MODERN TECHNIQUES OF SURFACE SCIENCE

Size: px
Start display at page:

Download "MODERN TECHNIQUES OF SURFACE SCIENCE"

Transcription

1 MODERN TECHNIQUES OF SURFACE SCIENCE Second edition D. P. WOODRUFF & T. A. DELCHAR Department ofphysics, University of Warwick CAMBRIDGE UNIVERSITY PRESS

2 Contents Preface to first edition Preface to second edition Abbreviations page xiii xv xvii 1 Introduction Why surfaces? Ultra-High-Vacuum (UHV), contamination and cleaning Adsorption at surfaces Surface analytical techniques 11 2 Surface crystallography and diffraction Surface symmetry Description of overlayer structures Reciprocal net and electron diffraction Electron diffraction - qualitative consideration Domains, Steps and defects Surface structure determination using LEED General considerations and the failure of Single scattering and Fourier transform methods Basic elements of multiple scattering theories Application of multiple scattering calculations Thermal effects Reflection High Energy Electron Diffraction (RHEED) X-ray methods of surface structure determination Introduction Grazing incidence refraction of X-rays at surfaces Measuring the diffraction pattern Crystal truncation rods 85 vu

3 Vlll Contents Applications of surface X-ray diffraction X-ray Standing waves 97 Further reading 104 Electron spectroscopies General considerations Introduction Electron attenuation lengths and surface specificity Electron energy spectrometers Electron energy distributions in electron spectroscopies Electron spectroscopies: core level spectroscopies X-ray Photoelectron Spectroscopy (XPS) Introduction Photon sources Shapes and shifts XPS as a core level spectroscopy Synchrotron radiation studies Structural effects in XPS Auger electron spectroscopy (AES) Introduction - basic processes Energy levels, shifts and shapes AES for surface composition analysis Structural effects in AES AES versus XPS - some comparisons Threshold techniques Appearance Potential Spectroscopy (APS) Ionisation Loss Spectroscopy (ILS) Structural effects in threshold spectroscopies Ultraviolet Photoelectron Spectroscopy (UPS) Introduction UPS in the elucidation of band structure UPS in the study of adsorbed molecules Inverse photoemission Introduction Photoemission and inverse photoemission - basic theory Experimental methods in inverse photoemission Applications of IPES and KRIPES 256 Further reading 264

4 Contents Incident ion techniques Introduction Charge exchange between ions and surfaces Ion Neutralisation Spectroscopy (INS) INS with metastable intermediates Experimental arrangements for INS Experimental results from neutralisation at metal surfaces Information from INS of metals Ion scattering techniques LEIS: basic principles Structural effects in LEIS Instrumentation, problems and prospects: LEIS Medium and High Energy Ion Scattering (MEIS and HEIS) Sputtering and depth profiling Secondary Ion Mass Spectrometry (SIMS) 338 Further reading 354 Desorption spectroscopies Introduction Thermal desorption techniques Introduction Qualitative analysis of pressure-time curves Experimental arrangements for flash desorption and TPD Flash desorption and TPD spectra Electronically stimulated desorption Basic mechanisms Mechanisms for physisorbed layers ESDIAD (ESD Ion Angular Distributions) Instrumentation and measurements Some applications and results 404 Further reading 409 Tunnclling microscopy Field emission The field emission microscope Factors governing Operation Practical microscope configurations 418 ix

5 X Contents Experimental results from Field Emission Microscopy (FEM) Field ionisation Field adsorption and field-induced chemisorption Field evaporation and desorption The field ion microscope The atom probe field ion microscope Electron Stimulated Field Desorption (ESFD) Scanning tunnelling microscopy Scanning Tunnelling Spectroscopy (STS) The Scanning Tunnelling Microscope (STM) Other applications of the STM The Atomic Force Microscope (AFM) 459 Further reading 460 Work function techniques Introduction Single crystal surfaces Polycrystalline surfaces Work function measurements based upon the diode method Work function measurements based on CPD Field emission measurements Phötoelectric measurements Experimental results 481 Further reading 484 Atomic and molecular beam scattering Introduction The beam-surface interaction Inelastic scattering, the classical view Inelastic scattering, the quantum mechanical view Elastic scattering Quantum versus classical formulation Scattering cross-section for diffuse scattering The production and use of molecular beams Detectors Experimental arrangements Scattering studies 513 Further reading 531

6 Contents 9 Vibrational spectroscopies Introduction IRAS Vibrational linewidths Electron Energy Loss Spectroscopy (EELS) Experimental methods in IRAS Applications of IRAS Breakdown of the relationship between adsorbate site and vibrational frequency Experimental methods in HREELS Experimental results from HREELS 557 Further reading 562 References 563 Index 576 xi

Surface Analysis - The Principal Techniques

Surface Analysis - The Principal Techniques Surface Analysis - The Principal Techniques Edited by John C. Vickerman Surface Analysis Research Centre, Department of Chemistry UMIST, Manchester, UK JOHN WILEY & SONS Chichester New York Weinheim Brisbane

More information

Surface Analysis - The Principal Techniques

Surface Analysis - The Principal Techniques Surface Analysis - The Principal Techniques 2nd Edition Editors johnc.vickerman Manchester Interdisciplinary Biocentre, University of Manchester, UK IAN S. GILMORE National Physical Laboratory, Teddington,

More information

Surface Sensitivity & Surface Specificity

Surface Sensitivity & Surface Specificity Surface Sensitivity & Surface Specificity The problems of sensitivity and detection limits are common to all forms of spectroscopy. In its simplest form, the question of sensitivity boils down to whether

More information

Recommendations for abbreviations in surface science and chemical spectroscopy. (1) The electron, photoelectron and related spectroscopies

Recommendations for abbreviations in surface science and chemical spectroscopy. (1) The electron, photoelectron and related spectroscopies 17.6.3 Recommendations for abbreviations in surface science and chemical spectroscopy The overall list of selected techniques and their abbreviations have been subdivided under the following principal

More information

Table 1.1 Surface Science Techniques (page 19-28) Acronym Name Description Primary Surface Information Adsorption or selective chemisorption (1)

Table 1.1 Surface Science Techniques (page 19-28) Acronym Name Description Primary Surface Information Adsorption or selective chemisorption (1) Table 1.1 Surface Science Techniques (page 19-28) Acronym Name Description Primary Surface Information Adsorption or selective chemisorption (1) Atoms or molecules are physisorbed into a porous structure

More information

Solid Surfaces, Interfaces and Thin Films

Solid Surfaces, Interfaces and Thin Films Hans Lüth Solid Surfaces, Interfaces and Thin Films Fifth Edition With 427 Figures.2e Springer Contents 1 Surface and Interface Physics: Its Definition and Importance... 1 Panel I: Ultrahigh Vacuum (UHV)

More information

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture

Nanoelectronics 09. Atsufumi Hirohata Department of Electronics. Quick Review over the Last Lecture Nanoelectronics 09 Atsufumi Hirohata Department of Electronics 13:00 Monday, 12/February/2018 (P/T 006) Quick Review over the Last Lecture ( Field effect transistor (FET) ): ( Drain ) current increases

More information

Low Energy Electrons and Surface Chemistry

Low Energy Electrons and Surface Chemistry G. Ertl, J. Küppers Low Energy Electrons and Surface Chemistry VCH 1 Basic concepts 1 1.1 Introduction 1 1.2 Principles of ultrahigh vacuum techniques 2 1.2.1 Why is UHV necessary? 2 1.2.2 Production of

More information

Lecture 5. X-ray Photoemission Spectroscopy (XPS)

Lecture 5. X-ray Photoemission Spectroscopy (XPS) Lecture 5 X-ray Photoemission Spectroscopy (XPS) 5. Photoemission Spectroscopy (XPS) 5. Principles 5.2 Interpretation 5.3 Instrumentation 5.4 XPS vs UV Photoelectron Spectroscopy (UPS) 5.5 Auger Electron

More information

Concepts in Surface Physics

Concepts in Surface Physics M.-C. Desjonqueres D. Spanjaard Concepts in Surface Physics Second Edition With 257 Figures Springer 1. Introduction................................. 1 2. Thermodynamical and Statistical Properties of

More information

MSE 321 Structural Characterization

MSE 321 Structural Characterization Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics

More information

Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis Fundamentals of Nanoscale Film Analysis Terry L. Alford Arizona State University Tempe, AZ, USA Leonard C. Feldman Vanderbilt University Nashville, TN, USA James W. Mayer Arizona State University Tempe,

More information

Nanoscale Surface Physics PHY 5XXX

Nanoscale Surface Physics PHY 5XXX SYLLABUS Nanoscale Surface Physics PHY 5XXX Spring Semester, 2006 Instructor: Dr. Beatriz Roldán-Cuenya Time: Tuesday and Thursday 4:00 to 5:45 pm Location: Theory: MAP 306, Laboratory: MAP 148 Office

More information

Practical Surface Analysis

Practical Surface Analysis Practical Surface Analysis SECOND EDITION Volume 1 Auger and X-ray Photoelectron Spectroscopy Edited by D. BRIGGS ICI PLC, Wilton Materials Research Centre, Wilton, Middlesbrough, Cleveland, UK and M.

More information

1 Introduction COPYRIGHTED MATERIAL. 1.1 HowdoweDefinetheSurface?

1 Introduction COPYRIGHTED MATERIAL. 1.1 HowdoweDefinetheSurface? 1 Introduction JOHN C. VICKERMAN Manchester Interdisciplinary Biocentre, School of Chemical Engineering and Analytical Science, The University of Manchester, Manchester, UK The surface behaviour of materials

More information

Methods of surface analysis

Methods of surface analysis Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice

More information

MSE 321 Structural Characterization

MSE 321 Structural Characterization Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics

More information

Experimental techniques of Surface Science and how a theorist understands them

Experimental techniques of Surface Science and how a theorist understands them Experimental techniques of Surface Science and how a theorist understands them Karsten Reuter Fritz-Haber-Institut der Max-Planck-Gesellschaft Faradayweg 4-6, D-14195 Berlin reuter@fhi-berlin.mpg.de 0.

More information

Experimental techniques in superatomic physics IV

Experimental techniques in superatomic physics IV Experimental techniques in superatomic physics IV Today Ion scattering Diffraction of x-rays, electrons, and neutrons Transmission and scanning electron microscopies Scanning tunnelling microscopy Atomic

More information

DIFFRACTION PHYSICS THIRD REVISED EDITION JOHN M. COWLEY. Regents' Professor enzeritus Arizona State University

DIFFRACTION PHYSICS THIRD REVISED EDITION JOHN M. COWLEY. Regents' Professor enzeritus Arizona State University DIFFRACTION PHYSICS THIRD REVISED EDITION JOHN M. COWLEY Regents' Professor enzeritus Arizona State University 1995 ELSEVIER Amsterdam Lausanne New York Oxford Shannon Tokyo CONTENTS Preface to the first

More information

Structure analysis: Electron diffraction LEED TEM RHEED

Structure analysis: Electron diffraction LEED TEM RHEED Structure analysis: Electron diffraction LEED: Low Energy Electron Diffraction SPA-LEED: Spot Profile Analysis Low Energy Electron diffraction RHEED: Reflection High Energy Electron Diffraction TEM: Transmission

More information

Vibrational Spectroscopy of Molecules on Surfaces

Vibrational Spectroscopy of Molecules on Surfaces Vibrational Spectroscopy of Molecules on Surfaces Edited by John T. Yates, Jr. University of Pittsburgh Pittsburgh, Pennsylvania and Theodore E. Madey National Bureau of Standards Gaithersburg, Maryland

More information

Electron Spettroscopies

Electron Spettroscopies Electron Spettroscopies Spettroscopy allows to characterize a material from the point of view of: chemical composition, electronic states and magnetism, electronic, roto-vibrational and magnetic excitations.

More information

Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) CHEM53200: Lecture 10 Secondary Ion Mass Spectrometry (SIMS) Major reference: Surface Analysis Edited by J. C. Vickerman (1997). 1 Primary particles may be: Secondary particles can be e s, neutral species

More information

XPS o ESCA UPS. Photoemission Spectroscopies. Threshold Spectroscopies (NEXAFS, APS etc ) The physics of photoemission.

XPS o ESCA UPS. Photoemission Spectroscopies. Threshold Spectroscopies (NEXAFS, APS etc ) The physics of photoemission. XPS o ESCA Photoemission Spectroscopies UPS Threshold Spectroscopies (NEXAFS, APS etc ) The physics of photoemission. How are photoemission spectra recorded: sources and analyzers Semi-quantitative analysis.

More information

Spectroscopies for Unoccupied States = Electrons

Spectroscopies for Unoccupied States = Electrons Spectroscopies for Unoccupied States = Electrons Photoemission 1 Hole Inverse Photoemission 1 Electron Tunneling Spectroscopy 1 Electron/Hole Emission 1 Hole Absorption Will be discussed with core levels

More information

Transmission Electron Microscopy

Transmission Electron Microscopy L. Reimer H. Kohl Transmission Electron Microscopy Physics of Image Formation Fifth Edition el Springer Contents 1 Introduction... 1 1.1 Transmission Electron Microscopy... 1 1.1.1 Conventional Transmission

More information

Advanced Lab Course. X-Ray Photoelectron Spectroscopy 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT Qualitative analysis Chemical Shifts 7

Advanced Lab Course. X-Ray Photoelectron Spectroscopy 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT Qualitative analysis Chemical Shifts 7 Advanced Lab Course X-Ray Photoelectron Spectroscopy M210 As of: 2015-04-01 Aim: Chemical analysis of surfaces. Content 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT 3 3.1 Qualitative analysis 6 3.2 Chemical

More information

Inelastic soft x-ray scattering, fluorescence and elastic radiation

Inelastic soft x-ray scattering, fluorescence and elastic radiation Inelastic soft x-ray scattering, fluorescence and elastic radiation What happens to the emission (or fluorescence) when the energy of the exciting photons changes? The emission spectra (can) change. One

More information

An Introduction to Diffraction and Scattering. School of Chemistry The University of Sydney

An Introduction to Diffraction and Scattering. School of Chemistry The University of Sydney An Introduction to Diffraction and Scattering Brendan J. Kennedy School of Chemistry The University of Sydney 1) Strong forces 2) Weak forces Types of Forces 3) Electromagnetic forces 4) Gravity Types

More information

Electron Spectroscopy

Electron Spectroscopy Electron Spectroscopy Photoelectron spectroscopy is based upon a single photon in/electron out process. The energy of a photon is given by the Einstein relation : E = h ν where h - Planck constant ( 6.62

More information

4. Other diffraction techniques

4. Other diffraction techniques 4. Other diffraction techniques 4.1 Reflection High Energy Electron Diffraction (RHEED) Setup: - Grazing-incidence high energy electron beam (3-5 kev: MEED,

More information

Surface Characterization of Advanced Polymers

Surface Characterization of Advanced Polymers Surface Characterization of Advanced Polymers Edited by Luigia Sabbatini and Pier Giorgio Zambonin VCH Weinheim New York Basel Cambridge Tokyo 1 Spectroscopies for Surface Characterization 1 E. Desimoni

More information

Lecture 12. study surfaces.

Lecture 12. study surfaces. Lecture 12 Solid Surfaces Techniques to Solid Surfaces. Techniques to study surfaces. Solid Surfaces Molecules on surfaces are not mobile (to large extent) Surfaces have a long-range order (crystalline)

More information

Appearance Potential Spectroscopy

Appearance Potential Spectroscopy Appearance Potential Spectroscopy Submitted by Sajanlal P. R CY06D009 Sreeprasad T. S CY06D008 Dept. of Chemistry IIT MADRAS February 2006 1 Contents Page number 1. Introduction 3 2. Theory of APS 3 3.

More information

Table 1: Residence time (τ) in seconds for adsorbed molecules

Table 1: Residence time (τ) in seconds for adsorbed molecules 1 Surfaces We got our first hint of the importance of surface processes in the mass spectrum of a high vacuum environment. The spectrum was dominated by water and carbon monoxide, species that represent

More information

8 Summary and outlook

8 Summary and outlook 91 8 Summary and outlook The main task of present work was to investigate the growth, the atomic and the electronic structures of Co oxide as well as Mn oxide films on Ag(001) by means of STM/STS at LT

More information

Techniken der Oberflächenphysik

Techniken der Oberflächenphysik Techniken der Oberflächenphysik Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik 18.01.2018 Contact: yong.lei@tu-ilmenau.de; yang.xu@tu-ilmenau.de Office: Heisenbergbau

More information

5) Surface photoelectron spectroscopy. For MChem, Spring, Dr. Qiao Chen (room 3R506) University of Sussex.

5) Surface photoelectron spectroscopy. For MChem, Spring, Dr. Qiao Chen (room 3R506) University of Sussex. For MChem, Spring, 2009 5) Surface photoelectron spectroscopy Dr. Qiao Chen (room 3R506) http://www.sussex.ac.uk/users/qc25/ University of Sussex Today s topics 1. Element analysis with XPS Binding energy,

More information

Characterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev

Characterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,

More information

EE 527 MICROFABRICATION. Lecture 5 Tai-Chang Chen University of Washington

EE 527 MICROFABRICATION. Lecture 5 Tai-Chang Chen University of Washington EE 527 MICROFABRICATION Lecture 5 Tai-Chang Chen University of Washington MICROSCOPY AND VISUALIZATION Electron microscope, transmission electron microscope Resolution: atomic imaging Use: lattice spacing.

More information

Characterisation of vibrational modes of adsorbed species

Characterisation of vibrational modes of adsorbed species 17.7.5 Characterisation of vibrational modes of adsorbed species Infrared spectroscopy (IR) See Ch.10. Infrared vibrational spectra originate in transitions between discrete vibrational energy levels of

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 2: UPS

MS482 Materials Characterization ( 재료분석 ) Lecture Note 2: UPS 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 2: UPS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

The Use of Synchrotron Radiation in Modern Research

The Use of Synchrotron Radiation in Modern Research The Use of Synchrotron Radiation in Modern Research Physics Chemistry Structural Biology Materials Science Geochemical and Environmental Science Atoms, molecules, liquids, solids. Electronic and geometric

More information

CHARACTERIZATION of NANOMATERIALS KHP

CHARACTERIZATION of NANOMATERIALS KHP CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope

More information

Electron spectroscopy Lecture Kai M. Siegbahn ( ) Nobel Price 1981 High resolution Electron Spectroscopy

Electron spectroscopy Lecture Kai M. Siegbahn ( ) Nobel Price 1981 High resolution Electron Spectroscopy Electron spectroscopy Lecture 1-21 Kai M. Siegbahn (1918 - ) Nobel Price 1981 High resolution Electron Spectroscopy 653: Electron Spectroscopy urse structure cture 1. Introduction to electron spectroscopies

More information

Unit title: Atomic and Nuclear Physics for Spectroscopic Applications

Unit title: Atomic and Nuclear Physics for Spectroscopic Applications Unit title: Atomic and Nuclear Physics for Spectroscopic Applications Unit code: Y/601/0417 QCF level: 4 Credit value: 15 Aim This unit provides an understanding of the underlying atomic and nuclear physics

More information

Lecture 5-8 Instrumentation

Lecture 5-8 Instrumentation Lecture 5-8 Instrumentation Requirements 1. Vacuum Mean Free Path Contamination Sticking probability UHV Materials Strength Stability Permeation Design considerations Pumping speed Virtual leaks Leaking

More information

Ma5: Auger- and Electron Energy Loss Spectroscopy

Ma5: Auger- and Electron Energy Loss Spectroscopy Ma5: Auger- and Electron Energy Loss Spectroscopy 1 Introduction Electron spectroscopies, namely Auger electron- and electron energy loss spectroscopy are utilized to determine the KLL spectrum and the

More information

5.8 Auger Electron Spectroscopy (AES)

5.8 Auger Electron Spectroscopy (AES) 5.8 Auger Electron Spectroscopy (AES) 5.8.1 The Auger Process X-ray and high energy electron bombardment of atom can create core hole Core hole will eventually decay via either (i) photon emission (x-ray

More information

An introduction to X- ray photoelectron spectroscopy

An introduction to X- ray photoelectron spectroscopy An introduction to X- ray photoelectron spectroscopy X-ray photoelectron spectroscopy belongs to a broad class of spectroscopic techniques, collectively called, electron spectroscopy. In general terms,

More information

APPLIED PHYSICS 216 X-RAY AND VUV PHYSICS (Sept. Dec., 2006)

APPLIED PHYSICS 216 X-RAY AND VUV PHYSICS (Sept. Dec., 2006) APPLIED PHYSICS 216 X-RAY AND VUV PHYSICS (Sept. Dec., 2006) Course Meeting: Monday, Wednesdays 11-12:15 Professor: Office Hours: Secretary: Mid Term: Final Exam: Another Course: Zhi-Xun Shen McCullough

More information

Lecture 5: Characterization methods

Lecture 5: Characterization methods Lecture 5: Characterization methods X-Ray techniques Single crystal X-Ray Diffration (XRD) Powder XRD Thin film X-Ray Reflection (XRR) Microscopic methods Optical microscopy Electron microscopies (SEM,

More information

X-ray Photoelectron Spectroscopy (XPS)

X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS) As part of the course Characterization of Catalysts and Surfaces Prof. Dr. Markus Ammann Paul Scherrer Institut markus.ammann@psi.ch Resource for further reading:

More information

Core Level Spectroscopies

Core Level Spectroscopies Core Level Spectroscopies Spectroscopies involving core levels are element-sensitive, and that makes them very useful for understanding chemical bonding, as well as for the study of complex materials.

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

Energy Spectroscopy. Ex.: Fe/MgO

Energy Spectroscopy. Ex.: Fe/MgO Energy Spectroscopy Spectroscopy gives access to the electronic properties (and thus chemistry, magnetism,..) of the investigated system with thickness dependence Ex.: Fe/MgO Fe O Mg Control of the oxidation

More information

Vibrational Spectroscopies. C-874 University of Delaware

Vibrational Spectroscopies. C-874 University of Delaware Vibrational Spectroscopies C-874 University of Delaware Vibrational Spectroscopies..everything that living things do can be understood in terms of the jigglings and wigglings of atoms.. R. P. Feymann Vibrational

More information

Preamble: Emphasis: Material = Device? MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS

Preamble: Emphasis: Material = Device? MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS MTSE 719 - PHYSCL PRIN CHARACTIZTN SOLIDS Section # Call # Days / Times 001 96175 -View Book Info - F:100PM - 355PM - TIER114 Preamble: Core course

More information

GAS-SURFACE INTERACTIONS

GAS-SURFACE INTERACTIONS Page 1 of 16 GAS-SURFACE INTERACTIONS In modern surface science, important technological processes often involve the adsorption of molecules in gaseous form onto a surface. We can treat this adsorption

More information

Ted Madey s Scientific Career at NBS/NIST: Aspects of Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Vacuum Science

Ted Madey s Scientific Career at NBS/NIST: Aspects of Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Vacuum Science Ted Madey s Scientific Career at NBS/NIST: Aspects of Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Vacuum Science Cedric J. Powell 1. Ted s 25-year career at NBS/NIST:

More information

Photoelectron Spectroscopy

Photoelectron Spectroscopy Stefan Hüfner Photoelectron Spectroscopy Principles and Applications Third Revised and Enlarged Edition With 461 Figures and 28 Tables JSJ Springer ... 1. Introduction and Basic Principles 1 1.1 Historical

More information

Lecture 20 Auger Electron Spectroscopy

Lecture 20 Auger Electron Spectroscopy Lecture 20 Auger Electron Spectroscopy Auger history cloud chamber Although Auger emission is intense, it was not used until 1950 s. Evolution of vacuum technology and the application of Auger Spectroscopy

More information

Photon Interaction. Spectroscopy

Photon Interaction. Spectroscopy Photon Interaction Incident photon interacts with electrons Core and Valence Cross Sections Photon is Adsorbed Elastic Scattered Inelastic Scattered Electron is Emitted Excitated Dexcitated Stöhr, NEXAPS

More information

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960 Introduction to X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate

More information

desorption (ESD) of the O,/Si( 111) surface K. Sakamoto *, K. Nakatsuji, H. Daimon, T. Yonezawa, S. Suga

desorption (ESD) of the O,/Si( 111) surface K. Sakamoto *, K. Nakatsuji, H. Daimon, T. Yonezawa, S. Suga -!!!I c%sj ELSEVIER Surface Science 306 (1994) 93-98.:.:.j:::~:::~~~::::::~:~::~~:~~,:~.~...,.. ~. :...:E.:.:: :.:.::::::~.:.:.:.:.:.:.,:.:,:,:. ~.~:+::.:.::::::j:::~::::.:...( ~ :.:.::.:.:.:,:..:,: :,,...

More information

X-Ray Photoelectron Spectroscopy (XPS) Auger Electron Spectroscopy (AES)

X-Ray Photoelectron Spectroscopy (XPS) Auger Electron Spectroscopy (AES) X-Ray Photoelectron Spectroscopy (XPS) Auger Electron Spectroscopy (AES) XPS X-ray photoelectron spectroscopy (XPS) is one of the most used techniques to chemically characterize the surface. Also known

More information

Name: (a) What core levels are responsible for the three photoelectron peaks in Fig. 1?

Name: (a) What core levels are responsible for the three photoelectron peaks in Fig. 1? Physics 243A--Surface Physics of Materials: Spectroscopy Final Examination December 16, 2014 (3 problems, 100 points total, open book, open notes and handouts) Name: [1] (50 points), including Figures

More information

Probing Matter: Diffraction, Spectroscopy and Photoemission

Probing Matter: Diffraction, Spectroscopy and Photoemission Probing Matter: Diffraction, Spectroscopy and Photoemission Anders Nilsson Stanford Synchrotron Radiation Laboratory Why X-rays? VUV? What can we hope to learn? 1 Photon Interaction Incident photon interacts

More information

Film Characterization Tutorial G.J. Mankey, 01/23/04. Center for Materials for Information Technology an NSF Materials Science and Engineering Center

Film Characterization Tutorial G.J. Mankey, 01/23/04. Center for Materials for Information Technology an NSF Materials Science and Engineering Center Film Characterization Tutorial G.J. Mankey, 01/23/04 Theory vs. Experiment A theory is something nobody believes, except the person who made it. An experiment is something everybody believes, except the

More information

Chemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5

Chemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5 Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4

More information

Grazing Incidence Fast Atom Diffraction: a new tool for surface characterization

Grazing Incidence Fast Atom Diffraction: a new tool for surface characterization Grazing Incidence Fast Atom Diffraction: a new tool for surface characterization Victor H. Etgens Institut des NanoSciences de Paris Outline Introduction GIFAD : technique how it works; Experimental set-up;

More information

4. How can fragmentation be useful in identifying compounds? Permits identification of branching not observed in soft ionization.

4. How can fragmentation be useful in identifying compounds? Permits identification of branching not observed in soft ionization. Homework 9: Chapters 20-21 Assigned 12 April; Due 17 April 2006; Quiz on 19 April 2006 Chap. 20 (Molecular Mass Spectroscopy) Chap. 21 (Surface Analysis) 1. What are the types of ion sources in molecular

More information

Evidence for partial dissociation of water on flat MgO(1 0 0) surfaces

Evidence for partial dissociation of water on flat MgO(1 0 0) surfaces 6 February 2002 Chemical Physics Letters 352 (2002) 318 322 www.elsevier.com/locate/cplett Evidence for partial dissociation of water on flat MgO(1 0 0) surfaces Y.D. Kim a, R.M. Lynden-Bell b, *, A. Alavi

More information

( 1+ A) 2 cos2 θ Incident Ion Techniques for Surface Composition Analysis Ion Scattering Spectroscopy (ISS)

( 1+ A) 2 cos2 θ Incident Ion Techniques for Surface Composition Analysis Ion Scattering Spectroscopy (ISS) 5.16 Incident Ion Techniques for Surface Composition Analysis 5.16.1 Ion Scattering Spectroscopy (ISS) At moderate kinetic energies (few hundred ev to few kev) ion scattered from a surface in simple kinematic

More information

Spectroscopy. Practical Handbook of. J. W. Robinson, Ph.D., D.Sc, F.R.C.S. Department of Chemistry Louisiana State University Baton Rouge, Louisiana

Spectroscopy. Practical Handbook of. J. W. Robinson, Ph.D., D.Sc, F.R.C.S. Department of Chemistry Louisiana State University Baton Rouge, Louisiana Practical Handbook of Spectroscopy Edited by J. W. Robinson, Ph.D., D.Sc, F.R.C.S. Department of Chemistry Louisiana State University Baton Rouge, Louisiana CRC Press Boca Raton Ann Arbor Boston TABLE

More information

T. Pradeep

T. Pradeep Analytical Instrumentation Analytical of analysis Analysis ana + lysis, Greek total, whole + separating, loosing Separating the whole into parts, by examination Analyst, analytical, analytic, analytics,

More information

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS) X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Fulmer 261A Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect

More information

Part II: Thin Film Characterization

Part II: Thin Film Characterization Part II: Thin Film Characterization General details of thin film characterization instruments 1. Introduction to Thin Film Characterization Techniques 2. Structural characterization: SEM, TEM, AFM, STM

More information

Lecture 23 X-Ray & UV Techniques

Lecture 23 X-Ray & UV Techniques Lecture 23 X-Ray & UV Techniques Schroder: Chapter 11.3 1/50 Announcements Homework 6/6: Will be online on later today. Due Wednesday June 6th at 10:00am. I will return it at the final exam (14 th June).

More information

Evidence for structure sensitivity in the high pressure CO NO reaction over Pd(111) and Pd(100)

Evidence for structure sensitivity in the high pressure CO NO reaction over Pd(111) and Pd(100) Evidence for structure sensitivity in the high pressure CO NO reaction over Pd(111) and Pd(100) Scott M. Vesecky, Peijun Chen, Xueping Xu, and D. Wayne Goodman a) Department of Chemistry, Texas A&M University,

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS. Byungha Shin Dept. of MSE, KAIST

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS. Byungha Shin Dept. of MSE, KAIST 2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

Auger Electron Spectrometry. EMSE-515 F. Ernst

Auger Electron Spectrometry. EMSE-515 F. Ernst Auger Electron Spectrometry EMSE-515 F. Ernst 1 Principle of AES electron or photon in, electron out radiation-less transition Auger electron electron energy properties of atom 2 Brief History of Auger

More information

X-Ray Photoelectron Spectroscopy (XPS)

X-Ray Photoelectron Spectroscopy (XPS) X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect was enunciated

More information

Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Elastic and Inelastic Scattering in Electron Diffraction and Imaging Elastic and Inelastic Scattering in Electron Diffraction and Imaging Contents Introduction Symbols and definitions Part A Diffraction and imaging of elastically scattered electrons Chapter 1. Basic kinematical

More information

Low-dimensional NbO structures on the Nb(110) surface: scanning tunneling microscopy, electron spectroscopy and diffraction

Low-dimensional NbO structures on the Nb(110) surface: scanning tunneling microscopy, electron spectroscopy and diffraction Low-dimensional NbO structures on the Nb(110) surface: scanning tunneling microscopy, electron spectroscopy and diffraction A.S. Razinkin, E.V. Shalaeva and M.V. Kuznetsov Institute of Solid State Chemistry,

More information

Microscopical and Microanalytical Methods (NANO3)

Microscopical and Microanalytical Methods (NANO3) Microscopical and Microanalytical Methods (NANO3) 06.11.15 10:15-12:00 Introduction - SPM methods 13.11.15 10:15-12:00 STM 20.11.15 10:15-12:00 STS Erik Zupanič erik.zupanic@ijs.si stm.ijs.si 27.11.15

More information

SOFT X-RAYS AND EXTREME ULTRAVIOLET RADIATION

SOFT X-RAYS AND EXTREME ULTRAVIOLET RADIATION SOFT X-RAYS AND EXTREME ULTRAVIOLET RADIATION Principles and Applications DAVID ATTWOOD UNIVERSITY OF CALIFORNIA, BERKELEY AND LAWRENCE BERKELEY NATIONAL LABORATORY CAMBRIDGE UNIVERSITY PRESS Contents

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

An Introduction to Auger Electron Spectroscopy

An Introduction to Auger Electron Spectroscopy An Introduction to Auger Electron Spectroscopy Spyros Diplas MENA3100 SINTEF Materials & Chemistry, Department of Materials Physics & Centre of Materials Science and Nanotechnology, Department of Chemistry,

More information

SOLID STATE PHYSICS. Second Edition. John Wiley & Sons. J. R. Hook H. E. Hall. Department of Physics, University of Manchester

SOLID STATE PHYSICS. Second Edition. John Wiley & Sons. J. R. Hook H. E. Hall. Department of Physics, University of Manchester SOLID STATE PHYSICS Second Edition J. R. Hook H. E. Hall Department of Physics, University of Manchester John Wiley & Sons CHICHESTER NEW YORK BRISBANE TORONTO SINGAPORE Contents Flow diagram Inside front

More information

Materials Characterization. Foothill College Nanotechnology Program

Materials Characterization. Foothill College Nanotechnology Program Materials Characterization Foothill College Nanotechnology Program Overview The case for materials characterization Approaches to characterization Categories of instrumental techniques Who uses these tools?

More information

Surface Defects on Natural MoS 2

Surface Defects on Natural MoS 2 Supporting Information: Surface Defects on Natural MoS 2 Rafik Addou 1*, Luigi Colombo 2, and Robert M. Wallace 1* 1 Department of Materials Science and Engineering, The University of Texas at Dallas,

More information

Spectroscopy of Nanostructures. Angle-resolved Photoemission (ARPES, UPS)

Spectroscopy of Nanostructures. Angle-resolved Photoemission (ARPES, UPS) Spectroscopy of Nanostructures Angle-resolved Photoemission (ARPES, UPS) Measures all quantum numbers of an electron in a solid. E, k x,y, z, point group, spin E kin, ϑ,ϕ, hν, polarization, spin Electron

More information

Surface Studies by Scanning Tunneling Microscopy

Surface Studies by Scanning Tunneling Microscopy Surface Studies by Scanning Tunneling Microscopy G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel IBM Zurich Research Laboratory, 8803 Ruschlikon-ZH, Switzerland (Received by Phys. Rev. Lett. on 30th April,

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

Vacuum Science and Technology in Accelerators

Vacuum Science and Technology in Accelerators Vacuum Science and Technology in Accelerators Lectures are the members of ASTeC Vacuum Science Group: Oleg Malyshev (Lectures 1,6) Keith Middleman (Lectures 2,3) Joe Herbert (Lecture 4) Reza Valizadeh

More information

X- ray Photoelectron Spectroscopy and its application in phase- switching device study

X- ray Photoelectron Spectroscopy and its application in phase- switching device study X- ray Photoelectron Spectroscopy and its application in phase- switching device study Xinyuan Wang A53073806 I. Background X- ray photoelectron spectroscopy is of great importance in modern chemical and

More information

Surface Characte i r i zat on LEED Photoemission Phot Linear optics

Surface Characte i r i zat on LEED Photoemission Phot Linear optics Surface Characterization i LEED Photoemission Linear optics Surface characterization with electrons MPS M.P. Seah, WA W.A. Dench, Surf. Interf. Anal. 1 (1979) 2 LEED low energy electron diffraction De

More information

Spectroscopy. An introduction MENA3100,OBK,

Spectroscopy. An introduction MENA3100,OBK, Spectroscopy An introduction MENA3100,OBK, 24.01.18 Spectroscopy spectroscopy, n. spectrum, n. The art of using the spectroscope; that branch of science which involves the use of the spectroscope. In mod.

More information