FINDING DESCRIPTORS USEFUL FOR DATA MINING IN THE CHARACTERIZATION DATA OF CATALYSTS
|
|
- Adrian Fox
- 5 years ago
- Views:
Transcription
1 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume FINDING DESCRIPTORS USEFUL FOR DATA MINING IN THE CHARACTERIZATION DATA OF CATALYSTS C. K. Lowe-Ma, A. R. Drews, A. E. Chen Research & Advanced Engineering, Ford Motor Company, Dearborn, Michigan, USA ABSTRACT The ultimate goal of materials characterization is often to optimize materials by relating observed features to a response function or performance specification. For X-ray data to be successfully included in statistical or data mining methodologies that examine contributions to a response function, sufficient pieces of information of the right kind must be extracted from the X-ray data. Traditional X-ray analysis methods using individual comparisons cannot keep up with the flux of specimens and data needed for data mining approaches to materials optimization. The work described herein focuses on obtaining descriptors from X-ray fluorescence, X-ray powder diffraction, and other characterization data from automotive exhaust-gas catalysts using automated or semi-automated processes, and relating these descriptors to other performance measures. Our results are also relevant to informatics requirements for high-throughput screening and combinatorial studies. INTRODUCTION The goal of this work is to combine X-ray powder diffraction features with other characterization data to build up mathematical relationships in automated or semi-automated processes that not only describe existing data, but can also predict results and materials performance. These new data analysis approaches can (a) help to develop better catalysis strategies and new materials, (b) help to understand failure mechanisms, and (c) help in examining large numbers of fleet and customer-aged catalysts for usage-dependent aging. Understanding and improving automotive exhaust-gas catalysis enables us to improve air quality by continuing to mitigate undesirable exhaust gases. Although automotive exhaust-gas catalysts are only one component of a complex exhaust emissions system, the catalysts themselves are also complex heterogeneous chemical systems designed to perform multiple functions. An example of an automotive exhaust-gas catalyst is shown in Figure 1. FINDING AND USING DESCRIPTORS Statistical methods and data mining algorithms have evolved to handle discrete bits of information that are abstractions of data that may not necessarily have simple physical interpretations. Ideal descriptors are those that can provide real distinctions amongst data without redundancy. The value of descriptors derives from using them to enable comparisons between disparate unrelated-types of characterization data. One of the difficulties and challenges of obtaining useful descriptors is that the results of subsequent statistical analyses or data mining algorithms may be quite dependent on the form and choice of descriptors! [1] Complex data, such as X-ray powder diffraction patterns of catalyst materials, are often difficult and very time consuming to interpret, making detailed individual interpretations impractical if
2 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume large numbers of samples are involved. Accurately predicting catalyst performance over a wide variety of scenarios requires models built upon large numbers of specimens and built upon data from different sources, hence the need to find data-driven descriptors that can provide the most useful information from the fewest variables in an automated fashion. Substrate Active catalytic material Figure 1. Shown at the left is a catalytic converter brick for a vehicle. The magnified image in the middle shows the channels in the brick through which engine exhaust gases pass. The electron microscopy image at the right is an image a single corner of a channel and shows the active catalytic material that has been washcoated onto the substrate. Most physical characterization techniques (and their associated software) have evolved to examine one (or small n) sample(s) at a time. For example, X-ray powder diffraction scans are collected sequentially, one at a time, on an individual specimen. Each resulting diffraction scan is processed either by hand or in a batch mode for baseline correction, possibly some additional geometric corrections, and peak picking. Each processed diffraction scan is then analyzed to identify phases present, possibly analyzed for crystallite size or quantitative information, and relationships to other characterization data are deduced manually. The limitations of this conventional approach are obvious: it is problematic for materials containing many phases with severe overlap; it is problematic for complex mixtures of crystalline and poorly crystalline materials; and it is certainly problematic for handling large numbers of diffraction patterns containing many phases of variable crystallinity mixed with highly crystalline (but uninteresting) substrate phases. Figure 2 shows representative powder diffraction data obtained from the active catalytic material scraped from three different catalysts and illustrates how unrealistic a conventional approach might be. Several approaches to computationally examining diffraction patterns were considered. Described herein are results obtained by: (a) using whole-pattern (SNAP)-derived correlations and peaks as descriptors, (b) using expectation maximization to bin peaks into clusters and using the clusters as descriptors, and (c) using principle component analysis of large regions of raw powder pattern data to obtain key factors with high variance (high information content). COMPUTATIONALLY-DERIVED DESCRIPTORS INSTEAD OF PHASE DESCRIPTORS
3 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume Using the non-parametric whole-pattern analysis described by Gilmore, et al, [2] (also called SNAP), correlations amongst a set of catalyst diffraction patterns were obtained from pair-wise pattern comparisons between catalyst diffraction patterns and a standard set of reference patterns for different ceria-zirconia compositions and crystallinity. These correlations, when examined for clustering, yield the hierarchical cluster analysis tree (without pruning and using standard tree clustering algorithms [3]) shown in Figure 3. The resulting tree exhibits three (or possibly four) major clusters. These correlation values (or the mean value of each cluster) could, therefore, be used in subsequent analyses as a variable (or a descriptor) representative of the type and composition of ceria-zirconia present in the catalyst. Figure 2. Representative diffraction data obtained from the catalytic material in automotive catalysts. Figure 3. Hierarchical cluster analysis tree illustrating the clustering of correlation coefficients obtained from SNAP (see text). The horizontal axis shows individual data labels.
4 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume A concern with using SNAP-derived correlations is that every pair-wise comparison yields only a single value that may not adequately represent the complexity and subtle differences between diffraction patterns containing data of the type shown in Figure 2. For this reason, an approach using peaks was also considered. Peak positions and intensities (d's & I's) have, historically, been used as short-hand descriptors for powder patterns. However, the mechanics of the approach we used was rather different and more amenable to computational methods. A complete list of all observed peak positions from a number of diffraction patterns was used as input to a clustering algorithm using expectation maximization [4]. Expectation Maximization examines distributions of data and develops naïve Bayesian probabilities about which data values (peak positions) belong together. A sampling of the cluster or binning results is shown in Table I below. Then, using normalized intensities (from zero to one) to represent the peak heights every diffraction pattern exhibits for each bin, relationships between the peak-position bins can be further examined. For example, Table II shows, for small a subset of bins, intensity-based correlations between some bins. Over an entire scan, redundant phase composition information is present in diffraction data that contain no distortions due to preferred orientation. In the present example, although the major ceria-zirconia [111] peak envelope region was not included in the expectation maximization procedure, enough ceria-zirconia phase information still remains in other parts of the diffraction pattern to derive a general regression relationship between binned (peak) intensities and the amount of cerium observed by X-ray fluorescence (Figure 4). Table I. Sample of expectation maximization results (after including diffraction knowledge about the likely spread in peak position values). N is the number of patterns examined containing a peak at that average position. cluster, or bin # 2theta Std.Error % 99.00% N Table II. Example of intensity-based correlations between peak-position bins. The blue highlighted values in the and columns are correlations from peaks due to the same phase cordierite from the substrate. The green highlighted correlation is new information not previously known; peaks at and at appear to be due to the same (but unknown) phase
5 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume Expectation Maximization may represent a different, and possibly improved approach to phase analysis through intensity correlations, but this approach still results in far too many variables (too many peak positions). Another approach is to use Principle Component Analysis (PCA) to obtain composite factors that contain the largest amount of information. [5] PCA has been used in other diffraction studies [6] and has been widely used in the spectroscopy community [5b, 7]. PCA could be used to reduce the number of peak-position bins obtained by expectation maximization but PCA on peak-position bins could be problematic because across any given set of diffraction scans many of the peak-position bins may have zero peak intensity. However, if PCA is used on raw normalized data, every 2θ step becomes a variable and the intensity is the value of the variable. Shown in Figure 5 are plots of the first two principle components obtained from raw diffraction data over a "low-angle" region and over a "mid-angle" region. Because PCA derives directions in parameter space with the highest variance (information content), the PCA approach is able to delineate differences between the diffraction data for three types of catalysts; and these differences are more substantive than being due to just the variable amount of cordierite substrate that inadvertently occurs when scraping catalyst washcoat. Figure 4. Comparison of the regression-predicted Ce composition with the observed Ce from XRF. INCORPORATING DESCRIPTORS FROM OTHER CHARACTERIZATION TECHNIQUES Analytical techniques such as quantitative X-ray fluorescence generally yield descriptors (numerical values for composition) that are examined easily for relationships. Other spectroscopic characterization methods can yield descriptors using procedures similar to those described here for X-ray diffraction data. Continuous curve data (e.g., reactor or emissions data) represent another type of data for which obtaining useful descriptors can be difficult. Images, and microscopy images in particular, also pose challenges to using computational methods to examine relationships. For electron microprobe images of catalysts, we obtain descriptors by separating substrate regions from washcoat and then derive elemental spatial correlations from the X-ray emission maps. [8] PUTTING IT ALL TOGETHER RELATIONSHIPS BETWEEN DESCRIPTORS AND PERFORMANCE Aggregate X-ray diffraction descriptors, such as the first few PCA factors, can be compared to performance groupings derived from, e.g., tailpipe emissions to determine the usefulness of the descriptors. Figure 6a shows the effectiveness of the selected X-ray diffraction PCA factors in discriminating amongst emissions-based groupings. The larger the numbers on both axes, the
6 This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website ICDD Website -
7 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. better the discrimination. Some discrimination occurs using just the X-ray diffraction descriptors (Figure 6a), but the discrimination between performance groups is greatly enhanced if the most important PCA factors from electron microprobe image correlations and from XRF-based compositions are included with the X-ray diffraction factors (Figure 6b). Figure 5. Plots illustrating the ability of the first PCA factor (horizontal axis) and second PCA factor (vertical axis) derived from raw X-ray diffraction data to separate three different types of catalysts into three (known) types of catalyst. The plot on the left shows the first two PCA factors derived from "lowangle" data; the plot on the right shows the first two PCA factors for "mid-angle" data. Figure 6a. Figure 6b. Figure 6. Plots of each catalyst discriminant score for the first two discriminant functions (canonical roots). Discriminant analysis is used to determine which variables can successfully differentiate between groups, in this case, groups based on emission performance. Discriminant functions are obtained from weighted linear combinations of variables with the weights derived to maximize differentiation between groups. As shown above, PCA factors derived from raw XRD data can (marginally) discriminate between emission groups (6a), but the differentiation between emissions groups is notably more effective if the first few PCA factors obtained from XRF and EPMA data are also included (6b). 343
8 Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume CONCLUSIONS SNAP is a powerful approach to comparing diffraction patterns and enables obtaining useful correlations between whole patterns. Expectation Maximization is found to be useful for deriving clusters of peaks associated with a single average peak position (a peak bin); correlations between intensities in the bins can then be used to determine which peaks belong together and are due to a single phase. Principle Component Analysis of normalized step-scan data is found to yield useful descriptors that subsequently can be related to measures of materials performance. These approaches to deriving descriptors from powder diffraction data will facilitate finding new and improved inorganic materials, especially heterogeneous catalytic materials, using high-throughput discovery methods and data mining to target specific property criteria. REFERENCES [1] Kantardzic, M., Data Mining -- Concepts, Models, Methods, and Algorithms, Wiley-Interscience, IEEE Press: New Jersey (2003), pp [2] Gilmore, C. J., Barr, G., Paisley, J., High Throughput Powder Diffraction I: Full-profile Qualitative and Quantitative Powder Diffraction Pattern Analysis, J. Appl. Crystall. (submitted) [3] StatSoft, Inc. (2003). STATISTICA (data analysis software system), version 6. Tulsa, Oklahoma: [4] Mitchell, T. M., Machine Learning, McGraw-Hill: Boston (1997), pp [5] (a) Reference [1], pp ; (b) Jurs, P.C., "Chemometric and Multivariate Analysis in Analytical Chemistry" in Reviews in Computational Chemistry, Lipkowitz and Boyd, edit., VCH Publishers: New York (1990), pp ; (c) Jambu, M., Exploratory and Multivariate Data Analysis, Academic Press: Boston (1991), pp [6] (a) Kato, M., Fujii, S., Ui, T., Asada, E., Powder Diffract. 5(1), (1990); (b) Klar, P.J., Chen, L., Rentschler, T., J. Mater. Chem., 6(11), (1996); (c) Artursson, T., et al., Applied Spectr., 54(8), (2000); (d) Hida, M., Sato, H., Sugawara, H., Mitsui, T., Forensic Science International 115, (2001). [7] (a) Aries, R., Lidiard, D., Spragg, R., Spectroscopy 5(3), (1990); (b) Workman, J.J., et al., "Review of Chemometrics Applied to Spectroscopy: , Part I" in Applied Spectr.Reviews, 31(1&2), (1996). [8] Chen, A.E. and Lowe-Ma, C.K., Microscopy and Microanalysis 7, Suppl. 2, (2001).
9 A concern with using SNAP-derived correlations is that every pair-wise comparison yields only a single value that may not adequately represent the complexity and subtle differences between diffraction patterns containing data of the type shown in Figure 2. For this reason, an approach using peaks was also considered. Peak positions and intensities (d's & I's) have, historically, been used as short-hand descriptors for powder patterns. However, the mechanics of the approach we used was rather different and more amenable to computational methods. A complete list of all observed peak positions from a number of diffraction patterns was used as input to a clustering algorithm using expectation maximization [4]. Expectation Maximization examines distributions of data and develops naïve Bayesian probabilities about which data values (peak positions) belong together. A sampling of the cluster or binning results is shown in Table I below. Then, using normalized intensities (from zero to one) to represent the peak heights every diffraction pattern exhibits for each bin, relationships between the peak-position bins can be further examined. For example, Table II shows, for small a subset of bins, intensity-based correlations between some bins. Over an entire scan, redundant phase composition information is present in diffraction data that contain no distortions due to preferred orientation. In the present example, although the major ceria-zirconia [111] peak envelope region was not included in the expectation maximization procedure, enough ceria-zirconia phase information still remains in other parts of the diffraction pattern to derive a general regression relationship between binned (peak) intensities and the amount of cerium observed by X-ray fluorescence (Figure 4). Table I. Sample of expectation maximization results (after including diffraction knowledge about the likely spread in peak position values). N is the number of patterns examined containing a peak at that average position. cluster, or bin # 2theta Std.Error % 99.00% N Table II. Example of intensity-based correlations between peak-position bins. The blue highlighted values in the and columns are correlations from peaks due to the same phase cordierite from the substrate. The green highlighted correlation is new information not previously known; peaks at and at appear to be due to the same (but unknown) phase
10 Expectation Maximization may represent a different, and possibly improved approach to phase analysis through intensity correlations, but this approach still results in far too many variables (too many peak positions). Another approach is to use Principle Component Analysis (PCA) to obtain composite factors that contain the largest amount of information. [5] PCA has been used in other diffraction studies [6] and has been widely used in the spectroscopy community [5b, 7]. PCA could be used to reduce the number of peak-position bins obtained by expectation maximization but PCA on peak-position bins could be problematic because across any given set of diffraction scans many of the peak-position bins may have zero peak intensity. However, if PCA is used on raw normalized data, every 2θ step becomes a variable and the intensity is the value of the variable. Shown in Figure 5 are plots of the first two principle components obtained from raw diffraction data over a "low-angle" region and over a "mid-angle" region. Because PCA derives directions in parameter space with the highest variance (information content), the PCA approach is able to delineate differences between the diffraction data for three types of catalysts; and these differences are more substantive than being due to just the variable amount of cordierite substrate that inadvertently occurs when scraping catalyst washcoat. Figure 4. Comparison of the regression-predicted Ce composition with the observed Ce from XRF. INCORPORATING DESCRIPTORS FROM OTHER CHARACTERIZATION TECHNIQUES Analytical techniques such as quantitative X-ray fluorescence generally yield descriptors (numerical values for composition) that are examined easily for relationships. Other spectroscopic characterization methods can yield descriptors using procedures similar to those described here for X-ray diffraction data. Continuous curve data (e.g., reactor or emissions data) represent another type of data for which obtaining useful descriptors can be difficult. Images, and microscopy images in particular, also pose challenges to using computational methods to examine relationships. For electron microprobe images of catalysts, we obtain descriptors by separating substrate regions from washcoat and then derive elemental spatial correlations from the X-ray emission maps. [8] PUTTING IT ALL TOGETHER RELATIONSHIPS BETWEEN DESCRIPTORS AND PERFORMANCE Aggregate X-ray diffraction descriptors, such as the first few PCA factors, can be compared to performance groupings derived from, e.g., tailpipe emissions to determine the usefulness of the descriptors. Figure 6a shows the effectiveness of the selected X-ray diffraction PCA factors in discriminating amongst emissions-based groupings. The larger the numbers on both axes, the
11 better the discrimination. Some discrimination occurs using just the X-ray diffraction descriptors (Figure 6a), but the discrimination between performance groups is greatly enhanced if the most important PCA factors from electron microprobe image correlations and from XRF-based compositions are included with the X-ray diffraction factors (Figure 6b). Figure 5. Plots illustrating the ability of the first PCA factor (horizontal axis) and second PCA factor (vertical axis) derived from raw X-ray diffraction data to separate three different types of catalysts into three (known) types of catalyst. The plot on the left shows the first two PCA factors derived from "lowangle" data; the plot on the right shows the first two PCA factors for "mid-angle" data. Figure 6a. Figure 6b. Figure 6. Plots of each catalyst discriminant score for the first two discriminant functions (canonical roots). Discriminant analysis is used to determine which variables can successfully differentiate between groups, in this case, groups based on emission performance. Discriminant functions are obtained from weighted linear combinations of variables with the weights derived to maximize differentiation between groups. As shown above, PCA factors derived from raw XRD data can (marginally) discriminate between emission groups (6a), but the differentiation between emissions groups is notably more effective if the first few PCA factors obtained from XRF and EPMA data are also included (6b).
12 CONCLUSIONS SNAP is a powerful approach to comparing diffraction patterns and enables obtaining useful correlations between whole patterns. Expectation Maximization is found to be useful for deriving clusters of peaks associated with a single average peak position (a peak bin); correlations between intensities in the bins can then be used to determine which peaks belong together and are due to a single phase. Principle Component Analysis of normalized step-scan data is found to yield useful descriptors that subsequently can be related to measures of materials performance. These approaches to deriving descriptors from powder diffraction data will facilitate finding new and improved inorganic materials, especially heterogeneous catalytic materials, using high-throughput discovery methods and data mining to target specific property criteria. REFERENCES [1] Kantardzic, M., Data Mining -- Concepts, Models, Methods, and Algorithms, Wiley-Interscience, IEEE Press: New Jersey (2003), pp [2] Gilmore, C. J., Barr, G., Paisley, J., High Throughput Powder Diffraction I: Full-profile Qualitative and Quantitative Powder Diffraction Pattern Analysis, J. Appl. Crystall. (submitted) [3] StatSoft, Inc. (2003). STATISTICA (data analysis software system), version 6. Tulsa, Oklahoma: [4] Mitchell, T. M., Machine Learning, McGraw-Hill: Boston (1997), pp [5] (a) Reference [1], pp ; (b) Jurs, P.C., "Chemometric and Multivariate Analysis in Analytical Chemistry" in Reviews in Computational Chemistry, Lipkowitz and Boyd, edit., VCH Publishers: New York (1990), pp ; (c) Jambu, M., Exploratory and Multivariate Data Analysis, Academic Press: Boston (1991), pp [6] (a) Kato, M., Fujii, S., Ui, T., Asada, E., Powder Diffract. 5(1), (1990); (b) Klar, P.J., Chen, L., Rentschler, T., J. Mater. Chem., 6(11), (1996); (c) Artursson, T., et al., Applied Spectr., 54(8), (2000); (d) Hida, M., Sato, H., Sugawara, H., Mitsui, T., Forensic Science International 115, (2001). [7] (a) Aries, R., Lidiard, D., Spragg, R., Spectroscopy 5(3), (1990); (b) Workman, J.J., et al., "Review of Chemometrics Applied to Spectroscopy: , Part I" in Applied Spectr.Reviews, 31(1&2), (1996). [8] Chen, A.E. and Lowe-Ma, C.K., Microscopy and Microanalysis 7, Suppl. 2, (2001).
DATA MINING WITH DIFFERENT TYPES OF X-RAY DATA
DATA MINING WITH DIFFERENT TYPES OF X-RAY DATA 315 C. K. Lowe-Ma, A. E. Chen, D. Scholl Physical & Environmental Sciences, Research and Advanced Engineering Ford Motor Company, Dearborn, Michigan, USA
More informationPeter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K.
783 SCOPE AND LIMITATIONS XRF ANALYSIS FOR SEMI-QUANTITATIVE Introduction Peter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K. Historically x-ray fluorescence spectrometry has
More informationGLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS
176 177 GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS Robert W. Zuneska, Y. Rong, Isaac Vander, and F. J. Cadieu* Physics Dept., Queens College of CUNY, Flushing, NY 11367. ABSTRACT
More informationACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 369 ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM
More informationNEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 266 NEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
More informationMATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 249 MATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
More informationTHE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 96 THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS
More informationTime-Resolved μ-xrf and Elemental Mapping of Biological Materials
296 Time-Resolved μ-xrf and Elemental Mapping of Biological Materials K. Tsuji 1,2), K. Tsutsumimoto 1), K. Nakano 1,2), K. Tanaka 1), A. Okhrimovskyy 1), Y. Konishi 1), and X. Ding 3) 1) Department of
More informationELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS
390 ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS J. C. Rao 1, 2 *, M. Song 2, K. Mitsuishi 2, M. Takeguchi 2, K. Furuya 2 1 Department
More informationMEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS
, MEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS K.O. Goyal, J.W. Westphal Semiconductor Equipment Group Watkins-Johnson Company Scotts Valley, California 95066 Abstract Deposition of borophosphosilicate
More informationRIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 261 RIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES G. Kimmel
More informationCHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE
CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE 218 Chris M. Sparks 1, Elizabeth P. Hastings 2, George J. Havrilla 2, and Michael Beckstead 2 1. ATDF,
More informationIMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 158 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. H.
More informationAEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD
Copyright JCPDS-International Centre for Diffraction Data 2014 ISSN 1097-0002 219 AEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD Takao Moriyama 1), Atsushi Morikawa 1), Makoto
More informationIn Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron Radiation
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 371 In Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron
More informationEFFECT OF CALIBRATION SPECIMEN PREPARATION TECHNIQUES ON NARROW RANGE X-RAY FLUORESCENCE CALIBRATION ACCURACY
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 424 EFFECT OF CALIBRATION SPECIMEN PREPARATION TECHNIQUES ON NARROW RANGE X-RAY FLUORESCENCE CALIBRATION
More informationChemometrics. Classification of Mycobacteria by HPLC and Pattern Recognition. Application Note. Abstract
12-1214 Chemometrics Application Note Classification of Mycobacteria by HPLC and Pattern Recognition Abstract Mycobacteria include a number of respiratory and non-respiratory pathogens for humans, such
More informationANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION
173 ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION N. A. Raftery, L. K. Bekessy, and J. Bowpitt Faculty of Science, Queensland University of Technology, GPO Box 2434,
More informationCombinatorial Heterogeneous Catalysis
Combinatorial Heterogeneous Catalysis 650 μm by 650 μm, spaced 100 μm apart Identification of a new blue photoluminescent (PL) composite material, Gd 3 Ga 5 O 12 /SiO 2 Science 13 March 1998: Vol. 279
More informationHorst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Christian Eisenmenger-Sittner, Johann Wernisch, and Michael Mantler
DETECTION OF SUBMONOLAYERS BY MEASUREMENT OF THE TOTAL ELECTRON YIELD (TEY) OF X-RAY EXCITED ELECTRON EMISSION Horst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Christian Eisenmenger-Sittner,
More informationINFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES
122 INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES I. Busch 1, M. Krumrey 2 and J. Stümpel 1 1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
More informationRADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA
90 RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA Christopher G. Worley Los Alamos National Laboratory, MS G740, Los Alamos, NM 87545 ABSTRACT Energy dispersive X-ray fluorescence (EDXRF) is a rapid, straightforward
More informationDimension Reduction (PCA, ICA, CCA, FLD,
Dimension Reduction (PCA, ICA, CCA, FLD, Topic Models) Yi Zhang 10-701, Machine Learning, Spring 2011 April 6 th, 2011 Parts of the PCA slides are from previous 10-701 lectures 1 Outline Dimension reduction
More informationMCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 363 MCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT J.E. Fernández, V.
More informationFUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS 255 Yoshiyuki Kataoka 1, Naoki Kawahara 1, Shinya Hara 1, Yasujiro Yamada 1, Takashi Matsuo 1, Michael Mantler 2 1 Rigaku
More informationA COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 320 A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS Hiroyoshi SOEJIMA and
More informationresearch papers High-throughput powder diffraction. IV. Cluster validation using silhouettes and fuzzy clustering
Journal of Applied Crystallography ISSN 0021-8898 Received 25 June 2004 Accepted 24 August 2004 High-throughput powder diffraction. IV. validation using silhouettes and fuzzy clustering Gordon Barr, Wei
More informationFUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
45 ABSTRACT FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS W. T. Elam, Robert B. Shen, Bruce Scruggs, and Joseph A. Nicolosi EDAX, Inc. Mahwah, NJ 70430 European Community Directive 2002/95/EC
More informationADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES
187 188 ADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES ABSTRACT W. T. Elam, B. Scruggs, F. Eggert, and J. A. Nicolosi EDAX, a unit of Ametek Inc., 91 McKee Drive, Mahwah,
More informationPREDICTION OF THE CRYSTAL STRUCTURE OF BYNARY AND TERNARY INORGANIC COMPOUNDS USING SYMMETRY RESTRICTIONS AND POWDER DIFFRACTION DATA
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 116 PREDICTION OF THE CRYSTAL STRUCTURE OF BYNARY AND TERNARY INORGANIC COMPOUNDS USING SYMMETRY RESTRICTIONS
More informationFACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE
Copyright JCPDS-International Centre for Diffraction Data 26 ISSN 197-2 FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE 31 K. L. Kelly and B. K. Tanner Department
More informationX-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 321 X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Kazuhiro Takada 1,
More informationABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS
302 ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS M. Song 1, K. Mitsuishi 1, M. Takeguchi 1, K. Furuya 1, R. C. Birtcher 2 1 High Voltage Electron Microscopy Station, National
More informationUnsupervised Learning with Permuted Data
Unsupervised Learning with Permuted Data Sergey Kirshner skirshne@ics.uci.edu Sridevi Parise sparise@ics.uci.edu Padhraic Smyth smyth@ics.uci.edu School of Information and Computer Science, University
More informationPOWDER DIFFRACTION ANALYSIS OF HYDRAULIC CEMENTS: ASTM RIETVELD ROUND ROBIN RESULTS ON PRECISION
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 33 POWDER DIFFRACTION ANALYSIS OF HYDRAULIC CEMENTS: ASTM RIETVELD ROUND ROBIN RESULTS ON PRECISION
More informationDEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN THICK MATERIALS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 59 DEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN
More informationBasics of Multivariate Modelling and Data Analysis
Basics of Multivariate Modelling and Data Analysis Kurt-Erik Häggblom 2. Overview of multivariate techniques 2.1 Different approaches to multivariate data analysis 2.2 Classification of multivariate techniques
More informationCopyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol ISSN
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 129 MATHEMATICAL OF DIFFRACTION PROPERTIES POLE FIGURES ABSTRACT Helmut Schaeben Mathematics and Computer
More informationCALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY
Copyright -International Centre for Diffraction Data 2010 ISSN 1097-0002 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba, M. Mantler, H. Ebel, R. Svagera Technische Universit Vienna,
More informationIchiro Takeuchi University of Maryland
High-throughput Experimentation and Machine Learning for Materials Discovery 55 Å 45 Å 35Å Ferroelectric library t s (Å) 25 Å 20 Å 15 Å 10 Å 5 Å No impurity Ti (3 Å) Ti (6 Å) Ti (9 Å) Cu (3 Å) Cu (6Å)
More informationSemi-Quantitative Analysis of Analytical Data using Chemometric Methods. Part II.
Semi-Quantitative Analysis of Analytical Data using Chemometric Methods. Part II. Simon Bates, Ph.D. After working through the various identification and matching methods, we are finally at the point where
More informationConstraint Reasoning and Kernel Clustering for Pattern Decomposition With Scaling
Constraint Reasoning and Kernel Clustering for Pattern Decomposition With Scaling Ronan LeBras Theodoros Damoulas Ashish Sabharwal Carla P. Gomes John M. Gregoire Bruce van Dover Computer Science Computer
More informationCHECKING AND ESTIMATING RIR VALUES
Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42 287 Copyright(C)JCPDS-International Centre for Diffraction Data 2000, Advances in X-ray Analysis, Vol.42
More informationPDF-4+ Tools and Searches
PDF-4+ Tools and Searches PDF-4+ 2018 The PDF-4+ 2018 database is powered by our integrated search display software. PDF-4+ 2018 boasts 72 search selections coupled with 125 display fields resulting in
More informationXRD RAPID SCREENING SYSTEM FOR COMBINATORIAL CHEMISTRY
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 1 XRD RAPID SCREENING SYSTEM FOR COMBINATORIAL CHEMISTRY Bob B. He, John Anzelmo, Peter LaPuma, Uwe Preckwinkel,
More informationMixture Analysis Made Easier: Trace Impurity Identification in Photoresist Developer Solutions Using ATR-IR Spectroscopy and SIMPLISMA
Mixture Analysis Made Easier: Trace Impurity Identification in Photoresist Developer Solutions Using ATR-IR Spectroscopy and SIMPLISMA Michel Hachey, Michael Boruta Advanced Chemistry Development, Inc.
More informationPDF-4+ Tools and Searches
PDF-4+ Tools and Searches PDF-4+ 2019 The PDF-4+ 2019 database is powered by our integrated search display software. PDF-4+ 2019 boasts 74 search selections coupled with 126 display fields resulting in
More informationVORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 332 VORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS Shaul Barkan,
More informationDetecting Dark Matter Halos using Principal Component Analysis
Detecting Dark Matter Halos using Principal Component Analysis William Chickering, Yu-Han Chou Computer Science, Stanford University, Stanford, CA 9435 (Dated: December 15, 212) Principal Component Analysis
More informationBENEFITS OF IMPROVED RESOLUTION FOR EDXRF
135 Abstract BENEFITS OF IMPROVED RESOLUTION FOR EDXRF R. Redus 1, T. Pantazis 1, J. Pantazis 1, A. Huber 1, B. Cross 2 1 Amptek, Inc., 14 DeAngelo Dr, Bedford MA 01730, 781-275-2242, www.amptek.com 2
More informationMachine learning comes from Bayesian decision theory in statistics. There we want to minimize the expected value of the loss function.
Bayesian learning: Machine learning comes from Bayesian decision theory in statistics. There we want to minimize the expected value of the loss function. Let y be the true label and y be the predicted
More informationDiscriminating between polymorphs of acetaminophen using Morphologically-Directed Raman Spectroscopy (MDRS)
Discriminating between polymorphs of acetaminophen using Morphologically-Directed Raman Spectroscopy (MDRS) CHEMICAL IDENTIFICATION PARTICLE SIZE PARTICLE SHAPE Introduction Interest in studying mixed
More informationThree-Dimensional Electron Microscopy of Macromolecular Assemblies
Three-Dimensional Electron Microscopy of Macromolecular Assemblies Joachim Frank Wadsworth Center for Laboratories and Research State of New York Department of Health The Governor Nelson A. Rockefeller
More informationDEVELOPMENT OF XRD IN EL SALVADOR
PACIFIC OCEAN Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 150 ABSTRACT DEVELOPMENT OF XRD IN EL SALVADOR Elizabeth de Henríquez LaGeo S.A. de
More informationPLS. theoretical results for the chemometrics use of PLS. Liliana Forzani. joint work with R. Dennis Cook
PLS theoretical results for the chemometrics use of PLS Liliana Forzani Facultad de Ingeniería Química, UNL, Argentina joint work with R. Dennis Cook Example in chemometrics A concrete situation could
More informationChoosing the best set of variables in regression analysis using integer programming
DOI 10.1007/s10898-008-9323-9 Choosing the best set of variables in regression analysis using integer programming Hiroshi Konno Rei Yamamoto Received: 1 March 2007 / Accepted: 15 June 2008 Springer Science+Business
More informationREALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 218 REALIZATION OF AN ASYMMETRIC MULTILAYER X-RAY MIRROR S. M. Owens Laboratory for High Energy Astrophysics,
More informationION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM.
822 ION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM. Abstract A.P.Morovov, L.D.Danilin, V.V.Zhmailo, Yu.V.Ignatiev, A.E.Lakhtikov,
More informationKeywords: Multimode process monitoring, Joint probability, Weighted probabilistic PCA, Coefficient of variation.
2016 International Conference on rtificial Intelligence: Techniques and pplications (IT 2016) ISBN: 978-1-60595-389-2 Joint Probability Density and Weighted Probabilistic PC Based on Coefficient of Variation
More informationApplied Multivariate Statistical Analysis Richard Johnson Dean Wichern Sixth Edition
Applied Multivariate Statistical Analysis Richard Johnson Dean Wichern Sixth Edition Pearson Education Limited Edinburgh Gate Harlow Essex CM20 2JE England and Associated Companies throughout the world
More informationUSABILITY OF PORTABLE X-RAY SPECTROMETER FOR DISCRIMINATION OF VALENCE STATES
Copyright (c)jcpds-international Centre for Diffraction Data 00, Advances in X-ray Analysis, Volume 45. 409 ISSN 1097-000 USABIITY OF POTABE X-AY SPECTOMETE FO DISCIMINATION OF VAENCE STATES I.A.Brytov,.I.Plotnikov,B.D.Kalinin,
More informationCharacterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors
Platinum Metals Rev., 2014, 58, (2), 106 110 FINAL ANALYSIS Characterisation of Catalysts Using Secondary and Backscattered Electron In-lens Detectors Heterogeneous catalysis often involves the use of
More informationCHEMICAL ENGINEEERING AND CHEMICAL PROCESS TECHNOLOGY Vol. III - Ideal Models Of Reactors - A. Burghardt
IDEAL MODELS OF REACTORS A. Institute of Chemical Engineering, Polish Academy of Sciences, Poland Keywords: Thermodynamic state, conversion degree, extent of reaction, classification of chemical reactors,
More informationRare Event Discovery And Event Change Point In Biological Data Stream
Rare Event Discovery And Event Change Point In Biological Data Stream T. Jagadeeswari 1 M.Tech(CSE) MISTE, B. Mahalakshmi 2 M.Tech(CSE)MISTE, N. Anusha 3 M.Tech(CSE) Department of Computer Science and
More informationAN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS
96 AN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS T. N. Blanton 1, D.R Whitcomb 2, and S.T. Misture 3 1 Eastman Kodak Company, Kodak Research Laboratories, Rochester, NY 14650-2106,
More informationSTRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 106 STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F. A. Selim 1, D.P. Wells 1, J. F. Harmon 1,
More informationData envelopment analysis
15 Data envelopment analysis The purpose of data envelopment analysis (DEA) is to compare the operating performance of a set of units such as companies, university departments, hospitals, bank branch offices,
More informationNon-Parametric Bayes
Non-Parametric Bayes Mark Schmidt UBC Machine Learning Reading Group January 2016 Current Hot Topics in Machine Learning Bayesian learning includes: Gaussian processes. Approximate inference. Bayesian
More informationCS 6375 Machine Learning
CS 6375 Machine Learning Nicholas Ruozzi University of Texas at Dallas Slides adapted from David Sontag and Vibhav Gogate Course Info. Instructor: Nicholas Ruozzi Office: ECSS 3.409 Office hours: Tues.
More informationCHARACTERIZATION OF Pu-CONTAINING PARTICLES BY X-RAY MICROFLUORESCENCE
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 534 CHARACTERIZATION OF Pu-CONTAINING PARTICLES BY X-RAY MICROFLUORESCENCE Marco Mattiuzzi, Andrzej Markowicz,
More informationKinetic Parameters Estimation using Vehicle Data for Exhaust Aftertreatment Devices
Kinetic Parameters Estimation using Vehicle Data for Exhaust Aftertreatment Devices Karthik Ramanathan India Science Lab General Motors, Global Research and Development Center Bangalore, India Acknowledgments:
More informationMulti-Plant Photovoltaic Energy Forecasting Challenge with Regression Tree Ensembles and Hourly Average Forecasts
Multi-Plant Photovoltaic Energy Forecasting Challenge with Regression Tree Ensembles and Hourly Average Forecasts Kathrin Bujna 1 and Martin Wistuba 2 1 Paderborn University 2 IBM Research Ireland Abstract.
More informationCPSC 340: Machine Learning and Data Mining. More PCA Fall 2016
CPSC 340: Machine Learning and Data Mining More PCA Fall 2016 A2/Midterm: Admin Grades/solutions posted. Midterms can be viewed during office hours. Assignment 4: Due Monday. Extra office hours: Thursdays
More informationMachine Learning. CUNY Graduate Center, Spring Lectures 11-12: Unsupervised Learning 1. Professor Liang Huang.
Machine Learning CUNY Graduate Center, Spring 2013 Lectures 11-12: Unsupervised Learning 1 (Clustering: k-means, EM, mixture models) Professor Liang Huang huang@cs.qc.cuny.edu http://acl.cs.qc.edu/~lhuang/teaching/machine-learning
More informationMachine Learning 11. week
Machine Learning 11. week Feature Extraction-Selection Dimension reduction PCA LDA 1 Feature Extraction Any problem can be solved by machine learning methods in case of that the system must be appropriately
More informationPRINCIPAL COMPONENTS ANALYSIS
121 CHAPTER 11 PRINCIPAL COMPONENTS ANALYSIS We now have the tools necessary to discuss one of the most important concepts in mathematical statistics: Principal Components Analysis (PCA). PCA involves
More informationANALYSIS OF GEOLOGIC MATERIALS USING RIETVELD QUANTIATIVE X-RAY DIFFRACTION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 204 ANALYSIS OF GEOLOGIC MATERIALS USING RIETVELD QUANTIATIVE X-RAY DIFFRACTION Robin M. Gonzalez,
More informationPerformance Comparison of K-Means and Expectation Maximization with Gaussian Mixture Models for Clustering EE6540 Final Project
Performance Comparison of K-Means and Expectation Maximization with Gaussian Mixture Models for Clustering EE6540 Final Project Devin Cornell & Sushruth Sastry May 2015 1 Abstract In this article, we explore
More informationSYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD
73 SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD Atsuo Iida 1), Yoichi Takanishi 2) 1)Photon Factory, Institute of Materials Structure Science, High Energy
More informationBATCH PROCESS MONITORING THROUGH THE INTEGRATION OF SPECTRAL AND PROCESS DATA. Julian Morris, Elaine Martin and David Stewart
BATCH PROCESS MONITORING THROUGH THE INTEGRATION OF SPECTRAL AND PROCESS DATA Julian Morris, Elaine Martin and David Stewart Centre for Process Analytics and Control Technology School of Chemical Engineering
More informationFast Hierarchical Clustering from the Baire Distance
Fast Hierarchical Clustering from the Baire Distance Pedro Contreras 1 and Fionn Murtagh 1,2 1 Department of Computer Science. Royal Holloway, University of London. 57 Egham Hill. Egham TW20 OEX, England.
More informationDiscrimination of Dyed Cotton Fibers Based on UVvisible Microspectrophotometry and Multivariate Statistical Analysis
Discrimination of Dyed Cotton Fibers Based on UVvisible Microspectrophotometry and Multivariate Statistical Analysis Elisa Liszewski, Cheryl Szkudlarek and John Goodpaster Department of Chemistry and Chemical
More informationRESIDUAL STRESS MEASUREMENT IN STEEL BEAMS USING THE INCREMENTAL SLITTING TECHNIQUE
659 RESIDUAL STRESS MEASUREMENT IN STEEL BEAMS USING THE INCREMENTAL SLITTING TECHNIQUE DZL Hodgson 1, DJ Smith 1, A Shterenlikht 1 1 Department of Mechanical Engineering, University of Bristol University
More informationTRACE ELEMENT ANALYSIS USING A BENCHTOP TXRF- SPECTROMETER
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 236 ABSTRACT TRACE ELEMENT ANALYSIS USING A BENCHTOP TXRF- SPECTROMETER Hagen Stosnach Röntec GmbH,
More informationModeling Mutagenicity Status of a Diverse Set of Chemical Compounds by Envelope Methods
Modeling Mutagenicity Status of a Diverse Set of Chemical Compounds by Envelope Methods Subho Majumdar School of Statistics, University of Minnesota Envelopes in Chemometrics August 4, 2014 1 / 23 Motivation
More informationBrief Introduction of Machine Learning Techniques for Content Analysis
1 Brief Introduction of Machine Learning Techniques for Content Analysis Wei-Ta Chu 2008/11/20 Outline 2 Overview Gaussian Mixture Model (GMM) Hidden Markov Model (HMM) Support Vector Machine (SVM) Overview
More informationBayesian non-parametric model to longitudinally predict churn
Bayesian non-parametric model to longitudinally predict churn Bruno Scarpa Università di Padova Conference of European Statistics Stakeholders Methodologists, Producers and Users of European Statistics
More informationIMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 281 IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE Susumu Imashuku 1, Deh Ping Tee 1, Yasukazu
More informationLASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE
Copyright(C)JCPDS-International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Vol.46 74 ISSN 1097-0002 LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani 1, D. Wells
More informationCPSC 340: Machine Learning and Data Mining. More PCA Fall 2017
CPSC 340: Machine Learning and Data Mining More PCA Fall 2017 Admin Assignment 4: Due Friday of next week. No class Monday due to holiday. There will be tutorials next week on MAP/PCA (except Monday).
More informationExperimental Design and Data Analysis for Biologists
Experimental Design and Data Analysis for Biologists Gerry P. Quinn Monash University Michael J. Keough University of Melbourne CAMBRIDGE UNIVERSITY PRESS Contents Preface page xv I I Introduction 1 1.1
More informationMachine Learning, Midterm Exam
10-601 Machine Learning, Midterm Exam Instructors: Tom Mitchell, Ziv Bar-Joseph Wednesday 12 th December, 2012 There are 9 questions, for a total of 100 points. This exam has 20 pages, make sure you have
More informationDECISION TREE BASED QUALITATIVE ANALYSIS OF OPERATING REGIMES IN INDUSTRIAL PRODUCTION PROCESSES *
HUNGARIAN JOURNAL OF INDUSTRIAL CHEMISTRY VESZPRÉM Vol. 35., pp. 95-99 (27) DECISION TREE BASED QUALITATIVE ANALYSIS OF OPERATING REGIMES IN INDUSTRIAL PRODUCTION PROCESSES * T. VARGA, F. SZEIFERT, J.
More informationCharacterization and Classification of Heroin from Illicit Drug Seizures Using the Agilent 7200 GC/Q-TOF
Characterization and Classification of Heroin from Illicit Drug Seizures Using the Agilent 72 GC/Q-TOF Application Note Forensics Authors Koluntaev Dmitry InterLab Inc. Moscow, Russia Sergei Syromyatnikov
More informationMachine Learning 2017
Machine Learning 2017 Volker Roth Department of Mathematics & Computer Science University of Basel 21st March 2017 Volker Roth (University of Basel) Machine Learning 2017 21st March 2017 1 / 41 Section
More informationGentle Introduction to Infinite Gaussian Mixture Modeling
Gentle Introduction to Infinite Gaussian Mixture Modeling with an application in neuroscience By Frank Wood Rasmussen, NIPS 1999 Neuroscience Application: Spike Sorting Important in neuroscience and for
More informationULTRATHIN LAYER DEPOSITIONS A NEW TYPE OF REFERENCE SAMPLES FOR HIGH PERFORMANCE XRF ANALYSIS
298 299 ULTRATHIN LAYER DEPOSITIONS A NEW TYPE OF REFERENCE SAMPLES FOR HIGH PERFORMANCE XRF ANALYSIS M. Krämer 1), R. Dietsch 1), Th. Holz 1), D. Weißbach 1), G. Falkenberg 2), R. Simon 3), U. Fittschen
More informationCharacterization of Jet Charge at the LHC
Characterization of Jet Charge at the LHC Thomas Dylan Rueter, Krishna Soni Abstract The Large Hadron Collider (LHC) produces a staggering amount of data - about 30 petabytes annually. One of the largest
More informationCopyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 386 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS II. EVALUATION
More informationPrincipal component analysis, PCA
CHEM-E3205 Bioprocess Optimization and Simulation Principal component analysis, PCA Tero Eerikäinen Room D416d tero.eerikainen@aalto.fi Data Process or system measurements New information from the gathered
More information