GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS
|
|
- Martina Hawkins
- 5 years ago
- Views:
Transcription
1 GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS Robert W. Zuneska, Y. Rong, Isaac Vander, and F. J. Cadieu* Physics Dept., Queens College of CUNY, Flushing, NY ABSTRACT The composition of ancient Chinese bronze mirrors has been determined by X-ray fluorescence measurements. The mirrors were archived to be from either 200 BCE-200 CE and from approximately the 800 CE period. Glancing incidence X-Ray excitation proofed highly useful for obtaining the elemental composition from the fluorescence measurements. Measurements of the tin L /K X-ray fluorescence ratio as a function of the glancing incidence angle showed that this ratio became independent of the glancing angle for angles less than 5. Glancing X-ray fluorescence measurements made at 2 were then calibrated to known standards to give highly accurate compositions for major elements in the Chinese bronze mirrors. X-Ray diffraction measurements were used to test for composition segregation or crystal structure changes near the surface of the mirrors. The X-ray diffraction angles were found to be independent of the glancing angle indicating that surface composition segregation was not observed. Changing relative intensities of the observed diffraction reflections indicated that the crystal texturing changed near the surface. INTRODUCTION X-ray fluorescence (XRF) has become a popular method to investigate archaeological and historical materials because it provides nondestructive elemental analysis measurements. An attractive feature of XRF is that it can successfully employ a number of spectrometers including newly utilized portable systems. In this study XRF has been used to study the elemental composition of 6 ancient Chinese mirrors dating from approximately 200 BCE 800 CE obtained courtesy of the Godwin-Ternbach Museum (Winter 2003) located at Queens College of the City University of New York. In certain cases X-ray diffraction has been used to also determine the crystal phasing of the mirrors. A key part of these studies is that the irradiation angle between the X-ray beam and the mirror surfaces, defined as, has been varied systematically to aid in calibrating the measured XRF elemental intensities to sample compositions. A key problem for XRF is that converting the measured elemental intensities to actual element compositions is not a simple problem and depends on many factors. A major problem for the study of bronzes is the determination of the tin content. Measurements of the Sn L kev, intensity are often used to determine the Sn content. One of the things shown in this study is that the measured Sn L /K intensity ratio is a strong function of the irradiation angle. Standard bronze samples with certified mass spectrograph compositions obtained from the Concast Corporation were used as calibration standards. It is obviously not possible to directly do mass spectrograph composition measurements on the Chinese mirrors since that would permanently mark the museum pieces.
2 This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website ICDD Website -
3 With this same diffractometer geometry it was also possible to do glancing incidence XRD to study the crystallographic properties of the mirror surfaces. These relatively new techniques have proven very useful for the study of growth and segregation effects in thin films. (van Brussel and De Hosson, 1994) In this variable incidence angle X-ray diffraction the angle between the substrate plane and the incident beam,, is held constant for a series of different 2 scans, with 2 defined as the angle between the incident beam and the diffracted beam. Such glancing incidence XRD studies have proven particularly useful for studying changes in crystallographic structures for metal film systems. (Cadieu 2010) EXPERIMENT The Chinese bronze mirrors and composition standards were analyzed in a PANalytical Materials Research Diffractometer. An Amptek, XR-100T, Peltier cooled energy dispersive X-ray detector was added to this system to facilitate XRF measurements. The samples were irradiated by the Cu X-ray tube operated at a beam voltage of 45 kv with a 20 µm thick Ni Cu K filter (99% Cu Kâ reduction). Beam currents ranging from 5 to 40 ma were utilized to limit the Amptek detector dead time to 15%. A programmable divergence slit, PDS, was used to set the irradiated sample length to 5 mm independent of the angle. XRD data was collected using a programmable receiving slit, PRS, with a Cu K monochrometer. With this setup the irradiation angle could be reliably set to a small fraction of 1 degree. The Amptek fluorescence data were collected using a multichannel analyzer with the ADC gain set to 1024 channels. Figure 1 shows the basic setup inside the diffractometer. The standard compositions for the three bronze samples determined by Concast Corporation by mass spectrographic are designated ST932, ST903, and ST907. Our measurements on these standards are designated by CT932, CT903, and CT907 where the dots stand for a measurement angle. Fig. 1. Setup inside X'Pert Pro Overhead View, is the incoming angle. RESULTS and DISCUSSION
4 The Chinese bronze Mirrors were loaned by the Godwin-Ternbach Museum at Queens College. The museum designations for the mirrors are, Mirror A (#66.45) is 8.9 cm in diameter (Fig. 2A), made around C. 206 BCE-220 CE; Mirror B (#63.18) is 11.4 cm in diameter (Fig. 2B), made around C CE; Mirror C (#63.19) is 8.9 cm in diameter (Fig. 2C), made around C. 206 BCE-220 CE; Mirror D (#63-17) is 10.9 cm in diameter (Fig. 2D), made around C. 206 BCE-220 CE: Mirror E (#66-46) is 10.6 cm in diameter (Fig. 2E), made around C. 206 BCE-220 CE: Mirror F (#66-47) is 10.7 cm in diameter (Fig. 2F), made around C. 206 BCE-220 CE. Composition measurements were made at several locations on the mirror side in regions most free of corrosion or discoloration. Glancing and non-glancing X-ray excitation angles were investigated. Figure 3 shows the ratios of Sn/Cu and Pb/Cu fluorescence count percentages at glancing angle 2 and a more normal excitation angle of 60. The chart shows that the intensity ratios measured at a glancing angle of 2 are clearly higher than those measured for 60. Furthermore,
5 Mirror B has a higher composition of lead which implies that the mirror was made in a later period as lead content was increased in the making after the Song dynasty. [Chou 2000] Figure 4 below shows lead Lâ/Lá ratios at a normal angle of 60 and a glancing angle of 2. The motivation is to show that the normal incidence and the glancing excitation angles give consistently different results. The lead Lâ/Lá ratios in Fig. 4 are clearly higher for 60 excitation than for 2. These differences in fluorescence ratios as a function of excitation angle illustrate that it not obvious how to translate the fluorescence counts to actual compositions. To solve this problem data was collected for a bronze standard, A932, which approximates the mirror compositions. Mirrors Normal and Glancing Sn/Cu Pb/Cu 5 count ratio % A1017G A1017N B1015G B1015N C1017G MC1017N Fig. 3. Fluorescence counts for Sn and Pb relative to Cu are shown for mirrors A, B, and C as measured at glancing angles of 2, G, and 60, N.
6 Fig. 4. Lead Lâ/Lá Ratios at = 60, N, and Glancing, =2, G (A, B, C are ratios for respective Chinese Mirrors, CT932 is a bronze standard, Pb is pure Lead) The Amptek amplifier gain was set to either collect X-rays up to 16 or 30 kev. With the gain set to collect up to 30 kev, fluorescence counts for both the Sn L as well as the Sn K X-rays were collected. Figure 5 shows the fluorescence spectrum collected for the Concast bronze standard CT932 for energies up to 30 kev. Figure 6 shows the collected ratios for Sn L /K versus the angle for the Concast bronze standard CT932. This was a smooth machined surface so that the angles could be precisely defined. The Sn L X-rays have a relatively low energy at kev so that the observed Sn L intensity is a function of both the depth of sample irradiated and of the probability for such a low energy X-ray to escape from the sample and be counted. The Sn K X-rays have a relatively high energy at kev and can consequently escape from a greater depth of the sample than the Sn L X-rays. The depth of sample irradiated decreases as the angle decreases. The Sn L /K intensity ratio is expected to increase with decreasing until the L X-rays have a greater probability of exiting than being absorbed within the sample. For this sample the Sn L /K intensity ratios become independent of for 5. The relative intensities of the Sn L and K X-rays illustrate the problems inherent in calibrating X-ray intensities at different energies to percent composition values. It is desired that the Sn concentration determined from the Sn L and Sn K X-ray intensities should be the same and it is also a non-obvious problem in determining compositions from X-rays at different energies for other elements. This result indicates that calibration comparisons should be made for angles that are less than 5. Compositions were determined from glancing measurements for = 2.
7 Cu Pb Pb Counts for 1000 s Sn Sn Sn 100 Zn Energy (KeV) Fig. 5. Spectrum of Concast sample CT932 at low gain with 2 glancing angle. 1.3 Sn Intensity Ratio Lá/Ká Angle Omega degrees Fig. 6. The intensity ratio for the Sn L /K X-rays versus irradiation angle is shown for the Concast Bronze CT932 sample.
8 A key result of Fig. 6 is that the relative XRF counts for spectrum collected at = 2 is independent of for angles near 2. XRF spectrum collected at = 2 for the Concast sample CT932, which closely matched the element content and compositions for the Chinese mirrors, were ascribed to wt.% for the elements of interest by the following formula. ܭ 100% = %.ݐݓ ݏݐܥ σ ܭ ݏݐܥ In this expression Cts i is the peak counts above an assumed flat background in the vicinity of the peak. Background corrections were normally small here but the same expressions could also be used in cases where the background is non-negligible. A sum over 5 channels centered on the peak was used for the i th element as measured at the angle = 2, K i is a constant that makes the wt.% composition for the i th element in the Concast standard CT932 match for the elements Sn, Fe, Ni, Cu, Zn, and Pb in the Concast composition with the constraint K Cu =1.00. The remaining K i for the elements Sn, Fe, Ni, Zn, and Pb are determined by a what if iterative procedure in Microsoft Excel. The peaks used for elements were the Sn L, Fe K, Ni K, Cu K, Zn K, and Pb L. The wt.% composition for the mirrors are determined by using the K i values applied to XRF spectrum collected at = 2. This expression can be checked by determined composition values for the other Concast standard known compositions. Calibration for the relatively weak Zn K intensity compared to the Cu K peak was made by subtracting a scaled Cu Kâ peak for Concast standard CT907 that was certified to contain only wt.% Zn. With the set of coefficients determined the measured Zn content for the Concast standard CT903 agreed to within 0.1 wt.% and for Concast standard CT907 within 0.04 wt.%. The average Zn wt.% for the six mirrors was 0.32 ±0.72 wt.% for a 2 tolerance. This value certainly straddles zero. Zn is expected to be the element with the largest tolerances. The compositions of the mirrors are indicted graphically in Fig. 7 and then tabulated in Table 1. Coefficients were set by ST932. Also shown in Table 1 are the deduced compositions for the two standards ST903 and ST907 furnished by Concast and their mass spectrograph measured compositions performed by Concast. For both of these other standards the determined and Concast certified compositions for Sn and Pb agree within 0.4 wt.% for each standard. The determined Cu content for the Concast standards CT903 and CT907 agree within 0.2 wt.% with measured Concast values. Mirror B that was archived on the basis of design to be from C. 800 CE was found to have much lower Sn composition than the 5 other mirrors, but much greater Pb concentration.
9 Wt.% AG2 BG2 CG2 DG2 EG2 FG2 Sn Cu Zn Pb Fig. 7. Mirrors A to F major metal content as calibrated from glancing angle at 2 are indicated. Table 1. Wt.% compositions for the mirrors A to F are indicated plus measured and known compositions for Concast certified standards ST932, ST903, and ST907. wt.% ST932 CT932G2 AG2 BG2 CG2 DG2 EG2 FG2 CT903G2 ST903 CT907G2 ST907 Sb Sn Fe Ni Cu Zn Pb Sum = Since at glancing angles a thinner surface region of the mirrors is sampled, it may be possible that the surface region is different from the interior because of surface segregation of one or more components. Since this is an alloy system it is expected than changes in composition should result in expanded or contracted lattice parameters. Figure 8 shows X-ray diffraction traces for different glancing angles for mirror D and a trace for the sample CT932. The fact that the diffraction angle remains constant for mirror D as a function of the glancing angle means that this mirror does not exhibit surface composition segregation. This figure also shows that the lattice parameter for mirror D is shifted from that of the standard CT932 because of alloying effects.
10 Copyright JCPDS-International Centre for Diffraction Data 2011 ISSN DG DG2 x DG CT932G theta for different glancing angles Fig. 8. X-Ray diffraction data for the main bronze diffraction reflection for different glancing angles for mirror D and the bronze standard CT932 are shown. Figure 9 shows that the lattice parameters for mirrors D, E, F are different and different from that of the standard. In each case the position of the diffraction peak does not shift with changing glancing angle values which shows that surface composition segregation is not observed. The bronzes as well as Cu exhibit a cubic structure with the major peak corresponding to the (111) reflection occurring at about 43 2-theta and the next most intense peak, the (200) at about 50 2-theta. Figure 10 shows the ratio of the (200) intensity to the (111) intensity as a function of glancing angle for mirror D. This figure shows that the interior as sampled at large glancing angles exhibits a diffraction pattern similar to that for a random oriented sample, but that the surface region as sampled at small glancing angles exhibits a predominant (111) texture. Note that as shown above that this texture change is not accompanied by a surface composition change.
11 Copyright JCPDS-International Centre for Diffraction Data 2011 ISSN Counts 1400 CT932G FG DG EG theta degres Fig. 9. X-Ray diffraction data for the mirrors D, E, F, and the bronze standard CT932 are shown. Int. Ratio (200)/(111) Mirror D Glancing Angle Omega degrees Fig. 10. The intensity ratios of the bronze (200) to (111) reflections for mirror D are shown versus the glancing angle.
12 CONCLUSIONS It was shown that the relative XRF intensity of the Sn La/Ka was independent of the glancing excitation angle for near 2. The XRF intensities were then calibrated by a set of coefficients to give agreement with the composition of mass spectrographically analyzed known standard composition. The coefficients could then be used to determine the major element composition for XRF excitation at a glancing angle of 2 for the six Chinese bronze mirrors and for two other bronze standards to a high precision of 0.3 wt.% for Sn and Pb. Even though a Cu X-ray tube was used in the analysis, a bronze sample with a similar Cu content to that in the mirrors was used for the composition calibration. Any spurious effects that might affect the Cu peak such as Rayleigh scatter are expected to affect the concentration standard and mirror samples equally and thus cancel out. XRD results showed that the diffraction angle for the principal (111) reflection was independent of the glancing angle w. This result shows that composition segregation was not a problem and gave validity to the compositions determined at a glancing angle of 2. The relative intensity of the XRD (200)/(111) bronze reflections did change as a function of implying that the outer surface regions were (111) oriented crystallites. The XRF composition analysis showed that mirror B that the museum had ascribed to the about 800 CE time period was substantially different in Sn and Pb concentration than the other five mirrors. REFERENCES * Author for Correspondence: F. J. Cadieu, cadieu@qc.edu Cadieu, F. J., Vander, I. Rong, Y. and Zuneska, R. W. (2010) Glancing XRD and XRF for the Study of Texture Development in SmCo Based Films Sputtered Onto Silicon Substrates, Denver X-Ray Conference 2010, Paper F-11. Chou, J. (2000). Circles of Reflection: The Carter Collection of Chinese Bronze Mirrors, Cleveland, The Cleveland Museum of Art. van Brussel, B. A., and De Hosson, J. Th. (1994), Glancing Angle X-Ray Diffraction: A Different Approach, Appl. Phys. Lett. 64, Winter, Amy H. (2003), The Light of Infinite Wisdom, Asian Art From the Godwin- Ternbach Museum, NYC, The Godwin-Ternbach Museum, Queens College of CUNY.
ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION
173 ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION N. A. Raftery, L. K. Bekessy, and J. Bowpitt Faculty of Science, Queensland University of Technology, GPO Box 2434,
More informationAEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD
Copyright JCPDS-International Centre for Diffraction Data 2014 ISSN 1097-0002 219 AEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD Takao Moriyama 1), Atsushi Morikawa 1), Makoto
More informationRADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA
90 RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA Christopher G. Worley Los Alamos National Laboratory, MS G740, Los Alamos, NM 87545 ABSTRACT Energy dispersive X-ray fluorescence (EDXRF) is a rapid, straightforward
More informationPeter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K.
783 SCOPE AND LIMITATIONS XRF ANALYSIS FOR SEMI-QUANTITATIVE Introduction Peter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K. Historically x-ray fluorescence spectrometry has
More informationBENEFITS OF IMPROVED RESOLUTION FOR EDXRF
135 Abstract BENEFITS OF IMPROVED RESOLUTION FOR EDXRF R. Redus 1, T. Pantazis 1, J. Pantazis 1, A. Huber 1, B. Cross 2 1 Amptek, Inc., 14 DeAngelo Dr, Bedford MA 01730, 781-275-2242, www.amptek.com 2
More informationTHE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 96 THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS
More informationIMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 158 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. H.
More informationCALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY
Copyright -International Centre for Diffraction Data 2010 ISSN 1097-0002 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba, M. Mantler, H. Ebel, R. Svagera Technische Universit Vienna,
More informationNEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 266 NEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
More informationELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS
390 ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS J. C. Rao 1, 2 *, M. Song 2, K. Mitsuishi 2, M. Takeguchi 2, K. Furuya 2 1 Department
More informationCALCULATION OF THE DETECTOR-CONTRIBUTION TO ZIRCONIUM PEAKS IN EDXRF SPECTRA OBTAINED WITH A SI-DRIFT DETECTOR
CALCULATION OF THE DETECTOR-CONTRIBUTION TO ZIRCONIUM PEAKS IN EDXRF SPECTRA OBTAINED WITH A SI-DRIFT DETECTOR A. C. Neiva 1, J. N. Dron 1, L. B. Lopes 1 1 Escola Politécnica da Universidade de São Paulo
More informationADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES
187 188 ADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES ABSTRACT W. T. Elam, B. Scruggs, F. Eggert, and J. A. Nicolosi EDAX, a unit of Ametek Inc., 91 McKee Drive, Mahwah,
More informationCHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE
CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE 218 Chris M. Sparks 1, Elizabeth P. Hastings 2, George J. Havrilla 2, and Michael Beckstead 2 1. ATDF,
More informationLASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE
Copyright(C)JCPDS-International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Vol.46 74 ISSN 1097-0002 LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani 1, D. Wells
More informationFUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS 255 Yoshiyuki Kataoka 1, Naoki Kawahara 1, Shinya Hara 1, Yasujiro Yamada 1, Takashi Matsuo 1, Michael Mantler 2 1 Rigaku
More informationMT Electron microscopy Scanning electron microscopy and electron probe microanalysis
MT-0.6026 Electron microscopy Scanning electron microscopy and electron probe microanalysis Eero Haimi Research Manager Outline 1. Introduction Basics of scanning electron microscopy (SEM) and electron
More informationFUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
45 ABSTRACT FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS W. T. Elam, Robert B. Shen, Bruce Scruggs, and Joseph A. Nicolosi EDAX, Inc. Mahwah, NJ 70430 European Community Directive 2002/95/EC
More informationINFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES
122 INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES I. Busch 1, M. Krumrey 2 and J. Stümpel 1 1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
More informationUSABILITY OF PORTABLE X-RAY SPECTROMETER FOR DISCRIMINATION OF VALENCE STATES
Copyright (c)jcpds-international Centre for Diffraction Data 00, Advances in X-ray Analysis, Volume 45. 409 ISSN 1097-000 USABIITY OF POTABE X-AY SPECTOMETE FO DISCIMINATION OF VAENCE STATES I.A.Brytov,.I.Plotnikov,B.D.Kalinin,
More informationOverview of X-Ray Fluorescence Analysis
Overview of X-Ray Fluorescence Analysis AMPTEK, INC., Bedford, MA 01730 Ph: +1 781 275 2242 Fax: +1 781 275 3470 sales@amptek.com 1 What is X-Ray Fluorescence (XRF)? A physical process: Emission of characteristic
More informationDEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN THICK MATERIALS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 59 DEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN
More informationTime-Resolved μ-xrf and Elemental Mapping of Biological Materials
296 Time-Resolved μ-xrf and Elemental Mapping of Biological Materials K. Tsuji 1,2), K. Tsutsumimoto 1), K. Nakano 1,2), K. Tanaka 1), A. Okhrimovskyy 1), Y. Konishi 1), and X. Ding 3) 1) Department of
More informationA COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 320 A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS Hiroyoshi SOEJIMA and
More informationABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS
302 ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS M. Song 1, K. Mitsuishi 1, M. Takeguchi 1, K. Furuya 1, R. C. Birtcher 2 1 High Voltage Electron Microscopy Station, National
More informationUnderstanding X-rays: The electromagnetic spectrum
Understanding X-rays: The electromagnetic spectrum 1 ULa 13.61 kev 0.09 nm BeKa 0.11 kev 11.27 nm E = hn = h c l where, E : energy, h : Planck's constant, n : frequency c : speed of light in vacuum, l
More informationCHARACTERIZATION OF Pu-CONTAINING PARTICLES BY X-RAY MICROFLUORESCENCE
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 534 CHARACTERIZATION OF Pu-CONTAINING PARTICLES BY X-RAY MICROFLUORESCENCE Marco Mattiuzzi, Andrzej Markowicz,
More informationX-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 321 X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Kazuhiro Takada 1,
More informationSTRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 106 STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F. A. Selim 1, D.P. Wells 1, J. F. Harmon 1,
More informationTRACE ELEMENT ANALYSIS USING A BENCHTOP TXRF- SPECTROMETER
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 236 ABSTRACT TRACE ELEMENT ANALYSIS USING A BENCHTOP TXRF- SPECTROMETER Hagen Stosnach Röntec GmbH,
More informationACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 369 ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM
More informationAPPLICATION OF MICRO X-RAY FLUORESCENCE SPECTROMETRY FOR LOCALIZED AREA ANALYSIS OF BIOLOGICAL AND ENVIRONMENTAL MATERIALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 540 APPLICATION OF MICRO X-RAY FLUORESCENCE SPECTROMETRY FOR LOCALIZED AREA ANALYSIS OF BIOLOGICAL AND
More informationIMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 281 IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE Susumu Imashuku 1, Deh Ping Tee 1, Yasukazu
More informationMCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 363 MCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT J.E. Fernández, V.
More informationFACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE
Copyright JCPDS-International Centre for Diffraction Data 26 ISSN 197-2 FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE 31 K. L. Kelly and B. K. Tanner Department
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationSwanning about in Reciprocal Space. Kenneth, what is the wavevector?
Swanning about in Reciprocal Space or, Kenneth, what is the wavevector? Stanford Synchrotron Radiation Laboratory Principles The relationship between the reciprocal lattice vector and the wave vector is
More informationPERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES
249 PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES F. I. G. M. Borges, S. J. C. do Carmo, T. H. V. T. Dias, F.
More informationUnderstanding X-rays: The electromagnetic spectrum
Understanding X-rays: The electromagnetic spectrum 1 ULa 13.61 kev 0.09 nm BeKa 0.11 kev 11.27 nm E = hn = h c l where, E : energy, h : Planck's constant, n : frequency c : speed of light in vacuum, l
More informationInternational Journal of Scientific & Engineering Research, Volume 5, Issue 3, March-2014 ISSN
316 Effective atomic number of composite materials by Compton scattering - nondestructive evaluation method Kiran K U a, Ravindraswami K b, Eshwarappa K M a and Somashekarappa H M c* a Government Science
More informationIssues With TXRF Angle Scans and Calibration
Copyright (C) JCPDS-International Centre for Diffraction Data 1999 794 Issues With TXRF Angle Scans and Calibration Dennis Werho, Stephen N. Schauer, and George F. Carney, Motorola, Inc., AZ Abstract Previous
More informationAnalysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy Hiroshi Onodera Application & Research Center, JEOL Ltd. Introduction um, PBB and PBDE) are subject to usage restrictions in Europe.
More informationULTRATHIN LAYER DEPOSITIONS A NEW TYPE OF REFERENCE SAMPLES FOR HIGH PERFORMANCE XRF ANALYSIS
298 299 ULTRATHIN LAYER DEPOSITIONS A NEW TYPE OF REFERENCE SAMPLES FOR HIGH PERFORMANCE XRF ANALYSIS M. Krämer 1), R. Dietsch 1), Th. Holz 1), D. Weißbach 1), G. Falkenberg 2), R. Simon 3), U. Fittschen
More informationCOMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS - I. THEORY
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 380 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS - I. THEORY
More informationXUV 773: X-Ray Fluorescence Analysis of Gemstones
Fischer Application report vr118 HELM UT FISCHER GMBH + CO. KG Institut für Elektronik und Messtechnik Industriestrasse 21-7169 Sindelfingen, Germany Tel.: (+49) 731 33- - Fax: (+49) 731 33-79 E-Mail:
More informationprint first name print last name print student id grade
print first name print last name print student id grade Experiment 2 X-ray fluorescence X-ray fluorescence (XRF) and X-ray diffraction (XRD) may be used to determine the constituent elements and the crystalline
More informationCopyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol ISSN
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 129 MATHEMATICAL OF DIFFRACTION PROPERTIES POLE FIGURES ABSTRACT Helmut Schaeben Mathematics and Computer
More informationMEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS
, MEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS K.O. Goyal, J.W. Westphal Semiconductor Equipment Group Watkins-Johnson Company Scotts Valley, California 95066 Abstract Deposition of borophosphosilicate
More informationRIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 261 RIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES G. Kimmel
More informationAuger Electron Spectroscopy
Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection
More informationSetting The motor that rotates the sample about an axis normal to the diffraction plane is called (or ).
X-Ray Diffraction X-ray diffraction geometry A simple X-ray diffraction (XRD) experiment might be set up as shown below. We need a parallel X-ray source, which is usually an X-ray tube in a fixed position
More informationInformation on the test material EDS-TM002 and the BAM software package EDX Spectrometer Test for determination of the spectrometer performance
BAM 6.8 8.5.213 Information on the test material EDS-TM2 and the BAM software package EDX Spectrometer Test for determination of the spectrometer performance 1. Introduction Energy dispersive spectrometers
More informationQUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES
QUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES 287 Chul-Un Ro Department of Chemistry, Inha University 253, Yonghyun-dong, Nam-gu, Incheon 402-751, Korea ABSTRACT
More informationED(P)XRF: SCREENING ANALYSIS AND QUANTITATIVE ANALYSIS with POLARIZED
384 ED(P)XRF: SCREENING ANALYSIS AND QUANTITATIVE ANALYSIS with POLARIZED X-RAYS R. Schramm, J. Heckel, K. Molt 2 Spectra Analytical Instruments, Kleve, Germany. 2Gerhard-Mercator- University Duisburg,
More informationMONTE-CARLO MODELING OF SILICON X-RAY DETECTORS
274 MONTE-CARLO MODELING OF SILICON X-RAY DETECTORS Brian Cross (1), Greg Bale (2), Barrie Lowe (2) and Rob Sareen (2) (1) CrossRoads Scientific, 414 Av. Portola, El Granada, CA 94018-1823, USA. (2) Gresham
More informationLAB 01 X-RAY EMISSION & ABSORPTION
LAB 0 X-RAY EMISSION & ABSORPTION REPORT BY: TEAM MEMBER NAME: Ashley Tsai LAB SECTION No. 05 GROUP 2 EXPERIMENT DATE: Feb., 204 SUBMISSION DATE: Feb. 8, 204 Page of 3 ABSTRACT The goal of this experiment
More informationIn Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron Radiation
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 371 In Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron
More informationCopyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 386 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS II. EVALUATION
More informationX-ray Spectroscopy. Danny Bennett and Maeve Madigan. October 12, 2015
X-ray Spectroscopy Danny Bennett and Maeve Madigan October 12, 2015 Abstract Various X-ray spectra were obtained, and their properties were investigated. The characteristic peaks were identified for a
More informationSYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD
73 SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD Atsuo Iida 1), Yoichi Takanishi 2) 1)Photon Factory, Institute of Materials Structure Science, High Energy
More informationSCINTILLATION DETECTORS & GAMMA SPECTROSCOPY: AN INTRODUCTION
SCINTILLATION DETECTORS & GAMMA SPECTROSCOPY: AN INTRODUCTION OBJECTIVE The primary objective of this experiment is to use an NaI(Tl) detector, photomultiplier tube and multichannel analyzer software system
More informationFINDING DESCRIPTORS USEFUL FOR DATA MINING IN THE CHARACTERIZATION DATA OF CATALYSTS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 338 FINDING DESCRIPTORS USEFUL FOR DATA MINING IN THE CHARACTERIZATION DATA OF CATALYSTS C. K. Lowe-Ma,
More informationION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM.
822 ION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM. Abstract A.P.Morovov, L.D.Danilin, V.V.Zhmailo, Yu.V.Ignatiev, A.E.Lakhtikov,
More informationDATA MINING WITH DIFFERENT TYPES OF X-RAY DATA
DATA MINING WITH DIFFERENT TYPES OF X-RAY DATA 315 C. K. Lowe-Ma, A. E. Chen, D. Scholl Physical & Environmental Sciences, Research and Advanced Engineering Ford Motor Company, Dearborn, Michigan, USA
More informationBRAGG AND BARKLA POLARIZATION IN EDXRF
BRAGG AND BARKLA POLARIZATION IN EDXRF J Heckel, R. Schramm2 Spectra Analytical Instruments, Kleve, Germany. 2Gerhard-Mercator-University Duisburg, Germany. ABSTRACT The use of a combination target consisting
More informationCHEM-E5225 :Electron Microscopy X-Ray Spectrometry
CHEM-E5225 :Electron Microscopy X-Ray Spectrometry 2016.11 Yanling Ge Outline X-ray Spectrometry X-ray Spectra and Images Qualitative and Quantitative X-ray Analysis and Imaging Discussion of homework
More informationLatest advances in identifying mineral composition variation by the M4 TORNADO AMICS
Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS Bruker Nano Analytics, Berlin, Germany Webinar, June 15, 2017 Innovation with Integrity Presenters Samuel Scheller Sr.
More informationSFT3000S Measurement of Sn-Cu Coating
SFT N0.19 SEP.2001 SFT3000S Measurement of Sn-Cu Coating 1. Overview Recently, Sn-Cu solder has been used in replacement of lead type solders. This application brief introduces several points you should
More informationA NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILM
Copyright JCPS - International Centre for iffraction ata, Advances in X-ray Analysis, Volume 46. 56 A NEW SALL ANGLE X-RAY SCATTERING TECHNIQUE FOR ETERINING NANO-SCALE PORE/PARTICLE SIZE ISTRIBUTIONS
More informationElectron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn?
Electron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn? EPMA - what is it? Precise and accurate quantitative chemical analyses of micron-size
More informationPortable type TXRF analyzer: Ourstex 200TX
Excerpted from Adv. X-Ray. Chem. Anal., Japan: 42, pp. 115-123 (2011) H. Nagai, Y. Nakajima, S. Kunimura, J. Kawai Improvement in Sensitivity and Quantification by Using a Portable Total Reflection X-Ray
More informationMATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 249 MATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
More informationREALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 218 REALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR S. M. Owens Laboratory for High Energy Astrophysics,
More informationSEM. Chemical Analysis in the. Elastic and Inelastic scattering. Chemical analysis in the SEM. Chemical analysis in the SEM
THE UNIVERSITY Chemical Analysis in the SEM Ian Jones Centre for Electron Microscopy OF BIRMINGHAM Elastic and Inelastic scattering Electron interacts with one of the orbital electrons Secondary electrons,
More informationCauchois Johansson x-ray spectrograph for kev energy range
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 72, NUMBER 2 FEBRUARY 2001 Cauchois Johansson x-ray spectrograph for 1.5 400 kev energy range E. O. Baronova a) and M. M. Stepanenko RRC Kurchatov Institute, 123182,
More information2.3 Particle Induced X-Ray Emission PIXE
2.3 Particle Induced X-Ray Emission PIXE The previous section concentrated on X-ray fluorescence. This section discusses a different X-ray production technique that can lead to the development of 2-D/3-D
More informationFUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 511 FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON
More informationAN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS
96 AN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS T. N. Blanton 1, D.R Whitcomb 2, and S.T. Misture 3 1 Eastman Kodak Company, Kodak Research Laboratories, Rochester, NY 14650-2106,
More informationElemental analysis by X-ray f luorescence. Sequential benchtop WDXRF spectrometer
Elemental analysis by X-ray f luorescence Sequential benchtop WDXRF spectrometer Elemental analysis is one of the most important fundamental measurements made for industrial quality control and research
More informationSurface Analysis. Dr. Lynn Fuller Dr. Fuller s Webpage:
ROCHESTER INSTITUTE OF TECHNOLOGY MICROELECTRONIC ENGINEERING Surface Analysis Dr. Lynn Fuller Dr. Fuller s Webpage: http://people.rit.edu/lffeee 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585)
More informationVORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 332 VORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS Shaul Barkan,
More informationFINDING A NEEDLE IN A HAYSTACK: PERFORMANCE EVALUATION OF PORTABLE XRF INSTRUMENTS FROM THREE MANUFACTURERS
FINDING A NEEDLE IN A HAYSTACK: PERFORMANCE EVALUATION OF PORTABLE XRF INSTRUMENTS FROM THREE MANUFACTURERS Brand N. W 1 and Brand CJ 1 1 Portable XRF Services Pty Ltd. Suite 1, 5 Colin Street, West Perth,
More informationLesson 2 Diffractometers & Phase Identification
Lesson 2 Diffractometers & Phase Identification Nicola Döbelin RMS Foundation, Bettlach, Switzerland February 11 14, 2013, Riga, Latvia Repetition: Generation of X-rays Kα 1 Target (Cu, Mo, Fe, Co,...)
More informationX-ray fluorescence analysis - calibration of the X-ray energy detector
X-ray fluorescence analysis - TEP Related topics Bremsstrahlung, characteristic X-radiation, energy levels, fluorescence radiation, conduction processes in semiconductors, doping of semiconductors, pin-diodes,
More informationEFFECT OF CALIBRATION SPECIMEN PREPARATION TECHNIQUES ON NARROW RANGE X-RAY FLUORESCENCE CALIBRATION ACCURACY
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 424 EFFECT OF CALIBRATION SPECIMEN PREPARATION TECHNIQUES ON NARROW RANGE X-RAY FLUORESCENCE CALIBRATION
More informationInstantaneous reduction of graphene oxide at room temperature
Instantaneous reduction of graphene oxide at room temperature Barun Kuma Burman, Pitamber Mahanandia and Karuna Kar Nanda Materials Research Centre, Indian Institute of Science, Bangalore-560012, India
More informationX-ray absorption. 4. Prove that / = f(z 3.12 ) applies.
Related topics Bremsstrahlung, characteristic radiation, Bragg scattering, law of absorption, mass absorption coefficient, absorption edge, half-value thickness, photoelectric effect, Compton scattering,
More informationBragg reflection :determining the lattice constants of monocrystals
Bragg reflection :determining the lattice constants of monocrystals Objectives: 1-Investagating Bragg reflection at Nacl monocrystal -determinig the lattice constant a 0 of NaCl. Theory: Bragg's law of
More informationMICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES
THE PUBLISHING HOUSE PROCEEDINGS OF THE ROMANIAN ACADEMY, Series A, OF THE ROMANIAN ACADEMY Volume 18, Number 1/2017, pp. 42 49 MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES Ion GRUIA University
More informationAn Analysis of Secondary Enhancement Effects in Quantitative XRFA
An Analysis of Secondary Enhancement Effects in Quantitative XRFA Michael Mantler Institut fur Angewandte und Technische Physik Vienna University of Technology, Vienna, Austria Secondary enhancement effects
More informationCombined XRD and XRF for Comprehensive Materials Analysis
XRD-XRF Instrument BTX Profiler Combined XRD and XRF for Comprehensive Materials Analysis Mineralogy-Phase Analysis with 2-D-XRD Elemental Analysis with ED-XRF Seamless Integration of Data and Results
More information1 of 5 14/10/ :21
X-ray absorption s, characteristic X-ray lines... 4.2.1 Home About Table of Contents Advanced Search Copyright Feedback Privacy You are here: Chapter: 4 Atomic and nuclear physics Section: 4.2 Absorption
More informationCHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
More informationAdvances in Field-Portable XRF
Advances in Field-Portable XRF Volker Thomsen and Debbie Schatzlein Field-portable x-ray fluorescence (XRF) allows us to take the laboratory to the sample. The latest generation of such handheld x-ray
More informationX-rays. X-ray Radiography - absorption is a function of Z and density. X-ray crystallography. X-ray spectrometry
X-rays Wilhelm K. Roentgen (1845-1923) NP in Physics 1901 X-ray Radiography - absorption is a function of Z and density X-ray crystallography X-ray spectrometry X-rays Cu K α E = 8.05 kev λ = 1.541 Å Interaction
More informationCharacterizing Biological Macromolecules by SAXS Detlef Beckers, Jörg Bolze, Bram Schierbeek, PANalytical B.V., Almelo, The Netherlands
Characterizing Biological Macromolecules by SAXS Detlef Beckers, Jörg Bolze, Bram Schierbeek, PANalytical B.V., Almelo, The Netherlands This document was presented at PPXRD - Pharmaceutical Powder X-ray
More informationANALYSIS OF GEOLOGIC MATERIALS USING RIETVELD QUANTIATIVE X-RAY DIFFRACTION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 204 ANALYSIS OF GEOLOGIC MATERIALS USING RIETVELD QUANTIATIVE X-RAY DIFFRACTION Robin M. Gonzalez,
More informationat Oak Ridge National Laboratory.
361 Designs for Neutron Radiography at Oak Ridge National Laboratory and Computed Tomography Dudley A. Raine lipv4, Camden R. Hubbard, Paul M. Whaley, and Michael C. Wright3 Oak Ridge National Laboratory
More informationSpin-resolved photoelectron spectroscopy
Spin-resolved photoelectron spectroscopy Application Notes Spin-resolved photoelectron spectroscopy experiments were performed in an experimental station consisting of an analysis and a preparation chamber.
More informationFig 1: Auger Electron Generation (a) Step 1 and (b) Step 2
Auger Electron Spectroscopy (AES) Physics of AES: Auger Electrons were discovered in 1925 but were used in surface analysis technique in 1968. Auger Electron Spectroscopy (AES) is a very effective method
More informationPulsed Laser Deposition of laterally graded NE-multilayers. application in parallel beam X-ray optics
Copyright (C) JCPDS International Centre for Diffraction Data 1999 346 Pulsed Laser Deposition of laterally graded NE-multilayers and their application in parallel beam X-ray optics T. Holz, R. Dietsch,
More information