ANALYSIS OF THE CHARGE TRANSFER IN CCDS INCLUDING THE EFFECT OF SURFACE STATES AND A VARYING FRINGING FIELD
|
|
- Alban Lyons
- 5 years ago
- Views:
Transcription
1 Active and Passive Elec. Comp., 1995, Vol. 18, pp Reprints available directly from the publisher Photocopying permitted by license only (C) 1995 OPA (Overseas Publishers Association Amsterdam B.V. Published under license by Gordon and Breach Science Publishers SA Printed in Malaysia ANALYSIS OF THE CHARGE TRANSFER IN CCDS INCLUDING THE EFFECT OF SURFACE STATES AND A VARYING FRINGING FIELD UMESH KUMAR Senior Member, IEEE: Fellow, IETE. Department ofelectrical Engg., lit New Delhi Pin-llO016 India. P. BHUSHAN MITAL Fellow, IETE. Department ofelectronics & Communication Engg. C.IZ State College ofengineering, Murthal (Sonepat) India Pin In this paper, a general charge transfer equation is derived that includes the effect of the surface states and does not assume a constant fringing field. Further, a detailed and simple method is presented for the solution of this general charge transfer equation. 1. INTRODUCTION The free charge transfer phenomenon in CCDs has been dealt with in the past by many authors [1, 2, 3, 4]. Most of the authors have, until now, considered a constant fringing field for their analysis. The solution of the charge transfer equation has been obtained [3, 4] in the past with the aid of a computer and includes the drift due to the self-induced field and thermal diffusion. The charge transfer phenomenon described in [1, 2, 3, 4] has been concerned with the free electrons in the conduction band only. Nothing has been said about transitions of electrons between the conduction band and surface states. We present a general charge transfer mechanism here that includes the effect of surface states and assumes a varying fringing field. 2. SURFACE STATES AND ITS EFFECT ON CHARGE TRANSFER EQUATION Let us consider a 3-phase CCD as shown in Fig. 1. In an operating surface channel charge coupled device with no generation current and in the absence of signal charge injection over a long period, the interface states become deeply depleted. If a charge packet is transferred along the device, some fraction of the charge will be trapped in the interface states under each gate. If the remission time constant is short compared to the time allowed for the transfer, or longer, some carriers will, Assistant Professor, Department of Electrical Engineering, I.I.T., Hauz Khas, New Delhi , India Phone: +(91) (11) (Residence) +(91) (11) /Extn (Office) FAX: +(91) (11) (Office) 111
2 112 U. KUMAR AND P.B. MITAL Transfer Electrode V/llilllil. V /i///i/llllllz2//llllll/y llllli/3g/////llll/) Is (." ", Discharging." l.; \ w... " boundary "-... FIGURE 1 in part, join the main packet, while others will bc re-emitted only much later and, thus, will form a residual in the following packets. But even if the charge trapped in interface states is re-emitted into the main packet, this is a much slower process than the free charge transfer. Thus, after sometime from the beginning of the cycle, transfer of the charge becomes limited by the rate of emission from the interface states. Consider a p channel device shown in Fig. 1. The equation describing the occupation of the interface states at the Energy level E above the valence band is given by dtl dt n ss N,, p and K K 2 r h vth N d Kz(N, n,,)p K_n,,p(-E/KT) (1) Density of filled states Interface state density density/unit area of mobile holes. o- h vth/d O hv,hn Trap cross section of holes Average thermal velocity of mobile carriers. Density of states in the valence bands Average thickness of inversion layer.
3 CHARGE TRANSFER IN CCDS 113 Thus, we can say that the first term in eq. (1) describes the rate of capture of mobile carriers and the second term describes the rate of emission of the trapped carriers. The total rate of emission from the interface states is then given by a(x t) Eg Ptr Energy gap OPt" fes de (2) rss Ot Ot 0 Total number of trapped carriers. Thus, the mobile carrier continuity equation must be modified to include this emission rate. ap Here l(ej) q(ox) + a(x, t) (3) Thus, Cox +n x (3a) C o, + D -x IE l p + a ( x t) (4) Equation (4) is the general equation that relates time and space dependence of the carrier concentration. The boundary conditions and initial values are: J(O,t) 0 p(l,t) =0 and p(x,o) Po for0 <x < L Before going on to the solution of this equation, let us first consider the procedure used to determine p(x, t). We assume, according to the charge control model, an expression of the form p(x, t) 41(x)exp(-t/rl, ) b(x) some function describing the x dependence of p(x, t) for all t. decay time constant.
4 114 U. KUMAR AND P.B. MITAL Now, substituting equation (5) into equation (1)we get a solution for n ss- Kllp(x, t) > 1, then ns(x,t,e) Ns[1 K 2 exp( E/KT) ] Kp(x,t) Thus, the interface states have a small effective time constant and can equilibrate very rapidly with the mobile carriers. Assuming a constant interface state density N and a constant cross section area trb and if < < r 2 r,p(x,t) 2 then the total density of trapped carriers reduces to If (6) Pt,(x,o N Es KT In KlP-(; t) and using eqn. (2) NsKT (7) (8) Now, if the mobile carrier density falls to a level such that Kl fp(x t) < 1, the mobile charge is no longer in equilibrium with the trapped charge, which means that the tilting time constant of the interface states becomes greater than the time constant governing the variation of mobile carrier density and hence the trap occupation fails to follow the variation of the free charge. In this case, if t>t1+ K,p(x,t) (9) t is the time, emission of carriers becomes dominant and refilling of the traps becomes negligible given by the equation Klrp (x, t) 1 (10) then ptr(x, t) N,[Eg KT In K2(t tl) and the emission rate is p(x tl) (t-tl)k1 (11) t(x,t) NssKT (t- tl) (t- tl) 2 (12)
5 CHARGE TRANSFER IN CCDS 115 Note that inequality (9), which reads t > t +, means that a cannot be > -re. But more than that, after t > tl, t has no physical reason to increase. It follows that solution (12) is valid only after t has reached its maximum value, which happens at t t + 2. Thus, for t < t < t + 2y the solution will be a.(x,t) / 1- (13) 3. SOLUTION OF THE CHARGE TRANSFER EQUATION The charge transfer equation given by eq. (8) by O --f 0"- Co, + D -x -/xe/p + a ( x t ) (14) can be written as Op OH t- c(x, t) (15) Ot Ox H= --Jq l(qtxp)op +D Co -x -IzE/p (16) and thus the boundary condition becomes -- H(0, t) =0 (t>0) Considering the Linearized Crank Nicholson scheme, if the derivative of H at a net point j(j 1,2, 3... N- 1) is expanded, equation (15) can be expressed as given below. Also, by replacing the value of a(x, t) as given by eq. (8) Pj, k+ Pj, k 1 (Hj+l/2 k+l/2 t Ij-1/2 k+l/2 ) (17) 7" with 1([ Hj + I/2,k + 1/2 ( +,/2. +D)(-x0P) jd: 1/2, k+ "" -]- ( /J Pj+ 1/2,k+1 -[- D) -x j+l/2,k ]Eftj.I.I/2>Pj=I= 1/2,k+1 (18)
6 116 U. KUMAR AND P.B. MITAL fl q Cox "X j + /2 m j-1/2,m Pj + /2 Pj, h Pj, m --Py-l,m h Pj + l,m -F" Pj, m 2 1 N-1 ) m=k and m=k+l (19) After some algebraic manipulations, equation (17) becomes ajpj+l,k+ "]- Bjpj, k+ -]" Cjpj_l,k+ R J= 2,3,4...N B/xr Dr /zr Ay 2h P+ 2 k 2h + --Ef 2 /+ /2 By= 1 + 2hEPY, + + fll.r Dr Iz r Cj 2h 2 Pj-I,, 2h 2 4h and -[E//, -Eft_/,] DT R p/,, + "(Pj+l,k 2Pbk + Pj-l,k) (20) (21) Id,T 4h [E[<j+,/2,(p/, + Pj+l,k) NkT Efti_w2)(Pj, k -F- Pj-l,k)]
7 CHARGE TRANSFER IN CCDS 117 For j 1, using 1 Pl,k+l Pl,k -H1/2,k+1 (22) with equation (18) and (19), we get alp2,k+ -I- BlPl,k+ R (23) nl and DT Pl,k q- -h- ( p2, g 2P,k + P0,,) 4h E1"o/2 [P2 k + Pl,k]." EI.,/2. 0 (24) and for j N P,V,k+I 0 (25) Now, equations (20, (23) and (25) become a system of N-linear algebraic equations with a tridiagonal coefficient matrix. This can now be solved by any of several methods such as Gauss-elimination, etc. Note that here two time levels have been considered, namely (K + 1)r and Kr. Time derivative is taken as the backward difference at point (j, k + 1) and the space derivatives are expressed by the values at (K + Since it is obvious that all the unknowns are in (KH), the second subscripts can be omitted for simplicity. Let pi G.ipi+, + F. forj 1,2,3...N- 1 (26) then p_, G_,p + F._, forj 2,3,4...N (27)
8 118 U. KUMAR AND P.B. MITAL Substituting (27) into (20) and rearranging terms we get Comparing (28) with (26) we have aj Bj + CjGj_ n; + CjFj_ Also comparing (23)with (26). p+ + forj 2,3,4...N- 1 (28) forj 2,3,4...N- 1 -do- (29) G1 -A1/B1 and f R1/B1 (30) Since PN is given by eq. 25, back substitution of j N- 1, N , 1 in (26) with all the G s and F s, all the p can be determined. 3. CONCLUSIONS This paper presents the charge transfer phenomenon in CCDs taking into consideration two factors-varying fringing field and surface states. A general equation has been formulated including these effects, and a method has been suggested for the solution of this general equation. 1. s.m. Sze, Physics of Semiconductor Devices, second edition, John Wiley and sons, New York Charge Transfer Devices: Sequin & Tompsel, Academic Press, Inc.. 3. C.K. Kim and M. Lenzlinger, "Charge Transfer in CCD," Applied Physics, Vol. 42, p. 3586, Aug R.J. Strain and N. L. Sehryer, "A Non-linear Diffusion Analysis of Charge transfer," Bell System Technical Journal, Vol. 50, p. 1721, July-1971.
9 Rotating Machinery Engineering The Scientific World Journal Distributed Sensor Networks Sensors Control Science and Engineering Advances in Civil Engineering Submit your manuscripts at Electrical and Computer Engineering Robotics VLSI Design Advances in OptoElectronics Navigation and Observation Chemical Engineering Active and Passive Electronic Components Antennas and Propagation Aerospace Engineering Volume 2010 Modelling & Simulation in Engineering Shock and Vibration Advances in Acoustics and Vibration
Comparison of Non-Parabolic Hydrodynamic Models
VLSI DESIGN 1998, Vol. 6, Nos. (1--4), pp. 177-180 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationWell pin Solar Cells: Dark Behavior
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 419-422 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationMETAMAGNETIC MATERIALS WITH VOLUME-DEPENDENT
Active and Passive Elec. Comp., 2001, Vol. 24, pp. 63-67 Reprints available directly from the publisher Photocopying permitted by license only (C) 2001 OPA (Overseas Publishers Association) N.V. Published
More informationof the Resonant Tunneling Diode
VLSI DESIGN 1998, Vol. 8, Nos. (1--4), pp. 143-146 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationA -SiC MOSFET Monte Carlo Simulator Including
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 257-260 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationThe Quantum Hydrodynamic Smooth Effective Potential
VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 17-2 Repnnts available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by license
More informationA Compound Semiconductor Process Simulator and its
VLSI DESIGN 1998, Vol. 6, Nos. (1--4), pp. 393-397 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationSingle-Electron Parametron
VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 43-46 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by license
More informationCMOS. Technology Doping Profiles. Simulation of 0.35 Ixm/0.25 INTRODUCTION
VLSI DESIGN 2001, Vol. 13, Nos. 4, pp. 459-- 463 Reprints available directly from the publisher Photocopying permitted by license only (C) 2001 OPA (Overseas Publishers Association) N.V. Published by license
More informationSecond Order Newton Iteration Method
VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 141--145 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationQUANTIZATION OF THE ELECTRIC
Active and Passive Elec. Comp., 2001, Vol. 24, pp. 165--168 () 2001 OPA (Overseas Publishers Association) N.V. Reprints available directly from the publisher Published by license under Photocopying permitted
More informationQuantum Kinetic Transport under High Electric Fields
VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 3-7 Reprints available directly from the publisher Photocopying permitted by license only 1998 OPA (Ov+rseas Publishers Association) N.V. Published by license
More informationn N D n p = n i p N A
Summary of electron and hole concentration in semiconductors Intrinsic semiconductor: E G n kt i = pi = N e 2 0 Donor-doped semiconductor: n N D where N D is the concentration of donor impurity Acceptor-doped
More informationShell-Filling Effects in Circular Quantum Dots
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 443-447 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationMacroscopic Device Simulation of InGaAs/InP Based Avalanche Photodiodes
VLSI DESIGN 1998, Vol. 6, Nos. (1--4), 10p. 79-82 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationLOW FREQUENCY NOISE OF TANTALUM CAPACITORS*
Active and Passive Elec. Comp., 2002, Vol. 25, pp. 161 167 LOW FREQUENCY NOISE OF TANTALUM CAPACITORS* J. SIKULA a,{, J. HLAVKA a, J. PAVELKA a, V. SEDLAKOVA a, L. GRMELA a, M. TACANO b and S. HASHIGUCHI
More informationNew Approach to Hot Electron Effects in Si-MOSFETs
VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 307-311 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationOPTICAL RESPONSE STUDY OF THE Al=a-SiC:H SCHOTTKY DIODE FOR DIFFERENT SUBSTRATE TEMPERATURES OF THE r.f. SPUTTERED a-sic:h THIN FILM
Active and Passive Elec. Comp., 2003, Vol. 26(2), pp. 63 70 OPTICAL RESPONSE STUDY OF THE Al=a-SiC:H SCHOTTKY DIODE FOR DIFFERENT SUBSTRATE TEMPERATURES OF THE r.f. SPUTTERED a-sic:h THIN FILM L. MAGAFAS
More informationLecture 15: Optoelectronic devices: Introduction
Lecture 15: Optoelectronic devices: Introduction Contents 1 Optical absorption 1 1.1 Absorption coefficient....................... 2 2 Optical recombination 5 3 Recombination and carrier lifetime 6 3.1
More informationScattered Packet Method for the Simulation of the Spatio-temporal Evolution of Local Perturbations
VLSI DESIGN 2001, Vol. 13, Nos. 1-4, pp. 205-209 Reprints available directly from the publisher Photocopying permitted by license only (C) 2001 OPA (Overseas Publishers Association) N.V. Published by license
More informationThermionic emission vs. drift-diffusion vs. p-n junction
6.772/SMA5111 - Compound Semiconductors Lecture 4 - Carrier flow in heterojunctions - Outline A look at current models for m-s junctions (old business) Thermionic emission vs. drift-diffusion vs. p-n junction
More informationON DYNAMIC NEGATRONS ACTIVE COMPONENTS BASED. HELEN LINNIK and PAVLO MULYAR
Active and Passtve Elec. Comp., 2000, Vol. 23, pp. 25-36 Rprints available directly from the publisher Photocopying permitted by license only (C) 2000 OPA (Overseas Publishers Association) N.V. Published
More informationResearch Article Optimum Barrier Height for SiC Schottky Barrier Diode
ISRN Electronics Volume 2013, Article ID 528094, 5 pages http://dx.doi.org/10.1155/2013/528094 Research Article Optimum Barrier Height for SiC Schottky Barrier Diode Alaa El-Din Sayed Hafez and Mohamed
More informationTEMPERATURE DEPENDENCE OF THE HALL COEFFICIENT OF THIN FILMS
Electrocomponent Science and Technology 1979, Vol. 6, pp. 19-22 0305-3091/79/0601-0019 $04.50/0 (C) 1979 Gordon and Breach Science Publishers, Inc. Printed in Great Britain TEMPERATURE DEPENDENCE OF THE
More informationEigensolution Derivatives for Arbitrarily Normalized Modes
B. P. Wang Department of Mechanical Aerospace Engineering The University of Texas at Arlington Box 19023, Arlington, TX 76019 Eigensolution Derivatives for Arbitrarily Normalized Modes Methods for computing
More informationLecture 19 - p-n Junction (cont.) October 18, Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode: parasitics, dynamics
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 19-1 Lecture 19 - p-n Junction (cont.) October 18, 2002 Contents: 1. Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode:
More informationSemiconductor device structures are traditionally divided into homojunction devices
0. Introduction: Semiconductor device structures are traditionally divided into homojunction devices (devices consisting of only one type of semiconductor material) and heterojunction devices (consisting
More informationSemiconductor Physics and Devices
The pn Junction 1) Charge carriers crossing the junction. 3) Barrier potential Semiconductor Physics and Devices Chapter 8. The pn Junction Diode 2) Formation of positive and negative ions. 4) Formation
More informationRELAXABLE DAMAGE IN HOT-CARRIER
Active and Passive Elec. Comp., 1999, Vol. 22, pp. 147-156 (C) 1999 OPA (Overseas Publishers Association) N.V. Reprints available directly from the publisher Published by license under Photocopying permitted
More informationTheory and Simulation of the Smooth Quantum
VLSI DESIGN 1999, Vol. 9, No. 4, pp. 351-355 Reprints available directly from the publisher Photocopying permitted by license only (C) 1999 OPA (Overseas Publishers Association) N.V. Published by license
More informationf,e_ir, Application of the Wigner-Function Formulation to Mesoscopic Systems in Presence of Electron-Phonon Interaction (1)
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 185--190 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationCOMPUTER SIMULATION OF HYBRID INTEGRATED CIRCUITS INCLUDING COMBINED ELECTRICAL AND THERMAL EFFECTS
Electrocomponent Science and Technology, 1983, Vol. 10, pp. 171-176 (C) 1983 Gordon and Breach Science Publishers, Inc. 0305-3091/83/1003-0171 $18.50/0 Printed in Great Britain COMPUTER SIMULATION OF HYBRID
More informationINTERFACIAL DYNAMIC VELOCITY FOR SOLAR CELL CHARACTERIZATION
Active and Passive Elec. Comp., 1997, Vol. 20, pp. 95-103 Reprints available directly from the publisher Photocopying permitted by license only (C) 1997 OPA (Overseas Publishers Association) Amsterdam
More informationLecture Notes 2 Charge-Coupled Devices (CCDs) Part I. Basic CCD Operation CCD Image Sensor Architectures Static and Dynamic Analysis
Lecture Notes 2 Charge-Coupled Devices (CCDs) Part I Basic CCD Operation CCD Image Sensor Architectures Static and Dynamic Analysis Charge Well Capacity Buried channel CCD Transfer Efficiency Readout Speed
More informationResearch Article Propagation Characteristics of Oblique Incident Terahertz Wave in Nonuniform Dusty Plasma
Antennas and Propagation Volume 216, Article ID 945473, 6 pages http://dx.doi.org/1.1155/216/945473 Research Article Propagation Characteristics of Oblique Incident Terahert Wave in Nonuniform Dusty Plasma
More informationLecture 8 - Carrier Drift and Diffusion (cont.), Carrier Flow. February 21, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 8-1 Lecture 8 - Carrier Drift and Diffusion (cont.), Carrier Flow February 21, 2007 Contents: 1. Quasi-Fermi levels 2. Continuity
More informationTHICK FILM RESISTORS *
Electrocomponent Science and Technology, 1984, Vol. 11, pp. 185-190 (C) 1984 Gordon and Breach Science Publishers, Inc. 0305-3091/84/1102-0185 $18.50/0 Printed in Great Britain MODEL FOR RELIABILITY PREDICTION
More informationV BI. H. Föll: kiel.de/matwis/amat/semi_en/kap_2/backbone/r2_2_4.html. different electrochemical potentials (i.e.
Consider the the band diagram for a homojunction, formed when two bits of the same type of semicondutor (e.g. Si) are doped p and ntype and then brought into contact. Electrons in the two bits have different
More informationMOS Capacitor MOSFET Devices. MOSFET s. INEL Solid State Electronics. Manuel Toledo Quiñones. ECE Dept. UPRM.
INEL 6055 - Solid State Electronics ECE Dept. UPRM 20th March 2006 Definitions MOS Capacitor Isolated Metal, SiO 2, Si Threshold Voltage qφ m metal d vacuum level SiO qχ 2 E g /2 qφ F E C E i E F E v qφ
More informationTHE BASE MINORITY CARRIER LIFETIME AND
Active and Passive Elec. Comp., 1997, Vol. 19, pp. 225-238 Reprints available directly from the publisher Photocopying permitted by license only (C) 1997 OPA (Overseas Publishers Association) Amsterdam
More informationThe Report of the Characteristics of Semiconductor Laser Experiment
The Report of the Characteristics of Semiconductor Laser Experiment Masruri Masruri (186520) 22/05/2008 1 Laboratory Setup The experiment consists of two kind of tasks: To measure the caracteristics of
More informationResolution of Resonances in a General Purpose Quantum Device Simulator (NEMO)
VLSI DESIGN 1998, Vol. 6, Nos. (1--4), pp. 107-110 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationCalibration of a One Dimensional Hydrodynamic Simulator with Monte Carlo Data
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 515-520 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationMetal Semiconductor Contacts
Metal Semiconductor Contacts The investigation of rectification in metal-semiconductor contacts was first described by Braun [33-35], who discovered in 1874 the asymmetric nature of electrical conduction
More informationSemiconductor Physics. Lecture 3
Semiconductor Physics Lecture 3 Intrinsic carrier density Intrinsic carrier density Law of mass action Valid also if we add an impurity which either donates extra electrons or holes the number of carriers
More informationANALYSIS AND SIMULATION OF FUNCTIONAL STRESS DEGRADATION ON VDMOS POWER TRANSISTORS
Active and Passive Elec. Comp., 2002, Vol. 25, pp. 215 223 ANALYSIS AND SIMULATION OF FUNCTIONAL STRESS DEGRADATION ON VDMOS POWER TRANSISTORS M. ZOAETER a, *, B. BEYDOUN a, M. HAJJAR a, M. DEBS a and
More informationLecture 4 - Carrier generation and recombination. February 12, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 4-1 Contents: Lecture 4 - Carrier generation and recombination 1. G&R mechanisms February 12, 2007 2. Thermal equilibrium: principle
More informationLecture 5 - Carrier generation and recombination (cont.) September 12, 2001
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 5-1 Contents: Lecture 5 - Carrier generation and recombination (cont.) September 12, 2001 1. G&R rates outside thermal equilibrium
More informationSemiconductor Physics Problems 2015
Semiconductor Physics Problems 2015 Page and figure numbers refer to Semiconductor Devices Physics and Technology, 3rd edition, by SM Sze and M-K Lee 1. The purest semiconductor crystals it is possible
More informationLecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005
6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 15-1 Lecture 15 - The pn Junction Diode (I) I-V Characteristics November 1, 2005 Contents: 1. pn junction under bias 2. I-V characteristics
More informationAnalysis of Vibrating Timoshenko Beams Using the Method of Differential Quadrature
P. A. A. Laura R. H. Gutierrez Institute of Applied Mechanics (CONICET-SENID-ACCE) and Department of Engineering Universidad Nacional del Sur BOOO-Bahia Blanca, Argentina Analysis of Vibrating Timoshenko
More informationLecture 9 - Carrier Drift and Diffusion (cont.), Carrier Flow. September 24, 2001
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 9-1 Lecture 9 - Carrier Drift and Diffusion (cont.), Carrier Flow September 24, 2001 Contents: 1. Quasi-Fermi levels 2. Continuity
More informationResearch Article Simplified Robotics Joint-Space Trajectory Generation with a via Point Using a Single Polynomial
Robotics Volume, Article ID 75958, 6 pages http://dx.doi.org/.55//75958 Research Article Simplified Robotics Joint-Space Trajectory Generation with a via Point Using a Single Polynomial Robert L. Williams
More information16EC401 BASIC ELECTRONIC DEVICES UNIT I PN JUNCTION DIODE. Energy Band Diagram of Conductor, Insulator and Semiconductor:
16EC401 BASIC ELECTRONIC DEVICES UNIT I PN JUNCTION DIODE Energy bands in Intrinsic and Extrinsic silicon: Energy Band Diagram of Conductor, Insulator and Semiconductor: 1 2 Carrier transport: Any motion
More informationTwo Visually Meaningful Correlation Measures for Comparing Calculated and Measured Response Histories
Benjamin Whang William E. Gilbert Stephen Zilliacus Carderock Division Naval Surface Warfare Center Bethesda, MD 20084 Two Visually Meaningful Correlation Measures for Comparing Calculated and Measured
More informationA New High Voltage 4H-SiC Lateral Dual Sidewall Schottky (LDSS) Rectifier: Theoretical Investigation and Analysis
M. Jagadesh Kumar and C. Linga Reddy, "A New High Voltage 4H-SiC Lateral Dual Sidewall Schottky (LDSS) Rectifier: Theoretical Investigation and Analysis", IEEE Trans. on Electron Devices, Vol.50, pp.1690-1693,
More informationA Parameter Study of Localization
Sandor Stephen Mester Haym Benaroya Department of Mechanical and Aerospace Engineering Rutgers The State University of New Jersey New Brunswick NJ A Parameter Study of Localization Etensive work has been
More informationModel tests and FE-modelling of dynamic soil-structure interaction
Shock and Vibration 19 (2012) 1061 1069 1061 DOI 10.3233/SAV-2012-0712 IOS Press Model tests and FE-modelling of dynamic soil-structure interaction N. Kodama a, * and K. Komiya b a Waseda Institute for
More informationSchottky diodes. JFETs - MESFETs - MODFETs
Technische Universität Graz Institute of Solid State Physics Schottky diodes JFETs - MESFETs - MODFETs Quasi Fermi level When the charge carriers are not in equilibrium the Fermi energy can be different
More informationSpring Semester 2012 Final Exam
Spring Semester 2012 Final Exam Note: Show your work, underline results, and always show units. Official exam time: 2.0 hours; an extension of at least 1.0 hour will be granted to anyone. Materials parameters
More informationAnalysis of Mobility of Intrinsic Germanium and Silicon near Room Temperature
Physics Journal Vol. 2, No. 1, 2016, pp. 35-44 http://www.aiscience.org/journal/pj Analysis of Mobility of Intrinsic Germanium Silicon near Room Temperature D. P. Nedkar * Department of Electrical Engineering,
More informationChoice of V t and Gate Doping Type
Choice of V t and Gate Doping Type To make circuit design easier, it is routine to set V t at a small positive value, e.g., 0.4 V, so that, at V g = 0, the transistor does not have an inversion layer and
More informationLecture 2. Introduction to semiconductors Structures and characteristics in semiconductors
Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation
More informationPeak Electric Field. Junction breakdown occurs when the peak electric field in the PN junction reaches a critical value. For the N + P junction,
Peak Electric Field Junction breakdown occurs when the peak electric field in the P junction reaches a critical value. For the + P junction, qa E ( x) ( xp x), s W dep 2 s ( bi Vr ) 2 s potential barrier
More informationLecture-4 Junction Diode Characteristics
1 Lecture-4 Junction Diode Characteristics Part-II Q: Aluminum is alloyed into n-type Si sample (N D = 10 16 cm 3 ) forming an abrupt junction of circular cross-section, with an diameter of 0.02 in. Assume
More informationResearch Article Travel-Time Difference Extracting in Experimental Study of Rayleigh Wave Acoustoelastic Effect
ISRN Mechanical Engineering, Article ID 3492, 7 pages http://dx.doi.org/.55/24/3492 Research Article Travel-Time Difference Extracting in Experimental Study of Rayleigh Wave Acoustoelastic Effect Hu Eryi
More information8. Schottky contacts / JFETs
Technische Universität Graz Institute of Solid State Physics 8. Schottky contacts / JFETs Nov. 21, 2018 Technische Universität Graz Institute of Solid State Physics metal - semiconductor contacts Photoelectric
More informationChapter 7. The pn Junction
Chapter 7 The pn Junction Chapter 7 PN Junction PN junction can be fabricated by implanting or diffusing donors into a P-type substrate such that a layer of semiconductor is converted into N type. Converting
More informationAvalanche breakdown. Impact ionization causes an avalanche of current. Occurs at low doping
Avalanche breakdown Impact ionization causes an avalanche of current Occurs at low doping Zener tunneling Electrons tunnel from valence band to conduction band Occurs at high doping Tunneling wave decays
More informationSolid State Physics SEMICONDUCTORS - IV. Lecture 25. A.H. Harker. Physics and Astronomy UCL
Solid State Physics SEMICONDUCTORS - IV Lecture 25 A.H. Harker Physics and Astronomy UCL 9.9 Carrier diffusion and recombination Suppose we have a p-type semiconductor, i.e. n h >> n e. (1) Create a local
More informationRemote Sensing Applications for the Historic Environment
m S App H Em L H Em m S 4 C B P m k m m. B m S App H Em L H Em m S 4 m C A Im H Em. B m m H Lp U S D m S C U P m k B m S App H Em L H Em m S 4 m A m A W k? A pp :. Tpp. Px. mk.. S S mk.. Cp S mk B m m
More informationParametric Study of Greitzer s Instability Flow Model Through Compressor System Using the Taguchi Method
Rotating Machinery, 10: 91 97, 2004 Copyright c Taylor & Francis Inc. ISSN: 1023-621X print DOI: 10.1080/10236210490276683 Parametric Study of Greitzer s Instability Flow Model Through Compressor System
More informationResearch Article Partial Pole Placement in LMI Region
Control Science and Engineering Article ID 84128 5 pages http://dxdoiorg/11155/214/84128 Research Article Partial Pole Placement in LMI Region Liuli Ou 1 Shaobo Han 2 Yongji Wang 1 Shuai Dong 1 and Lei
More informationIBFLUENCE OJ' SURFACE STATE ON THE CHARGE TRANSFER.AIDNG THE DIELECTRIC-S1!J4ICONDUCTOR IBTERFACE
IBFLUENCE OJ' SURFACE STATE ON THE CHARGE TRANSFER.AIDNG THE DIELECTRIC-S1!J4ICONDUCTOR IBTERFACE V. V. Pospelov,* R. A. Suris 'f B. I. J'oukst R. Z. Haf'izov-oc ABSTRACT Surface charge transfer analysis
More informationLecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.)
Lecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.) Outline 1. Overview of MOS electrostatics under bias 2. Depletion regime 3. Flatband 4. Accumulation regime
More informationLecture 22 Field-Effect Devices: The MOS Capacitor
Lecture 22 Field-Effect Devices: The MOS Capacitor F. Cerrina Electrical and Computer Engineering University of Wisconsin Madison Click here for link to F.C. homepage Spring 1999 0 Madison, 1999-II Topics
More informationFEMTOSECOND MID-INFRARED SPECTROSCOPY OF HYDROGEN-BONDED LIQUIDS
Laser Chem., 1999, Vol. 19, pp. 83-90 Reprints available directly from the publisher Photocopying permitted by license only (C) 1999 OPA (Overseas Publishers Association) N.V. Published by license under
More informationThis is the 15th lecture of this course in which we begin a new topic, Excess Carriers. This topic will be covered in two lectures.
Solid State Devices Dr. S. Karmalkar Department of Electronics and Communication Engineering Indian Institute of Technology, Madras Lecture - 15 Excess Carriers This is the 15th lecture of this course
More informationResearch Article Trapped-Mode Resonance Regime of Thin Microwave Electromagnetic Arrays with Two Concentric Rings in Unit Cell
Microwave Science and Technology Volume 2, Article ID 3688, 6 pages doi:.55/2/3688 Research Article Trapped-Mode Resonance Regime of Thin Microwave Electromagnetic Arrays with Two Concentric Rings in Unit
More informationSemiconductor Optoelectronics Prof. M. R. Shenoy Department of physics Indian Institute of Technology, Delhi
Semiconductor Optoelectronics Prof. M. R. Shenoy Department of physics Indian Institute of Technology, Delhi Lecture - 18 Optical Joint Density of States So, today we will discuss the concept of optical
More informationpn JUNCTION THE SHOCKLEY MODEL
The pn Junction: The Shockley Model ( S. O. Kasap, 1990-001) 1 pn JUNCTION THE SHOCKLEY MODEL Safa Kasap Department of Electrical Engineering University of Saskatchewan Canada Although the hole and its
More informationFundamentals of Semiconductor Physics
Fall 2007 Fundamentals of Semiconductor Physics 万 歆 Zhejiang Institute of Modern Physics xinwan@zimp.zju.edu.cn http://zimp.zju.edu.cn/~xinwan/ Transistor technology evokes new physics The objective of
More informationLecture 20 - p-n Junction (cont.) October 21, Non-ideal and second-order effects
6.70J/3.43J - Integrated Microelectronic Devices - Fall 00 Lecture 0-1 Lecture 0 - p-n Junction (cont.) October 1, 00 Contents: 1. Non-ideal and second-order effects Reading assignment: del Alamo, Ch.
More informationEstimation of dynamic characteristics of a spring-mass-beam system
Shock and Vibration 14 (2007) 271 282 271 IOS Press Estimation of dynamic characteristics of a spring-mass-beam system Ding Zhou a,b, and Tianjian Ji b a College of Civil Engineering, Nanjing University
More informationSemiconductor Devices
Semiconductor Devices - 2014 Lecture Course Part of SS Module PY4P03 Dr. P. Stamenov School of Physics and CRANN, Trinity College, Dublin 2, Ireland Hilary Term, TCD 17 th of Jan 14 Metal-Semiconductor
More informationPart 4: Heterojunctions - MOS Devices. MOSFET Current Voltage Characteristics
MOS Device Uses: Part 4: Heterojunctions - MOS Devices MOSCAP capacitor: storing charge, charge-coupled device (CCD), etc. MOSFET transistor: switch, current amplifier, dynamic random access memory (DRAM-volatile),
More informationIntroduction to Optoelectronic Device Simulation by Joachim Piprek
NUSOD 5 Tutorial MA Introduction to Optoelectronic Device Simulation by Joachim Piprek Outline:. Introduction: VCSEL Example. Electron Energy Bands 3. Drift-Diffusion Model 4. Thermal Model 5. Gain/Absorption
More informationRecombination: Depletion. Auger, and Tunnelling
Recombination: Depletion Region, Bulk, Radiative, Auger, and Tunnelling Ch 140 Lecture Notes #13 Prepared by David Gleason We assume: Review of Depletion Region Recombination Flat Quantum Fermi Levels
More informationA Generalized Monte Carlo Approach for the Analysis of Quantum-Transport Phenomena in Mesoscopic Systems:
VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 197-202 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by
More informationCharge Carriers in Semiconductor
Charge Carriers in Semiconductor To understand PN junction s IV characteristics, it is important to understand charge carriers behavior in solids, how to modify carrier densities, and different mechanisms
More informationDesign and control of nonlinear mechanical systems for minimum time
Shock and Vibration 15 (2008) 315 323 315 IOS Press Design and control of nonlinear mechanical systems for minimum time J.B. Cardoso a,, P.P. Moita b and A.J. Valido b a Instituto Superior Técnico, Departamento
More informationCourse overview. Me: Dr Luke Wilson. The course: Physics and applications of semiconductors. Office: E17 open door policy
Course overview Me: Dr Luke Wilson Office: E17 open door policy email: luke.wilson@sheffield.ac.uk The course: Physics and applications of semiconductors 10 lectures aim is to allow time for at least one
More informationL5: Surface Recombination, Continuity Equation & Extended Topics tanford University
L5: Surface Recombination, Continuity Equation & Extended Topics EE 216 : Aneesh Nainani 1 Announcements Project Select topic by Jan 29 (Tuesday) 9 topics, maximum 4 students per topic Quiz Thursday (Jan
More informationECE-305: Fall 2016 Minority Carrier Diffusion Equation (MCDE)
ECE-305: Fall 2016 Minority Carrier Diffusion Equation (MCDE) Professor Peter Bermel Electrical and Computer Engineering Purdue University, West Lafayette, IN USA pbermel@purdue.edu Pierret, Semiconductor
More informationCurrent mechanisms Exam January 27, 2012
Current mechanisms Exam January 27, 2012 There are four mechanisms that typically cause currents to flow: thermionic emission, diffusion, drift, and tunneling. Explain briefly which kind of current mechanisms
More informationChapter 1 Overview of Semiconductor Materials and Physics
Chapter 1 Overview of Semiconductor Materials and Physics Professor Paul K. Chu Conductivity / Resistivity of Insulators, Semiconductors, and Conductors Semiconductor Elements Period II III IV V VI 2 B
More informationLecture 2. Introduction to semiconductors Structures and characteristics in semiconductors
Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation
More informationFinite Difference Methods for
CE 601: Numerical Methods Lecture 33 Finite Difference Methods for PDEs Course Coordinator: Course Coordinator: Dr. Suresh A. Kartha, Associate Professor, Department of Civil Engineering, IIT Guwahati.
More informationElectron Energy, E E = 0. Free electron. 3s Band 2p Band Overlapping energy bands. 3p 3s 2p 2s. 2s Band. Electrons. 1s ATOM SOLID.
Electron Energy, E Free electron Vacuum level 3p 3s 2p 2s 2s Band 3s Band 2p Band Overlapping energy bands Electrons E = 0 1s ATOM 1s SOLID In a metal the various energy bands overlap to give a single
More informationSemiconductor Detectors
Semiconductor Detectors Summary of Last Lecture Band structure in Solids: Conduction band Conduction band thermal conductivity: E g > 5 ev Valence band Insulator Charge carrier in conductor: e - Charge
More information