arxiv: v2 [cond-mat.soft] 1 Sep 2017

Transcription

1 Characterizing Pixel and Pint Patterns with a Hyperunifrmity Disrder Length A.T. Chiec 1, R. Dreyfus and D.J. Durian 1 1 Department f Physics and Astrnmy, University f Pennsylvania, Philadelphia, PA , USA Cmplex Assemblies f Sft Matter, CNRS-Slvay-UPenn UMI 354, Bristl, PA, , USA (Dated: September 4, 017) arxiv: v [cnd-mat.sft] 1 Sep 017 We intrduce the cncept f a hyperunifrmity disrder length h that cntrls the variance f vlume fractin fluctuatins fr randmly placed windws f fixed size. In particular, fluctuatins are determined by the average number f particles within a distance h frm the bundary f the windw. We first cmpute special expectatins and bunds in d dimensins, and then illustrate the range f behavir f h versus windw size L by analyzing several different types f simulated twdimensinal pixel patterns where particle psitins are stred as a binary digital image in which pixels have value zer/ne if empty/cntain a particle. The first are randm binmial patterns, where pixels are randmly flipped frm zer t ne with prbability equal t area fractin. These have lng-ranged density fluctuatins, and simulatins cnfirm the exact result h = L/. Next we cnsider vacancy patterns, where a fractin f f particles n a lattice are randmly remved. These als display lng-range density fluctuatins, but with h = (L/)(f/d) fr small f, and h = L/ fr f 1. And finally, fr a hyperunifrm system with n lng-range density fluctuatins, we cnsider Einstein patterns where each particle is independently displaced frm a lattice site by a Gaussian-distributed amunt. Fr these, at large L, h appraches a cnstant equal t abut half the rt-mean-square displacement in each dimensin. Then we turn t grayscale pixel patterns that represent simulated arrangements f plydisperse particles, where the vlume f a particle is encded in the value f its central pixel. And we discuss the cntinuum limit f pint patterns, where pixel size vanishes. In general, we thus prpse t quantify particle cnfiguratins nt just by the scaling f the density fluctuatin spectrum but rather by the real-space spectrum f h(l) versus L. We call this apprach Hyperunifrmity Disrder Length Spectrscpy (HUDLS). The structure f crystals is straightfrward t describe. By cntrast, it remains a fundamental prblem t identify and characterize the structural features f disrdered many-bdy systems that relate t materials prperties. In this regard the cncept f hyperunifrmity was develped fr systems in which lng-wavelength density fluctuatins are suppressed t nearly the same extent as in crystals [1, ]. Disrdered systems that are hyperunifrm accrdingly pssess sme degree f lng-ranged hidden rder, nt evident in the lcal structure, and this can give rise t special material prperties. Fr example, hyperunifrmity has been cnnected t jamming [3 1] and t nvel phtnic behavir [13 17] in amrphus materials. It is relevant fr the spatial arrangement f certain bilgical [18] and astrphysical [19] bjects. And it has been cnnected with irreversibility in seemingly-deterministic many-bdy systems subjected t peridic driving [0 ], as well as t dynamical behavir f Brwnian particles subjected t steady driving [3]. Thus the imprtance f quantifying hyperunifrmity is increasingly recgnized. Accrding t the riginal definitin, a d-dimensinal system f pint particles is said t be hyperunifrm if the structure factr S(q) vanishes at wavevectr q = 0. [1]. Equivalently, it is hyperunifrm if the variance in the number f particles enclsed by a set f randmlyplaced measuring windws f vlume L d grws as the average number f particles n the windw surface, σ N (L) L d 1 [1]. Here L is the width r diameter f the windw and d is dimensinality. By cntrast, the number variance fr liquid-like systems with lng-range density fluctuatins grws like the average number particles inside the entire windw, σ N (L) L d ; this crrespnds t S(0) > 0. Fr extended particles f nnzer vlume, the quantities f interest are instead the spectral density χ(q) and the variance σ φ (L) f vlume-fractin fluctuatins [, 7, 8]. The usual fcus is n the small-q / large-l scaling; i.e. n χ(q) q ɛ, (1) σ φ (L) 1/L d+ɛ, () and the value f the expnent. Fr ɛ = 0, then there are lng-ranged density fluctuatins and the particles have a liquid-like arrangement that is significantly mre randm than in a crystal. Fr ɛ > 0, the particles are arranged mre unifrmly thrughut space and the system is said t be hyperunifrm. The degree f hidden rder increases with ɛ, and the upper limit ɛ = 1 crrespnds t a crystallike unifrmity. Lgarithmic crrectins t Eqs. (1-) may be expected, and can be described by a single value f ɛ ver a (perhaps experimentally-limited) range f q r L. T relate t structure, it is helpful t translate measured quantities int a length scale. Fr example Hpkins et al. [4] define a crrelatin length frm the value f S(0). And Refs. [1, 0, ] define ther lengths based n the lcatin f features in the frm f χ(q) versus q r f σ (L) versus L. Here, we intrduce a cmpletely length based n the value f σ φ (L) that we call the hyperunifrmity disrder length, h(l). The size f h(l) relates directly t the distance frm the bundary ver which fluctuatins ccur fr a set f measuring windws, and its value as well as its scaling with L indicates the degree f unifrmity.

2 FIG. 1: (clr nline) Example binary pixel pattern, cnsisting f a grid f pixels and 15 particles (slid blue) ccupying an area fractin f φ = 15/(50 50) = Particle psitins, whether frm experiment r simulatin, can be represented by a digital image where pixel size is determined by experimental r numerical precisin. Accrdingly, we develp ur apprach fr d- dimensinal pixel patterns. A binary -dimensinal example is shwn in Fig. 1, where space is represented by a square grid f pixels that have value I(x, y) = 0 if empty r I(x, y) = 1 if a particle is present. We begin by deriving the vlume fractin variance fr a few special cases. Using this as a guide, we discuss hw t quantify hidden rder frm the measured variance, first by its rati t that in a ttally randm arrangement f the same bjects, and then by the hyperunifrmity disrder length. The cntinuum limit f vanishing pixel size, i.e. f pint particles, is als discussed. Then we illustrate this prgram fr several classes f system, starting with binary pixel patterns and ending with grayscale pixel patterns representing a plydisperse cllectin f extended particles. I. VARIANCE FOR PIXEL PATTERNS In this sectin we define ntatin and cmpute the vlume fractin variance exactly fr fur special arrangements f pixel particles (Pissn patterns, multinmial patterns, separated-particles, and cubic crytals). As in Fig. 1, the patterns t be characterized cnsist f a d- dimensinal Cartesian grid f pixels with intensity values I(x, y, z...) that specify the arrangement f pixel-sized particles. The vlume f a particle f species i is cnsidered t be v i = I i p d, where p is the pixel width and p d is the pixel vlume. Then the vlume fractin φ equals the average intensity in the pattern. Fr example, a system f extended particles with actual gemetrical vlumes v i can be represented by a pixel pattern where the central pixel inside each particle is incremented by intensity I i = v i /p d. In general, if species i has number density ρ i, then it ccupies vlume fractin φ i = v i ρ i = I i p d ρ i and the ttal vlume fractin ccupied by all particles is φ = φ i. The average prbability fr a pixel t cntain a particle f species i is q i = p d ρ i = φ i /I i, t be used belw. The basic tl fr quantifying the extent f hidden rder and hyperunifrmity is the vlume fractin variance σ φ (L) versus windw size. Operatinally, a large number f measuring windws f vlume V Ω are placed at randm. In each windw Ω, the vlume fractin is cmputed as the average intensity. The results vary frm windw t windw, but the average must cnverge t the ttal/true vlume fractin φ if enugh windws are sampled. The variance f the measured vlume fractin values, n the ther hand, depends n the particular pattern and n the windw size/shape. The nature f the hidden rder is t be analyzed frm this behavir. Fr analysis f simulated pixel patterns, we use cubic measuring windws f vlume V Ω = L d. This will be useful fr future analyses f digital vide data. Fr cntinuum space, it is mre usual t use spherical measuring windws. Hwever this is incnvenient fr pixel patterns, because spheres cannt be cnstructed except as pixelated apprximates. In this sectin, results fr arbitrary windw shapes are given in terms f V Ω and results fr hypercubic windws are given in terms f L. Cntinuum results fr hyperspherical windws f diameter D are given in the cnclusin. The behavir f h(l) fr hypercubic windws is almst the same as h(d) fr hyperspherical windws. A. Randm Patterns and Relative Variance The vlume fractin variance may be cmputed exactly, as fllws, if the pixel particles are arranged at randm. Fr a given L d measuring windw f n = (L/p ) d pixels, the ttal vlume f pixel particles is V = v i N i where N i is the actual number f species i enclsed (i.e. the number f time enclsed pixels were incremented by +I i ). The crrespnding average and variance ver windw lcatins are V = v i N i and σ V = v i σ Ni + i j v iv j σ NiN j, where N i = ρ i L d is the average number f species i enclsed, σ Ni is the variance, and σ NiN j = N i N j N i N j is the cvariance. T evaluate the variance and cvariance fr the number f enclsed particles, we must nw make a distinctin between tw different kinds f randm cnfiguratin. If multiple particles can ccupy the same pixel, then Pissn statistics hld, the number variance is σ Ni = nq i where the prbability q i was given abve, and the cvariance is zer. In this case, each particle s lcatin is chsen at randm and multiple particles may freely ccupy a pixel. Such cnfiguratins are called Pissn patterns. By cntrast, if nly ne particle at a time is allwed n each pixel, then multinmial statistics hld: the number variance is σ Ni = nq i (1 q i ) and the cvariance is σ NiN j = nq i q j. This case crrespnds t a pattern where the intensity f each pixel is randmly drawn frm {0, I 1, I,...} with respective prbabilities

3 3 {1 q i, q 1, q,...}. We call such cnfiguratins multinmial patterns. Cmbining these ingredients, the vlume fractin variance fr the tw different types f randm pattern is cmputed t be σ φ (L) = I p d { φ Pissn, (3) L d φ [1 φ/ I ] Multinmial, (4) where I = φ i I i /φ is the vlume-fractin weighted average grayscale intensity f the particle species. The cmmn prefactr may be re-written as v /V Ω where v = I p d is the vlume-fractin weighted particle vlume and V Ω is the windw vlume n matter what its shape. Thus, the variance scales as 1/L d as expected fr a system with lng-range density fluctuatins. And, imprtantly fr later, the actual prprtinality cnstants are nw knwn. In principle, Eqs. (3-4) culd be btained frm reciprcal-space results [, 5 7]. T ur knwledge, neither pixelated space nr the distinctin between Pissn and multinmial statistics have been previusly cnsidered. This is imprtant when a large fractin f pixels cntain particles. Fr example, a randm binmial pattern f nn-verlapping binary particles, with I = 1, has variance σ φ (L) = ( v /V Ω )[φ(1 φ)]; this hlds at all φ, and is crrectly unchanged by image inversin I 1 I and φ 1 φ. Nte that Pissn statistics are recvered t gd apprximatin when the ppulated pixels are dilute and the q i are small cmpared t ne. This happens fr a central-pixel representatin when the image reslutin is gd, i.e. in the cntinuum limit where the pixel size is small enugh that φ v /p d = I is true. On the basis f Eqs. (3,4) we define the relative variance fr general cnfiguratins as V(L) σ φ (L) φ σ φ (L) φ[1 φ/ I ] Pissn, (5) Multinmial, (6) where the tw cases are respectively fr particles that are, r are nt, allwed t verlap. Then fr bth types f randm pixel patterns, the relative variance is V(L) = v /V Ω fr any vlume fractin. This equals I at the smallest windw size, V Ω = p d, and has an initial linear decay f V(L) = I [1 d(l p )/p + O(L p ) ] fr hypercubic windws. Fr patterns with hidden rder, V(L) will be smaller than this upper bund [8]. B. Separated-Particles Limit The vlume fractin variance may als be cmputed exactly fr small L, when all measuring windws cntain n mre than ne particle. Fr example if the pixel particles effectively repel each ther, r if fr anther reasn they have sme minimum separatin, then fr a set f w randmly placed L d measuring windws that are sufficiently small, the results will be sme numbers {M, M 1, M,...} f bserved intensity values {0, I 1, I,...}. Then the measured vlume fractin mments are φ n m = (M i /M)(I i p d /L d ) n, where M = Mi, and the measured relative variance is V m (L) = Mi ( Mφ Ii p d /L d) φ, (7) 1 φ/ I assuming multinmial statistics as apprpriate fr separated particles. The averages are set by M i = Mρ i L d = M[φ i /(I i p d )]L d. This gives φ n m = φ i (I i p d /L d ) n 1, which leads t φ m = φ i = φ and a relative vlume fractin variance f V(L) = I (p /L) d φ/ I, (8) 1 φ/ I Nte that Eq. (8) is exact and hlds fr small enugh L, fr any arrangement f particles. If the arrangement is randm, then it hlds nly fr L = p since there will be a nnzer number f adjacent pixel particles. If the particles are separated, then Eq. (8) hlds up t sme larger L that is set by the smallest particle-particle separatin. Fr windws f arbitrary shape, Eq. (8) generalizes t V(L) = ( v /V Ω φ)/(1 φ/ I ). T ur knwledge, the small windw limit f separated particles has nt been previusly cnsidered. C. Cubic Crystal As a third example that may be cmputed exactly, we cnsider a pattern cnsisting f pixel particles f vlume v = I p d n a d-dimensinal cubic lattice f spacing b, using L d hypercubic measuring windws, where bth the lattice and the windws are aligned with the grid f pixels. Fr this situatin there are nly (b/p ) d distinct lcatins fr the windws; and there are nly d + 1 distinct results fr the number n f enclsed particles. These are all f frm n = d j=0 a j[flr(l/b)] j, with a d = 1. Fr example, in d = 1 there are (b δ)/p ways fr n 1 = flr(l/b) particles t be enclsed, and δ/p ways fr n particles t be enclsed, where δ = L bflr(l/b). The prbability distributin and the mments fr the number f enclsed particles may then be evaluated. Exact results fr the average and variance f the measured vlume fractins are fund by direct summatin t be φ = I (p /b) d, as expected, and

4 4 σ φ (L) = φ ( b L ) d { ( ) [ L L b flr 1 L ( )]} d L b b + flr φ. (9) b We calculated Eq. (9) explicitly in 1,, and 3 dimensins, and we verified the d = case by cmparisn with simulatin. Thugh we are unaware f prir statement r prf, we suppse it is true in all dimensins. The crrespnding number variance is σ N (L) = [σ φ (L)/φ ](L/b) d. Fr L < b the results simplify t σ φ (L) = φ [(b/l) d 1] and σ N (L) = (L/b) d [1 (L/b) d ]. The frmer agrees with Eq. (8); the latter agrees with the d = 1 case cnsidered in Ref. [1], where the number variance was cmputed frm the structure factr and expressed in Eq. (83) as a Furier series. Fr increasing L, the variance vanishes at integer values f L/b. The variance at half-way between the zers gives the large-l decay envelpe as σ φ (L) = (d/4)(φb/l). This is pathlgical fr d > 1, since crystals ught t be strngly hyperunifrm with variance scaling f 1/L d+1. Our result is even mre pathlgical than expected based n ftnte 11 n p. 14 f Ref. [19], which indicates that σ φ (L) 1/L d 1 was fund fr cubic crystals with cubic measuring windws. The pathlgy arises because the distributin f measured φ Ω values is highly nn-gaussian; hence, it may be remved by using spherical measuring windws [1, 19]. Fr pixelated space it is mre cnvenient t tilt the lattice at multiple angles with respect t the pixel grid, as dne in the simulatins belw. D. Cntinuum Limits The abve expectatins were all derived fr pixelated space, where windw widths and lattice spacings are an integer number f pixel widths p, and where each particle has intensity I i and ccupies a p d vxel. But the results all als extend t cntinuus space fr a pint representatin f particles f vlume fractin φ and φ i - weighted average particle vlume v. This is the limit f vanishing p and diverging I i taken simultaneusly such that v i = I i p d and φ i are cnstant. Then multinmial statistics reduce t Pissn statistics, since φ/ I vanishes and there is zer prbability fr tw pint particles t lie n tp f ne anther. Fr measuring windws f any shape, and vlume V Ω, the relative variance expectatin f Eq. (3) fr a randm arrangement then becmes σ φ (L)/φ = v /V Ω. Fr an infinite system, where there is n minimum particle-particle separatin, this hlds fr all V Ω. Fr a finite system, hwever, it fails fr small V Ω where the windws all cntain n mre than ne particle. Fr any pattern and windw shape at such small V Ω, the relative variance expectatin frm Eq. (8) is σ φ (L)/φ = v /V Ω φ. Fr cubic crystals, Eq. (9) hlds in the cntinuum limit as written. II. CHARACTERIZING HIDDEN ORDER We nw discuss hw t measure the vlume fractin variance fr a given pixel pattern, then we prpse tw different ways t plt and interpret the results. A. Measurements and Errrs Standard prcedure is t measure the variance f the list f vlume fractins fund inside a large number w f randmly placed measuring windws Ω f desired size and shape [1]. Fr pixel patterns, the vlume fractin inside a particular measuring windw is φ m = [ I(x, y, z...)p d ]/V Ω, which equals the ttal enclsed particle vlume divided by the measuring windw vlume V Ω L d ; this is the same as the average intensity f all the enclsed pixels. The average φ m and the variance σ m = φ m φ f the measured vlume fractins may then be cmputed. Fr a large number w f windws, φ m will cnverge t the actual ttal vlume fractin φ f the whle pattern. But hw large must w be, and what is the resulting expected statistical uncertainty between the measured variance and the true value? T ur knwledge, this has nt been addressed in prir wrk. The errr analysis fr large measuring windws is mst straightfrward. Since then the distributin f measured vlume fractins ught t be Gaussian, the uncertainty can be estimated frm the standard errr f the variance as σ φ (L) = σ φ (L) /(s 1), where s is the number f independent samples. If the w measuring windws are small and the pattern is large, then the windws measure disjint sets f particles and hence s = w may be used. But fr measuring windws that are sufficiently large in size r number, sme f the particles will be sampled by mre than ne windw and hence s will becme smaller than w. In general, the number s f independent samples will be the ttal number f pixels cvered by the entire set f measuring windws divided by the number f pixels per windw. T accunt fr this we create an auxiliary binary image where pixel values I aux (x, y) are flipped frm zer t ne if the crrespnding pixel in the image lies within a measuring windw. Then the number f independent samples is taken frm the auxiliary image as s = ( I aux )/(L/p ) d. T cver mst f the sample with windws, there is n need fr w t be mre than n the rder f V/V Ω where V is the vlume f the entire image. This gives a number f independent samples that is clse t s max = V/V Ω. As windw size increases tward system size, s max decreases

5 5 t ne and causes the standard errr f the variance t blm. In ur analyses f tw-dimensinal simulatins, belw, we take the number f L L square windws t be w = A/(L ), where A is the image area, subject t the cnstraint 10 w And the largest windw size we use is typically L = A/. Results fr larger measurement windws are cntaminated by finite size artifacts, such that the area-fractin variance is artificially depressed tward zer as L appraches the image width [11]. Care must be taken that this systematic errr nt be mistakenly interpreted as a sign f hyperunifrmity r lack theref. Fr small measuring windws, the standard errr f the variance is nt a gd estimate because the vlume fractin distributin is nt Gaussian. Instead, the statistical uncertainty may be deduced frm Eq. (7), which gives ( V) ( w i ) where w i is the number f small measuring windws that cntain ne particle f species i. The key ingredient is ( w i ) = w i = wρ i V Ω. As befre, w shuld be replaced with s. The resulting frmula fr the uncertainty is gd nly fr small enugh windws that cntain n mre than ne particle. But we suppse it might serve as an estimate fr intermediate windw size, anyway. Cmbining this in quadrature with the standard errr f the variance, which applies fr large windws, gives the expected statistical uncertainty in the measured relative variance as V = v 3 /V Ω 3 sφ[1 φ/ I ] + V s 1, (10) assuming multinmial statistics. Fr Pissn statistics, the cntinuum limit, r pixel particles with φ I, the φ/ I term is drpped in cmparisn with ne. Nte that the first term dminates fr small windws, while the secnd dminates fr large windws; therefre, it des n harm t simply add them tgether. We will use Eq. (10) t generate errr bars in analysis plts, belw. Nte that the φ i -weighted mments f the particle vlume distributin may be written as v n = φ i v n i /φ = ( N i v n+1 i )/( N i v i ) where the sums are ver species and where N i is the ttal number f particles f species i in the sample. This may als be written as v n = v n+1 j / v j where the sums are ver all particles in the sample. B. Variance Rati, R(L) The vlume fractin variance is largest fr a ttally randm pattern, and necessarily decreases with rdering. Therefre the presence f hidden rder can be detected by cmparing σ φ (L) fr the pattern in questin with [σ φ (L)] rand fr a ttally randm arrangement f the same set f particles. Fr nn-verlapping pixel particles, the variance at L = p merely measures the distributin f particle intensities independent f their arrangement; therefre, σ φ (p ) = [σ φ (p )] rand = φ I [1 φ/ I ] hlds and we may write [σ φ (L)] rand = σ φ (p )(p /L) d. Hence we define the variance rati, and evaluate it withut having t knw φ and I, as σ φ (L) R(L) = σ φ (L)L d [σ φ (L)] rand σ φ (p )p d. (11) By cnstructin, ttally randm patterns have R(L) = 1 and this is an upper bund. Nte, t, that the variance rati is nrmalized t R(p ) = 1 fr all pixel patterns. Fr the cntinuum limit f pint particle and spherical measuring windws, simply replace L with diameter D, and p with sme chsen smallest measuring diameter D that is less than the minimum particle-particle separatin r min in the sample. Either D shuld be vanishingly small cmpared t r min, r else a crrectin shuld be made using the abve results fr separated-particle arrangements: R(D) = σ φ (D)D d [σ φ (D ) + φ ]D d. (1) This gives R(D) = 1 φv Ω / v exactly fr D < s, and is nrmalized t R(D ) = 1 nly as D vanishes and σ φ (D ) diverges. T interpret R(L), first nte that the large-l scaling is R(L) 1/L ɛ fr σ φ (L) 1/L d+ɛ. Therefre, R(L) ges t a cnstant fr patterns with lng-range density fluctuatins (ɛ = 0); and it ges t zer as a dimensin-indepenent pwer-law if the pattern is hyperunifrm, e.g. mst ntably R(L) 1/L fr strngly hyperunifrm (ɛ = 1). The utility f diagnsing hyperunifrmity via the prduct σ φ (L)L d has been previusly recgnized [11, 1]. The advantage f additinally nrmalizing by σ φ (p )p d is that then the value (nt just the scaling) has meaning. Smaller R means mre rder, larger R means mre randm, and R = 1 means ttally randm. Thus, R(L) can be thught f as a randmness index, which decays frm ne as L increases and hidden rder is detected. As shwn belw, R(L) can als be interpreted as the fractin f f space available fr density fluctuatins at wavelength L. C. Hyperunifrmity Disrder Length, h(l) While R(L) is a useful new quantity, it des nt cnnect t the riginal idea [1] that fluctuatins in hyperunifrm systems are gverned by particles n the surface f the measuring windws. Since particles reside in a vlume, we quantify this ntin by intrducing a hyperunifrmity disrder length h(l) that specifies the regin near the windw bundary where fluctuatins are imprtant. This cncept is depicted in Fig., which shws an L L measuring windw that is partitined int a bundary regin f thickness h and an (L h) (L h) interir regin. Intuitively, h is defined such that, if the system is ergdic and the time variatin φ Ω (t) fr ne windw has the same distributin as fr a randmly placed set f windws, then nly the bundary particles have pprtunity

6 6 t temprarily leave the measuring windw. Fr a ttally randm system where all enclsed particles participate, h(l) wuld equal the maximum value L/. Fr a maximally hyperunifrm system, h(l) wuld be a minimum and equal t p /, which is the largest cnstant cnsistent with the h L/ requirement fr all L; in this case, the participating pixel particles are literally n the surface. Since h(l) increases with disrder, we call it the hyperunifrmity disrder length. In general, the nature f the fluctuatins is thus easily visualized in terms f the value and frm f the real-space spectrum f h(l) versus L. We therefre call this analysis methd Hyperunifrmity Disrder Length Spectrscpy (HUDLS). FIG. : (clr nline) Example Einstein pattern f pixel particles with a Gaussian-distributed randm displacement frm a triangular lattice. The lattice cnstant is 30 pixels, and the rt-mean-square displacement is 150 pixels in each dimensin. Since the particles are effectively bund t the lattice sites, the pattern is hyperunifrm with n lng-range density fluctuatins even thugh it appears very disrdered t the eye. Randmly placed measurement windws hence shw density fluctuatins that are due nly t particles within a distance h f the windw bundary that is cnstant fr large windws. Here this hyperunifrmity disrder length is h = 8 pixels, as illustrated fr an example windw. Fr clarity, the pixel particles are shwn as dts that are 11 pixels acrss. The technical definitin f h(l) is based n the measured variance cmpared t that fr a ttally randm arrangement f the same set f particles. Fr a truly randm pattern, the number f pixels with fluctuating particles is equal t the number n = (L/p ) d f pixels in the entire L d measuring windw. Fr nn-randm patterns with smaller variance, we take it instead t be the number n B = [L d (L h) d ]/p d f pixels in the bundary regin; this is where h enters. Intuitively, the particle number variance is set by the average number f particles in the bundary regin. Repeating the arguments in the first three paragraph f Sectin I A, but with n replaced by n B as the nly difference, gives the fllwing Fundamental Equatins f HUDLS fr cubic windws: V(L) = v L d [ L d (L h) d L d ], (13) R(L) = 1 (1 h/l) d, (14) h(l) = (L/){1 [1 R(L)] 1/d }. (15) Nte that the term in square brackets in Eq. (13) equals the right-hand side f Eq. (14), and is the rati f bundary vlume t windw vlume. As defined earlier, V(L) is shrthand fr the relative vlume fractin variance given by Eqs. (5-6) fr either Pissn r multinmial statistics, as apprpriate; v = I p d is the φ i -weighted average particle vlume; and R(L) V(L)/[ v /L d ] is the rati f the variance t that in a randm arrangement f the same particles. We emphasize that Eqs. (13-15) are equivalent, and serve t define h(l) in terms f the measured vlume fractin variance. The same set f equatins hlds fr pint particles in cntinuum space, and als fr spherical measuring windws if L is replaced by diameter. Befre putting this machinery int actin, we examine special cases and bunds. First, nte that V(L) = v /L d and R(L) = 1 are recvered fr ttally randm patterns, where h equals L/ by cnstructin. These are upper bunds [8]. Fr nt-ttally-randm patterns with liquid-like lng-range fluctuatins, V(L) als scales as 1/L d ; then R(L) ges t a cnstant and h(l) scales like L but with a prprtinality cnstant less than 1/. Fr separated particles at small L, where there is n mre than than ne particle per windw, the expectatins are V(L) = v /Ld φ 1 φ/ I, (16) R(L) = 1 φld / v 1 φ/ I, (17) h(l) = L L [ φl d ] 1/d / v φ/ I 1 φ/ I. (18) These are lwer bunds; hwever, at larger L where Eq. (18) falls belw p /, the lwer bunds are given instead by the fundamental equatins evaluated at h = p / (maximally hyperunifrm). In the cntinuum limit, the φ/ I terms vanish. Fr patterns where h(l) L hlds and fluctuatins are hence nly near the measuring windw surfaces, then expansin f the fundamental equatins gives V(L) = d v h(l), Ld+1 (19) R(L) = d h(l) L, (0) h(l) = 1 R(L)L. (1) d

7 7 The case f strng hyperunifrmity is V(L) v /L d+1 ; this crrespnds t a cnstant hyperunifrmity disrder length h(l) = h e. Nte that the very frm f the V(L) v /L d+1 scaling demands the existence f a new length scale, h e, in rder t becme dimensinally crrect: V(L) v h e /L d+1. Fr further intuitin and direct cnnectin with the surface cefficient Λ f Ref. [1], we repeat the derivatin f Eq. (19) fr the restricted case f mndisperse particles f vlume v, Pissn statistics fr bundary fluctuatins, arbitrary windw shapes, and h V Ω 1/d. Then the bundary vlume equals windw surface area A Ω times h, and the number variance equals the average number f particles in A Ω h: σ N = A Ωhφ. () v The vlume fractin variance is therefre ( ) v σ φ σ N = va Ωhφ V, (3) Ω V Ω and the relative variance is V(L) σ φ φ = va Ωh V Ω. (4) This reduces t Eq. (19) fr hypercubic windws, where V Ω = L d and A Ω = dl d 1. In Ref. [1] a surface cefficient is defined by σ N = Λ(R/b) d 1 and tabulated fr hyperspherical windws f radius R and mndisperse crystals with lattice spacing b. Thus Λ and h e are directly related by Λ(R/b) d 1 = A Ω h e φ/v. As anther aside, it might be tempting t use the fundamental equatins t analyze actual images f extended particles rather than their central-pixel representatin. We warn that this is crrect nly fr sufficiently large windws. Ref. [9] generalizes ur HUDLS analysis apprach t extended particles, and crrects upn Eq. (13) at small L by accunting fr particles that lie partially inside and partially utside the measuring windws. D. Multinmial Expectatins in d = In the fllwing sectins we measure the area fractin variance fr simulated tw-dimensinal patterns f nnverlapping pixel particles. S multinmial statistics are apprpriate, and fr reference the three quantities f interest are V(L) = σ φ (L) 4 a (L h)h = φ[1 φ/ I ] L 4, (5) R(L) = σ φ (L)L σ φ (p )p, (6) h(l) = (L/)[1 1 R(L)], (7) where a = I p is the area-fractin weighted average particle area. These equatins will be used t deduce R(L) and h(l) frm measurements f V(L). Results will be cmpared with the fllwing bunds: { a /L } φ max 1 φ/ I, I (L/p 1) (L/p ) 4 V(L) a L, (8) { 1 φl } / a max 1 φ/ I, I (L/p 1) (L/p ) R(L) 1, (9) { ( ) } L φl max 1 / a φ/ I 1, h(l) L. (30) p 1 φ/ I p p The upper bunds are fr ttally randm patterns; these will be pltted as red dashed lines. The lwer bunds are either the small-l expectatin fr separated particles, r the expectatin fr maximally-hyperunifrm as defined by h = p /; these will be pltted as green dtted curves. Nte that, with substitutin f a = I p, the bunds are all algebraic functins f the dimensinless variable x = L/p. Fr small L, and fr very disrdered patterns, it can happen that the measured variance exceeds the upper bund in accrd with expected statistical uncertainty. Then R is greater than ne and h cannt be deduced frm Eq. (7); instead, we take h = (L/)[1 + R 1] as a reasnable way t shw data pints and errr bars that verlap the upper bund. III. BINARY PIXEL PARTICLES We nw apply the abve methds t characterize three different types f tw-dimensinal binary pixel patterns created by simulatin. Here the image sizes are all 8600p 8600p, smewhat larger than typical digital vide images. Pixel values are either I(x, y) = 0 (empty) r I(x, y) = 1 (ne particle); therefre multinmial statistics reduce t binmial statistics, all particle areas are a = p, and the area fractin equals the fractin f pix-

8 8 els that cntain a particle. The area fractin variance σ φ (L) is measured as described abve using L L measuring windws, where L is varied frm p t at least 4300p, half the image width. A. Randm Binmial Patterns A simple algrithm is t flip each pixel frm zer t ne with prbability equal t the desired area fractin, φ. This creates a randm binmial pixel pattern, with an actual area fractin that is apprximately φ. T create a binmial pattern with exactly the desired area fractin, we instead select a pixel at randm, set its value t ne, and repeat until the desired number f pixel particles is reached. Such binmial patterns are the pixelated analgue f randm Pissn patterns fr pint particles. While pints literally ccupy zer vlume in Pissn patterns, binmial patterns have 0 < φ < 1 and reduce t a Pissn pattern at bth extremes. FIG. 3: (Clr nline) Area fractin variance (a) and hyperunifrmity disrder length (b) versus measuring windw size, fr simulated tw-dimensinal randm binmial pixel patterns with ttal area fractin φ as labeled. The system size is 8600p 8600p where p is the pixel width; this is indicated by yellw shading. The results agree well with expectatin f (a) σ φ /[φ(1 φ)] = (p /L) and (b) h = L/. Hwever there are significant finite-size effects fr large L, s all further simulated patterns will be analyzed nly up t half the system size. Simulatin results fr the relative variance V(L) = σ φ (L)/[φ(1 φ)] are pltted versus L/p in Fig. 3a fr six different target area fractins, ranging widely frm φ = 10 3 up t φ = 0.9. All data cllapse tgether and match the expectatin (p /L) t within statistical uncertainty fr L less than abut half the image width, where finite-size effects are expected t becme strng [11]. The crrespnding hyperunifrmity disrder lengths, deduced frm Eq. (7), are pltted underneath in Fig. 3b. All results cllapse tgether and match the expectatin h = L/ t within statistical uncertainty, as lng as finite-size effects are absent. The gd agreement between simulatin and expectatin validates ur calculatins as well as ur image analysis prcedures. Nte in particular that the factr f (1 φ) in the relative variance is crucial fr btaining gd cllapse at high packing fractins. B. Vacancy Patterns Anther type f disrdered pattern can be created by randmly remving a fractin f f particles frm a crystalline lattice. Here we study such vacancy patterns made frm pixel particles n a tw-dimensinal triangular lattice that is rtated by 14 with respect t the image grid. The rtatin, and the triangular pattern, help smth ut irregular features in the area fractin distributins that wuld be especially strng fr a square lattice with square measuring windws. We take the lattice spacing t be b = 30p, which gives the area fractin f the base crystal as φ c = 4/3(p /b) = When a fractin f f sites are vacant, the area fractin decreases t φ = (1 f)φ c. These are small cmpared t 1, s we may neglect factrs f (1 φ) and ur simulatins are effectively in the cntinuum limit with Pissn statistics. Simulatin results fr the relative variance are shwn in Fig. 4a fr several values f f. Each curve represents an average f 0 independent runs. All data initially decay as (p /L), just like fr randm patterns. As L increases tward the lattice spacing, the variance data fall belw the (p /L) upper bund, mre quickly fr smaller f. This behavir matches well the lwer bund given by the small-l separated-particle expectatin f Eq. (8). Fr f > 0, the final decay is nt as steep and appears t scale as 1/L. At small L there are prminent scillatins set by the lattice spacing. Fr large L and f = 0, the data appear t eventually apprach and hug the maximallyhyperunifrm bund. These trends are easier t see in terms f the crrespnding variance ratis, R(L), pltted underneath in Fig. 4b. In particular, it s mre apparent that the initial decay is in gd agreement with the small-l separated-particles expectatin f Eq. (9). And fr large-l, befre finite-size effects becme strng, the R(L) data appear t apprach a cnstant that equals the fractin f f vacancies. These features may all be readily understd, next, taking the relative variance f the perfect crystal as a given and using the binmial distributin t treat vacancies. T mdel the vlume fractin variance f vacancy patterns in d-dimensins, first nte that the number f particles in a particular L d measuring windw is equal t the

9 Similar cmputatin gives N v = n n k=0 (k q k )p n = f(1 f)n c + f N c and N c N v = n n k=0 (np n)(kq k ) = fn c. Plugging these int the expressin fr σ N, multiplying by (p /L) d t cnvert t area fractin variance, and dividing left and right hand sides by φ = (1 f)φ c, gives a final result that is surprisingly simple: σ φ (L) φ = (1 f) σ φ c (L) φ c + f 9 ( p ) d. (31) L Thus the relative variance f a vacancy pattern is the weighted average f that fr a perfect crystal plus that fr a randm binmial pattern. The variance rati and hyperunifrmity length can then be expressed in terms f thse quantities fr the perfect crystal as R(L) = (1 f)r c (L) + f, (3) h(l) = h c (L)(1 f) 1/d + L [1 (1 f)1/d ]. (33) Again these are weighted averages, but fr h(l) the weighting is nt linear in f. Fr f 0 the crystal results are recvered; and fr f 1, as all particles are remved, the pattern becmes ttally randm with h = L/. Since crystals are hyperunifrm, σ φ (L) shuld decay faster than 1/L d and therefre the secnd terms in Eqs. (31-33) will eventually dminate at large L. Then the large-l asympttic behavir is FIG. 4: (Clr nline) Area fractin variance (a), variance rati (b), and hyperunifrmity disrder length (c) versus measuring windw size, fr simulated tw-dimensinal triangular crystals with a specified fractin f f randm vacancies. Here φ is the area fractin, p is the pixel width, 8600p is image width (yellw shading), and b = 30p is the lattice spacing. Measurements are made at all integer L/p fr f = 0 (gray curve), but nly at a select subset fr f > 0. Results fr f = 0 at the same subset f L/p are shwn by black curves. The dash-dtted curves crrespnd t ur mdel, Eq. (31); these curves appear t stp belw a certain L, but in fact they are present but entirely cvered by the data curve. The red and green dashed curves represent the upper and lwer bunds given by Eqs. (8-30). The separated-particle bund is shwn nly fr the crystal. number N = N c N v f enclsed crystal lattice sites minus the number f vacancies. Therefre, the average ver a large set f L d measuring windws is N = N c N v, and the variance is σ N = σ Nc (N c N v N c N v ) + σ Nv. Fr the crystal lattice sites, we may write N c = np n and Nc = n p n where p n is the prbability f finding n sites in a randmly placed L d windw. If there are n sites in a windw, then the prbability fr k f them t be vacant is given by the binmial distributin as q k = {n!/[k!(n k)!]}f k (1 f) n k. By direct summatin, this gives N v = n n k=0 (kq k)p n = fn c as expected. σ φ (L) ( p ) d = f, φ L (34) R(L) = f, (35) h(l) = (L/)[1 (1 f) 1/d ]. (36) Fr ur d = simulatins, these predicted scalings with L are readily seen in Fig. 4. As a strnger test, V c (L), R c (L), and h c (L) were extracted frm the f = 0 data, and the resulting expectatins based n Eqs. (31-33) are pltted as dt-dashed curves. These match the f > 0 simulatin data very well, until finite-size effects becme strng. At ur level f precisin, such effects are nticeable even fr L dwn t ne tenth the sample width. Based n the R(L) f result fr vacancy patterns, we may interpret R(L) fr general systems nt just as a kind f randmness index but als mre specifically as the fractin f space available fr density fluctuatins at wavelength L. C. Einstein Patterns Our previus examples all exhibited h L at lng length scales, s nw we study a type f disrdered pattern that has n lng-range density fluctuatins and is unquestinably hyperunifrm. In particular, we cnsider tw-dimensinal pixel particles that are individually displaced by a Gaussian-distributed amunt frm a crystalline lattice. We dub these Einstein patterns

10 10 in hnr f Einstein s simplified mdel fr the heat capacity f slids, where each atm is harmnically bund t a fixed lattice site. This may be cmpared with the shuffled lattice patterns f Ref. [19], where each bject is placed randmly inside a cubic vlume surrunding a lattice site. Fr ur simulatins we again use a triangular lattice with spacing b = 30p, which is large enugh that factrs f (1 φ) may be drpped. Displacements in each dimensin are randmly drawn frm a Gaussian distributin specified by the dimensinless parameter δ = x rms /b = y rms /b. Fr large δ, it is smetimes necessary t repeat a trial placement until an unccupied pixel is fund. Example patterns are shwn in Fig. fr ne δ, and in Fig. 5 fr a sequence f increasing δ. We include δ = 0, althugh the crystal isn t perfect due t pixilatin effects that must be large fr x rms < p, i.e. here fr δ < 0.0. Nte that the underlying crystal is evident fr δ 1, including the case δ = 0.15 that crrespnds t the Lindemann criterins fr melting. Fr δ > 0.5, i.e. fr displacements larger than abut 1/ lattice spacing, it is difficult t detect the lattice by eye. Nevertheless, even fr very large δ, the particles are still bund t a lattice and hence cannt have lng-range density fluctuatins. This will be reflected intuitively, as shwn next, in terms f the behavir f the hyperunifrmity disrder length. We next measure the area fractin variance as abve, and display the results in Fig. 6a. The crrespnding variance ratis and hyperunifrmity disrder lengths are shwn underneath, in Figs. 6b-c. Each curve represents an average f furteen Einstein patterns, all with different displacements, and where the underlying lattice was rtated by a different angle θ {1,,..., 14 }. This helps minimize artifacts frm pixelatin as well as frm cmmensuratin f the lattice with the square measuring windws. Such artifacts are still present fr the zer-temperature crystal case, δ = 0, where the relative variance is cmputed at each integer L/p in the range Since these artifacts vanish fr large enugh δ, we then measure at fewer windw sizes. The bserved behavir is as fllws. At small L, the relative variances fr all δ match well with the randm binmial expectatin with h = L/. Fr increasing L, each data curve eventually falls belw the binmial expectatin sner fr smaller δ, i.e fr less disrder. The δ = 0 crystal results shw prnunced scillatins with features lcated accrding t lattice spacing. At large enugh L such features are less regular, thugh are still present, and the variance appraches the lwer bund f maximally hyperunifrm. Fr δ > 0, the variance results similarly shw a final decay f 1/L 3 but with a numerical prefactr that grws with δ. Einstein patterns are therefre all hyperunifrm, but nt maximally s. The extent f hyperunifrmity may be diagnsed in terms f the behavir seen in Fig. 6c fr the hyperunifrmity disrder length at large L. In particular a signature f strng hyperunifrmity is that h becmes a cnstant, and the degree f hyperunifrmity may be judged by the FIG. 5: (Clr nline) Example Einstein patterns fr different rt-mean-square displacements, labeled by the value f δ = x rms/b = y rms/b. Here the lattice spacing b is 30 pixels, and fr clarity the particles are shwn as dts that are many pixels acrss. By eye, patterns (f)-(i) are nearly indistinguishable and appear quite randm. size h e f this cnstant. T deduce h e we either average the large-l results r we fit t h(l) = h e(e αl/he 1) α + (e αl/he 1), (37) where α and h e are adjustable parameters. This empirical functin has an expnential crssver frm h = L/

11 11 which cmes frm the cmbinatin f pixelatin and Gaussian kicks. This makes intuitive sense by thinking f a fixed measuring windw and harmnically bund particles that independently scillate in time with thermal energy. Number fluctuatins are primarily due t the particles whse lattice sites lie within a distance h e frm the bundary f the measuring windw. This degree f disrder is nt evident t the eye when the rt-meansquare displacement is larger than the lattice spacing. But it is readily detected by analyzing the relative variance in terms f the hyperunifrmity disrder length. FIG. 6: (Clr nline) Area fractin variance (a), variance rati (b), and hyperunifrmity disrder length (c) versus measuring windw size, fr simulated tw-dimensinal Einstein patterns with specified dimensinless rt-mean-square displacement, δ. Here φ is the area fractin, p is the pixel width, 8600p is image width (yellw shading), and b = 30p is the lattice spacing. In (c) an empirical fitting functin is shwn, which may be used t estimate the cnstant value h e f the hyperunifrmity length at large L. Nte that h e is rughly ne-half the rt-mean-square displacement in each dimensin. Measurements are made at all integer L/p fr δ = 0 (gray curve), but nly at a select subset fr δ > 0. Results fr δ = 0 at the same subset f L/p are shwn by black curves. The red and green dashed curves represent the upper and lwer bunds given by Eqs. (8-30). at small L t h = h e at large L. It is seen in Fig. 6c t match the data quite well, except fr the scillatins cming frm the crystal. The fitting results fr α are cnstant: α = 0.77 ± 0.0. The fitting results fr h e are pltted versus δ = x rms /b = y rms /b in Fig. 7, and are well described by h e = (p /) + (cx rms ), (38) with c 1/. Thus, h e is apprximately ne-half the ttal rt-mean-square displacement in each dimensin, FIG. 7: (Clr nline) Large-L value f the hyperunifrmity disrder length versus dimensinless rt-mean square displacement, δ = x rms/b = y rms/b, fr the Einstein pattern results shwn in Fig. 6b with lattice spacing b = 30p. The insert is a blw-up f the small-δ regin. The fitting functin h e = (p /) + (cbδ) matches the data well with c = 0.56 ± By cntrast a linear fit fr all δ, shwn by the dashed yellw line in the inset, fails fr small δ. D. Finite-size effects The degree t which variance measurements are affected by the finite size f the system can be examined in terms f the rati f measured t expected variance as a functin f L/W where W is the width f the sample. This is shwn in Fig. 8 fr all three pattern types discussed abve. Fr the binmial and vacancy patterns, we fund n trend with area fractin and f, respectively. S results are averaged tgether. As seen in Fig. 8, finite size effects are generally largest fr the binmial patterns and smallest fr the Einstein patterns. In all cases, the variance is suppressed and the amunt increases with disrder and the range f the density fluctuatins. Thus Einstein patterns with small δ are least affected, and binmial patterns are mst affected. Fr general guidance, systematic errrs are n mre than abut 1% fr L < 0.05W and n mre than abut 10% fr L < 0.W. But fr strngly hyperunifrm systems the systematic errrs can be cnsiderably less.

12 1 1 σ φ / [φ(<ι> φ)] (p /L) I = {1,, 3} in equal numbers I = {1,, 4, 8} in equal area fractins FIG. 8: (Clr nline) Rati f simulated t expected area fractin variance versus L/W where L is the width f the measuring bxes and W = 8300p is the width f the sample. Data are frm previus figures. As seen, the effect f finite sample size is t suppressed the variance at large L. The lnger the range f the density fluctuatins, the larger the effect. IV. GRAYSCALE PIXEL PARTICLES In this sectin we apply the same analysis apprach t three different types f simulated tw-dimensinal patterns where the pixel particles are nw plydisperse, with a range f intensity values I i that differ frm ne. The particle areas are a i = I i p, and the expectatins are determined by the weighted average a = I p = φi a i /φ. Area fractins are given by the sum f intensities divided by number f pixels, and the variance σ φ (L) is measured using L L square windws. A. Randm Multinmial Patterns The first test is fr ttally randm multinmial patterns made either frm equal numbers f three species f pixel particle with grayscale intensities {1,, 3}, r fr patterns made frm equal area fractins f fur species f pixel particle with grayscale intensities {1,, 4, 8}. Tw patterns are created fr each mixture, with different ttal area fractins f 0.1 and 0.9, by randmly chsing pixels values as {0, I 1, I,...} with apprpriate prbabilities {1 q i, q 1, q,...}. The relative variance is expected t be V(L) = σ φ (L)/[φ(1 φ/ I ] = I (p /L), where the φ/ I term cannt be neglected. We therefre plt V(L)/ I in Fig. 9 and cmpare with (p /L). As expected, the data fr all fur patterns perfectly cllapse t this pwer law until finite size effects becme nticeable at large L. This validates the multinmial statistics calculatin, and serves t emphasize that the relevant average particle area is set by φ i -weighting L/p FIG. 9: (Clr nline) Nrmalized area fractin variance versus measuring windw size fr fur randm multinmial pixel patterns. Tw mixtures f pixel particle species are used, as labeled, and patterns fr each are created with ttal area fractins f 0.1 (smaller symbls) and 0.9 (larger symbls). A small prtin f the {1,, 3} system with φ = 0.9 is shwn in the inset. Fr all fur patterns, the relative variance results agree well with the (p /L) expectatin shwn by the dashed red line. B. Bidisperse Squares: Overlapping The secnd test is fr a grayscale Pissn pattern made frm f a 50:50 mixture f tw different size square particles, a 1 = (10p ) and a = (0p ), and the assciated central pixel pattern. Extended particles are repeatedly added at randm lcatins, such that each cvered pixel is incremented by +1, until the respective area fractins reach φ 1 = 0. and φ = 0.8. The ttal area fractin is then φ = 1 and the φ i -weighted average particle area is a = 340p. Nte that particle-particle verlaps are freely allwed, and that the value f each pixel is equal t the number f particles that cver it. In parallel we cnstruct the central pixel pattern representatin f the same cnfiguratins, where the center pixel fr each particle f each species is incremented by I 1 = 100 r I = 400. Fr bth image types, the lcal area fractin is given by the sum f pixel values per unit area. Small examples f extended-particle and crrespnding central-pixel images are shwn in the insets f Fig. 10. Even thugh the ttal area fractin is ne, the particles are large enugh that the central pixel pattern is quite dilute and has intensity values f nly {0, I 1, I }. Therefre, the distinctin between Pissn and multinmial statistics fr the central pixel representatin can be neglected. The main plt f Fig. 10 shws the relative area fractin variance fr the tw different representatins f the same arrangement. The results fr the central-pixel image are well described by the predictin σ φ /φ = a /L = 340(p /L). By cntrast, the relative variance fr the extended particle image merges nt a /L nly fr L much greater than the particle sizes; in this limit the tw representatins give identical results. At small-l the relative variance fr the extended particle image has

13 13 σ φ / φ (p /L) Lastly, we use a central-pixel representatin t diagnse the unifrmity f simulated 50:50 bidisperse mixtures f a 1 = (10p ) and a = (0p ) square particles with a = 340p as a functin f ttal area fractin. This system is like in Fig. 10, but with ne majr difference: Randm trial lcatins are nw rejected if any particle-particle verlap ccurs. An example f the resulting binary pattern f extended particles is shwn in the inset f Fig. 11. As befre, central-pixel representatins are simultaneusly made and then analyzed. Results fr the relative variance, the variance rati, and the crrespnding hyperunifrmity disrder lengths, are cllected in Fig. 11. The general behavir is an amalgam f key features seen fr the vacancy and Einstein patterns. Like the latter, the system matches the separatedparticles expectatins at small L fllwed by a develping plateau f cnstant h(l) but nly ut t intermediate L. At larger L, the scaling then crsses ver t that seen fr the vacancy patterns with lng-range density fluctuatins: V(L) 1/L, R(L) cnstant, and h(l) L. With increasing φ, the plateau becmes mre prnunces and the lng-range density fluctuatins decrease. If the length f the plateau were t diverge as φ increases tward randm-clse packing, then the nset f jamming wuld be accmpanied by the develpment f strng hyperunifrmity like in an Einstein pattern. This is the tpic f a fllwing paper [30], where different packing prtcls are used t generate bigger systems with higher packing fractins than are accessible here. Fr nw, Fig. 11 serves as demnstratin f the HUDLS analysis methd fr plydisperse hard r sft particles and, hpefully, als whets the appetite fr its larger scale uses a 1 =(10p ), φ 1 = (a) φ=0.35: a =(0p ), φ = L/p FIG. 10: (Clr nline) Relative variance versus measuring windw size fr a randm arrangement f a 50:50 bidisperse mixture f extended square particles (gray squares) and the crrespnding central-pixel representatin (red dts). The actual image sizes are 4300p 4300p ; much smaller versins are shwn as insets. Particle sizes and ttal area fractins are labeled. The φ i-weighted average area f the tw species is a = 340p. The red line is the a /L expectatin. The gray curve is frm Ref. [9]. σ φ (L)/ φ R (L) area fractin (b) 4 340[(L/p )-1]/(L/p ) 340(p /L) a slwer decay starting frm σ φ /φ = 1 at L = p. This reflects the particle shape as well as the randm arrangement [9], whereas the decay fr central pixel patterns reflects nly the nature f the arrangement. 0.1 [(L/p )-1]/(L/p ) C. Bidisperse Squares: Nn-Overlapping 100 (c) h(l)/p 10 1 L/(p ) 1 10 L/p 100 FIG. 11: (Clr nline) Relative variance (a), variance rati (b), and hyperunifrmity disrder length (c) versus measuring windw size fr the central-pixel representatin f arrangements f nn-verlapping a 1 = (10p ) and a = (0p ) square particles, in equal numbers, like in the inset, fr several area fractins. Fr clarity, errr bars are pltted n nly a few data as sets marked in the legend. The red and green brken curves represent the upper and lwer bunds given by Eqs. (8-30). The separated-particle bund is shwn nly fr the largest packing fractin. 1/