SPP03N60S5 SPB03N60S5

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1 Cool MOS Power Transistor New revolutionary high voltage technology Ultra low gate charge Periodic avalanche proved Extreme dv/dt rated Optimized capacitances Improved noise immunity Former development designation: SPPx4N6S5/SPBx4N6S5 D,2 G, S,3 CO LMOS Power Semiconductors Type V DS I D R DS(on) Package Marking Ordering Code 6 V Ω P-TO22-3- P-TO Maximum Ratings, at T j = 25 C, unless otherwise specified 3N6S5 3N6S5 Q674-S484 Q674-S497 Parameter Symbol Value Unit Continuous drain current I D T C = 25 C T C = C Pulsed drain current, t p = ms ) I D puls 5.7 T C = 25 C valanche energy, single pulse E S mj I D = 3.2, V DD = 5 V, R GS = 25 Ω Periodic avalanche energy E R only limited by T jmax Reverse diode dv/dt I S = 3.2, V DS <V DSS, di/dt = /µs, dv/dt 6 kv/µs T jmax = 5 C Gate source voltage V GS ±2 V Power dissipation T C = 25 C P tot 38 C Operating and storage temperature T j, T stg C Semiconductor Group

2 Electrical Characteristics Parameter Symbol Values Unit at T j = 25 C, unless otherwise specified min. typ. max. Thermal Characteristics Thermal resistance, junction - case R thjc K/W Thermal resistance, junction - ambient (Leaded and through-hole packages) R thj SMD version, device on min. 6 cm 2 cooling area 2) R thj Static Characteristics Drain- source breakdown voltage V GS = V, I D =.25 m Gate threshold voltage, V GS = V DS I D = 35 µ, T j = 25 C Zero gate voltage drain current, V DS =V DSS V GS = V, T j = 25 C V GS = V, T j = 5 C Gate-source leakage current V GS = 2 V, V DS = V Drain-Source on-state resistance V GS = V, I D = 2 V (BR)DSS V V GS(th) I DSS µ I GSS - - n R DS(on) Ω current limited by Tjmax 2 Device on 5mm*5mm*.5mm epoxy PCB FR4 with 6 cm2 (one layer, 7µm thick) copper area for drain connection. PCB is vertical without blown air. Semiconductor Group 2

3 Electrical Characteristics Parameter Symbol Values Unit at T j = 25 C, unless otherwise specified min. typ. max. Characteristics Transconductance g fs S V DS 2*I D *R DS(on)max, I D = 2 Input capacitance C iss - 44 pf V GS = V, V DS = 25 V, f = MHz Output capacitance C oss - 23 V GS = V, V DS = 25 V, f = MHz Reverse transfer capacitance C rss - 2 V GS = V, V DS = 25 V, f = MHz Turn-on delay time t d(on) - 4 ns V DD = 35 V, V GS = V, I D = 3.2, R G = 2 Ω Rise time t r V DD = 35 V, V GS = V, I D = 3.2, R G = 2 Ω Turn-off delay time t d(off) - 6 V DD = 35 V, V GS = V, I D = 3.2, R G = 2 Ω Fall time V DD = 35 V, V GS = V, I D = 3.2, R G = 2 Ω t f Semiconductor Group 3

4 Electrical Characteristics Parameter Symbol Values Unit at T j = 25 C, unless otherwise specified min. typ. max. Gate Charge Characteristics Gate-source charge Q gs nc I D = 3.2, V DD = 35 V Gate-drain charge Q gd I D = 3.2, V DD = 35 V Total gate charge V DD = 35 V, I D = 3.2, V GS = to V Q g Reverse Diode Inverse diode continuous forward current T C = 25 C Inverse diode direct current,pulsed T C = 25 C Inverse diode forward voltage V GS = V, I F = 3.2 Reverse recovery time V R = 35 V, I F =I S, di F /dt = /µs Reverse recovery charge V R = 35 V, I F =l S, di F /dt = /µs I S I SM V SD -.2 V t rr - - ns Q rr µc Semiconductor Group 4

5 Power Dissipation P tot = f (T C ) 4 W Preliminary data Drain current I D = f (T C ) parameter: V GS V Ptot 24 ID C C 6 5 T j Safe operating area I D =f (T C ) parameter: D=., T C =25 C t p = 6.µs Transient thermal impedance Z thjc = f(t P ) Parameter: D=t P /T ID R DS(on) = V DS / I D µs ZthJC K/W - DC ms ms - D=.5 D=.2 D=. D=.5 D=.2 D=. single pulse -2 2 V 3 V DS s t p Semiconductor Group 5

6 Typ. output characteristic I D = f(v DS ); T j =25 C Parameter: V GS V 3V V Preliminary data Drain-source on-resistance R DS(on) = f (T j ) parameter : I D = 2, V GS = V 5.5 Ω 4.5 ID V RDS(on) % typ 2.. 7V V 26 V DS Typ. transfer characteristics I D = f ( V GS ) parameter: t p = 8 µs V DS 2 x I D x R DS(on)max C 8 T j Typ. capacitances C = f(v DS ) Parameter: V GS = V, f= MHz 4 pf Ciss ID 6 C 2 5 Coss 4 3 Crss V 2 V GS V V DS Semiconductor Group 6

7 Gate threshold voltage V GS(th) = f (T j ) parameter: V GS = V DS, I D = 35 µ 7 Preliminary data valanche Energy E S = f (T j ) parameter: I D = 3.2, V DD = 5 V R GS = 25 Ω 2 V mj VGS(th) % ES 8 typ % C 8 T j Forward characteristics of reverse diode I F = f (V SD ) parameter: T j, tp = 8 µs C 6 T j Drain-source break down voltage V (BR)DSS =f (T j ) 7 V 66 IF V(BR)DSS T j = 25 C typ T j = 5 C typ T j = 25 C (98%) T j = 5 C (98%) V 3. V SD C 8 T j Semiconductor Group 7

8 Typ. gate charge V GS = f (Q Gate ) parameter: I Dpuls = Preliminary data V 2,2 V DS max,8 V DS max VGS nc 2 Q g Semiconductor Group 8

9 P-TO22-3- dimensions [mm] symbol min max B C D E F G H K L M 2.54 typ. N P.7.4 T Semiconductor Group 9

10 P-TO22-3 SMD dimensions [mm] symbol min max B.7.3 C..6 D.3.7 E F typ..85 G H typ. 4.5 K.7.37 L M N P. 5 typ..2 Q R S max 3. T.4.6 U V W X Y Z Semiconductor Group

11 Edition Published by Siemens G, Bereich Halbleiter Vetrieb, Werbung, Balanstraße 73, 854 München Siemens G 997 ll Rights Reserved. ttention please! s far as patents or other rights of third parties are concerned, liability is only assumed for components, not for applications, processes and circuits implemented within components or assemblies. The information describes a type of component and shall not be considered as warranted characteristics. Terms of delivery and rights to change design reserved. For questions on technology, delivery and prices please contact the Semiconductor Group Offices in Germany or the Siemens Companies and Representatives worldwide (see address list). Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Siemens Office, Semiconductor Group. Siemens G is an approved CECC manufacturer. Packing Please use the recycling operators known to you. We can also help you - get in touch with your nearest sales office. By agreement we will take packing material back, if it is sorted. You must bear the costs of transport. For packing material that is returned to us unsorted or which we are not obliged to accept, we shall have to invoice you for any costs incurred. Components used in life-support devices or systems must be expressly authorized for such purpose! Critical components of the Semiconductor Group of Siemens G, may only be used in life-support devices or systems 2 with the express written approval of the Semiconductor Group of Siemens G. ) critical component is a component used in a life-support device or system whose failure can reasonably be expected to cause the failure of that life-support device or system, or to affect its safety or effectiveness of that device or system. 2)Life support devices or systems are intended (a) to be implanted in the human body, or (b) to support and/or maintain and sustain and/or protecf human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Semiconductor Group

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