XUV 773: X-Ray Fluorescence Analysis of Gemstones
|
|
- Sibyl Palmer
- 6 years ago
- Views:
Transcription
1 Fischer Application report vr118 HELM UT FISCHER GMBH + CO. KG Institut für Elektronik und Messtechnik Industriestrasse Sindelfingen, Germany Tel.: (+49) Fax: (+49) mail@helmut-fischer.de Internet: w w w.helmut-fischer.com XUV 773: X-Ray Fluorescence Analysis of Gemstones The energy dispersive X-ray fluorescence analysis (ED-XRFA) is a well-established tool for multielement composition analysis in different fields/1/. It works non-conducting and it is non-destructive. No particular sample preparation is necessary if the specimens have an almost planar and smooth surface. For the characterization of precious gemstone material it is also important that the deposited X-ray radiation dose is definitely too weak for inducing colour alterations, in contrast to WD-XRFA /2/. This is essential for gemstone testing. The concentrations of the major and minor and the trace elements give important hints for the type and/or the authenticity of the gemstone. In this way ED-XRFA becomes essential for the identification of the mineral in addition to structural analysis (Raman, XRD) and classic optical methods. 1. XRFA in vacuum The ED-XRFA of gemstones and mineral samples has to cover both the analysis of light and heavy elements. The evaluation of the light matrix elements Na, Mg, Al enforces the evacuation of the measuring head is necessary for the detection of light elements (Z < 14). Also for the Z-range 15 2 (P Ca) the detection limits are improved. The vacuum instead of normal atmosphere eliminates the air path absorption between detector and sample (cf. tab. 1). May be that for Si-K and Al-K the absorption can be counterbalanced by longer measuring times. The measurement of the fluorescence of Mg-K and in particular Na-K requires vacuum absolutely. A combination of different X-ray excitation conditions is applied in order to reach optimal measuring sensitivities for a wide range of atomic numbers Z. The WinFTM /3/ software includes the evaluation of the respective spectra in a single run which does not require particular efforts of the user. This so-called multiple excitation mode offers also possibilities to suppress the influence of X-ray diffraction. This quantification consequently utilizes a complete computer simulation of the measured spectra which is based on a fundamental parameter treatment described in /4/. This report describes the application of an XRF vacuum measuring system for the analysis of several gemstone reference samples in order to qualify the methodology. 1
2 Tab. 1 Transmission (%) of X-Rays for different detector to sample air path lengths. 1.5 cm is the minimum distance for the standard geometry of Fischer XRF systems with several apertures and video optics. air path Na Kα 1.4keV Mg Kα 1.25keV Al Kα 1.49keV Si Kα 1.74keV P Kα 2.2keV S Kα 2.31keV 1.5cm cm cm cm Fig. 1 A sample carrier with 64 gemstone specimen is placed on the motorized stage of the Fischerscope XUV 773 (top). p symbolizes the primary X-ray beam which excites the sample for the emission of fluorescence radiation (f). The sample has to be fixed over a radiation trap. It avoids that the backscattered radiation (s) can be detected. The fig. 1 shows a sample fixing support for 64 gemstone samples. They are placed over a hole to prevent scattering background radiation from the backing. Also the measuring geometry is shown schematically. 2
3 2. Multi-excitation and Braggs Fig. 2 XRF spectra of a mineral sample (andesine) for different excitations: a) 5 kv, 1 mm Al primary filter (green) b) 2 kv,,1 mm Al filter (blue) c) 8 kv,,1 mm Mylar filter (ochre). Fig. 3 The effect of different primary absorption filters to a continuous primary radiation. The thin filter has maximum intensity. The energy range without potential elastic scattering inclusive Bragg is small (origin - 1). The filter reduces the low energy part mainly. A thick filter causes a large region without elastic scattering (origin 3) but it is counterbalanced by s low primary intensity. Optimal detection limits for light elements are achieved by a soft excitation or a low high voltage. The optimal HV (X-ray tube high voltage) should be about 3 times the ionization threshold of the respective inner shell, as a guideline. So 5 kv should be optimal for Al (K-shell), and 15 kv for Ti, and 3 kv for Ga, etc. 3
4 Different primary excitations have to be applied in order to cover the full element range of interest /5/. The component mode has been used because it is known that the mineral consists of oxides. The list of defined and analysed components is given in tab. 1 below. It is important to note that the software itself decides which excitation mode is used for the determination of any element. These decisions depend on the measuring sensitivities of a given element for each excitation mode, which is calculated in any case. This internal weighing is influenced by possible diffraction peaks. The samples have a crystalline structure which is the origin of diffraction peaks in the spectrum. These so-called Bragg-peaks appear in the spectrum by random due to the current position of the reflecting lattice plane which is normally unknown. They can disturb the evaluation considerably and are a source of non-reproducibility. They can be avoided or suppressed by using filtered primary radiation (fig. 3). The optimum excitation condition for a certain element without potential Bragg interferences predicts a certain high voltage filter combination. A compromise has to be found in order to analyse several elements with a large Z-range (Na to U). It has to take into account - the application of only a few filters (thickness & material) - in combination with only a few high voltage settings. WinFTM restricts the number of different excitations (high voltage and filter settings) to maximum three. This so-called multiple excitation mode automatically takes the optimum information from all spectra recorded with different excitation conditions (fig. 2). Their definition has to consider the mentioned criteria (avoid Braggs and optimal sensitivities for the elements of interest). The fig. 4 illustrates the compromise situation with respect to Na analysis. The softest excitation (no filtering) yields the best Na-K excitation (yellow spectrum). Unfortunately, there are some strong Bragg peaks labelled with B. The Na-K fluorescence peak is overlapped by an intense diffraction peak. Hence, Na cannot be determined from this spectrum. The selection of high voltage filter combinations for the single excitations has to prevent such cases. The blue spectrum of fig. 3 belongs to the same sample. The soft primary radiation is absorbed (filtered) by a thin plastic foil. Scattered primary radiation which could overlap by diffraction in the 1 kev-region is avoided. However, this filtering reduces the intensities of the low energy fluorescence peaks. The unfiltered soft primary radiation can be applied in case of a non-crystalline sample (e.g. glass). Fig. 4 The effect of a thin mylar primary filter to the low energy part of the spectrum. The yellow spectrum of the unfiltered primary radiation (tube operation voltage = 8 kv) causes some Bragg reflection labelled with a B. The Na-K peak is completely overlapped by a diffraction peak and Na cannot be analysed from this measurement. A 1 µm thick plastic (mylar) filter reduces the probability of such interferences (blue spectrum). 4
5 3. Quantification and sample geometry The WinFTM FP treatment calculates a best-fit of the theoretical spectra with the measured ones. The free parameters of this iterative fit calculation are the unknown concentrations. The mathematical best fit is the theoretical or standardless result. The treatment assumes a sample which consists of planparallel layers. In case of a mineral sample we have only one layer. And the interaction length within the sample is small compared with the detector-sample-distance d int eraction << d det sample, cf. fig. 5. For several mineral and gemstone samples both preconditions do not hold true in any case (in particular for high fluorescence energies). WinFTM calculates the absorption of a fluorescence line for a plane surface. A shaped one may influence the result. Fig. 5 Geometry of gemstone analysis The internal algorithm of version 6.23 has been modified with respect to get more tolerance with respect to (small) changes of the intensity of a spectrum. This will not correct the result for such undefined variations but it can avoid a complete failure of the iteration. Optimal DefMA setup setup - Exitation with 3 different modes (5 kv & 1mm Al filter, 2 kv and.1 mm Al filter, 8 kv and.1 mm mylar filter). - The concentrations of oxides have to be analysed: the component modus is used. - The balance component (or balance element) is the last one defined. No trace element at the last position. - Start parameters for the single concentrations are necessary for the component mode and helpful for the element mode. - The soft 8 kv excitation is defined with ratio method. - A ROI for the lower limit of the spectrum is helpful, e.g. ROI1=25. 5
6 4. Test results This section reports some comparisons of standardless XRF results with data from other analytical techniques. Comparing the respective results we have to take into account both the statistical uncertainties (cf. tab. 2) and systematic differences. These may have different reasons such as Local variations of element concentrations (examples see figs.6-8), Different information depth, Systematic calibration errors (of the other methods). Tab. 2 Measuring results of a mineral (andesine). Measuring time is 1 s per excitation mode. Excitation conditions acc. to fig. 2 Component Mean (wt.-%) Std.dev. (wt.-%) Estimated detection limit (wt.-%) Na 2 O MgO Al 2 O SiO K 2 O CaO TiO V 2 O MnO Fe 2 O 3, Co 3 O Ni 2 O CuO ZnO Ga 2 O SrO PbO Bi 2 O Video image of an andesine. The points drawn in mark the line scan shown in the follow- Fig.6 ing figs
7 Fig. 7 Linescan of the Na 2 O concentration for an andesine sample (fig. 6). The scattering of the measuring points reflects the statistical uncertainty. Fig. 8 Linescan of the Al 2 O 3 concentration for an andesine sample (fig. 6). The scattering of the measuring points reflects the statistical uncertainty. Normally, the mineral samples are more homogeneous then the andesine sample of figs Many gem specimens are used as reference standards /6/ which are analyzed by different techniques. Also some mineral certified reference material is available. The figs depict a comparison of XRF measurements with data from other methods. The correlation is sufficient or good. Remaining deviations are expected to be caused by different reasons which cannot be discussed in detail here. 7
8 Mg y =,998x +,7296 % M g O ( o t h e r m e th o d s ) %MgO (XRF) Fig. 9 Comparison with MgO analysis in different minerals and gemstones. The single points refer to SEM measurements of some selected gemstones /6/ and to certified standard materials % Al2O 3 (other methods) Al y =,953x -, %Al2O3 (XRF) Fig. 1 Comparison with Al 2 O 3 analysis in different minerals and gemstones. The single points refer to SEM measurements of some selected gemstones /6/ and to certified standard materials 8
9 Si 8 y =,8753x + 2, %SiO2 (other methods) , 2, 4, 6, 8, 1, %SiO2 (XRF) Fig. 11 Comparison with SiO 2 analysis in different minerals and gemstones. The single points refer to SEM measurements of some selected gemstones /6/ and to certified standard materials %CaO (other methods) Ca y = 1,591x -, , 5, 1, 15, %CaO (XRF) Fig. 12 Comparison with CaO analysis in different minerals and gemstones. The single points refer to SEM measurements of some selected gemstones /6/ and to certified standard materials 9
10 %TiO2,1,9,8,7,6 XRF,5,4,3,2,1,1,2,3,4,5,6,7,8,9,1 LA a) %V2O5 X R F,8,7,6,5,4,3,2,1,1,2,3,4,5,6,7,8 LA b) 1
11 %Cr2O3 1,4 1,2 1,8 XRF,6,4,2,2,4,6,8 1 1,2 1,4 LA c) MnO,1,9,8,7,6 XRF,5,4,3,2,1,1,2,3,4,5,6,7,8,9,1 LA d) 11
12 %Fe2O3 3 2,5 2 XR F 1,5 1,5,5 1 1,5 2 2,5 3 LA e) %Ga2O3,1,9,8,7,6,5,4,3,2,1,1,2,3,4,5,6,7,8,9,1 LA f) Fig. 13a-f Comparison of LA-ICP-MS with standard free XRFA results 12
13 The trace element and minor element concentrations of a number of reference standards of the GRS Lab /6/ have been determined by means of LA-ICP-MS which is a well accepted method in gemstone characterization. The comparisons (figs. 13a-f) prove that XRFA reflects the trace element concentrations quite reliable. In contrast to the laser beam technique 1 it works non-destructive and so XRFA has a big potential in this field. References /1/ T. Kouichi, J. Injuk, and R. van Grieken (eds.), X-ray spectrometry: recent technological advances, Wiley 24. /2/ A. Burkhardt, priv. communication. /3/ Helmut Fischer GmbH, WinFTM softwareversion 6.22 ff. /4/ V. Rößiger and B. Nensel, in Handbook of practical X-Ray fluorescence analysis, Springer 26, p /5/ Fischer application note vr99, Multi excitation. /6/ A. Peretti, priv. communication 1 The sophisticated equipment is very expensive also. 13
MT Electron microscopy Scanning electron microscopy and electron probe microanalysis
MT-0.6026 Electron microscopy Scanning electron microscopy and electron probe microanalysis Eero Haimi Research Manager Outline 1. Introduction Basics of scanning electron microscopy (SEM) and electron
More informationEDS User School. Principles of Electron Beam Microanalysis
EDS User School Principles of Electron Beam Microanalysis Outline 1.) Beam-specimen interactions 2.) EDS spectra: Origin of Bremsstrahlung and characteristic peaks 3.) Moseley s law 4.) Characteristic
More informationElectron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn?
Electron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn? EPMA - what is it? Precise and accurate quantitative chemical analyses of micron-size
More informationEPMA IMAGES. Figure 9. Energy-dispersive spectra of spot mineral analyses in sample 89GGR-33A for locations 1-5 in Figure 8.
EPMA IMAGES The attached images and mineral data can be used to supplement an instrument-based lab, or serve as the basis for lab that can be completed without an instrument. Please provide credit for
More informationMicro-XRF excitation in an SEM
X-RAY SPECTROMETRY X-Ray Spectrom. 2007; 36: 254 259 Published online 8 May 2007 in Wiley InterScience (www.interscience.wiley.com).974 Micro-XRF excitation in an SEM M. Haschke, 1 F. Eggert 2 andw.t.elam
More informationIn-Situ Analysis of Traces, Minor and Major Elements in Rocks and Soils with a Portable XRF Spectrometer*
In-Situ Analysis of Traces, Minor and Major Elements in Rocks and Soils with a Portable XRF Spectrometer* Anthony Thomas 1, Joachim Heckel 1, and Dirk Wissmann 1 Search and Discovery Article #41836 (2016)
More informationStandardless Analysis by XRF but I don t know what s in my sample!! Dr Colin Slater Applications Scientist, XRF Bruker UK Limited
by XRF but I don t know what s in my sample!! Dr Colin Slater Applications Scientist, XRF Bruker UK Limited XRF Standardless Analysis In this talk What is meant by standardless analysis? Fundamental Parameters
More informationQuantitative XRF Analysis. algorithms and their practical use
Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring Quantitative XRF Analysis algorithms and their practical use
More informationOverview of X-Ray Fluorescence Analysis
Overview of X-Ray Fluorescence Analysis AMPTEK, INC., Bedford, MA 01730 Ph: +1 781 275 2242 Fax: +1 781 275 3470 sales@amptek.com 1 What is X-Ray Fluorescence (XRF)? A physical process: Emission of characteristic
More informationFUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 511 FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON
More informationLatest advances in identifying mineral composition variation by the M4 TORNADO AMICS
Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS Bruker Nano Analytics, Berlin, Germany Webinar, June 15, 2017 Innovation with Integrity Presenters Samuel Scheller Sr.
More informationX Rays & Crystals. Characterizing Mineral Chemistry & Structure. J.D. Price
X Rays & Crystals Characterizing Mineral Chemistry & Structure J.D. Price Light - electromagnetic spectrum Wave behavior vs. particle behavior If atoms are on the 10-10 m scale, we need to use sufficiently
More informationAnalysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy Hiroshi Onodera Application & Research Center, JEOL Ltd. Introduction um, PBB and PBDE) are subject to usage restrictions in Europe.
More informationMT Electron microscopy Scanning electron microscopy and electron probe microanalysis
MT-0.6026 Electron microscopy Scanning electron microscopy and electron probe microanalysis Eero Haimi Research Manager Outline 1. Introduction Basics of scanning electron microscopy (SEM) and electron
More informationX-Ray Fluorescence and Natural History
X-Ray Fluorescence and Natural History How XRF Helps XRF can be used both quantitatively (homogenous samples) and quantitatively (heterogenous samples).! Trace elements in a fossil can help identify source,
More informationFUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
45 ABSTRACT FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS W. T. Elam, Robert B. Shen, Bruce Scruggs, and Joseph A. Nicolosi EDAX, Inc. Mahwah, NJ 70430 European Community Directive 2002/95/EC
More informationRoHS/WEEE Measurement of Hazardous Substances in Plastics
HELMUT FISCHER GMBH + + CO. COKG INDUSTRIESTRASSE INDUSTRIESTASSE 21 21 71069 71069 SINDELFINGEN - MAICHINGEN TEL TEL. 07031 07031 // 303-0 FAX 0 FAX 07031 07031 / / 30379 Application Report bn2005_01
More informationPeter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K.
783 SCOPE AND LIMITATIONS XRF ANALYSIS FOR SEMI-QUANTITATIVE Introduction Peter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K. Historically x-ray fluorescence spectrometry has
More informationMICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES
THE PUBLISHING HOUSE PROCEEDINGS OF THE ROMANIAN ACADEMY, Series A, OF THE ROMANIAN ACADEMY Volume 18, Number 1/2017, pp. 42 49 MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES Ion GRUIA University
More informationPraktikum zur. Materialanalytik
Praktikum zur Materialanalytik Energy Dispersive X-ray Spectroscopy B513 Stand: 19.10.2016 Contents 1 Introduction... 2 2. Fundamental Physics and Notation... 3 2.1. Alignments of the microscope... 3 2.2.
More informationprint first name print last name print student id grade
print first name print last name print student id grade Experiment 2 X-ray fluorescence X-ray fluorescence (XRF) and X-ray diffraction (XRD) may be used to determine the constituent elements and the crystalline
More informationX-Ray Emission and Absorption
X-Ray Emission and Absorption Author: Mike Nill Alex Bryant February 6, 20 Abstract X-rays were produced by two bench-top diffractometers using a copper target. Various nickel filters were placed in front
More informationAPPENDICES. Appendix 1
Corthouts, T.L., Lageson, D.R., and Shaw, C.A., 2016, Polyphase deformation, dynamic metamorphism and metasomatism of Mount Everest s summit limestone, east central Himalaya, Nepal/Tibet: Lithosphere,
More informationAuger Electron Spectroscopy (AES)
1. Introduction Auger Electron Spectroscopy (AES) Silvia Natividad, Gabriel Gonzalez and Arena Holguin Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving
More informationAP5301/ Name the major parts of an optical microscope and state their functions.
Review Problems on Optical Microscopy AP5301/8301-2015 1. Name the major parts of an optical microscope and state their functions. 2. Compare the focal lengths of two glass converging lenses, one with
More informationChemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5
Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4
More informationS2 PICOFOX. Innovation with Integrity. Spectrometry Solutions TXRF
S2 PICOFOX Spectrometry Solutions Innovation with Integrity TXRF S2 PICOFOX True Trace Analysis with XRF for the First Time! You need to know the concentration of trace elements in environmental samples?
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationElectron-Induced X-Ray Intensity Ratios of Pb Lα/Lβ and As Kα/Kβ by kev Applied Voltages
Electron-Induced X-Ray Intensity Ratios of Pb Lα/Lβ and As Kα/Kβ by 18-30 kev Applied Voltages Bolortuya DAMDINSUREN and Jun KAWAI Department of Materials Science and Engineering, Kyoto University Sakyo-ku,
More informationChemistry Instrumental Analysis Lecture 19 Chapter 12. Chem 4631
Chemistry 4631 Instrumental Analysis Lecture 19 Chapter 12 There are three major techniques used for elemental analysis: Optical spectrometry Mass spectrometry X-ray spectrometry X-ray Techniques include:
More informationChemistry 311: Instrumentation Analysis Topic 2: Atomic Spectroscopy. Chemistry 311: Instrumentation Analysis Topic 2: Atomic Spectroscopy
Topic 2b: X-ray Fluorescence Spectrometry Text: Chapter 12 Rouessac (1 week) 4.0 X-ray Fluorescence Download, read and understand EPA method 6010C ICP-OES Winter 2009 Page 1 Atomic X-ray Spectrometry Fundamental
More informationElectron Microscopy I
Characterization of Catalysts and Surfaces Characterization Techniques in Heterogeneous Catalysis Electron Microscopy I Introduction Properties of electrons Electron-matter interactions and their applications
More informationSEM. Chemical Analysis in the. Elastic and Inelastic scattering. Chemical analysis in the SEM. Chemical analysis in the SEM
THE UNIVERSITY Chemical Analysis in the SEM Ian Jones Centre for Electron Microscopy OF BIRMINGHAM Elastic and Inelastic scattering Electron interacts with one of the orbital electrons Secondary electrons,
More informationPlasma driven ammonia decomposition on Fe-catalyst: eliminating surface nitrogen poisoning
Supporting Information for Plasma driven ammonia decomposition on Fe-catalyst: eliminating surface nitrogen poisoning Contents: 1. Scheme of the DBD plasma-driven catalysis reactor, Scheme S1. 2. XRF analysis
More informationSpectroscopy on Mars!
Spectroscopy on Mars! Pathfinder Spirit and Opportunity Real World Friday H2A The Mars Pathfinder: Geological Elemental Analysis On December 4th, 1996, the Mars Pathfinder was launched from earth to begin
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationNEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 266 NEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
More informationUnderstanding X-rays: The electromagnetic spectrum
Understanding X-rays: The electromagnetic spectrum 1 ULa 13.61 kev 0.09 nm BeKa 0.11 kev 11.27 nm E = hn = h c l where, E : energy, h : Planck's constant, n : frequency c : speed of light in vacuum, l
More informationLAB REPORT ON XRF OF POTTERY SAMPLES By BIJOY KRISHNA HALDER Mohammad Arif Ishtiaque Shuvo Jie Hong
LAB REPORT ON XRF OF POTTERY SAMPLES By BIJOY KRISHNA HALDER Mohammad Arif Ishtiaque Shuvo Jie Hong Introduction: X-ray fluorescence (XRF) spectrometer is an x-ray instrument used for routine, relatively
More informationSupplementary Information. Large Scale Graphene Production by RF-cCVD Method
Supplementary Information Large Scale Graphene Production by RF-cCVD Method Enkeleda Dervishi, *a,b Zhongrui Li, b Fumiya Watanabe, b Abhijit Biswas, c Yang Xu, b Alexandru R. Biris, d Viney Saini, a,b
More informationHOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS. SCSAM Short Course Amir Avishai
HOW TO APPROACH SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE SPECTROSCOPY ANALYSIS SCSAM Short Course Amir Avishai RESEARCH QUESTIONS Sea Shell Cast Iron EDS+SE Fe Cr C Objective Ability to ask the
More informationX-ray practical: Crystallography
X-ray practical: Crystallography Aim: To familiarise oneself with the operation of Tex-X-Ometer spectrometer and to use it to determine the lattice spacing in NaCl and LiF single crystals. Background:
More informationMetcalf and Buck. GSA Data Repository
GSA Data Repository 2015035 Metcalf and Buck Figure DR1. Secondary ionization mass-spectrometry U-Pb zircon geochronology plots for data collected on two samples of Wilson Ridge plutonic rocks. Data presented
More informationUnderstanding X-rays: The electromagnetic spectrum
Understanding X-rays: The electromagnetic spectrum 1 ULa 13.61 kev 0.09 nm BeKa 0.11 kev 11.27 nm E = hn = h c l where, E : energy, h : Planck's constant, n : frequency c : speed of light in vacuum, l
More informationAXP Research group Analytical X-ray Physics
Research group Analytical X-ray Physics X-ray Fluorescence Spectrometry Wolfgang and BLiX Team Our Current Activities 3D Micro-XRF 3D Micro-XANES High resolution X-ray emission spectroscopy Characterisation
More informationTime-Resolved μ-xrf and Elemental Mapping of Biological Materials
296 Time-Resolved μ-xrf and Elemental Mapping of Biological Materials K. Tsuji 1,2), K. Tsutsumimoto 1), K. Nakano 1,2), K. Tanaka 1), A. Okhrimovskyy 1), Y. Konishi 1), and X. Ding 3) 1) Department of
More informationX-ray Spectroscopy. Danny Bennett and Maeve Madigan. October 12, 2015
X-ray Spectroscopy Danny Bennett and Maeve Madigan October 12, 2015 Abstract Various X-ray spectra were obtained, and their properties were investigated. The characteristic peaks were identified for a
More informationCHEM*3440. X-Ray Energies. Bremsstrahlung Radiation. X-ray Line Spectra. Chemical Instrumentation. X-Ray Spectroscopy. Topic 13
X-Ray Energies very short wavelength radiation 0.1Å to 10 nm (100 Å) CHEM*3440 Chemical Instrumentation Topic 13 X-Ray Spectroscopy Visible - Ultraviolet (UV) - Vacuum UV (VUV) - Extreme UV (XUV) - Soft
More informationSupplementary Materials for
advances.sciencemag.org/cgi/content/full/2/3/e1501725/dc1 Supplementary Materials for Discovery of natural MgSiO3 tetragonal garnet in a shocked chondritic meteorite The PDF file includes: Naotaka Tomioka,
More informationKMÜ 396 MATERIALS SCIENCE AND TECH. I PRESENTATION ELECTRON ENERGY LOSS SPECTROSCOPY (EELS) TUĞÇE SEZGİN
KMÜ 396 MATERIALS SCIENCE AND TECH. I PRESENTATION ELECTRON ENERGY LOSS SPECTROSCOPY (EELS) TUĞÇE SEZGİN 20970725 HACETTEPE UNIVERSITY DEPARTMENT OF CHEMICAL ENGINEERING, SPRING 2011,APRIL,ANKARA CONTENTS
More informationX-RAY SPECTRA. Theory:
12 Oct 18 X-ray.1 X-RAY SPECTRA In this experiment, a number of measurements involving x-rays will be made. The spectrum of x-rays emitted from a molybdenum target will be measured, and the experimental
More informationAuger Electron Spectroscopy
Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection
More informationINTERNATIONAL JOURNAL OF SCIENTIFIC & TECHNOLOGY RESEARCH VOLUME 3, ISSUE 2, FEBRUARY 2014 ISSN
Implication Of X-Ray Path, Region Of Interest, Tube Current And Voltage In Calibration Of X- Ray Fluorescence Instrument: A Case Study Of X-Supreme 8000 Amuda, A.K., Okoh, S., Ekwuribe, S., Bashir, M.
More informationX-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect was enunciated
More informationX-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Fulmer 261A Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect
More informationGaetano L Episcopo. Scanning Electron Microscopy Focus Ion Beam and. Pulsed Plasma Deposition
Gaetano L Episcopo Scanning Electron Microscopy Focus Ion Beam and Pulsed Plasma Deposition Hystorical background Scientific discoveries 1897: J. Thomson discovers the electron. 1924: L. de Broglie propose
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 2: UPS
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 2: UPS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationOXEA - Online Elemental Analyzer
02 25 08 OXEA - Online Elemental Analyzer OXEA (Online X-ray Elemental Analyzer) is based on the X-ray fluorescence technology (XRF) which is well known in the laboratory field. With the aid of a patented
More informationSupporting Information. For. Preparation and Characterization of Highly Planar Flexible Silver
Supporting Information For Preparation and Characterization of Highly Planar Flexible Silver Crystal Belts Dharmesh Varade and Kazutoshi Haraguchi* [*] Dr. K. Haraguchi (Corresponding-Author), Dr. D. Varade
More informationGeology 777 Monte Carlo Exercise I
Geology 777 Monte Carlo Exercise I Purpose The goal of this exercise is to get you to think like an electron... to start to think about where electrons from the stream of high energy electrons go when
More information4. Inelastic Scattering
1 4. Inelastic Scattering Some inelastic scattering processes A vast range of inelastic scattering processes can occur during illumination of a specimen with a highenergy electron beam. In principle, many
More informationAdvanced Lab Course. X-Ray Photoelectron Spectroscopy 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT Qualitative analysis Chemical Shifts 7
Advanced Lab Course X-Ray Photoelectron Spectroscopy M210 As of: 2015-04-01 Aim: Chemical analysis of surfaces. Content 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT 3 3.1 Qualitative analysis 6 3.2 Chemical
More informationX-ray Absorption Spectroscopy
X-ray Absorption Spectroscopy Nikki Truss November 26, 2012 Abstract In these experiments, some aspects of x-ray absorption spectroscopy were investigated. The x-ray spectrum of molybdenum was recorded
More informationLAB 01 X-RAY EMISSION & ABSORPTION
LAB 0 X-RAY EMISSION & ABSORPTION REPORT BY: TEAM MEMBER NAME: Ashley Tsai LAB SECTION No. 05 GROUP 2 EXPERIMENT DATE: Feb., 204 SUBMISSION DATE: Feb. 8, 204 Page of 3 ABSTRACT The goal of this experiment
More informationAtomic and nuclear physics
Atomic and nuclear physics X-ray physics Physics of the atomic shell LEYBOLD Physics Leaflets Moseley s law and determination of the Rydberg constant P6.3.3.6 Objects of the experiment Measuring the K-absorption
More informationTwo-dimensional homologous perovskites as light absorbing materials for solar cell applications
Supporting Information for Two-dimensional homologous perovskites as light absorbing materials for solar cell applications Duyen H. Cao, Constantinos C. Stoumpos, Omar K. Farha,, Joseph T. Hupp, and Mercouri
More informationMSE 321 Structural Characterization
Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics
More informationAn Introduction to Diffraction and Scattering. School of Chemistry The University of Sydney
An Introduction to Diffraction and Scattering Brendan J. Kennedy School of Chemistry The University of Sydney 1) Strong forces 2) Weak forces Types of Forces 3) Electromagnetic forces 4) Gravity Types
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 12: Summary. Byungha Shin Dept. of MSE, KAIST
2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 12: Summary Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1
More informationTransmission Electron Microscopy
L. Reimer H. Kohl Transmission Electron Microscopy Physics of Image Formation Fifth Edition el Springer Contents 1 Introduction... 1 1.1 Transmission Electron Microscopy... 1 1.1.1 Conventional Transmission
More informationSemiconductor X-Ray Detectors. Tobias Eggert Ketek GmbH
Semiconductor X-Ray Detectors Tobias Eggert Ketek GmbH Semiconductor X-Ray Detectors Part A Principles of Semiconductor Detectors 1. Basic Principles 2. Typical Applications 3. Planar Technology 4. Read-out
More informationAtomic and nuclear physics
Atomic and nuclear physics X-ray physics Attenuation of x-rays LEYBOLD Physics Leaflets P6.3.2.2 Investigating the wavelength dependency of the coefficient of attenuation Objects of the experiment To measure
More informationTEP Examination of the structure of NaCl monocrystals with different orientations
Examination of the structure of NaCl TEP Related topics Characteristic X-radiation, energy levels, crystal structures, reciprocal lattices, Miller indices, atomic form factor, structure factor, and Bragg
More informationAbsorption of X-rays
Absorption of X-rays TEP Related topics Bremsstrahlung, characteristic X-radiation, Bragg scattering, law of absorption, mass absorption coefficient, absorption edges, half-value thickness, photoelectric
More informationAEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD
Copyright JCPDS-International Centre for Diffraction Data 2014 ISSN 1097-0002 219 AEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD Takao Moriyama 1), Atsushi Morikawa 1), Makoto
More informationCharacteristic X-rays of molybdenum
Characteristic X-rays of molybdenum TEP Related Topics X-ray tubes, bremsstrahlung, characteristic X-radiation, energy levels, crystal structures, lattice constant, absorption of X-rays, absorption edges,
More informationX-RAY SCATTERING AND MOSELEY S LAW. OBJECTIVE: To investigate Moseley s law using X-ray absorption and to observe X- ray scattering.
X-RAY SCATTERING AND MOSELEY S LAW OBJECTIVE: To investigate Moseley s law using X-ray absorption and to observe X- ray scattering. READING: Krane, Section 8.5. BACKGROUND: In 1913, Henry Moseley measured
More informationAnalyzing the Sensitivity of a Hard X Ray Detector Using Monte Carlo Methods
1 Analyzing the Sensitivity of a Hard X Ray Detector Using Monte Carlo Methods Junhong Sam Zhou Victor Senior High School LLE Advisor: Christian Stoeckl Laboratory for Laser Energetics University of Rochester
More informationX-ray Spectroscopy. c David-Alexander Robinson & Pádraig Ó Conbhuí. 14th March 2011
X-ray Spectroscopy David-Alexander Robinson; Pádraig Ó Conbhuí; 08332461 14th March 2011 Contents 1 Abstract 2 2 Introduction & Theory 2 2.1 The X-ray Spectrum............................ 2 2.2 X-Ray Absorption
More informationAuger Electron Spectroscopy (AES) Prof. Paul K. Chu
Auger Electron Spectroscopy (AES) Prof. Paul K. Chu Auger Electron Spectroscopy Introduction Principles Instrumentation Qualitative analysis Quantitative analysis Depth profiling Mapping Examples The Auger
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationControlled self-assembly of graphene oxide on a remote aluminum foil
Supplementary Information Controlled self-assembly of graphene oxide on a remote aluminum foil Kai Feng, Yewen Cao and Peiyi Wu* State key Laboratory of Molecular Engineering of Polymers, Department of
More informationSupporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
More informationSummary of test results for Daya Bay rock samples. by Patrick Dobson Celia Tiemi Onishi Seiji Nakagawa
Summary of test results for Daya Bay rock samples by Patrick Dobson Celia Tiemi Onishi Seiji Nakagawa October 2004 Summary A series of analytical tests were conducted on a suite of granitic rock samples
More informationElectronic Supplementary Information (ESI) Green synthesis of shape-defined anatase TiO 2 nanocrystals wholly exposed with {001} and {100} facets
Electronic Supplementary Information (ESI) Green synthesis of shape-defined anatase TiO 2 nanocrystals wholly exposed with {001} and {100} facets Lan Wang, a Ling Zang, b Jincai Zhao c and Chuanyi Wang*
More informationENVIRONMENTAL FACTORS IMPACTING THE FORMATION AND KINETICS OF FE(II) LAYERED HYDROXIDES ON MINERALS AND SOILS. Autumn Nichole Starcher
ENVIRONMENTAL FACTORS IMPACTING THE FORMATION AND KINETICS OF FE(II) LAYERED HYDROXIDES ON MINERALS AND SOILS by Autumn Nichole Starcher A dissertation submitted to the Faculty of the University of Delaware
More informationAndrew D. Kent. 1 Introduction. p 1
Compton Effect Andrew D. Kent Introduction One of the most important experiments in the early days of quantum mechanics (93) studied the interaction between light and matter; it determined the change in
More informationQ. WANG, Q-K. XIA, S. Y. O REILLY, W. L. GRIFFIN, E. E. BEYER AND H. K. BRUECKNER
Pressure- and stress-induced fabric transition in olivine from peridotites in the Western Gneiss Region (Norway): implications for mantle seismic anisotropy Q. WANG, Q-K. XIA, S. Y. O REILLY, W. L. GRIFFIN,
More informationSupporting Information
Supporting Information Bindi et al. 10.1073/pnas.1111115109 Fig. S1. Electron microprobe X-ray elemental maps for the grain reported in Fig. 1B. Experimental details are given in Experimental Methods.
More informationCASSY Lab. Manual ( )
CASSY Lab Manual (524 202) Moseley's law (K-line x-ray fluorescence) CASSY Lab 271 can also be carried out with Pocket-CASSY Load example Safety notes The X-ray apparatus fulfils all regulations on the
More informationData report for elemental analysis of IMPROVE samples collected during April, May, June 2009 UC Davis Submitted June 18, 2010 SUMMARY
Data report for elemental analysis of IMPROVE samples collected during April, May, June 2009 UC Davis Submitted June 8, 200 SUMMARY This report summarizes the quality assurance performed during elemental
More informationEDS Mapping. Ian Harvey Fall Practical Electron Microscopy
EDS Mapping Ian Harvey Fall 2008 1 From: Energy Dispersive X-ray Microanalysis, An Introduction Kevex Corp. 1988 Characteristic X-ray generation p.2 1 http://www.small-world.net/efs.htm X-ray generation
More informationOverview over VDZ reference cements VDZ100, VDZ200, VDZ300
Overview over VDZ reference cements VDZ100, VDZ200, VDZ300 1 Productdefinition Material: Portland cement (CEM I 42,5 R) Portland-composite cement (CEM II/B-M (S,LL)) Blast furnace cement (CEM III/B) Productcode:
More informationTreatment of Data. Methods of determining analytical error -Counting statistics -Reproducibility of reference materials -Homogeneity of sample
Treatment of Data Methods of determining analytical error -Counting statistics -Reproducibility of reference materials -Homogeneity of sample Detection Limits Assessment of analytical quality -Analytical
More informationGSA Data Repository
GSA Data Repository 2019057 1 METHODS Grain Boundary Imaging and Orientation Analysis Backscatter electron (BSE) maps of thin sections were acquired using the FEI Verios XHR scanning electron microscope
More informationDevelopment of 2-Dimentional Imaging XAFS System at BL-4
Development of 2-Dimentional Imaging XAFS System at BL-4 Koichi Sumiwaka 1, Misaki Katayama 2, Yasuhiro Inada 2 1) Department of Applied Chemistry, College of Science and Engineering, Ritsumeikan, University,
More informationDevelopments & Limitations in GSR Analysis
Developments & Limitations in GSR Analysis ENFSI Working Group Meeting June 2006 Jenny Goulden Oxford Instruments NanoAnalysis Overview Introduction Developments in GSR Software Importance of EDS Hardware
More informationSupplementary Information
Supplementary Information Fabrication of Novel Rattle-Type Magnetic Mesoporous carbon Microspheres for Removal of Microcystins Xinghua Zhang and Long Jiang* Beijing National Laboratory for Molecular Science
More informationAuger Electron Spectroscopy Overview
Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E
More informationObservations Regarding Automated SEM and SIMS Analysis of Minerals. Kristofor Ingeneri. April 22, 2009
Observations Regarding Automated SEM and SIMS Analysis of Minerals Kristofor Ingeneri April 22, 2009 Forensic Geoscience A field of inquiry that utilizes techniques developed in the geosciences (geology,
More information