KP Technology System Catalogue

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64 62 60 58 56 54 52 50 48-1040 RH (%) WF (mv) -1055 30 per. Mov. Avg.

1 Sample: Al Tip: 2mm S/S Sig Ave: 60 WF Ave: 2 T: 18.9 C Gain: 4 KP Technology System Catalogue Winter Al Relative Humidity Ramp Test (10% 2 Hr/step 09-10/Nov/2013 RH (%) RH (%) WF (mv) per. Mov. Avg. ( WF (mv) ) Time (Hours) WF (mv) Air Photoemission - Si 30 Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9 o C CPD : mV 25 WF : 4.983eV R2 : Yield : 9.7 Photoemission current [1/3] (AU) eV Ep (ev)

Photoemission in Air Systems APS01, APS02, APS03, APS04 System Description The Photoemission in Air Systems are KP Technology s newest addition to our large surface analysis range.

2 Photoemission in Air Systems APS01, APS02, APS03, APS04 System Description The Photoemission in Air Systems are KP Technology s newest addition to our large surface analysis range. The Air-PE systems measure the absolute work function of a material by Photoemission in Air, no vacuum required. With an excitation range of 3.3eV to over 7eV, the Air-PE systems are capable of measuring the absolute Work Function of Metals and with the addition of an SPV and SPS source, the full bands of Semicondcutors can be measured in one system, no other product can do this. Photoemission current [1/3] (AU) Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9 o C CPD : mV WF : 4.983eV R2 : Yield : eV Air Photoemission - Si Each APS system comes with our gold-standard Kelvin Probe system, capable of Contact Potential Difference Measurements, backed-up by the APS Absolute measurements Ep (ev) Photoemission in Air measurement of a Silicon Sample Air Photoemission system APS02 - Scanning Kelvin Probe with Air Photoemission Spectrometry Features Applications Work Function by Photoemission in Air Density of States Measurements <3.3eV to >7.0eV Energy Range Measurement of all Semiconductor Bands Contact Potential Difference by Kelvin Probe Organic and Non-Organic Semiconductors Metals Thin Films Solar Cells and Organic Photovoltaics Corrosion

3 Photoemission in Air Systems APS01, APS02, APS03, APS04 Measurement Principle When light is incident on a material such as a metal or a semiconductor, the photons may have enough energy to liberate electrons from the surface, a process known as the Photoelectric Effect. Photons having insufficient energy will not liberate electrons, while photons of just enough energy will liberate a few electrons; photons of much more energy than the work function will liberate a lot of electrons. The energy required for electrons to escape the material is termed the work function. By varying the energy of the incoming light, the absolute work function can be established. Based on Fowler s analysis of photoemission, the square root (cube root for Semicondcutors) of the photoelectron yield is plotted on a graph versus the incident photon energy (image right). Photoemission current [1/2] (AU) Air Photoemission - Cu 60 Sample : Cu Gradient : 4 Averaging : 3 RH : 44% T : 20.7 o C CPD : mV 50 WF : 4.565eV R2 : Yield : eV Energy (ev) Air Photoemission Curve of Copper Sample 0.4 Material WF (ev) WF Literature (ev) CPD (V) Ag Au Al Cu Fe Ti Zn Ag Au y = x R2 = Cu Fe Contact Potential Difference (V) Ti -0.8 Zn -1 Al Tip Work Function = ev Photon Energy (ev) Air Photoemission Measurements of a Selection of Metals. Each metal is measured with the PE Mode and Kelvin Probe Mode of an APS02 system. The Contact Potential is measured with the Kelvin Probe and the Work Function is measured by the air Photoemission Mode. When Work Funciton is plotted against CPD, a straight line is formed. A line is drawn at 0V CPD to the line and when traced down reveals the absolute Work Function of the Tip.

4 Photoemission in Air Systems APS01, APS02, APS03, APS04 Density of States The properties of many materials are governed by the Density of States (DOS) near the Fermi Level. The Air Photoemssion system is capable of probing the DOS by differentiating the detected photoelectron yields by the incident photon energy. The DOS measurement can thus be compared to molecular orbital calculations for the material under investigation. DOS data collected with the APS in air is shown to the right for Copper. The data for all measured samples is consistent with literature. Air Photoemission - Density of States - Si Air Photoemission - Density of States - Cu Sample : Si Sample : Cu Gradient : 5 Averaging : 3 RH : 42% T : 19.9 o C CPD : mV WF : 4.983eV R2 : Yield : Gradient : 4 Averaging : 3 RH : 44% T : 20.7 o C CPD : mV WF : 4.565eV R2 : Yield : 11.8 DOS (AU) 0.6 DOS (AU) Energy (ev) Energy (ev) Silicon Sample Denisty of States Copper Sample Denisty of States System Overview Optical Enclosure and Measurement System Photoelectron Detector Air Photoemission Light Source Optical Fiber Sample Spectrometer UV Lamp UV Lamp PSU e e PC and Monitor XYZ stage (APS02/03/04) Digital Controller The Optical Enclosure houses the sample in complete darkness prior to measurement. The Photoelectron detector measures the liberated electrons driven off by the UV Light emitted by the Spectrometer. The UV Bulb is powered by an external PSU and is controlled by software. The UV light is injected into the Spectrometer and a variable wavelength of light is produced. The energy range of this light is <3.3eV to >7.0eV. The Digital Controller controls every aspect of the system and is controlled by the dedicated software GUI. The measurement from the Photoelectron Detector is passed to the Digital Controller, to the PC and plotted in software, producing the PE curve.

5 Photoemission in Air Systems APS01, APS02, APS03, APS04 System Specifications Kelvin Probe 3-Axis Scanning Surface Photovoltage Surface Photovoltage Spectroscopy Tip Material / Diameter Work Function Resolution Height Control (Auto) Kelvin Probe Mode CPD Measurement Time PE Mode WF Measurement Time DOS Measurements Optical System Oscilloscope Test Sample Faraday Enclosure Base (mm) Control Supplied Warranty APS01 APS02 APS03 APS04 2mm Gold Tip <3meV 25mm Automatic Full CPD measurements CPD measurements in <1 min Full Photoemission measurement PE measurement in <5 mins Full access to DOS Information Colour Camera with Zoom Lens and Monitor for positioning Digital TFT Oscilloscope for Real Time Signal Gold, Aluminium and Silver Test Samples 450 x 450mm Optical Enclosure PC Control with Dedicated Software 12 Months 836 mm 1249 mm 836 mm 1459 mm 620 mm 620 mm APS02 Photoemission system APS04 Photoemission system with surface Photovoltage Spectroscopy The Company Contact KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies. KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world. For quotation requests, further inforamtion or to discuss any research or particular measurements, please feel free to contact us: sales@kelvinprobe.com Tel: Or visit our websites KP Technology was the proud winner of the Queens Award for Enterprise: International Trade 2013

Scanning Kelvin Probe Systems SKP5050, ASKP100100, ASKP200250, ASKP350350 System Description Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D Work Function plots of

5nm, the Scanning Kelvin Probe gives reliable, repeatable measurements.

6 Scanning Kelvin Probe Systems SKP5050, ASKP100100, ASKP200250, ASKP System Description Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D Work Function plots of samples ranging in size from 5mm to 300mm. With Work Function resolution at less than 3meV, and the resolution of the 3-axis scanning stages as low as 317.5nm, the Scanning Kelvin Probe gives reliable, repeatable measurements. A high performance Faraday and optical enclosure shields all of our scanning systems from unwanted fast changing environmental conditions, electromagnetic interference and providing the perfect platform for our Photoemission and Surface Photovoltage add-on modules. Silicon substrate modified by a layer of small Bumps. Sample is scanned using SKP5050 advanced 2D and 3D techniques Scanning Kelvin Probe SKP5050 Pictured Inside Standard Optical Enclosure Features Applications Work Function Measurement by Kelvin Probe Work Function Resolution of <3meV Scanning Area from 5mm to 300mm Scanning Resolution from 317.5nm Automatic Height Regulation Organic and Non-Organic Semiconductors Metals Thin Films Solar Cells and Organic Photovoltaics Corrosion

Scanning Kelvin Probe Systems SKP5050, ASKP100100, ASKP200250, ASKP350350 System Specifications SKP5050 ASKP100100 ASKP200250 ASKP350350 Tip Material / Diameter 2mm Gold Tip Work Function Resolution

Surface Potential Optical System Colour Camera with Zoom Lens and Monitor Oscilloscope Digital TFT Oscilloscope for Real Time Signal Test Sample Gold and Aluminium Test Sample Faraday Enclosure Base

Air Photoemission System Surface Photovoltage (QTH or LED) Surface Photovoltage Spectroscopy (400-1000nm) Tips in Gold or S.Steel from 0.

7 Scanning Kelvin Probe Systems SKP5050, ASKP100100, ASKP200250, ASKP System Specifications SKP5050 ASKP ASKP ASKP Tip Material / Diameter 2mm Gold Tip Work Function Resolution <3meV Sample Scan Size 50mm x 50mm 100mm x 100mm 200mm x 250mm 300mm x 300mm 3D Sample Area Square Square Square Square & Circular Height Control (Auto) 25mm 50mm 50mm 50mm Visualisation 3D Maps of Surface Potential Optical System Colour Camera with Zoom Lens and Monitor Oscilloscope Digital TFT Oscilloscope for Real Time Signal Test Sample Gold and Aluminium Test Sample Faraday Enclosure Base (mm) 450 x x x x 600 Control Supplied Detection System Warranty PC Control with Dedicated Software Off-Null with Parasitic Capacity Rejection 12 Months Upgrades and Add-Ons Air Photoemission System Surface Photovoltage (QTH or LED) Surface Photovoltage Spectroscopy ( nm) Tips in Gold or S.Steel from 0.05mm to 20mm Relative Humidity Control and Nitrogen Environmental Chamber 12 Silicon Wafer Measured Using the ASKP Scanning Kelvin Probe The Company KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies. KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world. Contact For quotation requests, further information or to discuss any research or particular measurements, please feel free to contact us: sales@kelvinprobe.com Tel: Or visit our websites KP Technology was the proud winner of the Queens Award for Enterprise: International Trade 2013

Environmental Kelvin Probe Systems RHC010, RHC020, RHC030, RHC040 System Description The Relative Humidity Kelvin Probe Systems are the ideal solution for monitoring samples in a controlled

As well as RH control, the RHC020 and 040 Kelvin Probe Systems come with the KP Technology gold-standard Scanning Kelvin Probe platform, perfect for plotting the effect of corrosion over the surface

8 Environmental Kelvin Probe Systems RHC010, RHC020, RHC030, RHC040 System Description The Relative Humidity Kelvin Probe Systems are the ideal solution for monitoring samples in a controlled atmosphere. The RHC systems have the ability to automatically control the Relative Humidity within the chamber from 5% to 95% using the easily programmable software. As well as RH control, the RHC020 and 040 Kelvin Probe Systems come with the KP Technology gold-standard Scanning Kelvin Probe platform, perfect for plotting the effect of corrosion over the surface of a sample. The RHC030 and 040 come with the added benefit of Nitrogen atmosphere control with the ability to go down to <1% Oxygen within the System. RH (%) RH (%) WF (mv) per. Mov. Avg. ( WF (mv) ) Sample: Al Tip: 2mm S/S Sig Ave: 60 WF Ave: 2 78 T: 18.9 C Gain: Time (Hours) Effect of Relative Humidity on Aluminium Sample over time WF (mv) Relative Humidity System RHC040 with 3-Axis Scanning Capabilities Features Applications Work Function Measurement by Kelvin Probe Organic and Non-Organic Semiconductors Work Function Resolution of <3meV Metals Automatic Control of Relative Humidity Thin Films Atmospheric Control to <1% Oxygen Solar Cells and Organic Photovoltaics Modular System for Upgrades and Add-Ons Corrosion

mm 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.

4239 -- 4250 4229 -- 4239 4218 -- 4229 4208 -- 4218 4197 -- 4208 4187 -- 4197 4176 -- 4187 4166 -- 4176 4113 -- 4124 4103 -- 4113 4092 -- 4103 4082 -- 4092 4071 -- 4082 4061 -- 4071 4050 -- 4061

9 mm mm Environmental Kelvin Probe Systems RHC010, RHC020, RHC030, RHC040 System Specifications RHC010 RHC020 RHC030 RHC040 Tip Material / Diameter 2mm Stainless Steel Tip Work Function Resolution <3meV Sample Scanning Single-Point 50mm x 50mm Single-Point 50mm x 50mm Relative Humidity Control Automatic: 5% to 95% Atmospheric Control RH Only RH Only Oxygen to <1% Oxygen to <1% Optical System Front Window Colour Camera Oscilloscope Digital TFT Oscilloscope for Real Time Signal Test Sample Gold and Aluminium Test Sample Breadboard Footprint 900 x 600 mm Control Supplied PC Control with Dedicated Software Detection System Off-Null with Parasitic Capacity Rejection Warranty 12 Months Upgrades and Add-Ons Air Photoemission System Surface Photovoltage (QTH or LED) Surface Photovoltage Spectroscopy ( nm) Upgrade to Scanning Kelvin Probe System Sample Heating to 115 C Relative Humidity System RHC020 with 3-Axis Scanning The Company KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies. KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world. Contact For quotation requests, further information or to discuss any research or particular measurements, please feel free to contact us: sales@kelvinprobe.com Tel: Or visit our websites KP Technology was the proud winner of the Queens Award for Enterprise: International Trade 2013

UHV Kelvin Probe Systems UHVKP020, UHVKP030 System Description Our range of Ultra High Vacuum Kelvin Probes gives the user full access to Work Function measurements under vacuum.

separation constant at all times during the measurement. Even under vacuum, the Work Function resolution is less than 3meV.

10 UHV Kelvin Probe Systems UHVKP020, UHVKP030 System Description Our range of Ultra High Vacuum Kelvin Probes gives the user full access to Work Function measurements under vacuum. Each UHV Kelvin Probe comes with a High Quality Manual or Motorised Translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system holds the tip separation constant at all times during the measurement. Even under vacuum, the Work Function resolution is less than 3meV. The UHV Kelvin Probe can be mounted to the user s existing UHV Chamber with no fuss. If the user does not have a chamber, KP Technology offers an elegant UHVKP Cell System (UHVKP030) that can be used for Ambient, UHV or Gaseous measurements. This Cell is completely modular and a host of additional extras can be added-on. With a small chamber size, pumping-down the Cell, or injecting Gas, takes no time at all, resulting in fast, reliable measurements. Work Function of Metals versus Temperature under Vacuum Ultra High Vacuum Kelvin Probe, UHVKP030, mounted on breadboard. UHV Cell with Heater Stage, Gas Inlet and UHV Kelvin Probe mounted vertically. Features Applications Work Function Measurement by Kelvin Probe Work Function Resolution of <3meV UHV, Gas or Ambient Measuring Modular System for Upgrades and Add-Ons Automatic Height Regulation Organic and Non-Organic Semiconductors Metals Thin Films Solar Cells and Organic Photovoltaics Corrosion

UHV Kelvin Probe Systems UHVKP020, UHVKP030 System Specifications UHVKP020 UHVKP030 Tip Material / Diameter 4mm Stainless Steel Tip Work Function Resolution <3meV Standard Translator 50mm Manual

11 UHV Kelvin Probe Systems UHVKP020, UHVKP030 System Specifications UHVKP020 UHVKP030 Tip Material / Diameter 4mm Stainless Steel Tip Work Function Resolution <3meV Standard Translator 50mm Manual Translator Translator Sizes Possible 50mm or 100mm Manual or Motorised Translators Height Control (Auto) Approximately 1-5mm by DC Offset (unless Motorised) Visualisation Single-Point Work Function / Contact Potential Difference Scans Oscilloscope Digital TFT Oscilloscope for Real Time Signal Test Sample Available on Request Control Supplied USB Control with Dedicated Software PC Control with Dedicated Software Detection System Off-Null with Parasitic Capacity Rejection UHV Cell Not Included 2.75" 6 Port Cell Warranty 12 Months Upgrades and Add-Ons Photoemission System Surface Photovoltage (QTH or LED) Surface Photovoltage Spectroscopy ( nm) Motorised or Manual Translators (50mm to 200mm) Heater Stage and/or Sample Translation Tips in Gold or S.Steel from 0.05mm to 20mm UHVKP020 Kelvin Probe with Manual Translator Photographed on desk before mounting on to User s Chamber The Company KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies. KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world. Contact For quotation requests, further information or to discuss any research or particular measurements, please feel free to contact us: sales@kelvinprobe.com Tel: Or visit our websites KP Technology was the proud winner of the Queens Award for Enterprise: International Trade 2013

Single Point Kelvin Probe System KP020 System Description Our Single-Point Kelvin Probe System is the introductory system to the KP Technology range.

For rapid events, the KP020 can record work function at a rate of 1000 work function measurements per minute, or, alternatively, the system will track slow work function evolution over a number of

12 Single Point Kelvin Probe System KP020 System Description Our Single-Point Kelvin Probe System is the introductory system to the KP Technology range. The economical system enables users to quickly record non-scanning data in a numner of different modes to match the exact requirement of the sample under investigation. For rapid events, the KP020 can record work function at a rate of 1000 work function measurements per minute, or, alternatively, the system will track slow work function evolution over a number of days. The KP020 provides the perfect platform for upgrades to Scanning, Air Photoemission and Surface Photovoltage add-on modules. Platinum Work Function over time after cleaning Single-Point Kelvin Probe KP020 Pictured on the right without the included Optical Enclosure Features Applications Work Function Measurement by Kelvin Probe Work Function Resolution of <3meV Modular System for Upgrades and Add-Ons Economical, Entry System USB Version Plug-and-Play Organic and Non-Organic Semiconductors Metals Thin Films Solar Cells and Organic Photovoltaics Corrosion

Single Point Kelvin Probe System KP020 System Specifications Tip Material / Diameter Work Function Resolution Probe Translation Visualisation Oscilloscope Test Sample Control Supplied Control

13 Single Point Kelvin Probe System KP020 System Specifications Tip Material / Diameter Work Function Resolution Probe Translation Visualisation Oscilloscope Test Sample Control Supplied Control Possible Detection System Enclosure Optical System Warranty KP020 2mm Gold Tip <3meV 25mm Manual Translator Single-Point Work Function / Contact Potential Difference Scans Digital TFT Oscilloscope for Real Time Signal Gold on Aluminium Sample PC Control with Dedicated Software USB Control with Dedicated Software available upon request Off-Null with Parasitic Capacity Rejection 450mm x 450mm Optical Enclosure Included Colour Camera with Zoom Lens and Monitor 12 Months Upgrades and Add-Ons Air Photoemission System Surface Photovoltage (QTH or LED) Surface Photovoltage Spectroscopy ( nm) Upgrade to Scanning Kelvin Probe System Relative Humidity Control and Nitrogen Environmental Chamber The KP Technology Kelvin Probe The Company KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would firstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and finally educate scientists, engineers and technologists in the capabilities of these emerging technologies. KP Technology also performs a significant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world. Contact For quotation requests, further information or to discuss any research or particular measurements, please feel free to contact us: sales@kelvinprobe.com Tel: Or visit our websites KP Technology was the proud winner of the Queens Award for Enterprise: International Trade 2013

Surface Photovoltage Modules SPS030, SPS040 System Description The surface Photovoltage Spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such

The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in Optical Chopper.

14 Surface Photovoltage Modules SPS030, SPS040 System Description The surface Photovoltage Spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as Organic Semiconductors, Solar Cells or Light Sensitive Dyes. The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in Optical Chopper. Total digital control of all parameters including light intensity and wavelength ( nm or nm) gives the oppurtunity to investigate the quality of samples, characterise interface and bulk defect states. SPV (mv) mc-si, Si3N CdTe Photon Energy (ev) SPS Response of mc-si, Si3N4 and CdTe Samples Surface Photovoltage Spectroscopy SPS030 Pictured with Silicon Solar Cell Sample Features Applications SPS to 700nm Range SPS to 1000nm Range Intense White Light QTH Source DC and AC Measurement Modes Compatible with all Kelvin Probe Systems Organic and Non-Organic Semiconductors Metals Thin Films Solar Cells and Organic Photovoltaics Corrosion

Surface Photovoltage Modules SPV010, SPV020 System Description TThe SPV010 or SPV020 module is the ideal upgrade to any of our Kelvin Probe Systems, for any one with an interest in light sensitive

Vary the light intensity of the 150W DC regulated Quartz Tungsten Halogen bulb to achieve open circuit potential or investigate the quality of your latest roll-to-roll silicon solar cells.

15 Surface Photovoltage Modules SPV010, SPV020 System Description TThe SPV010 or SPV020 module is the ideal upgrade to any of our Kelvin Probe Systems, for any one with an interest in light sensitive materials such as solar cells and light sensitive dye. Vary the light intensity of the 150W DC regulated Quartz Tungsten Halogen bulb to achieve open circuit potential or investigate the quality of your latest roll-to-roll silicon solar cells. The modules come in two forms; SPV010 is an intense White LED that is a simple on/off DC measurement; SPV020 is an extremely intense Quartz Tungsten Halogen Light source that has a variable light intensity from softare control. change in surface potential (mv) Back Side Grounded Front Side Grounded Time (s) FSE and BSE Coated, Defective, measured with SPV020 QTH Light Pulse Quartz Tungsten Halogen SPV020 Source and SPV010 LED Source with Electronics Control Box Features Applications SPV010 - White LED Light Source Organic and Non-Organic Semiconductors SPV020 - QTH Variable Light Source Metals Intense Light Sources Thin Films Automatic Software Control Solar Cells and Organic Photovoltaics Compatible with all Kelvin Probe Systems Corrosion

Scanning Kelvin Probe Systems

Scanning Kelvin Probe Systems SKP5050, ASKP100100, ASKP200250, ASKP350350 System Description Our large range of Scanning Kelvin Probes give the user full access to 2D and 3D work function plots of samples