Radiation Experiments and New Materials. T. Paulmier, B. Dirassen, R. Rey

Transcription

1 Radiaio Exerimes ad New Maerials T. Paulmier, B. Dirasse, R. Rey The research leadig o hese resuls fuded i ar by he Euroea Uio Seveh Framework Programme (FP7) uder gra agreeme No 6676 SPACESTORM Close Ou Meeig, Cambridge, UK, 3 March 7

2 Oulie Moivaios Physics of ieral chargig Objecives of he curre rojec Exerimeal faciliies ad measureme se-u Characerisaio of maerials used o ieral ars Characerisaio of comoes i rereseaive elecro evirome Coclusio

3 Moivaios Harsh radiaio evirome i MEO High fluxes a high eergy levels : irradiaio o ier elemes imora effec o ieral chargig wih oeially high chargig kieics Saellie V diff U.V - e Exeral Dielecric e - V diff - Ieral Dielecric Thick dielecric suor Isulaed wires Circui board Wih low coduciviy (low charge decay) Charge accumulaio Effec brough io evidece by o-board exerimes : SCATHA, CRRES, DSP Cosequece : geeraio of high elecric field Iiiaio of disruive ESD high risks o meallic floaig ars Dielecric breakdow Damages o elecroics EMC issues Degradaio of hysical roeries 3

4 Physics seerig ieral chargig Physical mechaims seerig chargig oeial Surface coduciviy I i Ise I i Volume coduciviy Effec o chargig kieics ad decay Bulk coduciviy Surface coduciviy Secodary elecro emissio Polarisaio effec Radiaio iduced coduciviy 4

5 Physics seerig ieral chargig Chargig behaviour of maerials i sace Poeial (V) Time (mi.),e-3 6 Irradiaio Time (mi.) E E E-4 Kao, 7 µm -4-4 kev 4E-4-5 GEO -5-6 E-4-6 s irradiaio -7-7 d irradiaio Irradiaio -9 Irradiaio Time (s) Relaxaio Surface oeial (V) RIC (Ω -.m - ) Effec of radiaio dose Radiaio iduced coduciviy RIC (isaaeous effec) dd σ ric = k d Effec of radiaio dose : σ RIC =f(d) Permae effec : Physical ad chemical ageig 5

6 Objecives Assess imac of exreme sace weaher ad eves o ieral chargig Imrove our kowledge of heomeology ad hysics of ieral chargig a maerial level Chargig kieics ad charge decay assessme Effec of ioisig dose : acs o radiaio iduced coduciviy (RIC) Radiaio hisory ad recovery effec : radiaio affec chargig roeries (delayed RIC) Ageig effec Characerisaio of elecric ad chargig roeries of defied maerials ad sysems Predicio of chargig levels ad kieics ad risk of ESD for secific sace weaher eves ad Deermie siuaio esecially a risk due o maerials or sub-sysems desig (geomery, secific wirig, ) Characerisaio of chargig behaviour i rereseaive irradiaio codiios ad geomeries Defiiio of a es rocedure for ieral chargig evaluaio Tes uder differe irradiaio codiios 6

7 SIRENE faciliy Tes faciliies for maerial characerisaio SIRENE fucios Chargig of sace maerials uder rereseaiive elecro beam secrum i eergy rage [-4 kev] Assessme of irisic ad radiaio iduced coduciviies (bulk ad surface) Ageig hrough elecro radiaio (4 kev) SIRENE Faciliy Characerisics : Two mooeergeic elecro beams: Elecro gu : eergy of 7 o kev, fluxes -5 A/cm Va de Graaff acceleraor: 4 kev, A.cm - 5 A.cm - Isrumeaio : Kelvi robe, PEA i siu, curre Oeraig codiios : Vaccum : -6 orr Temeraure : -5 C/5 C 7

8 Tes faciliies for ieral chargig GEODUR faciliy Equied wih a.5 MeV Va de Graaff accelaraor 35 kev elecro gu So size = 6mm Temeraure rage [-5 C, 5 C] Elecro Flux ragig from. A.cm - o 4 A.cm - Surface oeial (KP mehod verical axis sca) ad elecric curre measuremes Dosimery ad curre measuremes wih Faraday cus Possible rasfer of charged samle uder vacuum o sorage faciliy (SPIDER) Vacuum : -6 hpa 8

9 Characerisaio of elecric ad chargig roeries Phase : Characerisaio of elecric ad chargig roeries of he defied maerials ad sysems Seve esed maerials : Isulaig ad coformal ars : PEEK, PEI, Silicoe varish MAP 3, Solihae (olyurehae based resi) Cable alicaio - isulaig sheah : Kao, ETFE Pai : Polyurehae based ai (PU) Exracio of elecric coduciviies aalysis of mai reds (dose rae effec, elecric field effec, ) Aalysis of cumulaive effec (log erm ioisaio effec ageig) 9

10 Characerisaio of elecric ad chargig roeries Aalysis of coducio rocesses Chargig a kev Irisic relaxaio Irradiaio a 4 kev wih four differe fluxes :.,, ad 5 A/cm σ = ε o ε dv s / V s d dd σ ric = k d - RIC PEI PEEK MAP 3 Kao wire Surface oeial (V) - PEI -3 PEEK MAP 3-4 Polyurehae PU- Simulaed relaxaio Solihae 4 kev, 5 A.cm - Kao wire -5 ETFE wire Time (mi.) Irradiaio a kev Irisic relaxaio Bulk coduciviy PEI, PEEK, Kao, ETFE : ρ > 5 Ω.m k Δ MAP 3 : ρ = Ω.m Solihae : ρ = 8 3 Ω.m

11 Characerisaio of elecric ad chargig roeries Effec of dose Successive irradiaio (low dose) Ageig (doses > 5 Gy 5-6 years close o he surface behid mm shieldig) Surface oeial (V) Surface oeial (V) Prisie PEI Aged PEI Time (mi.) PEI PEEK Prisie PEEK Aged PEEK Time (mi.) Surface oeial (V) Kao Prisie Kao Aged Kao Time (mi.) - Radiaio hisory : delayed effec - Differe behaviours i regard of high dose - Degradaio of coduciviy for PEEK ad PEI - Higher coduciviy for Kao - Daa used for model arameer exracio

12 Characerisaio of elecric ad chargig roeries Numerical simulaio Circui model C R I i C R I i Ii =I Q I SE I surf I R I Q I R =I i.(-η-β) C.dV/dV/R=I i.(-η-β) dv/d=(ji.l.(-η-β)-σ.v)/ε σ=e.( -.µ -.µ ) ) ( ) ( ) ( ) ( = = = = = = d d d d E g d d d d d d E g d d α α α α α α Two ras model Holes BC BV Elecros Shallow e - ra Dee e - ra Dee hole ra Shallow hole ra

13 Characerisaio of elecric ad chargig roeries Numerical simulaio SURF daa.e Ioisig Flux Chargig Flux From // o 3/6/ Shieldig :,5 mm Curre (A.cm-).E.E.E6 4.E6 6.E6 8.E6.E7.E7.4E7.E-.E- Curre (A.cm-).E.E6 4.E6 6.E6 8.E6.E7.E7.4E7...E-3 Time (s). Time (s) Wih ONERA model (RIC = f(d)) Poeial (V).E 3.E6 6.E6 9.E6.E7.5E7.8E Time(s) Polyimide 5 µm Poeial (V) E 3.E6 6.E6 9.E6.E7.5E7.8E7 PEEK 5 µm Time (s) Poeial (V) E 5.E6.E7.5E7.E7 Time (s) ETFE µm 3

14 Characerisaio of elecric ad chargig roeries Numerical simulaio SURF daa.e Ioisig Flux.E.E.E6 4.E6 6.E6 8.E6.E7.E7.4E7.E- Curre (A.cm-) From // o 3/6/ Curre (A.cm-) Chargig Flux.E.E6 4.E6 6.E6 8.E6.E7.E7...E-..E-3 Time (s) Time (s) Comariso bewee ONERA model (RIC = f(d)) ad coveioal model (RIC = cosa).e 3.E6 6.E6 9.E6.E7.5E7.8E7.E.E6 4.E6 6.E6 8.E6.E7.E7.4E Poeial (V) Poeial (V) Polyimide 5 µm - -4 Time(s) Polyimide 5 µm -4 Time (s) 4.4E7

15 Characerisaio of maerials i real rereseaive secrum Phase : Characerisaio of chargig behaviour i rereseaive irradiaio codiios ad geomeries Irradiaio of PCB (olyimide based PCB) uder rereseaive wors case MEO codiios wih ad wihou grouded racks ad deecio of ay elecrosaic discharge Irradiaio of sace used maerials uder rereseaive MEO codiios o sudy chargig kieics. Assessme of elecro secrum behid.5 mm shieldig Iegraed curre (A.cm - ) E- E- E- E-3 E-4 E-5 E-6 E-7 Eergy (MeV) GEODUR GEODUR / 5 wors case MEO Wors case behid.5 mm shieldig E The GEODUR secrum ca be fied o ge close o he MEO wors case secrum behid shieldig - Maerials esed wih secrum behid.5 mm shieldig C. Iguimber, S. Bourdarie, "Eude de l'eviroeme élecroique e orbie MEO e GEO", ONERA Reor RTS /768 DESP - Mars 3

16 Characerisaio of maerials i real rereseaive secrum E- Eergy (MeV) Irradiaio of PCB (olyimide based) Iegraed curre (A.cm - ) E- E- E-3 E-4 E-5 E-6 E-7 GEODUR GEODUR / 5 wors case MEO Wors case behid.5 mm shieldig E-8 Surface oeial (V) Flag PCB o PCB boom Wors case (GEODUR / 5) Wors case (GEODUR / 5) 6 mi. irrad ( h) Wors case (GEODUR /.5) h irrad. ( 4 days) Discharge Irisic relaxaio Time (mi.) Iiiaio of discharge (a 6 V.m - ) far below he dielecric breakdow hreshold (> 8 V.m - ) Process cofirmed hrough differe exerimes 6

17 Surface oeial (V) PEI PEEK Kao ETFE Characerisaio of maerials i real rereseaive secrum Irradiaio GEODUR /5 3 : Sudyig combied effec of charge imlaaio ad RIC Wha is he chargig behaviour whe shifig he overall elecro flux o higher values? Ca we hik abou a rocedure for he reducio of es duraio? Relaxaio Time (mi.) Surface oeial (V) PEI PEEK Kao ETFE Irradiaio GEODUR / 5 Relaxaio Time (mi.) No srog evoluio of chargig level o PEEK RIC icrease by he same facor as chargig curre Higher oeial for higher flux for PEI, Kao wire RIC icrease lower ha chargig curre Seady icrease of chargig kieics for ETFE wires o RIC Differe behaviour for he maerials i regard of secrum variaio 7

18 Characerisaio of maerials i real rereseaive secrum Kowig he elecric roeries of he maerial (RIC), we ca aly a acceleraio facor for ieral chargig assessme No RIC (like ETFE) Wih acceleraio facor, we icrease he chargig kieics ad reach more quickly he hreshold for discharge iiiaio Δ = (like PEEK or Kao HN) Alyig a acceleraio facor does o chage he equilibrium surface oeial bu allows reachig more quickly his equilibrium V L = I σ S. Δ < (like PEI, silico, Wires) dd σ ric = k d Alyig a acceleraio facor chage he equilibrium surface oeial bu exraolaio is feasible kowig he coduciviy arameers 8 V V I L =. = Γ σ S = Γ. V I L. σ S

19 Coclusio Develome of rereseaive elecro secrum Elecric Characerisaio of ew sace used isulaig maerial i rereseaive sace evirome exracio of he key arameers for charge redicio ad risk assessme Advaceme o ieral chargig : Irradiaio uder rereseaive secrum behid shieldig : effec of his secrum o chargig behaviour High chargig risks i MEO evirome Key oi : Radiaio Iduced coduciviy Maerial ageig effec Use of acceleraio facor for assessme wih log duraio Evidece of elecrosaic discharge occurrece o criical elemes : PCB wih floaig ars Defiiio of a es rocedure for ieral chargig evaluaio 9