Measurements of CsI(Tl) Crystals with PMT and APD. ipno.in2p3.fr Jean Peyré Milano - October 2006
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1 Measurements of I(Tl) Crystals with PMT and APD Jean Peyré Milano - Oct 2006 IPNO-RDD-Jean Peyré 1
2 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co 3.Conclusions IPNO-RDD-Jean Peyré 2
3 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co 3.Conclusions IPNO-RDD-Jean Peyré 3
4 What we have got 4 I(Tl) crystals from Saint-Gobain PM tubes from Photonis (XP1912 and XP5300B) APD from Panda APD S (Hamamatsu) PMT I(Tl) Crystals APD S IPNO-RDD-Jean Peyré 4
5 I(Tl) Crystals 4 Sizes: 22x22x22 mm 3, 22x22x220 mm 3, 44x22x200 mm 3, 66x22x200 mm 3, wrapped with Teflon polished only on exit face, rough on others. 44x22x200mm 3 22x22x220mm 3 66x22x200mm 3 I(Tl) Crystals 22x22x22mm 3 IPNO-RDD-Jean Peyré 5
6 Typical emission spectra of I(Tl) Light yield ( photons / MeV) Max emission = 550nm IPNO-RDD-Jean Peyré 6
7 Decrease time of I(Tl) Decrease time of 3,5 μs for 662 kev-γray IPNO-RDD-Jean Peyré 7
![Non-linearity of I(Tl) Ref: [1] P. Dorenbos, J. T. M. de Haas, C.](/docs-images/82/86383835/images/8-2.jpg "W. E. van Eijk, Non-proportionality in the Scintillation Response")
8 Non-linearity of I(Tl) Ref: [1] P. Dorenbos, J. T. M. de Haas, C. W. E. van Eijk, Non-proportionality in the Scintillation Response and Energy Resolution Obtainable with Scintillation Crystals, IEEE Trans. Nucl. Sci., vol. 42, pp , 1995 IPNO-RDD-Jean Peyré 8
9 Photonis PMT PMT: XP1912 Ø 19 mm (Active area 176mm 2 ), bialkaly XP5300B Ø 76 mm, green extended bialkaly Quantum efficiency» XP % at 420nm, 14% at 550nm» XP5300B 34% at 420nm, 24% at 550nm XP1912 XP5300B IPNO-RDD-Jean Peyré 9
10 Typical Spectral Characteristics of PMT PMT: XP5300B I(Tl) ~x2 Arbitrary vertical value for I(Tl) XP1912 IPNO-RDD-Jean Peyré 10
11 Typical Spectral Characteristics of Hamamatsu Panda APD APD: APD from Panda APD S (Hamamatsu) Active area 100mm 2 Quantum efficiency 70% at 420nm, 85% at 550nm APD S I(Tl) Arbitrary vertical value for I(Tl) IPNO-RDD-Jean Peyré 11
12 Other Characteristics of Hamamatsu Panda APD APD: Typical output capacitor ~270pF T =20 C M=50 at 380V M=74 at 400V APD S IPNO-RDD-Jean Peyré 12
13 Energy Resolution you can obtain with I(Tl) R = R + R With PMT: S M R: global resolution R S : scintillator resolution (~4%)* R M : Photomultiplier resolution** 1 + v(m) R M = 2.35 N *Ref: [1], [3], [4], [5], **Ref: [1], [2], [3] v(m): variance of the PMT gain (~0,1) N: Number of photoelectrons N phé RM pmt RS scint R 900 8,62% 4,00% 9,50% 950 8,39% 4,00% 9,29% ,17% 4,00% 9,10% ,78% 4,72% 4,09% 3,66% 3,34% 4,00% 4,00% 4,00% 4,00% 4,00% 7,03% 6,19% 5,72% 5,42% 5,21% IPNO-RDD-Jean Peyré 13
14 With APD: R: global resolution* Energy Resolution you can obtain with I(Tl) ( N/N ) ( /N ) R = R 2 S + e-h + noise e-h N/N e-h : statistical fluctuation of the APD gain noise /N e-h : Noise contribution (dark noise) *Ref: [4] N/N = 2.35 e-h F/N e-h F: excess noise factor N e-h : Number of primary electron-hole pairs n oise/ne-h = 2.35 σnoise/ne-h IPNO-RDD-Jean Peyré 14
15 Energy Resolution you can obtain with I(Tl) With APD: For F=2 and noise 40 e-rms (shaping time 3μS): N (é-h) Fluc Gain Noise RS scint R ,51% 9,40% 4,00% 14,66% ,43% 4,70% 4,00% 9,66% ,07% 3,13% 4,00% 7,91% ,25% 4,29% 3,72% 3,32% 3,03% 2,35% 1,57% 1,18% 0,94% 0,78% 4,00% 4,00% 4,00% 4,00% 4,00% 7,01% 6,07% 5,58% 5,28% 5,08% IPNO-RDD-Jean Peyré 15
16 References 1. [1] P. Dorenbos, J. T. M. de Haas, C. W. E. van Eijk, Nonproportionality in the Scintillation Response and Energy Resolution Obtainable with Scintillation Crystals, IEEE Trans. Nucl. Sci., vol. 42, pp , [2] M. Moszynski, Inorganic scintillation detectors in Gamma-ray spectrometry, Nuclear Instruments and Methods in Physics Research A 505 (2003) , [3] M. Moszynski, M. Kapusta, D. Wolski, M. Szawlowski, W. Klamra, Energy Resolution of Scintillation Detectors with LAAP and PMT, IEEE Trans. Nucl. Sci., vol. 45, pp , [4] P. Schotanus, R. Kamermans, P. Dorenbos, Scintillation characteristics of pure and Tl-doped Crystals, IEEE Trans. Nucl. Sci., vol. 37, pp , [5] M. Moszynski, M. Szawlowski, M. Kapusta,M. Balcerzyk, Avalanche photodiodes in scintillation detection, Nuclear Instruments and Methods in Physics Research A 497 (2003) , 2002 IPNO-RDD-Jean Peyré 16
17 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co Characterisation of I(Tl) 3.Conclusions IPNO-RDD-Jean Peyré 17
18 Experimental setup Source Wooden black box Lead collimator Photomultiplier XP5300B Crystal Translation of source Lead collimator Source IPNO-RDD-Jean Peyré 18
19 Experimental setup Photomultiplier XP5300B Crystal wrapped with Teflon IPNO-RDD-Jean Peyré 19
20 Experimental setup PMT XP5300B has 8 stages. Charge preamplifier connected to 5 th stage Cf= 24 pf, Shaping time 3 μs XP5300B Cf Light emission Charge preamplifier + Shaper + ADC + Data Acquisition on PC γ rays IPNO-RDD-Jean Peyré 20
21 peak at 662 kev 0,662 MeV peak Compton Edge IPNO-RDD-Jean Peyré 21
22 Results I(Tl)+Teflon+XP5300B+ Collected Light (phe-) by XP5300B ,55% Xtal 22x22x22 teflon Xtal 22x22x220 teflon Xtal 44x22x200 teflon Energy Resolution FWHM 8,18% TEFLON Collected light for peak VS position of impact 6,52% 6,68% Xtal 66x22x200 teflon Position (mm) of Gamma source along the Xtal RS=5,5%±0,2 except for crystal 22x22x220: RS~7% Global Resolution is quite constant along the Crystal Variation from 14% to 38% of collected light along the Crystal IPNO-RDD-Jean Peyré 22
23 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co Characterisation of I(Tl) 3.Conclusions IPNO-RDD-Jean Peyré 23
24 Experimental setup Crystal wrapped with VM2000 IPNO-RDD-Jean Peyré 24
25 Results I(Tl)+VM2000+XP5300B+ Collected Light (photoelectrons) by XP5300B ,74% Xtal 22x22x22 VM2000 Xtal 22x22x220 VM2000 Xtal 44x22x200 VM2000 Xtal 66x22x200 VM2000 Energy Resolution FWHM 6,70% VM RS=4,7%±0,1 for cube and 44x22x200, RS=5,6%±0,1for 22x22x220 & 66x22x200 Global Resolution is quite constant along the Crystal Variation from 7% to 20% of collected light along the Crystal IPNO-RDD-Jean Peyré 25 Collected light for peak VS position of impact 5,86% Position (mm) of Gamma source along the Xtal 6,57%
26 Results I(Tl)+XP5300B+ Collected Light (photoelectrons) by XP5300B ,74% 6,55% Xtal 22x22x22 teflon Xtal 22x22x220 teflon Xtal 44x22x200 teflon Xtal 66x22x200 teflon Xtal 22x22x22 VM2000 Xtal 22x22x220 VM2000 Xtal 44x22x200 VM2000 Xtal 66x22x200 VM2000 6,70% 8,18% VM2000 up TEFLON down 6,52% Position (mm) of Gamma source along the Xtal VM2000 chosen for all next tests Problem with 22x22x22O I(Tl) crystal Collected light for peak VS position of impact 5,86% 6,57% 6,68% IPNO-RDD-Jean Peyré 26
27 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co Tests with small light detectors 3.Conclusions IPNO-RDD-Jean Peyré 27
28 Experimental setup Output face closed and adapted to XP1912 Crystal wrapped with VM2000 IPNO-RDD-Jean Peyré 28
29 Results I(Tl)+VM2000+XP1912+ Collected Light (photoelectrons) ,05% Energy Resolution FWHM 9,40% VM ,33% Collected light for peak VS position of impact XP ,28% Position (mm) of Gamma source along the Xtal RS=5%±0,1 for cube Variation from 7% to 14% of collected light along the Crystal Resolution is quite constant along the Crystal Xtal 22x22x22 closed XP1912 Xtal 22x22x220 closed XP1912 Xtal 44x22x200 closed XP1912 Xtal 66x22x200 closed XP1912 IPNO-RDD-Jean Peyré 29
30 Results I(Tl)+VM2000+XP1912+ Collected Light (photoelectrons) ,05% 8,64% XP1912 9,40% Closed output face is necessary VM ,33% 12,28% Collected light for peak VS position of impact 12,28% 15,11% Position (mm) of Gamma source along the Xtal Xtal 22x22x22 XP1912 Xtal 22x22x220 XP1912 Xtal 44x22x200 XP1912 Xtal 66x22x200 XP1912 Xtal 22x22x22 closed XP1912 Xtal 22x22x220 closed XP1912 Xtal 44x22x200 closed XP1912 Xtal 66x22x200 closed XP1912 CLOSED NOT CLOSED IPNO-RDD-Jean Peyré 30
31 Results for PMT/VM XP5300B VM2000 Collected Light (photoelectrons) ,74% XP1912 8,05% 6,70% 5,86% Collected light for peak VS position of impact 9,40% 10,33% 12,28% Position (mm) of Gamma source along the Xtal 6,57% Xtal 22x22x22 XP5300 Xtal 22x22x220 XP5300 Xtal 44x22x200 XP5300 Xtal 66x22x200 XP5300 Xtal 22x22x22 closed XP1912 Xtal 22x22x220 closed XP1912 Xtal 44x22x200 closed XP1912 Xtal 66x22x200 closed XP1912 IPNO-RDD-Jean Peyré 31
32 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + APD S Co+ 60 Co f) I(Tl) + XP Co+ 60 Co Tests with small light detectors 3.Conclusions IPNO-RDD-Jean Peyré 32
33 Experimental setup APD used at Gain 50 and 380V. Cf= 0,5 pf, Shaping time 3 μs Cf Light emission Charge preamplifier + Shaper + ADC + Data Acquisition on PC γ rays IPNO-RDD-Jean Peyré 33
34 Results I(Tl)+VM2000+APD+ Collected Light (electron-holes) ,23% Xtal 22x22x22 APD 9,39% Energy Resolution FWHM VM2000 Collected light for peak VS position of impact Xtal 22x22x220 APD 0 0,00 20,00 40,00 60,00 80,00 100,00 120,00 140,00 160,00 180,00 200,00 Position (mm) of Gamma source along the Xtal RS=4,5%±0,1 Global Resolution is quite constant along the Crystal except close to the APD IPNO-RDD-Jean Peyré 34
35 Results I(Tl)+VM2000+APD+ 25% Energy Resolution (FWHM) 20% 15 % 10 % 5% 0% Position (mm) of Gamma source γ-rays interact with APD close to APD IPNO-RDD-Jean Peyré 35
36 Energy Resolutions I(Tl)+VM2000+APD/PMT+ 22x22x22 22x22x220 44x22x200 66x22x200 XP5300B 5,74% 6,70% 5,86% 6,57% XP1912 APD S ,23% 9,39% 8,05% 9,40% 10,33% 12,28% IPNO-RDD-Jean Peyré 36
37 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + XP Co+ 60 Co f) I(Tl) + APD S Co+ 60 Co Tests with small light detectors 3.Conclusions IPNO-RDD-Jean Peyré 37
38 60 Co peaks 60 Co peaks 1.17 MeV 1.33 MeV IPNO-RDD-Jean Peyré 38
39 56 Co peaks 0,85 MeV 1.24 MeV 56 Co peaks 2,59 MeV 3,25 MeV IPNO-RDD-Jean Peyré 39
40 Energy Resolutions I(Tl)+VM2000+XP Co+ 56 Co Collected light for, 60 Co, 56 Co peaks VS position of impact 56Co 3,25MeV (5,35%) 4,90% calculated measured Collected Light (photoelectrons) Co 1,33MeV 6,45% (6,71%) Energy Resolution FWHM ,66MeV 9,40% (9,29%) Position (mm) of Gamma source along the Xtal Rscint =4% IPNO-RDD-Jean Peyré 40
41 Energy Resolutions I(Tl)+VM2000+APD Co+ 56 Co Collected Light (electron-holes) Collected light for, 60 Co, 56 Co peaks VS position of impact (9,00%) (6,82%) 9,39% (5,13%) 5,84% 4,64% 60Co 1,3 3 M e V 13 7 C s 0,66M ev 56Co 3,25M ev Position (mm) of Gamma source along the Xtal Rscint =4% IPNO-RDD-Jean Peyré 41
42 1.Characteristics of I(Tl), PMT and APD 2.Measurements on I(Tl) a) I(Tl) /Teflon + XP5300B b) I(Tl) /VM XP5300B c) I(Tl) + XP1912 d) I(Tl) + APD S e) I(Tl) + XP Co+ 60 Co f) I(Tl) + APD S Co+ 60 Co 3.Conclusions IPNO-RDD-Jean Peyré 42
43 Use of XP1452 foreseen XP mm (Active area 4x272mm2), green extended bialkaly Quantum efficiency 30% at 420nm, 20% at 550nm Size from 35mm to 50mm Next tests with XP1452 XP1452 IPNO-RDD-Jean Peyré 43
44 Conclusions Xtal Calculated Resolutions Photo detector Area photok Area photok /Area Xtal Quantum Efficiency Global Mev Cost XP5300B >484 mm 2 100% 24% 24% 5.54% 4.83% 4.36% Test only XP mm 2 36% 14% 5% 9.25% 7.11% 5.49% 120 XP x mm 2 56% 20% 11% 6.89% 5.62% 4.73% 350/2 XP x44 APD 380 mm mm 2 79% 21% 20% 85% 16% 17% 6.21% 9.00% 5.21% 6.64% 4.54% 5.15% 350/2 150 IPNO-RDD-Jean Peyré 44
45 Conclusions 1. Collected light through long crystals is not constant. Tests with non collimated source give resolutions greater that 15%. 2. The choice of VM2000 seems obvious 3. With XP1912, it seems difficult to have a resolution better than 9%-10% at 662keV on long crystals because: a. Area covered by PMT is only 36% with 22x22 output face b. Intrinsic resolution of crystal is quite high (~4/5%) c. Photocathode is not green extended bialkaly 4. Resolution obtained with PMT XP1912 and APD are quite comparable until 3.25MeV 5. No work has been done on surface quality (polished/rough) 6. Use of XP1452 seems promising 7. Tests on LaCl 3 crystal IPNO-RDD-Jean Peyré 45
46 Many Thanks to all participants IPNO-RDD-Jean Peyré 46
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