Disclosure to Promote the Right To Information

Transcription

1 इ टरन ट म नक Disclosure to Promote the Right To Information Whereas the Parliament of India has set out to provide a practical regime of right to information for citizens to secure access to information under the control of public authorities, in order to promote transparency and accountability in the working of every public authority, and whereas the attached publication of the Bureau of Indian Standards is of particular interest to the public, particularly disadvantaged communities and those engaged in the pursuit of education and knowledge, the attached public safety standard is made available to promote the timely dissemination of this information in an accurate manner to the public. ज न1 क अ+धक र, ज 1 क अ+धक र Mazdoor Kisan Shakti Sangathan The Right to Information, The Right to Live प0र 1 क छ ड न' 5 तरफ Jawaharlal Nehru Step Out From the Old to the New IS (1984): ceramic dielectric capacitors type 1: Part 2 FCCT 1 [LITD 5: Semiconductor and Other Electronic Components and Devices]! न $ एक न' भ रत क +नमण Satyanarayan Gangaram Pitroda Invent a New India Using Knowledge! न एक ऐस खज न > ज कभ च0र य नहB ज सकत ह ह Bhartṛhari Nītiśatakam Knowledge is such a treasure which cannot be stolen

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4 IS:10825( Part2)1984 Indian Standard SPECIFICATION FOR CERAMIC DIELECTRIC CAPACITORS, TYPE 1 PART 2 TYPE FCCT1 0.1 General This standard ( Part 2 ) shall be read in conjunction with IS : ( Part 1 J1975 Ceramic dielectric capacitors, Type 1: Part 1 General requirements and methods of tests. 1. Scope This standard ( Part 2 ) covers fixed ceramic dielectric capacitors temperature compensated, moulded type insulated. 2. Outline, Drawing and Dimensions The outline, drawing and dimensions shall be in accordance with Fig. 1 and 2 and Table 1. rdia OF LEAD WITHIN All dimensions in millimetres. FIG. 1 OUTLINE, DRAWING AND DIMENSIONS.. DIA OF LEAD All dimensions in millimetres. FIG. 2 OUTLINE, DRAWING AND DIMENSIONS Note 1 Dimensions are in mm. Note 2 Lead diameter shall be 0 51 mm to 0 69 mm. A TABLE 1 DIMENSIONS ( Clause 2 ) S Figure Reference.. A 4.83 rt ri: B 7.37 rt i: _ Adopted 23 April April 1985, ISI I I IND~IAN STANDARDS INSTITUTION MANAK SHAVAN. 9 BAHADtiR SHAH ZAFAR MARG NEW DELHI Gr 5

5 IS:10825(Part2)1984 TABLE 2 RATINGS ( Clause 3 ) Nominal Capacitance Capacitance Tolerance Rated Voltage Tolerance on Temperature Coefficient Case Size (1) PF (2) zt (3) V (4) w WC I 15) O1 pf, 0 25 pf ;:; ;: ' '1 pf, 0 25 pf, 0 5 PF 200 A $ s: 24 2: 47 z: 62 1 percent 2 percent 5 percent +30 ; % : 6: ( Continued) 2

6 IS : ( Part 2 ) 1984 TABLE 2 RATINGS Contd Nominal Capacitance Capacitance Tolerance Rated Voltage Tolerance on Temperature Coefficient Case Size (1) (2) PF +.,wml C ~ I I I percent 2 percent 5 percent i _._ I percent 2 percent 5 percent A I I 1 percent 2 Percent 5 Percent I t ;oo:._ I 1 percent 2 percent 5 percent 10 percent 50

7 IS : ( Part2 ) Ratings and Characteristics a) b) d 4 e) f) :j 9 k) ml n) Climatic category Low air pressure Acceleration Bump Vibration Shock Capacitance values Selection tolerances Rated voltage Rated temperature J coefficient Tolerance on temperature coefficient Stability after endurance 55/l 25,: kpaz 1 km,s bumps 10 to Hz, 150 m/s 1 km/s See Table 2 0 ppm/ C See Table 2 zl13 percent or 0 5 pf (0 25 pf for values < 10 pf) whichever is greater Marking See 8 of IS : ( Part 1 j1975. * Construction and Workmanship See 6 of IS : ( part 1 )1975. Tests 6.1 Classification of Tests 6.X1 Type tests The procedure for type approval shall be in accordance with IS : 2612l 965 Recommendation for type approval and sampling procedures for electronic components. The sequence of type tests and requirements shall be in accordance with Table I.I Number of samples The manufacturer shall submit 24 specimens in any one temperature coefficient in each size of component for which approval is desired or a minimum of 28 specimens if approval for only one temperature coefficient in a size is desired in accordance with Table 3. The specimens shall be of the highest capacitance value and closest tolerance in each temperature coefficient. Group (1) 0 Number of Specimens ~ ~ h~~~~~~ Each One Temperature Size Coefficient in One Size (2) (3) TABLE 3 SCHEDULE OF TYPE TESTS Test (4) (Visual examination, 1 Dimensions, I Capacitance, { Tangent of loss angle, 1 Short term stability, I Voltage proof (one minute), and llnsulation resistance a Spares 1 1 [ Solderability, 1 Robustness of terminations, I Bumo,! i Vibration, Shock, 1 Acceleration, 1 Rapid change of temperature, and [Climatic sequence Damp heat (steady state) Endurance i Resistance to solvents Resistance to soldering heat Temperature coefficient and capacitance drift 4

8 IS : ( Part 2 )I Routine tests The following shall constitute the routine tests and shall be carried out on each and every capacitor: a) Visual examination, and b) Capacitance Acceptance tests From the lot which has passed the routine tegts, two groups of samples ( Group A and B > shall beselected and the capacitors shall be subjected to the tests in accordance with Table 4. TABLE 4 SCHEDULE OF ACCEPTANCE TESTS Tests AQL InspLect_$n* D/ND (1) (2) (3) (4) GROUP A Dimensions Tangent of loss angle Insulation resistance Voltage proof 1 11 ND GROUP B Sub &oup I Short term stability Temperature coefficient and capacitance drift 4 53 ND Sub Group 2 Solderability Robustness of terminations Bump Climatic Sequence 4 53 D Sub Group 3 Endurancel 68 hours 4 53 ND D : Destructive, ND : NonLdeslructive. *IS : Sampling plans and procedures for inspection by attributes for electronic items. TABLE 5 TEST SCHEDULE AND REQUIREMENTS ( Clause ) SI Test Clause Condition No. Reference of Test IS : ( Part 1 )1975 Requirement (1) (2) (3) (4) (5) i) GROUP 0 (Ail samples ) a) Visual examination b) Dimensions c) Capacitance d) Tangent of loss angle The condition, workmanship and finish shall be satisfactory. Marking shall be legible and indelible Dimensions shall be in accordance with Fig. 1 and 2 and Table 1 The capacitance value shall correspond with the rated capacitance, taking into account the tolerance Tan 6 shall not exceed the following a) For capacitance equal to or exceeding 5 pf but less:gh;n 50 pf Tan 6 z ( c X 104 b) For rated capacitance > 50 pf Tan 6 = Continued 5

9 IS:10825( Part2)1984 Si No. Test (1) (2) e) Short term stability TABLE 5 TEST SCHEDULE AND REQUIREMENTS Contd Clause Reference IS : ( Part 1 )I975 (3) (4) Requirement (5) No random variation of frequency shall occur f) Voltage proof At 3 times the rated voltage 1) Between terminals The surge current shall not exceed 50mA 2) Between terminals connected together and the mounting plate g) Insulation resistance between terminals At rated voltage See Appendix A ii) First Group a) Solderability b) Robustness of terminations c) 5ump 1) Visual examination Capacitors shall be held by one terminal and the load shall be gradually applied in the direction of the leads until the loads reaches 22N. The loadshall be applied at least for 5 seconds Bumps 2) Capacitance ) Tangent of loss angle 4) Insulation resistance There shall be no evidence of loosening or rapture of the terminals and any other damage to the terminals and capacitors body There shall be no mechanical deterioration initial value shall not exceed +2 percent or 0.5 pf (0 25 pf for values less As in SI No. (i) (d) As in Sl No. (i)(g) d) Vibration 1) Visual examination Capacitance 2) t02000Hz150m(sa There shall be no mechanical deterioration initial value shall not exceed 52 percent or 0 5 pf (0 25 pf for values less than I:0 pf) whichever is greater 3) 4) Tangent of loss angle Insulation resistance e) Shock As in IS : 9000 (Part 71 Set l) 1979* As in St No. (i) (d) As in SI No. (i) (g) 1 km!s* 1) Visual examination 2) Capacitance 3) Tangent of loss angle 4) Insulation resistance There shall be no mechanical deterioration initial value shall not exceed 52 percent or 0 5 pf (0 25 pf for values less As in SI No. (i)(d) As in SI No. (i)(g) Basic environmental testing procedures for electronic and electrical items: Part 7 Impact test, Section 1 Shock. t Continosd ) 6

10 IS : ( Part 2 ) 1984 I% TABLE 5 TEST SCHEDULE AND REQUIREMENTSConrd Test Clause CyfdTey Requirement l?gfe;y9;; ( Part 3 )1975 (I) (2) (3) (4) (5) f) Acceleration As per 1 km/s% IS : 9000 (Part 9). 1984* I) Visual examination 9.4 There shall be no mechanical deterioration 2) Capacitance ) Tangent of loss angle ) insulation resistance g) Rapid change of temperature ) Visual examination 2) Capacitance /l 25 initial value shall not exceed 42 percent or 0 5 of (0 25 pf for values less As in SI No. (i) (d) As in SI No. (i)(g) There shall be no fracture or other mechnical deterioration initial value shall not exceed +5 percent or 0.5 PF (0 25 pf for values less than 10,oF) whichever is greater 3) Tangent of loss angle As in SI No. (i) (d) 4) Insulation resistance As in SI No. (i) (g) h) Climate sequence 1) Dry heat At +I 25 C i) insulation resistance (hot) As in SI No. (i)(g) ii) Capacitance initial value shall not exceed +5 percent or 0.5 pf (0 25 pf for values less 2) Damp heat cyclic ) Cold i) Working test One cycle 55 C During the last 10 minutes of exposure, the rated voltage shall be applied to the specimens 4) Low air pressure kpa. During the last minute the rated voltage shall be applied 5) Damp heat cyclic Remaining cycles i) Working test Within 15 minutes after removal from the chamber, and before the recovery period, the rated voltage shall be applied for 5 minutes j) Final measurements a) Visual examination b) Voltage proof There shall be no corrosion, fracture or other mechanical deterioration. Marking shall be legible and indelible *Basic environmental testing procedures for electronic and electrical items: Part 9 Acceleration (steady state) test. ( Continued J 7

11 IS : ( Part 2 ) 1984 SI No. Test TABLE 5 TEST SCHEDULE AND REQUIREMENTS Contd Clause y;f elrgegn;; CzdFe$n Requirement ( Part, )I975 (1) (2) (3) c) insulation resistance d) Capacitance e) Tangent of loss angle iii) Second Group Damp heat (Steady 1) Electrical loading 2) Visual examination 3) Voltage proof state) 4) Insulation resistance 5) Capacitance ) Tangent of loss angle ) Solderability iv) Third Group a) Endurance test 1) Visual 2) 3) 4) 5) Capacitance Tangent Voltage Insulation v) Fourth Group examination of loss angle proof resistance a) Resistance to solvents (4) To be completed within one hour after recovery 56 days a) Throughout the period of exposure onehalf of the specimens shall have the rated voltage applied between the terminations b) Within 15 minutes sfter removal from the chamber the remaining specimens shall have the rated voltage applied between the terminations for 5 minutes At ~125 C As in IS : 9000 \ps ;;,20) _b) Resistance to soldering heat ) Visual examination 9.4 2) Capacitance ) Tangent of loss angle 4) Insulation resistance vi) Fifth Group a) Temperature coefficient b) Capacitance drift (5) The value shall be not less than 50 percent of the initial value initial value shall not exceed +5 percent or 0 5 pf (0 25 pf for values less As in SI No. (i)(d) There shall be no corrosion, fracture or other mechanical deterioration. Marking shall be legible and indelible The value shall be not less than 30 cent of the initial value per initial value shall not exceed.5 percent or 0 5 pf (0 25 PDF for values less As in SI No. (i) (d) Thereshall be no fracture, or any mother mechanical deterioration. Marking shall be legible and indelible initial value shall not exceed 13 percent or 0 5 pf (0 25 pf for values less As in SI No. (i) (d) As in SI No. (i)(f) The value shall be not less than 50 percent of the initial value The marking shall remain legible and shall not smear or rub off. There shall be no visible indication of damage or deterioration of the capacitor body There shall be no mechanical damage initial value shall not exceed 15 percent As in SI No. (i) (d) As in SI No. (i) (g) The value of temperature coefficient shall be as given in 3 (j) The value shall be within 10 2 percent or 0 5 pf whichever is greater *Basic environmental testing procedures for electronic and electrical items: Part 20 Resistance to cleaning solvents and permanence of markings. 8

12 IS : ( Part 2 ) 1984 APPENDIX A [ Table 5, SI No. (i) (g) I INSULATION RESISTANCE $ a K 10K 100 K s CAPACITANCE IN pf 9 Printed at Printrade, New Delhi. India