Neutron Irradiation Test Results of the RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator

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1 Neutron Irradiation Test Results of the RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator 09 October 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the S-Power Design and Product Engineering Groups from Linear Technology for the data collection pre- and post-irradiations. Special thanks are also for Thomas Regan from University of Massachusetts, Lowell (UMASS) for the help with the neutrons irradiation tests. P a g e 1 41

2 Neutron Radiation Testing of the RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator Part Type Tested: RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator, SPEC NO REV. 0 Traceability Information: Fab Lot# H ; Wafer # 3; Assembly Lot # See photograph of unit under test in Appendix A. Quantity of Units: 7 units received, 2 units for control, and 5 units for unbiased irradiation. Leads of devices, serial numbers 1 to 5, were shorted together using anti-static foam during irradiation. Serial numbers 11 and 12 were used as control. See Appendix B for the radiation bias connection tables. Radiation Dose: Total fluence of 1E12 neutron/cm 2. Radiation Test Standard: MIL-STD-883 TM1017 and Linear Technology RH3080MH SPEC NO REV. C and RH3080MK DICE/DWF Test Hardware and Software: LTX test program EFCR3080R.00. Facility and Radiation Source: University of Massachusetts, Lowell and Reactor Facility-FNI. Irradiation and Test Temperature: Room temperature controlled to 24 C±6 C per MIL-STD- 883 and MIL-STD-750. SUMMARY ALL FIVE PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER IRRADIATION TO 1E12 N/cm 2. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 41

3 1.0 Overview and Background Neutron particles incident on semiconductor materials lose energy along their paths. The energy loss produces electron-hole pairs (ionization) and displaces atoms in the material lattice (displacement damage defects or DDD). DDD induces a mixture of isolated and clustered defects or broken bonds. Such defects elevate the energy level of the material and consequently change material and electrical properties. The altering energy level creates the combination of any of the following processes, thermal generation of electron-hole pairs, recombination, trapping, compensation, tunneling, affecting hence the devices basic features. We run the electrical tests after we had made sure that the parts are not radioactive anymore to be shipped to LTC. Bipolar technology is susceptible to neutron displacement damage around a fluence level of 1E12 neutron/cm 2. The neutron radiation test for the RH3080MK determines the change in device performance as a function of neutrons fluence. 2.0 Radiation Facility: Five samples were irradiated unbiased at the University of Massachusetts, Lowell, using the Reactor Facility-FNI. The neutron flux was determined by system S/P-32, method ASTM E-265, to be 4.05E9 N/cm 2 -s (1MeV equivalent) for each irradiation step. Refer to Appendix C for the certificate of dosimetry. 3.0 Test Conditions Five samples and two control units were electrically tested at 25 C prior to irradiation. The testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 7 units (5 irradiated and 2 control). During irradiation, devices leads were shorted together using anti-static foam and devices then were placed into an antistatic bag. Devices were then vertically aligned with the radiation source. The criteria to pass the neutron displacement damage test is that five irradiated samples must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted in accordance with method 5003, MIL-STD-883, and if valid the lot will be scrapped. P a g e 3 41

4 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - SET Pin Current V IN = 1V, V CONTROL = 2V, I LOAD = 1mA - Output Offset Voltage (V OUT V SET ) V IN = 1V, V CONTROL = 2V, I LOAD = 1mA - Load Regulation, I SET I LOAD = 1mA to 0.9A - Load Regulation, V OS I LOAD = 1mA to 0.9A - Line Regulation, I SET V IN = 1V to 26V, V CONTROL = 2V to 26V, I LOAD = 1mA - Line Regulation, V OS V IN = 1V to 26V, V CONTROL = 2V to 26V, I LOAD = 1mA - Minimum Load Current V IN = 10V, V CONTROL = 10V - Minimum Load Current V IN = 26V, V CONTROL = 26V - V CONTROL Dropout Voltage V IN = 1V, I LOAD = 0.1A - V CONTROL Dropout Voltage V IN = 1V, I LOAD = 0.9A - V IN Dropout Voltage V CONTROL = 2V, I LOAD = 0.1A - V IN Dropout Voltage V CONTROL = 2V, I LOAD = 0.8A - V CONTROL Pin Current V IN = 1V, V CONTROL = 2V, I LOAD = 0.1A - V CONTROL Pin Current V IN = 1V, V CONTROL = 2V, I LOAD = 0.9A - Current Limit V IN = 5V, V CONTROL = 5V, V SET = 0V, V OUT = - 0.1V Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 41

5 5.0 Test Results All five samples passed the post-irradiation electrical tests. All measurements of the fifteen listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated by adding to and subtracting from mean the product of standard deviation and the tolerance limit factor K TL where K TL is tabulated from a table of the inverse normal probability distribution. The upper tolerance limit +K TL and the lower tolerance limit -K TL are +K TL = mean + (K TL ) (standard deviation) -K TL = mean - (K TL ) (standard deviation) However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% K TL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The K TL factor in this report is In the plots, the dashed lines with X-markers are the measured data points of five postirradiated samples. The solid lines with square symbols are the computed KTL values of five post-irradiated samples with the application of the K TL statistics. The orange solid lines with circle markers are the datasheet specification limits. The post-irradiation test limits are using Linear Technology datasheets 10 Krads(Si) specification limits. P a g e 5 41

6 I SET (ua) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased Average Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.1 Plot of SET Pin Current versus Total Fluence All five samples pass the SET Pin Current parameter. Notice the KTL point of pre-irradiation is right at the minimum specification limit due to the small 5-piece sample size. P a g e 6 41

7 Table 5.1: Raw data table for SET Pin Current of pre- and post-irradiation (1E12 N/cm 2 ) I SET Parameter Total Fluence (neutron/cm 2 ) Units (ua) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (-KTL) Un-biased FAIL PASS Status (+KTL) Un-biased PASS PASS P a g e 7 41

8 V OS (mv) DDD RH3080MK H W Specification MAX 6 4 Ps90%/90% (+KTL) Un-biased 2 0 Average Un-biased -2-4 Ps90%/90% (-KTL) Un-biased -6-8 Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.2: Plot of Output Offset Voltage versus Total Fluence All measured data are within the datasheet specification limits. P a g e 8 41

9 Table 5.2: Raw data table for Output Offset Voltage of pre- and post-irradiation (1E12 N/cm 2 ) V OS Parameter Total Fluence (neutron/cm 2 ) Units (mv) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN -5-8 Specification MAX 5 8 Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased PASS PASS P a g e 9 41

10 Load Regulation I SET (na) DDD RH3080MK H W Specification MAX 10 Ps90%/90% (+KTL) Un-biased 5 0 Average Un-biased Ps90%/90% (-KTL) Un-biased -15 Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.3: Plot of Load Regulation I SET versus Total Fluence All measured data points of Load Regulation I SET parameter are within datasheet specification limits. P a g e 10 41

11 Table 5.3: Raw data table for Load Regulation I SET of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Load Regulation I SET Total Fluence (neutron/cm 2 ) Units (na) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased PASS PASS P a g e 11 41

12 Load Regulation V OS (mv) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Unbiased 0.00 Average Un-biased Ps90%/90% (-KTL) Unbiased Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.4: Plot of Load Regulation V OS versus Total Fluence All post-irradiation measured values of Load Regulation V OS are within datasheet specification limits. P a g e 12 41

13 Table 5.4: Raw data table for Load Regulation V OS of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Load Regulation V OS Total Fluence (neutron/cm 2 ) Units (mv) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased PASS PASS P a g e 13 41

14 Line Regulation I SET (na/v) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased Average Un-biased Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Specification MIN Figure 5.5: Plot of Line Regulation versus Total Fluence All measured post-irradiation data points are within datasheet specification limits. P a g e 14 41

15 Table 5.5: Raw data table for Line Regulation I SET of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Line Regulation I SET Total Fluence (neutron/cm 2 ) Units (na/v) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased PASS PASS P a g e 15 41

16 Line Regulation V OS (mv/v) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased 0.00 Average Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.6: Plot of Line Regulation V OS versus Total Fluence All five samples pass the Line Regulation V OS post-irradiation test. P a g e 16 41

17 Table 5.6: Raw data table for Line Regulation V OS of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Line Regulation V OS Total Fluence (neutron/cm 2 ) Units (mv/v) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased PASS PASS P a g e 17 41

18 Min. Current V P =V C =10V (ma) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Unbiased Average Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Ps90%/90% (-KTL) Unbiased Figure 5.7: Plot of Minimum Load with V IN and V CONTROL = 10V versus Total Fluence All measured data points are well under datasheet upper limits. P a g e 18 41

19 Table 5.7: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Miin Current P =V C =10V Total Fluence (neutron/cm 2 ) Units (ma) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 19 41

20 Min Current V P =V C =26V DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Unbiased 0.6 Average Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Ps90%/90% (-KTL) Unbiased Figure 5.8: Plot of Minimum Load Current with V IN = V CONTROL = 26V versus Total Fluence P a g e 20 41

21 Table 5.8: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Min Current C =26V Total Fluence (neutron/cm 2 ) Units (ma) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 21 41

22 V C Dropout I L =0.1A (V) DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased 1.35 Average Un-biased Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.9: Plot of V C Dropout Voltage (@V IN =1V, I LOAD = 0.1A) versus Total Fluence The measured parameters are well under the specification maximum limit. P a g e 22 41

23 Table 5.9: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12 N/cm 2 ) Parameter V C Dropout I L = 0.1A Total Fluence (neutron/cm 2 ) Units (V) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 23 41

24 Specification MAX V C Dropout I L =0.9A (V) Ps90%/90% (+KTL) Unbiased Average Un-biased Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.10: Plot of V C Dropout Voltage (@ V IN = 1V, I LOAD = 0.9A) versus Total Fluence P a g e 24 41

25 Table 5.10: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12 N/cm 2 ) Parameter V C Dropout IL=.9A Total Fluence (neutron/cm 2 ) Units 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 25 41

26 V IN Dropout I L =.1A (V) DDD RH3080MK H W Specification MAX 0.17 Ps90%/90% (+KTL) Un-biased Average Un-biased Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.11: Plot of V IN Dropout Voltage (@ V CONTROL = 2V I LOAD = 0.1A) versus Total Fluence P a g e 26 41

27 Table 5.11: Raw data table for V IN Dropout Voltage of pre- and post-irradiation (1E12 N/cm 2 ) Parameter V IN Dropout IL=.1A Total Fluence (neutron/cm 2 ) Units (V) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 27 41

28 V IN Dropout I L =.8A (V) DDD RH3080MK H W Specification MAX 0.45 Ps90%/90% (+KTL) Un-biased 0.40 Average Un-biased 0.35 Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.12: Plot of V IN Dropout Voltage (@ V CONTROL = 2V I LOAD = 0.8A) versus Total Fluence P a g e 28 41

29 Table 5.12: Raw data table for V IN Dropout Voltage of pre- and post-irradiation (1E12 N/cm 2 ) Parameter V IN Dropout I L =.8A Total Fluence (neutron/cm 2 ) Units (V) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 29 41

30 CONTROL Pin I L = 0.1A DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased Average Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Ps90%/90% (-KTL) Un-biased Figure 5.13: Plot of CONTROL Pin Current (@ I LOAD = 0.1A) versus Total Fluence P a g e 30 41

31 Table 5.13: Raw data table for CONTROL Pin Current of pre- and post-irradiation (1E12 N/cm 2 ) Parameter CONTROL Pin L =.1A Total Fluence (neutron/cm 2 ) Units (ma) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 31 41

32 CONTROL Pin I L =.9A DDD RH3080MK H W Specification MAX Ps90%/90% (+KTL) Un-biased Average Un-biased Ps90%/90% (-KTL) Un-biased E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.14: Plot of CONTROL Pin Current (@ I LOAD = 0.9A) versus Total Fluence P a g e 32 41

33 Table 5.14: Raw data table for V CONTROL Pin Current of pre- and post-irradiation (1E12 N/cm 2 ) Parameter CONTROL Pin L =.9A Total Fluence (neutron/cm 2 ) Units (ma) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Status (Measurements) Specification MAX Status (-KTL) Un-biased Status (+KTL) Un-biased PASS PASS P a g e 33 41

34 Current Limit (A) DDD RH3080MK H W Ps90%/90% (+KTL) Un-biased Average Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN E+11 1E E+12 Total Fluence (neutron/cm 2 ) Figure 5.15: Plot of Current Limit versus Total Fluence P a g e 34 41

35 Table 5.15: Raw data table for Current Limit of pre- and post-irradiation (1E12 N/cm 2 ) Parameter Current Limit Total Fluence (neutron/cm 2 ) Units (A) 0 1.E+12 1 Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Un-biased Irradiation Control Unit Control Unit Un-biased Irradiation Statistics Average Un-biased Std Dev Un-biased Ps90%/90% (+KTL) Un-biased Ps90%/90% (-KTL) Un-biased Specification MIN Specification MAX Status (Measurements) Status (-KTL) Un-biased PASS PASS Status (+KTL) Un-biased P a g e 35 41

36 Appendix A Pictures of one among five samples used in the test. Figure A1: Top View showing date code Figure A2: Bottom View showing serial number P a g e 36 41

37 Appendix B Radiation Bias Connection Table Table B1: Unbias condition Pin Function Connection / Bias 1 NC Float 2 SET Float 3 V CONTROL Float 4 IN Float 5 OUT = CASE Float P a g e 37 41

38 Figure B1: Pin-Out P a g e 38 41

39 Appendix C P a g e 39 41

40 Appendix D Table D1: Electrical Characteristics of Device-Under-Test Pre-Irradiation P a g e 40 41

41 Table D2: Electrical Characteristics of Device-Under-Test Post-Irradiation P a g e 41 41

Neutron Irradiation Test Results of the RH1009MW 2.5V Reference

Neutron Irradiation Test Results of the RH1009MW 2.5V Reference 19 March 2015 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Signal Conditioning Product and Test Engineering