The Rigaku SAXS Solution Portfolio. Rigaku Innovative Technologies Inc. Paul Ulrich PENNARTZ

Size: px
Start display at page:

Download "The Rigaku SAXS Solution Portfolio. Rigaku Innovative Technologies Inc. Paul Ulrich PENNARTZ"

Transcription

1 The Rigaku SAXS Solution Portfolio Rigaku Innovative Technologies Inc. Paul Ulrich PENNARTZ

2 Scaling of SAXS/WAXS

3 Principle of SAXS X-ray Sample Beam Stop Scattering angle ( 2q = 0~10 deg. ) Important: Important:

4 Rigaku SAXS Portfolio * Ultima IV & SmartLab S-MAX 3000 NANOPIX NanoMAX & NanoMAX IQ

5 Ultima IV/SmartLab SAXS X-ray Sample

6 Application Tree Composit materials Polymers in Solution Metal powders, bulks Anisotropic Scatterers Nanoparticles in solution Isotropic Scatterers Cracks, pores etc. Bones, cotton, carbon composites Nanoparticles Surfaces Polymers Application Ultima IV & SmartLab SAXS

7 NANOPIX Nano Particle Inspection X-ray tool : NANOPIX

8 NANOPIX Concept "Easy operation for experts and non-expert" The analysis of the main use purpose and method in a small-angle scattering analysis. Small-angle scattering analysis apparatus that has greatly improved the usability of the main purpose SAXS application. Target Market Professional user and entry user. The entry user has a steep learning curve. Structure scientist interested in nano-scale materials (size distribution analysis, preferred orientation, shape crystallinity) General Features Material science applications, solution scattering including nanoparticle and polymers (fully cover all SAXS applications) Q min starting at about 0.02 nm -1 (very low-q measurement capability) The system is fully motorized and controlled by software. Sample-to-detector distance is easily changed by manual movement. Position of sample is measured and sent to PC.

9 Pinhole SAXS System X-ray Sample Beam Stop + Detector

10

11 Application Tree Composit materials Polymers in Solution Metal powders, bulks Anisotropic Scatterers Nanoparticles in solution Isotropic Scatterers Cracks, pores etc. Bones, cotton, carbon composites Nanoparticles Surfaces Polymers Application NANOPIX

12 Sources X-ray generated Synchroton Lab Source Divergence Low, almost parallel Divergent in all directions Energy Adjustable in wide area Depending on target mostly Kα or Kα 1 Polarisation Intensity Yes, almost 100% within storage ring direction Very high photon/second/sterad/δe No, almost not polarized at all High 10 9 depending on source Pulsed source Yes, second pulses No, continuous emission Availability At research centers In your lab (typical basement)

13 Lab X-ray Sources by Rigaku Focal Spot Max. Power Anode Material MM003i 30 µm 30 W Cu, Mo, Ag MM µm 40 W Cu MM x 1000 µm 9000 W Cu, Cr, Fe, Co, Ni, Ag, Mo, Au, W MM µm 1200 W Cu, Mo, Cr FR-E 70 µm 2475 W Cu, Cr

14 2D Focusing Monochromators Synthetic Multilayers with Graded Index Kirkpatrick-Baez Scheme Cross-Coupled Side-by-side optical systems Confocal First reflection zone Second reflection zone Each mirror reflects one vector component independently Elliptical mirrors focus the beam and parabolic mirrors collimate the beam Large capture angle Symmetric magnification Compact Easy alignment

15 Detectors HyPix HyPix-6000 Direct photon counting Efficiency: >99% (Cu, Co) 100x100 mm 2 pixel size No point spread function Resolution = pixel size Zero background

16 Detectors Technology Rigaku HyPix-3000 Hybrid pixel array Rigaku HyPix-6000 Hybrid pixel array Size 38.5 x 77.5 mm 2 77 x 77.5 mm 2 Area 2,984 mm 2 5,968 mm 2 Pixel size 100 x 100 mm x 100 mm 2 Point spread function - - XRF suppression YES YES Energy discriminator Count rate (Local) 2 1 >1 Mcps >1 Mcps Background <0.1 cps <0.1 cps 0D mode YES YES 1D mode YES YES 2D mode YES YES

17 Rigaku's fundamental technologies Beam module Two-dimentional detector High perfomance pinhole slit (Optinal) Vaccum path and sample stage

18

19 Beam module NANOPIX beam module X-ray source (selectable) MM007 (Standard) and FR-X (Optional) Multilayer mirror for Cu Newly desigend CMF

20 2 pinhole collimation Source Pinhole slit combination (selectable) 2 pinhole (high performance pinhole) and 3 pinhole (Pt pinhole) configurations are selectable, and no need to adjust the pinholes. CMF Detector Source CMF 1st slit 3 pinhole collimation 3rd (2nd) slit Beam stop Detector 1st slit 2nd slit Beam stop 3rd slit Pinhole slit coliation is fully motorized.

21

22 Sample stage Vaccum path and sample stage Sample-to-detector distance is easilly changed Sample stage position is easilly changed sample stage

23 Sample stage Standard sample holder Kinematic base

24 System length The system performance is selectable 2.0 m 3.0 m

25

26

27 Samples of applications SAXS studies of anisotropic sample - rat tail collagen 2D SAXS scattering patterns from rat tail collagen (left) and integrated 1D profile I vs Q(right). The Q min can reach to 0.05nm -1 and first peak corresponding to ~63nm can be clearly measured. If Q min is as large as 0.069nm -1 this first peak can t be clearly determined.

28 SAXS/WAXS in Biominerization Simultaneous SAXS and WAXS Studies of Bones Simultaneous 2D SAXS( left) and WAXS(right) patterns from bones

29 The following results are obtained by Dr. Cincia Gianini ICCS Bari/Italy

30 Research Theme: Bone XMI-LAB allows to collect scanning small and wide angle X-ray scattering (scanning SWAXS) Studies of healthy and pathologic human bone sections : dwarfism syndrome, coxarthrosis and Paget s disease. Inspection of the structural and morphological order of bone at the nanoscale Partner: RIZZOLI - BOLOGNA FR-E+ SuperBright Data are collected with a high brilliance synctrotron like microsource (FR-E+ SuperBrigth)coupled with a 3-pinhole SWAXS camera. Fiber-like hierachical materials (collagen cellulose) Typical outcome: a. CPL microscopy b. WAXS microscopy c. SAXS microscopy Map of mono-oriented interfibrillar aligned mineral nanocrystals Map of the collagen fiber by SAXS Microscopy

31 SAXS in Nanocomposites Simultaneous SAXS and WAXS Studies of Nanocomposites---SAXS Data The SAXS pattern of PP(left) and the plots of unwrapped azimuth angle in degree vs. Q (right). The SAXS data reveal that PP has an ordered structure with strong orientation. The sample - detector distance is 820mm

32 SAXS/WAXS in Nanocomposites Simultaneous SAXS and WAXS Studies of Nanocomposites---WAXS data The WAXS pattern of PP(left) and the plot of azimuthally averaged I vs. Q (right). Ordered structure was observed. The data were collected at sample-detector distance of 40mm.

33 Eggiman, Tate & Hillhouse, Chem. Mater. Grazing Incidence SAXS 2D SAXS upon Substrate Rotation: from TSAXS to GISAXS

34 GISAXS Study of a 3D Ordered Assembly of Iron Oxide Nanocrystals. Altamura D., Holy V., Siliqi D., Cozzoli D., Fan L., Gozzo F., and Giannini C. 2014

35 Samples of applications GISAXS Studies of Copolymer Thin Films 2D GISAXS pattern from a copolymer thin film. Such materials with weak scattering ability is always challenge for laboratory GISAXS. The Rigaku S-Max3000 can determine their morphology The peak positions are Qxy= 0.043, 0.075, A -1 The ratio follows 1:3 1/2 : 4 1/ 2, indicating a hexagonal structure

36 NanoMAX NanoMAX IQ

37 NanoMAX & NanoMAX-IQ X-ray Sample

38 Application Tree Composit materials Polymers in Solution Metal powders, bulks Anisotropic Scatterers Nanoparticles in solution Isotropic Scatterers Cracks, pores etc. Bones, cotton, carbon composites Nanoparticles Surfaces Polymers Application NanoMAX & NanoMAX-IQ

39 NanoMAX Hardware Overview Beam stop (Pin Diode) Kratky Block Detector Attenuator 4 Jaw slits Detector Sample holder Kratky Block

40 Inter-relationship of q and flux Photo of the 2dk block Top view of 2d kratky block at varied q min

41 Inter-relationship of q and flux X-ray source (CMF) Low q min (Low flux) Sample Mid q min (Mid flux) High q min (High flux) SMAX HF 2DK+FR-E 1-0,005 7E-17 0,005 0,01 0,015 Minimum q vers. flux (q A -1 )

42 NanoMAX Detector Sensor: Reversed biased silicon diode array Active area: 83.8 mm x 33.5 mm Pixel Size: 172 µm x 172 µm Count rate: up to 2 x 10 6 photons/sec/pixel DQE: CuKa Cooling: Air cooled

43 NanoMAX and SMAX Data Quality Comparison SMAX3000 Rg ; 15.0(0.65) Points ; NanoMAX+FR-E Rg ; 15.1(0.039) Points ; 6-38

44 NanoMAX examples System/Lysozyme As a highly diluted sample Exposure time (min) concentration (mg/ml) NanoMAX S-MAX A A -1

45 Silverbehenate on different SAXS machines 0.25 A -1 S-MAX A -1 NanoMAX NanoMAX-IQ 4,9 A -1

46 Sample Holders

47 Acknowledgements This presentation was only possible due to the support of my colleagues at Rigaku. Dr. Licai Jiang Mr. Nick Grupido Dr. Petra Pennartz Dr. Mike Degen and many others But also I will not forget my friends and customers at ETH Zurich/CH, Prof. R. Mezzenga, Dr. T. Sanches-Ferrer AMI/Fribourg/CH, Dr. S. Balog RWTH/Aachen/D, Dr. Th. Eckert ICCS Bari/I, Prof. C. Giannini and all members of their teams and many others

48 Typical Models Shapeless Spheres Clustered spheres (Debye model) Cylinders Core/shell spheres

49 Raw data (1) Real Life SAXS Data SAXSGUI Reduced data (2) SAXSGUI analyzed data (3) Result (4) Core Shell structure

50 Raw data (1) Real Life SAXS Data SAXSGUI Reduced data (2) SAXSGUI analyzed data (3) center to center Result (4) Particles approx 275 Ang size, Center to Center distance of particles Approx. 36 Ang can be interpreted from fringes in data analysis.

51 Why SAXS now? ln(i) q 2 I Log(I) P(r) SAXS pattern Guinier plot q [Å -1 ] Kratky plot Pair distribution function q 2 [Å -2 ] q [Å -1 ] r [Å] Journal of Structural Biology 172 (2010)

52 Any Questions?

The Compact Laboratory SAXS/WAXS/GISAXS System. SAXSpoint

The Compact Laboratory SAXS/WAXS/GISAXS System. SAXSpoint The Compact Laboratory SAXS/WAXS/GISAXS System SAXSpoint SAXSpoint The world s brightest footprint It s a common mindset that small-angle X-ray scattering experiments of high resolution require synchrotron

More information

The Compact Solution for Nanostructure Analysis. SAXSpace

The Compact Solution for Nanostructure Analysis. SAXSpace The Compact Solution for Nanostructure Analysis SAXSpace New to SAXS? Here are some essentials. What SAXS is SAXS, Small-Angle X-ray Scattering, is a non-destructive method for investigating nanostructures

More information

The Laboratory SAXS/WAXS/GISAXS Beamline. SAXSpoint 2.0

The Laboratory SAXS/WAXS/GISAXS Beamline. SAXSpoint 2.0 The Laboratory SAXS/WAXS/GISAXS Beamline SAXSpoint 2.0 SAXSpoint 2.0 Ideas take shape The new generation SAXSpoint 2.0 system provides an innovative solution for SAXS, WAXS and grazingincidence (GI) SAXS

More information

Supporting Information

Supporting Information Electronic Supplementary Material (ESI) for Physical Chemistry Chemical Physics. This journal is the Owner Societies 2016 Supporting Information to True ferroelectric switching in thin films of trialkylbenzene-1,3,5-tricarboxamide

More information

The SAXS Guide. Getting acquainted with the principles. New Edition with special contributions

The SAXS Guide. Getting acquainted with the principles. New Edition with special contributions The SAXS Guide Getting acquainted with the principles New Edition with special contributions The SAXS Guide Getting acquainted with the principles 4 th edition by Heimo Schnablegger Yashveer Singh Special

More information

Introduction to SAXS at SSRL

Introduction to SAXS at SSRL Everything You Ever Wanted to Know About Introduction to SAXS at SSRL SAXS But Were Afraid to Ask John A Pople Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford CA

More information

SAXS COURSE Richard Koschuch. HECUS M.Braun Graz X-Ray Systems. and. Institute of Biophysics and X-Ray Structure Research,

SAXS COURSE Richard Koschuch. HECUS M.Braun Graz X-Ray Systems. and. Institute of Biophysics and X-Ray Structure Research, SAXS COURSE 2003 Richard Koschuch HECUS M.Braun Graz X-Ray Systems and Institute of Biophysics and X-Ray Structure Research, Austrian Academy of Sciences, Graz, Austria The SWAXS Instrument Scheme of the

More information

SAXSpace. The modular solution for nanostructure analysis. ::: Innovation in Materials Science

SAXSpace. The modular solution for nanostructure analysis. ::: Innovation in Materials Science SAXSpace The modular solution for nanostructure analysis ::: Innovation in Materials Science New to SAXS? Here are some essentials. What SAXS is Internal Structure SAXS, Small-Angle X-ray Scattering, is

More information

HOW TO ANALYZE SYNCHROTRON DATA

HOW TO ANALYZE SYNCHROTRON DATA HOW TO ANALYZE SYNCHROTRON DATA 1 SYNCHROTRON APPLICATIONS - WHAT Diffraction data are collected on diffractometer lines at the world s synchrotron sources. Most synchrotrons have one or more user facilities

More information

Introduction to X-ray and neutron scattering

Introduction to X-ray and neutron scattering UNESCO/IUPAC Postgraduate Course in Polymer Science Lecture: Introduction to X-ray and neutron scattering Zhigunov Alexander Institute of Macromolecular Chemistry ASCR, Heyrovsky sq., Prague -16 06 http://www.imc.cas.cz/unesco/index.html

More information

2) Measure sample and empties. 3) Measure transmissions of sample and empties. 4) Normalize to exposure time and transmission. 5) Subtract the empties

2) Measure sample and empties. 3) Measure transmissions of sample and empties. 4) Normalize to exposure time and transmission. 5) Subtract the empties 1) Measure calibrants and direct beam to do Angular Integrations (transforms 2D into 1D) Need the distance SD Need center of beam Need to calculate q-vector 2) Measure sample and empties 3) Measure transmissions

More information

Methoden moderner Röntgenphysik II Streuung und Abbildung

Methoden moderner Röntgenphysik II Streuung und Abbildung Methoden moderner Röntgenphysik II Streuung und Abbildung Stephan V. Roth DESY 12.05.2015 Outline > 12.05.: Small-Angle X-ray Scattering (SAXS) > 19.05.: SAXS > 21.05.: Applications of SAXS > 02.06.: Grazing

More information

Diffractometer. Geometry Optics Detectors

Diffractometer. Geometry Optics Detectors Diffractometer Geometry Optics Detectors Diffractometers Debye Scherrer Camera V.K. Pecharsky and P.Y. Zavalij Fundamentals of Powder Diffraction and Structural Characterization of Materials. Diffractometers

More information

PLS-II s STXM and its application activities

PLS-II s STXM and its application activities 1 PLS-II s STXM and its application activities Hyun-Joon Shin Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Korea shj001@postech.ac.kr Two accelerators for x-rays...

More information

Methoden moderner Röntgenphysik II Streuung und Abbildung

Methoden moderner Röntgenphysik II Streuung und Abbildung Methoden moderner Röntgenphysik II Streuung und Abbildung Stephan V. Roth DESY 5.6.14 Two phase Model single particle approximation > Amplitude: Δ 3 > Intensity: = > Closer look at Iq for dilute systems:

More information

Ternary blend polymer solar cells with enhanced power conversion efficiency

Ternary blend polymer solar cells with enhanced power conversion efficiency Ternary blend polymer solar cells with enhanced power conversion efficiency Luyao Lu 1, Tao Xu 1, Wei Chen 2,3, Erik S. Landry 2,3, Luping Yu 1 * 1. Department of Chemistry and The James Franck Institute,

More information

Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS

Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Supporting Information Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Kamran Khajehpour,* a Tim Williams, b,c Laure Bourgeois b,d and Sam Adeloju a

More information

Design of multilayer X-ray mirrors and systems

Design of multilayer X-ray mirrors and systems Design of multilayer X-ray mirrors and systems T. Holz*, R. Dietsch*, S. Braun**, A. Leson** * AXO DRESDEN GmbH, Germany ** Fraunhofer IWS Dresden, Germany Introduction CHARACTERISTICS 1D periodicity of

More information

2D XRD Imaging by Projection-Type X-Ray Microscope

2D XRD Imaging by Projection-Type X-Ray Microscope 0/25 National Institute for Materials Science,Tsukuba, Japan 2D XRD Imaging by Projection-Type X-Ray Microscope 1. Introduction - What s projection-type X-ray microscope? 2. Examples for inhomogeneous/patterned

More information

EM-30AX is very good space utilization

EM-30AX is very good space utilization EM helps to grasp material characteristics through providing precise images. EM makes it possible to analyze deep submicron or nanometer structure. Alteration of material caused by pressure, heat can be

More information

Performance of the MCP-PMT for the Belle II TOP counter

Performance of the MCP-PMT for the Belle II TOP counter Performance of the MCP-PMT for the Belle II TOP counter a, S. Hirose b, T. Iijima ab, K. Inami b, Y. Kato a, Y. Maeda a, R. Mizuno b, Y. Sato a and K. Suzuki b a Kobayashi-Maskawa Institute, Nagoya University

More information

The Small Angle X-ray Scattering Technique: An Overview

The Small Angle X-ray Scattering Technique: An Overview The Small Angle X-ray Scattering Technique: An Overview Dr. Gianluca Croce, Ph.D DISTA - Univ. Piemonte Orientale Via T. Michel 11,15121 Alessandria (Italy) gianluca.croce@mfn.unipmn.it Dr. Gianluca Croce

More information

May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa

May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa ESRF, The European Synchrotron 71 Rue des Martyrs, 38000 Grenoble, France EXP DIV - THE SURFACE

More information

Student Projects for

Student Projects for MINERALS RESOURCES Student Projects for 2016-17 The CSIRO On-line Analysis (OLA) Group offers opportunities for students to undertake applied physics research projects at our Lucas Heights laboratories.

More information

Structural Characterization of Giant Magnetoresistance Multilayers with New Grazing Incidence X-ray Fluorescence

Structural Characterization of Giant Magnetoresistance Multilayers with New Grazing Incidence X-ray Fluorescence Structural Characterization of Giant Magnetoresistance Multilayers with New Grazing Incidence X-ray Fluorescence vnaoki Awaji (Manuscript received December 13, 21) We have developed a grazing incidence

More information

Sample Alignment (2D detector) Part

Sample Alignment (2D detector) Part Sample Alignment (2D detector) Part Contents Contents 1 How to set Part conditions...1 1.1 Setting conditions... 1 1.2 Customizing scan conditions and slit conditions... 6 2 Sample alignment sequence...13

More information

Low Voltage Field Emission SEM (LV FE-SEM): A Promising Imaging Approach for Graphene Samples

Low Voltage Field Emission SEM (LV FE-SEM): A Promising Imaging Approach for Graphene Samples Low Voltage Field Emission SEM (LV FE-SEM): A Promising Imaging Approach for Graphene Samples Jining Xie Agilent Technologies May 23 rd, 2012 www.agilent.com/find/nano Outline 1. Introduction 2. Agilent

More information

Basics of Synchrotron Radiation Beamlines and Detectors. Basics of synchrotron radiation X-ray optics as they apply to EXAFS experiments Detectors

Basics of Synchrotron Radiation Beamlines and Detectors. Basics of synchrotron radiation X-ray optics as they apply to EXAFS experiments Detectors Basics of Synchrotron Radiation Beamlines and Detectors Basics of synchrotron radiation X-ray optics as they apply to EXAFS experiments Detectors Important properties of Synchrotron Radiation Tunability

More information

Lesson 2 Diffractometers & Phase Identification

Lesson 2 Diffractometers & Phase Identification Lesson 2 Diffractometers & Phase Identification Nicola Döbelin RMS Foundation, Bettlach, Switzerland February 11 14, 2013, Riga, Latvia Repetition: Generation of X-rays Kα 1 Target (Cu, Mo, Fe, Co,...)

More information

Laboratory 3&4: Confocal Microscopy Imaging of Single-Emitter Fluorescence and Hanbury Brown and Twiss setup for Photon Antibunching

Laboratory 3&4: Confocal Microscopy Imaging of Single-Emitter Fluorescence and Hanbury Brown and Twiss setup for Photon Antibunching Laboratory 3&4: Confocal Microscopy Imaging of Single-Emitter Fluorescence and Hanbury Brown and Twiss setup for Photon Antibunching Jose Alejandro Graniel Institute of Optics University of Rochester,

More information

When to Utilize SAXS. Everything You Ever Wanted to Know About. SAXS But Were Afraid to Ask

When to Utilize SAXS. Everything You Ever Wanted to Know About. SAXS But Were Afraid to Ask Everything You Ever Wanted to Know About When to Utilize SAXS SAXS But Were Afraid to Ask John A Pople Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford CA 94309 When

More information

ADVANCED APPLICATIONS OF SYNCHROTRON RADIATION IN CLAY SCIENCE

ADVANCED APPLICATIONS OF SYNCHROTRON RADIATION IN CLAY SCIENCE CMS WORKSHOP LECTURES Volume 19 ADVANCED APPLICATIONS OF SYNCHROTRON RADIATION IN CLAY SCIENCE THE CLAY MINERALS SOCIETY Joseph W. Stucki, Series Editor and Editor in Chief University of Illinois Urbana,

More information

EUV Reflectivity measurements on Acktar Sample Magic Black

EUV Reflectivity measurements on Acktar Sample Magic Black Report EUV Reflectivity measurements on Acktar Sample Magic Black S. Döring, Dr. K. Mann Laser-Laboratorium Göttingen e.v. October 28, 2011 Contents 1 Introduction 3 2 Setup 3 3 Measurements 4 4 Conclusion

More information

X-Ray Microscopy with Elemental, Chemical, and Structural Contrast

X-Ray Microscopy with Elemental, Chemical, and Structural Contrast Institut für Strukturphysik, TU Dresden, Christian Schroer (schroer@xray-lens.de) X-Ray Microscopy with Elemental, Chemical, and Structural Contrast Christian G. Schroer Institute of Structural Physics,

More information

Shedding New Light on Materials Science with Raman Imaging

Shedding New Light on Materials Science with Raman Imaging Shedding New Light on Materials Science with Raman Imaging Robert Heintz, Ph.D. Senior Applications Specialist 1 The world leader in serving science Raman Imaging Provides More Information Microscope problems

More information

Detection of Single Photon Emission by Hanbury-Brown Twiss Interferometry

Detection of Single Photon Emission by Hanbury-Brown Twiss Interferometry Detection of Single Photon Emission by Hanbury-Brown Twiss Interferometry Greg Howland and Steven Bloch May 11, 009 Abstract We prepare a solution of nano-diamond particles on a glass microscope slide

More information

LAB 01 X-RAY EMISSION & ABSORPTION

LAB 01 X-RAY EMISSION & ABSORPTION LAB 0 X-RAY EMISSION & ABSORPTION REPORT BY: TEAM MEMBER NAME: Ashley Tsai LAB SECTION No. 05 GROUP 2 EXPERIMENT DATE: Feb., 204 SUBMISSION DATE: Feb. 8, 204 Page of 3 ABSTRACT The goal of this experiment

More information

Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS

Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS Bruker Nano Analytics, Berlin, Germany Webinar, June 15, 2017 Innovation with Integrity Presenters Samuel Scheller Sr.

More information

David Martin High Precision Beamline Alignment at the ESRF IWAA, Grenoble 3-7 October 2016

David Martin High Precision Beamline Alignment at the ESRF IWAA, Grenoble 3-7 October 2016 David Martin High Precision Beamline Alignment at the ESRF IWAA, Grenoble 3-7 October 2016 OVERVIEW The ESRF has just completed the Phase I Upgrade programme. The Phase I Upgrade programme was centered

More information

NANOCOMPOSITE THIN FILMS:

NANOCOMPOSITE THIN FILMS: NANOCOMPOSITE THIN FILMS: Assembly, Characterizations, & Applications Chaoyang Jiang Department of Chemistry The University of South Dakota St. Louis, June 26, 2008 Forest Products &Nanocomposite P. Monteiro@UC

More information

The MID instrument.

The MID instrument. The MID instrument International Workshop on the Materials Imaging and Dynamics Instrument at the European XFEL Grenoble, Oct 28/29, 2009 Thomas Tschentscher thomas.tschentscher@xfel.eu Outline 2 History

More information

X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL

X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 321 X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Kazuhiro Takada 1,

More information

Auger Electron Spectroscopy Overview

Auger Electron Spectroscopy Overview Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E

More information

Multilayer Interference Coating, Scattering, Diffraction, Reflectivity

Multilayer Interference Coating, Scattering, Diffraction, Reflectivity Multilayer Interference Coating, Scattering, Diffraction, Reflectivity mλ = 2d sin θ (W/C, T. Nguyen) Normal incidence reflectivity 1..5 1 nm MgF 2 /Al Si C Pt, Au 1 ev 1 ev Wavelength 1 nm 1 nm.1 nm Multilayer

More information

Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown and Twiss Photon Antibunching Setup

Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown and Twiss Photon Antibunching Setup 1 Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown and Twiss Photon Antibunching Setup Abstract Jacob Begis The purpose of this lab was to prove that a source of light can be

More information

Modeling and Computation Core (MCC)

Modeling and Computation Core (MCC) List of Research by Research Cluster Modeling and Computation Core (MCC) GOAL 1: Develop multiscale theories and materials databank that complement experimental approaches for materials design Objective

More information

Infrastructure of Thin Films Laboratory in Institute of Molecular Physics Polish Academy of Sciences

Infrastructure of Thin Films Laboratory in Institute of Molecular Physics Polish Academy of Sciences Infrastructure of Thin Films Laboratory in Institute of Molecular Physics Polish Academy of Sciences Outline Sample preparation Magnetron sputtering Ion-beam sputtering Pulsed laser deposition Electron-beam

More information

Development of X-ray phase imaging method using a compact high-brightness X-ray generator

Development of X-ray phase imaging method using a compact high-brightness X-ray generator Development of X-ray phase imaging method using a compact high-brightness X-ray generator Development of X-ray phase imaging method using a compact high-brightness X-ray generator Sub-theme: Evaluation

More information

Introduction to XAFS. Grant Bunker Associate Professor, Physics Illinois Institute of Technology. Revised 4/11/97

Introduction to XAFS. Grant Bunker Associate Professor, Physics Illinois Institute of Technology. Revised 4/11/97 Introduction to XAFS Grant Bunker Associate Professor, Physics Illinois Institute of Technology Revised 4/11/97 2 tutorial.nb Outline Overview of Tutorial 1: Overview of XAFS 2: Basic Experimental design

More information

SAS Data Analysis Colloids. Dr Karen Edler

SAS Data Analysis Colloids. Dr Karen Edler SAS Data Analysis Colloids Dr Karen Edler Size Range Comparisons 10 1 0.1 0.01 0.001 proteins viruses nanoparticles micelles polymers Q = 2π/d (Å -1 ) bacteria molecules nanotubes precipitates grain boundaries

More information

Small Angle X-Ray Scattering

Small Angle X-Ray Scattering SAXS Small Angle X-Ray Scattering Röntgenkleinwinkelstreuung Intensions Determination of the particle size and the morphology of solid materials: Intensions Determination of the particle size and the morphology

More information

How to judge data quality

How to judge data quality SSRL Workshop: Small-Angle X-ray Scattering and Diffraction Studies, March 28-30, 2016 How to judge data quality Tsutomu Matsui SSRL Lab / Dept. of Chemistry Stanford University Subject of this session

More information

Quiz 1 XRD ) Explain the error in the following statement: "a laser beam is a focused beam of monochromatic light".

Quiz 1 XRD ) Explain the error in the following statement: a laser beam is a focused beam of monochromatic light. Quiz 1 XRD 092706 Diffraction involves constructive interference between waves that emanate from structurally organized matter such as from atoms in a crystal. X-ray diffraction uses a relationship of

More information

a b c Supplementary Figure S1

a b c Supplementary Figure S1 a b c Supplementary Figure S1 AFM measurements of MoS 2 nanosheets prepared from the electrochemical Liintercalation and exfoliation. (a) AFM measurement of a typical MoS 2 nanosheet, deposited on Si/SiO

More information

PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy

PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray

More information

Hanle Echelle Spectrograph (HESP)

Hanle Echelle Spectrograph (HESP) Hanle Echelle Spectrograph (HESP) Bench mounted High resolution echelle spectrograph fed by Optical Fiber Second generation instrument for HCT The project is a technical collaboration between Indian Institute

More information

How Does It All Work? A Summary of the IDEAS Beamline at the Canadian Light Source

How Does It All Work? A Summary of the IDEAS Beamline at the Canadian Light Source How Does It All Work? A Summary of the IDEAS Beamline at the Canadian Light Source What Makes Up The Canadian Light Source? 4. Storage Ring 5. Synchrotron Light 6. Beamline 1. Electron Gun 2. Linear Accelerator

More information

Characterisation & Use of Array Spectrometers

Characterisation & Use of Array Spectrometers Characterisation & Use of Array Spectrometers Mike Shaw, Optical Technologies & Scientific Computing Team, National Physical Laboratory, Teddington Middlesex, UK 1 Overview Basic design and features of

More information

HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai

HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS SCSAM Short Course Amir Avishai RESEARCH QUESTIONS Sea Shell Cast Iron EDS+SE Fe Cr C Objective Ability to ask the

More information

FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION

FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 511 FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON

More information

PEEM and XPEEM: methodology and applications for dynamic processes

PEEM and XPEEM: methodology and applications for dynamic processes PEEM and XPEEM: methodology and applications for dynamic processes PEEM methods and General considerations Chemical imaging Magnetic imaging XMCD/XMLD Examples Dynamic studies PEEM and XPEEM methods 1

More information

Lessons learned from Bright Pixels and the Internal Background of the EPIC pn-ccd Camera

Lessons learned from Bright Pixels and the Internal Background of the EPIC pn-ccd Camera Lessons learned from Bright Pixels and the Internal Background of the EPIC pn-ccd Camera Elmar Pfeffermann, Norbert Meidinger, Lothar Strüder, Heinrich Bräuninger, Gisela Hartner Max-Planck-Institut für

More information

Swanning about in Reciprocal Space. Kenneth, what is the wavevector?

Swanning about in Reciprocal Space. Kenneth, what is the wavevector? Swanning about in Reciprocal Space or, Kenneth, what is the wavevector? Stanford Synchrotron Radiation Laboratory Principles The relationship between the reciprocal lattice vector and the wave vector is

More information

X-rays. X-ray Radiography - absorption is a function of Z and density. X-ray crystallography. X-ray spectrometry

X-rays. X-ray Radiography - absorption is a function of Z and density. X-ray crystallography. X-ray spectrometry X-rays Wilhelm K. Roentgen (1845-1923) NP in Physics 1901 X-ray Radiography - absorption is a function of Z and density X-ray crystallography X-ray spectrometry X-rays Cu K α E = 8.05 kev λ = 1.541 Å Interaction

More information

Development of 2-Dimentional Imaging XAFS System at BL-4

Development of 2-Dimentional Imaging XAFS System at BL-4 Development of 2-Dimentional Imaging XAFS System at BL-4 Koichi Sumiwaka 1, Misaki Katayama 2, Yasuhiro Inada 2 1) Department of Applied Chemistry, College of Science and Engineering, Ritsumeikan, University,

More information

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960 Introduction to X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate

More information

On the use of Kumakhov Polycapillaries to improve laboratory

On the use of Kumakhov Polycapillaries to improve laboratory ICXOM Frascati (INFN - LNF) 25-30 September 2005 On the use of Kumakhov Polycapillaries to improve laboratory Energy Dispersive X-ray X Diffractometry and Reflectometry B. Paci 1, V. Rossi Albertini 1,

More information

Quantum Optics and Quantum Information Laboratory

Quantum Optics and Quantum Information Laboratory Quantum Optics and Quantum Information Laboratory OPT 253, Fall 2011 Institute of Optics University of Rochester Instructor: Dr. Lukishova Jonathan Papa Contents Lab 1: Entanglement and Bell s Inequalities

More information

Nanosphere Lithography

Nanosphere Lithography Nanosphere Lithography Derec Ciafre 1, Lingyun Miao 2, and Keita Oka 1 1 Institute of Optics / 2 ECE Dept. University of Rochester Abstract Nanosphere Lithography is quickly emerging as an efficient, low

More information

Research with Synchrotron Radiation. Part I

Research with Synchrotron Radiation. Part I Research with Synchrotron Radiation Part I Ralf Röhlsberger Generation and properties of synchrotron radiation Radiation sources at DESY Synchrotron Radiation Sources at DESY DORIS III 38 beamlines XFEL

More information

SCI. Scientific Computing International. Scientific Computing International. FilmTek. Raising Thin Film Metrology Performance to a New Level

SCI. Scientific Computing International. Scientific Computing International. FilmTek. Raising Thin Film Metrology Performance to a New Level FilmTek Raising Thin Film Metrology Performance to a New Level 1 Through Silicon Via (TSV) Metrology FilmTek TM TM TSV TSV Metrology Advantages Measure high aspect ratio TSV structures (up to 30:1) Measure

More information

Biological Small Angle X-ray Scattering (SAXS) Dec 2, 2013

Biological Small Angle X-ray Scattering (SAXS) Dec 2, 2013 Biological Small Angle X-ray Scattering (SAXS) Dec 2, 2013 Structural Biology Shape Dynamic Light Scattering Electron Microscopy Small Angle X-ray Scattering Cryo-Electron Microscopy Wide Angle X- ray

More information

at the MPE test facility PANTER

at the MPE test facility PANTER Calibration of hard X-ray (15 50 kev) optics at the MPE test facility PANTER M. Freyberg, H. Bräuninger, W. Burkert, G. Hartner Max-Planck-Institut für extraterrestrische Physik, PANTER X-ray Test Facility,

More information

SSRL XAS Beam Lines Soft X-ray

SSRL XAS Beam Lines Soft X-ray SSRL SMB Summer School July 20, 2010 SSRL XAS Beam Lines Soft X-ray Thomas Rabedeau SSRL Beam Line Development Objective/Scope Objective - develop a better understanding of the capabilities and limitations

More information

Silicon Drift Detectors: Understanding the Advantages for EDS Microanalysis. Patrick Camus, PhD Applications Scientist March 18, 2010

Silicon Drift Detectors: Understanding the Advantages for EDS Microanalysis. Patrick Camus, PhD Applications Scientist March 18, 2010 Silicon Drift Detectors: Understanding the Advantages for EDS Microanalysis Patrick Camus, PhD Applications Scientist March 18, 2010 EDS Detector Requirements Detect whole energy range of x-rays 50 ev

More information

IDRaman reader and IDRaman mini: Raster Orbital Scanning (ROS)

IDRaman reader and IDRaman mini: Raster Orbital Scanning (ROS) IDRaman reader and IDRaman mini: Raster Orbital Scanning (ROS) Tightly focused beam may give noisy signals or miss the Raman active target completely leading to false negatives from unidentified samples

More information

Methoden moderner Röntgenphysik II Streuung und Abbildung

Methoden moderner Röntgenphysik II Streuung und Abbildung Methoden moderner Röntgenphysik II Streuung und Abbildung Stephan V. Roth DESY 1.5.15 Outline > 1.5. : Small-Angle X-ray Scattering (SAXS) > 19.5. : Applications & A short excursion into Polymeric materials

More information

A Brief Introduction to Medical Imaging. Outline

A Brief Introduction to Medical Imaging. Outline A Brief Introduction to Medical Imaging Outline General Goals Linear Imaging Systems An Example, The Pin Hole Camera Radiations and Their Interactions with Matter Coherent vs. Incoherent Imaging Length

More information

EUV and Soft X-Ray Optics

EUV and Soft X-Ray Optics EUV and Soft X-Ray Optics David Attwood University of California, Berkeley Cheiron School September 2011 SPring-8 1 The short wavelength region of the electromagnetic spectrum n = 1 δ + iβ δ, β

More information

Supporting Information for Induced smectic phase in binary mixture of twist-bend nematogens

Supporting Information for Induced smectic phase in binary mixture of twist-bend nematogens Supporting Information for Induced smectic phase in binary mixture of twist-bend nematogens Anamarija Knežević 1, Irena Dokli 1, Marin Sapunar 2, Suzana Šegota 2, Ute Baumeister 3 and Andreja Lesac* 1

More information

Introduction to Synchrotron X-ray Scattering Techniques

Introduction to Synchrotron X-ray Scattering Techniques Stanford Synchrotron Radiation Lightsource Introduction to Synchrotron X-ray Scattering Techniques Mike Toney, SSRL Materials Sciences Division 1. Why do x-ray scattering? 2. Basics of an x-ray scattering

More information

The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis

The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis Tim Nunney The world leader in serving science 2 XPS Surface Analysis XPS +... UV Photoelectron Spectroscopy UPS He(I)

More information

RamanStation 400: a Versatile Platform for SERS Analysis

RamanStation 400: a Versatile Platform for SERS Analysis FIELD APPLICATION REPORT Raman Spectroscopy Author: Dean H. Brown PerkinElmer, Inc. Shelton, CT USA RamanStation 400 RamanStation 400: a Versatile Platform for SERS Analysis Introduction Surface Enhanced

More information

Imaging Polymer Morphology Using Atomic Force Microscopy

Imaging Polymer Morphology Using Atomic Force Microscopy Imaging Polymer Morphology Using Atomic Force Microscopy Russell J. Composto Materials Science and Engineering, and the Laboratory for Research on the Structure of Matter, University of Pennsylvania Agilent

More information

Temperature Dependence of the Diffusion. Coefficient of PCBM in Poly(3-hexylthiophene)

Temperature Dependence of the Diffusion. Coefficient of PCBM in Poly(3-hexylthiophene) Supporting Information Temperature Dependence of the Diffusion Coefficient of PCBM in Poly(3-hexylthiophene) Neil D. Treat,, Thomas E. Mates,, Craig J. Hawker,,, Edward J. Kramer,,, Michael L. Chabinyc,

More information

The KATRIN experiment

The KATRIN experiment The KATRIN experiment Status and SDS comissioning Philipp Chung-On Ranitzsch for the KATRIN collaboration Insitute for Nuclear Physics, Westfälische Wilhelms-Universität, Münster The KATRIN experiment

More information

Portable type TXRF analyzer: Ourstex 200TX

Portable type TXRF analyzer: Ourstex 200TX Excerpted from Adv. X-Ray. Chem. Anal., Japan: 42, pp. 115-123 (2011) H. Nagai, Y. Nakajima, S. Kunimura, J. Kawai Improvement in Sensitivity and Quantification by Using a Portable Total Reflection X-Ray

More information

Nanoscale Chemical Characterization: Moving to 3 Dimensions

Nanoscale Chemical Characterization: Moving to 3 Dimensions Nanoscale Chemical Characterization: Moving to 3 Dimensions Eric B. Steel Chemical Science & Technology Laboratory National Institute of Standards & Technology Outline What is and why do we need chemical

More information

FXA UNIT G485 Module X-Rays. Candidates should be able to : I = I 0 e -μx

FXA UNIT G485 Module X-Rays. Candidates should be able to : I = I 0 e -μx 1 Candidates should be able to : HISTORY Describe the nature of X-rays. Describe in simple terms how X-rays are produced. X-rays were discovered by Wilhelm Röntgen in 1865, when he found that a fluorescent

More information

LAB REPORT ON XRF OF POTTERY SAMPLES By BIJOY KRISHNA HALDER Mohammad Arif Ishtiaque Shuvo Jie Hong

LAB REPORT ON XRF OF POTTERY SAMPLES By BIJOY KRISHNA HALDER Mohammad Arif Ishtiaque Shuvo Jie Hong LAB REPORT ON XRF OF POTTERY SAMPLES By BIJOY KRISHNA HALDER Mohammad Arif Ishtiaque Shuvo Jie Hong Introduction: X-ray fluorescence (XRF) spectrometer is an x-ray instrument used for routine, relatively

More information

Mater. Res. Soc. Symp. Proc. Vol Materials Research Society

Mater. Res. Soc. Symp. Proc. Vol Materials Research Society Mater. Res. Soc. Symp. Proc. Vol. 840 2005 Materials Research Society Q6.10.1 CoPt 3 nanoparticles adsorbed on SiO 2 : a GISAXS and SEM study Jan I. Flege 1, Thomas Schmidt 1, Gabriela Alexe 1, Torben

More information

X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka

X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka X-ray photoelectron spectroscopy (XPS) or Electron spectroscopy for chemical analysis (ESCA), Surface

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

BENEFITS OF IMPROVED RESOLUTION FOR EDXRF

BENEFITS OF IMPROVED RESOLUTION FOR EDXRF 135 Abstract BENEFITS OF IMPROVED RESOLUTION FOR EDXRF R. Redus 1, T. Pantazis 1, J. Pantazis 1, A. Huber 1, B. Cross 2 1 Amptek, Inc., 14 DeAngelo Dr, Bedford MA 01730, 781-275-2242, www.amptek.com 2

More information

Fabrication Methods: Chapter 4. Often two methods are typical. Top Down Bottom up. Begins with atoms or molecules. Begins with bulk materials

Fabrication Methods: Chapter 4. Often two methods are typical. Top Down Bottom up. Begins with atoms or molecules. Begins with bulk materials Fabrication Methods: Chapter 4 Often two methods are typical Top Down Bottom up Begins with bulk materials Begins with atoms or molecules Reduced in size to nano By thermal, physical Chemical, electrochemical

More information

Standardless Analysis by XRF but I don t know what s in my sample!! Dr Colin Slater Applications Scientist, XRF Bruker UK Limited

Standardless Analysis by XRF but I don t know what s in my sample!! Dr Colin Slater Applications Scientist, XRF Bruker UK Limited by XRF but I don t know what s in my sample!! Dr Colin Slater Applications Scientist, XRF Bruker UK Limited XRF Standardless Analysis In this talk What is meant by standardless analysis? Fundamental Parameters

More information

Applications of Spin-Polarized Electrons in Condensed Matter Physics

Applications of Spin-Polarized Electrons in Condensed Matter Physics Applications of Spin-Polarized Electrons in Condensed Matter Physics Dan Pierce Electron Physics Group, NIST http://physics.nist.gov/epg Supported in part by the Office of Naval Research Pierce and Meier,

More information

Quantum Optics and Quantum Information Laboratory Review

Quantum Optics and Quantum Information Laboratory Review Quantum Optics and Quantum Information Laboratory Review Fall 2010 University of Rochester Instructor: Dr. Lukishova Joshua S. Geller Outline Lab 1: Entanglement and Bell s Inequalities Lab 2: Single Photon

More information

Laboratory 3: Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown, and Twiss Setup for Photon Antibunching

Laboratory 3: Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown, and Twiss Setup for Photon Antibunching Laboratory 3: Confocal Microscopy Imaging of Single Emitter Fluorescence and Hanbury Brown, and Twiss Setup for Photon Antibunching Jonathan Papa 1, * 1 Institute of Optics University of Rochester, Rochester,

More information

CASSY Lab. Manual ( )

CASSY Lab. Manual ( ) CASSY Lab Manual (524 202) Moseley's law (K-line x-ray fluorescence) CASSY Lab 271 can also be carried out with Pocket-CASSY Load example Safety notes The X-ray apparatus fulfils all regulations on the

More information