REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 15 REV STATUS OF SHEETS SHEET

Transcription

1 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV REV 15 REV STATUS REV OF S PMIC N/A MICROCIRCUIT DRAWING PREPARED BY Greg Cecil CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Charles F. Saffle DRAWING APPROVAL DATE MICROCIRCUIT, HYBRID, LINEAR, CURRENT SENSE AMPLIFIER AMSC N/A A CAGE CODE DSCC FORM OF E344-15

2 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph and MIL-PRF A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 R K X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) \ / (see 1.2.3) \/ Drawing number Radiation hardness assurance (RHA) designator. RHA marked devices meet the MIL-PRF specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-rha device Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 MSK 196RH Radiation hardened, current sense amplifier Device class designator. This device class designator is a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class K H G Device performance documentation Highest reliability class available. This level is intended for use in space applications. Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 2

3 Outline letter Descriptive designator Terminals Package style X See figure 1 10 Flat pack with straight leads Y See figure 1 10 Flat pack with formed leads Lead finish. The lead finish is as specified in MIL-PRF Absolute maximum ratings. 1/ Input voltage (+IN, -IN to V-) V to 44 V dc Differential Input Voltage V Total supply voltage from V V Output short circuit duration (V CC)... Indefinite 2/ Thermal resistance, junction-to-case (T C = +125 C) C/W 3/ Junction temperature (T J) C Storage temperature C to +150 C Lead temperature (soldering, 10 seconds) C 1.4 Recommended operating conditions. Input voltage range (V IN)... Case operating temperature range (T C) V dc to 36 V dc -55 C to +125 C 1.5 Radiation features. 4/ Maximum total dose available (dose rate = rads(si)/s) krads(si) 5/ 6/ Neutron irradiation (1 MeV equivalent neutrons) x10 11 n/cm 2 7/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE S MIL-STD Test Method Standard Microcircuits. MIL-STD Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ A heat sink may be required to keep the junction temperature below absolute maximum ratings. 3/ Guaranteed by design, but not tested. 4/ See for the manufacturer s radiation hardness assurance analysis and testing. 5/ This device has been high dose rate tested using condition A of Method 1019 of MIL-STD-883 to 100 krads(si) to ensure RHA designator level R. This device will be re-tested after design or process changes that may affect the RHA response of the device. 6/ This device may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for conditions as specified in MIL-STD-883, method 1019 condition A for these parameters. 7/ The device was tested per method 1017 of MIL-STD-883 using a minimum sample size of (5) devices. A representative device will be retested after design or process changes that may affect the RHA response of the device. 3

4 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK List of Standard Microcircuit Drawings. MIL-HDBK Standard Microcircuit Drawings. (Copies of these documents are available online at or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA ) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF Compliance with MIL-PRF may include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF and herein Case outlines. The case outlines shall be in accordance with herein and figure Terminal connections. The terminal connections shall be as specified on figure Radiation exposure circuits. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the qualifying and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF shall be provided with each lot of microcircuits delivered to this drawing. 4

5 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55 C T C +125 C unless otherwise specified Group A subgroups Device type Min Limits Max Unit Voltage gain error 1 V SENSE = 25 mv to 75 mv +V S = 12 V % 2, Voltage gain error 1 V SENSE = 25 mv to 75 mv, 1, 2, % +V S = 0V Post Irradiation Input offset voltage 1 V IO V SENSE = 25 mv, +V S = 12 V mv 2, Post Irradiation Input offset voltage 2 V IO V SENSE = 5 mv +V S = 0 V mv 2, Post Irradiation Input common mode rejection ratio CMRR V SENSE = 5 mv +V S = 2.8 V to 44 V db 5, 6 95 Post Irradiation 4 90 Power supply rejection ratio PSRR V SENSE = 5 mv +V = 2.85 V to 36 V db 5, 6 94 Post Irradiation 4 90 Input Current IIN V SENSE = 0 V, +V S = 3 V, A V = 25 V SENSE = 0 V, +V S = 0 V 1, 2, µa Input offset current I IO V SENSE = 0 V, +V S = 3 V, A V = 25 V SENSE = 0 V, +V S = 0 V 1, 2, µa See footnotes at end of table. 5

6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55 C T C +125 C unless otherwise specified Group A subgroups Device type Min Limits Max Unit Supply current I CC V SENSE = 0 V, +V S = 3 V, +V = 36 V 1, 2, µa Minimum output voltage Output high (Referred to V+) V OMIN V SENSE = 0 V, +V S = 44 V, +V = 36 V V O V SENSE = 120 V, A V = 100, R OUT = 10 K 1, 2, mv 1, 2, V 1/ Post irradiation testing shall be in accordance with herein. 2/ This device has been high dose rate tested using condition A of Method 1019 of MIL-STD-883 to 100 krads(si) to ensure RHA designator level R. A representative device will be re-tested after design or process changes that may affect the RHA response of the device. 3/ This device may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in condition A of method 1019 of MIL-STD

7 Case outline X. FIGURE 1. Case outlines 7

8 Case outline X Continued. Symbol Millimeters Inches Min Max Min Max A b c D D E E e 1.27 TYP.050 TYP L Q S REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline X weight: 0.36 grams typical. FIGURE 1. Case outlines Continued. 8

9 Case outline Y. FIGURE 1. Case outlines Continued. 9

10 Case outline Y Continued. Symbol Millimeters Inches Min Max Min Max A b c c1 See note 4 See note 4 D D E , E e 1.27 TYP.050 TYP L L S REF.028 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline Y weight: 0.3 grams typical. 4. The bottom of the lead shall be within ±.005 to the base of the package. FIGURE 1. Case outlines Continued. 10

11 Device type 01 Case outlines X, Y Terminal number Terminal symbol IN V+ NC V- NC NC V OUT NC NC +IN FIGURE 2. Terminal connections. 11

12 TABLE II. Electrical test requirements. MIL-PRF test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters --- Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters End-point electrical parameters for radiation hardness assurance (RHA) devices 1, 2, 3, 4, 5, 6 1, 4 * PDA applies to subgroup VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) T C = +125 C minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Radiography test, method 2012 of MIL-STD-883. (1) Per method 2012 of MIL-STD-883, 100 percent screening will be performed on Class H product. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF and as specified herein Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 shall be omitted Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF

13 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) T C = +125 C minimum. (3) Test duration: 1,000 hours minimum as specified in 1005 of MIL-STD Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF Radiation Hardness Assurance (RHA). RHA qualification is required for those devices with the RHA designator as specified herein. See table IIIA and IIIB. RHA method Employed Testing at rated total dose of 100 krads(si) Element Level Hybrid Device Level Table IIIA. Radiation Hardness Assurance Methods Table. Includes temperature effects Worst Case Analysis Not Performed Combines temperature and radiation effects Combines total dose and displacement effects End point electrical tests after total dose End-of-life Element Level Hybrid device level 1X 1/ 1X No No No No T C = +25ºC T C = +25ºC 1/ Testing is done at the element level, since there is only one active element in the device. See Table IIIB. Hybrid level and element level test table. M.S. Kennedy Radiation Test SMD Total Dose Neutron Low Dose ELDRS Rate Characterization Damage Displacement (DD) Hybrid Level Testing High Dose Rate (HDR) Not Tested Tested (100 krads) No Tested (1 MeV equivalent neutrons) Element Level Testing Bipolar Linear or Mixed Signal Not Tested X 1/ (hybrid level test) No Tested (hybrid level test) 1/ Testing is done at the element level, since there is only one active element in the device. See

14 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime -VQ) approved plan and with MIL-PRF-38534, Appendix G. a. The hybrid device manufacturer shall establish procedures controlling element radiation testing, and shall establish radiation test plans used to implement element lot qualification during procurement. Test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. b. The hybrid device manufacturer shall oversee element lot qualification, and monitor design changes for continued compliance to RHA requirements Hybrid level radiation qualification Qualification by similarity. Qualification by similarity is not applicable to this SMD Total ionizing dose characterization testing. A representative device is characterized and tested, initially and after any design or process changes which may affect the RHA response. Devices are tested at High Dose Rate (HDR) in accordance with condition A of method 1019 of MIL-STD-883 to 100 krads(si). A minimum of 8 devices (4 biased and 4 unbiased) shall be tested /90% statistics are applied to the device parameter degradations, which are compared against Table I Neutron testing. A representative device is characterized and tested initially, and after design or process changes that may affect the RHA response. The device is tested in accordance with Method 1017 of MIL-STD-883. Five samples shall be tested. The end point electrical values of the five samples will be compared to the limits specified in table I herein, or the corresponding SMD Element level radiation qualification. Elements are tested at the hybrid level since this device contains only one active element Radiation lot acceptance. Each wafer lot of active elements shall be evaluated for acceptance in accordance with the approved plan and MIL-PRF Appendix G Total Ionizing Dose. Every wafer lot of the active element will be RLAT (Radiation Lot Acceptance Testing) tested In accordance with Alternatively, active element manufacturer TID data from the wafer lot may be evaluated for acceptance per PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio , or telephone (614)

15 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML The vendors listed in MIL-HDBK-103 and QML have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have agreed to this drawing. 15

16 BULLETIN DATE: Approved sources of supply for SMD listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML during the next revisions. MIL-HDBK-103 and QML will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML DLA Land and Maritime maintains an online database of all current sources of supply at Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962R HXA 5962R HXC 5962R KXA 5962R KXC 5962R HYA 5962R HYC 5962R KYA 5962R KYC MSK 196HRH MSK 196HRH MSK 196KRH MSK 196KRH MSK 196HRHG MSK 196HRHG MSK 196KRHG MSK 196KRHG 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number Vendor name and address Anaren Microwave Inc. MSK products 6635 Kirkville Road East Syracuse, NY The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.