Chip Monolithic Ceramic Capacitors

Transcription

1 !Note C02E.pdf Chip Monolithic Ceramic Capacitors for Flow/Reflow Soldering GRM5/8/2/3 Series Features. Terminations are made of metal highly resistant to migration. 2. The GRM series is a complete line of chip ceramic capacitors in V, V, V, V, V, 0V, V and 0V ratings. These capacitors have temperature characteristics ranging from to Y5V. 3. A wide selection of sizes is available, from the miniature LxWxT:.0x0.5x0.5mm to LxWxT: 3.2x.6xmm., 2 and types are suited to flow and reflow soldering. GRM5 type is applied to only reflow soldering.. Stringent dimensional tolerances allow highly reliable, high speed automatic chip placement on PCBs. 5. The GRM series is available in paper or plastic embossed tape and reel packaging for automatic placement. Bulk case packaging is also available for GRM5, and. GRM55 8* GRM2 9 A B GRM3 9 M C Dimensions (mm) L W T e g min..0 ± ± ± to ± ± ± to ±0.. ± ±0. ± / to ± ± ±0.5.6 ±0.5 ±0. ± to ±0.2.6 ±0.2.6 ±0.2 Bulk Case :.6 ±0.07(L)g0.8 ±0.07(W)g0.8 ±0.07(T) * e g L e W T Applications General electronic equipment Compensating Type GRM5 Series (.0x0.5 mm) V/V GRM5.00x0. [002] (X) 0.pF(R) pF(R75) 0..0pF(R0) pF(2R0) pF(3R0) pF(R0) pF(5R0) pF(6R0) pF(7R0) pF(8R0) pF(9R0) pf(0) pF(20) pF() pF(80) pF(220) pF(270) pF(330)

2 !Note C02E.pdf GRM5.00x0. [002] (X) 39pF(390) pF(70) pF(560) pF(680) pF(820) pF() pF(2) pf(5) pF(8) pF(22) pF(27) pF(33) pF(39) pF(7) pF(56) pF(68) pF(82) 0. 00pF(2) 0. The part numbering code is shown in ( ). Compensating Type Series (.60x mm) V/0V/V/V.60x [0603] (X) pF(R) 0.75pF(R75).0pF(R0) 2.0pF(2R0) 3.0pF(3R0).0pF(R0) 5.0pF(5R0) 6.0pF(6R0) 7.0pF(7R0) 8.0pF(8R0) 9.0pF(9R0) pf(0) 2pF(20) 5pF() 8pF(80) 22pF(220) 27pF(270) 33pF(330) 39pF(390) 7pF(70) 56pF(560) 0

3 !Note C02E.pdf x [0603] (X) 0 68pF(680) 82pF(820) 0pF() 20pF(2) pf(5) 80pF(8) 220pF(22) 270pF(27) 330pF(33) 390pF(39) 70pF(7) 560pF(56) 680pF(68) 820pF(82) 00pF(2) pf(22) pf(52) 800pF(82) 2pF(222) 2700pF(272) The part numbering code is shown in ( ). 0 Compensating Type Series (2.00x. mm) V/0V/V/V 2.00x. [0805] C0H (6C) (X) 0 2pF(20) 5pF() 8pF(80) 22pF(220) 27pF(270) 33pF(330) 39pF(390) 7pF(70) 56pF(560) 68pF(680). 82pF(820). 0pF(). 0.60(6) 20pF(2). 0.60(6) pf(5). 0.60(6). 80pF(8). 0.60(6). 220pF(22). 0.60(6). 270pF(27) 0.60(6). 330pF(33) 0.60(6). 390pF(39) 0.60(6).. 0 9

4 !Note C02E.pdf x. [0805] C0H (6C) (X) pF(7) 0.60(6).. 560pF(56) 0.60(6) pF(68) pF(82) (6). 0.60(6) 00pF(2). 0.60(6). 0.60(6) pf(22). 0.60(6). 0.60(6) pf(52).. 800pF(82) 0.60(6).. 2pF(222) 0.60(6) 2700pF(272) 0.60(6) pF(332) 0.60(6) pF(392) 0.60(6). 700pF(72) 0.60(6) 5600pF(562). 6800pF(682). 8pF(822) 000pF(3) 0.60(6) 0.60(6) 0pF(23) 0.60(6) 0.60(6) 0pF(53) 0.60(6) 0.60(6) 8000pF(83) 0.60(6) 0.60(6) 20pF(223) 27000pF(273) 33000pF(333).00(A).00(A) 39000pF(393) pF(73).. The part numbering code is shown in ( ). Compensating Type Series (3.20x.60 mm) 0V/V/0V/V/V 3.20x.60 [206] C0H (6C) (X).0pF(R0) 2.0pF(2R0) 3.0pF(3R0).0pF(R0) 5.0pF(5R0) 6.0pF(6R0) 7.0pF(7R0) 8.0pF(8R0) 9.0pF(9R0) pf(0) 2pF(20) 5pF() 8pF(80) 22pF(220) 0 (2H) 0

5 !Note C02E.pdf x.60 [206] C0H (6C) (X) 0 (2H) 27pF(270) 33pF(330) 39pF(390) 7pF(70) 56pF(560) 68pF(680) 82pF(820) 270pF(27) 330pF(33) 390pF(39) 70pF(7) 560pF(56) 680pF(68) 820pF(82) 00pF(2) pf(22) pf(52) 800pF(82) 2pF(222) 2700pF(272) 3300pF(332) 3900pF(392) 700pF(72) 5600pF(562) 6800pF(682) 8pF(822) 000pF(3) 0pF(23) 0pF(53) 27000pF(273) 33000pF(333) 7000pF(73) 56000pF(563) 68000pF(683) 80pF(823) 0 0.µF().60(C) The part numbering code is shown in ( ). High Dielectric Constant Type X5R (R6) Characteristics GRM5.00x0. [002] 68000pF(683) 0. 0.µF() µF(33).60x [0603] X5R (R6) 2.00x. [0805] 3.20x.60 [206]

6 !Note C02E.pdf GRM5.00x0. [002] 0.7µF(7) 0.68µF(68).60x [0603] X5R (R6).0µF(5) 2.00x. [0805].5µF(55) 2.2µF(2).. 3.3µF(335)..30(X) 3.20x.60 [206].7µF(75)..60(C) µf(6).60(c).60(c) The part numbering code is shown in each ( ). 3.3µF and.7µf, V rated are series of L: 2±0.5, W:.±0.5, T:.±0.5. T: ±0.mm is also available for.0µf for V. L: 3.2±0.2, W:.6±0.2 for V.0µF type. Also L: 3.2±0.2, W:.6±0.2, T: ±0.5 for V.5µF and 2.2µF type. High Dielectric Constant Type X7R (R7) Characteristics X7R (R7) GRM5.00x0. [002].60x [0603] 2.00x. [0805] 3.20x.60 [206] pF (22) pF (33) 0. 70pF (7) pF (68) 0. 00pF (2) 0. pf (52) 0. 2pF (222) pF (332) pF (72) pF (682) pF (3) 0.. 0pF (53) 20pF (223) pF (333) 0. 2

7 !Note C02E.pdf X7R (R7) GRM5.00x0. [002].60x [0603] 2.00x. [0805] 3.20x.60 [206] pF (73) pF (683). 0.µF () µF (5) µF (22). 0.33µF (33). 0.7µF (7) µF (68).0µF (5)..5µF (55).60 (C) 2.2µF (2).60 (C) 3.3µF (335).60 (C).7µF (75).60 (C) The part numbering code is shown in each ( ). The tolerance will be changed to L: 3.2±0.2, W:.6±0.2 for V.0µF type. Also L: 3.2±0.2, W:.6±0.2, T: ±0.5 for V.5µF and 2.2µF type. High Dielectric Constant Type Y5V (F5) Characteristics Y5V (F5) GRM5.00x0. [002].60x [0603] 2.00x. [0805] 3.20x.60 [206] 0 2pF (222) pF (72) pF (3) 0. 20pF (223) pF (73) 0. 0.µF ()

8 !Note C02E.pdf Y5V (F5) GRM5.00x0. [002].60x [0603] 2.00x. [0805] 3.20x.60 [206] µF (22). 0.7µF (7)..0µF (5) 2.2µF (2)....7µF (75). µf (6).60 (C) The part numbering code is shown in each ( ). T:.±0.mm is also available for V or V.0µF type. High Dielectric Constant Type Z5U (E) Characteristics.60x [0603] Z5U (E) 2.00x. [0805] 000pF(3) 20pF(223) 7000pF(73) 0.60(6) 0.µF() 3.20x.60 [206] 0.22µF(22) The part numbering code is shown in ( ).

9 !Note C02E.pdf GRM Series Specifications and Test Methods Specifications No. Item Compensating Type High Dielectric Type Test Method 2 Operating Rated Voltage Y55 to WD See the previous page. R6 : Y55 to W85D R7 : Y55 to WD E : W to W85D F5 : Y30 to W85D The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, V P-P or V O-P, whichever is larger, should be maintained within the rated voltage range. 3 No defects or abnormalities Visual inspection Dimensions Within the specified dimensions Using calipers on micrometer 5 Dielectric Strength No defects or abnormalities No failure should be observed when * 300% of the rated voltage (C0 to and ) or * 2% of the rated voltage (X5R, X7R, Z5U and Y5V) is applied between the terminations for to 5 seconds, provided the charge/discharge current is less than ma. * % for 0V 6 Insulation Resistance More than,000mω or 0Ω F (Whichever is smaller) The insulation resistance should be measured with a DC voltage not exceeding the rated voltage at D and 75%RH max. and within 2 minutes of charging. 7 8 Q/ Dissipation Factor (D.F.) Within the specified tolerance 30pFmin. : QU00 30pFmax. : QU00+20C C : Nominal (pf) W.V. : Vmin. : 0.0max. W.V. : /V : 0.035max. W.V. : V 0.05max.(CF3.3µF) 0.max.(CU3.3µF) W.V. : Vmin. : 0.0max. W.V. : Vmin. : 0.05max.(CF0.µF) : 0.09max.(CU0.µF) W.V. : V/V : 0.max. W.V. : Vmax. : 0.5max. The capacitance/q/d.f. should be measured at D at the frequency and voltage shown in the table. Item Char. Frequency Voltage C to 7U, X (00pF and T0.MHz 0.5 to 5Vrms below) C to 7U, X (more than 00pF) R6, R7, F5 (µf and below) T0.kHz T0.kHz T0.2Vrms T0.2Vrms R6, R7, F5 (more than µf) 20T2Hz 0.5T0.Vrms E T0.kHz 0.5T0.05Vrms 9 Characteristics Change Coefficient Drift Within the specified tolerance (Table A) Within the specified tolerance (Table A) Within T0.2% or T0.05pF (Whichever is larger.) *Does not apply to X/V R6 : WithinT5% (Y55 to W85D) R7 : Within±5% (Y55 to WD) E : Within W22/Y56% (W to W85D) F5 : Within W22/Y82% (Y30 to W85D) The capacitance change should be measured after 5 min. at each specified temperature stage. () Compensating Type The temperature coefficient is determined using the measured in step 3 as a reference. When cycling the temperature sequentially from step through 5 (C0 : WD to WD : other temp. coeffs. : WD to W85D) the capacitance should be within the specified tolerance for the temperature coefficient and capacitance change as Table A. The capacitance drift is calculated by dividing the differences between the maximum and minimum measured values in steps, 3 and 5 by the capacitance value in step 3. Step (D) T2 2 Y55T3 (for C to 7U/X/R6/R7) Y30T3 (for F5) T3 (for E) 3 T2 T3 (for C/R7) 85T3 (for other ) 5 T2 (2) High Dielectric Constant Type The ranges of capacitance change compared with the above D value over the temperature ranges shown in the table should be within the specified ranges. 22

10 b!note C02E.pdf GRM Series Specifications and Test Methods Specifications No. Item Compensating Type High Dielectric Type Test Method Solder the capacitor to the test jig (glass epoxy board) shown in Fig. using a eutectic solder. Then apply N* force in parallel with the test jig for Tsec. The soldering should be done either with an iron or using the reflow method and should be conducted with care so that the soldering is uniform and free of defects such as heat shock. *2N (GRp03) 5N (GRp5, ) c a Adhesive Strength of Termination Vibration Resistance Q/D.F. No removal of the terminations or other defect should occur. No defects or abnormalities Within the specified tolerance 30pFmin. : QU00 30pFmax. : QU00W20C C : Nominal (pf) W.V. : Vmin. : 0.0max. W.V. : /V : 0.035max. W.V. : V : 0.05max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.0max. W.V. : Vmin. : 0.05max. (CF0.µF) : 0.09max. (CU0.µF) W.V. : V/V : 0.max. W.V. : Vmax. : 0.5max. b, QRS Fig. Solder resist Baked electrode or copper foil (in mm) Solder the capacitor to the test jig (glass epoxy board) in the same manner and under the same conditions as (). The capacitor should be subjected to a simple harmonic motion having a total amplitude of.5mm, the frequency being varied uniformly between the approximate limits of and 55Hz. The frequency range, from to 55Hz and return to Hz, should be traversed in approximately minute. This motion should be applied for a period of 2 hours in each of 3 mutually perpendicular directions (total of 6 hours). Solder the capacitor on the test jig (glass epoxy board) shown in Fig. 2 using a eutectic solder. Then apply a force in the direction shown in Fig. 3. The soldering should be done either with an iron or using the reflow method and should be conducted with care so that the soldering is uniform and free of defects such as heat shock. 2 Deflection 0, QR No crack or marked defect should occur. φ.5 Type a b c GRp03 GRp5 GRM32 GRM3 GRM a t :.6mm (GRp03/5 : 0.8mm) Type a b c GRp03 GRp5 GRM32 GRM3 GRM ,QRST c Fig. 2 0 (in mm) R Pressurizing speed :.0mm/sec. Pressurize meter 5 5 Fig. 3 Flexure : V 23

11 !Note C02E.pdf GRM Series Specifications and Test Methods Specifications No. Item Compensating Type High Dielectric Type Test Method 3 Solderability of Termination 75% of the terminations are to be soldered evenly and continuously. The measured and observed characteristics should satisfy the specifications in the following table. Immerse the capacitor in a solution of ethanol (JIS-K-8) and rosin (JIS-K-5902) (% rosin in weight proportion). Preheat at 80 to 20D for to 30 seconds. After preheating, immerse in eutectic solder solution for 2T0.5 seconds at 230T5D. No marking defects Resistance to Soldering Heat Change Q/D.F. Within T2.5% or T0.pF (Whichever is larger) 30pFmin. : QU00 30pFmax. : QU00W20C C : Nominal (pf) R6, R7 : Within T7.5% E, F5 : Within T20% W.V. : Vmin. : 0.0max. W.V. : /V : 0.035max. W.V. : V : 0.05max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.0max. W.V. : Vmin. : 0.05max. (CF0.µF) : 0.09max. (CU0.µF) W.V. : V/V : 0.max. W.V. : Vmax. : 0.5max. Preheat the capacitor at 20 to D for minute. Immerse the capacitor in a eutectic solder solution at 270T5D for T0.5 seconds. Let sit at room temperature for 2T2 hours (temperature compensating type) or 8T hours (high dielectric constant type), then measure. #Initial measurement for high dielectric constant type W 0 Perform a heat treatment at YD for one hour and then let sit for 8T hours at room temperature. Perform the initial measurement. *Preheating for GRM32/3/55 Step 2 0D to 20D 70D to D Time min. min. I.R. More than,000mω or 0Ω F (Whichever is smaller) Dielectric Strength No failure The measured and observed characteristics should satisfy the specifications in the following table. No marking defects 5 Cycle Change Q/D.F. Within T2.5% or T0.pF (Whichever is larger) 30pFmin. : QU00 30pFmax. : QU00W20C C : Nominal (pf) R6, R7 : Within T7.5% E, F5 : Within T20% W.V. : Vmin. : 0.0max. W.V. : /V : 0.035max. W.V. : V 0.05max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.0max. W.V. : Vmin. : 0.05max. (CF0.µF) : 0.09max. (CU0.µF) W.V. : V/V : 0.max. W.V. : Vmax. : 0.5max. Fix the capacitor to the supporting jig in the same manner and under the same conditions as (). Perform the five cycles according to the four heat treatments listed in the following table. Let sit for 2T2 hours (temperature compensating type) or 8T hour (high dielectric constant type) at room temperature, then measure. Step 2 3 Temp. (D) Time (min.) Min. Operating Temp.W0/Y3 Room Temp. Max. Operating Temp.W3/Y0 Room Temp. 30T3 2 to 3 30T3 2 to 3 #Initial measurement for high dielectric constant type W 0 Perform a heat treatment at YD for one hour and then let sit for 8T hours at room temperature. Perform the initial measurement. I.R. More than,000mω or 0Ω F (Whichever is smaller) Dielectric Strength No failure 2

12 !Note C02E.pdf GRM Series Specifications and Test Methods No. Humidity Steady State 7 Humidity Load Item Change Q/D.F. I.R. Dielectric Strength Change Q/D.F. I.R. Dielectric Strength Compensating Type Specifications High Dielectric Type The measured and observed characteristics should satisfy the specifications in the following table. No marking defects Within T5% or T0.5pF (Whichever is larger) 30pF and over : QU3 pf and over 30pF and below : QU275W5C/2 pf and below : QUWC C : Nominal (pf) R6, R7 : Within T2.5% E, F5 : Within T30% W.V. : Vmin. : 0.05max. W.V. : /V : 0.05max. W.V. : V 0.075max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.05max. W.V. : Vmin. : 0.075max. (CF0.µF) : 0.max. (CU0.µF) W.V. : V/V : 0.5max. W.V. : Vmax. : 0.2max. More than,000mω or Ω F (Whichever is smaller) No failure The measured and observed characteristics should satisfy the specifications in the following table. No marking defects Within T7.5% or T0.75pF (Whichever is larger) 30pF and over : QU 30pF and below : QU0+C/3 C : Nominal (pf) No failure R6, R7 : Within T2.5% E : Within T30% F5 : Within T30% [W.V. : Vmax.] F5 : Within W30/Y0% W.V. : Vmin. : 0.05max. W.V. : /V : 0.05max. W.V. : V 0.075max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.05max. W.V. : Vmin. : 0.075max. (CF0.µF) : 0.max. (CU0.µF) W.V. : V/V : 0.5max. W.V. : Vmax. : 0.2max. More than 0MΩ or Ω F (Whichever is smaller) Test Method Let the capacitor sit at 0T2D and 90 to 95% humidity for 0T2 hours. Remove and let sit for 2T2 hours (temperature compensating type) or 8T hours (high dielectric constant type) at room temperature, then measure. Apply the rated voltage at 0T2D and 90 to 95% humidity for 0T2 hours. Remove and let sit for 2T2 hours (temperature compensating type) or 8T hours (high dielectric constant type) at room temperature, then measure. The charge/discharge current is less than ma. #Initial measurement for F5/V max. Apply the rated DC voltage for hour at 0T2D. Remove and let sit for 8T hours at room temperature. Perform initial measurement.

13 !Note C02E.pdf GRM Series Specifications and Test Methods Specifications No. Item Compensating Type High Dielectric Type Test Method The measured and observed characteristics should satisfy the specifications in the following table. 8 High Load Change Q/D.F. No marking defects Within T3% or T0.3pF (Whichever is larger) 30pF and over : QU3 pf and over 30pF and below : QU275+5C/2 pf and below : QU+C C : Nominal (pf) R6, R7 : Within T2.5% E : Within T30% F5 : Within T30% (CapF.0µF) F5 : Within W30/Y0% (CapU.0µF) W.V. : Vmin. : 0.05max. W.V. : /V : 0.05max. W.V. : V 0.075max. (CF3.3µF) 0.max. (CU3.3µF) W.V. : Vmin. : 0.05max W.V. : Vmin. : 0.075max. (CF0.µF) : 0.max. (CU0.µF) W.V. : V/V : 0.5max. W.V. : Vmax. : 0.2max. Apply % of the rated voltage for 00T2 hours at the maximum operating temperature T3D. Let sit for 2T2 hours (temperature compensating type) or 8T hours (high dielectric constant type) at room temperature, then measure. The charge/discharge current is less than ma. #Initial measurement for high dielectric constant type. Apply % of the rated DC voltage for one hour at the maximum operating temperature T3D. Remove and let sit for 8T hours at room temperature. Perform initial measurement. *% for 0V and CUµF I.R. More than,000mω or Ω#F (Whichever is smaller) Dielectric Strength No failure Table A Change from D (%) Char. Code Nominal Values (ppm/d)* Max. Min. Max. Min. 5C 6C 6P 6R 6S 6T 7U X Y000 T030 Y000 T060 Y T060 Y220 T060 Y330 T060 Y70 T060 Y7 T20 W3 to Y Y Y0.2 Y Y Y Y0.7 Y Y *Nominal values denote the temperature coefficient within a range of D to D (for C)/85D (for other ). Y55 Y30 Max Y Y Min. Y0. Y Y 26