Energy analyzer for spin polarized Auger electron spectroscopy
|
|
- Jocelin Benson
- 6 years ago
- Views:
Transcription
1 REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 75, NUMBER 5 MAY 2004 Energy analyzer for spin polarized Auger electron spectroscopy V. N. Petrov a) and A. S. Kamochkin St. Petersburg Technical University, 29 Polytechnicheskaya Street, , St. Petersburg, Russia Received 3 June 2003; accepted 6 February 2004; published 26 April 2004 A double-pass cylindrical mirror energy analyzer for spin polarized Auger electron spectroscopy SPAES has been constructed and tested. The analyzer has high transmission, small electron emission angle for the collection of electrons into an additional Mott detector, and large focal distance. The combination of this energy analyzer with a compact classical Mott detector provides a SPAES spectrometer with very high efficiency American Institute of Physics. DOI: / I. INTRODUCTION One of the most powerful methods for the analysis of local surface magnetic properties is spin polarized Auger electron spectroscopy SPAES. 1 8 In terms of analyzing power this method is approaching the technique of x-ray magnetic circular dichroism. However, it does not require the application of synchrotron radiation and can be performed under laboratory conditions. A very impressive demonstration of this method was given by Landolt and Mauri, 1 Landolt, 2 Landolt, Allenspach, and Mauri, 3 and Allenspach et al. 4 SPAES is not widely used since suitable energy analyzers and electron polarization detectors were not available. In this article, we describe design and performance of a high transmission cylindrical mirror analyzer coupled to a high efficient classical Mott detector. First, the relevant parameters for spin-resolved Auger electron spectroscopy are discussed. Then, the design of a analyzer is described. In the third part the performance of the system is demonstrated with measurements on FeNi 3. At present there exist two surface analysis methods that successfully compete and complement each other, namely, photoelectron spectroscopy PES and Auger electron spectroscopy AES. Thus it is useful to base our analysis on the comparison of PES and AES spectra. Despite the fact that the physical nature of PES and AES is in principle the same the spectra look different. While photoelectron spectra have characteristic peaks with amplitudes comparable to or greatly exceeding the background signal, the Auger peak s amplitude is usually considerably lower than the background. This results in a different approach to the registration and analysis of these spectra in conventional spectroscopy without spin analysis. Photoelectron spectra are registered directly as a function of intensity against electron energy. An Auger electron spectrum is typically plotted as the derivative of the intensity as a function of the electron energy. Let us consider the peculiarities of these methods, which manifest themselves when a spin analysis is added. An electron beam polarization measurement can be performed by means of Mott scattering. 9,10 A beam of relativistic electrons is scattered on a gold foil and the backscattered a Electronic mail: petrov@tuexph.stu.neva.ru electrons are counted. For the determination of one component of the polarization vector two counters are needed in order to determine the number of electrons back scattered to the left (N L ) and to the right (N R ) with respect to the direction of the incoming beam. 9,10 The polarization of the incoming electron beam is then found to be P N L N R /S N L N R, S is a parameter characterizing the Mott detector and is called effective Sherman function. The absolute statistical error P of the polarization P is given by P 1/S N L N R, and the relative error P by P P/P N L N R / N L N R. These equations are only valid for large values of N and for the case with N L N R N L, N R. Note that the polarization is usually measured in percent and therefore also P is given in percent. Since P as well is expressed in percent one should be careful not to mix up P and P. In the case of a photoelectron spectra where the peak amplitudes are higher than the background of the signal no problems arise during the analysis. Normally these spectra are presented as two independent curves spin up and spin down. In the case of Auger spectra the situation is different. Auger peaks are normally considerably smaller than the background. Typically the background exceeds the peak signal by one order of magnitude. Just plotting two polarization curves is not useful in this case. Also the plotting of the derivative of these curves would only obscure possible findings. Therefore often, 1 4,8 but not always, 5 7 a background is subtracted and the subsequently derived electron spin polarization is plotted as function of energy. But also this approach makes the interpretation of the experimental results complicated since the background subtraction might induce an artificial polarization at the edges of an Auger peak. In the case of Auger spectroscopy we define the number of Auger electrons counted in the left and right detector as N LA and N RA. Both detectors do also count a considerable /2004/75(5)/1274/6/$ American Institute of Physics
2 Rev. Sci. Instrum., Vol. 75, No. 5, May 2004 Energy analyzer 1275 amount of background electrons. We call these N LB and N RB. The total number of electrons counted by the two detectors is then N L N LA N LB, 4 N R N RA N RB. 5 If we put these expressions for N L and N R into Eq. 1 and if we set N LB N RB N B we obtain P N L N R /S N L N R N LA N RA /S N LA N RA 2N B. 6 Note that the polarization of the background electrons does not have to be zero, but is normally small. 2 It is evident that the polarization P measured in the experiment will be smaller than the polarization of the Auger electrons. This difference can be as large as two orders of magnitude. Let us analyze what happens in this case to the statistical error. We make use of expression 3 and receive P N LA N RA 2N B / N LA N RA. 7 The relative error grows considerably in comparison with the ideal case 3. The only way to keep the relative error at the same low level is to increase the number of electrons by a factor by increasing the measuring time. Then P becomes P N LA N RA 2N B / N LA N RA. 8 In order to reduce P to the level it had with N B 0, has to solve the following equation: N LA N RA 2N B / N LA N RA N LA N RA / N LA N RA. 9 For we obtain 1 2N B / N LA N RA. 10 It is evident that in order to maintain the same relative error it is necessary to increase the number of electrons as many times as the background exceeds the signal. It is useful to define D as D 1/ N LA N RA / N LA N RA 2N B. 11 The final equation for the absolute error becomes then P 1/S D N L N R, 12 where D N SIGNAL / N SIGNAL N BACKGROUND. 13 With this it is easy to calculate the time required for an analysis with predefined error. Suppose we would like to measure the Auger peak polarization with an absolute statistical error equal to P % polarization. The value of the Sherman function of a modern Mott detectors is between We will take the worst case, i.e., S 0.1. The value of D for low kinetic energy auger peaks will be taken as 0.1. By substituting these values into Eq. 12 we obtain N L and N R of the order of Taking into consideration that the counting rate of a state-of-the-art Mott detector is 10 5 cps, the time required for the measurement of one spectrum point with absolute error P 0.01 is 50 s. This is a quite reasonable time in terms of application of SPAES as a quick laboratory method for the analysis of local surface magnetism. Of course this is only practicable when the transmission of the energy analyzer is good enough to provide an electron counting rate of (10 5 cps) with an initial current of the electron gun not exceeding several microamperes. The requirements for the components of a the SPAES spectrometer are therefore: 1 The energy analyzer should have very high transmission. 2 The electron polarization detector should have high efficiency and high maximum count rate. 3 The time stability of the polarization detector should be very high for cases where the polarization is small and a long measuring time is required. 4 The electron polarization measurement should be insensitive to movements and shape variations of the incoming beam since these effects might occur when the transmission energy of the energy analyzer is varied. Any failure to meet one of these conditions gravely complicates the construction of an efficient SPAES spectrometer. II. DESIGN Cylindrical mirror energy analyzers are known to have a high transmission. Therefore they are suitable for SPAES spectroscopy and should in addition fulfill the following requirements: 1. The transmission should be extremely high, even at the cost of resolution. This is acceptable in our case because the width of an Auger peak itself is rather large. Our design goal is a relative resolution of E/E 0.7%. 2. The electron emission angle should be as small as possible. Conventional cylindrical mirror analyzers have an emission angle of about 43. Such a large emission angle makes it difficult to recollect the electrons into a Mott detector. 3. The focal distance the distance between the entrance of the analyzer and the sample should be large enough. Limited space in front of the analyzer entrance complicates the work with magnetic samples and with coils needed to magnetize these samples. The use of a small analysis angle requires the construction of a double-pass analyzer. A schematic drawing of the accordingly designed energy analyzer is given in Fig. 1. It consists of three cylindrical coaxial electrodes. The outer cylinder is always at earth potential and serves as support and protective screen. Ceramic rings hold the two inner cylinders in place. Energy analysis is performed by varying the potential of the inner cylinders. A hole in the inner cylinder at the location of the first focal point allows the electrons to cross the analyzer axis. A grid covers this hole in order to avoid singularities in the electric field. Secondary electrons, which should be analyzed according to their energy and spin, have to pass through the entrance slit of the analyzer. The entrance slit accepts electrons
3 1276 Rev. Sci. Instrum., Vol. 75, No. 5, May 2004 V. N. Petrov and A. S. Kamochkin FIG. 2. Energy spectrum measured in one channel of the Mott detector. The energy and current of primary electron beam are 1500 ev and 0.4 A, respectively. FIG. 1. Schematic of analyzer. on emission cones with opening angles between 18.5 and The analyzer has two modes of operation: One where the relative resolution ( E/E) is kept constant and one where the absolute resolution ( E) is kept constant. The different modes are realized by applying suitable potentials to the concentric cylinders of the analyzer. In the E/E const mode all input grids do have the same ground potential. The inner cylinder is on ground potential as well. Scanning of the negative potential supplied to the medium cylinder provides the energy analysis. A potential of approximately (0,7E/e) allows the transmission of electrons with a kinetic energy of E e is the charge of one electron. Electrons leave the analyzer at approximately 35. This angle enables us to collect and direct the electrons into the Mott detector. On leaving the analyzer the electrons are directed into the Mott detector with the help of one focusing electrode. A voltage between 50 and 300 V positive with regard to the inner cylinder potential is supplied to this electrode. A fixed potential of 2 kv is supplied to the outer hemispherical electrode of the Mott detector. Three grids at the entrance of the analyzer are used in the E const mode these grids can be removed if the analyzer is operated exclusively in the E/E const mode. In this mode the outer cylinder is also held at ground potential. The potential difference between the inner and the medium cylinders is kept constant. Energy analysis is performed by scanning the absolute potentials applied to these two electrodes. The energy resolution is the result of a retardation of the electrons between the first and the second grid. All tests described in this article have been done in the E/E const mode. The main dimensions of the analyzer are shown in Fig. 1. The energy analyzer can also be operated without subsequent spin analysis. In this case a channeltron is installed on the exit flange size CF100. If the analyzer will be operated only in the E/E const mode, it can be installed without outer cylinder on a CF63 flange. At the design stage the functioning of the analyzer was simulated by a homemade software using analytical methods for the solution of the electron-optical problem. Final design testing was carried out with the help of the SIMION software. 11 Our Mott detector is characterized by high sensitivity and stability and is described in Ref. 12. It is equipped with an updated detector electronics similar to the one used in our compact Mott detector. 13 The detector efficiency is 5, and the maximum count rate is 500 kcps. The overall spectrometer dimensions are cm. The energy analyzer described above is equally compatible with the Mott detector. 13 This combination results in an even smaller system with outer dimensions of cm. III. TESTS A. Transmission test The experimental investigation of the transmission of an analyzer is not an ordinary task, because it is necessary to place a source of electrons with known intensity and variable energy at the focal point of the analyzer. Here we use a strongly contaminated FeNi3 crystal not cleaned after baking, which is irradiated by an electron beam from an electron gun placed at a 90 angle with respect to the detector axis. The electron beam hits the sample surface at an angle of 30 with respect to the surface normal. Figure 2 shows the
4 Rev. Sci. Instrum., Vol. 75, No. 5, May 2004 Energy analyzer 1277 an electron gun placed at a 90 angle with respect to the detector axis. The electron beam hit the sample surface at an angle of 30. All principal Fe and Ni peaks were registered during the experiment, but we will only present the low kinetic energy results since they are most interesting due to the following facts: i they are close in energy and therefore easy to compare and ii they exhibit a high signal to background ratio high D value. The number of electrons in the left N L and right N R counter of the Mott detector was measured as a function of the kinetic energy. These spectra corrected to S 1, are shown in Fig. 4 a. The upper curve is proportional to the number of electrons with spin up (M L ), while the lower curve is proportional to the number of spin down electrons (M R ): FIG. 3. Energy spectrum of elastically reflected electrons measured in one channel of the Mott detector. energy spectrum of such a scattering measured in one channel of the Mott detector. The current of the primary electron beam was 0.4 A. The analysis of the measured count rate reveals that the transmission coefficient is determined by a geometrical factor being equal to the ratio of the solid angle established by entrance slits to 2. For the analysis we use the coefficient of secondary electron emission of carbon equal Practically any point of the spectrum can be studied with a count rate of 500 kcps in the E/E const mode by using a primary electron beam current between 0.4 and 10 A. Most metallic surfaces are not damaged or influenced by such a primary beam intensity. The main difference between the present setup and the spectrometer built by Landolt and Mauri, 1 Landolt, 2 Landolt, Allenspach, and Mauri, 3 and Allenspach 4 is the efficiency of the energy analyzer. A simple comparison based on comparing the different geometries reveals that our device has a 19 times higher efficiency. This means that the registration of identical spectra can be done 19 times faster. B. Resolution test For the estimation of the energy resolution we zoom into a part of the spectra shown in Fig. 2 see Fig. 3. E/E is measured for the peak of the elastically reflected electrons and is found to be equal to 0.7%. C. Spin resolved tests As a test sample we use a FeNi 3 (110) crystal, which is particularly suitable because its concentration and magnetization parameters are well-known. The crystal was cut in the shape of a frame, with its sides coinciding with the easy magnetization axes 111. The sample was magnetized by a coil of seven loops wound onto one of the frame sides. The crystal surface was cleaned by means of ion bombardment and high temperature annealing in ultrahigh vacuum. The crystal was irradiated by an unpolarized electron beam from where M L N 1 P, M R N 1 P, N N L N R / The absolute statistical error of M was determined according to M M L M R 1/S N, 17 and is smaller than the points of the graph. To eliminate the instrumental asymmetry and the asymmetry caused by the spin orbit interaction during the scattering process the magnetization of the target was periodically reversed by means of short field pulses. The counts in the left right channel were determined as the sum of counts in the left right channel with positive direction of the magnetization and in the right left channel with negative magnetization direction. All spectra were taken in remanence. The primary beam had an energy of E P 1500 ev. Multiple scanning of the energy was performed during the measurement. The whole spectrum was measured within 35 min. Further processing of the spectra was performed in the following way. Each curve was treated independently. A portion before and after the Auger peaks was selected in our case the ranges and ev and fitted by a polynomial function having the same order for both curves. This background curve was subtracted from the measured spectra. The result of this processing is shown in Fig. 4 b. The peaks are clearly resolved. However the peak ratio is not 1/3. This is probably caused both by the very crude background subtraction procedure. Figure 4 c shows the derivative taken from the spin integrated curves in order to give a more familiar representation. Here the ratio of the peak heights is 1/3 as expected. Figure 4 b shows that the Ni atoms are weakly magnetized while the magnetic moment of the Fe atoms is fairly high. This agrees with our knowledge about the magnetic properties of FeNi 3. It is obvious that a certain technique should be developed for the full and correct analysis of such experimental curves. Here we propose two independent approaches for the analysis of SPAES spectra.
5 1278 Rev. Sci. Instrum., Vol. 75, No. 5, May 2004 V. N. Petrov and A. S. Kamochkin since the described spectrometer enables us to do this quite efficiently. 2 A theoretical model that allows calculating the absolute magnetic moment of atoms from spin resolved spectra should be developed. Nevertheless we can do a preliminary analysis of our present results. The magnetization can be determined in the following way: 15 I B N N, 18 where N and N are spin up and spin down electrons in the valence band, B is the Bohr magnetron. We multiply and divide expression 18 by (N N ) N, where N is the number of valence electrons: I B N N N / N N. 19 Substituting the expression (N N )/(N N )by(s S )/(S S ), where S and S are the areas under the Auger peaks Fig. 2 b, we obtain I B N S S / S S. 20 The substitution of (N N )/(N N ) by (S S )/ (S S ) might not be fully justified but gives a first estimate for the size of the magnetic moments. Background selection is also a delicate problem. Let us refer to Fig. 4 b and keep in mind that the peak ratio should be 1/3. We can determine an artificial background corresponding to this peak ratio. It is indicated by the horizontal dotted line in Fig. 4 b. The Fe and Ni peaks are separated by the vertical dotted line. Measuring the areas under the two peaks in Fig. 4 b and substituting the result into Eq. 10 yields the following magnetic moments: I Fe 2.9 B ; I Ni 0.7 B. The number of valence electrons in Fe and Ni was assumed to be 8 and 10, respectively. This result is in good agreement with neutron scattering experiments on bulk Fe and Ni atoms in FeNi 3.Fe and Ni magnetic moments of I Fe 2.8 B ; I Ni 0.6 B were reported. 16 Our first analysis might be rather crude. However one should keep in mind that the results were obtained in a simple, home-built setup. We would also like to mention that no filtering of the experimental curves was performed. Even slight filtering would increase the signal to noise level and a shorter measuring time would become possible. In conventional Auger electron spectroscopy filtering is usually done via time averaging. With the experimental setup described above it becomes possible to collect a spin resolved Auger spectra as fast as a conventional retarding field spectrometer can collect a pure Auger electron spectra. FIG. 4. a Number of electrons in the left spin up and right spin down channels of the Mott detector vs kinetic energy. These spectra corrected for the case S 1. b Background subtracted spectra. c Derivative from the spin integral curve. 1 A sufficient amount of spin resolved data from various magnetic elements and their alloys should be measured under identical conditions and should serve as a reference. Our group plans to carry out this work in the nearest future ACKNOWLEDGMENTS The authors gratefully acknowledge T. Ya. Fishkova, L. P. Ovsyannikova, E. V. Shpak, M. Hoesch, and A. Vaterlaus for useful discussions. 1 M. Landolt and D. Mauri, Phys. Rev. Lett. 49, M. Landolt, in Polarized Electrons in Surface Physics, edited by R. Feder World Scientific, Singapore, 1985, Chap M. Landolt, R. Allenspach, and D. Mauri, J. Appl. Phys. 57, R. Allenspach, D. Mauri, M. Taborelli, and M. Landolt, Phys. Rev. B 35,
6 Rev. Sci. Instrum., Vol. 75, No. 5, May 2004 Energy analyzer B. Sinković, P. D. Johnson, N. B. Brookes, A. Clarke, and N. V. Smith, Phys. Rev. B 52, R B. Sincović, E. Shekel, and S. L. Hulbert, Phys. Rev. B 52, R Yu. Kucherenko, B. Sinković, E. Shekel, P. Rennert, and S. Hulbert, Phys. Rev. B 62, O. S. Anilturk and A. R. Koymen, J. Appl. Phys. 89, N. F. Mott, Proc. R. Soc. London 124, J. Kessler, Polarized Electrons Springer, New York, David A. Dahl, Simion 3D Version 6.0 User s Manual Idaho National Engineering Laboratory, Chemical Materials & Processes Department, Lockheed Idaho Technologies Co., Idaho Falls, ID 83415, V. N. Petrov, M. Landolt, M. S. Galaktionov, and B. V. Yushenkov, Rev. Sci. Instrum. 68, V. N. Petrov, V. V. Grebenshikov, B. D. Grachev, and A. S. Kamochkin, Rev. Sci. Instrum. 74, I. M. Bronshtain and B. S. Fraiman, Secondary Electron Emission Nauka, Moskva, 1969, in Russian. 15 C. Kittel, Introduction to Solid State Physics Wiley, New York, M. Nishi, Y. Nakai, and N. Kunitomi, J. Phys. Soc. Jpn. 37,
Spin-resolved photoelectron spectroscopy
Spin-resolved photoelectron spectroscopy Application Notes Spin-resolved photoelectron spectroscopy experiments were performed in an experimental station consisting of an analysis and a preparation chamber.
More informationMa5: Auger- and Electron Energy Loss Spectroscopy
Ma5: Auger- and Electron Energy Loss Spectroscopy 1 Introduction Electron spectroscopies, namely Auger electron- and electron energy loss spectroscopy are utilized to determine the KLL spectrum and the
More informationAdvanced Lab Course. X-Ray Photoelectron Spectroscopy 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT Qualitative analysis Chemical Shifts 7
Advanced Lab Course X-Ray Photoelectron Spectroscopy M210 As of: 2015-04-01 Aim: Chemical analysis of surfaces. Content 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT 3 3.1 Qualitative analysis 6 3.2 Chemical
More informationSpin- and angle-resolved photoemission spectroscopy study of the Au(1 1 1) Shockley surface state
Journal of Electron Spectroscopy and Related Phenomena 137 140 (2004) 119 123 Spin- and angle-resolved photoemission spectroscopy study of the Au(1 1 1) Shockley surface state Matthias Muntwiler a,, Moritz
More informationScanning Auger Microprobe
Scanning Auger Microprobe This enables images of the elements in the near surface layer of samples to be acquired. SAM a combination of the techniques of SEM and AES. An electron beam is scanned over the
More informationLecture 5. X-ray Photoemission Spectroscopy (XPS)
Lecture 5 X-ray Photoemission Spectroscopy (XPS) 5. Photoemission Spectroscopy (XPS) 5. Principles 5.2 Interpretation 5.3 Instrumentation 5.4 XPS vs UV Photoelectron Spectroscopy (UPS) 5.5 Auger Electron
More informationPhotoelectron spectroscopy Instrumentation. Nanomaterials characterization 2
Photoelectron spectroscopy Instrumentation Nanomaterials characterization 2 RNDr. Věra V Vodičkov ková,, PhD. Photoelectron Spectroscopy general scheme Impact of X-ray emitted from source to the sample
More information= 6 (1/ nm) So what is probability of finding electron tunneled into a barrier 3 ev high?
STM STM With a scanning tunneling microscope, images of surfaces with atomic resolution can be readily obtained. An STM uses quantum tunneling of electrons to map the density of electrons on the surface
More informationKeywords: electron spectroscopy, coincidence spectroscopy, Auger photoelectron, background elimination, Low Energy Tail (LET)
Measurement of the background in Auger-photoemission coincidence spectra (APECS) associated with inelastic or multi-electron valence band photoemission processes S. Satyal 1, P.V. Joglekar 1, K. Shastry
More informationX-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Fulmer 261A Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect
More informationDelta undulator magnet: concept and project status
Delta undulator magnet: concept and project status Part I: concept and model construction* Alexander Temnykh, CLASSE, Cornell University, Ithaca, New York, USA Part - II: beam test at ATF in BNL + M. Babzien,
More informationAppearance Potential Spectroscopy
Appearance Potential Spectroscopy Submitted by Sajanlal P. R CY06D009 Sreeprasad T. S CY06D008 Dept. of Chemistry IIT MADRAS February 2006 1 Contents Page number 1. Introduction 3 2. Theory of APS 3 3.
More informationPhotoemission Spectroscopy
FY13 Experimental Physics - Auger Electron Spectroscopy Photoemission Spectroscopy Supervisor: Per Morgen SDU, Institute of Physics Campusvej 55 DK - 5250 Odense S Ulrik Robenhagen,
More informationLecture 5-8 Instrumentation
Lecture 5-8 Instrumentation Requirements 1. Vacuum Mean Free Path Contamination Sticking probability UHV Materials Strength Stability Permeation Design considerations Pumping speed Virtual leaks Leaking
More informationAuger Analyses Using Low Angle Incident Electrons
Auger Analyses Using Low Angle Incident Electrons Kenichi Tsutsumi, Yuji agasawa and Toyohiko Tazawa Electron ptics Division, JEL Ltd. Introduction Auger Electron Spectroscopy (AES) is widely used, as
More informationX-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Electron Spectroscopy for Chemical Analysis (ESCA) The basic principle of the photoelectric effect was enunciated
More informationAuger Electron Spectroscopy (AES)
1. Introduction Auger Electron Spectroscopy (AES) Silvia Natividad, Gabriel Gonzalez and Arena Holguin Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving
More informationX- ray Photoelectron Spectroscopy and its application in phase- switching device study
X- ray Photoelectron Spectroscopy and its application in phase- switching device study Xinyuan Wang A53073806 I. Background X- ray photoelectron spectroscopy is of great importance in modern chemical and
More informationSpin-polarized e,2e) spectroscopy of ferromagnetic iron
Surface Science 482±485 2001) 1015±1020 www.elsevier.nl/locate/susc Spin-polarized e,2e) spectroscopy of ferromagnetic iron S. Samarin a, O. Artamonov b, J. Berakdar a, *, A. Morozov a,1, J. Kirschner
More informationHigh Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni
High Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni K. N. Altmann, D. Y. Petrovykh, and F. J. Himpsel Department of Physics, University of Wisconsin, Madison, 1150
More informationarxiv:physics/ v1 3 Aug 2006
Gamma Ray Spectroscopy with Scintillation Light in Liquid Xenon arxiv:physics/6834 v1 3 Aug 26 K. Ni, E. Aprile, K.L. Giboni, P. Majewski, M. Yamashita Physics Department and Columbia Astrophysics Laboratory
More informationIntroduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960
Introduction to X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate
More informationCesium Dynamics and H - Density in the Extended Boundary Layer of Negative Hydrogen Ion Sources for Fusion
Cesium Dynamics and H - Density in the Extended Boundary Layer of Negative Hydrogen Ion Sources for Fusion C. Wimmer a, U. Fantz a,b and the NNBI-Team a a Max-Planck-Institut für Plasmaphysik, EURATOM
More informationAuger Electron Spectroscopy *
OpenStax-CNX module: m43546 1 Auger Electron Spectroscopy * Amanda M. Goodman Andrew R. Barron This work is produced by OpenStax-CNX and licensed under the Creative Commons Attribution License 3.0 1 Basic
More informationBasic structure of SEM
Table of contents Basis structure of SEM SEM imaging modes Comparison of ordinary SEM and FESEM Electron behavior Electron matter interaction o Elastic interaction o Inelastic interaction o Interaction
More informationMeasurements of rotational transform due to noninductive toroidal current using motional Stark effect spectroscopy in the Large Helical Device
REVIEW OF SCIENTIFIC INSTRUMENTS 76, 053505 2005 Measurements of rotational transform due to noninductive toroidal current using motional Stark effect spectroscopy in the Large Helical Device K. Ida, a
More informationThe Standard Auger Electron Spectra in The AIST DIO-DB(111); Ge(111)
Paper The Standard Auger Electron Spectra in The AIST DIO-DB(111); Ge(111) K. Goto, a,* Adel Alkafri, b Y. Ichikawa, b A.Kurokawa, c and Y. Yamauchi a a AIST-Chubu Center, Anagahora 2266, Moriyama-ku,
More informationEnergy Spectroscopy. Excitation by means of a probe
Energy Spectroscopy Excitation by means of a probe Energy spectral analysis of the in coming particles -> XAS or Energy spectral analysis of the out coming particles Different probes are possible: Auger
More informationTransmission Electron Microscopy
L. Reimer H. Kohl Transmission Electron Microscopy Physics of Image Formation Fifth Edition el Springer Contents 1 Introduction... 1 1.1 Transmission Electron Microscopy... 1 1.1.1 Conventional Transmission
More informationEnergy Spectroscopy. Ex.: Fe/MgO
Energy Spectroscopy Spectroscopy gives access to the electronic properties (and thus chemistry, magnetism,..) of the investigated system with thickness dependence Ex.: Fe/MgO Fe O Mg Control of the oxidation
More informationChemistry 311: Instrumentation Analysis Topic 2: Atomic Spectroscopy. Chemistry 311: Instrumentation Analysis Topic 2: Atomic Spectroscopy
Topic 2b: X-ray Fluorescence Spectrometry Text: Chapter 12 Rouessac (1 week) 4.0 X-ray Fluorescence Download, read and understand EPA method 6010C ICP-OES Winter 2009 Page 1 Atomic X-ray Spectrometry Fundamental
More informationPraktikum zur. Materialanalytik
Praktikum zur Materialanalytik Energy Dispersive X-ray Spectroscopy B513 Stand: 19.10.2016 Contents 1 Introduction... 2 2. Fundamental Physics and Notation... 3 2.1. Alignments of the microscope... 3 2.2.
More informationAuger Electron Spectroscopy (AES) Prof. Paul K. Chu
Auger Electron Spectroscopy (AES) Prof. Paul K. Chu Auger Electron Spectroscopy Introduction Principles Instrumentation Qualitative analysis Quantitative analysis Depth profiling Mapping Examples The Auger
More informationSupplementary Figure 1 PtLuSb RHEED and sample structure before and after capping layer
Supplementary Figure 1 PtLuSb RHEED and sample structure before and after capping layer desorption. a, Reflection high-energy electron diffraction patterns of the 18 nm PtLuSb film prior to deposition
More informationSECONDARY ELECTRON EMISSION OF CERAMICS USED IN THE CHANNEL OF SPT
SECONDARY ELECTRON EMISSION OF CERAMICS USED IN THE CHANNEL OF SPT V. Viel-Inguimbert, ONERA/DESP, Avenue Edouard Belin, 3 55 Toulouse Cédex, FRANCE INTRODUCTION In the frame of the development of a plasma
More information4. Inelastic Scattering
1 4. Inelastic Scattering Some inelastic scattering processes A vast range of inelastic scattering processes can occur during illumination of a specimen with a highenergy electron beam. In principle, many
More informationPHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy
PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray
More informationPhotoelectron Spectroscopy. Xiaozhe Zhang 10/03/2014
Photoelectron Spectroscopy Xiaozhe Zhang 10/03/2014 A conception last time remain Secondary electrons are electrons generated as ionization products. They are called 'secondary' because they are generated
More informationAndrew D. Kent. 1 Introduction. p 1
Compton Effect Andrew D. Kent Introduction One of the most important experiments in the early days of quantum mechanics (93) studied the interaction between light and matter; it determined the change in
More informationX-ray spectroscopy: Experimental studies of Moseley s law (K-line x-ray fluorescence) and x-ray material s composition determination
Uppsala University Department of Physics and Astronomy Laboratory exercise X-ray spectroscopy: Experimental studies of Moseley s law (K-line x-ray fluorescence) and x-ray material s composition determination
More informationChemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5
Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4
More information5.8 Auger Electron Spectroscopy (AES)
5.8 Auger Electron Spectroscopy (AES) 5.8.1 The Auger Process X-ray and high energy electron bombardment of atom can create core hole Core hole will eventually decay via either (i) photon emission (x-ray
More informationElectron Spettroscopies
Electron Spettroscopies Spettroscopy allows to characterize a material from the point of view of: chemical composition, electronic states and magnetism, electronic, roto-vibrational and magnetic excitations.
More informationName: (a) What core levels are responsible for the three photoelectron peaks in Fig. 1?
Physics 243A--Surface Physics of Materials: Spectroscopy Final Examination December 16, 2014 (3 problems, 100 points total, open book, open notes and handouts) Name: [1] (50 points), including Figures
More informationQUESTIONS AND ANSWERS
QUESTIONS AND ANSWERS (1) For a ground - state neutral atom with 13 protons, describe (a) Which element this is (b) The quantum numbers, n, and l of the inner two core electrons (c) The stationary state
More informationMethods of surface analysis
Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice
More informationScintillation Detector
Scintillation Detector Introduction The detection of ionizing radiation by the scintillation light produced in certain materials is one of the oldest techniques on record. In Geiger and Marsden s famous
More informationX-Ray Photoelectron Spectroscopy (XPS)-2
X-Ray Photoelectron Spectroscopy (XPS)-2 Louis Scudiero http://www.wsu.edu/~scudiero; 5-2669 Fulmer 261A Electron Spectroscopy for Chemical Analysis (ESCA) The 3 step model: 1.Optical excitation 2.Transport
More informationCauchois Johansson x-ray spectrograph for kev energy range
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 72, NUMBER 2 FEBRUARY 2001 Cauchois Johansson x-ray spectrograph for 1.5 400 kev energy range E. O. Baronova a) and M. M. Stepanenko RRC Kurchatov Institute, 123182,
More informationStudying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies.
PY482 Lecture. February 28 th, 2013 Studying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies. Kevin E. Smith Department of Physics Department of Chemistry Division
More informationInternational Journal of Scientific & Engineering Research, Volume 5, Issue 3, March-2014 ISSN
316 Effective atomic number of composite materials by Compton scattering - nondestructive evaluation method Kiran K U a, Ravindraswami K b, Eshwarappa K M a and Somashekarappa H M c* a Government Science
More informationAuger Electron Spectroscopy Overview
Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E
More informationTable 1: Residence time (τ) in seconds for adsorbed molecules
1 Surfaces We got our first hint of the importance of surface processes in the mass spectrum of a high vacuum environment. The spectrum was dominated by water and carbon monoxide, species that represent
More informationX-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu
X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-ray Photoelectron Spectroscopy Introduction Qualitative analysis Quantitative analysis Charging compensation Small area analysis and XPS imaging
More information5) Surface photoelectron spectroscopy. For MChem, Spring, Dr. Qiao Chen (room 3R506) University of Sussex.
For MChem, Spring, 2009 5) Surface photoelectron spectroscopy Dr. Qiao Chen (room 3R506) http://www.sussex.ac.uk/users/qc25/ University of Sussex Today s topics 1. Element analysis with XPS Binding energy,
More informationLab 6 - ELECTRON CHARGE-TO-MASS RATIO
101 Name Date Partners OBJECTIVES OVERVIEW Lab 6 - ELECTRON CHARGE-TO-MASS RATIO To understand how electric and magnetic fields impact an electron beam To experimentally determine the electron charge-to-mass
More informationLab 5 - ELECTRON CHARGE-TO-MASS RATIO
81 Name Date Partners Lab 5 - ELECTRON CHARGE-TO-MASS RATIO OBJECTIVES To understand how electric and magnetic fields impact an electron beam To experimentally determine the electron charge-to-mass ratio
More informationLASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE
Copyright(C)JCPDS-International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Vol.46 74 ISSN 1097-0002 LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani 1, D. Wells
More information2. Determine the excess charge on the outer surface of the outer sphere (a distance c from the center of the system).
Use the following to answer question 1. Two point charges, A and B, lie along a line separated by a distance L. The point x is the midpoint of their separation. 1. Which combination of charges will yield
More informationEcole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools
1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron
More informationOverview of X-Ray Fluorescence Analysis
Overview of X-Ray Fluorescence Analysis AMPTEK, INC., Bedford, MA 01730 Ph: +1 781 275 2242 Fax: +1 781 275 3470 sales@amptek.com 1 What is X-Ray Fluorescence (XRF)? A physical process: Emission of characteristic
More informationProbing Matter: Diffraction, Spectroscopy and Photoemission
Probing Matter: Diffraction, Spectroscopy and Photoemission Anders Nilsson Stanford Synchrotron Radiation Laboratory Why X-rays? VUV? What can we hope to learn? 1 Photon Interaction Incident photon interacts
More informationA Simple Multi-Turn Time of Flight Mass Spectrometer MULTUM II
J. Mass Spectrom. Soc. Jpn. Vol. 51, No. 2, 23 REGULAR PAPER A Simple Multi-Turn Time of Flight Mass Spectrometer MULTUM II Daisuke O@JBJG6, a) Michisato TDND96, a) Morio IH=>=6G6, a) and Itsuo K6I6@JH:
More informationThe Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements
The Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements Uwe Scheithauer, 82008 Unterhaching, Germany E-Mail: scht.uhg@googlemail.com Internet: orcid.org/0000-0002-4776-0678;
More informationBasic physics Questions
Chapter1 Basic physics Questions S. Ilyas 1. Which of the following statements regarding protons are correct? a. They have a negative charge b. They are equal to the number of electrons in a non-ionized
More informationPractical Surface Analysis
Practical Surface Analysis SECOND EDITION Volume 1 Auger and X-ray Photoelectron Spectroscopy Edited by D. BRIGGS ICI PLC, Wilton Materials Research Centre, Wilton, Middlesbrough, Cleveland, UK and M.
More informationThe Use of Synchrotron Radiation in Modern Research
The Use of Synchrotron Radiation in Modern Research Physics Chemistry Structural Biology Materials Science Geochemical and Environmental Science Atoms, molecules, liquids, solids. Electronic and geometric
More informationh p λ = mν Back to de Broglie and the electron as a wave you will learn more about this Equation in CHEM* 2060
Back to de Broglie and the electron as a wave λ = mν h = h p you will learn more about this Equation in CHEM* 2060 We will soon see that the energies (speed for now if you like) of the electrons in the
More informationConclusion. 109m Ag isomer showed that there is no such broadening. Because one can hardly
Conclusion This small book presents a description of the results of studies performed over many years by our research group, which, in the best period, included 15 physicists and laboratory assistants
More informationLab Manual: Determination of Planck s constant with x-rays
Lab Manual: Determination of Planck s constant with x-rays 1. Purpose: To obtain a better understanding on the production of X-rays, the bremsstrahlung radiation and the characteristic radiation of a Molybdenum
More informationRepeatability of Spectral Intensity Using an Auger Electron Spectroscopy Instrument Equipped with a Cylindrical Mirror Analyzer
A. Kurokawa et al. Repeatability of Spectral Intensity Using an Auger lectron Spectroscopy Instrument quipped with a Cylindrical Mirror Analyzer Paper Repeatability of Spectral Intensity Using an Auger
More informationLab 5 - ELECTRON CHARGE-TO-MASS RATIO
79 Name Date Partners OBJECTIVES OVERVIEW Lab 5 - ELECTRON CHARGE-TO-MASS RATIO To understand how electric and magnetic fields impact an electron beam To experimentally determine the electron charge-to-mass
More informationChapter 9. Electron mean free path Microscopy principles of SEM, TEM, LEEM
Chapter 9 Electron mean free path Microscopy principles of SEM, TEM, LEEM 9.1 Electron Mean Free Path 9. Scanning Electron Microscopy (SEM) -SEM design; Secondary electron imaging; Backscattered electron
More informationMT Electron microscopy Scanning electron microscopy and electron probe microanalysis
MT-0.6026 Electron microscopy Scanning electron microscopy and electron probe microanalysis Eero Haimi Research Manager Outline 1. Introduction Basics of scanning electron microscopy (SEM) and electron
More informationA Comparison between Channel Selections in Heavy Ion Reactions
Brazilian Journal of Physics, vol. 39, no. 1, March, 2009 55 A Comparison between Channel Selections in Heavy Ion Reactions S. Mohammadi Physics Department, Payame Noor University, Mashad 91735, IRAN (Received
More informationCharacterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev
Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,
More informationUsing Calibrated Specular Reflectance Standards for Absolute and Relative Reflectance Measurements
Using Calibrated Specular Reflectance Standards for Absolute and Relative Reflectance Measurements Applications Overview here are two fundamental techniques for measuring specular reflectance with a UV/VIS/NIR
More informationX-ray Photoelectron Spectroscopy (XPS)
X-ray Photoelectron Spectroscopy (XPS) As part of the course Characterization of Catalysts and Surfaces Prof. Dr. Markus Ammann Paul Scherrer Institut markus.ammann@psi.ch Resource for further reading:
More informationIon sputtering yield coefficients from In thin films bombarded by different energy Ar + ions
Ion sputtering yield coefficients from thin films bombarded by different energy Ar + ions MJ Madito, H Swart and JJ Terblans 1 Department of Physics, University of the Free State, P.. Box 339, Bloemfontein,
More informationSecondary ion mass spectrometry (SIMS)
Secondary ion mass spectrometry (SIMS) ELEC-L3211 Postgraduate Course in Micro and Nanosciences Department of Micro and Nanosciences Personal motivation and experience on SIMS Offers the possibility to
More informationAn Introduction to Auger Electron Spectroscopy
An Introduction to Auger Electron Spectroscopy Spyros Diplas MENA3100 SINTEF Materials & Chemistry, Department of Materials Physics & Centre of Materials Science and Nanotechnology, Department of Chemistry,
More informationhν' Φ e - Gamma spectroscopy - Prelab questions 1. What characteristics distinguish x-rays from gamma rays? Is either more intrinsically dangerous?
Gamma spectroscopy - Prelab questions 1. What characteristics distinguish x-rays from gamma rays? Is either more intrinsically dangerous? 2. Briefly discuss dead time in a detector. What factors are important
More informationHigh Resolution Optical Spectroscopy
PHYS 3719 High Resolution Optical Spectroscopy Introduction This experiment will allow you to learn a specific optical technique with applications over a wide variety of phenomena. You will use a commercial
More informationMANIPAL INSTITUTE OF TECHNOLOGY
SCHEME OF EVAUATION MANIPA INSTITUTE OF TECHNOOGY MANIPA UNIVERSITY, MANIPA SECOND SEMESTER B.Tech. END-SEMESTER EXAMINATION - MAY SUBJECT: ENGINEERING PHYSICS (PHY/) Time: 3 Hrs. Max. Marks: 5 Note: Answer
More informationCASSY Lab. Manual ( )
CASSY Lab Manual (524 202) Moseley's law (K-line x-ray fluorescence) CASSY Lab 271 can also be carried out with Pocket-CASSY Load example Safety notes The X-ray apparatus fulfils all regulations on the
More informationDepth Distribution Functions of Secondary Electron Production and Emission
Depth Distribution Functions of Secondary Electron Production and Emission Z.J. Ding*, Y.G. Li, R.G. Zeng, S.F. Mao, P. Zhang and Z.M. Zhang Hefei National Laboratory for Physical Sciences at Microscale
More informationFigure 1. Decay Scheme for 60Co
Department of Physics The University of Hong Kong PHYS3851 Atomic and Nuclear Physics PHYS3851- Laboratory Manual A. AIMS 1. To learn the coincidence technique to study the gamma decay of 60 Co by using
More informationWM2013 Conference, February 24 28, 2013, Phoenix, Arizona, USA
The Underwater Spectrometric System Based on CZT Detector for Survey of the Bottom of MR Reactor Pool 13461 Victor Potapov, Alexey Safronov, Oleg Ivanov, Sergey Smirnov, Vyacheslav Stepanov National Research
More informationEEE4106Z Radiation Interactions & Detection
EEE4106Z Radiation Interactions & Detection 2. Radiation Detection Dr. Steve Peterson 5.14 RW James Department of Physics University of Cape Town steve.peterson@uct.ac.za May 06, 2015 EEE4106Z :: Radiation
More informationExperiment objectives: measure the ratio of Planck s constant to the electron charge h/e using the photoelectric effect.
Chapter 1 Photoelectric Effect Experiment objectives: measure the ratio of Planck s constant to the electron charge h/e using the photoelectric effect. History The photoelectric effect and its understanding
More informationM2 TP. Low-Energy Electron Diffraction (LEED)
M2 TP Low-Energy Electron Diffraction (LEED) Guide for report preparation I. Introduction: Elastic scattering or diffraction of electrons is the standard technique in surface science for obtaining structural
More informationPhotoelectric Effect Experiment
Experiment 1 Purpose The photoelectric effect is a key experiment in modern physics. In this experiment light is used to excite electrons that (given sufficient energy) can escape from a material producing
More informationQuantitative Assessment of Scattering Contributions in MeV-Industrial X-ray Computed Tomography
11th European Conference on Non-Destructive Testing (ECNDT 2014), October 6-10, 2014, Prague, Czech Republic More Info at Open Access Database www.ndt.net/?id=16530 Quantitative Assessment of Scattering
More information1 AT/P5-05. Institute of Applied Physics, National Academy of Sciences of Ukraine, Sumy, Ukraine
1 AT/P5-05 H - Ion Source with Inverse Gas Magnetron Geometry for SNS Project V.A. Baturin, P.A. Litvinov, S.A. Pustovoitov, A.Yu. Karpenko Institute of Applied Physics, National Academy of Sciences of
More informationPreamble: Emphasis: Material = Device? MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS
MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS MTSE 719 - PHYSCL PRIN CHARACTIZTN SOLIDS Section # Call # Days / Times 001 96175 -View Book Info - F:100PM - 355PM - TIER114 Preamble: Core course
More informationSurface Analysis - The Principal Techniques
Surface Analysis - The Principal Techniques Edited by John C. Vickerman Surface Analysis Research Centre, Department of Chemistry UMIST, Manchester, UK JOHN WILEY & SONS Chichester New York Weinheim Brisbane
More informationElectron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn?
Electron probe microanalysis - Electron microprobe analysis EPMA (EMPA) What s EPMA all about? What can you learn? EPMA - what is it? Precise and accurate quantitative chemical analyses of micron-size
More informationMagnetism of TbPc 2 SMMs on ferromagnetic electrodes used in organic spintronics
Electronic supplementary information Magnetism of TbPc 2 SMMs on ferromagnetic electrodes used in organic spintronics L. Malavolti, a L. Poggini, a L. Margheriti, a D. Chiappe, b P. Graziosi, c B. Cortigiani,
More informationLow Energy Electrons and Surface Chemistry
G. Ertl, J. Küppers Low Energy Electrons and Surface Chemistry VCH 1 Basic concepts 1 1.1 Introduction 1 1.2 Principles of ultrahigh vacuum techniques 2 1.2.1 Why is UHV necessary? 2 1.2.2 Production of
More informationX-RAY SCATTERING AND MOSELEY S LAW. OBJECTIVE: To investigate Moseley s law using X-ray absorption and to observe X- ray scattering.
X-RAY SCATTERING AND MOSELEY S LAW OBJECTIVE: To investigate Moseley s law using X-ray absorption and to observe X- ray scattering. READING: Krane, Section 8.5. BACKGROUND: In 1913, Henry Moseley measured
More information