MATSE 482/Phys 430 TUNNELING MICROSCOPIES Spring 2003

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1 MATSE 482/Phys 430 TUNNELING MICROSCOPIES Spring 2003 Projection Microscopy, Field Emission and Field Ion Microscopy R. Gomer, Field Emission and Field Ionization (Harvard University Press, 1961), pp. l-9, A bit murky at times, but otherwise a reasonable review of field emission of electrons. R. Good and E. W. Müller, Handbuch der Physik 21, 176 (1956). Very good introduction to the physics of field emission. E. W. Müller, and T. T. Tsong, Field Ion Microscopy, (Elsevier, 1969) pp The basic reference on field ion microscopy, but outdated in details. M. Bowkett and D. A. Smith, Field Ion Microscopy, (North Holland Publ. Co., 1970). Quite good on applications. W. Müller and T. T. Tsong, Progress in Surf. Sci. 4, part 1 (1974). Update of their book. A. van Oostrom, CRC Rev. Solid State Science 4, (1974). A brief survey of field emission and field ion microscopy. G. Ehrlich, Physics Today, June 1981, pp. 44. Brief survey of early results obtained with FIM. A. Modinos, Field, Thermionic, and Secondary Electron Emission Spectroscopy (Plenum, New York 1984). An interesting review of field electron-emission. H. C. Miller, J. Franklin Inst. 282, 382 (1966). The elliptic functions in field emission. A. J. Melmed, in Chemistry and Physics of Solid Surfaces Vl, edited by R. Vanselow and R. Howe (Springer, Berlin 1986), Chapt. 13. Field emission microscopy. A. Panitz, J. Phys. E. 15, 1281 (1982). Review of FIM. R. Wagner, in Crystals 6, edited by H. C. Freyhardt (Springer, Berlin 1982). FIM in materials studies. R.G. Forbes, J. Phys. D 18, 973 (1985). Imaging mechanisms in FIM. J. A. Panitz, in Solid State Physics: Surfaces, edited by R. L. Park and M. G. Lagally (Academic, Orlando 1985) Chapt. 7. High-field Techniques: FIM and FEM. G. L. Kellogg, J. Phys. E 20, 125 (1987). Pulsed-laser atom probe mass spectroscopy. N. Ernst and G. Ehrlich, in Microscopic Methods in Metals, edited by U. Gonser, Vol. 40 of Topics in Current Physics (Springer, Berlin 1986), Chapt. 4. Field evaporation and FIM techniques. J. M. Walls, ed. Methods of Surface Analysis (Cambridge, 1990). Brief intro to atom probe. D. P. Woodruff and T. A. Delchar, Modern Techniques of Surface Science, (Cambridge Univ. Press, Cambridge 1986) Chapt. 6. High field methods. T. T. Tsong, Atom Probe Field Ion Microscopy (Cambridge, 1990). Recent update of Müller & Tsong.

2 2 M.K. Miller, A. Cerezo, M.G. Hetherington, and G.D.W. Smith, Atom Probe Field Ion Microscopy (Clarendon, Oxford 1996). M.K. Miller and G.D. Smith, Atom Probe Microanalysis: Principles and Applications to Materials Problems (Materials Res. Soc. 1988). A.T. Hubbard (Editor), Surface Imaging and Visualization (CRC, Boca Raton 1995). An overview of lots of techniques. G.L. Kellogg, Surf. Sci. Repts. 21, 1-88 (1994). Review of single-atom surface diffusion studies. T. T. Tsong, Phys. Today 46, 5-24 (1993). A brief review of atom-probe field ion microscopy. N. Ernst, Appl. Surf. Sci. 67, (1993). Appearance energy spectroscopy of field ions. G. Ehrlich, in Surface Diffusion: Atomistic and Collective Processes, ed. M.C. Tringides (Plenum, N.Y. 1997) p. 23 Surface Diffusion of Metal Atoms and Clusters Directly Observed J. W. Gadzuk and E. W. Plummer, in Solid State Surf. Sci., ed by M. Green (Dekker, NY 1973) Vol. 3, p Field emission spectroscopy of chemisorbed atoms. For the most recent work, see the Proceedings Intl. Field Emission Symposium, published in J. de Physique, and also Appl. Surf. Sci.. Most recent volume: Field Emission 97, in Mat. Sci. Eng. A 250, No. 1 (1998). Tunneling and Field Ionization D. Bohm, Quantum Theory (Prentice-Hall, 1951), Chapts. 11 and 12. Old fashioned, but elementary survey of fundamentals. W. H. Rice and R. E. Good, Jr., J. Opt. Soc. Am. 52, 239 (1962). A. Messiah, Quantum Mechanics (North-Holland, 1965), Vol. I, pp , M. H. Alexander, Phys. Rev. 178, 34 (1969). Exact calculation of H field ionization. T. Yamabe, A. Tachibane, and H. J. Silverstone, Phys. Rev. A 16, 877 (1977). More recent work on field-ionization of H atoms. J. A. Appelbaum and E. G. McRae, Surface Sci. 47, 445 (1975). Also R. S. Chambers, Ph.D. Thesis, Dept. of Physics, UIUC 1976, Chapt. III. A detailed discussion of field ionization at surfaces. E. W. Plummer, in Interactions on Metal Surfaces, ed. R. Gomer (Springer, New York 1975), Chapt. 5. Field emission as a spectroscopic tool. D. R. Kingham, Vacuum 32, 471 (1982). Review of field evaporation. R. G. Forbes and K. Chibana, Surface Sci. 121, 275 (1982). Detailed techniques for interpretation of field evaporation measurements.

3 3 H. J. Kreuzer, Chemistry and Physics of Solid Surfaces VIII, ed. by R. Vanselow and R. Howe (Springer-Verlag, Berlin 1990) Chap. 7. Surface physics and chemistry in high electric fields. S. C. Lam and R. J. Needs, Surf. Sci. 271, 376 (1992). Tunneling rates in the field ion microscope. Scanning Tunneling Microscopy The Beginnings of the Technique R. D. Young, Surface Microtopography, Physics Today, Nov. 1971, p. 42. R. Young, I. Ward, and F. Scire, Rev. Sci. Inst. 43, 999 (1972). Description of Topgraphiner, the early version of STM. E. C. Teague, J. Res. Natl. Bur. Stand. 91, 171 (1986). Reproduction of 1978 thesis giving the first demonstration of vacuum tunneling. J. G. Simmons, J. Appl. Phys. 34, 1793 (1963). Simple tunneling relations between plates. G. Binnig and H. Rohrer, Helv. Phys. Acta 55, 726 (1982). Also Surface Sci. 126, 236 (1983). Early presentations of STM. I. Tersoff and D. R. Hamann, Phys. Rev. Lett. 50, 1998 (1983). Resolution of STM. J. A. Golovchenko, Science 232, 48 (1986). Short review of STM. R. M. Tromp, R. J. Hamers, and J. F. Demuth, Science 234, 304 (1986). Silicon studies with STM. C. F. Quate, Physics Today 39, August, p. 26 (1986). Recent history of STM. News: Search and Discovery, Physics Today 40, Jan. p. 17 (1987). Physics Nobel Prize for STM. R. Sonnenfeld and P. K. Hansma, Science 232, 211 (l986). Atomic resolution microscopy in water. Scanning Tunneling Microscope, Chemical and Engineering News, April 21, Workshop on STM IBM J. of Res. Develop. 30, No. 4 and 5 (1986) Workshop on STM, Surf. Sci. 181, 1/2 (1987). For More Current Examples: Proc. Intl. Conference on STM. Second JVST 6, 257 (1988). Fourth JVST 8, 153 (1990). Also Topical Conference on Nanometer Scale Properties of Surfaces and Interfaces, JVST 8, 3577 (1990).

4 4 ****A. Ikai, Surf. Sci. Rpts., 26, (1996) STM and AFM of bio/organic molecules and structures. J. A. Kubby and J. J. Boland, Surf. Sci. Rpts., 26, (1996). Scanning tunneling microscopy/semiconductor surfaces. F. Besenbacher, Rpt. Prog. Phys., 59, (1996). STM studies of metal surfaces. H.-J. Günther, D. Anselmetti, and E. Meyer, Forces in Scanning Probe Methods (Kluwer, Dordrecht, 1995). Ch. Bai, Scanning Tunneling Microscopy & Its Application (Springer-Verlag, Berlin 1995). J. Tersoff, in Chemistry and Physics of Solid Surfaces VIII, ed. by R. Vanselow and R. Howe (Springer Verlag, Berlin 1990) Chap. 14. Theoretical Aspects of Scanning Tunneling Microscopy. P. Avouris and I.-W. Lyo, ibid, Chap. 16, Studying Surface Chemistry Atom-by-Atom Using the STM. J. S. Murday and R. J. Coulton, ibid, Chap 15. Techniques for measuring at the nanometer scale. U. Hartmann, Adv. Electronics Electron Phys. 87, (1994). Fundamentals and special applications of non-contact scanning force microscopy. C. J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford Univ. Press, New York 1993). D. A. Bonnell, Editor, Scanning Tunneling Micrsocpy and Spectroscopy: Theory, Techniques, and Applications (VCH Publishers, 1993). H. Neddermeyer, Editor, Scanning Tunneling Microscopy (Kluwer, Dordrecht,1993).

5 5 H.-J. Güntherodt and R. Wiesendanger, eds., Scanning Tunneling Microscopy I: General Principles and Applications, 2 nd Edition (Springer-Verlag, Berlin 1994). R. Wiesendanger and H.-J. Güntherodt, eds., Scanning Tunneling Microscopy II: Further Applications, 2 nd Edition (Springer-Verlag, Berlin 1995). R. Wiesendanger and H.-J. Güntherodt, eds., Scanning Tunneling Microscopy III: Thoery of SIM and Related Scanning Probe Methods, 2 nd Edition (Springer-Verlag, Berlin 1996). M. Tsukada, K. Kobayashi, N. Isshiki and H. Kageshima, Surf. Sci. Repts. 13, 265 (1991). FIrst principles theory of STM. L.E.C. van de Leemput and H. van Kempen, Rep. Prog. Phys. 55, 1165 (1992). Review of STM (by Materials Researchers). C. Hamann and M. Hietschold, Raster-Tunnel Mikroskopie (Akademie Verlag, Berlin 1991). STM in German. R. J. Behm and W. Hösler, in Chemistry and Physics of Solid Surfaces VI, edited by R. Vanselow and R. Howe (Springer, Berlin 1986), Chapt. 14. Review of Scanning Tunneling Microscopy.

6 6 Also G. M. McClelland, ibid, Chapt. 18, Tribology on the Atomic Scale. R. M. Feenstra and J. A. Stroscio, Physica Scripta T19, 55 (1987). Real-space determination of surface structure by STM. G. K. Binnig, Physica Scripta, Tl9, 53 (1987). Atomic-force microscopy. J. B. Pethica and W. C. Oliver, Physica Scripta, Tl9, 61 (1987). Tip-surface interactions in STM and ATM. U. Dürig, J. K. Gimzewski and D. W. Pohl, Phys. Rev. Lett. 57, 2403 (1986). Observation of forces in STM. U. Dürig, O. Züger and D. W. Pohl, Phys. Rev. Lett. 65, 349 (1990). Observation of metallic adhesion using the Scanning Tunneling Microscope. R. M. Trump, in Chemistry and Physics of Solid Surfaces VII, ed. by R. Vanselow and R. Howe (Springer-Verlag, Berlin 1988) Chap. 19. Brief survey of STM. Y. Kuk and P. J. SIlverman, Rev. Sci. Inst. 60, 165 (1989). STM instrumentation. D. Rugar and P. Hansma, Atomic Force Microscopy, Physics Today, October 1990, pg. 23 R. J. Hamers, Ann. Rev. Phys. Chem. 40, 531 (1989). Atomic Resolution Surface Spectroscopy with the STM. R. M. Trump, J. Phys. (Condensed Matter) 1, (1989). Spectroscopy with the STM: A Critical Review. NATO Advanced Institute on Basic Concepts in Scanning Tunneling Microscopy and Related Methods, ed. by R. J. Behm, N. Garcia and H. Rohrer (Kluwer, Dedrecht, 1990). D. Sarid, Scanning Tip Microscopy (Oxford University Press, NY 1990). A. Yazdani and C.M. Lieber, Nature 401, (1999). Up close and personal to atoms.