CUS100ME RELIABILITY DATA
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1 RELIABILITY DATA DWG. No. APPD CHK DWG
2 I N D E X 1. Calculated Values for MTBF... R-1 2. Components Derating List... R-2 3. Main components temperature rise ΔT list... R-4 4. Electrolytic capacitor lifetime... R-5 5. Vibration Test... R-6 6. Thermal shock test... R-7 Test results are typical data.
3 1. Calculated Values for MTBF MODEL : CUS100ME-24 Calculating Method Calculated based on part count reliability projection of Telcordia (*1). Individual failure rates λ G is given to each part and MTBF is calculated by the count of each part. *1: Telcordia Document Reliability Prediction Procedure for Electronic Equipment (Document number SR-332 Issue3,Method I, Quality level II) Formula: MTBF = 1 λ equip 10 6 = (hours) λ equip = Total Equipment Failure Rate (Failure /10 6 Hours ) λ G = Generic failure rate for the i th generic part (Failure / 10 6 Hours) n i = Quantity of i th part n = Number of different generic part categories π Q = Generic quality factor for the ith generic part (π Q = 1) MTBF Values Environmental factor: G B (Ground, Benign) Line Input Output Volts Load T amb MTBF (hrs) 230V 24V 4.16A 20C 19,181, V 24V 4.16A 30 o C 10,719, V 24V 4.16A 40 o C 5,734, V 24V 4.16A 50 o C 3,003,623 R-1
4 2. Components Derating List MODEL: CUS100ME-24 Location No. Vin = 100VAC Load = 100% Ta = 50 C XD8 Tjmax=175 C θ j-c=20 C/W FURS360B Pd=0.5W ΔTc=10 C Tc=111 C Fagor Tj = Tc + ((θ j-c) Pd) =121 C D.F.=69.1% XD10 Tjmax=150 C θ j-c=13 C/W S5MB Pd=0.5W ΔTc=6.5 C Tc=123.4 C Taiwan Semiconductor Tj = Tc + ((θ j-c) Pd) =129.9 C D.F.=86.6% XD11 Tjmax=150 C θ j-c=13 C/W S5MB Pd=0.5W ΔTc=6.5 C Tc=123.4 C Taiwan Semiconductor Tj = Tc + ((θ j-c) Pd) =129.9 C D.F.=86.6% XD12 Tjmax=150 C θ j-c=13 C/W S5MB Pd=0.5W ΔTc=6.5 C Tc=123.4 C Taiwan Semiconductor Tj = Tc + ((θ j-c) Pd) =129.9 C D.F.=86.6% XD13 Tjmax=150 C θ j-c=13 C/W S5MB Pd=0.5W ΔTc=6.5 C Tc=123.4 C Taiwan Semiconductor Tj = Tc + ((θ j-c) Pd) =129.9 C D.F.=86.6% XQ1 Tjmax=150 C θ j-c=4 C/W IPD60R400CEAUMA1 Pd=0.36W ΔTc=1.4 C Tc=123.6 C Tj = Tc + ((θ j-c) Pd) =125 C D.F.=83.4% XQ2 Tjmax=150 C θ j-c=4 C/W IPD60R400CEAUMA1 Pd=0.36W ΔTc=1.4 C Tc=123.6 C Tj = Tc + ((θ j-c) Pd) =125 C D.F.=83.4% XQ3 Tjmax=150 C θ j-c=4 C/W IPD60R400CEAUMA1 Pd=1W ΔTc=4 C Tc=126 C Tj = Tc + ((θ j-c) Pd) =130 C D.F.=86.7% XQ4 Tjmax=150 C θ j-c=4 C/W IPD60R400CEAUMA1 Pd=1W ΔTc=4 C Tc=126 C Tj = Tc + ((θ j-c) Pd) =130 C D.F.=86.7% XQ5 Tjmax=150 C θ j-c=625 C/W 2SK3018T106 Pd=0W ΔTc=0 C Tc=100 C ROHM Tj = Tc + ((θ j-c) Pd) =100 C D.F.=66.7% R-2
5 Location No. Vin = 100VAC Load = 100% Ta = 50 C XQ105 Tjmax=150 C θ j-c=20 C/W BSC039N06NSATMA1 Pd=0.44W ΔTc=8.8 C Tc=127 C Tj = Tc + ((θ j-c) Pd) =135.8 C D.F.=90.5% XQ106 Tjmax=150 C θ j-c=20 C/W BSC039N06NSATMA1 Pd=0.39W ΔTc=7.7 C Tc=127 C Tj = Tc + ((θ j-c) Pd) =134.7 C D.F.=89.8% XU1 Tjmax=150 C θ j-c=90 C/W TEA1716T Pd=0W ΔTc=0 C Tc=99.9 C NXP Tj = Tc + ((θ j-c) Pd) =99.9 C D.F.=66.6% XU100 Tjmax=150 C θ j-c=140 C/W TEA1995T Pd=0W ΔTc=0 C Tc=100.5 C Tj = Tc + ((θ j-c) Pd) =100.5 C D.F.=67% XD100 Tjmax=150 C θ j-c=80 C/W NCP431B Pd=0.1W ΔTc=10.6 C Tc=80.8 C On-Semi Tj = Tc + ((θ j-c) Pd) =91.4 C D.F.=60.9% XD102 Tjmax=150 C θ j-c=80 C/W NCP431B Pd=0.02W ΔTc=1.4 C Tc=94.1 C On-Semi Tj = Tc + ((θ j-c) Pd) =95.5 C D.F.=63.7% R-3
6 3. Main components temperature rise ΔT list MODEL: CUS100ME-12 Measuring conditions Mounting Method Standard Mounting (A) Open Frame Measuring Results Input Voltage (VAC) 90 Output Voltage (VDC) 12 Output Current (A) ΔT Temperature Rise ( C) Output Derating Io = 100 % Io = 60 % Ta = 50 C Ta = 70 C Location No. Parts Name Mounting(A) Mounting (A) XD13 Bridge Diode XQ3 Boost FET XD8 Boost Diode XQ2 Primary FET XQ106 Secondary FET XU101 Optocoupler XU102 Optocoupler L1 Common Mode Choke L2 Boost Choke TX100 Transformer Primary TX100 Transformer Secondary C1 Resonant Cap C2 Auxilliary Cap C3 X Cap C6 Boost Cap C7 X Cap C102 Output Cap F1 Fuse XR112 Sense Resistor XD13 Bridge Diode R-4
7 Life Times (years) CUS100ME 4. Electrolytic capacitor lifetime MODEL: CUS100ME-12 Standard Mounting Conditions Ta 40 C 50 C Vin = 100 VAC Load (%) Lifetime (years) Ta = 40 C Ta = 50 C Output Current (%) Note : E-cap life calculation is based on 24hrs/day operation. e.g. For 12Hrs/day operation life numbers will double R-5
8 5. Vibration Test MODEL: CUS100ME (1) Vibration Test Class Frequency Variable Endurance Test (2) Equipment Used Controller: LDS Dactron Comet Vibrator: V T M8 R-CE Accelerometer: DeltaTron 4533-B (3) The Number of D.U.T. (Device Under Test) 5 Units (4) Test Conditions Sweep Frequency: Hz Direction: X, Y, Z Sweep Time: 1 minute Test Time: 1 hour each axis Acceleration: 2.2G Non-operation Mounting: Standard Mounting (5) Test Method Fix the PSUT on the mounting rail with stopper on each corner. Standard mounting position as per picture above. (6) Acceptable Conditions 1. Not to be broken. 2. No abnormal output after test. (7) Test Results Visually OK and functions after test. R-6
9 6. Thermal shock test MODEL : CUS100ME-24 (1) Equipment used Thermal shock chamber Thermotron (2) The number of PSUT. (Power Supply Under Test) 1 unit (3) Test Conditions Ambient Tempetature: -40 C 105 C Test Time: 20 min ~ 20 min Test Cycle: 523 cycles Not Operating +105 C 20 min 20 min -40 C 1 cycle (4) Test Method Before the test, check if there is no abnormal output and put the PSUT in the testing chamber. Then test it in above cycles. After the test is completed, leave it for 1 hour at the room temperature and check to make sure that there is no abnormal output. (5) Test Results Visually and electrically OK. R-7
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