ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS
|
|
- Augustus Lloyd
- 5 years ago
- Views:
Transcription
1 390 ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS J. C. Rao 1, 2 *, M. Song 2, K. Mitsuishi 2, M. Takeguchi 2, K. Furuya 2 1 Department of Materials Science, Harbin Institute of Technology, Harbin , CHINA 2 High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki, , JAPAN jcrao@hit.edu.cn, RAO.Jiancun@nims.go.jp ABSTRACT Low energy characteristic X-ray emission from Al 2 O 3 monocrystalline specimens is measured under bombardment of 100 kev Xe + ions. The electric field influence on emission of the X-rays of constitute elements in the specimens was investigated. The energy dispersive X-ray spectroscopy (EDS) spectra show that the characteristic X-ray of Al-Kα seems to be depressed by the applied direct current (DC) voltages, while the peak intensity of O-Kα was not notably influenced. The O-Kα peaks were broadened and the total counts increased as a higher DC bias was applied. It is possible that a DC electric field parallel to the target surface may influence the X-ray emission from it under ion bombardment. INTRODUCTION Some insulating samples under ion beam bombardment show important charging effects: a large bremsstrahlung background in the X-ray spectra and enhancement of characteristic X-ray yields of component elements [1-9]. When these insulating samples were bombarded by ion beams, such as protons and alpha particles, they produce a very large bremsstrahlung background in the X-ray spectra. Also, the yields of the X-ray lines of component elements are largely enhanced in comparison to those obtained from the same elemental concentrations in conductive samples or samples simultaneously neutralised by an electron gun. There is compelling evidence connecting the enhancement with the charging up of the samples and some researchers [1-9] attributed the effect to accelerated electrons as the cause of the X-ray yield enhancement. Recently, low energy characteristic X-ray emission was observed, by our group, as a result of bombardment by positive slow ions onto insulating materials. However, the mechanism that leads to the charging of the samples, with consequent buildup of high potentials, is not known. Theory or models concerning the charging and breakdown of insulating samples bombarded by ion
2 This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website ICDD Website -
3 391 beams are scarce. There is a study of the charging process by He + ion beams [10] and another [11] relative to the charging by some kev electron bombardment and subsequent surface breakdown. It is considered that some ideas of that model can be applied to the charging up of insulators under proton bombardment. The evidence both from our previous work and from the reports seems to confirm that the charging process is responsible for the X-ray yield enhancement in some insulating samples under slow ion bombardment. In the present work, the influence of an electric field on the characteristic X-ray yield was studied. It was concluded that application of a DC bias has an influence on low energy characteristic X-ray emission from insulator targets under ion bombardment. EXPERIMENTAL Pure Cu film was deposited as electrodes on one polished clean side of an Al 2 O 3 monocrystalline substrate with the normal of <1 1 02>. The electrodes were 2.0 mm apart from each other. The substrate size is 7 3 mm (long wide). The thickness of Al 2 O 3 substrate is 0.2 mm while that of Cu electrode films of 2 μm. The DC voltage was applied to generate an electric field on the polished surface (finished by 0.1 micron Al 2 O 3 polishing solution) of Al 2 O 3 monocrystalline substrate through the deposited Cu electrodes and a special specimen holder. The EDS spectra were detected by EDAX DX-4 analysis system with an energy resolution of 136 ev. The collecting live time was set as 100 seconds. The EDS were collected from the center part of the Al 2 O 3 area in the electric field built up by three different DC biases (0, 100 and 200V) under the ion bombardment in the vacuum of about Pa at room temperature. 3 mm Cu 7 mm 2.0 mm Cu 2 μm thick Ion EDS Detector A 0.2 mm Al 2 O 3 Fig. 1 Top view and side view of the diagram of the sample and the circuit for measuring both the characteristic X-ray and sample current.
4 kev Xe + was used as the incident ion source. The ion current was measured to be about 0.6 na and using a beam size about 1.0 mm in diameter using a special Faraday cup. Figure 1 gives the diagram of the sample and the circuit for measuring both the characteristic X-ray and sample current. There is an angle of 15 between the normal of the sample and the incident ion beam. RESULTS AND DISCUSSION Low energy characteristic X-ray emission is observed under the bombardment of positive slow ions onto Al 2 O 3 monocrystalline specimens. Figure 2 shows the relationship between low energy characteristic X-ray emission and electric field under slow ion bombardment. Fig. 2(a) gives the EDS spectra over an energy range from 0.4 to 2.0 kev from the Al 2 O 3 specimens with different DC bias (0 V, 100 V and 200 V) under 100 kev Xe + ion bombardment. The normalized counts of spectra for DC 100 V and DC 200 V spectra were shifted upward by adding 0.05 and 0.10, respectively, for clarity in the figure. The X-ray counts were normalized to 10 9 counts per Coulomb ions. It is obvious that the characteristic X-ray of Al-Kα was depressed by the applied direct current voltages while the peak intensity of O-Kα was not influenced very much. On the other hand, the O-Kα peaks were broadened when the DC bias was increase. Fig. 2(b) gives the total counts of O-Kα peaks in range from 0.46 to 0.60 kev under different DC bias. It shows clearly that the total counts increased linearly as the higher DC bias applied to the Al 2 O 3 substrate under ion bombardment. The X-ray emission from the insulating materials is related with electrical charge buildup and discharge on the surface due to the incident ions. The applied DC bias has obvious effect on the X-ray emission. The spiked secondary electrons in the insulator were accelerated by the applied electric field. These electrons were regarded to contribute to generate very intense X-rays. The interaction for ion bombarding on surface of bulk materials is dominated by the role of the potential energy carried by the incident ion beam toward the surface while the influence of the kinetic projectile energy remains much less important. The interaction at and below the surface is quite different for metal and insulator surfaces because of comparably much lower electron density and higher electron binding energy of the latter. As mentioned above, the influence of electric field on the low energy characteristic X-ray yield is obvious though the DC bias used in
5 the present work is not very high. Unfortunately, our experimental results are the indirect observation of this interaction process. Much work remains to be done before a theoretical description of the interaction of slow ions bombarding on the insulator surface can be made. To this goal, the experiment can be improved by the following aspects: collecting more data from different kinds of insulator, much higher DC bias and optimum detect parameters. a /C) 9 X-ray Counts (x O-K Al2O3 100 kev Xe + Current: 0.6 na Size: 1.0 mm Live time: 100 s DC 200V+0.10 DC 100V+0.05 DC 0V Engergy (kev) Al-K b X-ray Counts (x10 9 /C) O-Kα Peak Counts ( kev) DC (V) Fig. 2 Relationship between low energy characteristic X-ray emission and electric field under 100 kev Xe + bombardment. The characteristic X-ray of Al-Kα seems to be depressed by the applied direct current (DC) voltages while the peak intensity of O-Kα was not influenced obviously (a). The O-Kα peaks were broadened with the total counts in energy range from 0.46 to 0.60 kev increased as the higher DC bias applied (b). CONCLUSIONS (1) An electric field can influence the emission of low energy characteristic X-rays of constitute elements from an Al 2 O 3 monocrystalline specimen under bombardment of 100 kev Xe + ions. (2) The characteristic X-rays of Al-Kα seems to be decreased by the applied electric field, while the peak intensity of O-Kα was not measurably influenced. (3) The O-Kα peaks were broadened with the total counts increased as the higher DC bias applied. REFERENCES [1] Peisach M.; Pillay A. E.; Pineda C. A., Nucl. Instr. and Meth. B, 1993, 75, [2] Peisach M.; Pineda C. A.; Pillay A. E.; Springhorn K. A., Nucl. Instr. and Meth. B, 1994, 94,
6 [3] Mboweni R. C. M.; Pineda C. A.; Peisach M.; Pillay A. E., Nucl. Instr. and Meth. B, 1994, 85, [4] Pillay A. E.; Peisach M., J. Radioan. Nucl. Chem. Lett., 1994, 188, [5] Hamanaka H.; Hasegawa K.; Maeda K., Nucl. Instr. and Meth. B, 1996, , [6] Kawai J.; Maeda K.; Sakauchi N.; Konishi I., Nucl. Instr. and Meth. B, 1996, , [7] Szoekefalvi-Nagy Z.; Demeter I.; Hollos-Nagy K.; Kovacs I., Nucl. Instr. and Meth. B, 1996, , [8] Jesus A. P.; Reis M. A.; Alves L. C., Nucl. Instr. and Meth. B, 1998, , [9] Jesus A. P.; Reis M. A.; Alves L. C., Nucl. Instr. and Meth. B, 2000, , [10] Meyer J. D.; Arafah D. E., Nucl. Instr. and Meth. B, 1990, 50, [11] Blaise G.; Gressus C. Le, J. Appl. Phys., 1991, 69,
ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS
302 ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS M. Song 1, K. Mitsuishi 1, M. Takeguchi 1, K. Furuya 1, R. C. Birtcher 2 1 High Voltage Electron Microscopy Station, National
More informationDEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN THICK MATERIALS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 59 DEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN
More informationTime-Resolved μ-xrf and Elemental Mapping of Biological Materials
296 Time-Resolved μ-xrf and Elemental Mapping of Biological Materials K. Tsuji 1,2), K. Tsutsumimoto 1), K. Nakano 1,2), K. Tanaka 1), A. Okhrimovskyy 1), Y. Konishi 1), and X. Ding 3) 1) Department of
More informationLASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE
Copyright(C)JCPDS-International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Vol.46 74 ISSN 1097-0002 LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani 1, D. Wells
More informationCHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE
CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE 218 Chris M. Sparks 1, Elizabeth P. Hastings 2, George J. Havrilla 2, and Michael Beckstead 2 1. ATDF,
More informationRADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA
90 RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA Christopher G. Worley Los Alamos National Laboratory, MS G740, Los Alamos, NM 87545 ABSTRACT Energy dispersive X-ray fluorescence (EDXRF) is a rapid, straightforward
More informationFUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
45 ABSTRACT FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS W. T. Elam, Robert B. Shen, Bruce Scruggs, and Joseph A. Nicolosi EDAX, Inc. Mahwah, NJ 70430 European Community Directive 2002/95/EC
More informationPERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES
249 PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES F. I. G. M. Borges, S. J. C. do Carmo, T. H. V. T. Dias, F.
More informationNEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 266 NEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
More informationINFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES
122 INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES I. Busch 1, M. Krumrey 2 and J. Stümpel 1 1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
More informationMCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 363 MCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT J.E. Fernández, V.
More informationX-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 321 X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Kazuhiro Takada 1,
More informationSTRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 106 STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F. A. Selim 1, D.P. Wells 1, J. F. Harmon 1,
More informationTHE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 96 THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS
More informationCALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY
Copyright -International Centre for Diffraction Data 2010 ISSN 1097-0002 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba, M. Mantler, H. Ebel, R. Svagera Technische Universit Vienna,
More informationANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION
173 ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION N. A. Raftery, L. K. Bekessy, and J. Bowpitt Faculty of Science, Queensland University of Technology, GPO Box 2434,
More informationIMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 158 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. H.
More informationFACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE
Copyright JCPDS-International Centre for Diffraction Data 26 ISSN 197-2 FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE 31 K. L. Kelly and B. K. Tanner Department
More informationCharacterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev
Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,
More informationGLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS
176 177 GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS Robert W. Zuneska, Y. Rong, Isaac Vander, and F. J. Cadieu* Physics Dept., Queens College of CUNY, Flushing, NY 11367. ABSTRACT
More informationPráctica de laboratorio número 6: Non-Rutherford scattering near the MeV 12 C(p,p) 12 C resonance
Práctica de laboratorio número 6: Non-Rutherford scattering near the 1.734 MeV 12 C(p,p) 12 C resonance 1) Scope In this experiment, the yield of protons backscattered from a thin gold foil deposited over
More informationCombinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications
Combinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications Philip D. Rack,, Jason D. Fowlkes,, and Yuepeng Deng Department of Materials Science and Engineering University
More informationAEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD
Copyright JCPDS-International Centre for Diffraction Data 2014 ISSN 1097-0002 219 AEROSOL FILTER ANALYSIS USING POLARIZED OPTICS EDXRF WITH THIN FILM FP METHOD Takao Moriyama 1), Atsushi Morikawa 1), Makoto
More informationADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES
187 188 ADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES ABSTRACT W. T. Elam, B. Scruggs, F. Eggert, and J. A. Nicolosi EDAX, a unit of Ametek Inc., 91 McKee Drive, Mahwah,
More informationHorst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Christian Eisenmenger-Sittner, Johann Wernisch, and Michael Mantler
DETECTION OF SUBMONOLAYERS BY MEASUREMENT OF THE TOTAL ELECTRON YIELD (TEY) OF X-RAY EXCITED ELECTRON EMISSION Horst Ebel, Robert Svagera, Christian Hager, Maria F.Ebel, Christian Eisenmenger-Sittner,
More informationIMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 281 IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE Susumu Imashuku 1, Deh Ping Tee 1, Yasukazu
More informationA COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 320 A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS Hiroyoshi SOEJIMA and
More informationSpin-resolved photoelectron spectroscopy
Spin-resolved photoelectron spectroscopy Application Notes Spin-resolved photoelectron spectroscopy experiments were performed in an experimental station consisting of an analysis and a preparation chamber.
More informationAuger Electron Spectroscopy
Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection
More informationSYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD
73 SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD Atsuo Iida 1), Yoichi Takanishi 2) 1)Photon Factory, Institute of Materials Structure Science, High Energy
More informationFUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS 255 Yoshiyuki Kataoka 1, Naoki Kawahara 1, Shinya Hara 1, Yasujiro Yamada 1, Takashi Matsuo 1, Michael Mantler 2 1 Rigaku
More informationCOMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS - I. THEORY
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 380 COMPARISON OF THREE UNIVERSAL CURVES FOR THE ESCAPE PROBABILITY OF X-RAY EXCITED ELECTRONS - I. THEORY
More informationION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM.
822 ION-EXCHANGE FILMS FOR ELEMENT CONCENTRATION IN X-RAY FLUORESCENCE ANALYSIS WITH TOTAL REFLECTION OF THE PRIMARY BEAM. Abstract A.P.Morovov, L.D.Danilin, V.V.Zhmailo, Yu.V.Ignatiev, A.E.Lakhtikov,
More informationHomework 2: Forces on Charged Particles
Homework 2: Forces on Charged Particles 1. In the arrangement shown below, 2 C of positive charge is moved from plate S, which is at a potential of 250 V, to plate T, which is at a potential of 750 V.
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationAu-Ti THIN FILMS DEPOSITED ON GaAs
Au-Ti THIN FILMS DEPOSITED ON GaAs R. V. GHITA *, D. PANTELICA**, M. F. LAZARESCU *, A. S. MANEA *, C. LOGOFATU *, C. NEGRILA *, V. CIUPINA *** * National Institute of Material Physics, P.O. Box MG7, Mãgurele,
More informationPeter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K.
783 SCOPE AND LIMITATIONS XRF ANALYSIS FOR SEMI-QUANTITATIVE Introduction Peter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K. Historically x-ray fluorescence spectrometry has
More informationRepeatability of Spectral Intensity Using an Auger Electron Spectroscopy Instrument Equipped with a Cylindrical Mirror Analyzer
A. Kurokawa et al. Repeatability of Spectral Intensity Using an Auger lectron Spectroscopy Instrument quipped with a Cylindrical Mirror Analyzer Paper Repeatability of Spectral Intensity Using an Auger
More informationIn-vessel Tritium Inventory in ITER Evaluated by Deuterium Retention of Carbon Dust
FT/P1-19 In-vessel Tritium Inventory in ITER Evaluated by Deuterium Retention of Carbon Dust T. Hino 1), H. Yoshida 1), M. Akiba 2), S. Suzuki 2), Y. Hirohata 1) and Y. Yamauchi 1) 1) Laboratory of Plasma
More informationVORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 332 VORTEX A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS Shaul Barkan,
More informationACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 369 ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM
More informationFig 1: Auger Electron Generation (a) Step 1 and (b) Step 2
Auger Electron Spectroscopy (AES) Physics of AES: Auger Electrons were discovered in 1925 but were used in surface analysis technique in 1968. Auger Electron Spectroscopy (AES) is a very effective method
More informationChemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5
Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4
More informationDepth Distribution Functions of Secondary Electron Production and Emission
Depth Distribution Functions of Secondary Electron Production and Emission Z.J. Ding*, Y.G. Li, R.G. Zeng, S.F. Mao, P. Zhang and Z.M. Zhang Hefei National Laboratory for Physical Sciences at Microscale
More informationThe scanning microbeam PIXE analysis facility at NIRS
Nuclear Instruments and Methods in Physics Research B 210 (2003) 42 47 www.elsevier.com/locate/nimb The scanning microbeam PIXE analysis facility at NIRS Hitoshi Imaseki a, *, Masae Yukawa a, Frank Watt
More informationAN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS
96 AN EXAFS STUDY OF PHOTOGRAPHIC DEVELOPMENT IN THERMOGRAPHIC FILMS T. N. Blanton 1, D.R Whitcomb 2, and S.T. Misture 3 1 Eastman Kodak Company, Kodak Research Laboratories, Rochester, NY 14650-2106,
More informationEffect of Spiral Microwave Antenna Configuration on the Production of Nano-crystalline Film by Chemical Sputtering in ECR Plasma
THE HARRIS SCIENCE REVIEW OF DOSHISHA UNIVERSITY, VOL. 56, No. 1 April 2015 Effect of Spiral Microwave Antenna Configuration on the Production of Nano-crystalline Film by Chemical Sputtering in ECR Plasma
More informationUSABILITY OF PORTABLE X-RAY SPECTROMETER FOR DISCRIMINATION OF VALENCE STATES
Copyright (c)jcpds-international Centre for Diffraction Data 00, Advances in X-ray Analysis, Volume 45. 409 ISSN 1097-000 USABIITY OF POTABE X-AY SPECTOMETE FO DISCIMINATION OF VAENCE STATES I.A.Brytov,.I.Plotnikov,B.D.Kalinin,
More informationSILICON DRIFT DETECTORS FOR HIGH RESOLUTION, HIGH COUNT RATE X-RAY SPECTROSCOPY AT ROOM TEMPERATURE
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 53 SILICON DRIFT DETECTORS FOR HIGH RESOLUTION, HIGH COUNT RATE X-RAY SPECTROSCOPY AT ROOM TEMPERATURE
More informationMONTE-CARLO MODELING OF SILICON X-RAY DETECTORS
274 MONTE-CARLO MODELING OF SILICON X-RAY DETECTORS Brian Cross (1), Greg Bale (2), Barrie Lowe (2) and Rob Sareen (2) (1) CrossRoads Scientific, 414 Av. Portola, El Granada, CA 94018-1823, USA. (2) Gresham
More informationAPPLICATION OF MICRO X-RAY FLUORESCENCE SPECTROMETRY FOR LOCALIZED AREA ANALYSIS OF BIOLOGICAL AND ENVIRONMENTAL MATERIALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2000,Advances in X-ray Analysis,Vol.43 540 APPLICATION OF MICRO X-RAY FLUORESCENCE SPECTROMETRY FOR LOCALIZED AREA ANALYSIS OF BIOLOGICAL AND
More informationMEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS
, MEASUREMENT CAPABILITIES OF X-RAY FLUORESCENCE FOR BPSG FILMS K.O. Goyal, J.W. Westphal Semiconductor Equipment Group Watkins-Johnson Company Scotts Valley, California 95066 Abstract Deposition of borophosphosilicate
More informationAuger Electron Spectroscopy Overview
Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E
More informationphysics/ Sep 1997
GLAS-PPE/97-6 28 August 1997 Department of Physics & Astronomy Experimental Particle Physics Group Kelvin Building, University of Glasgow, Glasgow, G12 8QQ, Scotland. Telephone: +44 - ()141 3398855 Fax:
More informationReduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment.
NATIOMEM Reduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment. R. Grilli *, P. Mack, M.A. Baker * * University of Surrey, UK ThermoFisher Scientific
More informationExperimental study of nonlinear laser-beam Thomson scattering
Experimental study of nonlinear laser-beam Thomson scattering T. Kumita, Y. Kamiya, T. Hirose Department of Physics, Tokyo Metropolitan University, 1-1 Minami-Ohsawa, Hachioji, Tokyo 192-0397, Japan I.
More informationHigh Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni
High Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni K. N. Altmann, D. Y. Petrovykh, and F. J. Himpsel Department of Physics, University of Wisconsin, Madison, 1150
More informationAn Analysis of Secondary Enhancement Effects in Quantitative XRFA
An Analysis of Secondary Enhancement Effects in Quantitative XRFA Michael Mantler Institut fur Angewandte und Technische Physik Vienna University of Technology, Vienna, Austria Secondary enhancement effects
More informationElastic Recoil Detection Method using DT Neutrons for Hydrogen Isotope Analysis in Fusion Materials. Abstract
Elastic Recoil Detection Method using DT Neutrons for Hydrogen Isotope Analysis in Fusion Materials Naoyoshi Kubota, Kentaro Ochiai, Keitaro Kondo 2 and Takeo Nishitani. :Japan Atomic Energy Research Institute,
More informationPHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy
PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray
More informationSimulation of the cathode surface damages in a HOPFED during ion bombardment
Simulation of the cathode surface damages in a HOPFED during ion bombardment Hongping Zhao, Wei Lei, a Xiaobing Zhang, Xiaohua Li, and Qilong Wang Department of Electronic Engineering, Southeast University,
More informationFUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON EXCITATION
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 511 FUNDAMENTAL PARAMETER METHOD FOR THE LOW ENERGY REGION INCLUDING CASCADE EFFECT AND PHOTOELECTRON
More informationQUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES
QUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES 287 Chul-Un Ro Department of Chemistry, Inha University 253, Yonghyun-dong, Nam-gu, Incheon 402-751, Korea ABSTRACT
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationBi-directional phase transition of Cu/6H SiC( ) system discovered by positron beam study
Applied Surface Science 194 (2002) 278 282 Bi-directional phase transition of Cu/6H SiC(0 0 0 1) system discovered by positron beam study J.D. Zhang a,*, H.M. Weng b, Y.Y. Shan a, H.M. Ching a, C.D. Beling
More informationX-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect was enunciated
More informationMethods of surface analysis
Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice
More informationStudying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies.
PY482 Lecture. February 28 th, 2013 Studying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies. Kevin E. Smith Department of Physics Department of Chemistry Division
More informationPhotoemission Spectroscopy
FY13 Experimental Physics - Auger Electron Spectroscopy Photoemission Spectroscopy Supervisor: Per Morgen SDU, Institute of Physics Campusvej 55 DK - 5250 Odense S Ulrik Robenhagen,
More informationSECONDARY ELECTRON EMISSION OF CERAMICS USED IN THE CHANNEL OF SPT
SECONDARY ELECTRON EMISSION OF CERAMICS USED IN THE CHANNEL OF SPT V. Viel-Inguimbert, ONERA/DESP, Avenue Edouard Belin, 3 55 Toulouse Cédex, FRANCE INTRODUCTION In the frame of the development of a plasma
More informationInstitut für Experimentalphysik, Johannes Kepler Universität Linz, A-4040 Linz, Austria.
On the Surface Sensitivity of Angular Scans in LEIS D. Primetzhofer a*, S.N. Markin a, R. Kolarova a, M. Draxler a R. Beikler b, E. Taglauer b and P. Bauer a a Institut für Experimentalphysik, Johannes
More informationLecture 6 Plasmas. Chapters 10 &16 Wolf and Tauber. ECE611 / CHE611 Electronic Materials Processing Fall John Labram 1/68
Lecture 6 Plasmas Chapters 10 &16 Wolf and Tauber 1/68 Announcements Homework: Homework will be returned to you on Thursday (12 th October). Solutions will be also posted online on Thursday (12 th October)
More informationINVESTIGATION OF COMPRESSION AND THERMAL EXPANSION OF a-mnte USING A CUBIC-ANVIL X-RAY DIFFRACTION PRESS
INVESTIGATION OF COMPRESSION AND THERMAL EXPANSION OF a-mnte USING A CUBIC-ANVIL X-RAY DIFFRACTION PRESS W.Paszkowicz, E.Dynowska and T.Peun* Institute of Physics, Polish Academy of Sciences, al. Lotnikow
More informationIn Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron Radiation
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 371 In Situ High-Temperature Study Of Silver Behenate Reduction To Silver Metal Using Synchrotron
More informationElectron beam scanning
Electron beam scanning The Electron beam scanning operates through an electro-optical system which has the task of deflecting the beam Synchronously with cathode ray tube which create the image, beam moves
More informationDesorption and Sputtering on Solid Surfaces by Low-energy Multicharged Ions
Desorption and Sputtering on Solid Surfaces by Low-energy Multicharged Ions K. Motohashi Department of Biomedical Engineering, Toyo University motohashi@toyonet.toyo.ac.jp 1. Background Sputtering and
More informationThe use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades
Nuclear Instruments and Methods in Physics Research B 230 (2005) 608 612 www.elsevier.com/locate/nimb The use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades
More informationChapter Six: X-Rays. 6.1 Discovery of X-rays
Chapter Six: X-Rays 6.1 Discovery of X-rays In late 1895, a German physicist, W. C. Roentgen was working with a cathode ray tube in his laboratory. He was working with tubes similar to our fluorescent
More informationNEW X-RAY DETECTORS FOR XRF ANALYSIS. Jan S. Iwanczyk & Bradley E. Patt Photon Imaging, Inc., Northridge, CA 91324
951 NEW X-RAY DETECTORS FOR XRF ANALYSIS Jan S. Iwanczyk & Bradley E. Patt Photon Imaging, Inc., Northridge, CA 91324 Abstract The use of miniaturized XRF instrumentation for in-vivo applications imposes
More informationBORON IN GLASS DETERMINATION USING WDXRF
269 ABSTRACT BORON IN GLASS DETERMINATION USING WDXRF Alexander Seyfarth Bruker AXS Inc., 5465 East Cheryl Parkway, Madison, Wisconsin 53711-5373 The application of wavelength-dispersive XRF to the analysis
More informationA Sustainable Synthesis of Nitrogen-Doped Carbon Aerogels
A Sustainable Synthesis of Nitrogen-Doped Carbon Aerogels Supporting Information By Robin J. White, a, * Noriko Yoshizawa, b Markus Antonietti, a and Maria-Magdalena Titirici. a * e-mail: robin.white@mpikg.mpg.de
More informationChemistry Instrumental Analysis Lecture 19 Chapter 12. Chem 4631
Chemistry 4631 Instrumental Analysis Lecture 19 Chapter 12 There are three major techniques used for elemental analysis: Optical spectrometry Mass spectrometry X-ray spectrometry X-ray Techniques include:
More informationGeneration of X-Rays in the SEM specimen
Generation of X-Rays in the SEM specimen The electron beam generates X-ray photons in the beam-specimen interaction volume beneath the specimen surface. Some X-ray photons emerging from the specimen have
More informationX-ray Absorption Spectroscopy
X-ray Absorption Spectroscopy Nikki Truss November 26, 2012 Abstract In these experiments, some aspects of x-ray absorption spectroscopy were investigated. The x-ray spectrum of molybdenum was recorded
More informationCLUSTER SIZE DEPENDENCE OF SPUTTERING YIELD BY CLUSTER ION BEAM IRRADIATION
CLUSTER SIZE DEPENDENCE OF SPUTTERING YIELD BY CLUSTER ION BEAM IRRADIATION T. Seki 1,2), T. Murase 1), J. Matsuo 1) 1) Quantum Science and Engineering Center, Kyoto University 2) Collaborative Research
More information(i) Show that the energy of a single photon is about 3 x J.
1(a) A helium-neon laser emits red light of wavelength 6.3 x 10 7 m. (i) Show that the energy of a single photon is about 3 x 10 19 J. [2] The power of the laser beam is 1.0 mw. Show that about 3 x 10
More informationAn Anomalous Contrast in Scanning Electron Microscopy of Insulators: The Pseudo Mirror Effect.
SCANNING VOL., 35-356 (000) Received: March 7, 000 FAMS, Inc. Accepted with revision: August, 000 An Anomalous Contrast in Scanning Electron Microscopy of Insulators: The Pseudo Mirror Effect. M. BELHAJ
More informationA new detector for neutron beam monitoring
A new detector for neutron beam monitoring European Organization for Nuclear Research (CERN), Geneva, Switzerland in collaboration with Commissariat à l Energie Atomique (CEA), Saclay, France, Instituto
More informationPERFORMANCE IMPROVEMENT OF CZT DETECTORS BY LINE ELECTRODE GEOMETRY
Applications of Nuclear Techniques (CRETE3) International Journal of Modern Physics: Conference Series Vol. 27 (24) 4644 (8 pages) The Authors DOI:.42/S294546446 PERFORMANCE IMPROVEMENT OF CZT DETECTORS
More informationPositron Annihilation Spectroscopy - A non-destructive method for material testing -
Maik Butterling Institute of Radiation Physics http://www.hzdr.de Positron Annihilation Spectroscopy - A non-destructive method for material testing - Maik Butterling Positron Annihilation Spectroscopy
More informationSupporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
More informationQUANTITATIVE TEY (TOTAL ELECTRON YIELD) - THEORY, INSTRUMENTATION AND EXPRIMENTAL RESULTS
732 QUANTITATIVE TEY (TOTAL ELECTRON YIELD) - THEORY, INSTRUMENTATION AND EXPRIMENTAL RESULTS Horst Ebel, Robert Svagera, Maria F. Ebel and Matthias Baron Institut fiir Angewandte und Technische Physik
More informationNova 600 NanoLab Dual beam Focused Ion Beam IITKanpur
Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500
More informationMS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS
2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)
More informationA NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILM
Copyright JCPS - International Centre for iffraction ata, Advances in X-ray Analysis, Volume 46. 56 A NEW SALL ANGLE X-RAY SCATTERING TECHNIQUE FOR ETERINING NANO-SCALE PORE/PARTICLE SIZE ISTRIBUTIONS
More informationSYSTEM FOR PIXE TRACE ELEMENT ANALYSIS AT MTF. M. Beňo, J. Dobrovodský, D. Vaňa, S. Minárik
SYSTEM FOR PIXE TRACE ELEMENT ANALYSIS AT MTF M. Beňo, J. Dobrovodský, D. Vaňa, S. Minárik Slovak University of Technology in Bratislava, Faculty of Materials Science and Technology in Trnava (MTF), Advanced
More informationMagnetism of TbPc 2 SMMs on ferromagnetic electrodes used in organic spintronics
Electronic supplementary information Magnetism of TbPc 2 SMMs on ferromagnetic electrodes used in organic spintronics L. Malavolti, a L. Poggini, a L. Margheriti, a D. Chiappe, b P. Graziosi, c B. Cortigiani,
More informationEfficiency of modern large-area photo-detectors
Efficiency of modern large-area photo-detectors Valentin Ivanov 1 Institute of Computational Technologies, Siberian Branch of RAS 6, Acad. Lavrent'ev prosp., Novosibirsk, Russia E-mail: vivanov.48@mail.ru
More informationA.5. Ion-Surface Interactions A.5.1. Energy and Charge Dependence of the Sputtering Induced by Highly Charged Xe Ions T. Sekioka,* M. Terasawa,* T.
A.5. Ion-Surface Interactions A.5.1. Energy and Charge Dependence of the Sputtering Induced by Highly Charged Xe Ions T. Sekioka,* M. Terasawa,* T. Mitamura,* M.P. Stöckli, U. Lehnert, and D. Fry The interaction
More informationAppearance Potential Spectroscopy
Appearance Potential Spectroscopy Submitted by Sajanlal P. R CY06D009 Sreeprasad T. S CY06D008 Dept. of Chemistry IIT MADRAS February 2006 1 Contents Page number 1. Introduction 3 2. Theory of APS 3 3.
More information