Keywords-Keywords: Measurement Uncertainty, Test, UV Spectroradiometer, ISO/IEC 17025, ISO GUM
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1 Applied Mechaic ad Material Vol (01) pp Olie available ice 013/Dec/06 at (01) Tra Tech Publicatio, Switzerlad doi:10.08/ Aemet of the UVB Tramittace Meauremet Ucertaity i Coformity with ISO/IEC 1705 Je-Yu Shieh a, Sog-Yuh Huag b, Sog-Chi Huag c, Ku-Hie Li d, Wei Cheg Huag e Hue-Wei, Yue-Lig Couty 63, Taiwa reed@fu.edu.tw, hc815.jidue@ma.hiet.et, hy38@m16.hiet.et, @gm.fu.edu.tw, polo9965@yahoo.com.tw Keyword-Keyword: Meauremet Ucertaity, Tet, UV Spectroradiometer, ISO/IEC 1705, ISO GUM Abtract The mai purpoe of thi reearch i to cotruct a laboratory for tetig tadard. It refer to the pirit of ISO/IEC 1705 Stadard, ad follow Guide to the Expreio of Ucertaity i Meauremet (ISO GUM) made by ISO orgaizatio. The cotet iclude UV tet ytem cotructio, UVB tramittace meauremet ucertaity, ad the pla of meauremet quality aurace that aure the table operatio of the laboratory ytem. Cotruct the equatio of meauremet ucertaity by the ytem method that apply to the UVB tramittace meauremet of car iulatio film, ad evaluate the variace with tramittace meauremet meaured by UV pectroradiometer. A for the reult of tramittace meauremet, the tramittace i betwee ad 1.016(%) with igle wavelegth of 9.5m. There i little differece betwee the maufacturer label value ad the meaured oe. The verificatio proof the effectivee of the ytem, ad allow the tet of commercial UV-cut product fit the iteratioal ad world tadard. Itroductio Meauremet of light i a aciet ciece. Geerally, it ca be divided ito optical radiatio meauremet [1], photometric meauremet, ad color meauremet. Colorimetry [] i clearly part of optical meauremet related to color. Optical radiatio ad photometric meauremet are meauremet of optical parameter, ad the mai differece i that the latter iclude the huma viual repoe. I thi work, we try to build a UVB meauremet tadard baed o ISO 1705 ad TAF requiremet. Alo, it ca be ued o coumer market.[3-5]. By atellite telemetry, it i foud that the amout of ozoe above the earth decreaed igificatly i the lat two decade. Thi pheomeo icreaed the UV radiatio i the atmophere of the earth, ad detroyed the origial equilibrium. I additio to the direct threat to the health of huma bodie, the icreae of harmful UV radiatio ha gradually affected the ecological equilibrium i the Nature. The UV radiatio [6] divide ito three type accordig to the wavelegth, UVA(30~00 m), UVB(80~30 m), ad UVC(00~80 m) [7]. All right reerved. No part of cotet of thi paper may be reproduced or tramitted i ay form or by ay mea without the writte permiio of TTP, (ID: , Natioal Formoa Uiverity,, Taiwa, Taiwa-10/1/13,08:9:)
2 150 Applied Sciece ad Preciio Egieerig Iovatio Meauremet Method Deig The tadard light ource emitted ito the meaured object, ad the light which paed through the meaured object wa aalyzed by the fiber optic pectrometer for the variatio betwee the tadard tramittace ad the tramittace with the meaured object. Therefore, the tramittace of the meaured object could be foud. The meaured object i thi thei wa the car iulatio film. I Fig. 1, we propoed the ytem diagram. The tadard light ource (SL3-CAL), the tramiio fixture (TXF-1), ad the fiber optic pectrometer (EPP000-UV) were coected by two optical fiber (F600-UVVIS-SR). I thi ytem, the fiber optic pectrometer ad the computer were coected by the cable (USBEPP), ad the data relevat to tramittace were calculated by the computer oftware (Spectra Wiz Software) a i Fig.. Stadard Light Source Deuterium Lamp (SL3-CAL) Iput Tramiio Fixture (TXF-1) for Meaured Object Car Iulatio Film Optical Fiber (F600-UVVIS-SR) Fiber Optic Spectrometer (EPP000-UV) Output Data related to Tramittace Computer Sytem Fig. 1 Sytem Diagram Fig. Sytem Coectio A. Cotrol Chart The Cotrol Chart i maily etablihed for udertadig the tability of the meauremet ytem ad moitorig the ytem drift. The cotrol chart of each et of check parameter i the ytem wa aalyzed ad how i Fig. 3. After the procedure parameter etablihmet, the cotrol chart could be made for cotrollig ad moitorig the ytem tability i the future. If the check parameter fall withi the upper ad lower cotrol limit, it idicate the ytem i table ad the meauremet ca be performed. If the check parameter fall outide the upper ad lower cotrol limit, it idicate the ytem i utable ad the meauremet hould be paued.
3 Check value (m) Applied Mechaic ad Material Vol Cotrol Chart of UVB Tramittace Error (Wavelegth 8m) UCL=0.009 m Ac=0.000 m LCL= m Check date Fig. 3 Cotrol Chart of UVB Tramittace Error (Wavelegth 8m) B. Ucertaity Aalyi of Meauremet Sytem I thi ectio, the tramittace error will be corrected. Whe the tramittace i meaured, the light ource i tramitted i tur by optical fiber ad the tramiio fixture (TXF-1) ito the fiber optic pectrometer for meaurig it repoe variatio. S - D T 100% (1) R - D I equatio (1), where T i Tramittace; S i Tramittace of the Oberved Sample; D i Tramittace without Light Source; R i Tramittace with Light Source ad without Obtacle. The parameter of the fiber optic pectrometer are et with the reolutio of 1050 pixel for the meauremet experimet of tramittace. The the tramittace error ΔT may be writte a below: S D T 1 () T R D Where T i Tramittace Error; T i Stadard Tramittace. The meauremet equatio i repreeted a a fuctio: T f T, S, D, R (3) Combied Stadard Ucertaity v eff u U c : T u T u S u D u R () c f T f S f D f R Each eitivity coefficiet δf / δx i ca be calculated i equatio (5)-(8) a below: f D S (5) T T R D f 1 S T f D f R S R D T S R T R D D S T R : Effective Degree of Freedom (6) (7) (8)
4 15 Applied Sciece ad Preciio Egieerig Iovatio v u T T (9) u T u S u D u R vt vs vd vr Stadard Tramittace u T : It ucertaity i 0.5m, ad the coverage factor i.01, u T = The repoe value of pectrometer with ample obtacle: the ucertaity of the pectrometer u = ; the ucertaity of repeatability u = reolutio S 1 The repoe value of the pectrometer without light ource u D =.157 The repoe value of the pectrometer without obtacle betwee the light ource ad the pectrometer. u R = The combied tadard ucertaity u c T Subtitute all reult obtaied above ito equatio (), ad you ca obtai u c T = S Sytem Verificatio ad Reult A. Cutom Meauremet Method of Tramittace Ue the tadard light ource, deuterium lamp, to provide table UVB light. The light i tramitted by optical fiber to prevet the lo of it, ad the the light pae through the tramiio fixture ad the fiber optic pectrometer for meaurig the variatio betwee the tramittace with the car iulatio film ad that without it. The tramittace data are calculated by computer oftware. To eure the accuracy ad credibility of the data, the tadard light ource, deuterium lamp, ad the fiber optic pectrometer hould be calibrated ad traced. B.Tramittace Verificatio of UVB A for the reult of tramittace meauremet, the meaured tramittace i betwee ad 1.016(%) with igle wavelegth of 9.5m. There i little differece betwee the maufacturer label value ad the meaured oe. However, i the whole rage of UVB wavelegth, the meaured tramittace i betwee ad.0883(%), ad the differece i bigger. Due to o relevat Chiee Natioal Stadard (CNS) curretly, the verificatio reult are lited i Table 1. Fially, i Table, it how the Ucertaity Aalyi of Tramittace UVB Calibratio of thi meauremet. Table 1. Meauremet Reult of Tramittace Model Maufacturer Meaured Value (%) Meaured Value of the Label Value Wavelegth Rage (%) Wavelegth (%) 9.5m 80m~30m FSK-015S ~ FSK-015BK ~1.906 FSK-035S ~.0883 FSK-035BK ~ FSK-150SB ~1.9066
5 Applied Mechaic ad Material Vol FSK-168L ~ FSK ~ RALON-AL ~ RALON-AL ~ RALON-AL ~ RALON-AL ~ RALON-AL ~1.800 RALON-AL ~ Table.The Ucertaity Aalyi of Tramittace UVB Calibratio Ucertaity Variatio Probability Stadard Seitivity Compoet Degree Evaluatio Source Rage of Ditributio Ucertaity Coefficiet of of Type Ucertaity Ucertaity Freedom Source T S 0.5 Normal B Ditributio. 01 S S 1 1 Normal Ditributio S t A D.157 t A R t A u c T = %, v eff = 6.1, U 95= %( Coverage Factor k =.00) B Cocluio I our ytem, we aalyze the UVB wavelegth from 80 m to 30 m with a iterval of 1 m for the tramittace variatio of the igle wavelegth i thi reearch. The data i followed ISO GUM Guide to the Expreio of Ucertaity i Meauremet for accuracy verificatio. The quality of commercial UV-cut product ca be verified with more fairly method. Referece [1] Y.S. Chiag, Y.M. Sug, C.Y. Liu, C.H. Chua, C.T. Che: Opto-Electroic Techology, Wu Chig Publihig Group, 1-7, 005. [] Y.Y. A, H.T. Teg: Optical Seor ad Light Meauremet. Publihig Houe of Electroic Idutry, 1-6, 001. [3] J.Y. Shieh, Z.Y. Wag, S.Y. Huag, S.C. Huag ad J.L. Zhag: Meaure Ucertaity i Ultraviolet Idex Stadard. Electrical ad Electroic Egieerig,Vol., No.5, October 01. [] Y.S. Li, H.Y. Wag, C.C. Lee, J.Y. Shieh: Applicatio of Su Protectio Factor ad Ultra Violet i Alarmig Hat. The 33 rd Aual coferece of the IEEE Idutrial Electroic Society, DVD ROM, 007.
6 15 Applied Sciece ad Preciio Egieerig Iovatio [5] J.Y. Shieh, H.Y. Wag, C.C. Liu: Portable Ski Health SPF Detector. IEEE, Iteratioal Coferece o Sytem & Sigal,DVD ROM, 005. [6] Bria L. Diffey: Source ad Meauremet of Ultraviolet Radiatio. ACADEMIC PRESS Method 8 (00) 13, 19 Jue 00. [7] J.Y. Shieh, Z.Y. Wag, S.Y. Huag, S.C. Huag, ad J.L. Zhag: Meaure Ucertaity i Ultraviolet Idex Stadard. The 15th IEEE Iteratioal Sympoium o Coumer Electroic, 1-17 Jue, 011, Sigapore (ISCE 011)
7 Applied Sciece ad Preciio Egieerig Iovatio 10.08/ Aemet of the UVB Tramittace Meauremet Ucertaity i Coformity with ISO/IEC /
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