EM-30AX is very good space utilization
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- Estella Reynolds
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2 EM helps to grasp material characteristics through providing precise images. EM makes it possible to analyze deep submicron or nanometer structure. Alteration of material caused by pressure, heat can be detectable by using EM. High depth of field and clear image from EM would be the best solution to find defects and changes of various materials. EM help customer to obtain and nm quality images within a few minutes. The size of EM enhances space efficiency in the laboratory. EM is the best reasonable instrument which help science teacher to give visual explanation to the students. EM is also more affordable to small and medium industry company. Coxem promises precise nano-world measurement by using EM. Tiny defects can be found exactly through having high quality images with EM. Deep submicron cracks that are hard to find using optical microscope can be detectable using EM. Inspection with EM may find out problems in manufacturing process and hence quality of product can be upgraded into higher level. EM leads students into the nano-world of science that has not been viewed practically in school. Now, various numeral application such as cells, insect, pollen, metal texture and forensic evidence will be applicable with EM. This instrument may derive students curiosity of nano-world which help to discover a talent of students. 30,000
3 Users can understand intuitively the current equipment status through the display of focus number and location of sample supports. EM-30AX is very good space utilization Up to 300,000 stored X-ray count per second (optional : BSE) Analysis using filtered least squares fit Project based 60 Point or Rectangle analysis
4 Have you ever thought Scanning Electron Microscope should be easy enough to operate and be shared commonly among numeral users? CX-200 offers high resolution and convenient usage so that anyone could obtain high magnification without difficulty. Do your company have equipment operator because of the handling hardness of Scanning Electron Microscope? Experience COXEM CX-200 and you will fell everyone could get high magnification image with small effort. CX-200TA support 5 axis(x,y,z,y,t) motorized auto stage which makes specimen move as you wish. Feel the convenience. The sophisticated motorized auto stage of CX-200 enables users to move specimen by just doing mouse click on the screen image. CX-200 support images up to 5120x3840 pixels that is adequate in developing huge picture.
5 Nanostation Ease to use and operate SEM with Nanostation Laptop-PC based operation and easy installation requirements. COXEM s SEM can be installed in everywhere. Nanostation offer auto -functions which can also be used by everyone. Stage position Nanostation helps operator know easily the location information, by indicating the sample's location on Stage. Alignment Nanostation supports operator to understand well, by providing the X,Y Beam Alignment Coordinates. Click&Move Nanostation can move the sample's location through the mouse click on images. Magnification Nanostation helps operator move easily to the desired magnification through the Preset Magnification. Focus Nanostation provides Auto focus, Coarse focus and Fine focus. E-Gun Nanostation automatically control and indicates the Filament Saturation point when the Electron-Gun is on. Astigmatism Nanostation supports operator to understand well, by providing the X,Y Beam Alignment Coordinates. Real time functions Nanostation provides various functions such as Distance, Angle and Polygon measurements in a real time.
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9 COXEM provides a remote control service using by the Team Viewer tool. Whenever and wherever if your SEM PC is connected with internet, COXEM engineers can check remotely the SEM operating status and solve simple problems. COXEM provides Users Manual & Video Learning Materials. You can easily understand SEM and the using method through the Video Learning Materials. You can easily and well operate SEM through these various learning methods.
10 Optional Detectors Optional Detectors Four segment silicon PIN diode Low Vacuum System COXEM Scanning Electron Microscope support Low Vacuum capability optionally. This option will aid users to analyze critical specimen which should be handled at low vacuum. In addition, viscous specimen can be analyzable when LV system is combined with BSE detector. Coxem Scanning Electron Microscope supports Cool Stage that treat specimen such as bionic or fluid. Cool Stage freezes specimen at (-)25 C and enables users to analyze specimen precisely.
11 Primary Application
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