Items Requirements Test Methods and Remarks 1. Operating Temperature Range 2. Storage Temperature Range 3. Terminal Strength.

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1 Solid Tantalum Chip Capacitors (TC& Series). Operating Temperature Range. Storage Temperature Range. Terminal Strength No removal or split of the termination or other defects shall occur. -55 to to +5 Solder the capacitor inductor to the testing jig (glass epoxy board shown as the left figure) using eutectic solder. Then apply a force in the direction of the arrow. 5N force Keep time: 0±s Speed:.0mm/s Chip F Mounting Pad. Resistance to Solder the capacitor to the test jig (glass epoxy board) Using a eutectic solder. Then apply a force in the direction shown as the following figure. : mm; Pressurizing Speed: 0.5mm/sec. Keep time: 0 sec. Unit: mm [inch] 0 0 R0 5[.77] 5[.77] : mm Φ Vibration Solder the capacitor to the testing jig (glass epoxy board shown as the following figure) using eutectic solder. The capacitor shall be subjected to a simple harmonic motion having total amplitude of.5mm, the frequency being varied uniformly between the approximate limits of 0 and 55 Hz. The frequency range from 0 to 55 Hz and return to 0 Hz shall be traversed in approximately minute. This motion shall be applied for a period of hours in each mutually perpendicular directions (total of 6 hours). Solder mask Cu pad Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

2 Solid Tantalum Chip Capacitors (TC& Series) 6. Solderability No visible mechanical Solder temperature: 0± Duration: sec Wetting shall be exceeded Solder: Sn/.0Ag/0.5Cu 95% coverage. Flux: 5% Resin and 75% ethanol in weight 7. Resistance to Soldering Heat 5 No visible mechanical Wetting shall exceed 95% coverage. Capacitance change: within ±5%. tanδ shall not exceed 50% of the initial I 0 change shall not Solder temperature: 60± Duration: 5 sec Solder: Sn/.0Ag/0.5Cu Flux: 5% Resin and 75% ethanol in weight 5 The chip shall be stabilized at normal condition for ~ hours 8. Temperature exceed the initial I 0 A. At -55 No visible mechanical Capacitance change: within -0%. tanδ shall not exceed 50% of the initial B. At 85 No visible mechanical Capacitance change: <0% tanδ shall not exceed 50% of the initial I 0 shall not exceed 0 I 0 C. At 5 No visible mechanical Capacitance change: <%. tanδ shall not exceed 50% of the initial I 0 shall not exceed.5 Drying 0 + min at 5 The chip shall be stabilized at normal condition for ~ hours after drying, and measured at 5 as initial data. The chip shall be measured at -55 After Step A, the chip shall cool to room temperature. Measure at 85. After Step B, the chip shall be measured at Thermal Shock Capacitance change: within ±5%. tanδ shall not exceed the initial I 0 shall not exceed the initial I 0. I 0. Temperature, Time (See the following figure) -55, 0± min 5, 0±min. Transforming interval: Max. 5min. Tested cycle: 5 cycles. 5 The chip shall be stabilized at normal condition for ~ hours Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

3 Solid Tantalum Chip Capacitors (TC& Series) 0. Moisture Resistance No visible mechanical Temperature: 0±. Relative Humidity: 90%~95%RH. Capacitance change: within ±0%. Duration: hours. The chip shall be stabilized at normal condition for ~ hours tanδ shall not exceed 50% of the initial I 0 shall not exceed I 0.. Life Test No visible mechanical Capacitance change: within±0%. tanδ shall not exceed the initial I 0 shall not exceed.5 Temperature: 85± ; Rated Voltage Duration: hours The chip shall be stabilized at normal condition for ~ hours I 0. Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

4 Solid Tantalum Chip Capacitors (TC Series). Operating Temperature Range -55 to +05. Storage Temperature Range -55 to +05. Terminal No removal or split of the Solder the capacitor inductor to the testing jig (glass epoxy board Strength termination or other defects shown as the left figure) using eutectic solder. Then apply a force shall occur. in the direction of the arrow. Case code and shear: Case Size Max. Shear (Kg) code B D V E Keep time: 0±s Speed:.0mm/s Chip F Mounting Pad. Resistance to Solder the capacitor to the test jig (glass epoxy board) Using a eutectic solder. Then apply a force in the direction shown as the following figure. : mm; Pressurizing Speed: 0.5mm/sec. Keep time: 0 sec. Unit: mm [inch] Φ.5 R Fig Fig Vibration Solder the capacitor to the testing jig (glass epoxy board shown as the following figure) using eutectic solder. The capacitor shall be subjected to a simple harmonic motion having total amplitude of.5mm, the frequency being varied uniformly between the approximate limits of 0 and 55 Hz. The frequency range from 0 to 55 Hz and return to 0 Hz shall be traversed in approximately minute. This motion shall be applied for a period of hours in each mutually perpendicular directions (total of 6 hours). Solder mask Cu pad Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

5 Solid Tantalum Chip Capacitors (TC Series) 6. Solderability No visible mechanical Solder temperature: 5± Duration: sec Wetting shall be exceeded Solder: Sn/.0Ag/0.5Cu 95% coverage. Flux: 5% Resin and 75% ethanol in weight The less 5% of area is permitted to contain a few defect,such as pinholes holes un-soaking or poor soaking area which do not gather together. 7. Resistance to Soldering Heat No visible mechanical Wetting shall exceed 95% coverage. Capacitance change: within ±0%. tanδ shall not exceed 50% of the initial 5 I 0 change shall not exceed Solder temperature: 60± Duration: 5 sec Solder: Sn/.0Ag/0.5Cu Flux: 5% Resin and 75% ethanol in weight 5 The chip shall be stabilized at normal condition for hours 8. Temperature the initial I 0 A. At -55 No visible mechanical Capacitance change: within ±0%. tanδ shall not exceed the initial B. At 5 No visible mechanical Capacitance change: within ±0% tanδ shall not exceed the initial I 0 shall not exceed I 0 C. At 85 No visible mechanical Capacitance change: within ±0% tanδ shall not exceed 0% of the initial I 0 shall not exceed 0 I 0. D. At 05 No visible mechanical Capacitance change: within ±0%. tanδ shall not exceed 50% of the initial 5 I 0 shall not exceed 0 I 0. Drying 0 + min at 05 The chip shall be stabilized at normal condition for hours after drying, and measured at 5 as initial data. The chip shall be measured at -55 After Step A, the chip shall be cooled to 85 and measured. After Step B, the chip shall be measured at 85. After Step C, the chip shall be measured at 05. Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

6 Solid Tantalum Chip Capacitors (TC Series) 8. Temperature E. At 5 After Step D, the chip shall be cooled to 5 and measured. No visible mechanical Capacitance change: within ±0% tanδ shall not exceed the initial Leakage current shall not exceed I Thermal Shock Capacitance change: Temperature, Time (See Fig.6..7) within -0%~+0%. -55, 0± min 05, 0±min. tanδ shall not exceed the Transforming interval: Max.5min. initial Tested cycle: 500cycles. Leakage current shall not exceed the initial I 0. 5 The chip shall be stabilized at normal condition for hours before ESR shall not exceed 00% of the initial 0. Moisture Resistance No visible mechanical Capacitance change: -5%~+5%. tanδ shall not exceed of the initial I 0 shall not exceed 5I 0. 5 ESR shall not exceed 00% of the initial. Life Test No visible mechanical Capacitance change: -0%~+0%. tanδ shall not exceed the initial I 0 shall not exceed I 0. 5 ESR shall not exceed the initial. Surge Voltage No visible mechanical Capacitance change: -0%~+0%. tanδ shall not exceed the initial Leakage current shall not Fig.6..7 Temperature: 60±. Relative Humidity: 90%~95%RH. Duration: hours. The chip shall be stabilized at normal condition for hours before Temperature: 85± ; Rated Voltage Duration: hours The chip shall be stabilized at normal condition for hours before Temperature:05± ; ΩResistance,.Rated Voltage; 000cycles. 5 exceed I 0. ESR shall not exceed the initial Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

7 Solid Tantalum Chip Capacitors (TC Series) Item Requirements Test Methods and Remarks 6.. Terminal Strength shear shear Solder the capacitor to the test board(glass epoxy board shown in Fig. 6..-),then apply a force in the direction as Fig. 6..-; Fig.6..- Case code and shear: Case Size Max. Shear (Kg) code B C D V E Keep time:0±sec; speed:.0mm/sec 6.. Resistance to unit:mm Φ.5 Solder the capacitor to the test jig (glass epoxy board shown in Tab. 5-) Using a eutectic solder. Then apply a force in the direction shown in Fig. 6..-~Fig : mm; Pressurizing Speed: 0.5mm/sec. Keep time: 0 sec. 0 0 R0 00 Fig Fig Vibration Cu pad Solder mask Fig.6..- Solder the capacitor to the testing jig (glass epoxy board shown in Fig.6..-) using eutectic solder. The capacitor shall be subjected to a simple harmonic motion having total amplitude of.5mm, the frequency being varied uniformly between the approximate limits of 0 and 55 Hz. The frequency range from 0 to 55 Hz and return to 0 Hz shall be traversed in approximately minute. This motion shall be applied for a period of hours in each mutually perpendicular directions (total of 6 hours). 6.. Solderability Wetting shall exceed 95% coverage. The less 5% of area is permitted to contain a few defect,such as pinholes holes un-soaking or poor soaking area which do not gather together. Solder temperature: 5± Duration: sec. Solder: Sn/.0Ag/0.5Cu Flux: 5% Resin and 75% ethanol in weight Resistance to Soldering Heat Wetting shall exceed 95% coverage. Capacitance change: within ±0%. tanδ shall not exceed 50% of the initial 5 Leakage current change shall not exceed Solder temperature: 60± Duration: 5 sec. Solder: Sn/.0Ag/0.5Cu Flux: 5% Resin and 75% ethanol in weight. 5 The chip shall be stabilized at normal condition for hours before the initial I 0. Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

8 Solid Tantalum Chip Capacitors (TC Series) Item Requirements Test Methods and Remarks 6..6 Temperature properties 6..7 Thermal Shock A. At -55 Capacitance change: within±0%. tanδ shall not exceed the initial B. At 5 Capacitance change: within ±0% tanδ shall not exceed the initial Leakage current shall not exceed I 0. C. C. At 85 Capacitance change: within ±0% tanδ shall not exceed 0% of the initial Leakage current shall not exceed 0 I 0. D. At 05 Capacitance change: within ±0%. tanδ shall not exceed 50% of the initial Leakage current shall not exceed 0 I 0. E. At 5 Capacitance change: within ±0% tanδ shall not exceed the initial Leakage current shall not exceed I 0. Capacitance change: within -0%~+0%. tanδ shall not exceed the initial Leakage current shall not exceed the initial I 0. ESR shall not exceed 00% of the initial Drying 0 + min at 05 The chip shall be stabilized at normal condition for hours after drying, and measured at 5 as initial data. The chip shall be measured at -55. After Step A, the chip shall be cooled to 5 and measured. After Step B, the chip shall be measured at 85. After Step C, the chip shall be measured at 05. After Step D, the chip shall be cooled to 5 and measured. Temperature, Time (See Fig.6..7) -55, 0± min 05, 0±min. Transforming interval: Max.5min. Tested cycle: 500cycles. 5 The chip shall be stabilized at normal condition for hours before 6..8 Moisture Resistance Capacitance change:-5%~+5%. tanδ shall not exceed of the initial Leakage current shall not exceed 5I 0. 5 ESR shall not exceed 00% of the initial Fig.6..7 Temperature: 60±. Relative Humidity: 90%~95%RH. Duration: hours. The chip shall be stabilized at normal condition for hours before Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

9 Solid Tantalum Chip Capacitors (TC Series) Item Requirements Test Methods and Remarks 6..9 Life Test 6..0 Surge Voltage Capacitance change: -0%~+0%. tanδ shall not exceed the initial Leakage current shall not exceed I 0. 5 ESR shall not exceed the initial Capacitance change: -0%~+0%. tanδ shall not exceed the initial Leakage current shall not exceed I 0. 5 ESR shall not exceed the initial Temperature: 85± ; Rated Voltage Duration: hours The chip shall be stabilized at normal condition for hours before Temperature:05± ; ΩResistance,.Rated Voltage; 000cycles. Specifications subject to change without notice. Please check our website for latest information. Revised 0/05/5 Industrial Park, Dafuyuan Industrial Zone, Guanlan, Shenzhen, China 580 Tel: Fax: sunlord@sunlordinc.com

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