microanalytical techniques with LA-ICP-MS Future directions of LA-ICP-MS Open discussion about applications, including things that work and things that don t (yet) work. The course will be peppered with real life examples that outline the possibilities and practical limitations of LA-ICP-MS. The course is intended for both those interested in learning more about the technique as well as those already with experience with the technique. An emphasis will be placed in the course on how LA-ICP-MS, like all microanalytical techniques, is complimentary with the other tools of microanalysis. 21

23 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Room 12 Focused Ion Beam Microscopy and Microanalysis Lucille A. Giannuzzi, L.A. Giannuzzi and Associates, USA Keana Scott, National Institute of Standards and Technology, USA S/TEM and atom probe specimen preparation Strategies for TEM specimen preparation without lift out -pre-thinning -shadow technique -direct mounting of fibers -fold-out method -cryo methods Conventional ex situ lift out -techniques for manipulation of electron transparent specimens -manipulation of particles -lift out for MEMS carriers In situ Lift Out -techniques for manipulation of specimens -lift out for S/TEM tomography and atom probe specimens EXpressLO Grids and Methods -lift out of thick specimens -manipulation for backside milling Low Energy Polishing Open discussion and problem solving encouraging participants to ask about specific materials and geometries. Time permitting there will be a short demo of SRIM Monte Carlo software to illustrate and correlate techniques and methods with ion-solid interactions. Introduction to 3D FIB tomography Basic FIB tomography procedures -specimen preparation -instrument dependent variations -experimental considerations and limitations Cryo FIB tomography -specimen preparation -basic procedures -limitations 3D microanalysis -EDS/EBSD -other analytical options 3D data processing and visualization -basic processing steps -3D analysis tools Open discussion and problem solving encouraging participants to ask about specific material and applications. Time permitting, there will be a short demo of data processing 22 IUMAS-6 August 2-7, 2014 Hartford, CT

24 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Rooms 13 Microanalysis in the Variable Pressure SEM Brendan J. Griffin, The University of Western Australia The workshop is intended to be interactive throughout. Registrants are invited and welcome to submit problems/questions/questionable data to me (brendan.griffin@uwa.edu.au ) prior to the workshop, for discussion within it. Bring laptops or pads. The VP environment Core factors for x-ray generation by electron beams Current x-ray detection capabilities Gas scattering and x-ray resolution Spatial resolution within the sample practical Monte Carlo modelling Scattering parameters Spatial resolution above the sample practical Monte Carlo modelling Minimisation techniques & gadgets Charging the reality The gas cascade/amplification process Practical Monte Carlo modelling Negative charging electron implantation measuring the Duane-Hunt limit Positive space charge effects Minimisation techniques & gadgets X-ray microanalysis in practice Qualitative & quantitative procedures and protocols charge balance variable pressure extrapolation Standards: relevance & dimensions Best practice rough samples errors and accuracy 23

25 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Room 14 Scanning Probe Microscopy Phillip E. Russell, Appalachian State University, USA John Thornton, Bruker Nano The Scanning Probe Microscopy workshop will provide a summary of the techniques of STM (Scanning Tunneling Microscopy) and AFM (Atomic Force Microscopy) in a manner appropriate from beginners to experts. While the STM and AFM techniques offer high spatial resolution in some cases down to the atomic scale and three dimensional mapping of surface topography, there still remain issues related to quantitative interpretation of scanned probe data, particularly in the advanced modes, such as phase contrast imaging modes. In this workshop, the various modes of force microscopy will be introduced, along with applications examples. In developments and understanding of tip sample interaction, new techniques have emerged which allow us to use the scanned probe microscope to measure properties such as local adhesion and local elastic and plastic deformation of samples. The specific topics covered will include: Summary and General Principles of Scanning Probe Microscopy technique STM Modes: Vacuum Air AFM Modes: Contact Tapping MFM Tips and Cantilevers (STM vs. AFM) Feedback Control System Image Processing Limitations of SPM Instruments Applications The workshop will conclude with a discussion of the future of scanned probe microscopy. 24 IUMAS-6 August 2-7, 2014 Hartford, CT

26 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Room 15 Spectral Imaging and Analysis Nicholas C. Wilson, CSIRO-Minerals, Australia Paul G. Kotula, Sandia National Laboratories, USA Spectral imaging is a technique that is applied across a wide range of analytical methods and material systems, with a number of different analysis methods employed to extract information from the collected data sets. This workshop will cover strategies for both the collection and analysis of spectral image data sets, with the content being both accessible to beginners and of interest to experts. The workshop will begin with a series of lectures covering: Spectral imaging instrumentation and data collection strategies, with examples from spectral EDS, EBSD, high resolution soft x-ray, and cathodoluminescence. Spectral file formats and interchange of data between collection and analysis systems Software tools and theories for data analysis covering principal component analysis (PCA) and cluster analysis The second part of the workshop will take the form of data analysis software demonstrations and group discussions. Attendees are invited to submit data sets of interest for analysis prior to the workshop, with the analysed results presented in the discussion component of the workshop. 25

27 Afternoon Workshops Saturday, August 2, :30 PM - 5 PM Connecticut Convention Center, Room 16 X-ray Spectral Processing and Simulation Nicholas W. M. Ritchie, National Institute of Standards and Technology, USA Xavier Llovet, Universitat de Barcelona, Spain The X-ray Spectral Processing and Simulation workshop will discuss how freely available spectrum simulation and spectrum analysis tools, like PENELOPE and NIST DTSA-II, can be used to address real-world x-ray microanalysis challenges. Real-world samples are rarely the idealized ones discussed in the text books and for which we have analytical models. Yet somehow, we need to learn how to deal with them. Spectrum simulation, particularly Monte Carlo simulations, is the sharpest tool in the toolbox. Challenges like coated fibers, layered particles, inclusions of unknown depth and thin films are readily simulated by Monte Carlo models. However, simulating real-world samples is only the first step. We also need to be able to interpret our measured spectra based on insights from the simulations. Having tools, like DTSA-II which treat measured and simulated spectra equivalently, facilitates the process. Monte Carlo simulation led by Xavier Llovet X-ray spectral simulation as a tool for optimization EPMA measurements Basic concepts of Monte Carlo simulation. Interaction models for the simulation of X-ray spectra by electron impact. Accuracy of Monte Carlo simulation. Comparison with experimental data. Examples of simulation of EPMA measurements: spatial resolution, particles/inclusions, secondary fluorescence, etc. Combining Monte Carlo simulation with spectrum processing led by Nicholas W. M. Ritchie Worked example: Simulating and quantifying the measurement of a bulk material Practical differences between simulated experiments and real experiments Worked example: Using simulation to interpret multi-kv measurements on thin-films Worked example: Using simulation to understand particle spectra Discussion Hosted by Nicholas W. M. Ritchie & Xavier Llovet The floor will be opened to permit participants to ask questions and to discuss real-world problems. 26 IUMAS-6 August 2-7, 2014 Hartford, CT

28 Plenary Schedule SUNDAY, AUGUST 3, 2014 Connecticut Convention Center Room :45 AM Introduction and remarks Edward P. Vicenzi, Chair IUMAS-6 9:00 AM Keynote Address My Lab is on Mars: Geochemical Adventures with the Mars Curiosity Rover Laurie A. Leshin, Office of the President, Worcester Polytechnic Institute, USA 10:00 AM BREAK 10:30 AM Multi-spectral Electron Microprobe- Now and Future Colin M. MacRae, CSIRO-Minerals, Australia 11:10 AM Advances in Acquisition of Hyperspectral Images Paul G. Kotula, Sandia National Laboratories, USA 11:50 AM Atomic Resolution X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopes: Current Limits and Challenges toward Quantification Masashi Watanabe, Lehigh University, USA 12:30 PM Lunch (Vendor presentations) 1:30 PM H.G.J. Moseley: The Scientist Who Put the Z in ZAF (and KAB) David B Williams, The Ohio State University, USA 1:50 PM Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology Chan-Gyung Park, Pohang University of Science and Technology, Korea 2:30 PM Robert E Ogilvie: Inventor, MAS Founder, and Educator Joseph I Goldstein, University of Massachusetts, USA Charles E. Lyman, Lehigh University, USA 2:50 PM Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution Gianluigi Botton, McMaster University, Canada 3:30 PM BREAK 4:00 PM Mass Spectrometry of Surfaces Using Ion Beam: Molecular Mapping of (Bio) Polymers Birgit Hagenhoff, tascon GmbH, Germany 4:40 PM Elemental Analysis of Cells and Tissues Peta L. Clode, The University of Western Australia 27

29 Plenary Abstracts SUNDAY KEYNOTE PRESENTATION 8:45 AM Connecticut Convention Center, Room IUMAS-6 August 2-7, 2014 Hartford, CT Professor Laurie A. Leshin Office of the President, Worcester Polytechnic Institute, USA Professor Laurie Leshin is a leader in the field of cosmochemistry, with primary research interests in deciphering the record of water in objects within our solar system. Prior to her appointment as President of WPI, Prof. Leshin served as the Dean of the School of Science at Rensselaer Polytechnic Institute and the Deputy Director for Science and Technology at the NASA Goddard Space Flight Center. She is an active member of NASA s current mission, the Mars Science Laboratory. In her talk, she will share her unique perspective regarding the findings of the Mars Curiosity Rover. My Lab is on Mars: Geochemical Adventures with the Mars Curiosity Rover Since its dramatic and successful landing on August 5, 2012, Mars Curiosity has been exploring Gale Crater seeking evidence that this site hosted a habitable environment in the martian past. The payload aboard Curiosity (Fig. 1) includes both advanced imagers and diverse geochemical and mineralogical instruments tailored to achieve the mission goals: Cameras Mast Camera (Mastcam) is the main science imager with high-resolution stereo and color capability, spectral filters, and ability to capture high definition video. Mars Hand Lens Imager (MAHLI) is Curiosity s hand lens, and is mounted on the end of the arm. It takes extreme close-up pictures of rocks and soil revealing details at better than 20µm per pixel. Mars Descent Imager (MARDI) is a color descent imaging system that captured video during Curiosity s landing. Spectrometers Alpha Particle X-Ray Spectrometer (APXS) determines the relative abundances of different elements in rocks and soils and is an improved version of similar instruments flown on Pathfinder, Spirit and Opportunity. ChemCam uses laser pulses to vaporize material from targets up to 7 m from the rover. It uses emission spectroscopy to identify the types of atoms excited by the beam, and a telescope to capture detailed images of the sampled rocks and soils. Chemistry & Mineralogy X-Ray Diffraction/X-Ray Fluorescence Instrument (CheMin): The first X- ray diffraction instrument flown to another world, it provides measurements of mineralogy of martian samples. Sample Analysis at Mars (SAM): Includes a gas chromatograph, a quadrupole mass spectrometer and a tunable laser spectrometer with combined capabilities to identify a wide range of carbon-containing compounds and determine the ratios of isotopes of key elements. Radiation Detectors Radiation Assessment Detector (RAD) characterizes Mars current radiation environment to support future human exploration. Dynamic Albedo of Neutrons (DAN) senses subsurface H up to 1 m below the surface. Environmental Sensors Rover Environmental Monitoring Station (REMS) is Curiosity s weather station, providing data on atmospheric pressure, temperature, humidity, winds, and UV radiation.

30 Plenary Abstracts, Leshin continued In this presentation, I will discuss the geological and geochemical arguments supporting the discovery of a habitable environment, a benign fluvial system recorded in geologic features, with geochemically available key elements and energy sources. In addition to exploring the aqueous system preserved at Gale, geochemical measurements of surface soils have revealed insights into current volatile sources on Mars that could be of use to future human explorers (Fig. 2; [1]). The latest geological and geochemical data from Mars will be reviewed and discussed. References: [1] L Leshin et al. Science DOI: / science (2013) Figure 1. Mars Curiosity Rover Payload (prepared by R. Wiens). Figure 2. Volatiles released upon heating of Rocknest fines. Water release is equivalent to ~2% by weight. 29

31 Plenary Abstracts Multi-spectral Electron Microprobe - Now and the Future Colin M. MacRae 1, Nick C. Wilson 1 and Aaron Torpy 1 1 Microbeam Laboratory, CSIRO Process Science and Engineering, Clayton, Australia 3169 Hyperspectral datasets are now routinely collected in electron microprobes during mapping with an increasing amount of the energy spectrum being covered. Energy dispersive spectrometers (EDS) are now giving spectral information on X-rays down to Li [1], with the development of soft X-ray emission spectroscopy (SXES) giving high resolution spectroscopy down to energies of 50 ev [2], while cathodoluminescence (CL) detectors are giving spectral information in the ultra-violet to the infra-red range [3]. The SXES detector gives direct measurement of Si-L (100eV), Al-L (70eV) and importantly Li- K (52eV) using first order lines, while higher order x-ray reflections can be used to probe other elements which do not have first order lines able to be directly measured using this spectrometer. The high energy resolution of the detector, down to 0.2eV [2], can differentiate many of the overlapping x-ray lines observed using wavelength dispersive spectrometers, as well as resolve peak shape and energy changes which aid in the determination of the chemical bonding state of various compounds. CL also captures bonding and valence information having a high energy resolution over a comparatively small energy range which, depending on configuration, can be down to 10 mev. Both the SXES and CL techniques are capable of detecting trace element information down to the ppm in mapping mode. Hyperspectral data collection enables spectra to be accumulated in a single mapping pass avoiding artifacts from beam damage, which can induce bond changes, charge trapping and elemental migration. This can lead to spectral shape changes in CL and SXES and elemental migration changes in x-ray emission. The ability to collect all these signals in parallel, generating multi-spectral data sets, in an electron microprobe equipped with a field emission gun offers a wealth of chemical state and valence information, elemental levels at detection limits of a few ppm together at analytical resolutions of down to hundreds of nanometers. Multi-spectral data sets have the great advantage of allowing post-hoc examination of the data. This can lead to the discovery of unexpected phases (in x-ray data), bonding changes (in the SXES data) and defects or centers (in the cathodoluminescence data) within a sample. All this information is available at the pixel level. A problem encountered when trying to examine hyperspectral datasets is how to process the data to extract key spectral signatures. There are several approaches, with popular automated methods being principal component analysis, which reduces the dimensionality of the data set [4], and data clustering [5]. This operation can be performed on all hyperspectral data in parallel or separately and then combined at the end where appropriate, Fig. 1. Separately processing the data sets can be required due to the different generation processes and detectors associated with them. These processing algorithms find not only the major phases present but can locate minor and rare phases, all of which can be quantified in the WDS and EDS cases, through the application of peak identification, peak fitting and matrix correction methods. Phases found in the SXES and CL data can be fitted to identify bonding, valance and potentially trace information. The aim of this paper is to discuss what additional information hyperspectral data analysis can yield for chemically and structurally complex minerals and materials References: [1] L. Xiaobing et al, Microsc. Microanal. 19 (Suppl 2), 2013, p [2] M. Terauchi et al, Journal of Electron Microscopy. 61(1): (2012), p [3] C.M. MacRae et al, Microsc. Microanal. 18, (2012), p Si KAl 1 mm Si CL total counts 1 mm Quartz Illite Kaolinite K feldspar Fe oxide Albite Dolomite 1 mm Quartz (detrital) Quartz cement Illite Kaolinite K feldspar Fe oxide Albite Dolomite 1 mm [4] P.G. Kotula et al, Microsc. Microanal. 9, (2003), p [5] N.C. Wilson et al, Microsc. Microanal. 14(Suppl 2), (2008), CD. 30 IUMAS-6 August 2-7, 2014 Hartford, CT

32 Plenary Abstracts, MacRae continued B A Figure 1. A. Sandstone sample showing detrital quartz intergrown with clays (Kaolinite, Illite and Muscovite). Quartz grain structure is no evident with x-rays. B. Grain structure of quartz and hydrothermal healing within quartz grains is evident in a combined cathodoluminescence and silicon map. Regions containing detrital quartz have been grayed to highlight hydrothermal quartz features. C. Clustered x-ray map showing main minerals present. D. Combined x-ray and cathodoluminescence clustering shows the fine scale hydrothermal quartz sealing the detrital quartz and bonding the mineral assemblage. 31

33 Plenary Abstracts Advances in Acquisition and Analysis of Hyperspectral Images P. G. Kotula 1 1 Materials Characterization Department, Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM In less than 20 years the microanalysis community has seen incredible changes in technology for acquisition [1] and analysis [2] of x-ray spectral data otherwise with the advent of hyperspectral imaging where complete x-ray spectra area acquired from a 2D array of points. More recently advanced silicon-drift detectors (SDD) have almost completely replaced the Si (Li) detectors with greatly improved spectral resolution at high count rates [3]. Additionally SDDs and their resultant relaxed cooling requirements have resulted in the development of multi-sensor configurations including annular geometries [4-5] exceeding 1 sr solid angle of collection. Multi-SDD systems have more recently been fitted to scanning transmission electron microscopes (STEM) resulting in solid angles of 0.8 sr and higher [6]. This has allowed atomic-resolution x-ray data to be acquired [7] and quantified [8]. Fig. 1 shows results from a Bruker (pn Sensor) 4-channel annular SDD on a Zeiss Supra 55VP SEM operated at 30kV. The sample consisted of Bacillus anthracis spores fixed in gluteralehyde and then embedded in epoxy and microtomed to a thickness of about 80nm. The sample was mounted in a specially designed low background transmission holder. At nominal beam currents of 5 na the output count rate from the SDD was approximately 150 kcps. Figure 1a shows a secondary electron image of the analysis region. An x-ray spectral image 512 by 384 pixels was acquired in 20 minutes. The data were analyzed with Sandia s Automated expert Spectral Image Analysis (AXSIA) multivariate statistical analysis software [2] with the component image overlay shown in Fig. 1b with an inset enlargement. This example illustrates the improvements hyperspectral imaging, x-ray spectrometers, data analysis and a STEM-in-SEM analytical geometry with a thin sample to improve spatial resolution as well as analysis throughput. Figure 2 shows the results of analysis of a fine-scale spinodal decomposition in Paliney 7 (an electrical contact material consisting of Cu, Zn, Pd, Ag, Pt, and Au. Fig. 2a is the AXSIA analysis (component image overlay) of x-ray spectral image data acquired on a FEI Company Tecnai F30-ST operated at 300kV equipped with an EDAX R- TEM x-ray detector with a nominal solid angle of 0.07 sr. in about 2 hours at 2nm/pixel (the approximate probe size). The spinodal microstructure is just visible with the red consisting of Cu, Pd, Pt and Zn. The Green consists of Ag, Pd and Au. Illustrating the power of both new electron microscopes and multi-channel SDDs, Fig. 2b is the AXSIA analysis (component image overlay) of x-ray spectral image data acquired on a FEI Company Titan G with ChemiSTEM Technology and equipped with a high-brightness source, spherical aberration corrector on the probe-forming optics and a 4-SDD array with a combined solid angle of 0.8 sr. the data were acquired in 7 minutes with a probe smaller than 2Å and a significantly higher pixel density than in Fig. 2a. Taking into account spatial resolution and analysis time this represents a 70-fold improvement over the older electron microscope. The colors in Fig. 2a follow those of Fig. 2a. References [1] R.B. Mott, et al. In Proc. Microscopy and Microanalysis, (1995) [2] P.G. Kotula, et al., Microsc. Microanal. 9 (2003) [3] A. Niculae, et al., Nuc. Inst Meth. In Phys. Res. A 568 (2006) [4] B.L Doyle, et al., X-ray Spectrom. 34 (2005) [5] P.G. Kotula, et al. Microsc. Microanal.14 [Suppl. 2] (2008) [6] H.S. Von Harrach, et al., J Phys 241 (2010) [7] D.O Klenov, et al., Appl Phys Lett 99 (2011) [8] P.G. Kotula, et al., Microsc. Microanal. 18 (2012) IUMAS-6 August 2-7, 2014 Hartford, CT

34 Plenary Abstracts, Kotula continued [9] Joseph R. Michael from Sandia was involved with the Bacillus anthracis research which was part of the FBI s Amerithrax investigation of the 2001 Anthrax attacks. The Paliney research was a collaboration with Donald Susan and Zahara Ghanbari at Sandia. Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the US Department of Energy (DOE) under contract DE- AC0494AL Figure 1. a. SEM secondary electron image of a microtomed section of Bacillus anthracis spores. B. AXSIA analysis of an x-ray spectral image acquired (STEM-in-SEM) with an annular-geometry SDD array showing identification of Si incorporation into the sport coat (red) as well as Ca an P associated with the cortex and Cl and S associated with the exosporium Figure 2. AXSIA analysis of spectral images of a spinodal decomposition in Paliney 7 from data acquired on a. an FEI Company Tecnai F30ST and b. an FEI Company Titan G with ChemiSTEM technology resulting in a 70-fold improvement in combined spatial resolution and analysis time

35 Plenary Abstracts Atomic-Resolution X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopes: Current Limits and Challenges toward Quantification M. Watanabe 1 1 Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA X-ray analysis has been widely performed as one of the most robust characterization approaches in scanning transmission electron microscopes (STEMs) for ~40 years because of its simple operation and interpretation nature. However, availability of X-ray signals is very limited due to a small analyzed volume, physically restricted signalgeneration and poor signal-detection configurations of detectors. These limitations are now compensated in some degree by using the latest aberration-corrected STEMs in combination with the large solid-angle silicon drift detectors (SDDs) [1, 2]. It is now possible to acquire atomic-resolution X-ray maps using the latest instruments such as an aberration-corrected STEM JEOL JEM-ARM200CF equipped with a large solid-angle SDD. In this study, possibilities and limitations for quantification of atomic-resolution X-ray analysis will be explored. Figure 1 shows a set of atomic resolution X-ray map acquired from a [100]-projected GaAs specimen using the aberration-corrected STEM JEM-ARM200CF operated at 200 kv. In the [100]-projection of GaAs, Ga and As layers are alternatively separated. Unfortunately, this configuration may not appear by HAADF-STEM imaging (Fig. 1a) unless a very thin specimen is observed, because the difference in the atomic number is only two between Ga (31) and As (33). As shown in the elemental maps of (b) Ga and (c) As with (d) their color overlay, separated layers of Ga and As can be observed. Quantification of these maps were carried out by the -factor method [3], and compositions of (e) Ga and (f) As were determined with (g) thickness. Although the Ga and As layers seem well separated in elemental maps, the compositions do not reach to 0 or 100 at% in corresponding atomic layers. The maximum and minimum values of measured compositions are ~70 and 30 at%. According to the thickness map determined from measured X-ray intensities by the -factor method, there are relatively large variations between on-column and off-column regions: ~60 and 30 nm at on- and off-column regions, respectively. In order to investigate the composition variation of on- and off-atomic-column points, X-ray maps were measured from the [100]-projected GaAs at different thickness regions and quantified them. The quantified Ga compositions extracted at the Ga columns, As columns and off-columns are plotted against the specimen thickness in Fig. 2. From this plot, it is evident that (i) the compositions at both atomic columns do not reach 100:0 at% even in the thinnest region but come close to the average composition (50:50 at%) with an increase of the specimen thickness, (ii) the compositions at off-column positions exhibit the average composition (50:50 at%) and (iii) the thickness values at off-column positions are lower than those at atomic column positions. This thickness enhancement at the atomic-column positions indicates that abnormal X-ray emission occurs due to channeling [4]. The map was obtained in highly symmetric zone axis, in which the incident beam propagation is influenced by the atomic arrangement, i.e. the incident electrons are channeled and dechannneled especially at the atomic columns [5]. The channeling/dechanneling behaviors can be seen by simulating the wave function of incident beam propagating the specimen. The wave functions at Ga and off columns, simulated by xhrem multislice code [6], are shown in Fig. 3. Whereas the incident beam tends to remain the atomic column, the probe at the off-column position spreads more toward neighbor columns For quantification of the atomic resolution X-ray maps, the probe propagation needs to be considered. References [1] H.S. von Harrach, et al., Microsc. Microana. 15 (2009), Suppl. 2, 208. [2] I. Ohnishi, et al, Microsc. Microana. 17 (2011), Suppl. 2, 22.. [3] M. Watanabe and D.B. Williams, J. Microsc. 221 (2006), IUMAS-6 August 2-7, 2014 Hartford, CT

36 Plenary Abstracts, Watanabe continued [4] J.F. Bullock et al. Microscopy in Semiconductor Materials 1985, 405 (1985).. [5] B.D. Forbes et al. Allen, Phys. Rev. B 86, (2012). [6] K. Ishizuka., J. Electron Microsc. 50 (2012), 291. [7] The author wishes to acknowledge financial support from the NSF through grants DMR and DMR Figure 1: A set of quantitative X-ray maps from a [100]-projected GaAs specimen: (a) HAADF-STEM image, (b) Ga K intensity, (c) As K intensity, (d) color overlay of Ga K (red) and As K (green), (e) Ga composition, (f) As composition and (g) thickness. Figure 2: Ga composition extracted from Ga, As and off column positions in atomic-resolution X-ray maps of [001]-projected GaAs, plotted against the specimen thickness. Figure 3: Simulated wave functions at Ga and offcolumn positions of [001]-projected GaAs. 35

37 Plenary Abstracts H. G. J. Moseley: the Scientist Who Put the Z in ZAF (and kab). David B. Williams 1 1 College of Engineering, The Ohio State University, 2070 Neil Avenue, Columbus, OH 43210, USA. A century ago, a graduate research assistant performed a brilliant series of experiments showing that the wavelengths of emitted X-rays were proportional to Z, the atomic number of the elemental source. Hitherto, from 1869 when Mendeleev first presented his periodic table, the atomic weight, A, was assumed to be the defining characteristic of each element. Ninety-nine years ago on August 10, 1915, that scientist was killed by a sniper s shot to the head during the Gallipoli campaign, an event Isaac Asimov described as the most costly single death [1] of the ~20 million that occurred in World War I. That scientist was Henry Gwyn Jeffries Moseley, known to all as Harry. In 1913 he had started his research at the University of Manchester, having first spent time teaching elements to idiots. During his prior undergraduate years at Trinity College, Oxford, most of the time Harry spent with Trinity men was on the river and in the debating society. Perhaps as a consequence he had left Oxford with a second-class degree, which he saw as a failure. However, he was in the right place at the right time, working in Rutherford s group at Manchester, the university founded on the work of Dalton and Joule. We find that an X-ray bulb with a platinum target gives out a sharp line spectrum of the wavelengths he wrote to his mother on May 18, Tomorrow we search for the spectra of other elements. There is here a whole new branch of spectroscopy. How right he was! Similar work was being performed by William Henry Bragg in Leeds and Maurice de Broglie (older brother of Louis) in Paris. The latter two focused attention on the X-rays, not what they revealed about the target. The important difference was that all the work in Manchester was on atomic structure, not on X-ray physics. Rutherford had gathered the dream team including Geiger (whose key experiment with Marsden, then an undergraduate, revealed the importance of the nucleus and the atomic number), Darwin (grandson of Charles and known to the TEM community through the Darwin- Howie-Whelan equations) and Chadwick (later of neutron fame). Late in 1913, Harry decided to measure the K X-rays that were known to gain in hardness (frequency) regularly and almost monotonically throughout the periodic table. Moseley s hypothesis (originally ascribed to Van der Broek, an amateur physicist in Amsterdam) was that The element s nuclear charge equaled its serial number. So, in October 1913, Moseley built an apparatus with several different anticathodes in the same X-ray bulb so he was not dependent on the lab s (jealously guarded) vacuum pump for each experiment (Figure 1). In four days he obtained cathode-ray induced X-ray spectra from Ti, Cr, Mn, Fe, Co, Ni, Cu and Ag. Two weeks later his first data appeared in Phil Mag. [2] followed by a second paper [3]. Figure 2, his now famous step ladder is Plate V in [2]. Moseley found that the frequency of the Kα line was proportional to (Z-1) 2. Neils Bohr who spent many months in Manchester said (in 1962): The Rutherford work (the nuclear atom) was not taken seriously. The great change came with Moseley. Because of Moseley s research, the role of X-rays in physics, chemistry and materials science was extended from probing the possible crystallographic structure to the unequivocal identification of the elements within the specimen. He knew in minutes the contents of a sample which a chemist might take years to analyze. Now of course we know the answer in seconds, down to the individual atom level. 36 IUMAS-6 August 2-7, 2014 Hartford, CT

38 Plenary Abstracts, Williams continued Thus, in a couple of weeks, Moseley facilitated the birth of X-ray microanalysis using electron beams. This technique was not immediately popular. It took 31 more years for Hillier and Baker [4] to combine the techniques of electron scattering and X-ray detection into one instrument. It took almost 40 years for Castaing [5] to develop the quantification technique relating the elemental composition to the X-ray intensity through the ZAF approach. It took over 60 years before Cliff and Lorimer [6] developed the kfactor approach for highresolution, thin-film quantification by ignoring the A and F in Castaing s equation. The factor kab (= Z -1 ) is thus a correction for the different Z values of elements A and B in the thin specimen, as described in Williams and Carter [7]. How fitting that the method by which Moseley s X-ray spectroscopy was ultimately applied at the single-atom level was developed in Moseley s own Manchester University. References [1] All quotes from J. L. Heilbron, H. G. J. Moseley (University of California Press, Berkeley, CA, 1974). Reproduced Courtesy of The University of California Press. [2] H. G. J. Moseley, Part I, Phil. Mag. 26 (1913), p [3] H. G. J. Moseley, Part II, Phil. Mag. 27, (1914), p [4] J. Hillier and R. F. J. Baker, J. Appl. Phys. 15 (1944), p [5] R. Castaing, Thèse, Université de Paris (1951), ONERA Publ. #55. [6] G. Cliff and G. W. Lorimer, J. Microsc. 103 (1975), p [7] D. B. Williams and C. B. Carter, Transmission Electron Microscopy 2nd edition (Springer, New York, NY, 2009), p Figure 1. Moseley s definitive apparatus for measuring hard X-rays (a) schematic (b) what remains of the actual apparatus. Courtesy, University of California Press. Figure 2. Moseley s step ladder arranged with frequency decreasing from left to right. The darker of the two lines in each spectrum is K and the other is the K. An element is clearly missing between Ca and Ti. Moseley had no Sc sample available. Courtesy, Taylor and Francis. 37

39 Plenary Abstracts Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology C. G. Park 1,2, J.H.Lee 1, D.H. Jang 1, W.Y. Jeong 1, S. M. Park 1 1 Dept. of Materials Science and Engineering, Pohang Univ. of Science and Technology (POSTECH), Pohang, , Korea 2 National Institute for Nanomaterials Technology, POSTECH, Pohang , Korea Solid-state microelectronics has been matured for more than 50 years. As the size of devices is getting smaller recently, the demands for structural and compositional characterization of the devices in sub-nanometer scale are getting increased. Conventional analytical techniques, such as TEM and SIMS for the structural and compositional analyses, however, revealed limitation in acquiring the three-dimensional structural and compositional information in sub-nanometer scale. Atom Probe Tomography (APT) technology has been developed to overcome the technical limit of conventional analysis techniques, and thus, to provide three dimensional distributions of constituent elements at sub-nanometer region with high detection sensitivity (~ppm). Since ppm-level distribution of constituent elements plays a critical role for the performance of recent electronic devices, 3D compositional information combined with structural information is quite demanding in understanding the device characteristics. This presentation gives the various examples of atom probe tomography applied to the electronic devices, such as DRAM (with STI and finfet structures), PRAM (Phase Change Random Access Memory) and ReRAM (Resistive Random Access Memory) and the photonic devices of GaN-base LED (Light Emitting Diode). In addition the APT application has been extended to the fabrication and growth mechanism of ZnO nanostructure, which has the great potential for future electronic and photoelectronic devices. 38 IUMAS-6 August 2-7, 2014 Hartford, CT

40 Plenary Abstracts Robert E Ogilvie: Inventor, MAS Founder, and Educator J. I. Goldstein 1 1 Department of Mechanical and Industrial Eng.,University of Massachusetts, Amherst, MA This year the microanalysis society lost one of its founders, Robert E. Ogilvie. Bob was a major force in microscopy having developed an early version of the electron probe microanalyzer (EPMA). With his student, Victor Macres, he modified a RCA microscope, one of the first EPMA instruments (Fig 1.) In the 1960s a prototype of the Philips commercial instrument (Fig. 2) was developed and heavily used by his students at MIT. He founded the first short course in microscopy with such eminent lecturers as Castaing and Philibert, now the Lehigh SEM Short Course. In addition he was the major thesis advisor of a number of students who contributed to microscopy and instrumentation development (Lyman, Ziebold, Morris, Brown, Goldstein, and others). His major contribution to x-ray microscopy was the development of the a factor, Ziebold and Ogilvie (1964) [1] for x-ray microanalysis. In the early 1960s the ZAF method was not well developed and analysis errors were often quite significant. Furthermore, computer data reduction was less generally available. In response to this state of affairs, Ziebold and Ogilvie [1] developed an empirical correction method for quantitative analysis of binary alloys. Using the a factor, the intensity ratio sample to standard of element 1 is related directly to the concentration of element 1 in the sample for a given electron beam energy and take-off angle. The popularity of this method increased greatly when it was further developed by Bence and Albee (1968) [2] and applied in geological analysis. The Bence-Albee analytical technique has played an important role in x-ray microanalysis in geology and their paper has been one of the most cited articles in the geological sciences. Ogilvie was involved in the development of EPASA, the initial professional society which is now called MAS. He organized the famous 3rd US microanalysis meeting at the Summerset Hotel in Boston with major support from industrial sponsors. The society social has gone down in history as the best ever with the last attendees (Wittry, Borovsky) leaving on shaky legs after midnight. Ogilvie was president of the society and an active member for many years. He organized the first US-Japan meeting on microanalysis (Fig. 3) in Hawaii and participated in the second meeting a few years later. Among his entrepreneurial efforts, he was a founding member of AMR (Advanced Metals Research Corp), the company which produced and sold the AMRay SEM. In the early days of the firm, many a graduate student manned AMR s several home-made electron probe microanalyzers churning out data for customers. Bob had wide interests beyond microanalysis, especially meteorites and Japanese swords. In 2000 he was recognized for his meteorite activities with a named minor planet, 3973 Ogilvie. He went to Japan and visited sword makers to see how swords were made (Fig. 4) and worked with his students on the processing and compositional changes that took place as a result of heat treatment. In retirement he worked part time at the Boston Fine Arts Museum applying x-ray techniques to investigate the detection of art forgeries made available to the museum, the construction of samurai swords, and the analysis of meteorites. He was an avid sailor and used a MIT sabbatical to sail. His sailing activities unfortunately led to a more thorough investigation of the use of MIT faculty sabbaticals. Bob will be missed most for his out of the box thinking, his challenging questions at awkward moments, and his strong support of his students and his family. Bob passed away at the age of 89 on September 3, He is survived by his 3 children Claudia, Mary Lee and Robert. He was a Professor of Metallurgy at MIT in the Department of Materials Science and Engineering 39

41 Plenary Abstracts, Goldstein continued for 45 years (Fig. 5). Fig 1. RCA TEM redesigned by Macres and Ogilvie as an EPMA Fig. 2 MIT EPMA, circa 1960 Fig. 3. Attendees of the first US-Japan meeting on Microanalysis, circa 1970 Fig. 4. Bob Ogilvie in Japan. References: [1] TO Ziebold and RE Ogilvie, Anal. Chem. 36 (1964) p.322 [2] AE Bence and A Albee, J. Geol. 76 (1968) p.382. [3] The author acknowledges the following for helpful discussions: Tom Ziebold, Dale Newbury, Yet-Ming Chiang, Robert Scott Ogilvie, John Fournelle, and Lanie Gannon 40 IUMAS-6 August 2-7, 2014 Hartford, CT Fig. 5. Robert E Ogilvie, MIT professor

42 Plenary Abstracts Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution G. A. Botton 1, E. P. Bellido 1, M. Bugnet 1, N. Gauquelin 1,2, S. Prabhudev 1, D. Rossouw 1,3, S. Stambula 1, S.Y. Woo 1, G.-Z. Zhu 1, H. Zhang 4, J.Y.T. Wei 4 1 Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada. 2 Now at EMAT, University of Antwerp, Antwerp, Belgium. 3 Now with Department of Materials Science and Metallurgy, University of Cambridge, UK. 4 CIfAR Quantum Materials Program and Dept of Physics, Univ. of Toronto, Toronto, ON, Canada. Electron energy loss spectroscopy (EELS) has dramatically evolved since the development of electron monochromators, faster detectors within improved spectrometers, all this within more stable aberration correctedtransmission electron microscopes. These developments allow the acquisition of spectra with atomic resolution and spectroscopic quality that is sufficient to probe the changes in chemical bonding at near-atomic level so that real materials questions can be studied. Through energy loss near-edge structure analysis, EELS provide useful chemical state information so that changes in materials, for examples at interface, under extreme hightemperature conditions, or at defects can be probed. This contribution aims to review some of the applications of this technique by demonstrating examples of this work related to the study of interfaces in complex oxides, the quantification of spectra obtained at high spatial resolution, the detection of spectroscopic changes in nanomaterials subjected to intense light irradiation and the plasmonic response of nanostructures. Experiments were carried out on two aberration-corrected FEI Titan microscopes (a double-corrected Titan Cubed, and an image-corrected Titan ), both equipped with monochromators and EELS spectrometers (Quantum 966 and Tridiem 865 respectively), achieving down to 70 mev energy resolution. The capability of mapping at the atomic scale is not simply revealing local changes in composition but it allows us to identify the termination of the surface of substrates, and the chemical species that are in direct contact with the substrate (Figure 1). For the particular case of La2/3Ca1/3MnO3 (LCMO) grown on YBa2Cu3O7-d (YBCO) [1], our work has shown that the last atomic plane in YBCO is Ba, while the first atomic plane in LCMO is Mn (Figure 1). Similarly, it is also possible to use EELS mapping to provide unambiguous information on the site preference of transition metals in oxides whereby, in a Ca2FeMnO5, Mn is found on octahedral sites and Fe on tetrahedral sides (Figure 2). In disordered systems, this approach has allowed us to directly map the distribution of implanted Pr atoms in SrTiO3 and has demonstrated the expected statistical distribution (Figure 3) of atoms that cannot be resolved based on purely high-angle annular dark-field (HAADF)-contrast imaging [2]. For surfaces, we have been able to determine the valence state of surface atoms in reconstructed SrTiO3 [3] A good demonstration of the very high energy resolution application in energy loss near-edge structures is shown in our studies of the C K edge in single-wall and multiwall carbon nanotubes[4]. With the improved energy resolution, we have demonstrated that, simultaneous intense light irradiation (in-situ) and acquisition of energy-loss spectra, there is a significant change in the excitonic peak portion of the * fine structure [4]. This high-sensitivity demonstrates that the local heating and the charge carriers generated by infra-red photons significantly modify the electronic structure of the nanotubes. At very low energy losses, we have also shown the detection of energy loss features down to 0.17eV[5], the lowest feature ever reported. In addition, using numerical deconvolution, we have been able to show improvements in the effective energy resolution of spectra down to a FWHM of 0.01eV[6, 7]. 41

43 Plenary Abstracts, Botton continued References: [1] H. Zhang et al., Applied Physics Letters (2013). [2] G.-Z. Zhu et al., Physical Chemistry Chemical Physics 15, (2013) [3] G.-Z. Zhu, G. Radtke, G.A. Botton, Nature, 490 (7420), (2012) [4] D. Rossouw, M. Bugnet, G.A. Botton, Physical Review B 87, (2013) [5] D. Rossouw and G.A. Botton, Physical Review Letters 110, (2013) [6] E.P. Bellido et al., to appear in Microscopy and Microanalysis. [7] The Authors are grateful to NSERC for supporting this research. The microscopy was carried out at the Canadian Centre for Electron Microscopy, a National facility supported by NSERC and McMaster. 42 IUMAS-6 August 2-7, 2014 Hartford, CT

44 Plenary Abstracts Mass Spectrometry of Surfaces Using Ion Beams: Molecular Mapping of (Bio)Polymers Birgit Hagenhoff 1 1 Tascon GmbH, Münster, Germany Surface Mass Spectrometry using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) has matured into a flexible analyzing tool suited for routine and daily analysis of polymer surfaces. This is mainly due to its high sensitivity (fmol range), its high surface sensitivity (uppermost monolayer) and the fact that both, inorganic and organic species can be identified at the same time, i.e. in the same experiment. Thus it is suited for screening and survey analysis with no need for any pre-information. Whereas the lateral resolution during the onset of the technique in the beginning of the 80s of the last century was in the order of a few mm only, nowadays ToFSIMS has progressed onto an imaging technique with an ultimate lateral resolution below 100 nm. Routinely, fields of view ranging from (10 x 10) μm² to (9 x 9) cm² are addressed with modern instrumentation. With the advent of so called cluster ions for primary excitation and sample erosion it has also become possible to go in depth, i.e. to elucidate the molecular structure of a sample as a function of depth in a sputter experiment. The depth resolution is in the order of a few nm, allowing a detailed probing of the surface near layers. Combining imaging with depth profiling furthermore addresses the 3-dimensional inorganic and organic structure of a surface of interest. Typical analysis volumes for this mode are 100 (X) x 100 (Y) x 10 (Z) μm³. An example for 3D analysis of organic materials is presented in Figure 1. Based on a description of the physical background and the used instrumentation the talk will mainly focus on examples for the application of the technique to the characterization of polymer and biopolymer surfaces. Here, particularly the analysis of polymer additives (identification, localization; diffusion/segregation) is addressed. Figure 1. 3D ToF-SIMS analysis of the segregation of an organic flame retardant in polyamide; field of view: 30 x 30 x 1 μm³. 43

45 Plenary Abstracts Elemental Analysis of Cells and Tissues Peta L. Clode 1 1 Centre for Microscopy, Characterisation & Analysis, The University of Western Australia. Crawley, WA 6009 Australia. Elemental and isotopic imaging and analysis of cells and tissues is commonly utilised in the plant and animal sciences, being driven by scientific questions relating to disease states, resistance or susceptibility of different genotypes to environmental conditions, the role of partners in symbioses, biomineral formation, and cellular function and dynamics [1-4]. There are numerous analytical microscopy-based methods available - each with their advantages and limitations - and the method(s) employed must be tailored to the question at hand and thus be able to address the specific requirements relating to analytical resolution (e.g. subcellular, single cells, cell layers), sensitivity (low or high concentrations), elements of interest, and the forms of data (e.g. quantifiable, concentrations, maps/spectra) that are required. Available imaging-based techniques include energy-filtered TEM (EFTEM), electron probe x-ray microanalysis (EDS), x-ray nanoprobe analysis, and secondary ion mass spectrometry (SIMS). This plenary talk however, will aim to give an overview of the application of some electron (e.g. EDS and EFTEM) and ion (e.g. NanoSIMS) based analytical systems to the elemental and isotopic analysis of cells and tissues in biology. Examples will extend from toxicity (e.g. salinity, phosphorus and calcium) and metals (e.g. hyperaccumulation, gold nanoparticle formation) in plants, to iron- and calcium-based biomineralising tissues, iron-based magnetoreceptors, nutrient dynamics in plant-microbial-soil environments, and symbiotic algal cells. Focus will be given to the reasons one might consider adopting one or more of these methods, and to the limitations that can be expected. Factors to consider when using different methods of sample preparation, including chemical fixation and dehydration, low temperature fixation, freeze-substitution and drying, and frozenhydrated preparations, will be outlined. Additionally, practical challenges that biologists regularly face around sampling and sample preparation, element retention and immobilisation, experimental replication, low concentrations and detection limits, and analytical support will be touched upon. Additional examples and alternative methods of analysis that are highly suited to the elemental analysis of biological materials will also be presented by invited speakers and contributed talks as part of the Microanalysis of Biological Materials Symposium at the Microscopy and Microanalysis meeting that follows IUMAS [5]. References: [1] Echlin, P. Biological X-ray microanalysis: The past, present practices, and future prospects. Microscopy and Microanalysis 7, (2001). [2] McCully, M., Canny, M., Huang, C., Miller, C. & Brink, F. Cryo-scanning electron microscopy (CSEM) in the advancement of functional plant biology: energy dispersive X-ray microanalysis (CEDX) applications. Functional Plant Biology 37, (2010). [3] Pernice, M. et al. A single-cell view of ammonium assimilation in coral-dinoflagellate symbiosis. ISME J 1 11 (2012). [4] Marshall, A., Clode, P., Russell, R., Prince, K. & Stern, R. Electron and ion microprobe analysis of calcium 44 IUMAS-6 August 2-7, 2014 Hartford, CT

46 Plenary Abstracts, Clode continued distribution and transport in coral tissues. Journal of Experimental Biology 210, (2007). [5] The author acknowledges ARC Discovery Program funding (DP ) and the use of the equipment at CMCA, a facility funded by Universities, and State and Commonwealth governments. Figure 1: TEM brightfield image of granules extracted from trophocyte cells of the honey bee Apis mellifera (left) and corresponding iron EFTEM map (right). Scale bar = 500 nm. Courtesy J Shaw. Figure 2: EDS maps from transverse sections of freeze-substituted Banksia attenuata leaves, showing chloride (left) and silicon (right) distribution in the epidermis (e), sclerenchyma (s), and mesophyll (m). Scale bar = 50 um. 45

47 Early Career Scholars Encouraging Student Participation The IUMAS-6 organizing committee wish to encourage student and young professional participation in the meeting through financial support. Therefore IUMAS-6 in collaboration with the IUMAS member societies have created "IUMAS-6 Early Career Scholarships" to provide travel support to elite student members of the member societies. These scholarships provide both support for travel to Hartford, lodging in Hartford, and full meeting registration costs. Member societies have chosen14 ECS and the organizing committee has selected another 2 at-large awardees. They have submitted papers to 14 different sessions demonstrating the scientific diversity of these outstanding young scientists! At-Large ECS - The Microanalysis Society Kristin Bunker, President Aki Takigawa Carnegie Institute of Washington Morphologies, Isotopes, Crystal Structures, and Microstructures of Presolar Al 2 O 3 Grains: a NanoSIMS, EBSD, EDS, CL, and FIB-TEM Study Session P03 Tuesday 2:15 pm room 11 Shirin Kaboli McGill University Electron Channeling Contrast Observations in Deformed Magnesium Alloys Session P01 Thursday 8:30 am room 11 Australian Microbeam Analysis Society Ric Wuhrer, President Aoife McFadden University of Adelaide South Australian Museum Otolith Biomineralisation: Insights From a Microstructural and Microanalytical Study Session B06 Tuesday 11:45 am room 23 Tim Murphy University of Western Sydney 1. Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia Session A10 Wednesday 1:30 pm room X-ray Mapping Investigations of the Monazites from the Mt Weld Deposit - Compositional Variance as an Indicator of Provenance Session A10 Posters Thursday 10:30 am Hall AB Poster # IUMAS-6 August 2-7, 2014 Hartford, CT

48 Early Career Scholars Brazilian Society for Microscopy and Microanalysis Dr. André Luiz Pinto, President Vitor Hugo Balasco Serrao Electron Microscopy Physics Institute of São Carlos University of São Paulo Investigation of Escherichia coli Selenocysteine Synthase (SelA) Complex Formation Using Cryo-Electron Microscopy (Cryo-EM) Session B05 Posters Wednesday 3:30 pm Hall AB Poster #301 Patricia Fernanda Andrade Department of Chemistry University of Campinas Structural and Morphological Investigations of β-cyclodextrin-coated Silver Nanoparticles Session P09 Posters Thursday 10:30 am Hall AB Poster #451 Microscopical Society of Canada/Société de Microscopie du Canada/ Canadian Foundation for the Development of Microscopy MSC - Anja Geitmann, President; CFDM - Pierre-Mathieu Charest Samuel Bastien Chemical and Biotechnological Engineering Université de Sherbrooke Plasma Synthesis of Facetted Nickel nano-ferrites with Controlled Stoichiometry Session A07 Tuesday 9:15 am room 15 Xiaohui Zhu Chemistry and Chemical Biology McMaster University Probing Magnetic Polarities of Magnetotactic Bacteria by X-ray Magnetic Circular Dichroism in a Scanning Transmission X-ray Microscope Session B02 Monday 3:00 pm room

49 Early Career Scholars Standard Administration of People s Republic of China, Technical Committee 38 (Microbeam Analysis) Fen Liu, Committee Liaison Zhu Ruan University of Science and Technology of China Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image Session A01 Tuesday 2:15 pm room 24 Yanbo Zou University of Science and Technology of China Model-Based Library for Critical Dimension Metrology by CD-SEM Session A01 Monday 2:15 pm room 24 European Microbeam Analysis Society Mike Matthews, President Aurélien Moy Commissariat à l'energie Atomique Centre de Marcoule DEN/DTEC/SGCS/LMAC Quantification Of Actinides By EPMA: A New Accurate Standardless Approach Session P05 Wednesday 1:30 pm room 25 Philippe T. Pinard RWTH Aachen Gemeinschaftslabor für Elektronenmikroskopie (GFE) Towards Reliable Quantification of Steel Alloys at Low Voltage Session A11 Wednesday 2:00 pm room IUMAS-6 August 2-7, 2014 Hartford, CT

50 Early Career Scholars The 141st Committee on Microbeam Analysis of Japan Society for the Promotion of Science Yahachi Sato, Committee Liaison Masaru Irita Tokyo University of Science A Study of Single-Walled Carbon Nanotube Cap Structure Using Field Emission Image Session P04 Posters Monday 3:30 pm Hall AB Poster #107 Shoko Matsushita Hamamatsu University School of Medicine Volatile p-nitroaniline as Matrix for High Spatial Resolution Imaging of Phospholipids in Both Ion Modes by AP-MALDI-IMS Session P09 Posters Thursday 10:30 am Hall AB Poster #452 Korean Society of Microscopy Young-woon Kim, Society Liaison Yinsheng He School of Nano & Advanced Materials Engineering Microstructural Evolution of SS304 upon Various Shot Peening Treatments Session A13 Wednesday 2:00 pm Marriott Ballroom B Youngji Cho Korea Maritime and Ocean University Morphology and Structure Analysis of Graphene by Low Voltage TEM Session P04 Posters Monday 3:30 pm Hall AB Poster #

51 IUMAS-6 Sponsors Bronze Silver Gold Platinum 50 IUMAS-6 August 2-7, 2014 Hartford, CT MAS The Microanalysis Society ISBN