Thin MLCC (Multi-Layer Ceramic Capacitor) Reliability Evaluation Using an Accelerated Ramp Voltage Test
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1 cceleraed Sress Tesig ad Reliabiliy Thi MLCC (Muli-Layer Ceramic Capacior) Reliabiliy Evaluaio Usig a cceleraed Ramp olage Tes Joh Scarpulla The erospace Corporaio joh.scarpulla@aero.org Jauary-4-7 Sepember , Pesacola each, Florida
2 cceleraed Sress Tesig ad Reliabiliy Thi* Layer MLCCs Ubiquious *~2-4 µm hick vs >20 µm i heriage devices Sadard MLCC DUT (ed-bell ermiaios) 5 μf 22 μf Cosrucio 0. μf Sepember , Pesacola each, Florida
3 cceleraed Sress Tesig ad Reliabiliy Sample MLCC Cross-Secios C Cocers: : Irregular meal layers : Thi polycrysallie ceramic C: oids & defecs?: Oxyge vacacies??: Oher poeial failure mechaisms? Sepember , Pesacola each, Florida 3
4 cceleraed Sress Tesig ad Reliabiliy Thier ad Thier MLCCs Dielecric hickess are seadily decreasig 970: 25 50µm 980: 8 25 µm 990: 0 20 µm µm µm µm Fuure submicro PMEs MEs ME = base meal elecrode PME = precious meal elecrode IDC = ier-digiaed capacior Our echique useful for: MLCCs ed bell capaciors MEs PMEs IDCs Sepember , Pesacola each, Florida 4
5 cceleraed Sress Tesig ad Reliabiliy Need for Improved Tes Mehods Limied failures i radiioal log cosa sress ess yield ambiguous reliabiliy resuls 000 s-hour lifeess ofe give esseially zero failures Our mehod : is faser & provides 00% failures ca predic eeage moraliy (a elevaed failure rae i s 0,000hrs) ca deermie screeig efficacy Sepember , Pesacola each, Florida 5
6 cceleraed Sress Tesig ad Reliabiliy F E E exp kt The effecive hickess cocep: Each defec is assiged a effecive hickess irrespecive of is physical aure or observabiliy Sepember , Pesacola each, Florida 6
7 cceleraed Sress Tesig ad Reliabiliy Recall he P&* model Elecric field Solve for x eff Exracig x eff which saes ha he effecive hickess ca be exraced from he failure ime (a cosa olage) u olage is o cosa i acual usage P& model parameers are ukow F E x eff E x eff E exp kt F E exp kt E coefficies: * T. Procopowicz ad R. askas, Sepember , Pesacola each, Florida 7
8 cceleraed Sress Tesig ad Reliabiliy Ramp olage Techique Geeralize he P& model o o-cosa sress F F E f ( ) d exp d Cumulaive damage fucio xeff kt 0 0 ssume a ramp volage x eff Ramped es produce 00% failures R wih T cosa (We reliabiliy egieers live or die wih failures!) E Exrac x eff from ramped kt breakdow volages R exp F Sepember , Pesacola each, Florida 8
9 Fracio Failed cceleraed Sress Tesig ad Reliabiliy Ramped reakdow Tes Resuls Tes seup Ramped breakdows This array is called ad is referred o as he "log" vecor DUT board i emperaure chamber 0.8 gile Swich/Measure sysem C compuer allas resisor ad swich board Kepco HK MG ramp volage geeraor MLCCs per es cell Failure olage (ols) 32 9 cells = 288 failures Sepember , Pesacola each, Florida 9
10 cceleraed Sress Tesig ad Reliabiliy Key assumpio: Exrac P& coefficies from Ramp daa F95 s are a omial hickess x 0 llows he P& coefficies o be exraced lf 95 l l l R l x0 y m x m2x2 95 h perceiles of F from ramped breakdow es b E kt rasformaio ad muliple liear regressio Sepember , Pesacola each, Florida 0
11 y = l(95) cceleraed Sress Tesig ad Reliabiliy P& regressio resuls F95 9-cell muliple regressio T = 77C regressio coefficies P&model coefficies uis m dimesioless 4.8 m E.54 e b hr(/m) x = l(r) Now he effecive hickesses ca be exraced, bu firs. Sepember , Pesacola each, Florida
12 cceleraed Sress Tesig ad Reliabiliy Seeds model Seeds* model -- yield worses wih defec desiy ad area - basic semicoducor yield model (i approximaes a Poisso disribuio of defecs) P f Y D Solve for cumulaive defec desiy D : D( x eff Expressed as a fucio of he x eff Typical uis are defecs/cm 2 ) P f P f DT TRNSFORMTION F P f x eff Sepember , Pesacola each, Florida 2 D *R. Seeds 967
13 defec desiy, D (cm-2) cceleraed Sress Tesig ad Reliabiliy D vs. xeff curve 90% C.I effecive hickess, xeff (um) MLCC properies quaiy value uis Capaciace C 0. µf Case size Raed volage ra 0 Raed emperaure cive elecrode legh cive elecrode widh T ra 25 C L 0.77 mm W 0.27 mm Number of layers N 73 - Toal acive area 0.52 cm 2 Nomial dielecric hickess x µm Sepember , Pesacola each, Florida 3
14 cceleraed Sress Tesig ad Reliabiliy phase & duraio MLCC irh o Reireme i 4 phases () T (C) effecive hickess x eff (m) defec desiy D u (cm -2 ) Cum. failure prob. (%) Cod. failure prob. (%) DW es sec Par scree 68 hrs oard bur-i 320 hrs Missio 5 yrs Sepember , Pesacola each, Florida 4
15 cceleraed Sress Tesig ad Reliabiliy x eff for he four MLCC Life Phases Sepember , Pesacola each, Florida 5 exp kt E x eff eff kt E kt E x exp exp eff kt E kt E kt E kt E x exp exp exp exp eff kt E kt E kt E x exp exp exp DW is par of maufacurig screeig missio
16 defec desiy, D (cm-2) cceleraed Sress Tesig ad Reliabiliy mi day sec hr wk mo yr Ucodiioal D vs. x eff curve yrs Usage imes a raed codiios (25C, 0) map o ever icreasig x eff Curve is ucodiioed for he DW scree es (0.2%) From his curve ay desired reliabiliy predicios ca be made DW scree effecive hickess, xeff (um) Sepember , Pesacola each, Florida 6
17 average failure rae (FITs) effecive hickess x eff (m) cceleraed Sress Tesig ad Reliabiliy Example Reliabiliy Predicio Failure rae 00 Effecive hickesses mapped yrs = 8 T = 85C missio ime (years) Sadard bur-i missio ime (years) Sepember , Pesacola each, Florida 7
18 average failure rae (FITs) effecive hickess x eff (m) cceleraed Sress Tesig ad Reliabiliy Example Reliabiliy Predicio (Flucuaig Temperaure) Failure rae 00 Effecive hickesses mapped.6 0 Temperaure = 8 T flucuaes yearly bewee 85C & 50C missio ime (years) Sadard bur-i missio ime (years) Sepember , Pesacola each, Florida 8
19 average failure rae (FITs) effecive hickess x eff (m) cceleraed Sress Tesig ad Reliabiliy Example Reliabiliy Predicio wih reduced bur-i Failure rae 000 Effecive hickesses mapped eeage moraliy = 8 T = 85C missio ime (years) x eff smaller i firs year Higher failure rae missio ime (years) Wih bur-i reduced 0X i duraio ad 25C i emperaure Sepember , Pesacola each, Florida 9
20 defec desiy, D (cm -2 ) cceleraed Sress Tesig ad Reliabiliy Compare o he Tradiioal Cosa Failure Rae ssume a expoeial disribuio wih = 7 FITs Use same P& coefficies (o available radiioally) RESULT: E-08 E-09 ramp mehod radiioal mehod icoceivably low defec desiies effecive hickess, x eff (m) Shows ha coveioal mehod is overly opimisic Cao predic eeage moraliy despie acual P& coefficies Sepember , Pesacola each, Florida 20
21 cceleraed Sress Tesig ad Reliabiliy Coclusios ew mehod of MLCC esig has bee proposed Effecive hickess cocep Ramp volage es echique is fas (2 wks for his example) Seeds defec model (from he semicoducor idusry) llows more realisic compuaios of failure rae uder realisic variable usage codiios Permis esseially 00% failures (We live or die o failures) Exracs P& model coefficies Evaluaes screeig sraagems Sepember , Pesacola each, Florida 2
22 cceleraed Sress Tesig ad Reliabiliy The rademarks, service marks ad rade ames coaied herei are he propery of heir respecive owers. Sepember , Pesacola each, Florida 22
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