FERRITE CHIP BEADS SHAPE AND DIMENSIONS FEATURES APPLICATIONS ORDERING CODE CBY
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1 FEITE CHIP BEADS OPEAATING TEMP FEATUES Excellent solderability and high heat resistance for either reflow or wave soldering. No lead, ideal for SMT. Monotilithic inorganic material construction for high reliability. APPLICATIONS Computers and peripherals Communication equipments digital TV sets, VTS. ODEING CODE CBY 2129 A 121 T CBY Product Code Sharp Type Beads (L W T) (mm) Dimensions ( ) Material Code Packaging Style A Example T B Tape & eel Bulk SHAPE AND DIMENSIONS unit mm(inch) L W D T Part No. 155 (42) 1688 (63) 2129 (85) (126) L (.4.6) (.63.8) 2..2 (.79.8) (.126.8) W.5.15 (.2.6).8.2 (.31.8) (.47.8) (.63.8) T.5.15 (.2.6).8.2 (.31.8).9.2 (.31.8).9.2 (.35.8) D.25.1 (.1.4).3.2 (.1.8).5.3 (.2.12).5.3 (.2.12) 32
2 FEITE CHIP BEADS ELECTICAL CHAACTEISTICS 15 TYPE Part No. ( ) At 1MHz DC ( )Max Ir (ma)max CBY155A7 CBY155A19 ~11 12~ CBY155A %.2 3 CBY155A %.2 3 CBY155A6 6 25%.35 2 CBY155A %.5 15 CBY155A %.5 15 CBY155A % CBY155A %.7 15 CBY155A %.8 1 CBY155A % CBY155A % CBY155A % TYPE Part No. CBY1688A7 CBY1688A11 CBY1688A26 CBY1688A31 CBY1688A5 CBY1688A7 CBY1688A8 CBY1688A11 CBY1688A121 CBY1688A151 CBY1688A181 CBY1688A221 CBY1688A31 CBY1688A51 CBY1688A61 CBY1688A81 CBY1688A12 CBY1688A122 ( ) At 1MHz ~11 7~ % 31 25% 5 25% 7 25% 8 25% 1 25% 12 25% 15 25% 18 25% 22 25% 3 25% 5 25% 6 25% 8 25% 1 25% 12 25% DC ( )Max Ir (ma)max
3 212 TYPE Part No. ( ) At 1MHz DC ( )Max Ir (ma)max CBY2129A11 CBY2129A19 CBY2129A26 CBY2129A31 CBY2129A5 CBY2129A6 CBY2129A8 CBY2129A121 CBY2129A151 CBY2129A181 CBY2129A221 CBY2129A31 CBY2129A51 CBY2129A61 CBY2129A81 CBY2129A12 CBY2129A122 CBY2129A152 7~15 12~ % 31 25% 5 25% 6 25% 8 25% 12 25% 15 25% 18 25% 22 25% 3 25% 5 25% 6 25% 8 25% 1 25% 12 25% 15 25% TYPE Part No. ( ) At 1MHz DC ( )Max Ir (ma)max CBY32169A19 12~ CBY32169A %.1 5 CBY32169A %.1 5 CBY32169A7 7 25%.2 4 CBY32169A8 8 25%.2 4 CBY32169A %.2 4 CBY32169A %.2 4 CBY32169A %.2 4 CBY32169A %.2 4 CBY32169A %.25 4 CBY32169A %.3 3 CBY32169A %.3 3 CBY32169A %.4 3 CBY32169A %.4 3 CBY32169A %.6 1 CBY32169A %@5MHz
4 FEITE CHIP BEADS FEITE CHIP BEADS 168 SEIES 8 CBY1688A11T 1 CBY1688A26T 2 CBY1688A31T 3 CBY1688A5T [Ù] [Ù] [Ù] [Ù] CBY1688A7T 3 CBY1688A 8T 5 CBY1688A11T 5 CBY1688A121T [ ] Frequency[MH] Fequency (MHz) [Ù] [Ù] [Ù] CBY1688A151T Frequency[MH] CBY1688A221T Frequency[MH] [Ù] CBY1688A31T Frequency[M 1 1 Hz] 1 Frequency[MH] [Ù] CBY1688A51T CBY1688A61T 2 CBY1688A81T 25 CBY1688A12T 25 CBY1688A122T [Ù] [Ù] [Ù] [Ù]
5 FEITE CHIP BEADS 212 SEIES 6 CBY2129A11T 6 CBY2129A19T 12 CBY2129A26T 12 CBY2129A31T [Ù] [Ù] [Ù] [Ù] CBY2129A5T 3 CBY2129A6T 3 CBY2129A8T [Ù] [Ù] CBY2129A121T 6 CBY2129A151T 6 CBY2129A181T 8 CBY2129A21T [Ù] [Ù] [Ù] [Ù] CBY2129A31T 15 CBY2129A51T CBY2129A61T 2 CBY2129A 152T [ ] Fequency (MHz) [ ] Fequency (MHz) 2 12 [ ] Fequency Frequency[MH] (MHz) [Ù]
6 FEITE CHIP BEADS FEITE CHIP BEADS 3216 SEIES 1 CBY32169A19T 15 CBY32169A26T 2 CBY32169A31T 3 CBY32169A7T Fequency(MHz) Fequency(MHz) Frequency[MH] CBY32169A8T Frequency[MH] CBY32169A11T Frequency[MH] CBY32169A121T CBY32169A151T CBY32169A221T CBY32169A31T CBY32169A22T CBY32169A12T Frequency[MH] 37
7 ELIABILITY TESTING Type Item Specified value Test methods 1 Operating temperature range -4to Storage temperature range -1to+4 3 Solderability At least 9% of terminal electrode is covered by new solder Solder temperature: 23 5 Duration: 4 1S Preheating temperature: 12 to 15 Preheating time: 6S immersion into the colophony flux for 3 to 5 sec. Flux: immersion into methanol solution with colophony for3to5sec. Immersion speed: 25mm/sec Solder temperature: esistance to soldering At least 75% of terminal electrode is covered by new solder change: within 2% Inductor change: within 1% Duration: 1.5S Preheating temperature: 12 to 15 Preheating time: 6S immersion into the colophony flux for 3 to 5 sec. Flux: immersion into methanol solution with colophony for3to5sec. Immersion speed: 25mm/sec 5 Thermal shock change: within 3% Inductor change: within 1% Q value change(ferrite):within 3% Q value change(ceramic):within 2% Temperature: -4 for 3 3min +85 for 3 3min Transforming interval :max 2 sec Number of cycles: 32 6 Loading at low temperature change: within 2% Inductor change: within 1% Temperature: Duration: 5 hrs 7 Loading at high temperature change: within 3% Inductor change: within 1% Q value change(ferrite):within 3% Q value change(ceramic):within 2% Temperature: Duration: 1 hrs Applied current: ated current 8 Loading under Damp Heat change: within 3% Inductor change : within 1% Q value change(ferrite):within 3% Q value change(ceramic):within 2% Temperature: Duration: 5 hrs Humidity: 9 to 95%H Applied current: ated current 64
8 ELIABILITY TESTING Type Item Specified value Test methods 9 Vibration change: within 3% Inductor change: within 1% Q value change(ferrite):within 3% Q value change(ceramic):within 2% Amplitude:1.5mm Directions:2hrs each in Y direction Frequency range 1 to 55to 1Hz(min) Aookued firce:5n force for 15 and 168 series. 1N force for series. Keep time 1 1S Applied force: 5N force for 15 and 168 series. 1N force for series. 1 Adhesion of electrode The termination and body should be no damage Keep time 1 1S 11 esistance to pressure of substrate The body shall not be damaged by forces applied on the right. d w Note: When there are questions concerning, measurement shall be made after 24 standard condition. 2hrs of recovery under the 65
9 PACKAGING (VHF CMI CBG CBW CBH CBY CBA CBM SEIES) STANDAE QUANTITY Type Quantity(pcs) TAPING DAWINGS TAPING DIMENSIONS (UNIT: mm) Paper tape A B F T max max max max Embossed tape 66
10 PACKAGING / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / /-.1 K 4.+/ / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / / /-.1 EEL DIMENSIONS(UNIT:mm) A B C N G CF CF LEADE AND BLANK POTION PEELING OFF FOCE :.5 to.7n in the direction show below. 67
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ITEM :CHIP FERRITE BEADS APPROVAL SHEET CHIP FERRITE BEADS CUSTOMER : DATE :
ITEM :CHIP FEITE BEADS ESTABLISHMENT 27. 3. 24 APPOVED EVISION 29. 4. 19 Series NO:B94192 APPOVAL SHEET CHIP FEITE BEADS CUSTOME : DATE : You can reapprove only the changed quality request recorded in
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