EEE2146 Microelectronics Circuit Analysis and Design. MIC2: Investigation of Amplifier Parameters of a Common-Collector Amplifier

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1 EEE2146 Mcelectncs Ccut Analyss and Desgn Expement MIC2 MIC2: Inestgatn f Amplfe Paametes f a Cmmn-Cllect Amplfe Ttal Pecentage: 5% (Fm 40% Cusewk Mak) 1. Objecte T nestgate the ltage and cuent gans and nput and utput mpedances wth espect t dffeent peatng cndtns f a cmmn-cllect amplfe. T detemne the tansst paametes β, π and alues at dffeent basng cndtns. 2. sts f Equpments and Cmpnents Equpments Qty. Cmpnents Qty. Adjustable DC pwe supply 1 BJT 2N2222A 1 Functn geneat 1 Capact 10 µf (16 V) 2 Dgtal multmete 1 Ressts (0.25 W) / Ω: 10, 20, 100, Dual-channel scllscpe 1 200, 510, 4.7k, 5.1k, 10k, 6.2k Each ne Beadbad 1 Ressts (0.25 W) 1 kω 2 3. Intductn Fgue 1, Fgue 2 and Fgue 3 shws a cmmn-cllect amplfe ccut, ts smallsgnal equalent ccut and ts equalent ccut wth Theenn s equalent utput ccut. Because f the capacts n the amplfe ccut, the ltage gan mpedance Z and utput mpedance A, cuent gan A, nput Z ae functns f fequency, theefe, they ae ects cmplex numbes. The alues f A, A, Z and Z and the magntudes can be detemned n expement wth the belw equatns. A= A = A= A = Z = Z = R R = A = A Z + R Z + R The equatn f Z s deed accdng t Fgue 3. A s unladed ltage gan (R = ), A s equal t unladed utput ltage. Z + R = ( Z + R )( Z + R) *, whee ( Z + R ) * s the cmplex cnjugate f ( Z + R ). At md-band fequences, whee the effect f the capacts,.e. eactance, s neglgble, A, A, Z and Z ae almst ndependent f fequency,.e. they ae clse t eal numbes, A, A, R and R. The equatns t fnd the alues f A, A, R and R ae gen belw, whee all the cuents and ltages ae almst ndependent f fequency. R A=, A=, R=, = A R + R F futhe nfmatn, yu can efe t lectue ntes any mcelectncs bks. 1 / 4

2 EEE2146 Mcelectncs Ccut Analyss and Desgn Expement MIC2 Fgue 1: A cmmn-cllect amplfe. The ltages, cuents and mpedances (except V CC ) hae magntude and phase. It s the same f thse n Fgue 2 and Fgue 3. Fgue 2: Small-sgnal equalent ccut f the CC amplfe Fgue 3: Equalent ccut f the CE amplfe wth A, Z and Z functn f fequency 4. Expements Wanng: Ensue yu ccut cnnectns, BJT pn cnnectns, DC supply utput ltage and functn geneat utput ltage t ad damage f the BJT. Damage f BJT wll be ecded by the lab staff whch wll be ncluded f the ealuatn f pefmance dung lab sessn. Wanng: In nmal pactce, ad t measue BJT temnal ltages at ts pns. Ths s t ad accdental sht-ccut between base and cllect whch culd bun the base. Cautn: Ensue the Vlts/d and Tme/d Vaable-Cntl knbs f the scllscpe ae at the calbated pstns. Oscllscpe useful nfmatn: CH1 & CH2 nput esstance s 1 MΩ. T measue ey small ltage, pull the Vlts/d Vaable-Cntl knb t get X5 magnfcatn (PU X5 MAG), 5 mv/d 1 mv/d and 10 mv/d 2 mv/d. Calbated utput: squae wae, 1 V peak-t-peak, 1 khz. 2 / 4

EEE2146 Mcelectncs Ccut Analyss and Desgn Expement MIC2 Functn geneat useful nfmatn: Attenuatn buttn (-30 db) s useful f ey small utput ltage ange (0-0.6 V peak-t-peak).

3 EEE2146 Mcelectncs Ccut Analyss and Desgn Expement MIC2 Functn geneat useful nfmatn: Attenuatn buttn (-30 db) s useful f ey small utput ltage ange (0-0.6 V peak-t-peak). BJT pn layut: Geneal Gudelnes (f Sectn 5, 6 and 7): Plan t cay ut yu expements systematcally and effcently (e.g. table f ecdng data, measung pnts, lad cnnectns). Use tables t ecd data & calculated alues. Thee ae many calculatns n Sectn 5, hence yu just need t shw deng equatn wk and descbng calculatn wk (each epeated calculatn wk s nt equed t be shwn). Use gaphs t analyze ecded data and calculated alues n Sectn 6, f necessay. Tables and gaphs ae useful tls t bsee the changes f aables paametes and t cmpae the same aable paamete at dffeent peatng cndtns. Gaph s me sutable than table when the ttal numbe f alues nled s lage. Yu may use MS Excel equalent t plt gaphs. Expemental setup, measuements and data cllectn: (a) Cnstuct the ccut as shwn n Fgue 1, whee V CC = 12 V, R 1 = 4.7 kω, R 2 = 6.2 kω, R E = 510 Ω, R S = 5.1 kω, R = 10 Ω, C 1 = C 2 = 10 µf. Recd ltages V CC, V B and V E (Yu shuld get V CEQ aund 6 V). (b) Wth 0.2 V peak-t-peak (p-p) sne-wae f s (R = 10 Ω), ecd p-p ltages, b, e, and at seeal fequences fm 100 Hz t 50 khz ( may be 9-23 mv & may be 7-19 mv snce β may be If s nt wthn mv, change s. Recd s alue. Use ths s f the est f expements. Check s tme t tme). Take at least 6 data pnts wth abut equal space n lg-scaled fequency-axs. Check yu ltage pbes. Functn geneat sgnal cable can be used as ltage pbe n ths expement. (c) Wth f = 10 khz ( s = 0.2 V p-p), ecd p-p ltages and f R = 10 Ω, 20 Ω, 100 Ω, 200 Ω, 1 kω, 10 kω and. (d) Change R E t 1 kω. Recd ltages V CC, V B and V E (Yu shuld get V CEQ aund 6 V). (e) Fm Pat (d), wth f = 10 khz ( s = 0.2 V p-p), ecd p-p ltages f and f R = 10 Ω, 20 Ω, 100 Ω, 200 Ω, 1 kω and. 5. Analyss Calculate the belw: (a) β and π alues fm Pat 4(a). (b),,, and alues f each ecded fequency fm Pat 4(b). s b (c),, & alues f each R fm Pat 4(c). b (d) β and π alues fm Pat 4(d). (e), & alues f each R fm Pat 4(e). (f) The best R alue fm Pat 4(b) and Pat 4(c). 3 / 4

4 EEE2146 Mcelectncs Ccut Analyss and Desgn Expement MIC2 (g) The best R alue fm Pat 4(e). 6. Dscussns Dscuss n the belw: (a) The calculated esults n Pat 5(b). (b) The calculated esults n Pat 5(c). (c) The calculated esults n Pat 5(c) and Pat 5(e) by cmpasn. (d) The R alues fm Pat 5(f) and Pat 5(g). (e) The capact whch manly caused the fequency espnse f the amplfe f R = 10 Ω and hw the fequency espnse f the amplfe changes when R nceases. (f) The π and alues whch can be calculated fm the AC measuements and analyss. 7. Rept Wte a lab ept cnsstng f expemental esults, analyss, dscussns and cnclusns. Please nclude necessay gaph, table chat. The ept needs t be HANDWRITTEN. Please nclude the standad lab ept ce page. 8. Ealuatn (Based n Rubcs as attached) Refeences: ectue ntes any mcelectncs bks Appendx: g scale ~~ End f ab sheets ~~ Pepaed by: W.O. Sew, N 2013 Updated by: Zubada Yusff, N / 4

5 STUDENT'S NAME: SUBJECT CODE AND TITE: EEE2146 & Mcelectncs Ccut Analyss and Desgn EXPERIMENT TITE: MIC2: Inestgatn f Amplfe Paametes f a Cmmn-Cllect Amplfe 1a Ctea 1 (Need Impement) 2 (Satsfacty) 3 (Gd) 4 (Excellent) Pepaatn befe the ab (bseatn n lab) Ratng Awaded by Assess The ablty t undestand the bjectes Unable t llustate the Able t patally llustate the Able t clealy llustate the Able t clealy llustate the f the lab expement and t pedct bjectes f the lab and able tbjectes f the lab and able tbjectes f the lab and able tbjectes f the lab and able t theetcally n the expemental esultspedct smple expemental pedct up t mdeate pedct up t me cmplcated pedct up t cmplex f the CC amplfe (sme pedctns esults (DC V & I, tansst cmplcated expemental expemental esults (up t A, expemental esults (up t A, ae cmpaate,.e. change f alue) paametes wth DC analyss and fmulas) esults (up t A, A, R & R wth small-sgnal analyss n md-band fequences) A, R & R dependency n R and RE1 wth small-sgnal analyss n md-band fequences) A, Z & Z dependency n fequency wth small-sgnal analyss n lw t mdband fequences) Expemental Setup, Sklls and Dscplnes (bseatn n lab) 1b The ablty t cnstuct the CC amplfe ccut - measued wth tme spent use >60 mn t cnstuct ccut Use >40-60 mn t cnstuct (spent tme n dentfyng ccut esst alues, nt famle wth beadbad, n plannng n cmpnent pstns) Use >20-40 mn t cnstuct ccut (wth neat ccut = eady spaces/ways f cmpnent change/ addtn, eady measuement pnts) Use <=20 mn t cnstuct ccut (wth neat ccut) 1c The ablty t use equpments (DC PS, multmete, functn geneat, scllscpe) - checks/pesets (e.g. DC PS /p cuent lmt, ltage pbe checks, sc buttns & knbs, etc.) & settngs (e.g. settng sutable measuement anges f buttns/knb) Hae sme pblems t use sme functns f DC PS & multmete and nmally used functns f functn geneat & scllscpe (nmally used functns - e.g. set sutable ange, tgge leel adjust, etc.) Able t use all functns f DC PS & multmete and nmally used functns f functn geneat & scllscpe Hae sme pblems t use the Able t use all equpments seldm used functns (e.g. n effcently wthut any pblem ths expement, cmbnatn f case and fne adjustment, x 5 MAG f V/d, etc.) and able t use effcently n the est f functns 1d Data ecdng dscplne and the ablty N data ecdng dscplne Gt data ecdng tables but t justfy the data based n expeence (scatteed data, n data nt tdy (wth mssng nf e.g. and theetcal undestandng ecdng table, n unt, etc.) n unt, etc.) and n bus bus wng ecded alues wngly ecded alues (e.g. (e.g. negate ltage alue, V mstake n multple f V/d) ange but the actual s n mv ange, etc.) Neat data ecdng tables (wthut mssng nf) and easnable/cect data Neat data ecdng tables (wthut mssng nf), easnable/cect data and efcatn nf & they (e.g. tansst spec, analyzed ccuts, deed equatns, standad fmulas, etc.) 1e Panelty - seus cases (1. cases can bun/damage cmpnents, 2. cases may damage/degade cmpnents equpments, 3. cases can cause ccut mulfunctn, 4. cases ae unexpected t happen and less seus) 1. BJT esst - buned, electlytc capact - explded due t wng platy cnnectn: Equpment - wng cnnectn (e.g. DC PS /p t functn geneat /p, PS GND t functn geneat /p, etc.), electlytc capact - wng platy cnnectn but n explsn: Vltage pbe GND - wng cnnectn (e.g. t a ccut ltage pnt, t supply utput, etc.): Othe cases (e.g. esst n paallel wth a we, etc.): -1 Penalty Expemental Results / Data Analyss / Dscussns (n ept) 2 The cectness and cmpleteness f expemental esults/data (all ae ltages) Seus es (e.g. negate Mn es (e.g. n unt, ltage, V ange but the actual mssng cndtnal alues) s n mv ange) >30% mssng <=30% mssng (ncmplete) (ncmplete) Mn es and n mssng data N e and n mssng data Weght: The ablty t analyze expemental data Analyzed <50% f the data Able t analyze 50% t <70% f Able t analyze 70% t <90% f Able t analyze % f the Weght: 1.0 wth CC amplfe small-sgnal ccut cectly >30% f the data s the data cectly <=30% f the data cectly and the ests data cectly and the ests ae analyss knwledge and they (sme nt analyzed the data s nt analyzed ae wngly analyzed (wthut wngly analyzed (wthut nt analyss ae dect, e.g. calculate /, sme ae patally dect, e.g. calculate /) nt analyzed) [encuage t attempt t analyze] analyzed) 4 The ablty t explan/cmment/ dscuss the analyss esults wth CC amplfe small-sgnal ccut analyss knwledge and they (lab sheet has pen-ended questns) Dscussed <40% f the analyss Able t dscuss 40% t <60% f esults cectly >30% f the the analyss esults cectly data s nt dscussed <=30% f the data s nt analyzed Able t dscuss 60% t <80% f the analyss esults cectly and the ests ae wngly dscussed (wthut nt dscussed) Able t dscuss % f the analyss esults cectly and the ests ae wngly dscussed (wthut nt dscussed) Weght: The ablty t summase fnal utcmes Summased <40% f the fnal and dscussns (lab sheet has n utcmes and dscussns gudelne t summase) cectly Cnclusns (n ept) Able t summase 40% t <60% f the fnal utcmes and dscussns cectly Able t summase 60% t Able t summase % f Weght: 0.5 <80% f the fnal utcmes and the fnal utcmes and dscussns cectly dscussns cectly Rept Pesentatn (wtng sklls, ept gansatn, esult pesentatn) 6a The ablty t wte lab ept neatly and systematcally Had t ead, fequent and bus gammatcal and spellng es n lab ept Aeage lab ept (wth sme gammatcal and spellng es, patal systematc gansatn f ept) Gd lab ept (wth lttle gammatcal and spellng es, systematc gansatn) Excellent lab ept (wth ey lttle gammatcal and spellng es, easy t ead ept wth excellent gansatn) 6b The ablty t pesent apppate Unable t pesent apppate Patly able t pesent esults systematcally and neatly (gaph, esults systematcally and apppate esults table, chat, etc.) wth cect unts and neatly systematcally and neatly clea labels Mstly able t pesent apppate esults systematcally and neatly Excellently pesent apppate esults systematcally and neatly Ttal Maks (5%) ate Submssn (penalty) ate-cme AVERAGE MARK (ttal/numbe f ctea) STUDENT'S NAME: SUBMISSION DATE: REPORT SUBMISSION RECEIPT (STUDENT'S COPY) EXPERIMENTA TITE: STUDENT'S NAME: SUBMISSION DATE: STUDENT'S SIGNATURE: ATE SUBMISSION: YES/NO ATE SUBMISSION: YES/NO RECEIVED BY (AB'S STAMP):

T-model: - + v o. v i. i o. v e. R i

T-model: - + v o. v i. i o. v e. R i T-mdel: e gm - V Rc e e e gme R R R 23 e e e gme R R The s/c tanscnductance: G m e m g gm e 0 The nput esstance: R e e e e The utput esstance: R R 0 /c unladed ltage gan, R a g R m e gmr e 0 m e g me e/e