imust Project NSTEM Nanomanipulationwith Simultaneous TEM Observation PNNL, NanoLyon, ILM INL
|
|
|
- Gloria Stafford
- 6 years ago
- Views:
Transcription
1 imust Project NSTEM Nanomanipulationwith Simultaneous TEM Observation PNNL, NanoLyon, ILM INL
2 History and context of the project TEM acquisition Latest results Impact & conclusion
3 TOPCON 002B TEM acquired en 1993 New spare parts no longer available (Topcon ceased commercial activities in electron microscopy) The PNNL plateforme (Plateforme Nanotubes et Nanofils Lyonnaise) started to work on nanomanipulation in SEM et TEM.
4 Nanomanipulation under TEM P. Poncharal developed home made in-situ TEM sample holder Sample (tips) heating up to 1500 K Precision positioning via external microscrew and piezo movements (nm resolution) (mechanical drift) Electrical and piezo mechanical actuation High voltage biasing of the sample (up to 2000 V)
5 Nanomanipulation in the TEM Mechanics Field Emission
6 Nanomanipulation in the TEM Shear Force Apex modification Based on Field Evaporation First observation of Atoms by Muller in 1955
7 Apex modification SiC nanowire PECVD carbon nanotube BN nanotube opened for nanofluidic experiments Si nanowire
8 The NSTEM project In 2013 M. F. Joubert asked us to apply to the 2014 imust call to complete the financing to acquire a new TEM In order to sustain and grow our Nanomanipulation activities in the TEM. Project bringing together several teams from several laboratories The projet was proposed by two plateformes: PNNL and NanoLyon 180 k obtained to complete the TEM financing
9 The NSTEM project Jeol JEM2100, LaB 6 Global budget: euros HT - CNRS HT - UCBL CS HT - Fédération Ingénierie HT, - ILM 570 HT - LGTPE HT HT imust Project 31 % of the budget
10 New results: Electron beam assisted field evaporation. Improving the electrical contact in SEM and TEM for electrical characterization.
11 Electron beam assisted field evaporation. Why do highly insulating materials like BN desorb so easily (sometimes without DC voltage)!!! The electron beam plays a major role in inducing positive charging of the sample (for thin enough sample). I 0 I D I E I S U I 0 V DC
12 Electron beam assisted field evaporation. Why do highly insulating materials like BN desorb so easily (sometimes without DC voltage)!!! Observation of electron beam induced field evaporation of a BN nanotube Successive field evaporation of two close BN nanotubes
13 Electron beam assisted field evaporation. Interest and originality of this method? Considerable effort is currently necessary to characterize samples at the ultimate length scales (which atoms?, their position?,.) TEM et Atom Probe, réseau METSA Thomas Kelly, CAMECA Patent ANR project
14 Improving the electrical contact in SEM and TEM for electrical characterization. Main problem for electrical characterization of nanowires Glue that polymerizes under electron beam irradiation: no contact Connection via metals with low melting temperature
15 Connection via metals with low melting temperature
16 Overview Training users Project Public tender Acceptance This presentation No schematics from JEOL Administrative and customs delay New TEM sample holder with nanomanipulators??
17 Impact INL ILM - Hétéroépitaxie et Nanostructures - Photovoltaïque - Chimie et Nanobiotechnologies - Agrégats et Nanostructures - FemtoNanoOptics - Luminescence - (nano)matériaux pour l'énergie - Nanostructures Magnétiques - Physique des Nanostructures et Emission de Champ - CERA (Matériaux Céramiques et Composites) - METAL (METaux et ALliages) - SNMS (Structures, Nano- et Micro-Structures) - PVMH MATEIS ENS Lyon chimie - Matériaux Fonctionnels et Photonique - Structuration Multi-échelle des Matériaux - Couches Minces LMI GaAsnanowireswith oxidation-proof As capping for the growth of epitaxial shell, X. Guan, J. Becdelievre, A. Benali, C. Botella, G. Grenet, P. Regreny, N. Chauvin, N. P. Blanchard, X. Jaurand, G. Saint-Girons, M. Gendry, J. Penuelas, Nanoscale 8 (2016) GaAscore / SrTiO3 shell nanowiresgrown by Molecular Beam Epitaxy, X. Guan, J. Becdelievre, B. Meunier, A. Benali, G. Saint-Girons, R. Bachelet, P. Regreny, C. Botella, G. Grenet, N.P. Blanchard, X. Jaurand, M. Silly, F Sirotti, M. Gendry, J. Penuelas, Nano Letters 16 (2016)
18 Conclusion Procurement of a new JEOL 2100 microscope Trained users New sample holders with nanometric movements should be ready by the end of the year
19 Acknowledgements: INL: Jean Louis Leclerc, José Penuelas ILM: Nicholas Blanchard, Philippe Poncharal
Oxide Films & Nanostructures on Silicon for Thermal Energy Harvesting in Microelectronic Devices
Oxide Films & Nanostructures on Silicon for Thermal Energy Harvesting in Microelectronic Devices R. Bachelet R. Moalla, A. Carretero-Genevrier, L. Mazet, L. Louahadj, J. Penuelas, B. Vilquin, C. Dubourdieu,
SUPPLEMENTARY INFORMATION
Ultrahigh interlayer friction in multiwalled boron nitride nanotubes 1 Contents Nanotubes production and characterizations 2 Experimental Methods 4 Post mortem characterization of the nanotubes 4 Références
Chapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
(Advanced) FIB sample preparation for (high performance) TEM analysis
(Advanced) FIB sample preparation for (high performance) TEM analysis Bertrand Van de Moortèle Laboratoire de Géologie de Lyon Terre, Planètes, Environnement ENS de Lyon CROSSBEAM MICROSCOPY Metz, June
Thermal behaviour of 2 nanostructures in various gas environments: a combined 3D and in-situ TEM approach
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2018 Supporting Information Thermal behaviour of Pd@SiO 2 nanostructures in various gas environments:
Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur
Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500
AZtec LayerProbe TM. Layer thickness and composition characterisation in the SEM. ...the ultimate non-destructive, high-resolution solution.
AZtec LayerProbe TM EDS Layer thickness and composition characterisation in the SEM...the ultimate non-destructive, high-resolution solution 300 nm 253 nm 198 nm ds AZtec LayerProbe Overview Measure layer
Fullerene growth from encapsulated graphene flakes
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supplementary figures for: Fullerene growth from encapsulated graphene flakes WAN Neng 1, #, LEI
Growing a Carbon Nanotube Atom by Atom: And yet it does turn
Growing a Carbon Nanotube Atom by Atom: And yet it does turn Stephen T. Purcell Mickaël Marchand, Catherine Journet, Dominique Guillot, Jean-Michel Benoit, Boris I. Yakobson (Rice U.) Summary PNEC Activities
ELECTRON MICROSCOPE UNIT
ELECTRON MICROSCOPE Director: Prof Richard Tilley Associate Director: Dr Nicholas Ariotti Lab Manager: Ms Katie Levick Administrative Assistant: Mr Michael Zhi UNIT Basement Level: F10 Chemical Sciences
Chapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
2012/01/20. Thierry EPICIER. MATEIS-CLYM, umr CNRS5510, Director METSA (FR 3507 CNRS) M. AOUINE, JP MILLET et al.
2012/01/20 Thierry EPICIER MATEIS-CLYM, umr CNRS5510, Director METSA (FR 3507 CNRS) thierry.epicier@insa-lyon.fr M. AOUINE, JP MILLET et al. MATERIALS SCIENCES & NANOTECHNOLOGIES HIGH RESOLUTION MICROSCOPY
Y. LIU 1, H. YUAN 1,2, A. BOGNER-VAN DE MOORTELE 1, B. VAN DE MOORTELE 2, T. EPICIER 1
Y. LIU 1, H. YUAN 1,2, A. BOGNER-VAN DE MOORTELE 1, B. VAN DE MOORTELE 2, T. EPICIER 1 1 mm 1 Université de Lyon, INSA-Lyon, MATEIS (CLYM), umr CNRS 5510, F-69621 Villeurbanne Cedex 2 Université de Lyon,
ORION NanoFab: An Overview of Applications. White Paper
ORION NanoFab: An Overview of Applications White Paper ORION NanoFab: An Overview of Applications Author: Dr. Bipin Singh Carl Zeiss NTS, LLC, USA Date: September 2012 Introduction With the advancement
Final exam: take-home part
Final exam: take-home part! List five things that can be done to improve this class. Be specific; give much detail.! (You will be penalized only for insulting comments made for no benefit; you will not
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
![SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]](/thumbs/81/83165631.jpg "SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]")
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions
Other SPM Techniques. Scanning Probe Microscopy HT10
Other SPM Techniques Scanning Near-Field Optical Microscopy (SNOM) Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Multiprobe techniques Electrostatic Force Microscopy,
Dr. Adrian CARRETERO-GENEVRIER, Chargé de recherche CNRS (CR1) (CNRS-CR1 permanent research position) section 08. Équipe M2A, IES
Dr. Adrian CARRETERO-GENEVRIER, Chargé de recherche CNRS (CR1) (CNRS-CR1 permanent research position) section 08. Équipe M2A, IES Born: 27 August 1979, Sevilla, Spain Adrien Carretero Genevrier is a CNRS
CBE Science of Engineering Materials. Scanning Electron Microscopy (SEM)
CBE 30361 Science of Engineering Materials Scanning Electron Microscopy (SEM) Scale of Structure Organization Units: micrometer = 10-6 m = 1µm nanometer= 10-9 m = 1nm Angstrom = 10-10 m = 1Å A hair is
STM: Scanning Tunneling Microscope
STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =
Scanning Probe Microscopy
1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced
In-situ TEM study on structural change and light emission of a multiwall carbon nanotube during Joule heating
IOP Conference Series: Materials Science and Engineering PAPER OPEN ACCESS In-situ TEM study on structural change and light emission of a multiwall carbon nanotube during Joule heating To cite this article:
Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach
Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Beyond the diffraction limit The resolution of optical microscopy is generally limited by the diffraction
Dr. SYED SAJJAD HUSSAIN
1 Dr. SYED SAJJAD HUSSAIN Assistant Professor CENTRE OF EXCELLENCE IN SOLID STATE PHYSICS, University of the Punjab, QAC, Lahore-54590, Pakistan Sajjadh.cssp@pu.edu.pk, syedsajjad110@yahoo.com PERSONAL
Graphene Fundamentals and Emergent Applications
Graphene Fundamentals and Emergent Applications Jamie H. Warner Department of Materials University of Oxford Oxford, UK Franziska Schaffel Department of Materials University of Oxford Oxford, UK Alicja
Controlled self-assembly of graphene oxide on a remote aluminum foil
Supplementary Information Controlled self-assembly of graphene oxide on a remote aluminum foil Kai Feng, Yewen Cao and Peiyi Wu* State key Laboratory of Molecular Engineering of Polymers, Department of
High-resolution Magnetic Force Microscope
High-resolution Magnetic Force Microscope hr-mfm Gigasteps on a nanoscale hr-mfm the key instrument for research and development of high-density magnetic media. 1 nm magnetic resolution guaranteed. Winner
Supplementary Materials. Mechanics and Chemistry: Single Molecule Bond Rupture Forces Correlate with
Supplementary Materials Mechanics and Chemistry: Single Molecule Bond Rupture Forces Correlate with Molecular Backbone Structure M. Frei 1, S Aradhya 1, M. Koentopp 2, M. S. Hybertsen 3, L. Venkataraman
PolyCerNet. 1. U. of Trento Italy 2. U. Pierre et Marie Curie Paris France 3. Max Plank Inst. Germany 4. Poly. Univ.
Tailored Multifunctional Polymer-Derived NanoCeramics - (Network Coordinator: Prof. Gian Domenico Soraru, University of Trento, Italy) is a Marie Curie Research and Training Network coordinated by the
LabRAM HR Evolution. Research Raman Made Easy!
LabRAM HR Evolution Research Raman Made Easy! Cutting-Edge Applications with the La LabRAM HR Life sciences Deeply involved in Raman spectroscopy for decades, HORIBA Scientific has been providing an extensive
Raman spectroscopy of BN-SWNTs
Raman spectroscopy of BN-SWNTs R. Arenal de la Concha1,2, L. Wirtz2, J.Y. Mevellec3, S. Lefrant3, A. Rubio2, A. Loiseau1 1 LEM, Onera-Cnrs, 29 Avenue de la Division Leclerc, BP 72, 92322 Châtillon, France
EE236 Electronics. Computer and Systems Engineering Department. Faculty of Engineering Alexandria University. Fall 2014
EE236 Electronics Computer and Systems Engineering Department Faculty of Engineering Alexandria University Fall 2014 Lecturer: Bassem Mokhtar, Ph.D. Assistant Professor Department of Electrical Engineering
Institute for Electron Microscopy and Nanoanalysis Graz Centre for Electron Microscopy
Institute for Electron Microscopy and Nanoanalysis Graz Centre for Electron Microscopy Micromechanics Ass.Prof. Priv.-Doz. DI Dr. Harald Plank a,b a Institute of Electron Microscopy and Nanoanalysis, Graz
nano-ta: Nano Thermal Analysis
nano-ta: Nano Thermal Analysis Application Note #1 Failure Analysis - Identification of Particles in a Polymer Film Author: David Grandy Ph.D. Introduction Nano-TA is a local thermal analysis technique
Characterization of partially reduced graphene oxide as room
Supporting Information Characterization of partially reduced graphene oxide as room temperature sensor for H 2 Le-Sheng Zhang a, Wei D. Wang b, Xian-Qing Liang c, Wang-Sheng Chu d, Wei-Guo Song a *, Wei
Metrology is not a cost factor, but a profit center
Edition February 2018 Semiconductor technology & processing Metrology is not a cost factor, but a profit center In recent years, remarkable progress has been made in the field of metrology, which is crucial
Supporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
A NEW APPROACH TOWARDS PROPERTY NANOMEASUREMENTS USING IN-SITU TEM
A NEW APPROACH TOWARDS PROPERTY NANOMEASUREMENTS USING IN-SITU TEM Z.L. WANG*, P. PONCHARAL**, W.A. DE HEER** and R.P. GAO* * School of Materials Science and Engineering, ** School of Physics, Georgia
An account of our efforts towards air quality monitoring in epitaxial graphene on SiC
European Network on New Sensing Technologies for Air Pollution Control and Environmental Sustainability - EuNetAir COST Action TD1105 2 nd International Workshop EuNetAir on New Sensing Technologies for
Dual Beam Helios Nanolab 600 and 650
Dual Beam Helios Nanolab 600 and 650 In the Clean Room facilities of the INA LMA, several lithography facilities permit to pattern structures at the micro and nano meter scale and to create devices. In
Introductory guide to measuring the mechanical properties of nanoobjects/particles
Jeremias Seppä MIKES Metrology, VTT Technical Research Centre of Finland Ltd P.O. Box 1000, FI-02044 VTT, Finland Contents: AFM Cantilever calibration F-d curves and cantilever bending Hitting the particles
Magnetic Nanowires inside. carbon nanotubes
Leibniz Institute for Solid State and Materials Research IFW Dresden Magnetic Nanowires inside Carbon Nanotubes Magnetic force microscopy sensors using ironfilled carbon nanotubes Thomas Mühl Outline Introduction
Atomic and molecular interactions. Scanning probe microscopy.
Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic
Novel materials and nanostructures for advanced optoelectronics
Novel materials and nanostructures for advanced optoelectronics Q. Zhuang, P. Carrington, M. Hayne, A Krier Physics Department, Lancaster University, UK u Brief introduction to Outline Lancaster University
SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes
SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes Fabrication of the scanning thermal microscopy (SThM) probes is summarized in Supplementary Fig. 1 and proceeds
Materials. Definitions of nanotechnology. The term nanotechnology was invented by Professor Norio Taniguchi at the University of Tokyo in 1971.
Materials Definitions of nanotechnology The term nanotechnology was invented by Professor Norio Taniguchi at the University of Tokyo in 1971. The original definition, translated into English Nano-technology'
Nanoscale work function measurements by Scanning Tunneling Spectroscopy
Related Topics Tunneling effect, Defects, Scanning Tunneling Microscopy (STM), (STS), Local Density of States (LDOS), Work function, Surface activation, Catalysis Principle Scanning tunneling microscopy
Microscopy: Principles
Low Voltage Electron Microscopy: Principles and Applications Edited by David C. Bell Harvard University, USA and Natasha Erdman JEOL USA Inc., USA Published in association with the Royal Microscopical
Supplementary Materials to Addressable Photo-Charging of Single Quantum Dots Assisted with Atomic Force Microscopy Probe
Supplementary Materials to Addressable Photo-Charging of Single Quantum Dots Assisted with Atomic Force Microscopy Probe M. Dokukin 1, R. Olac-Vaw 2, N. Guz 1, V. Mitin 2, and I. Sokolov 1,* 1 Dept. of
h p λ = mν Back to de Broglie and the electron as a wave you will learn more about this Equation in CHEM* 2060
Back to de Broglie and the electron as a wave λ = mν h = h p you will learn more about this Equation in CHEM* 2060 We will soon see that the energies (speed for now if you like) of the electrons in the
The National Nanotechnology Initiative
The National Nanotechnology Initiative and Nano-scale Length Metrology T.V. Vorburger (tvtv@nist.gov), Precision Engineering Division R.G. Dixson, J. Fu, N.G. Orji, M.W. Cresswell, R.A. Allen, W.F. Guthrie,
Diameter- and Loading Mode Effects of Modulus in ZnO Nanowires
Diameter- and Loading Mode Effects of Modulus in ZnO Nanowires In Situ Measurements & Theoretical Understanding Mo-rigen H, CQ Chen, Y Shi, YS Zhang, W Zhou, JW Chen, YJ Yan, J Zhu* Beijing National Center
The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM Evaluations
07.80 The Microsc. Microanal. Microstruct. 513 Classification Physics Abstracts - - 06.20 61.16P The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM
Supplementary Figures
Fracture Strength (GPa) Supplementary Figures a b 10 R=0.88 mm 1 0.1 Gordon et al Zhu et al Tang et al im et al 5 7 6 4 This work 5 50 500 Si Nanowire Diameter (nm) Supplementary Figure 1: (a) TEM image
Auger Electron Spectroscopy Overview
Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E
Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture
Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 13:00 Monday, 12/February/2018 (P/T 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases
City University of Hong Kong. Course Syllabus. offered by Department of Physics and Materials Science with effect from Semester A 2016 / 17
City University of Hong Kong offered by Department of Physics and Materials Science with effect from Semester A 2016 / 17 Part I Course Overview Course Title: Nanostructures and Nanotechnology Course Code:
Graphene Canada Montreal Oct. 16, 2015 (International Year of Light)
Luminescence Properties of Graphene A. Beltaos 1,2,3, A. Bergren 1, K. Bosnick 1, N. Pekas 1, A. Matković 4, A. Meldrum 2 1 National Institute for Nanotechnology (NINT), 11421 Saskatchewan Drive, Edmonton,
Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2
Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor
Chapter 3 Combining Scanning Probe Microscopy and Transmission Electron Microscopy
Chapter 3 Combining Scanning Probe Microscopy and Transmission Electron Microscopy Alexandra Nafari, Johan Angenete, Krister Svensson, Anke Sanz-Velasco, and Håkan Olin Abstract This chapter is a review
Surfaces and Interfaces
1/16 Surfaces and Interfaces Fouad MAROUN Laboratoire de Physique de la Matière Condensée, Ecole Polytechnique CNRS Palaiseau, France 2/16 Outline Definition of surfaces and interfaces and 3 examples in
CNPEM Laboratório de Ciência de Superfícies
Investigating electrical charged samples by scanning probe microscopy: the influence to magnetic force microscopy and atomic force microscopy phase images. Carlos A. R. Costa, 1 Evandro M. Lanzoni, 1 Maria
EPIC: Keck-II: SPID:
The Northwestern University Atomic and Nanoscale Characterization Experimental Center (NUANCE) was established during 2001-02 to integrate complementary analytical instruments and characterization capabilities
Contents. Preface...xv List of Contributors...xvii
Preface...xv List of Contributors...xvii CHAPTER 1 Nanotechnology to Nanomanufacturing... 1 1.1 Introduction...1 1.2 Approaches to Nanotechnology...2 1.3 Transition from Nanotechnology to Nanomanufacturing...3
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
CPC - B82Y - 2017.08 B82Y SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES Definition statement This place covers:
), nano-objects (nano-particles, nano-wires, nano-bubbles) and the simulation of neutron irradiation effects in nuclear materials (UO 2.
SEMIRAMIS Since the sixties, SEMIRAMIS has developed skills in ion source and ion beam handling ranging from a few hundred ev to around 10 MeV, with the goal of materials implantation, irradiation and
Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS
Supporting Information Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Kamran Khajehpour,* a Tim Williams, b,c Laure Bourgeois b,d and Sam Adeloju a
May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa
May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa ESRF, The European Synchrotron 71 Rue des Martyrs, 38000 Grenoble, France EXP DIV - THE SURFACE
Scanning Electron Microscopy
Scanning Electron Microscopy Field emitting tip Grid 2kV 100kV Anode ZEISS SUPRA Variable Pressure FESEM Dr Heath Bagshaw CMA bagshawh@tcd.ie Why use an SEM? Fig 1. Examples of features resolvable using
Diamond-like-carbon (DLC) master creation for use in soft lithography using the Atomic Force Microscope (AFM)
Diamond-like-carbon (DLC) master creation for use in soft lithography using the Atomic Force Microscope (AFM) Author Watson, Gregory, Myhra, S., Watson, Jolanta Published 2007 Journal Title Journal of
Exploring the Formation of Symmetric Gold Nanostars by Liquid-Cell Transmission Electron Microscopy
Supplementary information Exploring the Formation of Symmetric Gold Nanostars by Liquid-Cell Transmission Electron Microscopy Nabeel Ahmad, 1,2 Guillaume Wang, 1 Jaysen Nelayah, 1 Christian Ricolleau,
Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy
NANO EXPRESS Open Access Memory properties and charge effect study in Si nanocrystals by scanning capacitance microscopy and spectroscopy Zhen Lin 1*, Georges Bremond 1, Franck Bassani 2 Abstract In this
In situ studies on dynamic properties of carbon nanotubes with metal clusters
In situ studies on dynamic properties of carbon nanotubes with metal clusters Jason Chang, Yuan-Chih Chang, Der-Hsien Lien, Shaw-Chieh Wang*, Tung Hsu*, and Tien T. Tsong Institute of Physics, Academia
Instrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
PHYS-E0541:Special Course in Physics Gas phase synthesis of carbon nanotubes for thin film application. Electron Microscopy. for
PHYS-E0541:Special Course in Physics Gas phase synthesis of carbon nanotubes for thin film application Electron Microscopy for Introduction to Electron Microscopy Carbon Nanomaterials (nanotubes) Dr. Hua
ETH Rüschlikon the people and their research
ETH Zurich @ Rüschlikon the people and their research Prof. Dr. Dimos Poulikakos, Laboratory of Thermodynamics in Emerging Technologies and Coordinator of the Nanotechnology Center, ETH Zurich The Vision
«SCANNING TUNNELLING MICROSCOPY AND ATOM PROBE»
Département Nanosciences & Nanotechnologies «SCANNING TUNNELLING MICROSCOPY AND ATOM PROBE» Thematic day, Friday 30th june 2017, Salle des férences, GPM Rouen* PROGRAM 9h45-10h30 10h30-10h45 10h45-11h10
POSEIDON SELECT IN SITU LIQUID ELECTRON MICROSCOPY. Protochips Quantifiably Better
POSEIDON SELECT IN SITU LIQUID ELECTRON MICROSCOPY Protochips Quantifiably Better TiO 2 Nanoparticles 150 nm of water Image courtesy Dr. Madeline Dukes SEE THINGS IN LIQUID YOU NEVER THOUGHT POSSIBLE Pegylated
Transmission Electron Microscopy: A Textbook For Materials Science (4-Vol Set) By C. Barry Carter, David B. Williams
Transmission Electron Microscopy: A Textbook For Materials Science (4-Vol Set) By C. Barry Carter, David B. Williams If you are searched for the ebook Transmission Electron Microscopy: A Textbook for Materials
Praktikum zur. Materialanalytik
Praktikum zur Materialanalytik Energy Dispersive X-ray Spectroscopy B513 Stand: 19.10.2016 Contents 1 Introduction... 2 2. Fundamental Physics and Notation... 3 2.1. Alignments of the microscope... 3 2.2.
4H SiC Schottky diodes under ESD and thermal stresses: A failure analysis method.
4H SiC Schottky diodes under ESD and thermal stresses: A failure analysis method. Pascal DHERBECOURT Groupe de Physique des Matériaux UMR CNRS 6634 The first part of the presentation reports electrical
Supporting Online Material for
www.sciencemag.org/cgi/content/full/1142021/dc1 Supporting Online Material for Remnants of the Early Solar System Water Enriched in Heavy Oxygen Isotopes Naoya Sakamoto, Yusuke Seto, Shoichi Itoh, Kiyoshi
Advanced techniques Local probes, SNOM
Advanced techniques Local probes, SNOM Principle Probe the near field electromagnetic field with a local probe near field probe propagating field evanescent Advanced techniques Local probes, SNOM Principle
NIS: what can it be used for?
AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached
CURRICULUM VITAE. 1. To apply the knowledge which I learned theoretically in the practical setting.
CURRICULUM VITAE II M,Sc. Nano Science and Technology, Coimbatore-641 046, Tamil Nadu. Mobile: +91-9843858762 E mail: maninano@gmail.com MANIVEL.P Objectives: 1. To apply the knowledge which I learned
Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm
Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte, Marcus Blab, Peter Coenen and Bert Voigtländer Abstract
Reliability of Dielectric Less RF-MEMS Capacitive Switches
Reliability of Dielectric Less RF-MEMS Capacitive Switches David Mardivirin, Pierre Chauveau, Arnaud Pothier, Aurelian Crunteanu, Pierre Blondy XLIM, CNRS, Université de Limoges Limoges, F-87000, France
MICRO-FOUR-POINT PROBES IN A UHV SCANNING ELECTRON MICROSCOPE FOR IN-SITU SURFACE-CONDUCTIVITY MEASUREMENTS
Surface Review and Letters, Vol. 7, Nos. 5 & 6 (2000) 533 537 c World Scientific Publishing Company MICRO-FOUR-POINT PROBES IN A UHV SCANNING ELECTRON MICROSCOPE FOR IN-SITU SURFACE-CONDUCTIVITY MEASUREMENTS
Nanotechnology where size matters
Nanotechnology where size matters J Emyr Macdonald Overview Ways of seeing very small things What is nanotechnology and why is it important? Building nanostructures What we can do with nanotechnology?
CARBON NANOSTRUCTURES SYNTHESIZED THROUGH GRAPHITE ETCHING
CARBON NANOSTRUCTURES SYNTHESIZED THROUGH GRAPHITE ETCHING Q. Yang 1, C. Xiao 1, R. Sammynaiken 2 and A. Hirose 1 1 Plasma Physics Laboratory, University of Saskatchewan, 116 Science Place Saskatoon, SK
Investigation of nanoelectrodes by Transmission Electron Microscopy
Investigation of nanoelectrodes by Transmission Electron Microscopy M.S. Kabir, S.H.M. Persson, Yimin Yao, Jean-Philippe Bourgoin, Serge Palacin To cite this version: M.S. Kabir, S.H.M. Persson, Yimin
A comparison study on hydrogen sensing performance of Pt/MoO3 nanoplatelets coated with a thin layer of Ta2O5 or La2O3
Title Author(s) Citation A comparison study on hydrogen sensing performance of Pt/MoO3 nanoplatelets coated with a thin layer of Ta2O5 or La2O3 Yu, J; Liu, Y; Cai, FX; Shafiei, M; Chen, G; Motta, N; Wlodarski,
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface
Supplementary information
Supplementary information Electrochemical synthesis of metal and semimetal nanotube-nanowire heterojunctions and their electronic transport properties Dachi Yang, ab Guowen Meng,* a Shuyuan Zhang, c Yufeng
Epitaxial piezoelectric heterostructures for ultrasound micro-transducers
15 th Korea-U.S. Forum on Nanotechnology Epitaxial piezoelectric heterostructures for ultrasound micro-transducers Seung-Hyub Baek Center for Electronic Materials Korea Institute of Science and Technology
Improving Micro-Raman/AFM Systems Imaging Using Negative-Stiffness Vibration Isolation
Photonics.com - February 2011 Improving Micro-Raman/AFM Systems Imaging Using Negative-Stiffness Vibration Isolation Negative-stiffness vibration isolators can easily support the heavy weight of a combined
Physical Science Research Activities of Korea Basic Science Institute
institutes in asia PaCiFiC BULLETIN Physical Science Research Activities of Korea Basic Science Institute JouhAhn Lee head ADVAnCeD nano-surface ReSeARCh group, KBSI Fig. 1: Overview of Korea Basic Science
From nanophysics research labs to cell phones. Dr. András Halbritter Department of Physics associate professor
From nanophysics research labs to cell phones Dr. András Halbritter Department of Physics associate professor Curriculum Vitae Birth: 1976. High-school graduation: 1994. Master degree: 1999. PhD: 2003.
Atomic Force/Magnetic Force Microscope
Atomic Force/Magnetic Force Microscope Veeco Instruments Dimension 3000 SPM with Nanoscope IIIa controller Atomic Force Microscopy Mode Magnetic Force Microscopy Mode Vibration isolation and sound proof
MSN551 LITHOGRAPHY II
MSN551 Introduction to Micro and Nano Fabrication LITHOGRAPHY II E-Beam, Focused Ion Beam and Soft Lithography Why need electron beam lithography? Smaller features are required By electronics industry: