Electrostatic and Dielectric Measurements for Hair Building Fibers from DC to Microwave Frequencies K. Y. You, Y. L. Then
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1 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences Electostatic and Dielectic Measuements fo Hai Building Fibes fom DC to Micowave Fequencies K. Y. You, Y. L. Then Intenational Science Index, Medical and Health Sciences waset.og/publication/ Abstact In ecent yeas, the hai building fibe has become popula, in othe wods, it is an effective method which helps people who suffe hai loss o spase hai since the hai building fibe is capable to ceate a natual look of simulated hai apidly. In the makets, thee ae a lot of hai fibe bands that have been designed to fomulate an intense bond with hai stands and make the hai appea moe voluminous instantly. Howeve, those poducts have thei own set of popeties. Thus, in this epot, some measuement techniques ae poposed to identify those poducts. Up to five diffeent bands of hai fibe ae tested. The electostatic and dielectic popeties of the hai fibes ae macoscopically tested using design DC and high fequency micowave techniques. Besides, the hai fibes ae micoscopically analysis by magnifying the stuctues of the fibe using scanning electon micoscope (SEM). Fom the SEM photos, the compaison of the unifomly shaped and boken ate of the hai fibes in the diffeent bulk samples can be obseved espectively. Keywods Hai fibe, electostatic, dielectic popeties, boken ate, micowave techniques. H I. INTRODUCTION AIR loss has become a common issue fo the public nowadays, which is influenced by age, disease, and a wide vaiety of othe factos. Recently, the inteest in hai building fibe has inceased because it is able to conceal hai loss within 30 seconds by speading the fibe on the hai. The fibe will be tied to evey existing individual stand of hai based on the electostatic pinciples which can esult moe voluminous hai [1], [8]. In the makets, thee ae a lot of hai fibe bands that have been designed to fomulate an intense bond with hai stands. Howeve, those poducts have thei own set of popeties. Thus, in this wok, some measuement techniques ae poposed to identify those hai fibes. Up to five diffeent bands of hai fibe ae tested, namely,,, and XFussion. The hai fibes ae micoscopically analysis by magnifying the stuctues of the fibe using scanning electon micoscope (SEM). Fom the SEM photos, the compaison of the unifomly shaped and boken ate of the hai fibes in the diffeent bulk samples can be obseved espectively. Besides, the electostatic and dielectic popeties of the hai fibes ae macoscopically tested using design DC and high fequency micowave techniques. In this wok, the dielectic popeties of the hai fibe has been measued in the micowave fequency ange, since the micowave signal often ciculate aound ou daily K. Y. You and Y. L. Then ae with the Communication Engineeing Depatment, Faculty of Electical Engineeing, Univesiti Teknologi Malaysia, UTM Skudai, Malaysia ( kyyou@fke.utm.my, andythenyl@yahoo.com). life, such as the signal geneated fom mobile phone and WiFi intenet seve. The measuement methods and esults analysis will be descibed in Sections III, IV and V, espectively. II. ELECTROSTATIC AND DIELECTRIC PROPERTIES OF HAIR FIBER Basically, the pefomance of the hai fibe is measued based on its chage density which allow the fibe to be attached to the eal human hai [1]. In fact, the total amount of chage in the fibe is often changing depends on the fibe conditions and the envionmental conditions [4]. As a matte of fact, the amount of chage on the fibe can be inceased by shaking the fibe in the containe befoe the fibe is used. Fiction between the fibe and the inne wall of the containe will geneate an additional fictional chage on the fibe. In this study, all fibe samples ae measued without pefoming any shaking, so that the measuement esults will be moe consistent and pecise. The chages on the hai fibe at DC stage is detemined based on the measued voltage, V (in unit Volt) and measued capacitance, C (in unit Faad) of the hai fibe. The elationship between the accumulated chage, Q, voltage, V and capacitance, C is given as: Q = V C (1) The capacitance, C in (1) is the paamete to measue the ability of the hai bulk fibe to stoe an electical chage. The value of the capacitance, C, which is highe indicates that moe chages can be stoed in the bulk fibe. Accoding to electostatic theoy, the capacitance, C is diectly popotional to the dielectic popeties of the fibe. Thus, indiectly, the pefomance of the fibe can also be efeed to the dielectic popeties of the bulk fibe. The dielectic popeties ae quantitatively epesented by the value of elative pemittivity, ε, which is witten as: ε = ε jε (2) whee the eal pat, ε is the dielectic constant and imaginay pat, ε is the dielectic loss facto. The dielectic constant, ε influences the electic field distibution and the phase of waves taveling though the fibe. In contast, the loss facto, ε influences the enegy absoption o attenuation of the fibe. Fom the loss facto, ε, the conductivity, σ of the five types of the hai fibes can be elatively compaed, since the loss facto at low fequencies, f (f < 2 GHz) is mainly contibuted by the conductivity of the hai fibe. The elationship between the conductivity, σ (in unit S/m) and the loss facto, ε is given as: Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
2 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences σ = 2π f ε oε (fo f < 2 GHz) (3) whee εo ( F/m) is the pemittivity of fee space. The conductivity, σ of the fibe can contibute to the pependicula fibe binding effect. This means that evey individual od fibe can conduct opposite chage between both ends of the od. One end of the od fibe can bind to the human hai whilst othe end will be epelled fom the human hai and poduce the pependicula aangement [1]. The magnified images ( 1000) eveal that the fibe stuctue of is vey simila to and both fibe ods have unifom shape. On the othe hand, the fibe stuctue of is simila to Xfussion. In addition, the fibe od is quite simila to the stuctue of the human hai. Intenational Science Index, Medical and Health Sciences waset.og/publication/ III. SCANNING ELECTRON MICROSCOPE ANALYSIS Nomal human hai stuctue [2] (c) (c) (d) (d) (e) (e) Fig. 1 SEM images of the distibution of hai fibe with 100-fold magnification The stuctue of the five fibes is magnified up to 100 and 1000, espectively, using Hitachi TM 3000 Tabletop Scanning Electon Micoscope (SEM) as shown in Figs. 1 and 2, espectively. Fig. 1 shows that the fibe distibution of the is moe compact compaed to othe fibe. Among the five types of fibes, shows the highest boken ates. Intenational Scholaly and Scientific Reseach & Innovation 9(3) 2015 (f) Fig. 2 Compaison between the human hai [2] and the simulated hai fibe stuctues 313 schola.waset.og/ /
3 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences IV. DC ELECTROSTATIC MEASUREMENTS In this wok, the chage, Q on the hai fibe is measued using designed capacitance senso as shown in Fig. 3. Plate clampe (Nylon) Sample holde Capacito plate (Bass) Scew Intenational Science Index, Medical and Health Sciences waset.og/publication/ Fig. 3 Coss-sectional view of the capacitance senso with labeled dimensions The senso consists of two cicula metallic plates (Bass) with 3 cm of adius, two plate clampes (Nylon) and one sample holde cove (Nylon) as shown in Fig. 4. Up to cm 3 of fibe sample is equied to be fully filled into the sample holde with 1 cm height (at the cente of the gap between the two metallic plates). The senso which filled with fibe sample, is connected to Fluke 289 multi-mete via test pobe and test lead as shown in Fig. 5. The DC voltage diffeence, V (mv) and capacitance, C (nf) between the two metallic plates with filled fibe samples ae espectively measued. The measuements ae ecoded in 15 minutes peiod and the aveage values ae ecoded as listed in Table I. Fom the measued V and C, the accumulated chage, Q (pc) on the suface of the metallic plate can be calculated using (1). In addition, the DC elative dielectic constant, ε of the fibe can be intepeted as: Csample ε = (4) C empty whee the C empty and C sample ae the empty-filled and fibe sample-filled measued capacitance, espectively. Fom the measuement esults, the hai fibe shows the ability to stoe the chage is much highe compaed to othe fibes at DC stage. TABLE I MEASURED V, C, Q AND ΕR AT DC STAGE Band V C V (mv) C (nf) Q = V ε (±0.01 mv) (±0.001 nf) (typ) (typ) C (pc) Empty Fig. 4 Senso components Senso fabication Keysight U1733C LCR mete Fluke 289 multi-mete Plate clampe (Nylon) Capacito plate (Bass) Capacito plate (Bass) Sample holde (Nylon) Plate clampe (Nylon) Senso Test pobe Test pobe Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
4 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences Empty (ε = 1) Fibe sample Agilent) U1733C handheld LCR mete. The capacitance measuement is efeed to as an ideal capacitance, C ideal in seies with a esistance so-called equivalent seies esistance (ESR) as shown in Fig. 6. Howeve, the given output measuement is in tem of C ideal, ESR and phase angle, θ c as tabulated in Table II. The elationship between the C ideal, ESR and θ c ae descibed in Fig. 6. The seies combination of ESR and C ideal can be witten in tem of impedance, Z as [6]: Intenational Science Index, Medical and Health Sciences waset.og/publication/ Fig. 5 Senso without sample Senso filled with fibe sample (c) Expeimental set-up V. LOSS FREQUENCY CAPACITANCE AND DIELECTRIC MEASUREMENTS ESR C ideal To positive teminal of LCR mete Metallic plate Metallic plate (Bass) Hai fibe sample Metallic plate (Bass) Nylon To gound teminal of LCR mete Metallic plate (c) C 1 Z = ESR j (5) ωc On the othe hand, the impedance, Z of the hai fibe sample is epesented as: ideal 1 Z = j (6) ωc In fact, the value of C in (6) is a complex numbe as: C = C jc (7) The vecto diagam fo (5) and (6) is shown in Fig. 7. TABLE II RAW MEASUREMENT DATA FOR HAIR FIBER USING U1733C LCR METER f (Hz) Empty C ideal (pf) θ c ( o ) ESR (MΩ) C ideal (pf) θ c ( o ) ESR (MΩ) k k k k k k k k k θ c ESR Metallic plate Metallic plate Fig. 6 Coss-sectional view of capacito senso The seies combination fo the measued ideal capacitance, C ideal and the measued seies esistance, ESR is equivalent to the capacitance, C of the hai fibes j ω C id e a l j ωc = ω ( C jc ) j In this measuement, the Fluke 289 multi-mete which connected to the senso, is eplaced by Keysight (fomely Fig. 7 Vecto diagam of the impedance, Z Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
5 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences Intenational Science Index, Medical and Health Sciences waset.og/publication/ Appling (7) in (6), yields, Z = j ω 1 ( C jc ) C jc = ω {( C ) + ( C ) } ω ( C ) + ( C ) { } Though the compaison of (5) and (8), the ESR and C ideal can be witten as: and ESR = ω C ideal = C {( C ) 2 ( ) 2 + C } ( C ) + ( C ) 2 2 C (8) (9) (10) Finally, the C and C can be obtained by solving (9) and (10) simultaneously with aid of data in Table II, as shown in Fig. 8. The C and C can be intepeted in elative pemittivity, ε as: C, (F) C,, (F) C jc ε = C jc ( sample) ( sample) ( empty) ( empty ) f (Hz) Empty XFussion Empty XFussion (11) ε, ε,, f (Hz) Empty f (Hz) Empty Fig. 8 Results of C, C, ε and ε vesus opeating fequency, f VI. MICROWAVE FREQUENCY DIELECTRIC MEASUREMENTS The elative pemittivity, ε, of the hai fibe sample which filled in a 5 cm length of coaxial waveguide ae obtained by measuing the eflection coefficient, S 11, and the tansmission coefficient, S [5], [7], [9]. The stuctue, mateial and dimension of the coaxial waveguide used in the measuements is shown in Fig f (Hz) Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
6 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences Coppe N-type connecto N-type connecto Step 1: Measue the A i φ of the ai-filled coaxial line Intenational Science Index, Medical and Health Sciences waset.og/publication/ Connect to post S 11 (c) (d) Fig. 9 Components of coaxial waveguide Fully-filled hai sample in coaxial line (c) Expeimental setup (d) Dimension of coaxial waveguide The linea magnitude, S 11, S, and the phase shift, Ø, fo ai and the hai fibe samples ae measued with an Agilent E5071C vecto netwok analyze (VNA) fom 0.5 GHz to 5 GHz. In Fig. 10, the Sample 11 and Sample ae the measued linea magnitudes of the eflection coefficient and the tansmission coefficient fo the sample, espectively. On the othe hand, the ds = 5 cm Ai φ (in adians) and Connect to post S Sam ple φ ae the tansmission phase shift of ai and hai fibe sample, espectively. Sample Step 2: Measue the 11, Sample and S am ple φ of the fibefilled coaxial 2 1 line Fig. 10 The measuement steps of hai fibe Once the values of measued Sample 11, Sample, A i φ and S a m p le φ ae obtained, the dielectic constant, ε 2 1, and the loss facto, ε, of the fibe sample can be detemined as: 2 1 Ai Sample φ φ + kod S 2 ε = α 2 S ko d S Ai Sample 2α S φ φ + kod s ε = 2 ko d S The attenuation, α S due to the fibe sample is calculated as: 2 2 ( S S ) (12) (13) α log Sample Sample S (14) d S whee k o is the popagation constant of the ai-filled coaxial waveguide. The calculated ε and ε fo the five kinds of hai fibes ae shown in Fig. 11. VII. DIELECTRIC MEASUREMENTS USING KEYSIGHT 85070D DIELECTRIC PROBE The Agilent 85070D dielectic pobe [3] is used to measue the dielectic popeties of hai fibe fom 300 MHz and 5 GHz at oom tempeatue (25 ± 1) C, as shown in Fig. 12. The measuement esults fo the five types of hai fibes ae shown in Fig. 13, in which the esults ae in good ageement with the calculated ε and ε in Fig. 11. Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
7 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences ε, ε, Intenational Science Index, Medical and Health Sciences waset.og/publication/ ε,, f (GHz) f (GHz) Fig. 11 The calculated ε and ε of the five types of hai fibes Hai fibe sample ε,, f (GHz) f (GHz) Fig. 13 The measued ε and ε of the five types of hai fibes using 85070D dielectic pobe VIII. CONCLUSION Fom the measuement esults, this study povides some conclusions: 1. hai fibe has a highe ability to stoe chage compaed with othe fibe bands fom DC to micowave fequency envionment. 2. hai fibe has the highest conductivity, σ value which will cause the fibe bundle appeas to be pependicula to the existing hai, in which the hai will look thicke with a small volume of the fibe powde. 3. and XFussion hai fibes have a suface stuctue which is vey simila to the suface stuctue of the human hai. 4. Density fibe distibution in the bulk fibe is the highest compaed to othe hai fibe bands. 5. All hai fibe shows a low factue ate of the od fibe in thei bulk sample, except. Fig. 12 Keysight 85070D dielectic pobe Hai fibe dielectic measuement using 85070D dielectic pobe REFERENCES [1] Gaham L. Hean. Electostatic popeties of hai building fibes. Retieved 2010, fom Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
8 Wold Academy of Science, Engineeing and Technology Intenational Jounal of Medical and Health Sciences Intenational Science Index, Medical and Health Sciences waset.og/publication/ poducts/culychemist-the-cuticle-is-the-fist-line-of-defense-fo-ouhai/ [2] Tonya Mckay. The cuticle is the fist line of defense fo ou hai. Retieved May 28, 2009, fom culeading/cul poducts/culychemist-the-cuticle-is-the-fist-line-ofdefense-fo-ou-hai/ [3] Agilent Technologies, Agilent 85070D Dielectic Pobe Kit: Poduct Oveview, Agilent Technologies Inc, U.S., [4] A. C. Lunn, and R. E. Evans, The electostatic popeties of human hai, J. Soc. Cosmet. Chem., vol. 28, pp , Septembe [5] A. M. Nicolson, and G. F. Ross, Measuement of the intinsic popeties of mateials by time-domain technique, IEEE Tans. Instum. Meas., vol. 19, no. 4, pp , Novembe [6] D. Stepins, G. Asmanis, and A. Asmanis, Measuing capacito paametes using vecto netwok analyzes, Electonics, vol. 18, no. 1, pp , June [7] C. J. Zhao, Q. X. Jiang, and S. H. Jing, Calibation-independent and position-insensitive tansmission/eflection method fo pemittivity measuement with one sample in coaxial line, IEEE Tansactions on Electomagnetic Compatibility, vol. 53, no. 3, pp , August [8] C. L. Zieing, enhances patient expeience, Hai Tansplant Foum Intenational, vol. 13, no. 1, pp. 257, Januay [9] H. Zhou, G. Z. Lu, Y. F. Li, S. Wang, and Y. Wang, An impoved method of detemining pemittivity and pemeability by S paametes, in PIERS Poceedings, Beijing, China, Mach 23-27, 2009, pp Kok Yeow You (M 09) was bon in He obtained his B.Sc. Physics (Honous) degee in Univesiti Kebangsaan Malaysia (UKM) in He pusued his M.Sc. in Micowave at the Faculty of Science in 2003 and his Ph.D. in Wave Popagation at the Institute fo Mathematical Reseach in 2006 in Univesiti Puta Malaysia (UPM), Sedang, Selango, Malaysia. Recently, he is a senio lectue at Communication Engineeing Depatment, Faculty of Electical Engineeing, Univesiti Teknologi Malaysia (UTM), Skudai, Joho, Malaysia. His main pesonnel eseach inteest is in the theoy, simulation, and instumentation of electomagnetic wave popagation at micowave fequencies focusing on the development of micowave sensos fo agicultual and biomedical applications. D. You is a membe of IEEE (2009 to ecent), IEEE Micowave Theoy and Techniques Society and IEICE (2011 to ecent). Yi Lung Then (S 13) was bon in Kuching, Malaysia in He eceived the B.Eng degee (Hons.) in electical engineeing fom Univesiti Teknologi Malaysia (UTM), Skudai, Malaysia, in 2012, whee he is cuently pusuing the Ph.D. degee in electical engineeing in UTM. Intenational Scholaly and Scientific Reseach & Innovation 9(3) schola.waset.og/ /
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