Standard Products UT54ACS139/UT54ACTS139 Dual 2-Line to 4-Line Decoders/Demultiplexers. Datasheet November 2010

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1 Standard Products UT54ACS9/UT54ACTS9 Dual -Line to 4-Line Decoders/Demultiplexers Datasheet November 00 FEATURES Incorporates two enable inputs to simplify cascading and/or data reception.μ CMOS - Latchup immune High speed Low power consumption Single 5 volt supply Available QML Q or V processes Flexible package - 6-pin DIP - 6-lead flatpack UT54ACS9 - SMD UT54ACTS9 - SMD DESCRIPTION PINOUTS IG A B Y0 Y Y Y V SS 6-Pin DIP Top View V DD G A B Y0 Y Y Y 6-Lead Flatpack Top View The UT54ACS9 and the UT54ACTS9 are designed to be used in high-performance memory-decoding or data-routing applications requiring very short propagation delay times. The devices consist of two individual two-line to four-line decoders in a single package. The active-low enable input can be used as a data line in demultiplexing applications. The devices are characterized over full military temperature range of -55 C to +5 C. G A B Y0 Y Y Y V SS V DD G A B Y0 Y Y Y FUNCTION TABLE ENABLE INPUTS SELECT INPUTS OUTPUT LOGIC DIAGRAM G B A Y0 Y Y Y H X X H H H H L L L L H H H L L H H L H H L H L H H L H L H H H H H L SELECT G A B G () () () (5) (4) Y0 (5) Y (6) Y (7) Y () Y0 () Y DATA SELECT A B (4) () (0) Y (9) Y

2 LOGIC SYMBOL A B G A B G () () () (4) () (5) EN X/Y 0 (4) (5) (6) (7) () () (0) (9) Y0 Y Y Y Y0 Y Y Y A () B () G () A (4) B () (5) G 0 DMUX G (4) (5) (6) (7) () () (0) (9) Y0 Y Y Y Y0 Y Y Y Note:. Logic symbols in accordance with ANSI/IEEE Std and IEC Publication 67-.

3 OPERATIONAL ENVIRONMENT PARAMETER LIMIT UNITS Total Dose.0E6 rads(si) SEU Threshold 80 MeV-cm /mg SEL Threshold 0 MeV-cm /mg Neutron Fluence.0E4 n/cm Notes:. Logic will not latchup during radiation exposure within the limits defined in the table.. Device storage elements are immune to SEU affects. ABSOLUTE MAXIMUM RATINGS SYMBOL PARAMETER LIMIT UNITS V DD Supply voltage -0. to 7.0 V V I/O Voltage any pin -. to V DD +. V T STG Storage Temperature range -65 to +50 C T J Maximum junction temperature +75 C T LS Lead temperature (soldering 5 seconds) +00 C Θ JC Thermal resistance junction to case 0 C/W I I DC input current ±0 ma P D Maximum power dissipation W Note:. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMIT UNITS V DD Supply voltage 4.5 to 5.5 V V IN Input voltage any pin 0 to V DD V T C Temperature range -55 to + 5 C

4 DC ELECTRICAL CHARACTERISTICS 7 (V DD = 5.0V ±0%; V SS = 0V 6, -55 C < T C < +5 C); Unless otherwise noted, Tc is per the temperature range ordered. SYMBOL PARAMETER CONDITION MIN MAX UNIT V IL Low-level input voltage ACTS ACS V IH High-level input voltage ACTS ACS 0.8 V.V DD.5V DD V.7V DD I IN Input leakage current ACTS/ACS V IN = V DD or V SS - μa V OL Low-level output voltage ACTS ACS I OL = 8.0mA I OL = 00μA V V OH High-level output voltage ACTS ACS I OH = -8.0mA I OH = -00μA.7V DD V DD V I OL Output current 0 (Sink) I OH Output current 0 (Source) V IN = V DD or V SS V OL = 0.4V V IN = V DD or V SS V OH = V DD - 0.4V 8 ma -8 ma I OS Short-circuit output current,4 ACTS/ACS V O = V DD and V SS ma P total Power dissipation, 8,,9 C L = 50pF.8 mw/ MHz I DDQ Quiescent Supply Current V DD = 5.5V 0 μa ΔI DDQ Quiescent Supply Current Delta ACTS For input under test V IN = V DD -.V.6 ma For all other inputs V IN = V DD or V SS V DD = 5.5V C IN Input capacitance 5 ƒ = 0V 5 pf C OUT Output capacitance 5 ƒ = 0V 5 pf 4

5 Notes:. Functional tests are conducted in accordance with MIL-STD-88 with the following input test conditions: V IH = V IH (min) + 0%, - 0%; V IL = V IL (max) + 0%, - 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to V IH (min) and V IL (max).. Supplied as a design limit but not guaranteed or tested.. Per MIL-PRF-855, for current density 5.0E5 amps/cm, the maximum product of load capacitance (per output buffer) times frequency should not exceed,765 pf/mhz. 4. Not more than one output may be shorted at a time for maximum duration of one second. 5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and V SS at frequency of MHz and a signal amplitude of 50mV rms maximum. 6. Maximum allowable relative shift equals 50mV. 7. All specifications valid for radiation dose E6 rads(si). 8. Power does not include power contribution of any TTL output sink current. 9. Power dissipation specified per switching output. 0. This value is guaranteed based on characterization data, but not tested. 5

6 AC ELECTRICAL CHARACTERISTICS (V DD = 5.0V ±0%; V SS = 0V, -55 C < T C < +5 C); Unless otherwise noted, Tc is per the temperature range ordered. SYMBOL PARAMETER MINIMUM MAXIMUM UNIT t PHL Select to output Yn 4 ns t PLH Select to output Yn 5 ns t PHL Enable to output Yn 4 ns t PLH Enable to output Yn ns Notes:. Maximum allowable relative shift equals 50mV.. All specifications valid for radiation dose E6 rads(si). 6

7 PACKAGING Side-Brazed Packages 7

8 FLATPACK PACKAGES 8

9 UT54ACS9/UT54ACTS9: SMD 596 * ***** ** * * * Lead Finish: (Notes & ) A = Solder C = Gold X = Optional Package Type: X = 6-lead ceramic bottom-brazed dual-in-line Flatpack C = 6-lead ceramic side-brazed dip Class Designator: Q = QML Class Q V = QML Class V Device Type: 0 Drawing Number: = UT54ACS = UT54ACTS9 Total Dose: (Notes & 4) R = E5 rads(si) F = E5 rads(si) G = 5E5 rads(si) H = E6 rads(si) Notes:. Lead finish (A,C, or X) must be specified.. If an X is specified when ordering, part marking will match the lead finish and will be either A (solder) or C (gold).. Total dose radiation must be specified when ordering. QML Q and QML V not available without radiation hardening. For prototype inquiries, contact factory. 4. Device type 0 is only offered with a TID tolerance guarantee of E5 rads(si) or E6 rads(si) and is tested in accordance with MIL-STD-88 Test Method 09 Condition A and section... Device type 0 is only offered with a TID tolerance guarantee of E5 rads(si), E5 rads(si), and 5E5 rads(si), and is tested in accordance with MIL-STD-88 Test Method 09 Condition A. 9

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