A guide to SIMS targeting in difficult samples. WiscSIMS. Department of Geoscience University of Wisconsin-Madison

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Gertrude Matthews
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1 A guide to SIMS targeting in difficult samples WiscSIMS Department of Geoscience University of Wisconsin-Madison images and text by K.H. Williford, 2012

A zero point is chosen and photographed at low magnification in reflected light, and again a t t h e s a m e ( h i g h e r ) magnification that will be u s e d t o l o g t a r g e t coordinates (see

2 A zero point is chosen and photographed at low magnification in reflected light, and again a t t h e s a m e ( h i g h e r ) magnification that will be u s e d t o l o g t a r g e t coordinates (see pg. 2). Target coordinates are logged relative to this point (0,0), often a corner of a standard grain near center of the sample. Red cross hairs in this and following images indicate target of interest. 1

This is the zero point photographed at the same magnification (e.g., 20x objective with 10x ocular) u s e d t o l o g t a r g e t coordinates and similar to the field of view on the SIMS microscope targeting system (see pg.

3 This is the zero point photographed at the same magnification (e.g., 20x objective with 10x ocular) u s e d t o l o g t a r g e t coordinates and similar to the field of view on the SIMS microscope targeting system (see pg. 14). The digital stage is set to 0,0 h e r e, a n d t a r g e t coordinates are logged relative to this point. We navigate to this point o n t h e S I M S a n d r e c a l c u l a t e t a r g e t coordinates relative to the coordinates of this point on the SIMS. 2

4 Target area 1 F i l a m e n t o u s P r o t e r o z o i c m i c r o f o s s i l s i n c h e r t, photographed in transmitted light. A backscattered electron image of target #1a is shown on the following page. In transparent or translucent materials (e.g., chert or quartzite), surface exposure of targets should be verified by reflected light microscopy and electron microscopy. 1b 1a 3

5 Target #1a F i l a m e n t o u s P r o t e r o z o i c microfossil in chert ( s h o w n i n transmitted light, pg. 3), intersecting the surface of a thin section and imaged at high magnification in backscatter mode o n a s c a n n i n g e l e c t r o n m i c r o s c o p e t o show distribution of organic matter at the surface of the sample. 4

6 Target #1a After gold coating and loading the sample into the S I M S s a m p l e h o l d e r, targets are photographed in reflected light (e.g., using a 20x objective), and a l l c o o r d i n a t e s a r e relogged to account for any rotation that occurs between initial targeting and inserting sample into S I M S s a m p l e h o l d e r. These coordinates, relative to the zero point are used for targeting on the SIMS, and surface features shown in this image are u s e d f o r a i m i n g. N o organic matter, and few surface features are visible on the surface of this chert sample after gold coating, and care must be taken to acquire sufficient reflected and transmitted (where appropriate) light, as well as backscattered and secondary electron images at various magnifications so that features can be recognized on the SIMS optical system. Faint surface features used f o r t a r g e t i n g ( b y triangulation): i.e., target is o n a l i n e c o n n e c t i n g features a and b, and a c e r t a i n d i s t a n c e f r o m feature c, calculated in a relative sense between this image and image on SIMS optical system. a c Position of microfossil target #1a b 5

7 Target #1b 6

8 Target #1b target #1a target #1b 7

9 Target area 2 2a 2b 8

10 Target #2a 9

11 Target #2a target #2a target #2b 100 μm 10

12 Target #2b 11

13 Target #2a target #2a target #2b 100 μm 12

Example publication figure showing transmitted light (a, b), secondary electron (c), and backscattered electron (d) images of representative target (2a).

14 Example publication figure showing transmitted light (a, b), secondary electron (c), and backscattered electron (d) images of representative target (2a). Panels c and b are enlargement of target #2a, shown before and after analysis in in panels a and b, respectively. Panel b shows analytical pit, and δ 13 C value ( VPDB) of this microfossil is indicated. High magnification backscattered electron post-analysis pit images of all targets are published in a supplement. 13

15 Screen capture from the SIMS microscope t a rg e t i n g s y s t e m (field of view 450 μ m ) s h o w i n g 1 5 micrometer spot after analysis. Note the difference in image quality between the SIMS optical system a n d a d e d i c a t e d r e fl e c t e d l i g h t microscope (pg. 1-2), a factor that can c o n t r i b u t e t o difficulty in targeting during the analytical session. 200 μm 15 micrometer spot after analysis. Cesium deposition and beam damage to the coating around the pit causes the spot to appear larger than 15 micrometers. spots made to locate beam position surface features used for aiming 14

Electron beam scanning

Electron beam scanning The Electron beam scanning operates through an electro-optical system which has the task of deflecting the beam Synchronously with cathode ray tube which create the image, beam moves