Nuclear reliability: system reliabilty

Size: px
Start display at page:

Download "Nuclear reliability: system reliabilty"

Transcription

1 Nuclear reliability: system reliabilty Dr. Richard E. Turner December 3, 203

2 Goal of these two lectures failures are inevitable: need methods for characterising and quantifying them LAST TIME: characterising component failures (fine level of granularity) TODAY: characterising system failures (coarse level of granularity) COURSE TEXT BOOK: Reliability and Risk Assessment, Andrews and Moss. Chapters 5 8.

3 Last time Three definitions of availability, key measures suitable for evaluating different systems (continuous/on demand) for different objectives (safety/productivity) Focused on continuously operational repairable systems: availability: A(t) = probability component works at time t unavailability: Q(t) = A(t) = probability does not work at time t reliability: R(t, t ) = probability work continuously between t & t unreliability: F (t, t ) = R(t, t ) probability fail somewhen between t & t Related properties of the Markov chain (easy to measure) to availability/reliability (important to know/predict/estimate) Today: relating system unavailability/unreliability/etc. to component unavailability/unreliability/etc.

4 Fault trees W water tank pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pipe P P2 pipe 2 P N T pump nozzle

5 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pipe P P2 pipe 2 P N T pump nozzle

6 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 T: failure of system on demand P N T pump nozzle

7 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 P N T T: failure of system on demand pump nozzle to nozzle from nozzle N

8 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 P N T T: failure of system on demand pump nozzle to nozzle from nozzle N to pump pump fails to start P

9 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 P N T T: failure of system on demand pump nozzle to nozzle from nozzle N to pump pump fails to start P from pipe from pipe 2

10 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 P N T T: failure of system on demand pump nozzle to nozzle from nozzle N from pipe to pump pump fails to start P from pipe from pipe 2 2

11 Fault trees W water tank reliablity = pressure vessel pressure vessel cooling system: normal ) temperature of pressure vessel > threshold 2) water drawn down two pipes to pump 3) pump sends water to nozzle 4) nozzle sprays pressure vessel to cool it pressure vessel cooling system: fault tree pipe P P2 pipe 2 P N T T: failure of system on demand pump nozzle to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

12 Fault trees Tips for fault tree construction: - external boundary - limit of resolution (internal boundary) - clear definition of events pressure vessel cooling system: fault tree T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

13 Fault trees Desire: top event probability p(t) in terms of event probabilities: p(w) p(p) p(p2) p(p) p(n) top event probability gives system: unavailability/unreliability/failure rate/etc. Key step: determine the necessary and sufficient causes for top failuer event to occur Tips for fault tree construction: - external boundary - limit of resolution (internal boundary) - clear definition of events pressure vessel cooling system: fault tree T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

14 Boolean representation of fault trees

15 Boolean representation of fault trees addition-like

16 Boolean representation of fault trees addition-like

17 Boolean representation of fault trees addition-like commutative

18 Boolean representation of fault trees addition-like commutative

19 Boolean representation of fault trees addition-like commutative

20 Boolean representation of fault trees addition-like commutative associative

21 Boolean representation of fault trees addition-like commutative associative

22 Boolean representation of fault trees addition-like commutative associative multiplication-like

23 Boolean representation of fault trees addition-like commutative associative multiplication-like

24 Boolean representation of fault trees addition-like commutative associative multiplication-like commutative

25 Boolean representation of fault trees addition-like commutative associative multiplication-like commutative

26 Boolean representation of fault trees addition-like commutative associative multiplication-like commutative

27 Boolean representation of fault trees addition-like commutative associative multiplication-like commutative associative

28 Question

29 Question

30 Question

31 Question

32 Question

33 Question

34 Question / gates distributive too

35 Other logic gates and symbols exclusive K-out-of-N x K K = NOT transfer symbol basic event top event or event description

36 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

37 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

38 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

39 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

40 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

41 Simplifying fault trees using Boolean logic T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

42 Simplifying fault trees using Boolean logic absorption law T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

43 Simplifying fault trees using Boolean logic absorption law T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

44 Simplifying fault trees using Boolean logic absorption law T: failure of system on demand to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

45 Simplifying fault trees using Boolean logic absorption law T: failure of system on demand if any one of these sets of events occurs the top event will also occur minimal cutsets to nozzle from nozzle N from pipe pipe blocked in tank to pump pump fails to start from pipe from pipe 2 P P W 2

46 Definition of a minimal cutset cutset: collection of basic events that result in top event occurring e.g. if T = N + P + W + P.P 2 = K = N.P and K = W.P are cutsets minimal cutset: necessary and sufficient cutset T = K + K K N K i = X.X X Li e.g. if T = N + P + W + P.P 2 = K = N, K 2 = P, K 3 = W, K 4 = P.P 2 for independent events, most of probability mass will be on low order cutsets pathset: set of basic events that result in top event not occurring computer programs (e.g. MOCUS) can be used to find cutsets efficiently

47 Calculating top event probability in terms of cutset probability

48 Calculating top event probability in terms of cutset probability

49 Calculating top event probability in terms of cutset probability 0

50 Calculating top event probability in terms of cutset probability

51 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion

52 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion Example: cooling system

53 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion Example: cooling system

54 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion Example: cooling system

55 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion Example: cooling system

56 Calculating top event probability in terms of cutset probability Inclusion-exclusion expansion Example: cooling system

57 The need for approximations Number of terms in an inclusion-exclusion expansion is if impossible (even for a computer) to enumerate need methods for approximating the top event probability first consider systems with independent events Inclusion-exclusion expansion Example: cooling system

58 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion Inclusion-exclusion expansion Example: cooling system

59 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion Inclusion-exclusion expansion Example: cooling system

60 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion Inclusion-exclusion expansion Example: cooling system

61 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion Inclusion-exclusion expansion Example: cooling system

62 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion Inclusion-exclusion expansion Example: cooling system

63 Upper and lower bounds plot successive terms in the inclusion-exclusion expansion progressively tighter lower/upper bounds on (if independent) Inclusion-exclusion expansion Example: cooling system

64 Upper and lower bounds = rare event upper bound (holds for dependent events too) plot successive terms in the inclusion-exclusion expansion progressively tighter lower/upper bounds on (if independent) Inclusion-exclusion expansion Example: cooling system

65 A tighter upper bound: minimal cutset upper bound P (T ) = P (at least one minimal cutset occurs) = P (no minimal cutsets occur) Now bound P (no minimal cutsets occur): P (no minimal cutsets occur) N P (minimal cutset n does not occur) n= Equality when a) events independent and b) no event occurs in more than one cutset. Using this to bound P (T ): N N P (T ) P (minimal cutset n does not occur) = ( P (K n )) n= n= E.g. for two cutsets P (T ) ( P (K ))( P (K 2 )) = P (K ) + P (K 2 ) P (K )P (K 2 ) P (K ) + P (K 2 ) Generally: N N P (T ) ( P (K n )) P (K n ) n= n= P (T ) minimal cutset upper bound rare event upper bound

66 A tighter upper bound: minimal cutset upper bound P (T ) = P (at least one minimal cutset occurs) = P (no minimal cutsets occur) Now bound P (no minimal cutsets occur): P (no minimal cutsets occur) N P (minimal cutset n does not occur) n= Equality when a) events independent and b) no event occurs in more than one cutset. Using this to bound P (T ): N N P (T ) P (minimal cutset n does not occur) = ( P (K n )) n= n= E.g. for two cutsets P (T ) ( P (K ))( P (K 2 )) = P (K ) + P (K 2 ) P (K )P (K 2 ) P (K ) + P (K 2 ) Generally: N N P (T ) ( P (K n )) P (K n ) n= n= P (T ) minimal cutset upper bound rare event upper bound

67 A tighter upper bound: minimal cutset upper bound P (T ) = P (at least one minimal cutset occurs) = P (no minimal cutsets occur) Now bound P (no minimal cutsets occur): P (no minimal cutsets occur) N P (minimal cutset n does not occur) n= Equality when a) events independent and b) no event occurs in more than one cutset. Using this to bound P (T ): N N P (T ) P (minimal cutset n does not occur) = ( P (K n )) n= n= E.g. for two cutsets P (T ) ( P (K ))( P (K 2 )) = P (K ) + P (K 2 ) P (K )P (K 2 ) P (K ) + P (K 2 ) Generally: N N P (T ) ( P (K n )) P (K n ) n= n= P (T ) minimal cutset upper bound rare event upper bound

68 A tighter upper bound: minimal cutset upper bound P (T ) = P (at least one minimal cutset occurs) = P (no minimal cutsets occur) Now bound P (no minimal cutsets occur): P (no minimal cutsets occur) N P (minimal cutset n does not occur) n= Equality when a) events independent and b) no event occurs in more than one cutset. Using this to bound P (T ): N N P (T ) P (minimal cutset n does not occur) = ( P (K n )) n= n= E.g. for two cutsets P (T ) ( P (K ))( P (K 2 )) = P (K ) + P (K 2 ) P (K )P (K 2 ) P (K ) + P (K 2 ) Generally: N N P (T ) ( P (K n )) P (K n ) n= n= P (T ) minimal cutset upper bound rare event upper bound

69 A tighter upper bound: minimal cutset upper bound P (T ) = P (at least one minimal cutset occurs) = P (no minimal cutsets occur) Now bound P (no minimal cutsets occur): P (no minimal cutsets occur) N P (minimal cutset n does not occur) n= Equality when a) events independent and b) no event occurs in more than one cutset. Using this to bound P (T ): N N P (T ) P (minimal cutset n does not occur) = ( P (K n )) n= n= E.g. for two cutsets P (T ) ( P (K ))( P (K 2 )) = P (K ) + P (K 2 ) P (K )P (K 2 ) P (K ) + P (K 2 ) Generally: N N P (T ) ( P (K n )) P (K n ) n= n= P (T ) minimal cutset upper bound rare event upper bound

70 Independent events in fault trees: example bounds

71 Independent events in fault trees: example bounds rare event

72 Independent events in fault trees: example bounds rare event minimal cutset = ground truth (indep./non-repeated)

73 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode

74 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode idea: introduce a repreat common cause event ( ) that captures the dependencies

75 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode idea: introduce a repreat common cause event ( ) that captures the dependencies

76 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode idea: introduce a repreat common cause event ( ) that captures the dependencies

77 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode idea: introduce a repreat common cause event ( ) that captures the dependencies rare event ground truth:

78 Dependent events in fault trees: common cause failures rare event minimal cutset = ground truth (indep./non-repeated) the two pipes ( and ) have a common failure mode idea: introduce a repreat common cause event ( ) that captures the dependencies rare event ground truth: minimal cutset = / ground truth (repeated events)

79 Summary fault trees describe system failure in terms of components and logic gates fault trees can be simplified by computer algorithms that traverse the tree and simplify the logic e.g. using the adsorption law cutsets can be identified which are collections of failures that result in a system failure availability (and other measures) can be computed from minimal cutsets in real systems bounds are the best we can hope for dependent component failures can be captured using shared repeated events

Risk Analysis of Highly-integrated Systems

Risk Analysis of Highly-integrated Systems Risk Analysis of Highly-integrated Systems RA II: Methods (FTA, ETA) Fault Tree Analysis (FTA) Problem description It is not possible to analyse complicated, highly-reliable or novel systems as black box

More information

EE 445 / 850: Final Examination

EE 445 / 850: Final Examination EE 445 / 850: Final Examination Date and Time: 3 Dec 0, PM Room: HLTH B6 Exam Duration: 3 hours One formula sheet permitted. - Covers chapters - 5 problems each carrying 0 marks - Must show all calculations

More information

RISK-INFORMED OPERATIONAL DECISION MANAGEMENT (RIODM): RISK, EVENT TREES AND FAULT TREES

RISK-INFORMED OPERATIONAL DECISION MANAGEMENT (RIODM): RISK, EVENT TREES AND FAULT TREES 22.38 PROBABILITY AND ITS APPLICATIONS TO RELIABILITY, QUALITY CONTROL AND RISK ASSESSMENT Fall 2005, Lecture 1 RISK-INFORMED OPERATIONAL DECISION MANAGEMENT (RIODM): RISK, EVENT TREES AND FAULT TREES

More information

Lecture 5 Probability

Lecture 5 Probability Lecture 5 Probability Dr. V.G. Snell Nuclear Reactor Safety Course McMaster University vgs 1 Probability Basic Ideas P(A)/probability of event A 'lim n64 ( x n ) (1) (Axiom #1) 0 # P(A) #1 (1) (Axiom #2):

More information

Chapter 18 Section 8.5 Fault Trees Analysis (FTA) Don t get caught out on a limb of your fault tree.

Chapter 18 Section 8.5 Fault Trees Analysis (FTA) Don t get caught out on a limb of your fault tree. Chapter 18 Section 8.5 Fault Trees Analysis (FTA) Don t get caught out on a limb of your fault tree. C. Ebeling, Intro to Reliability & Maintainability Engineering, 2 nd ed. Waveland Press, Inc. Copyright

More information

12 - The Tie Set Method

12 - The Tie Set Method 12 - The Tie Set Method Definitions: A tie set V is a set of components whose success results in system success, i.e. the presence of all components in any tie set connects the input to the output in the

More information

BOOLEAN ALGEBRA INTRODUCTION SUBSETS

BOOLEAN ALGEBRA INTRODUCTION SUBSETS BOOLEAN ALGEBRA M. Ragheb 1/294/2018 INTRODUCTION Modern algebra is centered around the concept of an algebraic system: A, consisting of a set of elements: ai, i=1, 2,, which are combined by a set of operations

More information

System Reliability Analysis. CS6323 Networks and Systems

System Reliability Analysis. CS6323 Networks and Systems System Reliability Analysis CS6323 Networks and Systems Topics Combinatorial Models for reliability Topology-based (structured) methods for Series Systems Parallel Systems Reliability analysis for arbitrary

More information

Boolean algebra. Examples of these individual laws of Boolean, rules and theorems for Boolean algebra are given in the following table.

Boolean algebra. Examples of these individual laws of Boolean, rules and theorems for Boolean algebra are given in the following table. The Laws of Boolean Boolean algebra As well as the logic symbols 0 and 1 being used to represent a digital input or output, we can also use them as constants for a permanently Open or Closed circuit or

More information

Causal & Frequency Analysis

Causal & Frequency Analysis Causal & Frequency Analysis Arshad Ahmad arshad@utm.my Fishbone Diagram 2 The Cause and Effect (CE) Diagram (Ishikawa Fishbone) Created in 1943 by Professor Kaoru Ishikawa of Tokyo University Used to investigate

More information

PROBABILISTIC AND POSSIBILISTIC FAULT TREE ANALYSIS

PROBABILISTIC AND POSSIBILISTIC FAULT TREE ANALYSIS PROBABILISTIC AD POSSIBILISTIC FAULT TREE AALYSIS M. Ragheb 12/28/2017 ITRODUCTIO In the design of nuclear power plants, it is important to analyze the probable and possible mechanisms of failure. Fault

More information

Discrete Mathematics. CS204: Spring, Jong C. Park Computer Science Department KAIST

Discrete Mathematics. CS204: Spring, Jong C. Park Computer Science Department KAIST Discrete Mathematics CS204: Spring, 2008 Jong C. Park Computer Science Department KAIST Today s Topics Combinatorial Circuits Properties of Combinatorial Circuits Boolean Algebras Boolean Functions and

More information

Analysis methods for fault trees that contain secondary failures

Analysis methods for fault trees that contain secondary failures Loughborough University Institutional Repository Analysis methods for fault trees that contain secondary failures This item was submitted to Loughborough University's Institutional Repository by the/an

More information

Failures in Process Industries

Failures in Process Industries Fault Tree Analysis Failures in Process Industries Single Component Failure Data for failure rates are compiled by industry Single component or single action Multiple Component Failure Failures resulting

More information

Assessing system reliability through binary decision diagrams using bayesian techniques.

Assessing system reliability through binary decision diagrams using bayesian techniques. Loughborough University Institutional Repository Assessing system reliability through binary decision diagrams using bayesian techniques. This item was submitted to Loughborough University's Institutional

More information

of an algorithm for automated cause-consequence diagram construction.

of an algorithm for automated cause-consequence diagram construction. Loughborough University Institutional Repository Development of an algorithm for automated cause-consequence diagram construction. This item was submitted to Loughborough University's Institutional Repository

More information

Reliability of Technical Systems

Reliability of Technical Systems Reliability of Technical Systems Main Topics 1. Short Introduction, Reliability Parameters: Failure Rate, Failure Probability, etc. 2. Some Important Reliability Distributions 3. Component Reliability

More information

A ternary decision diagram method to calculate the component contributions to the failure of systems undergoing phased missions

A ternary decision diagram method to calculate the component contributions to the failure of systems undergoing phased missions 73 A ternary decision diagram method to calculate the component contributions to the failure of systems undergoing phased missions J D Andrews Department of Aeronautical and Automotive Engineering, Loughborough

More information

Markov Reliability and Availability Analysis. Markov Processes

Markov Reliability and Availability Analysis. Markov Processes Markov Reliability and Availability Analysis Firma convenzione Politecnico Part II: Continuous di Milano e Time Veneranda Discrete Fabbrica State del Duomo di Milano Markov Processes Aula Magna Rettorato

More information

Quantitative Reliability Analysis

Quantitative Reliability Analysis Quantitative Reliability Analysis Moosung Jae May 4, 2015 System Reliability Analysis System reliability analysis is conducted in terms of probabilities The probabilities of events can be modelled as logical

More information

Compound Propositions

Compound Propositions Discrete Structures Compound Propositions Producing new propositions from existing propositions. Logical Operators or Connectives 1. Not 2. And 3. Or 4. Exclusive or 5. Implication 6. Biconditional Truth

More information

Monte Carlo Simulation for Reliability and Availability analyses

Monte Carlo Simulation for Reliability and Availability analyses Monte Carlo Simulation for Reliability and Availability analyses Monte Carlo Simulation: Why? 2 Computation of system reliability and availability for industrial systems characterized by: many components

More information

PSA Quantification. Analysis of Results. Workshop Information IAEA Workshop

PSA Quantification. Analysis of Results. Workshop Information IAEA Workshop IAEA Training Course on Safety Assessment of NPPs to Assist Decision Making PSA Quantification. Analysis of Results Lecturer Lesson Lesson IV IV 3_7.3 3_7.3 Workshop Information IAEA Workshop City, XX

More information

Chapter 5. System Reliability and Reliability Prediction.

Chapter 5. System Reliability and Reliability Prediction. Chapter 5. System Reliability and Reliability Prediction. Problems & Solutions. Problem 1. Estimate the individual part failure rate given a base failure rate of 0.0333 failure/hour, a quality factor of

More information

Safety and Reliability of Embedded Systems

Safety and Reliability of Embedded Systems (Sicherheit und Zuverlässigkeit eingebetteter Systeme) Fault Tree Analysis Mathematical Background and Algorithms Prof. Dr. Liggesmeyer, 0 Content Definitions of Terms Introduction to Combinatorics General

More information

Engineering Risk Benefit Analysis

Engineering Risk Benefit Analysis Engineering Risk Benefit Analysis 1.155, 2.943, 3.577, 6.938, 10.816, 13.621, 16.862, 22.82, ESD.72, ESD.721 RPRA 3. Probability Distributions in RPRA George E. Apostolakis Massachusetts Institute of Technology

More information

On Qualitative Analysis of Fault Trees Using Structurally Persistent Nets

On Qualitative Analysis of Fault Trees Using Structurally Persistent Nets On Qualitative Analysis of Fault Trees Using Structurally Persistent Nets Ricardo J. Rodríguez rj.rodriguez@unileon.es Research Institute of Applied Sciences in Cybersecurity University of León, Spain

More information

CprE 281: Digital Logic

CprE 281: Digital Logic CprE 281: Digital Logic Instructor: Alexander Stoytchev http://www.ece.iastate.edu/~alexs/classes/ Boolean Algebra CprE 281: Digital Logic Iowa State University, Ames, IA Copyright Alexander Stoytchev

More information

CS 226: Digital Logic Design

CS 226: Digital Logic Design CS 226: Digital Logic Design 0 1 1 I S 0 1 0 S Department of Computer Science and Engineering, Indian Institute of Technology Bombay. 1 of 29 Objectives In this lecture we will introduce: 1. Logic functions

More information

Mean fault time for estimation of average probability of failure on demand.

Mean fault time for estimation of average probability of failure on demand. Mean fault time for estimation of average probability of failure on demand. Isshi KOYATA a *, Koichi SUYAMA b, and Yoshinobu SATO c a The University of Marine Science and Technology Doctoral Course, Course

More information

Engineering Risk Benefit Analysis

Engineering Risk Benefit Analysis Engineering Risk enefit nalysis.55, 2.943, 3.577, 6.938, 0.86, 3.62, 6.862, 22.82 ESD.72J, ESD.72 RPR. The Logic of ertainty George E. postolakis Massachusetts Institute of Technology Spring 2007 RPR.

More information

NAND, NOR and XOR functions properties

NAND, NOR and XOR functions properties Laboratory NAND, NOR and XOR functions properties. Laboratory work goals Enumeration of NAND, NOR and XOR functions properties Presentation of NAND, NOR and XOR modules Realisation of circuits with gates

More information

Modeling Common Cause Failures in Diverse Components with Fault Tree Applications

Modeling Common Cause Failures in Diverse Components with Fault Tree Applications Modeling Common Cause Failures in Diverse s with Fault Tree Applications Joseph R. Belland, Isograph Inc. Key Words: Common Cause Failures, Fault Trees, Beta Factor SUMMARY & CONCLUSIONS A common cause

More information

Application of Common Cause Failure Methodology to Aviation Safety Assessment Model

Application of Common Cause Failure Methodology to Aviation Safety Assessment Model Application of Common Cause Failure Methodology to Aviation Safety Assessment Model Seungwon Noh Systems Engineering and Operations Research George Mason University Fairfax, VA, USA snoh2@gmu.edu Abstract

More information

Reliable Computing I

Reliable Computing I Instructor: Mehdi Tahoori Reliable Computing I Lecture 5: Reliability Evaluation INSTITUTE OF COMPUTER ENGINEERING (ITEC) CHAIR FOR DEPENDABLE NANO COMPUTING (CDNC) National Research Center of the Helmholtz

More information

Anew index of component importance

Anew index of component importance Operations Research Letters 28 (2001) 75 79 www.elsevier.com/locate/dsw Anew index of component importance F.K. Hwang 1 Department of Applied Mathematics, National Chiao-Tung University, Hsin-Chu, Taiwan

More information

Building a Computer Adder

Building a Computer Adder Logic Gates are used to translate Boolean logic into circuits. In the abstract it is clear that we can build AND gates that perform the AND function and OR gates that perform the OR function and so on.

More information

Part I: Propositional Calculus

Part I: Propositional Calculus Logic Part I: Propositional Calculus Statements Undefined Terms True, T, #t, 1 False, F, #f, 0 Statement, Proposition Statement/Proposition -- Informal Definition Statement = anything that can meaningfully

More information

Reliability of sequential systems using the causeconsequence diagram method

Reliability of sequential systems using the causeconsequence diagram method Loughborough University Institutional Repository Reliability of sequential systems using the causeconsequence diagram method This item was submitted to Loughborough University's Institutional Repository

More information

Chapter 2 Combinational Logic Circuits

Chapter 2 Combinational Logic Circuits Logic and Computer Design Fundamentals Chapter 2 Combinational Logic Circuits Part 1 Gate Circuits and Boolean Equations Chapter 2 - Part 1 2 Chapter 2 - Part 1 3 Chapter 2 - Part 1 4 Chapter 2 - Part

More information

RELIABILITY ANALYSIS OF PISTON MANUFACTURING SYSTEM

RELIABILITY ANALYSIS OF PISTON MANUFACTURING SYSTEM Journal of Reliability and Statistical Studies; ISSN (Print): 0974-8024, (Online):2229-5666 Vol. 4, Issue 2 (2011): 43-55 RELIABILITY ANALYSIS OF PISTON MANUFACTURING SYSTEM Amit Kumar and Sneh Lata School

More information

Reliability Evaluation of Engineering Systems:

Reliability Evaluation of Engineering Systems: Reliability Evaluation of Engineering Systems: Concepts and Techniques Roy Billinton PhD, DSc, FEIC, FRSC, FIEEE, PE c. J. MacKenzie Professor of Electrical Engineering University of Saskatchewan and Ronald

More information

Reliability Analysis of Hydraulic Steering System with DICLFL Considering Shutdown Correlation Based on GO Methodology

Reliability Analysis of Hydraulic Steering System with DICLFL Considering Shutdown Correlation Based on GO Methodology 2015 ICRSE&PHM-Beijing Reliability Analysis of Hydraulic Steering System with DICLFL Considering Shutdown Correlation Based on GO Methodology YI Xiaojian, SHI Jian, MU Huina, DONG Haiping, GUO Shaowei

More information

EEE130 Digital Electronics I Lecture #4

EEE130 Digital Electronics I Lecture #4 EEE130 Digital Electronics I Lecture #4 - Boolean Algebra and Logic Simplification - By Dr. Shahrel A. Suandi Topics to be discussed 4-1 Boolean Operations and Expressions 4-2 Laws and Rules of Boolean

More information

CSE 20 DISCRETE MATH. Fall

CSE 20 DISCRETE MATH. Fall CSE 20 DISCRETE MATH Fall 2017 http://cseweb.ucsd.edu/classes/fa17/cse20-ab/ Today's learning goals Describe and use algorithms for integer operations based on their expansions Relate algorithms for integer

More information

Presentation of Common Cause Failures in Fault Tree Structure of Krško PSA: An Historical Overview

Presentation of Common Cause Failures in Fault Tree Structure of Krško PSA: An Historical Overview International Conference Nuclear Energy for New Europe 2003 Portorož, Slovenia, September 8-11, 2003 http://www.drustvo-js.si/port2003 Presentation of Common Cause Failures in Fault Tree Structure of Krško

More information

Combinational Logic Design Combinational Functions and Circuits

Combinational Logic Design Combinational Functions and Circuits Combinational Logic Design Combinational Functions and Circuits Overview Combinational Circuits Design Procedure Generic Example Example with don t cares: BCD-to-SevenSegment converter Binary Decoders

More information

AP1000 European 19. Probabilistic Risk Assessment Design Control Document

AP1000 European 19. Probabilistic Risk Assessment Design Control Document 19.15 Chemical and Volume Control System 19.15.1 System Description See subsection 9.3.6.2. 19.15.2 System Operation See subsection 9.3.6.4. 19.15.3 Performance during Accident Conditions See subsection

More information

Terminology and Concepts

Terminology and Concepts Terminology and Concepts Prof. Naga Kandasamy 1 Goals of Fault Tolerance Dependability is an umbrella term encompassing the concepts of reliability, availability, performability, safety, and testability.

More information

DIGITAL CIRCUIT LOGIC BOOLEAN ALGEBRA

DIGITAL CIRCUIT LOGIC BOOLEAN ALGEBRA DIGITAL CIRCUIT LOGIC BOOLEAN ALGEBRA 1 Learning Objectives Understand the basic operations and laws of Boolean algebra. Relate these operations and laws to circuits composed of AND gates, OR gates, INVERTERS

More information

Application of the Cause-Consequence Diagram Method to Static Systems

Application of the Cause-Consequence Diagram Method to Static Systems Application of the ause-onsequence Diagram Method to Static Systems L.M.Ridley and J.D.Andrews Department of Mathematical Sciences Loughborough University Loughborough Leicestershire LE11 3TU Keywords:

More information

Development of Multi-Unit Dependency Evaluation Model Using Markov Process and Monte Carlo Method

Development of Multi-Unit Dependency Evaluation Model Using Markov Process and Monte Carlo Method Development of Multi-Unit Dependency Evaluation Model Using Markov Process and Monte Carlo Method Sunghyon Jang, and Akira Yamaguchi Department of Nuclear Engineering and Management, The University of

More information

Systems reliability for phased missions

Systems reliability for phased missions Loughborough University Institutional Repository Systems reliability for phased missions This item was submitted to Loughborough University's Institutional Repository by the/an author. Additional Information:

More information

MODELLING DYNAMIC RELIABILITY VIA FLUID PETRI NETS

MODELLING DYNAMIC RELIABILITY VIA FLUID PETRI NETS MODELLING DYNAMIC RELIABILITY VIA FLUID PETRI NETS Daniele Codetta-Raiteri, Dipartimento di Informatica, Università di Torino, Italy Andrea Bobbio, Dipartimento di Informatica, Università del Piemonte

More information

A binary decision diagram method for phased mission analysis of non-repairable systems

A binary decision diagram method for phased mission analysis of non-repairable systems Loughborough University Institutional Repository binary decision diagram method for phased mission analysis of non-repairable systems This item was submitted to Loughborough University's Institutional

More information

Reliability of Technical Systems

Reliability of Technical Systems Reliability of Technical Systems Main Topics 1. Short Introduction, Reliability Parameters: Failure Rate, Failure Probability, etc. 2. Some Important Reliability Distributions 3. Component Reliability

More information

XOR - XNOR Gates. The graphic symbol and truth table of XOR gate is shown in the figure.

XOR - XNOR Gates. The graphic symbol and truth table of XOR gate is shown in the figure. XOR - XNOR Gates Lesson Objectives: In addition to AND, OR, NOT, NAND and NOR gates, exclusive-or (XOR) and exclusive-nor (XNOR) gates are also used in the design of digital circuits. These have special

More information

Discrete Structures & Algorithms. Propositional Logic EECE 320 // UBC

Discrete Structures & Algorithms. Propositional Logic EECE 320 // UBC Discrete Structures & Algorithms Propositional Logic EECE 320 // UBC 1 Review of last lecture Pancake sorting A problem with many applications Bracketing (bounding a function) Proving bounds for pancake

More information

Chapter 8. Calculation of PFD using FTA

Chapter 8. Calculation of PFD using FTA Chapter 8. Calculation of PFD using FTA Mary Ann Lundteigen Marvin Rausand RAMS Group Department of Mechanical and Industrial Engineering NTNU (Version 0.1) Lundteigen& Rausand Chapter 8.Calculation of

More information

22c:145 Artificial Intelligence

22c:145 Artificial Intelligence 22c:145 Artificial Intelligence Fall 2005 Propositional Logic Cesare Tinelli The University of Iowa Copyright 2001-05 Cesare Tinelli and Hantao Zhang. a a These notes are copyrighted material and may not

More information

Integrated Dynamic Decision Analysis: a method for PSA in dynamic process system

Integrated Dynamic Decision Analysis: a method for PSA in dynamic process system Integrated Dynamic Decision Analysis: a method for PSA in dynamic process system M. Demichela & N. Piccinini Centro Studi su Sicurezza Affidabilità e Rischi, Dipartimento di Scienza dei Materiali e Ingegneria

More information

Evaluating the Core Damage Frequency of a TRIGA Research Reactor Using Risk Assessment Tool Software

Evaluating the Core Damage Frequency of a TRIGA Research Reactor Using Risk Assessment Tool Software Evaluating the Core Damage Frequency of a TRIGA Research Reactor Using Risk Assessment Tool Software M. Nematollahi and Sh. Kamyab Abstract After all preventive and mitigative measures considered in the

More information

CprE 281: Digital Logic

CprE 281: Digital Logic CprE 28: Digital Logic Instructor: Alexander Stoytchev http://www.ece.iastate.edu/~alexs/classes/ Decoders and Encoders CprE 28: Digital Logic Iowa State University, Ames, IA Copyright Alexander Stoytchev

More information

Module No. # 03 Lecture No. # 11 Probabilistic risk analysis

Module No. # 03 Lecture No. # 11 Probabilistic risk analysis Health, Safety and Environmental Management in Petroleum and offshore Engineering Prof. Dr. Srinivasan Chandrasekaran Department of Ocean Engineering Indian Institute of Technology, Madras Module No. #

More information

ASTRA 3.0: LOGICAL AND PROBABILISTIC ANALYSIS METHODS

ASTRA 3.0: LOGICAL AND PROBABILISTIC ANALYSIS METHODS ASTRA 3.: LOGICAL AND PROBABILISTIC ANALYSIS METHODS Description of the main phases and algorithms of the fault tree analysis procedure implemented in ASTRA 3. Sergio Contini and Vaidas Matuzas EUR 2452

More information

Lab 1 starts this week: go to your session

Lab 1 starts this week: go to your session Lecture 3: Boolean Algebra Logistics Class email sign up Homework 1 due on Wednesday Lab 1 starts this week: go to your session Last lecture --- Numbers Binary numbers Base conversion Number systems for

More information

Time Dependent Analysis with Common Cause Failure Events in RiskSpectrum

Time Dependent Analysis with Common Cause Failure Events in RiskSpectrum Time Dependent Analysis with Common Cause Failure Events in RiskSpectrum Pavel Krcal a,b and Ola Bäckström a a Lloyd's Register Consulting, Stockholm, Sweden b Uppsala University, Uppsala, Sweden Abstract:

More information

Quantitative evaluation of Dependability

Quantitative evaluation of Dependability Quantitative evaluation of Dependability 1 Quantitative evaluation of Dependability Faults are the cause of errors and failures. Does the arrival time of faults fit a probability distribution? If so, what

More information

Reliability of Safety-Critical Systems Chapter 8. Probability of Failure on Demand using fault trees

Reliability of Safety-Critical Systems Chapter 8. Probability of Failure on Demand using fault trees Reliability of Safety-Critical Systems Chapter 8. Probability of Failure on Demand using fault trees Mary Ann Lundteigen and Marvin Rausand mary.a.lundteigen@ntnu.no &marvin.rausand@ntnu.no RAMS Group

More information

Common Cause Failure (CCF)

Common Cause Failure (CCF) Common Cause Failure (CCF) 건국대학교컴퓨터공학과 UC Lab. 정혁준 & 박경식 amitajung@naver.com, kyeongsik@konkuk.ac.kr Contents Common Cause Failure (CCF) Types of CCF Examples Reducing CCF Common Cause Failure (CCF) Definition

More information

Number System. Decimal to binary Binary to Decimal Binary to octal Binary to hexadecimal Hexadecimal to binary Octal to binary

Number System. Decimal to binary Binary to Decimal Binary to octal Binary to hexadecimal Hexadecimal to binary Octal to binary Number System Decimal to binary Binary to Decimal Binary to octal Binary to hexadecimal Hexadecimal to binary Octal to binary BOOLEAN ALGEBRA BOOLEAN LOGIC OPERATIONS Logical AND Logical OR Logical COMPLEMENTATION

More information

CIRCUITS AND ELECTRONICS. The Digital Abstraction

CIRCUITS AND ELECTRONICS. The Digital Abstraction 6.002 CIRCUITS AND ELECTRONICS The Digital Abstraction Review Discretize matter by agreeing to observe the lumped matter discipline Lumped Circuit Abstraction Analysis tool kit: KVL/KCL, node method, superposition,

More information

Venn Diagrams; Probability Laws. Notes. Set Operations and Relations. Venn Diagram 2.1. Venn Diagrams; Probability Laws. Notes

Venn Diagrams; Probability Laws. Notes. Set Operations and Relations. Venn Diagram 2.1. Venn Diagrams; Probability Laws. Notes Lecture 2 s; Text: A Course in Probability by Weiss 2.4 STAT 225 Introduction to Probability Models January 8, 2014 s; Whitney Huang Purdue University 2.1 Agenda s; 1 2 2.2 Intersection: the intersection

More information

INTRODUCTION TO INFORMATION & COMMUNICATION TECHNOLOGY LECTURE 8 : WEEK 8 CSC-110-T

INTRODUCTION TO INFORMATION & COMMUNICATION TECHNOLOGY LECTURE 8 : WEEK 8 CSC-110-T INTRODUCTION TO INFORMATION & COMMUNICATION TECHNOLOGY LECTURE 8 : WEEK 8 CSC-110-T Credit : (2 + 1) / Week TEXT AND REF. BOOKS Text Book: Peter Norton (2011), Introduction to Computers, 7 /e, McGraw-Hill

More information

Campus Mail Box. Circle One: Richards 03 Richards 04 Lui 05 Lui - 06

Campus Mail Box. Circle One: Richards 03 Richards 04 Lui 05 Lui - 06 ES 202 - Exam I Winter 2002-2003 Richards/Lui Name: Campus Mail Box Circle One: Richards 03 Richards 04 Lui 05 Lui - 06 Problem 1 Problem 2 ( 10 ) ( 45 ) Problem 3 ( 45 ) TOTAL ( 100 ) General Comments

More information

Sample Problems for all sections of CMSC250, Midterm 1 Fall 2014

Sample Problems for all sections of CMSC250, Midterm 1 Fall 2014 Sample Problems for all sections of CMSC250, Midterm 1 Fall 2014 1. Translate each of the following English sentences into formal statements using the logical operators (,,,,, and ). You may also use mathematical

More information

Computing via boolean logic. COS 116: 3/8/2011 Sanjeev Arora

Computing via boolean logic. COS 116: 3/8/2011 Sanjeev Arora Computing via boolean logic. COS 116: 3/8/2011 Sanjeev Arora Recap: Boolean Logic Example Ed goes to the party if Dan does not and Stella does. Choose Boolean variables for 3 events: { Each E: Ed goes

More information

Boolean Algebra, Gates and Circuits

Boolean Algebra, Gates and Circuits Boolean Algebra, Gates and Circuits Kasper Brink November 21, 2017 (Images taken from Tanenbaum, Structured Computer Organization, Fifth Edition, (c) 2006 Pearson Education, Inc.) Outline Last week: Von

More information

Reliability of Safety-Critical Systems 5.4 Petrinets

Reliability of Safety-Critical Systems 5.4 Petrinets Reliability of Safety-Critical Systems 5.4 Petrinets Mary Ann Lundteigen and Marvin Rausand mary.a.lundteigen@ntnu.no &marvin.rausand@ntnu.no RAMS Group Department of Production and Quality Engineering

More information

Reliability of Technical Systems

Reliability of Technical Systems Reliability of Technical Systems Main Topics. Short Introduction, Reliability Parameters: Failure Rate, Failure Probability, etc. 2. Some Important Reliability Distributions 3. Component Reliability 4.

More information

Chapter 7 Propositional Satisfiability Techniques

Chapter 7 Propositional Satisfiability Techniques Lecture slides for Automated Planning: Theory and Practice Chapter 7 Propositional Satisfiability Techniques Dana S. Nau CMSC 722, AI Planning University of Maryland, Spring 2008 1 Motivation Propositional

More information

Set Theory Basics of Set Theory. mjarrar Watch this lecture and download the slides

Set Theory Basics of Set Theory. mjarrar Watch this lecture and download the slides 9/6/17 Birzeit University Palestine 2015 6.1. Basics of 6.2 Properties of Sets and Element Argument 6.3 Algebraic Proofs mjarrar 2015 1 Watch this lecture and download the slides Course Page: http://www.jarrar.info/courses/dmath/

More information

CHAPTER 1. MATHEMATICAL LOGIC 1.1 Fundamentals of Mathematical Logic

CHAPTER 1. MATHEMATICAL LOGIC 1.1 Fundamentals of Mathematical Logic CHAPER 1 MAHEMAICAL LOGIC 1.1 undamentals of Mathematical Logic Logic is commonly known as the science of reasoning. Some of the reasons to study logic are the following: At the hardware level the design

More information

Hardware Design I Chap. 2 Basis of logical circuit, logical expression, and logical function

Hardware Design I Chap. 2 Basis of logical circuit, logical expression, and logical function Hardware Design I Chap. 2 Basis of logical circuit, logical expression, and logical function E-mail: shimada@is.naist.jp Outline Combinational logical circuit Logic gate (logic element) Definition of combinational

More information

CHAPTER1: Digital Logic Circuits Combination Circuits

CHAPTER1: Digital Logic Circuits Combination Circuits CS224: Computer Organization S.KHABET CHAPTER1: Digital Logic Circuits Combination Circuits 1 PRIMITIVE LOGIC GATES Each of our basic operations can be implemented in hardware using a primitive logic gate.

More information

Quantitative evaluation of Dependability

Quantitative evaluation of Dependability Quantitative evaluation of Dependability 1 Quantitative evaluation of Dependability Faults are the cause of errors and failures. Does the arrival time of faults fit a probability distribution? If so, what

More information

Chapter 2 (Lect 2) Canonical and Standard Forms. Standard Form. Other Logic Operators Logic Gates. Sum of Minterms Product of Maxterms

Chapter 2 (Lect 2) Canonical and Standard Forms. Standard Form. Other Logic Operators Logic Gates. Sum of Minterms Product of Maxterms Chapter 2 (Lect 2) Canonical and Standard Forms Sum of Minterms Product of Maxterms Standard Form Sum of products Product of sums Other Logic Operators Logic Gates Basic and Multiple Inputs Positive and

More information

Safety and Reliability of Embedded Systems. (Sicherheit und Zuverlässigkeit eingebetteter Systeme) Fault Tree Analysis Obscurities and Open Issues

Safety and Reliability of Embedded Systems. (Sicherheit und Zuverlässigkeit eingebetteter Systeme) Fault Tree Analysis Obscurities and Open Issues (Sicherheit und Zuverlässigkeit eingebetteter Systeme) Fault Tree Analysis Obscurities and Open Issues Content What are Events? Examples for Problematic Event Semantics Inhibit, Enabler / Conditioning

More information

Chapter 7 Propositional Satisfiability Techniques

Chapter 7 Propositional Satisfiability Techniques Lecture slides for Automated Planning: Theory and Practice Chapter 7 Propositional Satisfiability Techniques Dana S. Nau University of Maryland 12:58 PM February 15, 2012 1 Motivation Propositional satisfiability:

More information

Quantification of Temporal Fault Trees Based on Fuzzy Set Theory

Quantification of Temporal Fault Trees Based on Fuzzy Set Theory Quantification of Temporal Fault Trees Based on Fuzzy Set Theory Sohag Kabir, Ernest Edifor, Martin Walker, Neil Gordon Department of Computer Science, University of Hull, Hull, UK {s.kabir@2012.,e.e.edifor@2007.,martin.walker@,n.a.gordon

More information

Chapter 6. a. Open Circuit. Only if both resistors fail open-circuit, i.e. they are in parallel.

Chapter 6. a. Open Circuit. Only if both resistors fail open-circuit, i.e. they are in parallel. Chapter 6 1. a. Section 6.1. b. Section 6.3, see also Section 6.2. c. Predictions based on most published sources of reliability data tend to underestimate the reliability that is achievable, given that

More information

Lecture 5 Fault Modeling

Lecture 5 Fault Modeling Lecture 5 Fault Modeling Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes

More information

Digital Logic and Design (Course Code: EE222) Lecture 19: Sequential Circuits Contd..

Digital Logic and Design (Course Code: EE222) Lecture 19: Sequential Circuits Contd.. Indian Institute of Technology Jodhpur, Year 2017-2018 Digital Logic and Design (Course Code: EE222) Lecture 19: Sequential Circuits Contd.. Course Instructor: Shree Prakash Tiwari Email: sptiwari@iitj.ac.in

More information

CSE 311: Foundations of Computing. Lecture 2: More Logic, Equivalence & Digital Circuits

CSE 311: Foundations of Computing. Lecture 2: More Logic, Equivalence & Digital Circuits CSE 311: Foundations of Computing Lecture 2: More Logic, Equivalence & Digital Circuits Last class: Some Connectives & Truth Tables Negation (not) p p T F F T Disjunction (or) p q p q T T T T F T F T T

More information

6.841/18.405J: Advanced Complexity Wednesday, February 12, Lecture Lecture 3

6.841/18.405J: Advanced Complexity Wednesday, February 12, Lecture Lecture 3 6.841/18.405J: Advanced Complexity Wednesday, February 12, 2003 Lecture Lecture 3 Instructor: Madhu Sudan Scribe: Bobby Kleinberg 1 The language MinDNF At the end of the last lecture, we introduced the

More information

Logic Design. Chapter 2: Introduction to Logic Circuits

Logic Design. Chapter 2: Introduction to Logic Circuits Logic Design Chapter 2: Introduction to Logic Circuits Introduction Logic circuits perform operation on digital signal Digital signal: signal values are restricted to a few discrete values Binary logic

More information

2. Introduction to commutative rings (continued)

2. Introduction to commutative rings (continued) 2. Introduction to commutative rings (continued) 2.1. New examples of commutative rings. Recall that in the first lecture we defined the notions of commutative rings and field and gave some examples of

More information

Finite Automata Theory and Formal Languages TMV027/DIT321 LP Recap: Logic, Sets, Relations, Functions

Finite Automata Theory and Formal Languages TMV027/DIT321 LP Recap: Logic, Sets, Relations, Functions Finite Automata Theory and Formal Languages TMV027/DIT321 LP4 2017 Formal proofs; Simple/strong induction; Mutual induction; Inductively defined sets; Recursively defined functions. Lecture 3 Ana Bove

More information

Introduction to Arti Intelligence

Introduction to Arti Intelligence Introduction to Arti Intelligence cial Lecture 4: Constraint satisfaction problems 1 / 48 Constraint satisfaction problems: Today Exploiting the representation of a state to accelerate search. Backtracking.

More information

Availability analysis of nuclear power plant system with the consideration of logical loop structures

Availability analysis of nuclear power plant system with the consideration of logical loop structures Availability analysis of nuclear power plant system with the consideration of logical loop structures MATSUOKA Takeshi 1, 2 1. Mechanical Systems Engineering, Department of Engineering, Utsunomiya University,

More information