Flavien Heu+er Sales & Applica+ons Engineer EFCC 2015
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1 Oscillator design guidelines for implantable medical device applications Flavien Heu+er Sales & Applica+ons Engineer 1 EFCC 2015
2 Agenda o Introduc/on o Key parameters in specifying quartz crystals o Suggested screenings for quartz crystals 2
3 3 INTRODUCTION
4 Evolu/on of the quartz crystals for medical implantable device applica/ons CX1 (8.0 x 3.5mm) CX3 (6.6 x 2.4mm) CX4 (5.0 x 1.5mm) First Lithium powered And Non invasive Programmable (Telemetry) pacemaker Pacemaker with Temperature and Motional sensors 3 chamber pacing implemented
5 Evolu/on of the quartz crystals for medical implantable device applica/ons CX9 (4.1x1.5mm) CX11 (3.2x1.5mm) CX16 (2.0 x 1.2 mm) CX18 (1.55 x 0.95 mm) Medical Implantable Communication Service (MICS) devices Retinal Implants BlueTooth Low Energy (BLE) and new generation of MICS. 1 st Leadless pacemaker
6 Quartz Crystal theory: Modes of Mo/on Flexure Mode Extensional Mode Face Shear Mode 6 Thickness Shear Mode Fundamental Mode Thickness Shear Third Overtone Thickness Shear
7 7 Tuning Fork Crystal Flexure mode
8 8 AT-cut crystal Thickness shear mode
9 9 Quartz Crystal Construc/on
10 Agenda o Introduc/on o Key parameters in specifying quartz crystals o Suggested screenings of quartz crystals 10
11 KEY PARAMETERS IN SPECIFYING QUARTZ CRYSTALS 11
12 Key parameters in specifying quartz crystals o Load capacitance o Gain o Drive level 12
13 Key parameters in specifying quartz crystals o Load capacitance o Gain o Drive level 13
14 Crystal Model and C L Symbol for crystal unit C L Total Reactance = X + X CL = 0 C 0 Static Arm Motional Arm C L 14 C 1 L 1 R 1
15 F L = F s 1+ Load Capacitance F L at C L C1 2( C + C 0 L ) + Area of usual operation in an oscillator TS = 1 F df L dc L = C 1 2(C 0 + C L ) 2 Reactance 0 Resonance, f r Antiresonance, f a Frequency TS is the Trim Sensi/vity πfC 0
16 How to measure C L? 1) Measure the crystal parameters C 1, C 0, and F s with a network or impedance analyzer. 2) Install the measured crystal in the oscillator circuit and measure the oscillation frequency f 3) Then calculate the load capacitance C L. For example with F s = khz C 1 = 2.3 ff C 0 = 1.5 pf f = khz we find C L = 9.0 pf. C L = C 1 2 F s C 0 f F s 16
17 Impact of incorrect C L Considering a khz CX11 crystal : C 0 = 1.0 pf, C 1 = 3.5 ff, calibrated for C L1 = 9 pf. Customer circuit at C L2 = 11 pf, what is the change in frequency? ppm = + + = C C C C C F F F L L L L
18 Importance of C L Right choice of C L for proper operating frequency Crystal with small load capacitance starts faster Large load capacitors increase the power consumption 18
19 Key parameters in specifying quartz crystals o Load capacitance o Gain o Drive level 19
20 Pierce Oscillator R f Fout Amplifier R A C G Crystal resonator C D C d 20
21 Gain Formula g m 4π 2 f 2 C G ( C D + C d )R e + (C d + R e C D )R A R O + C G C D (1+ R A R O )+ C d 1 R O 4π 2 f 2 C d C D R A 1+ R A + R e R O 4π 2 f 2 C d C D R A R e L 1 C 1 R 1 Oscillator AC equivalent circuit with the crystal I D electrical equivalent circuit R O X D C 0 = C 0 +C s X G 21
22 Gain Main part of the Formula g m 4π 2 f 2 C G C D R e + C G C D R O 1+ R e R O R f Fout R e L ' 1 C0 1 ' R + CL C + C = C ' L s 2 Xe Re I R O D ' C C + 0 = 0 C s X D C G X G CX R A C D C d 22 Pierce Oscillator AC Equivalent Circuit (R A omitted)
23 Compare minimum gain to drive sealed and unsealed khz CX11 crystal Sealed Unsealed g m = 4π 2 f 2 C D C G R e + C G /(C D R o )(1+R e /R o ) f Hz C D pf C G pf R 1 Ω R e R1(1+C 0' /C L' ) 2 R e Ω R o MΩ C L =C L' +C s C L pf C s pf C 0' =C 0 +C s C 0 pf g m 1 g m 2 g m g m 1 g m 2 g m g m µs (µmho) '768 32' ' '000 72' '
24 Key parameters in specifying quartz crystals o Load capacitance o Max allowed crystal resistance o Drive level 24
25 Drive Level Defini/on Crystal drive level is a measure of how hard the crystal is being driven. It can be defined as the current passing through the resonator, but is most o_en defined as the power dissipated within the resonator. The maximum allowed drive level is given by the crystal manufacturer and is dependent upon the physical size, geometry, mode, and frequency of the resonator. 25
26 Max Drive Level for CX11 Tuning Fork CX khz : 0.5 μw max AT-cut CX MHz : 200 μw max 26
27 Drive-Level Dependency Crystal drive-level dependency (DLD) refers to the dependency of the quartz crystal parameters (frequency and series resistance) to the with current through the crystal. High drive could irreversibly damage a quartz crystal 27
28 Drive-Level Dependency Resistance R 1 Anomalous starting resistance Normal operating range Drive level effects I X (ma)
29 Drive-Level Dependency Even with the steps we take to mi/gate this, there can s/ll be some parts that exhibit DLD behavior. We recommend customers requiring some levels of tes/ng to ensure reliable start-up of the oscillator. 29
30 SUGGESTED SCREENINGS FOR QUARTZ CRYSTALS 30
31 Suggested Screenings for Quartz Crystals o DLD Testing o Thermal Shock o Hermeticity Testing o PIND Testing 31
32 DLD Tes/ng 35 Purpose : To remove crystals that might have start-up issues in the oscillator. Method : Measure the crystal from a low drive level to the nominal drive level and back, looking for maximum resistance and changes in frequency and resistance.
33 Thermal Shock 36 Purpose : To determine Resistance of the component to expose at extreme temperature Per MIL-STD-202, Method 107 Method : Stress the mechanical structure (package and quartz bonding) and check effect on crystal parameters. -55 C to +125 C / 5 cycles
34 Herme/city Tes/ng Purpose: Determine the effec/veness of seal process detec/ng poten/al herme/city issue through ceramic, preform or seal rim. Fine and Gross Leak Tes/ng : Per MIL-STD-202, Method 112 Method : Parts under high pressure before measuring leakage 37
35 PIND Tes/ng Purpose : Non-destruc/ve test to detect loose par/culates, if any, inside a component cavity. Method : Detect loose par/culates of sufficient mass acous/cally upon impact with the cavity. Par/cle Impact Noise Detec/on per Mil-STD-883, Method 2020 Condi/on A 38 Need special test environment to reduce ambient and external noises.
36 Thank you 39
37
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