ANALYTICAL TECHNIQUES
|
|
- Imogene Goodwin
- 6 years ago
- Views:
Transcription
1 ANALYTICAL TECHNIQUES Raman Spectra Raman spectra were obtained by use of a T64000 (JY Horiba) triple-stage laser- Raman system having both macro-raman and confocal micro-raman capability which permits acquisition both of individual point spectra and of Raman images that map the two-dimensional spatial distributions of molecular-structural components. A Coherent Innova argon ion laser was focused through the 50 objective of an Olympus BX41 microscope to a ~1 µm spot; the laser provided excitation at nm with a power at the sample of ~1-8 mw, which is well below the threshold that could lead to radiation damage to the specimens studied here (Schopf et al., 2002). Due to its confocal capability, a vertical resolution of 2-3 µm and a horizontal resolution of ~1.5 µm are achieved by this system. Backscattered Raman radiation was collected over a range from 320 to 3100 cm -1 by use of a single spectral window centered at 1800 cm -1 that afforded simultaneous acquisition of both of the major bands (at ~1374 and ~1587 cm -1 ) and the second-order band (at ~2700 cm -1 ) of graphite, as well as of the major band of apatite (at ~965 cm -1 ) and of quartz (at 467 cm -1 ). Spectra were acquired at a resolution of <3 cm -1. Two- and Three-dimensional Raman Images Raman spectra were collected over a rectangular (25 x 35 µm) area enclosing the apatite grain and its surrounding quartz matrix at 1.5-µm-spaced vertical increments by use of a programmed motorized high precision microscope stage (SCAN 75x50, Märzhäuser GmbH & Co. KG) that moved the specimen in the x and y directions under a laser beam fixed in position and sequentially increased the depth of the image focal plane. To obtain an acceptable signal-to-noise ratio, each spectral element was analyzed for 2 seconds, resulting in a total data collection time of ~20 minutes for each twodimensional image. The several hundred spexels comprising such images were then processed (using LabSpec v4.14) to construct maps of the intensities in the spectral windows corresponding to the "G" band (~1587 cm -1 ) of graphite and the major bands of apatite and of quartz. The two-dimensional molecular-structural maps thus produced document the distribution of the minerals that comprise the specimen at a spatial resolution ~1.5-2 μm (given by the convolution of step size and laser beam focus). To obtain a "through focus" series from which three-dimensional images could be
2 constructed, 65 sequential two-dimensional maps were acquired and processed by use of the VolView v2.0 three-dimensional rendering program. Because the VolView software can process only one dataset at a time, we first constructed separate three-dimensional images of the quartz, apatite, and graphite present in the specimen and then merged these images by use of the Adobe Photoshop v7.0 image processing program. Construction of three-dimensional images such as those presented here requires processing of data having comparable overall quality and similar spatial resolution throughout an entire sampled volume (Schopf and Kudryavtsev, 2005). Two principal difficulties inhibit achievement of this requirement: (1) spherical aberration results in a decrease of vertical resolution with increasing depth; and (2) the intensity of the detectable backscattered Raman signal becomes increasingly faint with depth. Under our experimental conditions, these constraints become limiting at depths of ~65 70 µm (Schopf et al., 2002; Schopf and Kudryavtsev, 2005). To correct for diminishing Raman intensity with depth, data were normalized to the intensity of the quartz band in each of the sequentially acquired two-dimensional images. Ion Microscope Images Ion microscope images and carbon isotopic measurements of the graphitic inclusion contained in apatite grain #1 were obtained by use of a CAMECA ims1270 ion microprobe utilizing a mass-filtered 20 kev Cs + primary ion beam and analyzing negative secondary ions. Prior to isotopic analysis, the thin section was cut (by use of a diamond-impregnated wafering saw) such that the apatite grain was located approximately at the center of a roughly centimeter-sized section. This section had been hand-polished to remove its uppermost ~46 μm in order to expose the apatite and bring its inclusion to within ~0.5 μm of the thin section surface. Following cutting and polishing, the section was cleaned, positioned in the center of a 2.5-cm-diameter aluminum disk and sputter-coated with a thin gold film. The spatial distributions of 12 C, 28 Si, and 31 P in an area centered on apatite grain #1 were mapped by capturing the realtime ion images on the microchannel plate of the ims1270 with a CCD-camera and a standard PC-based image capture board. A contrast diaphragm was inserted into the secondary ion beam path in order to restrict image crossover and to obtain a spatial resolution of ~1 μm. The spatial resolution of the resultant ion images is sufficient to
3 verify that isotopic analyses were acquired from the same inclusion that had been imaged previously by optical and Raman methods and that these measurements did not include a significant contribution from any other carbon source. Carbon Isotopic Measurements Carbon isotopic ratios were measured by using the molecular ions 12 C 2 and 12 C 13 C since these species typically have higher intensity and exhibit less instrumental mass fractionation than atomic ions sputtered from carbonaceous material. Data were collected at high mass resolving power (~7000) by magnetic field-peak switching, a configuration in which all molecular ion mass interferences are quantitatively resolved (Fig. DR1). A normal incidence electron gun was used to achieve charge compensation during the analyses and the energy bandpass of the spectrometer was set at 30 ev. Appropriate corrections were subsequently made for electron multiplier dead time and for signal drift during the analysis. Both such corrections were relatively small under the analytical conditions used because the sputter rate was kept low (so as to not degrade the grain too quickly) by defocusing the Cs + beam slightly and using a low current (~150 pa) C 2 12 C 2 H Intensity (counts/sec) C 12 C Mass (amu) Figure. DR1. High mass resolution scan of m/q =24 and m/q =25 regions sputtered from E. Coli standard. Plotted is the logarithm of measured ion intensity (c/s) as a function of mass (i.e., magnetic field setting). The molecular ion interference from C 2 H is well resolved from the 12 C 13 C peak at a mass resolution (m/δm) = ~7000.
4 Instrumental mass fractionation (IMF) was calibrated by use of an E. coli bacterial standard (prepared by C. House, PennState University) which has an established isotopic composition of δ 13 C = (relative to PDB, as are all carbon isotopic data reported here). Previous analyses at UCLA have demonstrated that this biologic standard is homogenous to within ~1 on a micron scale. Ten analyses of randomly selected small (<10-μm-sized) clumps of this E. coli standard yielded an IMF = 2.1 /amu with a standard deviation = 1.5 (1σ standard error = 0.54 ), results consistent with counting statistics and the "in-run" precision on any one clump of such bacteria (reduced χ 2 = 0.94). Prior investigations have documented that SIMS matrix effects, a possible dependence of instrumental fractionation on the analyzed isotopic composition of a sample analyzed, are typically less than a few permil between graphite and biogenic carbonaceous matter (House et al., 2000; McKeegan et al., 1985; Orphan et al., 2002; Sangely et al., 2005). We thus consider that systematic errors in the isotopic compositions reported here, due to instrument effects and/or sample composition, are <5. Carbon isotope data are reported in Table DR1. Shown are the mean count rates for each analyzed spot, the measured ( 13 C 12 C)/ 12 C 2 ratios corrected for a detector deadtime of 25ns and IMF, and the δ 13 C values (relative to PDB) with one standard error of the mean. The larger uncertainty in the second analysis of the graphitic inclusion in Akilia apatite#1 was due to a declining signal, and no further measurements were attempted so as to not completely destroy the specimen. Table DR1. Carbon isotope measurements. Sample C 2 ( 13 C 12 C) / δ 13 C PDB 1 σ (10 5 cts/sec) C 2 ( ) ( ) E. Coli E. Coli E. Coli E. Coli E. Coli E. Coli E. Coli Ak. apatite# Ak. apatite# E. Coli E. Coli E. Coli
5 Additional Images of Graphitic Inclusions in Apatite Examples of two additional apatite grains in thin section G92-197B that contain graphitic inclusions are shown in Figure DR2. The opaque inclusions are identified as graphite by Raman spectra shown in Figure DR3. Figure DR2. Optical photomicrographs of quartz-embedded apatite grains #2 and #3 that contain opaque inclusions shown by Raman spectroscopy (Fig. DR3) to be composed of disordered graphite, in the same thin section (G92-197B) of a >3800 Ma quartz-pyroxene supracrustal rock from Akilia, southwest Greenland that contains apatite grain #1; magnification of all parts is shown by the scale in (A). A and B: Photomicrographs of apatite grain #2 at sequentially deeper focal planes showing its opaque graphitic inclusion (arrows). After polishing of the thin section to expose the inclusion in apatite grain #1 for analyses by SIMS, the upper surface of apatite grain #2, ~40 28 μm in size, was situated ~42 μm below the surface of the thin section and the median plane of the ~12 8 μm-sized inclusion was ~21 μm beneath the upper surface of the grain. C and D: Photomicrographs of apatite grain #3 at sequentially deeper focal planes showing the
6 presence of two opaque graphitic inclusions (arrows). After polishing, the upper surface of this ~40 22 μm-sized apatite grain was situated ~6 μm below the surface of the thin section; the median plane of the upper of the two inclusions, an elongate ~3 10 μmsized graphitic body (C, arrow), was ~12 μm beneath the upper surface of the grain; and the median plane of the lower, approximately equant, ~6 8 μm-sized graphitic inclusion (D, arrow) was ~18 μm beneath the upper surface of the grain. Figure DR3. Raman spectra that establish the graphitic composition of the apatite-hosted inclusions illustrated in Fig. DR2. A: The Raman spectrum of the inclusion in apatite grain #2 (denoted by the arrows in Fig. DR2, A and B). B: The spectrum of the upper of the two inclusions in apatite grain #3 (Fig. DR2, C, arrow). C: The spectrum of the lower inclusion in apatite grain #3 (Fig. DR2, B, arrow). The Raman spectra of these three inclusions are similar to one another and closely resemble that of the inclusion in apatite grain #1 (Fig. 2), all exhibiting the G, D', and D" bands characteristic of graphite (at 1587, 1374, and 1621 cm -1, respectively) as well as a broad second-order band at ~2730
7 cm -1 (not shown). The presence of the D' and D" bands in the spectrum of the inclusion in apatite grain #2 (A, the uppermost of the three spectra), like that of the same bands in the spectrum of the graphitic inclusion in apatite grain #1 (Fig. 2), shows that this carbonaceous matter has a moderately disordered crystal structure. The somewhat more narrow and less intense D' and D" bands in the spectra of the inclusions in apatite grain #3 (B and C, the lower two of the three spectra) and the bifurcation of the G band (evident especially in C, the spectrum of the lower inclusion in apatite grain #3), indicate that the carbonaceous material of these inclusions, though not crystalline graphite, is more graphitized than that in apatite grains #1 and #2. Three-dimensional Raman Images of Apatite #1 and surrounding Quartz Figure DR4. Three dimensional Raman image of Apatite #1; see also video presentation in the Data Repository.
8 REFERENCES House, C.H., Schopf, J.W., McKeegan, K.D., Coath, C.D., Harrison, T.M., and Stetter, K.O., 2000, Carbon isotopic composition of individual Precambrian microfossils: Geology, v. 28, p McKeegan, K.D., Walker, R.M., and Zinner, E., 1985, Ion microprobe isotopic measurements of individual interplanetary dust particles: Geochimica et Cosmochimica Acta, v. 49, p Orphan, V.J., House, C.H., Hinrichs, K.U., McKeegan, K.D., and DeLong, E.F., 2002, Multiple archaeal groups mediate methane oxidation in anoxic cold seep sediments: Proceedings of the National Academy of Sciences of the United States of America, v. 99, p Sangely, L., Chaussidon, M., Michels, R., and Huault, V., 2005, Microanalysis of carbon isotope composition in organic matter by secondary ion mass spectrometry: Chemical Geology, v. 223, p Schopf, J.W., and Kudryavtsev, A.B., 2005, Three-dimensional Raman imagery of Precambrian microscopic organisms: Geobiology, v. 3, p Schopf, J.W., Kudryavtsev, A.B., Agresti, D.G., Wdowiak, T.J., Czaja, A.D., 2002, Laser-Raman imagery of Earth's earliest fossils: Nature, v. 416, p
9 3-D D Raman Image, Apatite Grain #1 2-D D Optical Images Viewed from Top Quartz Apatite Graphite 10 μm Graphite 10 μm Quartz 3-D Apatite Raman Image Viewed from Side K. D. McKeegan, A. B. Kudryavtsev, and J. W. Schopf. Raman and ion microscopic imagery of graphitic inclusions in apatite from >3830 Ma Akilia supracrustals, West Greenland 1
10 3-D D Raman Image, Apatite Grain #1 2-D D Optical Images Viewed from Top Quartz Apatite Graphite 3-D Raman Image Viewed from Side Quartz Apatite Graphite 10 μm 10 μm 2
3.2 Ga detrital uraninite in the Witwatersrand Basin, South. Africa: Evidence of a reducing Archean atmosphere
GSA Data Repository 2018085 https://doi.org/10.1130/g39957.1 1 2 3 4 3.2 Ga detrital uraninite in the Witwatersrand Basin, South Africa: Evidence of a reducing Archean atmosphere Ian Burron 1, Giuliana
More informationSupporting Online Material for
www.sciencemag.org/cgi/content/full/1142021/dc1 Supporting Online Material for Remnants of the Early Solar System Water Enriched in Heavy Oxygen Isotopes Naoya Sakamoto, Yusuke Seto, Shoichi Itoh, Kiyoshi
More informationLAACHER SEE REVISITED: HIGH SPATIAL RESOLUTION ZIRCON DATING IMPLIES RAPID FORMATION OF A ZONED MAGMA CHAMBER -
LAACHER SEE REVISITED: HIGH SPATIAL RESOLUTION ZIRCON DATING IMPLIES RAPID FORMATION OF A ZONED MAGMA CHAMBER - DATA REPOSITORY ANALYTICAL PROCEDURES Ion microprobe U-Th measurements Th-U dating was performed
More informationHiden SIMS Secondary Ion Mass Spectrometers. Analysers for surface, elemental and molecular analysis
Hiden SIMS Secondary Ion Mass Spectrometers Analysers for surface, elemental and molecular analysis vacuum analysis surface science plasma diagnostics gas analysis SIMS Versatility SIMS is a high sensitivity
More informationPHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy
PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray
More informationEvidence for cavity-dwelling microbial life in 3.22 Ga tidal deposits
GSA Data Repository 2016012 Evidence for cavity-dwelling microbial life in 3.22 Ga tidal deposits Homann, M., Heubeck, C., Bontognali, R.R., Bouvier A.-S., Baumgartner L.P., and Airo, A. Geology, 2015
More informationSecondary Ion Mass Spectrometry (SIMS)
CHEM53200: Lecture 10 Secondary Ion Mass Spectrometry (SIMS) Major reference: Surface Analysis Edited by J. C. Vickerman (1997). 1 Primary particles may be: Secondary particles can be e s, neutral species
More informationTECHNIC A L WORK ING GROUP ITWG GUIDELINE ON SECONDARY ION MASS SPECTROMETRY (SIMS)
NUCLE A R FORENSIC S INTERN ATION A L TECHNIC A L WORK ING GROUP ITWG GUIDELINE ON SECONDARY ION MASS SPECTROMETRY (SIMS) EXECUTIVE SUMMARY Secondary Ion Mass Spectrometry (SIMS) is used for elemental
More informationHadean diamonds in zircon from Jack Hills, Western Australia
Hadean diamonds in zircon from Jack Hills, Western Australia Martina Menneken 1, Alexander A. Nemchin 2, Thorsten Geisler 1, Robert T. Pidgeon 2 & Simon A. Wilde 2 1 Institut fur Mineralogie, WestfalischeWilhelms-Universitat,
More informationObservations Regarding Automated SEM and SIMS Analysis of Minerals. Kristofor Ingeneri. April 22, 2009
Observations Regarding Automated SEM and SIMS Analysis of Minerals Kristofor Ingeneri April 22, 2009 Forensic Geoscience A field of inquiry that utilizes techniques developed in the geosciences (geology,
More informationSecondary Ion Mass Spectroscopy (SIMS)
Secondary Ion Mass Spectroscopy (SIMS) Analyzing Inorganic Solids * = under special conditions ** = semiconductors only + = limited number of elements or groups Analyzing Organic Solids * = under special
More informationDATA REPOSITORY ITEM: METAMORPHIC-AGE DATA AND TEXTURES
Berman et al. - page 1 DATA REPOSITORY ITEM: METAMORPHIC-AGE DATA AND TEXTURES This data repository contains details of pressure (P) - temperature (T) and age methods and data (Tables DR1, DR2, DR3). Figures
More informationApplication of NanoSIMS on Organo Mineral Structures
Application of NanoSIMS on Organo Mineral Structures Carmen Höschen*, Carsten W. Mueller, Katja Heister, Johann Lugmeier and Ingrid Kögel-Knabner Lehrstuhl für Bodenkunde, TU München, 85350 Freising-Weihenstephan,
More informationA guide to SIMS targeting in difficult samples. WiscSIMS. Department of Geoscience University of Wisconsin-Madison
A guide to SIMS targeting in difficult samples WiscSIMS Department of Geoscience University of Wisconsin-Madison images and text by K.H. Williford, 2012 A zero point is chosen and photographed at low magnification
More informationobject objective lens eyepiece lens
Advancing Physics G495 June 2015 SET #1 ANSWERS Field and Particle Pictures Seeing with electrons The compound optical microscope Q1. Before attempting this question it may be helpful to review ray diagram
More informationHigh Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni
High Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni K. N. Altmann, D. Y. Petrovykh, and F. J. Himpsel Department of Physics, University of Wisconsin, Madison, 1150
More informationFIB - SIMS. Focussed Ion Beam Secondary Ion Mass Spectrometry.
FIB - SIMS Focussed Ion Beam Secondary Ion Mass Spectrometry Outline Introduction to Hiden Analytical Introduction to SIMS FIB-SIMS - Introduction and key features FIB-SIMS - Applications data Hiden SIMS
More informationA DIVISION OF ULVAC-PHI
A DIVISION OF ULVAC-PHI X-ray photoelectron spectroscopy (XPS/ESCA) is the most widely used surface analysis technique and has many well established industrial and research applications. XPS provides
More informationTransmission Electron Microscopy
L. Reimer H. Kohl Transmission Electron Microscopy Physics of Image Formation Fifth Edition el Springer Contents 1 Introduction... 1 1.1 Transmission Electron Microscopy... 1 1.1.1 Conventional Transmission
More informationSecondary ion mass spectrometry (SIMS)
Secondary ion mass spectrometry (SIMS) ELEC-L3211 Postgraduate Course in Micro and Nanosciences Department of Micro and Nanosciences Personal motivation and experience on SIMS Offers the possibility to
More informationGSA Data Repository
GSA Data Repository 2017248 Das et al., 2017, In situ peridotitic diamond in Indus ophiolite sourced from hydrocarbon fluids in the mantle transition zone: Geology, doi:10.1130/g39100.1 Figure DR1. A:
More informationModern Optical Spectroscopy
Modern Optical Spectroscopy X-Ray Microanalysis Shu-Ping Lin, Ph.D. Institute of Biomedical Engineering E-mail: splin@dragon.nchu.edu.tw Website: http://web.nchu.edu.tw/pweb/users/splin/ Backscattered
More informationX Rays & Crystals. Characterizing Mineral Chemistry & Structure. J.D. Price
X Rays & Crystals Characterizing Mineral Chemistry & Structure J.D. Price Light - electromagnetic spectrum Wave behavior vs. particle behavior If atoms are on the 10-10 m scale, we need to use sufficiently
More informationGSA Data Repository Item Wacey et al.
GSA Data Repository Item 2015025 Wacey et al. Figure DR1. Occurrence of putative framboidal pyrite from the late Ediacaran of the Catalina Dome, Bonavista Peninsula, Newfoundland (sample WM1, c. 560 Ma
More informationX-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu
X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-ray Photoelectron Spectroscopy Introduction Qualitative analysis Quantitative analysis Charging compensation Small area analysis and XPS imaging
More informationLecture 22 Ion Beam Techniques
Lecture 22 Ion Beam Techniques Schroder: Chapter 11.3 1/44 Announcements Homework 6/6: Will be online on later today. Due Wednesday June 6th at 10:00am. I will return it at the final exam (14 th June).
More informationSecondary Ion Mass Spectrometry (SIMS) Thomas Sky
1 Secondary Ion Mass Spectrometry (SIMS) Thomas Sky Depth (µm) 2 Characterization of solar cells 0,0 1E16 1E17 1E18 1E19 1E20 0,2 0,4 0,6 0,8 1,0 1,2 P Concentration (cm -3 ) Characterization Optimization
More informationAPPENDICES. Appendix 1
Corthouts, T.L., Lageson, D.R., and Shaw, C.A., 2016, Polyphase deformation, dynamic metamorphism and metasomatism of Mount Everest s summit limestone, east central Himalaya, Nepal/Tibet: Lithosphere,
More informationElectronic Supplementary Information
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C. This journal is The Royal Society of Chemistry 2017 Electronic Supplementary Information Polymorphism and microcrystal shape
More informationThe design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis
The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis Tim Nunney The world leader in serving science 2 XPS Surface Analysis XPS +... UV Photoelectron Spectroscopy UPS He(I)
More informationSupplementary Information
Supplementary Information Supplementary Figures Supplementary figure S1: Characterisation of the electron beam intensity profile. (a) A 3D plot of beam intensity (grey value) with position, (b) the beam
More informationGold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS
Supporting Information Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Kamran Khajehpour,* a Tim Williams, b,c Laure Bourgeois b,d and Sam Adeloju a
More informationCharacterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev
Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,
More informationElectron beam scanning
Electron beam scanning The Electron beam scanning operates through an electro-optical system which has the task of deflecting the beam Synchronously with cathode ray tube which create the image, beam moves
More informationRecord of ancient Martian hydrosphere preserved in zircon from a Martian meteoritie
SUPPLEMENTARY INFORMATION DOI: 1.138/NGEO2231 Record of ancient Martian hydrosphere preserved in zircon from a Martian meteoritie A. A. Nemchin 1,2, M. Humayun 3, M. J. Whitehouse 1, R. H. Hewins 4,5,
More informationSecondary ion mass spectrometry (SIMS)
Secondary ion mass spectrometry (SIMS) Lasse Vines 1 Secondary ion mass spectrometry O Zn 10000 O 2 Counts/sec 1000 100 Li Na K Cr ZnO 10 ZnO 2 1 0 20 40 60 80 100 Mass (AMU) 10 21 10 20 Si 07 Ge 0.3 Atomic
More informationMethods of surface analysis
Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice
More informationRosetta/COSIMA: High Resolution In-Situ Dust Analysis at Comet 67P/Churyumov- Gerasimenkov
Rosetta/COSIMA: High Resolution In-Situ Dust Analysis at Comet 67P/Churyumov- Gerasimenkov H. Krüger [1], C. Engrand [2], H. Fischer [1], M. Hilchenbach [1], K. Hornung [3], J. Kissel [1], T. Stephan [4],
More informationMEMS Metrology. Prof. Tianhong Cui ME 8254
MEMS Metrology Prof. Tianhong Cui ME 8254 What is metrology? Metrology It is the science of weights and measures Refers primarily to the measurements of length, weight, time, etc. Mensuration- A branch
More informationRigidity transitions in glasses driven by changes in network dimensionality and. structural groupings Supplementary Material
Rigidity transitions in glasses driven by changes in network dimensionality and structural groupings Supplementary Material K. Vignarooban, P. Boolchand, M. Micoulaut, M. Malki, W. Bresser In this part,
More informationAtomic Force Microscopy Characterization of Room- Temperature Adlayers of Small Organic Molecules through Graphene Templating
Atomic Force icroscopy Characterization of Room- Temperature Adlayers of Small Organic olecules through Graphene Templating Peigen Cao, Ke Xu,2, Joseph O. Varghese, and James R. Heath *. Kavli Nanoscience
More informationAuger Electron Spectroscopy
Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection
More informationSnowy Range Instruments
Snowy Range Instruments Cary 81 2000 W Hg Arc JY U-1000 5 W Ar + Laser DL Solution 852 200 mw SnRI CBEx 785 100 mw What is Raman Spectroscopy? Raman spectroscopy is a form of molecular spectroscopy. It
More informationSecondary Ion Mass Spectrometry (SIMS) for Surface Analysis
Secondary Ion Mass Spectrometry (SIMS) for Surface Analysis General overview of SIMS - principles, ionization, advantages & limitations SIMS as a surface analysis technique - operation modes, information
More informationMSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
More informationToF-SIMS or XPS? Xinqi Chen Keck-II
ToF-SIMS or XPS? Xinqi Chen Keck-II 1 Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Not ToF MS (laser, solution) X-ray Photoelectron Spectroscopy (XPS) 2 3 Modes of SIMS 4 Secondary Ion Sputtering
More informationand Environmental Science Centre
1. Purpose The purpose of this document is to familiarize the user with the mode of function of the FT-Raman available at the facility, and to describe the sampling procedure. 2. Introduction Raman spectroscopy
More informationConfocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown and Twiss Photon Antibunching Setup
1 Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown and Twiss Photon Antibunching Setup Abstract Jacob Begis The purpose of this lab was to prove that a source of light can be
More informationMulti-technique photoelectron spectrometer for micro-area spectroscopy and imaging
Multi-technique photoelectron spectrometer for micro-area spectroscopy and imaging U. Manju, M. Sreemony and A. K. Chakraborty In this note we present the new multipurpose photoelectron spectroscopy facility
More informationCombining High Resolution Optical and Scanning Probe Microscopy
Combining High Resolution Optical and Scanning Probe Microscopy Fernando Vargas WITec, Ulm, Germany www.witec.de Company Background Foundation 1997 by O. Hollricher, J. Koenen, K. Weishaupt WITec = Wissenschaftliche
More informationSUPPLEMENTARY INFORMATION
SUPPLEMENTARY INFORMATION Extreme oxygen isotope anomaly with a solar origin detected in meteoritic organics Ko Hashizume, Naoto Takahata, Hiroshi Naraoka & Yuji Sano Supplementary Discussions Basic descriptions
More informationMSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
More informationSecondaryionmassspectrometry
Secondaryionmassspectrometry (SIMS) 1 Incident Ion Techniques for Surface Composition Analysis Mass spectrometric technique 1. Ionization -Electron ionization (EI) -Chemical ionization (CI) -Field ionization
More informationEDS Mapping. Ian Harvey Fall Practical Electron Microscopy
EDS Mapping Ian Harvey Fall 2008 1 From: Energy Dispersive X-ray Microanalysis, An Introduction Kevex Corp. 1988 Characteristic X-ray generation p.2 1 http://www.small-world.net/efs.htm X-ray generation
More informationShedding New Light on Materials Science with Raman Imaging
Shedding New Light on Materials Science with Raman Imaging Robert Heintz, Ph.D. Senior Applications Specialist 1 The world leader in serving science Raman Imaging Provides More Information Microscope problems
More informationFor more information, please contact: or +1 (302)
Introduction Graphene Raman Analyzer: Carbon Nanomaterials Characterization Dawn Yang and Kristen Frano B&W Tek Carbon nanomaterials constitute a variety of carbon allotropes including graphene, graphene
More informationUsing Calibrated Specular Reflectance Standards for Absolute and Relative Reflectance Measurements
Using Calibrated Specular Reflectance Standards for Absolute and Relative Reflectance Measurements Applications Overview here are two fundamental techniques for measuring specular reflectance with a UV/VIS/NIR
More informationLaboratory 3: Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown, and Twiss Setup for Photon Antibunching
Laboratory 3: Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown, and Twiss Setup for Photon Antibunching Jonathan Papa 1, * 1 Institute of Optics University of Rochester, Rochester,
More informationSecondary Ion Mass Spectrometry (SIMS) for Surface Analysis
Secondary Ion Mass Spectrometry (SIMS) for Surface Analysis General overview of SIMS - principles, ionization, advantages & limitations SIMS as a surface analysis technique - operation modes, information
More informationAuger Electron Spectroscopy (AES)
1. Introduction Auger Electron Spectroscopy (AES) Silvia Natividad, Gabriel Gonzalez and Arena Holguin Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving
More informationGSA DATA REPOSITORY Topuz et al. ANALYTICAL PROCEDURE
GSA DATA REPOSITORY 2013062 Topuz et al. ANALYTICAL PROCEDURE 40 Ar/ 39 Ar Dating Samples were selected, prepared and analysed following procedures described in Rolland et al. (2008). Pure white mica and
More informationSCI. Scientific Computing International. Scientific Computing International. FilmTek. Raising Thin Film Metrology Performance to a New Level
FilmTek Raising Thin Film Metrology Performance to a New Level 1 Through Silicon Via (TSV) Metrology FilmTek TM TM TSV TSV Metrology Advantages Measure high aspect ratio TSV structures (up to 30:1) Measure
More informationSupporting information
Supporting information Vacuum ultraviolet laser desorption/ionization mass spectrometry imaging of single cells with submicron craters Jia Wang, 1, + Zhaoying Wang, 2, + Feng Liu, 1 Lesi Cai, 2 Jian-bin
More informationUV-Vis optical fiber assisted spectroscopy in thin films and solutions
UV-Vis optical fiber assisted spectroscopy in thin films and solutions Description UV-Visible absorption and transmission spectra provide fundamental information for all experiments related to the attenuation
More informationAuger Analyses Using Low Angle Incident Electrons
Auger Analyses Using Low Angle Incident Electrons Kenichi Tsutsumi, Yuji agasawa and Toyohiko Tazawa Electron ptics Division, JEL Ltd. Introduction Auger Electron Spectroscopy (AES) is widely used, as
More informationSet-up for ultrafast time-resolved x-ray diffraction using a femtosecond laser-plasma kev x-ray-source
Set-up for ultrafast time-resolved x-ray diffraction using a femtosecond laser-plasma kev x-ray-source C. Blome, K. Sokolowski-Tinten *, C. Dietrich, A. Tarasevitch, D. von der Linde Inst. for Laser- and
More informationIf you are searching for a book Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan (Springer
Secondary Ion Mass Spectrometry Sims IV: Proceedings Of The Fourth International Conference, Osaka, Japan (Springer Series In Chemical Physics 36) By A. Benninghoven;J. Okano;R. Shimizu READ ONLINE If
More information( 1+ A) 2 cos2 θ Incident Ion Techniques for Surface Composition Analysis Ion Scattering Spectroscopy (ISS)
5.16 Incident Ion Techniques for Surface Composition Analysis 5.16.1 Ion Scattering Spectroscopy (ISS) At moderate kinetic energies (few hundred ev to few kev) ion scattered from a surface in simple kinematic
More informationDamage to Molecular Solids Irradiated by X-ray Laser Beam
WDS'11 Proceedings of Contributed Papers, Part II, 247 251, 2011. ISBN 978-80-7378-185-9 MATFYZPRESS Damage to Molecular Solids Irradiated by X-ray Laser Beam T. Burian, V. Hájková, J. Chalupský, L. Juha,
More informationConfocal Microscope Imaging of Single emitter fluorescence and Observing Photon Antibunching Using Hanbury Brown and Twiss setup. Lab.
Submitted for the partial fulfilment of the course PHY 434 Confocal Microscope Imaging of Single emitter fluorescence and Observing Photon Antibunching Using Hanbury Brown and Twiss setup Lab. 3 and 4
More informationCalibration of the IXPE Instrument
Calibration of the IXPE Instrument Fabio Muleri (INAF-IAPS) On behalf of the IXPE Italian Team 13th IACHEC Meeting 2018 Avigliano Umbro (Italy), 9-12 April 2018 IXPE MISSION IXPE will (re-)open the polarimetric
More informationLab 3-4 : Confocal Microscope Imaging of Single-Emitter Fluorescence and Hanbury-Brown and Twiss Set Up, Photon Antibunching
Lab 3-4 : Confocal Microscope Imaging of Single-Emitter Fluorescence and Hanbury-Brown and Twiss Set Up, Photon Antibunching Mongkol Moongweluwan 1 1 Department of Physics and Astronomy, University of
More informationUltrafast Dynamics and Single Particle Spectroscopy of Au-CdSe Nanorods
Supporting Information Ultrafast Dynamics and Single Particle Spectroscopy of Au-CdSe Nanorods G. Sagarzazu a, K. Inoue b, M. Saruyama b, M. Sakamoto b, T. Teranishi b, S. Masuo a and N. Tamai a a Department
More informationA synthetic standard for the analysis of carbon isotopes of carbon in silicates, and the observation of a significant water associated matrix effect
DOI 10.1186/s12932-015-0029-x METHODOLOGY Open Access A synthetic standard for the analysis of carbon isotopes of carbon in silicates, and the observation of a significant water associated matrix effect
More informationResearch Article Raman Microimaging Using a Novel Multifiber-Based Device: A Feasibility Study on Pharmaceutical Tablets
International Spectroscopy Volume 202, Article ID 959235, 5 pages doi:0.55/202/959235 Research Article Raman Microimaging Using a Novel Multifiber-Based Device: A Feasibility Study on Pharmaceutical Tablets
More informationElectron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn?
Electron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn? EPMA - what is it? Precise and accurate quantitative chemical analyses of micron-size
More informationExperiment AM3b: Raman scattering in transparent solids and liquids
Physics 6180: Graduate Physics Laboratory Experiment AM3b: Raman scattering in transparent solids and liquids Objectives: To learn the essentials of inelastic light scattering, particularly Raman scattering
More informationSetting The motor that rotates the sample about an axis normal to the diffraction plane is called (or ).
X-Ray Diffraction X-ray diffraction geometry A simple X-ray diffraction (XRD) experiment might be set up as shown below. We need a parallel X-ray source, which is usually an X-ray tube in a fixed position
More informationRamanStation 400: a Versatile Platform for SERS Analysis
FIELD APPLICATION REPORT Raman Spectroscopy Author: Dean H. Brown PerkinElmer, Inc. Shelton, CT USA RamanStation 400 RamanStation 400: a Versatile Platform for SERS Analysis Introduction Surface Enhanced
More informationSurface Science Spectra
Surface Science Spectra WCF Submission 226 Proof - SSS Submission # 14-015 (20141102)V22 Analysis of Silicon Germanium Standards for the Quantification of SiGe Microelectronic Devices using AES SECTION
More informationSurface Analysis. Dr. Lynn Fuller Dr. Fuller s Webpage:
ROCHESTER INSTITUTE OF TECHNOLOGY MICROELECTRONIC ENGINEERING Surface Analysis Dr. Lynn Fuller Dr. Fuller s Webpage: http://people.rit.edu/lffeee 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585)
More informationOverview of X-Ray Fluorescence Analysis
Overview of X-Ray Fluorescence Analysis AMPTEK, INC., Bedford, MA 01730 Ph: +1 781 275 2242 Fax: +1 781 275 3470 sales@amptek.com 1 What is X-Ray Fluorescence (XRF)? A physical process: Emission of characteristic
More informationPHI. Scanning XPS Microprobe
PHI Scanning XPS Microprobe Unique Scanning XPS Microprobe X-ray photoelectron spectroscopy (XPS/ESA) is the most widely used surface analysis technique and has many well established industrial and research
More informationEverhart-Thornley detector
SEI Detector Everhart-Thornley detector Microscope chamber wall Faraday cage Scintillator Electrons in Light pipe Photomultiplier Electrical signal out Screen Quartz window +200 V +10 kv Always contains
More informationIONTOF. Latest Developments in 2D and 3D TOF-SIMS Analysis. Surface Analysis Innovations and Solutions for Industry 2017 Coventry
Latest Developments in 2D and 3D TOF-SIMS Analysis Surface Analysis Innovations and Solutions for Industry 2017 Coventry 12.10.2017 Matthias Kleine-Boymann Regional Sales Manager matthias.kleine-boymann@iontof.com
More informationLet us consider a typical Michelson interferometer, where a broadband source is used for illumination (Fig. 1a).
7.1. Low-Coherence Interferometry (LCI) Let us consider a typical Michelson interferometer, where a broadband source is used for illumination (Fig. 1a). The light is split by the beam splitter (BS) and
More informationBasic structure of SEM
Table of contents Basis structure of SEM SEM imaging modes Comparison of ordinary SEM and FESEM Electron behavior Electron matter interaction o Elastic interaction o Inelastic interaction o Interaction
More informationAnalysis of Poly(dimethylsiloxane) on Solid Surfaces Using Silver Deposition/TOF-SIMS
Special Issue Surface and Micro-Analysis of Organic Materials 21 Research Report Analysis of Poly(dimethylsiloxane) on Solid Surfaces Using Silver Deposition/TOF-SIMS Masae Inoue, Atsushi Murase Abstract
More informationInvestigations on warm dense plasma with PHELIX facility
2 nd EMMI Workshop on Plasma Physics with Intense Laser and Heavy Ion Beams, May 14-15, Moscow Investigations on warm dense plasma with PHELIX facility S.A. Pikuz Jr., I.Yu. Skobelev, A.Ya. Faenov, T.A.
More informationMetcalf and Buck. GSA Data Repository
GSA Data Repository 2015035 Metcalf and Buck Figure DR1. Secondary ionization mass-spectrometry U-Pb zircon geochronology plots for data collected on two samples of Wilson Ridge plutonic rocks. Data presented
More informationTh) ) dating of micro-baddeleyite
U-Pb (and U-ThU Th) ) dating of micro-baddeleyite 30 μm Axel K. Schmitt UCLA SIMS, NSF National Ion Microprobe Facility Collaborators: T. Mark Harrison (UCLA) Kevin Chamberlain (University of Wyoming)
More informationGraphene films on silicon carbide (SiC) wafers supplied by Nitride Crystals, Inc.
9702 Gayton Road, Suite 320, Richmond, VA 23238, USA Phone: +1 (804) 709-6696 info@nitride-crystals.com www.nitride-crystals.com Graphene films on silicon carbide (SiC) wafers supplied by Nitride Crystals,
More informationSurface analysis techniques
Experimental methods in physics Surface analysis techniques 3. Ion probes Elemental and molecular analysis Jean-Marc Bonard Academic year 10-11 3. Elemental and molecular analysis 3.1.!Secondary ion mass
More informationHigh-Resolution. Transmission. Electron Microscopy
Part 4 High-Resolution Transmission Electron Microscopy 186 Significance high-resolution transmission electron microscopy (HRTEM): resolve object details smaller than 1nm (10 9 m) image the interior of
More informationScience Drivers. Spectroscopic Sensors. In Situ Sensors. Development of autonomous and remote platforms
Science Drivers In Situ Sensors Spectroscopic Sensors Development of autonomous and remote platforms ROVs, AUVs Cabled observatories Desire to analyze targets with discrete stability regions in the deep
More informationSupplementary Information. Back-Contacted Hybrid Organic-Inorganic Perovskite Solar Cells
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C. This journal is The Royal Society of Chemistry 2016 Journal of Materials Chemistry C Supplementary Information Back-Contacted
More informationChamber Development Plan and Chamber Simulation Experiments
Chamber Development Plan and Chamber Simulation Experiments Farrokh Najmabadi HAPL Meeting November 12-13, 2001 Livermore, CA Electronic copy: http://aries.ucsd.edu/najmabadi/talks UCSD IFE Web Site: http://aries.ucsd.edu/ife
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationInstrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
More informationA DIVISION OF ULVAC-PHI. Quantera II. Scanning XPS Microprobe
A DIVISION OF ULVAC-PHI Quantera II Scanning XPS Microprobe X-ray Photoelectron Spectroscopy (XPS/ESCA) is the most widely used surface analysis technique and has many well established industrial and
More information